Self-diagnosis method for a vehicle system

Abstract

The present invention relates to a method for self-diagnosis (100) of a vehicle system (1) which is supplied with energy from a vehicle on-board network (3) and which includes at least one system integrated circuit (ASIC) having at least an internal energy supply unit (11), a sequence control and logic control unit (10) and a safety control unit (12) and which includes a control unit (ECU) with at least one microcontroller (μC), as well as a vehicle system (1) for implementing this method. In this regard, after application of the on-board network voltage (VB), in an initialization phase, regardless of the activation state of the at least one microcontroller (μC), in the at least one system integrated circuit (ASIC), at least one internal reference voltage (VBz) and at least one internal system voltage (V1, V2, V3, V4) for supplying the vehicle system (1) are generated from the applied on-board network voltage (VB), and a hardware-assisted internal self-diagnosis function is executed, and if at least one internal reference voltage (VBz) is available, in the corresponding system integrated circuit (ASIC), a hardware-assisted internal self-diagnosis function is started and implemented, and at least two hardware-assisted internal self-diagnosis functions are processed at least partially in parallel, and the at least one microcontroller (μC) has an active state after an initialization phase of the at least one system integrated circuit (ASIC) and activates and implements at least one software-assisted self-diagnosis function (SEDF) after the internal self-diagnosis.

Description

Technical Field

[0001] The present invention relates to a method for self-diagnosis of a vehicle system. A vehicle system adapted to execute such a method is also an object of the present invention.

Background Art

[0002] From the state of the art, methods for self-diagnosis of vehicle systems and corresponding vehicle systems for implementing such methods are known. By such self-diagnosis methods, it can be ensured that complex electronic circuits function without errors, for example, during their entire operating period of 15 years. In this regard, the main functions and / or characteristics of the vehicle system can be inspected by the self-diagnosis function once per power-on cycle or continuously and / or periodically, depending on the safety classification. Most of these self-diagnosis functions, also called BIST (Built-In Self-Test), are first executed at each start-up of the vehicle system and can inform the user of a state without errors or a diagnostic failure. In the airbag system, the indication is usually given by an airbag warning display in the instrument panel of the vehicle. This airbag warning display lights up at each system start-up and is deactivated only when the self-diagnosis passes without problems. This can take several seconds depending on the type of system, vehicle type, etc. Only when the warning display disappears can the standby of the function be guaranteed. Since the individual self-diagnosis functions for hardware and software inspection almost always proceed sequentially, the essential contribution of the required time for the initialization or start-up of the airbag system becomes clear from the first diagnostic range. Furthermore, since the self-diagnosis function is generally software-assisted and started or evaluated via software by a microcontroller, the complexity of the vehicle system software increases.

Summary of the Invention

[0003] The self-diagnosis method of a vehicle system having the features of independent claim 1 and the corresponding vehicle system having the features of independent claim 14 each have the advantage that the required time for initializing or starting the vehicle system can be significantly reduced. This means that there is a time span until the standby of all functions of the vehicle system, i.e., until it becomes available, which can be significantly shortened. Furthermore, the complexity of the vehicle system software can be reduced.

[0004] The core of the present invention lies in parallelizing the self-diagnosis function of the vehicle system instead of sequentially executing it. This results in a clearly shortened overall diagnosis time and thus makes the functions of the vehicle system available earlier. For this purpose, the hardware design of at least one system integrated circuit including an additional test circuit and the cooperation with other system components, such as microcontrollers, sensors, communication interfaces, etc., can be correspondingly adapted. In addition, the individual internal self-diagnosis functions of at least one system integrated circuit can be enhanced by hardware support and can be executed and determined independently without the involvement of at least one microcontroller of the vehicle system. This reduces the complexity of the vehicle system software, especially during the initialization or startup phase of a vehicle system preferably constructed as an airbag system. In this regard, the standby of all functions of the airbag system, i.e., being available, can be indicated, for example, by the disappearance of the airbag warning display.

[0005] Embodiments of the present invention are provided with at least one system integrated circuit that is supplied with energy from a vehicle on-board network and has at least an internal energy supply unit, a sequence control and logic control unit, and a safety control unit, and includes a control device having at least one microcontroller, to provide a self-diagnosis method for a vehicle system. In this regard, after the application of the on-board network voltage, in the initialization stage, regardless of the activation state of at least one microcontroller, at least one internal reference voltage and at least one internal system voltage for supplying the vehicle system are generated from the applied on-board network voltage within at least one system integrated circuit, and a hardware-assisted internal self-diagnosis function is executed. When at least one internal reference voltage is available, the hardware-assisted internal self-diagnosis function is started and implemented within the corresponding system integrated circuit. Further, at least two hardware-assisted internal self-diagnosis functions are processed at least partially in parallel, at least one microcontroller has an active state after the initialization stage of at least one system integrated circuit, and after the internal self-diagnosis, at least one software-assisted self-diagnosis function is activated and implemented.

[0006] Furthermore, a vehicle system adapted to execute such a self-diagnosis method is proposed. This vehicle system may include, for example, at least one system integrated circuit and a control device having at least one microcontroller. In this regard, at least one system integrated circuit can have at least an internal energy supply unit, a sequence control and logic control unit, and a safety control unit, and the safety control unit can control the corresponding output stage to activate at least one ignition circuit of a suppression device.

[0007] The execution and flow of the individual self-diagnosis functions of the vehicle system are associated with a plurality of parameters or dependencies. That is, embodiments of the self-diagnosis method according to the invention of the vehicle system take into account electrical basic conditions, such as the presence of an internal system voltage, in the hardware design and in the control of the hardware-assisted internal self-diagnosis function. In addition to this, the start of the hardware-assisted internal self-diagnosis function is preferably actuated by the presence of at least one internal reference voltage. Furthermore, when executing the hardware-assisted internal self-diagnosis function, safety requirements can be met by paying attention to the interaction with other functions and / or tests. Thereby, it is possible to speed up the self-diagnosis flow of the vehicle system, parallelize the self-diagnosis functions, and reduce the complexity of the vehicle system software.

[0008] In the present application, the control device may be an electrical device that processes or evaluates the captured sensor signals, such as an airbag control device. The control device may have at least one interface that can be formed by hardware and / or software. In the case of being formed by hardware, the interface may be, for example, part of a system integrated circuit that encompasses a very variety of functions of the control device. However, it is also possible for the interface to be a dedicated integrated circuit or at least partially consist of individual components. In the case of being formed by software, the interface may be, for example, a software module that exists together with other software modules on one microcontroller. A computer program product stored on a machine-readable medium, such as a semiconductor memory, a hard disk memory, or an optical memory, and having a program code used for performing the evaluation is also advantageous when this program is executed by the microcontroller of the control device.

[0009] By means of the measures and variants described in the dependent claims, it is possible to advantageously improve the self-diagnosis method of the vehicle system presented in independent patent claim 1 and the vehicle system presented in independent patent claim 14.

[0010] It is particularly advantageous that at least one additional test circuit and / or at least one rewritable permanent memory for implementing a hardware-assisted internal self-diagnostic function can be implemented within at least one system integrated circuit. In this regard, the at least one rewritable permanent memory can provide electrical parameters. Alternatively, the hardware-assisted internal self-diagnostic function can proceed within the sequence control and logic control unit itself without parameterization and determination. That is, the sequence control and logic control unit can execute each individual hardware-assisted internal self-diagnostic function, for example, always in the same manner, and then provide the corresponding "Raw value" as a result to at least one microcontroller. Subsequently, the at least one microcontroller can determine whether the hardware-assisted internal self-diagnostic function has ended positively according to the type of the system. In addition, the at least one test circuit can be configured and arranged such that the occurrence of interactions that can be caused by interference of electrical parameters or crosstalk can be reduced. In the case of few spatially proximate locations on a common silicon substrate, the interaction can occur directly, for example, due to interference of electrical parameters or "crosstalk" or interference. Embodiments of the present invention can reduce the interaction of the hardware-assisted internal self-diagnostic function as much as possible by adapting at least one test circuit, for example, optimizing the sizing of current sources and / or current sinks, "disconnecting" from current paths with diodes, etc., to ensure a self-diagnostic function that is not affected. Similarly, in the layout of at least one system integrated circuit, measures can be taken to better insulate circuit blocks. That is, for example, an optimized ground connection, optimized wiring, grooves or trenches between adjacent structures, etc. can be implemented. With such improvement measures, since there is no or reduced functional interference of the hardware-assisted internal self-diagnostic function, the parallelization of the self-diagnostic function can be increased.

[0011] In an advantageous form of this method, at least two hardware-assisted internal self-diagnosis functions that are processed at least partially in parallel can each have a digital test part and an analog test part. In this regard, the digital test parts of at least two hardware-assisted internal self-diagnosis functions can be processed in parallel.

[0012] In a further advantageous form of this method, the analog test portions of at least two hardware-assisted internal self-diagnostic functions can be processed in parallel or in a set order, depending on known influences and / or safety settings. Due to the high integration of electrical circuits within at least one system integrated circuit, there can be a possibility of the existence of interactions between individual hardware-assisted internal self-diagnostic functions that can also interfere with the hardware-assisted internal self-diagnostic functions. Therefore, when implementing such hardware-assisted internal self-diagnostic functions, attention is paid to the fact that not all self-diagnostic functions can be arbitrarily started at any time and in parallel. In applications directly related to safety, such as airbag control devices, non-compliance with safety requirements must not occur. That is, for example, there is a dependency between individual self-diagnostic functions such that if the first hardware-assisted internal self-diagnostic function does not end properly, the execution of the second hardware-assisted internal self-diagnostic function is blocked. This dependency and the necessary control also cause complex system software in current systems and an extension of the overall time of the first self-diagnostic method. In an embodiment of the self-diagnostic method according to the invention for a vehicle system, the test integrated circuits and their hardware sequence control are constructed so that non-compliance with safety requirements cannot occur. That is, a failure of a hardware-assisted internal self-diagnostic function regarding a safety-related function will, for example, automatically cause an interruption of further hardware-assisted internal self-diagnostic functions. In the best case, the test circuit itself can be configured so that it does not pose a risk of threatening safety even in case of malfunction, whereby the hardware-assisted internal self-diagnostic functions can continue to proceed with the maximum possible test coverage rate. That is, for example, the internal system voltage can be available at different times and / or be dependent on each other. Therefore, the second system voltage that depends on the first system voltage can be tested only after the first system voltage has been tested and no error has been confirmed. Such improvements reduce or eliminate the dependency on safety requirements for hardware-assisted internal self-diagnostic functions, so that the parallelization of hardware-assisted internal self-diagnostic functions can also be increased.

[0013] In a further advantageous form of this method, at least one reference voltage and / or at least one auxiliary voltage can be generated based on at least one internal reference voltage and provided for a hardware-assisted internal self-diagnosis function. That is, the at least one auxiliary voltage can be replaced, for example, by the corresponding internal system voltage when this internal system voltage reaches its target value at a later point in time. This means that a number of self-diagnosis functions can already be executed before all internal voltages reach their target values. That is, for example, an evaluation circuit, such as a comparator, can be inspected before the internal system voltage to be inspected by the corresponding evaluation circuit becomes available.

[0014] In a further advantageous form of this method, at least one comparator may be inspected by at least one of the hardware-assisted internal self-diagnosis functions, and this at least one hardware-assisted internal self-diagnosis function is implemented to inspect the switching point of at least one comparator by a change in the applied reference voltage. In this regard, the transfer of the output signal of this at least one comparator can be blocked during the inspection. After being inspected without errors, this at least one comparator can be used by at least one further hardware-assisted internal self-diagnosis function to inspect the under-voltage threshold and / or over-voltage threshold of at least one internal reference voltage and / or at least one internal system voltage and / or at least one output voltage. The use of a comparator enables a simple and inexpensive implementation of the corresponding hardware-assisted internal self-diagnosis function.

[0015] In a further advantageous form of this method, at least one logic path of the sequence control and logic control part of the corresponding system integrated circuit and / or at least one logic path of the safety control part can be inspected by at least one hardware-assisted internal self-diagnosis function. Additionally or alternatively, at least one PSI interface capable of receiving and processing sensor signals from at least one peripheral sensor unit can be inspected by at least one hardware-assisted internal self-diagnosis function. Further, additionally or alternatively, at least one analog interface capable of receiving an analog signal from an external analog signal transmitter or outputting an analog signal to an external analog signal receiver can be inspected by at least one hardware-assisted internal self-diagnosis function. The listed hardware-assisted internal self-diagnosis functions should be understood only as examples, because the full range of hardware-assisted internal self-diagnosis functions can clearly be much larger.

[0016] In a further advantageous form of this method, the under-voltage threshold and / or over-voltage threshold of at least one energy storage unit of the vehicle system and / or an analog interface capable of receiving an analog signal from an external analog signal transmitter or outputting an analog signal to an external analog signal receiver and / or a central acceleration sensor and / or a central angular velocity sensor and / or a bus interface can be inspected by at least one software-assisted self-diagnosis function. This at least one software-assisted self-diagnosis function is started and implemented by, for example, system software by means of SPI commands. This is done when the internal system voltage is available, the microcontroller is fully supplied, and the internal self-diagnosis of the microcontroller has ended without problems.

[0017] Exemplary embodiments of the present invention are shown in the drawings and will be explained in more detail in the following description. In the drawings, the same reference signs mean components or elements that perform the same or similar functions.

Brief Description of the Drawings

[0018]

Figure 1

Figure 2

Figure 3

DETAILED DESCRIPTION OF THE INVENTION

[0019] As is apparent from FIG. 1, the illustrated exemplary embodiment of the vehicle system 1 according to the present invention, which is adapted to execute the method 100 according to the present invention shown in FIG. 2, includes a control device ECU having at least one system integrated circuit ASIC and at least one microcontroller μC. In the illustrated exemplary embodiment, the vehicle system 1 is configured as an airbag system 1A including only one system integrated circuit ASIC and only one microcontroller μC. The system integrated circuit ASIC includes at least an internal energy supply unit 11, a sequence control and logic control unit 10, and a safety control unit 12. The safety control unit 12 controls the corresponding output stage 16 in order to activate at least one ignition circuit 6 of a restraint device (not shown). As is further apparent from FIG. 1, the illustrated vehicle system 1 is supplied with energy by a vehicle on-board network 3 that provides an on-board network voltage VB.

[0020] In the illustrated exemplary embodiment of the self-diagnosis method 100 according to the present invention of the vehicle system 1 shown in FIG. 1, after the application of the on-board network voltage VB, in the initialization stage, regardless of the activation state of at least one microcontroller μC, within at least one system integrated circuit ASIC, at least one internal reference voltage VBz and at least one internal system voltage V1, V2, V3, V4 for supplying the vehicle system 1 are generated from the applied on-board network voltage VB, and the hardware-assisted internal self-diagnosis function EDF shown in FIG. 3 is executed. As is apparent from FIG. 2, in step S100, when at least one internal reference voltage VBz is available, the hardware-assisted internal self-diagnosis function EDF is started within the corresponding system integrated circuit ASIC and is carried out in step S120. In step S120, as is apparent from FIG. 3, at least two hardware-assisted internal self-diagnosis functions EDF are processed at least partially in parallel. After at least one microcontroller μC has an active state after the initialization stage of at least one system integrated circuit ASIC, after the internal self-diagnosis, in step S130 at least one software-assisted self-diagnosis function SEDF is activated, which is carried out in step S140.

[0021] The time sequence of the plurality of hardware-assisted self-diagnosis functions EDF shown in FIG. 3 indicates that, in the normal operation of the vehicle, at time T0, the on-board network voltage VB is applied to the control device ECU. In addition to this, the control device ECU includes an internal energy storage unit VER that is charged based on the on-board network voltage VB. When the on-board network voltage VB stops, the internal energy storage unit VER provides the energy storage unit voltage to the internal energy supply unit 11 in the emergency operation. Therefore, the internal energy supply unit 11 of the system integrated circuit ASIC generates four different internal system voltages V1, V2, V3, V4 in the illustrated exemplary embodiment, from the on-board network voltage VB provided in the normal operation and from the energy storage unit voltage provided in the emergency operation. For this purpose, the internal energy supply unit 11 includes a plurality of voltage regulators and / or voltage converters (not shown) that generate and output the different internal system voltages V1, V2, V3, V4. In the illustrated exemplary embodiment, the first internal system voltage V1 has a voltage level of 6.7V and is used, for example, to supply the central acceleration sensor SA and the central angular velocity sensor SD. The second internal system voltage V2 has a voltage level of 5.0V and is used, for example, to supply the data bus communication interface 9 and the analog interface 2. The third internal system voltage V3 has a voltage level of 3.3V and is used, for example, to supply the analog interface 15 and the PSI interface 17 of the system integrated circuit ASIC, as well as to supply the microcontroller μC. The fourth internal system voltage V4 has a voltage level of 1.29V and is used, for example, to supply the core of the microcontroller μC. In addition to this, the four internal system voltages V1, V2, V3, V4 are used to supply the rewritable permanent memory NVM (non-volatile memory) that holds the program code and electrical parameters for the internal self-diagnosis of the microcontroller μC, as well as to supply the sequence control and logic control unit 10, the safety control unit 12, and the output stage 16 of the system integrated circuit ASIC.The internal system voltages V1, V2, V3, and V4 mentioned should be understood only as examples. Of course, more or fewer internal system voltages may be generated and used than the four internal system voltages V1, V2, V3, and V4, and these internal system voltages may have voltage values different from those presented.

[0022] As is further apparent from FIG. 1, the system integrated circuit ASIC, in the illustrated exemplary embodiment, holds electrical parameters for the hardware-assisted internal self-diagnosis function EDF and is similarly supplied by one of the four internal system voltages V1, V2, V3, and V4, and includes a rewritable permanent memory 13 and a plurality of test circuits. One of these test circuits, test circuit 14, is illustratively shown. These test circuits 14 are also similarly supplied by one of the four internal system voltages V1, V2, V3, and V4. These test circuits 14 are configured and arranged such that the occurrence of interactions caused by interference of electrical parameters or by crosstalk is reduced.

[0023] As is further apparent from FIG. 1, the internal energy supply unit 11 generates at least one internal reference voltage VBz. Based on this at least one internal reference voltage VBz, in the illustrated exemplary embodiment, a reference voltage Vref and at least one auxiliary voltage VH are generated and provided for the hardware-assisted internal self-diagnosis function EDF. The at least one auxiliary voltage VH is replaced by the corresponding internal system voltages V1, V2, V3, and V4 when these internal system voltages V1, V2, V3, and V4 reach their target values at a later time.

[0024] The time sequence shown in FIG. 3 indicates that the internal reference voltage VBz is available at time T1. Therefore, in step S100 within the initialization phase, the end of which is indicated by time T1 in FIG. 3, method 100 starts the hardware-assisted internal self-diagnosis function EDF at time T1. As is further apparent from FIG. 3, method 100 according to the present invention includes, in the illustrated exemplary embodiment, five hardware-assisted internal self-diagnosis functions EDF and one software-assisted self-diagnosis function SEDF that is started by the microcontroller μC after the initialization phase has ended at time T1.

[0025] In this regard, at least one comparator is inspected by at least one of the hardware-assisted internal self-diagnosis functions EDF. This at least one hardware-assisted internal self-diagnosis function EDF is executed to inspect the switching point of at least one comparator by the change of the applied reference voltage Vref. The transfer of the output signal of this at least one comparator is blocked during the inspection. After being inspected without errors, this at least one comparator is used by at least one further hardware-assisted internal self-diagnosis function EDF to inspect the under-voltage threshold and / or over-voltage threshold of at least one internal reference voltage VBz and / or at least one internal system voltage V1, V2, V3, V4 and / or at least one output voltage. In addition, at least one logic path of the sequence control and logic control unit 10 of the system integrated circuit ASIC and / or at least one logic path of the safety control unit 12 are inspected by at least one of the hardware-assisted internal self-diagnosis functions EDF. The PSI interface 17 that receives and processes sensor signals from at least one peripheral sensor unit 8 is likewise inspected by at least one of the hardware-assisted internal self-diagnosis functions EDF. The PSI interface 17 transfers the processed sensor signals of at least one peripheral sensor unit 8 to other components of the vehicle system 1 via the in-system data bus SPI constructed as an SPI bus. The analog interface 15 that receives an analog signal from an external analog signal transmitter 5, for example from the contact sensor 5A of the seat belt buckle, or outputs an analog signal to an external analog signal receiver 4, for example the warning display 4A, is likewise inspected by at least one of the hardware-assisted internal self-diagnosis functions EDF.

[0026] As is even more apparent from FIG. 3, the first hardware-assisted internal self-diagnosis function EDF1 has one digital test part DT1 and two analog test parts AT1, AT2. The second hardware-assisted internal self-diagnosis function EDF2 has one digital test part DT1 and one analog test part AT1. The third hardware-assisted internal self-diagnosis function EDF3 has only one analog test part AT1. The fourth hardware-assisted internal self-diagnosis function EDF4 has one digital test part DT1 and one analog test part AT1. Similarly, the fifth hardware-assisted internal self-diagnosis function EDF5 also has one digital test part DT1 and one analog test part AT1.

[0027] As is even more apparent from FIG. 3, at the very least, the digital test portions DT1 of the hardware-assisted internal self-diagnostic functions EDF1, EDF2, EDF4, and EDF5 are processed in parallel. The analog test portions AT1 and AT2 of the five hardware-assisted internal self-diagnostic functions EDF1, EDF2, EDF3, EDF4, and EDF5 are processed either in parallel or in a set order, depending on known effects and / or safety settings. That is, after the processing of the digital test portions DT1 of the four hardware-assisted internal self-diagnostic functions EDF1, EDF2, EDF4, and EDF5, the analog test portions AT1 of the first hardware-assisted internal self-diagnostic function EDF1 and the fourth hardware-assisted internal self-diagnostic function EDF4 are processed in parallel. Since the second analog test portion AT2 of the first hardware-assisted internal self-diagnostic function EDF1, the analog test portion AT1 of the second hardware-assisted internal self-diagnostic function EDF2, and the analog test portion AT1 of the third hardware-assisted internal self-diagnostic function EDF3 depend on the first analog test portion AT1 of the first hardware-assisted internal self-diagnostic function EDF1, these three analog test portions AT1 and AT2 are processed in parallel after the processing of the first analog test portion AT1 of the first hardware-assisted internal self-diagnostic function EDF1. The analog test portion AT1 of the fifth hardware-assisted internal self-diagnostic function EDF5 depends on the analog test portion AT1 of the third hardware-assisted internal self-diagnostic function EDF3, so this is processed after the processing of the analog test portion AT1 of the third hardware-assisted internal self-diagnostic function EDF3.

[0028] The software-assisted self-diagnosis function SEDF shown in FIG. 3 checks the under-voltage threshold value and / or over-voltage threshold value of the energy storage unit VER of the vehicle system 1 in the illustrated exemplary embodiment. In an alternative exemplary embodiment not shown, a further software-assisted self-diagnosis function SEDF checks the analog interface 2 and / or the central acceleration sensor SA and / or the central angular velocity sensor SD and / or the data bus communication interface 9 connected to the vehicle bus system 7 constructed, for example, as a CAN bus. The analog interface 2 receives an analog signal from an external analog signal transmitter 5, for example, the switch state 5B of an airbag switch not shown. In this regard, the analog interface 2 may be incorporated into the microcontroller μC. In addition to this, this analog interface can also output the analog signal to an external analog signal receiver.

Claims

1. A self-diagnosis method (100) for a vehicle system (1) including a control device (ECU) equipped with at least one microcontroller (μC) and having at least one system integrated circuit (ASIC) supplied with energy from a vehicle on-board network (3) and having at least an internal energy supply unit (11), a sequence control and logic control unit (10), and a safety control unit (12). After the application of the on-board network voltage (VB), in the initialization stage, regardless of the activation state of the at least one microcontroller (μC), within the at least one system integrated circuit (ASIC), at least one internal reference voltage (VBz) and at least one internal system voltage (V1, V2, V3, V4) for supplying the vehicle system (1) are generated from the applied on-board network voltage (VB), and a hardware-assisted internal self-diagnosis function (EDF) is executed. When the at least one internal reference voltage (VBz) is available, the hardware-assisted internal self-diagnosis function (EDF) is started and implemented within the corresponding system integrated circuit (ASIC), at least two hardware-assisted internal self-diagnosis functions (EDF) are processed at least partially in parallel, the at least one microcontroller (μC) has an active state after the initialization stage of the at least one system integrated circuit (ASIC), and after the internal self-diagnosis, at least one software-assisted self-diagnosis function (SEDF) is activated and implemented.

2. At least one additional test circuit (14) and / or at least one rewritable permanent memory (13) for implementing the hardware-assisted internal self-diagnosis function (EDF) are implemented within the at least one system integrated circuit (ASIC), and in this regard, the at least one rewritable permanent memory (13) provides electrical parameters. The method (100) according to claim 1.

3. The method (100) according to claim 2, characterized in that the at least one additional test circuit (14) is configured and arranged such that the occurrence of interactions caused by interference of electrical parameters or crosstalk is reduced.

4. The method (100) according to claim 1, characterized in that at least the at least two hardware-assisted internal self-diagnosis functions (EDF) each have a digital test part (DT1) and an analog test part (AT1, AT2), and at least the digital test parts (DT1) of the at least two hardware-assisted internal self-diagnosis functions (EDF) are processed in parallel.

5. The method (100) according to claim 4, characterized in that the analog test parts (AT1, AT2) of the at least two hardware-assisted internal self-diagnosis functions (EDF) are processed in parallel or in a set order depending on known influences and / or safety settings.

6. The method (100) according to claim 1, characterized in that at least one reference voltage (Vref) and / or at least one auxiliary voltage (VH) is generated based on the at least one internal reference voltage (VBz) and provided for the hardware-assisted internal self-diagnosis function (EDF).

7. The method (100) according to claim 1, characterized in that at least one comparator is inspected by at least one of the hardware-assisted internal self-diagnosis functions (EDF), and the at least one hardware-assisted internal self-diagnosis function (EDF) is executed to inspect the switching point of the at least one comparator by a change in the applied reference voltage (Vref), and the transfer of the output signal of the at least one comparator is blocked during the inspection.

8. After the at least one comparator has been inspected without error, it is used by at least one further hardware-assisted internal self-diagnosis function (EDF) to inspect the under-voltage threshold and / or over-voltage threshold of the at least one internal reference voltage (VBz) and / or the at least one internal system voltage (V1, V2, V3, V4) and / or at least one output voltage. The method (100) according to claim 7, characterized in that.

9. At least one logic path of the sequence control and logic control unit (10) and / or at least one logic path of the safety control unit (12) of the corresponding system integrated circuit (ASIC) is inspected by at least one of the hardware-assisted internal self-diagnosis functions (EDF), the method (100) according to claim 1.

10. At least one PSI interface (17) for receiving and processing sensor signals from at least one peripheral sensor unit (8) is inspected by at least one of the hardware-assisted internal self-diagnosis functions (EDF), the method (100) according to claim 1.

11. At least one analog interface (15) for receiving an analog signal from an external analog signal transmitter (5) or outputting an analog signal to an external analog signal receiver (4) is inspected by at least one of the hardware-assisted internal self-diagnosis functions (EDF), the method (100) according to claim 1.

12. The under-voltage threshold and / or over-voltage threshold of at least one energy storage unit (VER) of the vehicle system (1) and / or an analog interface (2) for receiving an analog signal from an external analog signal transmitter (5) or outputting an analog signal to an external analog signal receiver and / or a central acceleration sensor (SA) and / or a central angular velocity sensor (SD) and / or a data bus communication interface (9) are inspected by the at least one software-assisted self-diagnosis function (SEDF), the method (100) according to claim 1.

13. A vehicle system (1) adapted to execute the method (100) according to any one of claims 1 to 12.

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