Dimensional Measuring Device

Abstract

To provide a dimension measuring device that can be miniaturized.SOLUTION: A first contact 31 is positioned in a first tip arm part 213. A second contact 32 is positioned in a second tip arm part 223. A first detector 4 detects movement of a first base end arm part 211. A second detector 5 detects movement of a second base end arm part 221 of a second lever 22. A first energization part energizes a first lever 21 and the second lever 22 such that the first contact 31 and the second contact 32 touch a measurement object 9. A first support part supports the first lever 21 and the second lever 22 such that the first tip arm part 213 and the second tip arm part 223 travel in an arc shape in a first arrangement direction. The first detector 4 touches a side opposite to the first contact 31 relative to the first lever 21. The second detector 5 touches the same side as the second contact 32 relative to the second lever 22.SELECTED DRAWING: Figure 3

Description

[Technical Field]

[0001] The present invention relates to a dimension measuring device. [Background technology]

[0002] Known devices for measuring the dimensions of workpieces include an electric micrometer with a detector such as a differential transformer. For example, Japanese Patent Application Laid-Open Publication No. 2002-181502 discloses a measuring head used in an outer diameter measuring sizing device for measuring the outer diameter dimensions of workpieces. The measuring head has a pair of base arms. A differential transformer, which serves as a detector, is provided at the base end of the base arm. A measuring arm is connected to the tip of the base arm. A contactor that comes into contact with the workpiece is provided at the tip of the measuring arm. The base arm is supported on a shaft, and the base arm and the measuring arm are rotatable around a rotary support shaft.

[0003] The pair of contacts are positioned facing each other to measure the outer diameter of the workpiece. When the measuring arm and base arm rotate in accordance with the outer diameter of the workpiece, the amount of movement of the base arm is detected by a differential transformer, thereby measuring the outer diameter of the workpiece. [Patent Document 1] Japanese Patent Application Laid-Open No. 2002-181502 Summary of the Invention [Problem to be solved by the invention]

[0004] The measurement head described in JP 2002-181502 A has a pair of differential transformers disposed inside a pair of base arms, and therefore the distance between the pair of base arms must be at least large enough to accommodate the pair of differential transformers.

[0005] Therefore, if the size of the differential transformer or the components associated with the differential transformer increases, the distance between the pair of base arms increases, which may result in an increase in the device size in the direction of the arrangement of the base arms.It is also possible to place each differential transformer outside the pair of base arms, but this also may result in an increase in the size of the device in the direction of the arrangement.

[0006] An object of the present invention is to provide a technique that makes it possible to reduce the size of an apparatus. [Means for solving the problem]

[0007] In order to solve the above problem, there is provided a dimension measuring device capable of measuring the dimensions of an object to be measured, the dimension measuring device comprising: a first lever, a second lever, a first contactor, a second contactor, a first detector, a second detector, a first biasing portion, and a first support portion. The first lever has a first base end arm portion and a first distal arm portion. The first distal arm portion is located on one side of the first base end arm portion in an axial direction. The second lever has a second base end arm portion and a second distal arm portion. The second distal arm portion is located on one side of the second base end arm portion in the axial direction. The second distal arm portion of the second lever is arranged such that it is spaced apart from the first distal arm portion in a first arrangement direction that intersects with the axial direction. The first contactor is located on the first distal arm portion. The second contactor is located on the second distal arm portion. The first detector detects movement of the first base end arm portion. The second detector detects movement of the second base end arm portion of the second lever. The first biasing portion biases the first lever and the second lever so that the first contactor and the second contactor contact the object to be measured. The first support portion supports the first lever and the second lever so that the first distal arm portion and the second distal arm portion move in an arc in the first arrangement direction. The first detector contacts the first lever on the side opposite to the first contactor. The second detector contacts the second lever on the same side as the second contactor. [Effects of the Invention]

[0008] The first and second detectors are arranged on the same side of the first and second base-end arms arranged in the first arrangement direction. This allows one of the first and second detectors to be arranged between the first and second base-end arms, and the other to be arranged outside the first and second base-end arms. Therefore, even when relatively large first and second detectors are used, the device size in the first arrangement direction can be reduced. [Brief explanation of the drawings]

[0009] [Figure 1] FIG. 1 is a diagram showing a dimension measuring device according to a first embodiment. [Figure 2] FIG. 2 is a side view showing the measuring head shown in FIG. [Figure 3] FIG. 2 is a diagram schematically illustrating a measuring head. [Figure 4] FIG. 10 is a schematic configuration diagram showing a dimension measuring device according to a second embodiment. [Figure 5] 5 is a diagram showing another example of the arrangement of the two measuring heads shown in FIG. 4. FIG. [Figure 6] FIG. 10 is a diagram showing a first lever and a second lever according to a third embodiment. [Figure 7] FIG. 10 is a diagram showing a measuring head according to a modified example. DETAILED DESCRIPTION OF THE INVENTION

[0010] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings. Note that the components described in the embodiment are merely examples and are not intended to limit the scope of the present invention. In the drawings, the dimensions and numbers of each part may be exaggerated or simplified as necessary to facilitate understanding.

[0011] In the following description, the direction parallel to the central axis of the measuring head is referred to as the "axial direction," the direction perpendicular to the central axis of the measuring head is referred to as the "radial direction," and the direction along the arc centered on the central axis of the measuring head is referred to as the "circumferential direction." When viewed from one axial side, the counterclockwise direction with respect to the central axis is referred to as the "one circumferential direction," and the clockwise direction with respect to the central axis when viewed from one axial side is referred to as the "other circumferential direction."

[0012] In addition, for each component, the end on one axial side will be referred to as the "one axial end," and the position of the end on one axial side will be referred to as the "one axial end." In addition, for each component, the end on the other axial side will be referred to as the "other axial end," and the position of the end on the other axial side will be referred to as the "other axial end."

[0013] Furthermore, one side in the radial direction toward the central axis is referred to as the "radially inner side" or "radially inner side," and the other side in the radial direction away from the central axis is referred to as the "radially outer side" or "radially outer side." Of the side surfaces of each component, the side surface facing radially inward is referred to as the "inner surface," and the side surface facing radially outward is referred to as the "outer surface."

[0014] 1. First embodiment Fig. 1 is a diagram showing a dimension measuring device 1 of a first embodiment. Fig. 2 is a side view showing the measuring head 2 shown in Fig. 1. Note that Fig. 1 shows a cross-sectional view of a casing 3. Also, Fig. 2 omits the illustration of a first support portion 51.

[0015] The dimension measuring device 1 is a device that measures the dimensions of a measurement object. The dimension measuring device 1 is a device that measures the inner diameter of a measurement object 9 that has a cylindrical shape. The dimension measuring device 1 has a base 11, a casing 3, a measurement head 2, a first electric micrometer 4, and a second electric micrometer 5. The casing 3 has a substantially cylindrical shape that extends in the axial direction. A portion of the measurement head 2 is disposed within the casing 3. The measurement head 2 has a first lever 21, a second lever 22, a first contactor 31, a second contactor 32, a first leaf spring 41, a second leaf spring 42, and a first support portion 51.

[0016] The first lever 21 has a first base end arm portion 211 and a first distal end arm portion 213. The first distal end arm portion 213 is arranged on one axial side of the first base end arm portion 211. The first contactor 31 is arranged at the distal end of the first distal end arm portion 213.

[0017] The first electric micrometer 4 detects the amount of movement (displacement) of the first base-end arm portion 211. The first electric micrometer 4 is a differential transformer type having a differential transformer as a detector. However, the first electric micrometer 4 may be of a type other than a differential transformer type (for example, a capacitance type, a resistance wire strain type, or an inductance type). The first electric micrometer 4 extends in a rod shape along the first arrangement direction. The first electric micrometer 4 is disposed on the other side of the first lever 21 in the first arrangement direction. The tip of the first electric micrometer 4 is in contact with the first base-end arm portion 211 and presses the first base-end arm portion 211 radially outward.

[0018] 1, the first electric micrometer 4 contacts the surface of the first lever 21 opposite to the first contactor 31. Specifically, the first contactor 31 is disposed on a surface of the first distal arm portion 213 on one side in the first arrangement direction. The distal end of the first electric micrometer 4 contacts a surface of the first proximal arm portion 211 on the other side in the first arrangement direction. The first electric micrometer 4 is disposed on the other side in the first arrangement direction relative to the first proximal arm portion 211.

[0019] The first leaf spring 41 biases the first lever 21 so that the first contactor 31 abuts against the inner surface 91 of the measurement object 9. The first leaf spring 41 has a plate shape extending in the axial direction. The first leaf spring 41 has a fixed portion 401 and a movable portion 403. The other axial end of the movable portion 403 is connected to one axial end of the fixed portion 401 via a connecting portion 405. The radial thickness of the connecting portion 405 is thinner than that of the fixed portion 401 and the movable portion 403, making it easy to bend and deform. Therefore, the movable portion 403 can move in an arc in the first arrangement direction with the one axial end of the fixed portion 401 as an axis (movable axis 407 (see FIG. 3)).

[0020] The second lever 22 has a second base end arm portion 221 and a second distal arm portion 223. The second distal arm portion 223 is arranged on one axial side of the second base end arm portion 221. The second distal arm portion 223 is arranged away from the first distal arm portion 213 in the first arrangement direction (more specifically, on the other side of the first arrangement direction).

[0021] The second electric micrometer 5 detects the amount of movement (amount of displacement) of the second base-end arm portion 221. The tip of the second electric micrometer 5 is in contact with the second base-end arm portion 221 and presses the second base-end arm portion 221 radially inward.

[0022] The second electric micrometer 5 is a differential transformer type having a differential transformer as a detector, but the second electric micrometer 5 may be of a type other than the differential transformer type (for example, a capacitance type, a resistance wire strain type, or an inductance type).

[0023] As shown in Fig. 1, the second electric micrometer 5 contacts the surface of the second lever 22 on the same side as the second contactor 32. Specifically, the second contactor 32 is disposed on the surface of the second distal arm portion 223 on the other side in the first arrangement direction. The distal end of the second electric micrometer 5 contacts the surface of the second base arm portion 221 on the other side in the first arrangement direction. The second electric micrometer 5 is disposed on the other side in the first arrangement direction.

[0024] The second leaf spring 42 biases the second lever 22 so that the second contactor 32 abuts against the inner surface 91 of the measurement object 9. The second leaf spring 42 has a plate shape extending in the axial direction. The second leaf spring 42 has a fixed portion 401 and a movable portion 403. The other axial end of the movable portion 403 is connected to one axial end of the fixed portion 401 via a connecting portion 405. The radial thickness of the connecting portion 405 is thinner than that of the fixed portion 401 and the movable portion 403, making it easy to bend and deform. Therefore, the movable portion 403 can move in an arc in the first arrangement direction with one axial end of the fixed portion 401 as an axis (movable axis 407).

[0025] The first support portion 51 supports the first lever 21 and the second lever 22 so that the first distal arm portion 213 of the first lever 21 and the second distal arm portion 223 of the second lever 22 can move in an arc in the first arrangement direction. In this embodiment, the first support portion 51 has a substantially cylindrical shape extending in the axial direction. The first support portion 51 is disposed between the first lever 21 and the second lever 22 in the first arrangement direction.

[0026] The inner surface of the fixed portion 401 of the first leaf spring 41 is fixed to the outer surface of the first support portion 51. The outer surface of the fixed portion 401 faces the inner surface of the first base-end arm portion 211 in the radial direction. A small gap is formed between the outer surface of the fixed portion 401 and the first base-end arm portion 211.

[0027] The outer surface of the movable part 403 of the first leaf spring 41 is fixed to the first base end arm part 211 of the first lever 21. The inner surface of the movable part 403 faces the outer surface of the first support part 51 in the radial direction. A small gap is formed between the inner surface of the movable part 403 and the outer surface of the first support part 51. The first distal arm part 213 can move in the first arrangement direction around one axial end of the fixed part 401 of the first leaf spring 41 as an axis.

[0028] The inner surface of the fixed portion 401 of the second leaf spring 42 is fixed to the outer surface of the first support portion 51. The outer surface of the fixed portion 401 faces radially the inner surface of the second base-end arm portion 221. A small gap is formed between the outer surface of the fixed portion 401 and the second base-end arm portion 221.

[0029] The outer surface of the movable part 403 of the second leaf spring 42 is fixed to the second base end arm part 221 of the second lever 22. The inner surface of the movable part 403 faces the outer surface of the first support part 51 in the radial direction. A small gap is formed between the inner surface of the movable part 403 and the outer surface of the first support part 51. The second distal arm part 223 can move in the first arrangement direction around one axial end of the fixed part 401 of the second leaf spring 42 as an axis.

[0030] The first leaf spring 41 and the second leaf spring 42 are an example of a first biasing portion. Note that the first biasing portion may be realized by a configuration different from that of the first leaf spring 41 and the second leaf spring 42.

[0031] 1 and 2, the first base-end arm 211 extends further toward the other axial direction than the other axial end of the first leaf spring 41. The first electric micrometer 4 contacts the first base-end arm 211 at a position spaced apart from the other axial side of the first leaf spring 41. The second base-end arm 221 extends further toward the other axial side than the other axial end of the second leaf spring 42. The second electric micrometer 5 contacts the second base-end arm 221 at a position spaced apart from the other axial side of the second leaf spring 42.

[0032] 1 and 2, first lever 21 has a first connecting portion 215. First connecting portion 215 connects first base-end arm portion 211 and first distal arm portion 213 so that they are positioned at different positions in the first arrangement direction. First connecting portion 215 extends toward one axial side and in one circumferential direction. Therefore, first distal arm portion 213 is located on one circumferential side relative to first base-end arm portion 211.

[0033] 1 and 2, second lever 22 has a second connecting portion 225. Second connecting portion 225 connects second base-end arm portion 221 and second distal arm portion 223 so that second base-end arm portion 221 and second distal arm portion 223 are disposed at different positions in the first arrangement direction. Second connecting portion 225 extends in one circumferential direction toward one axial side. Therefore, second distal arm portion 223 is located on one circumferential side relative to second base-end arm portion 221.

[0034] The second lever 22 may have the same size and shape as the first lever 21. This allows the first lever 21 and the second lever 22 to be standardized, thereby reducing the number of types of parts constituting the dimension measuring device 1. Furthermore, regardless of whether the first lever 21 and the second lever 22 are disposed on one side or the other side of the first arrangement direction, the first base-end arm portion 211 and the second base-end arm portion 221 can be disposed with a shift in the width direction, as described below. Because the first base-end arm portion 211 and the second base-end arm portion 221 can be disposed with a shift in the width direction, even if the first electric micrometer 4 and the second electric micrometer 5 are disposed on the other side of the first arrangement direction, the first electric micrometer 4 and the second electric micrometer 5 can be disposed so as not to interfere with each other in the width direction and the axial direction.

[0035] As shown in FIG. 2, the second base-end arm portion 221 is arranged offset in the width direction (more specifically, toward the other side in the width direction) perpendicular to the first arrangement direction with respect to the first base-end arm portion 211. Therefore, the first base-end arm portion 211 and the second base-end arm portion 221 are arranged at positions where they do not overlap in the first arrangement direction. This allows the first electric micrometer 4 and the second electric micrometer 5 to be arranged offset in the width direction. In particular, as shown in FIGS. 1 and 2, when the axial direction is defined as height, by arranging the first electric micrometer 4 and the second electric micrometer 5 in the width direction, even if the first electric micrometer 4 and the second electric micrometer 5 are arranged at the same height in the axial direction, the first electric micrometer 4 can be arranged so as not to overlap on the same axial line as the second electric micrometer 5.

[0036] As shown in FIG. 1 , the measuring head 2 has a first adjustment screw 61. The first adjustment screw 61 is inserted into a threaded hole 601 that penetrates the first base-end arm portion 211 of the first lever 21 in the radial direction (first arrangement direction) and engages with the threaded hole 601. The radially inner tip of the first adjustment screw 61 abuts against the outer surface of the first leaf spring 41. The distance between the first base-end arm portion 211 and the leaf spring can be adjusted by tightening or loosening the first adjustment screw 61. Therefore, by adjusting the position of the first adjustment screw 61, the biasing force that the first lever 21 receives from the first leaf spring 41 can be adjusted.

[0037] As shown in FIG. 1 , the measuring head 2 has a second adjustment screw 62. The second adjustment screw 62 is inserted into a threaded hole 601 that penetrates the first base-end arm portion 211 of the second lever 22 in the radial direction (first arrangement direction) and engages with the threaded hole 601. The radially inner tip of the second adjustment screw 62 abuts against the outer surface of the second leaf spring 42. The distance between the second base-end arm portion 221 and the leaf spring can be adjusted by tightening or loosening the second adjustment screw 62. Therefore, by adjusting the position of the second adjustment screw 62, the biasing force that the second lever 22 receives from the second leaf spring 42 can be adjusted.

[0038] The other axial end of the casing 3 is fixed to a surface on one axial side of the base 11. The casing 3 has an opening 301 at one axial end. The first distal arm portion 213 and the second distal arm portion 223 are exposed to the outside of the casing 3 through the opening 301. As a result, the first contactor 31 and the second contactor 32 are disposed outside the casing 3. In addition, one axial end of the first support portion 51 is also exposed to the outside of the casing 3 through the opening 301 of the casing 3. The casing 3 has a pair of holes into which the first electric micrometer 4 and the second electric micrometer 5 are inserted.

[0039] 1, the casing 3 has a pair of through holes 303 in the middle in the axial direction. The through holes 303 penetrate the casing 3 in the radial direction (first arrangement direction). The first adjusting screw 61 and the second adjusting screw 62 overlap with the pair of through holes 303 in the radial direction. Therefore, the user can adjust the first adjusting screw 61 and the second adjusting screw 62 via the pair of through holes 303.

[0040] 2, the first distal arm section 213 is disposed at the same position in the width direction as the second distal arm section 223. The first distal arm section 213 overlaps with the second distal arm section 223 in the first arrangement direction. On the other hand, the first base end arm section 211 is disposed shifted to one side in the width direction with respect to the second base end arm section 221. In other words, the first base end arm section 211 does not overlap with the second base end arm section 221 in the first arrangement direction.

[0041] 2, the center line C11 of the first base end arm portion 211 (a straight line parallel to the axial direction and passing through the center in the width direction) is offset to one side in the width direction with respect to the center line C12 of the first distal arm portion 213. As shown in FIG. 2, the center line C21 of the second base end arm portion 221 is offset to the other side in the width direction with respect to the center line C22 of the second distal arm portion 223.

[0042] 3 is a diagram schematically showing the measuring head 2. When the inner diameter of the measurement object 9 is measured using the dimension measuring device 1, the tip of the measuring head 2 is placed inside the measurement object 9. Then, the first contactor 31 and the second contactor 32 of the measuring head 2 are pressed against the inner surface 91 of the measurement object 9. Then, the inner diameter of the measurement object 9 is measured based on the amount of displacement of the first contactor 31 and the second contactor 32 in the radial direction (first arrangement direction).

[0043] For example, when the first contactor 31 moves radially inward, the first distal arm 213 moves radially inward, and the first proximal arm 211 moves radially outward. The first electric micrometer 4 then detects the radially outward movement of the first proximal arm 211. When the second contactor 32 moves radially inward, the second distal arm 223 moves radially inward, and the second proximal arm 221 moves radially outward. The second electric micrometer 5 then detects the radially outward movement of the second proximal arm 221. In this way, the first electric micrometer 4 and the second electric micrometer 5 detect the radially outward movement of the first proximal arm 211 and the second proximal arm 221, thereby measuring the inner diameter of the measurement object 9.

[0044] By rotating the measurement object 9 about the central axis Q1 relative to the measurement head 2, the first contactor 31 and the second contactor 32 can trace the inner circumference of the inner surface 91 of the measurement object 9. This makes it possible to measure the inner diameter of the measurement object 9 at each position in the circumferential direction. Based on the measurement results of this inner diameter, the roundness or cylindricity of the inner surface 91 of the measurement object 9 can be measured.

[0045] As shown in FIG. 1 , the first electric micrometer 4 and the second electric micrometer 5 are arranged on the same side (the other side) of the first base-end arm portion 211 and the second base-end arm portion 221 arranged in the first arrangement direction. This allows the first electric micrometer 4 to be arranged between the first base-end arm portion 211 and the second base-end arm portion 221, and the second electric micrometer 5 to be arranged outside the first base-end arm portion 211 and the second base-end arm portion 221. Therefore, even if the first electric micrometer 4 and the second electric micrometer 5 are relatively large, the device size in the first arrangement direction can be reduced. Furthermore, the first base-end arm portion 211 and the second base-end arm portion 221 can be brought closer to each other. This allows the device size in the first arrangement direction to be reduced.

[0046] The first electric micrometer 4 is arranged on the other side of the first base arm 211 in the first arrangement direction, opposite the first contactor 31 arranged on one side in the first arrangement direction, and is arranged along the second electric micrometer 5. This configuration makes it possible to reduce the size of the dimension measuring device 1 in the first arrangement direction compared to when the first electric micrometer 4 is arranged on one side of the first base arm 211 in the first arrangement direction.

[0047] 1, the tip end portion of the first electric micrometer 4 is disposed on one side in the first arrangement direction relative to the tip end of the second electric micrometer 5. In other words, the first electric micrometer 4 is disposed offset to one side in the first arrangement direction relative to the second electric micrometer 5. In this case, the device size of the dimension measuring device 1 in the first arrangement direction (radial direction) and width direction can be reduced depending on the length by which the first electric micrometer 4 is offset to one side in the first arrangement direction relative to the second electric micrometer 5.

[0048] 1, the wiring connected to the first electric micrometer 4 and the second electric micrometer 5 can be concentrated on the same side (the other side) in the first arrangement direction, improving the workability of wiring, etc. Furthermore, because the wiring is organized, maintenance of the measurement head 2 becomes easier.

[0049] As shown in Fig. 1, first base end arm section 211 and first distal arm section 213 are connected by first connecting section 215 so that they are disposed at different positions in the first arrangement direction. In this case, the range of measurable dimensions can be changed by appropriately setting the positions of first base end arm section 211 and first distal arm section 213 in the first arrangement direction. For example, in the example shown in Fig. 1, first distal arm section 213 is disposed on the other side in the first arrangement direction (radially inward) relative to first base end arm section 211. This arrangement makes it possible to measure objects with smaller inner diameters.

[0050] 2. Second embodiment Next, a second embodiment will be described. In the following description, elements having the same functions as elements already described will be given the same reference numerals or reference numerals with an additional alphabetical character, and detailed description thereof may be omitted.

[0051] Fig. 4 is a schematic diagram showing the configuration of a dimension measuring device 1A according to the second embodiment. As shown in Fig. 4, the dimension measuring device 1A further includes a measuring head 2A in addition to the measuring head 2 shown in Fig. 1. The measuring head 2A has the same configuration as the measuring head 2.

[0052] The positional relationship of each element constituting the measuring head 2A matches the positional relationship of each element when the measuring head 2 is rotated 180° around the central axis Q1. That is, the measuring heads 2, 2A are plane-symmetric with respect to a plane PL1 that is parallel to the axial direction and passes through the middle of the measuring heads 2, 2A. In the measuring head 2A, the direction in which the second distal arm section 223 is arranged relative to the first distal arm section 213 (second arrangement direction) is parallel to the first arrangement direction.

[0053] The first lever 21, the second lever 22, the first contactor 31, the second contactor 32, the first electric micrometer 4, the second electric micrometer 5, and the first support portion 51 of the measuring head 2A are examples of a third lever, a fourth lever, a third contactor, a fourth contactor, a third detector, a fourth detector, and a second support portion, respectively. The first leaf spring 41 and the second leaf spring 42 of the measuring head 2A are examples of a second biasing portion. The first base-end arm portion 211, the first distal arm portion 213, the second base-end arm portion 221, and the second distal arm portion 223 of the measuring head 2A are examples of a third base-end arm portion, a third distal arm portion, a fourth base-end arm portion, and a fourth distal arm portion, respectively.

[0054] 4, the dimension measuring device 1A is equipped with measuring heads 2 and 2A, and can therefore simultaneously measure the dimensions of two measurement objects 9. Note that the dimension measuring device 1A may also be equipped with three or more measurement heads. In this case, it becomes possible to simultaneously measure the inner diameters of three or more measurement objects 9.

[0055] 4, the first distal arm portion 213 (third distal arm portion) of the measuring head 2A is disposed between the second distal arm portion 223 of the measuring head 2 and the second distal arm portion 223 (fourth distal arm portion) of the measuring head 2A in the first arrangement direction. The first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2 are disposed on the other side in the first arrangement direction with respect to the first base end arm portion 211 of the measuring head 2. The first electric micrometer 4 (third detector) and the second electric micrometer 5 (fourth detector) of the measuring head 2A are disposed on one side in the first arrangement direction with respect to the first base end arm portion 211 (third base end arm portion) of the measuring head 2A.

[0056] 4, the first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2 are drawn out to the other side of the first arrangement direction, while the first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2A are drawn out to one side of the first arrangement direction. In this case, even if the measuring head 2 is brought close to the measuring head 2A, the first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2 can be prevented from interfering with the first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2A. Therefore, the inner diameters of the two measurement objects 9 can be measured while they are brought close to each other.

[0057] 5 is a diagram showing another example of the arrangement of the two measuring heads 2, 2A shown in FIG. 4. In the example shown in FIG. 5, in the measuring head 2A, the direction in which the second distal arm section 223 is arranged relative to the first distal arm section 213 (second arrangement direction) intersects (orthogonal in the illustrated example) the first arrangement direction. Even with this arrangement, when the measuring heads 2, 2A are brought close to each other, it is possible to prevent the first electric micrometer 4 and the second electric micrometer 5 of the measuring head 2A from interfering with each other. Therefore, the inner diameters of the two measurement objects 9 can be measured while they are brought close to each other.

[0058] 3. Third Embodiment FIG. 6 is a diagram showing a first lever 21A and a second lever 22 according to the third embodiment. As shown in FIG. 6, the first base-end arm 211A of the first lever 21A extends further toward the other axial direction than the other axial end of the second base-end arm 221 of the second lever. The first electric micrometer 4 is disposed away from the second electric micrometer 5 toward the other axial direction. In this case, the combined width of the first base-end arm 211 and the second base-end arm 221 can be made smaller than in the arrangement shown in FIG. 2. This allows the device size to be reduced in the width direction.

[0059] 6, first base end arm portion 211 may be arranged at the same position in the width direction as first distal arm portion 213. Also, second base end arm portion 221 may be arranged at the same position in the width direction as second distal arm portion 223. In this case, it is possible to reduce the size of first lever 21 or second lever 22 in the first arrangement direction in the width direction, and therefore it is possible to reduce the size of the device in the width direction.

[0060] <4. Variations> Although the embodiments have been described above, the present invention is not limited to the above and various modifications are possible.

[0061] For example, the dimension measuring device 1, 1A in each of the above embodiments is configured to measure the inner diameter of the measurement object 9. However, the dimension measuring device may also be configured to measure the outer diameter of the measurement object.

[0062] 7 is a diagram showing a measuring head 2B according to a modified example. The measuring head 2B is configured to be able to measure the outer diameter of the measurement target 9A. Specifically, the first contactor 31 and the second contactor 32 are arranged so as to face each other in the first arrangement direction. The first electric micrometer 4 is in contact with the first base-end arm portion 211 on the side opposite to the first contactor (one side in the first arrangement direction). The second electric micrometer 5 is arranged on the same side as the second contactor (one side in the first arrangement direction) with respect to the second base-end arm portion 221.

[0063] According to the measuring head 2B, the first electric micrometer 4 and the second electric micrometer 5 are arranged on the same side (one side) in the first arrangement direction with respect to the first base-end arm portion 211 and the second base-end arm portion 221 arranged in the first arrangement direction. This allows the second electric micrometer 5 to be arranged between the first base-end arm portion 211 and the second base-end arm portion 221, and the first electric micrometer 4 to be arranged outside the first base-end arm portion 211 and the second base-end arm portion 221. Therefore, even if the first electric micrometer 4 and the second electric micrometer 5 are relatively large in size, the device size in the first arrangement direction can be reduced.

[0064] 7, the first electric micrometer 4 and the second electric micrometer 5 can be collected on the same side (one side) in the first arrangement direction, which improves the workability of wiring, etc. Furthermore, the arrangement of the wires is simplified, which makes it easier to maintain the measuring head 2B.

[0065] Although the present invention has been described in detail, the above description is merely illustrative in all respects and does not limit the present invention. It is understood that countless variations not illustrated can be envisioned without departing from the scope of the present invention. The configurations described in the above embodiments and variations can be combined or omitted as appropriate as long as they are not mutually inconsistent. [Industrial Applicability]

[0066] The present invention can be used in a dimension measuring device. [Explanation of symbols]

[0067] 1,1A Dimensional measuring device 2, 2A, 2B measuring head 21,21A First lever 211, 211A First base end arm part 213 First distal arm 215 1st connection part 22 Second Lever 221 Second base end arm part 223 Second distal arm 31 First contact 32 Second contact 4. First electric micrometer (first detector) 41 First leaf spring (first biasing member) 42 second leaf spring (first biasing member) 5. Second electric micrometer (second detector) 51 1st support part 61 First adjustment screw

Claims

1. A dimension measuring device capable of measuring dimensions of a measurement object, a first lever having a first base end arm portion and a first distal arm portion located on one side in the axial direction relative to the first base end arm portion; a second lever including a second base end arm portion and a second distal arm portion located on one side of the second base end arm portion in the axial direction, the second distal arm portion being spaced apart from the first distal arm portion in a first arrangement direction intersecting the axial direction; a first contactor located on the first distal arm; a second contactor located on the second distal arm portion; a first detector that detects movement of the first base end arm portion; a second detector that detects movement of the second base end arm portion; a first biasing portion that biases the first lever and the second lever so that the first contactor and the second contactor come into contact with an object to be measured; a first support portion that supports the first lever and the second lever such that the first distal arm portion and the second distal arm portion move in an arc in a first arrangement direction, the first detector contacts the first lever on a side opposite to the first contactor; the second detector contacts the second lever on the same side as the second contactor; the second base end arm portion extends longer toward the other side in the axial direction than the first base end arm portion, The dimension measuring apparatus, wherein the first detector and the second detector are arranged to overlap each other in the axial direction.

2. A dimension measuring device capable of measuring dimensions of a measurement object, a first lever having a first base end arm portion and a first distal arm portion located on one side in the axial direction relative to the first base end arm portion; a second lever including a second base end arm portion and a second distal arm portion located on one side of the second base end arm portion in the axial direction, the second distal arm portion being spaced apart from the first distal arm portion in a first arrangement direction intersecting the axial direction; a first contactor located on the first distal arm; a second contactor located on the second distal arm portion; a first detector that detects movement of the first base end arm portion; a second detector that detects movement of the second base end arm portion; a first biasing portion that biases the first lever and the second lever so that the first contactor and the second contactor come into contact with an object to be measured; a first support portion that supports the first lever and the second lever such that the first distal arm portion and the second distal arm portion move in an arc in a first arrangement direction, the first detector contacts the first lever on a side opposite to the first contactor; the second detector contacts the second lever on the same side as the second contactor; the first biasing portion is a leaf spring, The dimension measuring device further includes an adjustment screw that engages with a screw hole that passes through the first base end arm portion and adjusts the gap between the first base end arm portion and the leaf spring.

3. 3. The dimension measuring device according to claim 1 or 2, the first lever further has a first connecting portion that connects the first base end arm portion and the first distal end arm portion so that the first base end arm portion and the first distal end arm portion are positioned at different positions in the first arrangement direction.

4. 4. The dimension measuring device according to claim 1, the second base end arm portion is disposed so as to be shifted relative to the first base end arm portion in a direction intersecting the first arrangement direction, The dimension measuring device, wherein the first detector is disposed at a position not overlapping with the second detector in the axial direction.

5. 5. The dimension measuring device according to claim 4, The dimension measuring device, wherein the first lever and the second lever have the same shape.

6. 3. The dimension measuring device according to claim 2, the second base end arm portion extends longer toward the other side in the axial direction than the first base end arm portion, The dimension measuring apparatus, wherein the first detector and the second detector are arranged to overlap each other in the axial direction.

7. 2. The dimension measuring device according to claim 1, the first biasing portion is a leaf spring, The dimension measuring device further includes an adjustment screw that engages with a screw hole that passes through the first base end arm portion and adjusts the gap between the first base end arm portion and the leaf spring.

8. A dimension measuring device capable of measuring the dimensions of a measurement object, a first lever having a first base end arm portion and a first distal arm portion located on one side in the axial direction relative to the first base end arm portion; a second lever including a second base end arm portion and a second distal arm portion located on one side of the second base end arm portion in the axial direction, the second distal arm portion being spaced apart from the first distal arm portion in a first arrangement direction intersecting the axial direction; a first contactor located on the first distal arm; a second contactor located on the second distal arm portion; a first detector that detects movement of the first base end arm portion; a second detector that detects movement of the second base end arm portion; a first biasing portion that biases the first lever and the second lever so that the first contactor and the second contactor come into contact with an object to be measured; a first support portion that supports the first lever and the second lever such that the first distal arm portion and the second distal arm portion move in an arc in a first arrangement direction, the first detector contacts the first lever on a side opposite to the first contactor; the second detector contacts the second lever on the same side as the second contactor; a third lever having a third base end arm portion and a third distal arm portion located on one side of the third base end arm portion in the axial direction; a fourth lever including a fourth base end arm portion and a fourth distal arm portion located on one side of the fourth base end arm portion in the axial direction, the fourth distal arm portion being spaced apart from the third distal arm portion in a second arrangement direction intersecting the axial direction; a third contactor located on the third distal arm portion; a fourth contactor located on the fourth distal arm portion; a third detector that detects movement of the third base end arm portion; a fourth detector that detects movement of the fourth base end arm portion; a second biasing portion that biases the third lever and the fourth lever so that the third contactor and the fourth contactor come into contact with an object to be measured; a second support portion that supports the third lever and the fourth lever so that the third lever and the fourth lever move in an arc in a second arrangement direction, the third detector contacts the third lever on a side opposite to the third contactor, The fourth detector contacts the fourth lever on the same side as the fourth contactor.

9. 9. The dimension measuring device according to claim 8, the third distal arm section is disposed between the second distal arm section and the fourth distal arm section in the first arrangement direction, the first detector and the second detector are disposed on the other side of the first base end arm portion in the first arrangement direction, The dimension measuring device, wherein the third detector and the fourth detector are disposed on one side of the third base end arm portion in the first arrangement direction.

10. 10. The dimension measuring device according to claim 1, the first contactor is located on one side of the first distal arm portion in the first arrangement direction, the first detector is located on the other side of the first base end arm portion in the first arrangement direction, the second contactor is located on the other side of the second distal arm portion in the first arrangement direction, The dimension measuring device, wherein the second detector is located on the other side of the second base end arm portion in the first arrangement direction.

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