Inspection Equipment

Abstract

To provide an inspection device capable of detecting a defocusing and adjusting a focusing position by a simple device with high accuracy.SOLUTION: An inspection device according to an embodiment contains: a stage onto which a sample is mounted; an image acquisition circuit; an estimation circuit; a stage control circuit; and a comparison circuit. The image acquisition circuit acquires a plurality of inspection images based on a secondary electron generated by a plurality of electron beams irradiated toward a first region containing a plurality of sub-regions of a sample. The estimation circuit estimates a rotational amount of an array of the plurality of electron beams irradiated to the first region on the basis of a deviation amount of each position of a plurality of referring images indicating a pattern indicated in each of the plurality of sub-regions and the plurality of inspection images. The stage control circuit controls a focusing position of the plurality of electron beams irradiated to a second region of the sample on the basis of the rotational amount. The comparison circuit compares the plurality of referring images with the plurality of inspection images.SELECTED DRAWING: Figure 6

Description

[Technical Field]

[0001] FIELD An embodiment of the present invention relates to an inspection apparatus. [Background technology]

[0002] In the semiconductor device manufacturing process, an exposure system is used to transfer a pattern onto a photosensitive layer (resist) formed above a semiconductor substrate (also called a "wafer"), and then fine patterns such as insulators and conductive bands are formed through etching and other processes. A mask or reticle is used for this transfer. The mask contains the original pattern of the pattern to be transferred onto the insulator and conductor. To form fine patterns on the insulator and conductor, the original mask pattern must also be fine. For this reason, mask defect inspection systems must have high performance to detect defects in the fine original pattern. As patterns become finer, inspection systems using light such as DUV (Deep Ultraviolet) light have traditionally been widely used, but in the future, inspection systems using EUV (Extreme Ultraviolet) light (actinic inspection) and electron beams are likely to become mainstream.

[0003] Defect inspection can be performed, for example, by comparing an inspection image based on a photographed image of a mask (photographed image) with a reference image based on design data that defines a pattern to be formed on the mask. The defect inspection device generates the inspection image by, for example, extracting the contour lines of the pattern from the photographed image. The defect inspection device detects defects by comparing the contour lines of the pattern in the inspection image with the contour lines of the pattern in the reference image.

[0004] An electron beam can be used to image a mask. That is, imaging involves scanning and irradiating the mask with an electron beam and detecting secondary electrons emitted from the mask as a result of the electron beam irradiation. Accurate imaging of the mask is essential for accurate inspection. The mask surface may have different thicknesses at various positions due to variations in thickness caused by mask polishing, bending of the mask itself, and / or bending caused when the mask is placed on a stage. This can cause the optimal focus position to differ at each position, resulting in defocusing. Accurate imaging of the mask requires accurate detection of the mask height or defocus, and appropriate adjustment of the focus position based on the detection results. Defocusing can be detected, for example, by using a sensor that uses an optical lever to detect the mask's position on the z-axis.

[0005] Cited Document 1 discloses that the focus position is adjusted by setting the optical system of the inspection device.

[0006] Cited documents 2 and 3 disclose techniques relating to measuring the height of a mask using an optical lever. [Prior art documents] [Patent documents]

[0007] [Patent Document 1] Japanese Patent Application Publication No. 2020-087788 [Patent Document 2] Japanese Patent Application Publication No. 2019-113329 [Patent Document 3] Japanese Patent Application Publication No. 2020-203760 Summary of the Invention [Problem to be solved by the invention]

[0008] Sensors that use optical levers are large-scale devices and difficult to handle, and the detection accuracy of sensors that use optical levers is not necessarily sufficient.

[0009] As described as a problem in Patent Document 1, when the settings of the optical system are changed to adjust the focus position, the magnification and / or rotation angle of the captured image change before and after the change. If the magnification and / or rotation angle differ, the captured image also differs. Therefore, simply adjusting the optical system to obtain an accurate captured image is not sufficient; many items, such as the optical system, magnification, and rotation angle, must all be optimized.

[0010] Therefore, there is a demand for an inspection device that is simple and capable of detecting defocus and adjusting the focus position with high accuracy. [Means for solving the problem]

[0011] An inspection apparatus according to one embodiment includes a stage on which a specimen is placed, an image acquisition circuit, an estimation circuit, a stage control circuit, and a comparison circuit. The image acquisition circuit acquires a plurality of inspection images based on secondary electrons generated by a plurality of electron beams irradiated toward a first region including a plurality of subregions of the specimen. The estimation circuit estimates the amount of rotation of the array of the plurality of electron beams irradiated toward the first region based on the amount of positional shift between a plurality of reference images showing patterns formed in the plurality of subregions, respectively, and the plurality of inspection images. The stage control circuit controls the focus positions of the plurality of electron beams irradiated toward a second region of the specimen based on the amount of rotation. The comparison circuit compares the plurality of reference images with the plurality of inspection images. [Effects of the Invention]

[0012] According to the inspection device of the present invention, defocus detection and focus position adjustment can be performed with high accuracy using a simple device. [Brief explanation of the drawings]

[0013] [Figure 1] FIG. 2 is a diagram showing components of the inspection device according to the first embodiment. [Figure 2] FIG. 2 is a diagram showing the structure of a shaping aperture array plate of the inspection device of the first embodiment along the xy plane. [Figure 3] FIG. 2 is a diagram showing an example of a region of a sample inspected by the inspection device of the first embodiment. [Figure 4] FIG. 2 is a diagram showing an example of a rectangular region of a sample to be inspected by the inspection device of the first embodiment. [Figure 5] FIG. 2 is a diagram showing the flow of an inspection performed by the inspection device of the first embodiment. [Figure 6] FIG. 3 is a flowchart showing the flow of acquiring an inspection image by the inspection device of the first embodiment. [Figure 7] 4 is a diagram showing the correspondence between an imaging area and a sub-rectangular area in an inspection by the inspection device of the first embodiment. FIG. [Figure 8] 3A and 3B are diagrams showing correspondence between two types of imaging regions in an inspection by the inspection device of the first embodiment. [Figure 9] FIG. 4 is a diagram showing an example of vectors used in estimating the rotation of the multi-electron beam array performed by the inspection apparatus of the first embodiment. [Figure 10] 5A and 5B are diagrams showing examples of correspondence between rotation angles and z-coordinate correction amounts acquired by the inspection device of the first embodiment. [Figure 11] FIG. 10 is a diagram showing an example of a rectangular region of a sample to be inspected by an inspection device according to a modified example of the first embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0014] Hereinafter, embodiments will be described with reference to the drawings. In some embodiments or different embodiments, multiple components having substantially the same functions and configurations may be distinguished from each other by adding additional numbers or letters to the end of the reference numerals. Any steps in the flow of the method of the embodiments are not limited to the illustrated order, and unless otherwise indicated, may occur in an order different from the illustrated order and / or in parallel with other steps.

[0015] 1 shows the components (configuration) of the inspection device of the first embodiment. As shown in FIG. 1, the inspection device 1 includes an imaging mechanism 2 and a control mechanism 3.

[0016] The imaging mechanism 2 irradiates a charged particle beam (electron beam) onto a sample 8 such as a mask, and acquires an image of the sample 8 by detecting secondary electrons emitted from the sample 8. The control mechanism 3 controls the imaging mechanism 2.

[0017] The imaging mechanism 2 includes a sample chamber 5 and a lens barrel 6. The sample chamber 5 has an internal space and accommodates a sample 8 during inspection. The lens barrel 6 has a cylindrical shape that extends perpendicular to the sample chamber 5. The lens barrel 6 is located above the sample chamber 5. The sample chamber 5 and the lens barrel 6 each have an opening at the surface where they contact each other, and the internal space of the sample chamber 5 and the lens barrel 6 are connected. The space formed by the sample chamber 5 and the lens barrel 6 is maintained in a vacuum (reduced pressure) state using a turbomolecular pump or the like.

[0018] The inspection apparatus 1 includes a stage 11 and stage drive mechanisms 12 and 13 within a sample chamber 5. A sample 8 is placed on the stage 11 during inspection. The stage 11 can move along x- and y-axes that are parallel to and perpendicular to the surface of the stage 11 while holding the sample 8 substantially horizontal. The stage 11 can also move along a z-axis that is perpendicular to the surface of the stage 11. The stage 11 may also be capable of rotating along the x-y plane around the z-axis.

[0019] The stage driving mechanism 12 has a mechanism for moving the stage 11 along the x-axis and y-axis, and may also have a mechanism for rotating the stage 11 along the xy plane around the z-axis.

[0020] The stage driving mechanism 13 has a mechanism for moving the stage 11 along the z-axis. The stage driving mechanism 13 is, for example, a piezo actuator using lead zirconate titanate (PZT).

[0021] The inspection device 1 includes, within the electron tube 6, an electron gun 21, an illumination lens 22, a shaping aperture array plate 23, a reduction lens 24, a limiting aperture array plate 25, an objective lens 26, deflectors 27 and 28, a beam separator 31, projection lenses 32 and 33, and a detector 34.

[0022] When a voltage is applied to the electron gun 21, the electron gun 21 emits an electron beam EB downward along the z axis (in the −z direction). The electron beam EB spreads along the xy plane as it travels along the z axis.

[0023] Illumination lens 22 is an annular electromagnetic lens, and is located below along the z-axis of electron gun 21. Illumination lens 22 changes the trajectory of electron beam EB, which has entered the inside of the ring of illumination lens 22 and spreads in the xy plane, to a direction parallel to the z-axis.

[0024] The shaping aperture array plate 23 is located on the −z side of the illumination lens 22. The shaping aperture array plate 23 has a plurality of apertures. Each aperture has, for example, a rectangular shape along the xy plane. The shaping aperture array plate 23 causes a portion of the electron beam EB entering the shaping aperture array plate 23 to pass through the plurality of apertures and branch into a set of a plurality of electron beams EBA. The set of electron beams EBA may be referred to as a multi-electron beam MEB. Each of the multi-electron beams MEB has, for example, a rectangular shape along the xy plane and travels substantially parallel to the z axis. The shaping aperture array plate 23 will be described further below.

[0025] The reduction lens 24 is an annular electromagnetic lens, and is located on the −z direction side of the shaping aperture array plate 23. The reduction lens 24 focuses the multi-electron beams MEB that have passed through the shaping aperture array plate 23 onto the center of the reduction lens 24.

[0026] The limiting aperture array plate 25 has a plate-like shape extending along the xy plane, and has an aperture at the center of the surface along the xy plane. The aperture is located near the focal point (crossover point) of the multiple electron beams MEB that have passed through the reduction lens 24.

[0027] The objective lens 26 is an annular electromagnetic lens, and is located on the −z side of the reduction lens 24. The objective lens 26 focuses the multi-electron beam MEB on the surface (upper surface) of the sample 8 on the +z side.

[0028] The deflectors 27 and 28 are located on the -z side of the limiting aperture array plate 25 and within the space surrounded by the objective lens 26. The deflector 28 is located on the -z side of the deflector 27. Each of the deflectors 27 and 28 includes multiple pairs of electrodes. FIG. 1 shows only one pair of electrodes to avoid unnecessary clutter. The two electrodes constituting each pair face each other. Each electrode receives a voltage, and each of the deflectors 27 and 28 deflects the multiple electron beam MEB incident thereon along the x-axis and y-axis in response to the application of voltages to the multiple electrodes. In this way, the entire multiple electron beam MEB reaches a specific region on the surface of the sample 8.

[0029] In this way, the illumination lens 22, the shaping aperture array plate 23, the reduction lens 24, the limiting aperture array plate 25, the objective lens 26, the deflector 27, and the deflector 28 allow the multiple electron beam MEB arranged along the xy plane to reach the surface of the sample 8. A set of secondary electrons (multiple secondary electrons) SEm is emitted from the sample 8 due to the sample 8 being irradiated with the multiple electron beam MEB. Each of the multiple secondary electrons SEm is caused by the irradiation of each of the multiple electron beams MEB. Each of the multiple secondary electrons SEm is refracted by the objective lens 26 toward the center of the trajectory of the multiple secondary electrons SEm and passes through the aperture of the limiting aperture array plate 25. The multiple secondary electrons SEm that have passed through the aperture travel in a direction substantially parallel to the z-axis due to the action of the reduction lens 24.

[0030] The beam separator 31 is located between the shaping aperture array plate 23 and the reduction lens 24. The beam separator 31 has, for example, an annular shape. Inside the annulus, the beam separator 31 generates an electric field and a magnetic field perpendicular to each other along the xy plane. The generated electric field and magnetic field exert forces in opposite directions on electrons entering the beam separator 31 from above along the z axis (+z direction), i.e., the multiple electron beam MEB. Therefore, the multiple electron beam MEB is effectively not subjected to the forces of the electric field and magnetic field and travels straight in the -z direction. On the other hand, the electric field and magnetic field exert forces in the same direction on electrons entering the beam separator 31 from the -z direction, i.e., the multiple secondary electrons SEm. Therefore, the multiple secondary electrons SEm are subjected to the forces of the electric field and magnetic field and travel in a direction angled with the z axis.

[0031] The projection lens 32 is an annular electromagnetic lens. The projection lens 32 is located at a position surrounding the trajectory of the multiple secondary electrons SEm that have passed through the beam separator 31 from the -z direction. In other words, a line passing through the center of the ring of the projection lens 32 forms an angle with the z axis. The projection lens 32 changes the trajectory of the multiple secondary electrons SEm that have entered the projection lens 32.

[0032] The projection lens 33 is an annular electromagnetic lens. The projection lens 33 is located at a position surrounding the trajectory of the multiple secondary electrons SEm that have passed through the beam separator 31 from the -z direction. In other words, a line passing through the center of the ring of the projection lens 32 forms an angle with the z axis. The projection lens 33 is aligned with the projection lens 32. The projection lens 33 changes the trajectory of the multiple secondary electrons SEm that have entered the projection lens 32.

[0033] The detector 34 is a device that detects the received electrons. The detector 34 is located on an extension of the trajectory of the multiple secondary electrons SEm that passed through the beam separator 31 from the -z direction. In other words, the surface of the detector 34 that receives electrons forms an angle with the z axis. The detector 34 generates a signal based on the multiple secondary electrons SEm that it received. The signal contains information for generating an image based on the multiple secondary electrons SEm that it received. The detector 34 includes, for example, a photodiode.

[0034] The control mechanism 3 includes a control device 41, a storage device 42, a display device 43, an input device 44, and a communication device 45. The control device 41, the storage device 42, the display device 43, the input device 44, and the communication device 45 are connected to each other, for example, by a bus, and can communicate with each other.

[0035] The control device 41 controls the entire inspection apparatus 1 and inspects the sample 8 for defects. More specifically, the control device 41 controls the imaging mechanism 2 to acquire a secondary electron image or a scanning electron microscope (SEM) image (photographed image). The control device 41 also controls the control mechanism 3 to compare a reference image with an inspection image and detect defects. For example, the control device 41 includes a central processing unit (CPU), a random access memory (RAM), and a read-only memory (ROM), all of which are not shown. For example, the CPU loads a program stored in the ROM or the storage device 42 into the RAM. The CPU interprets and executes the program loaded into the RAM, thereby operating the control device 41. The control device 41 may be, for example, a CPU device such as a microprocessor, or a computer device such as a personal computer. The control device 41 may also include a dedicated circuit (dedicated processor) that executes at least some of the functions of the control device 41. Examples of special-purpose circuits include Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs), and other integrated circuits such as Graphics Processing Units (GPUs).

[0036] The control device 41 controls the imaging mechanism 2. The control device 41 is communicably connected to the imaging mechanism 2. The control device 41 includes an inspection control circuit 411, a stage control circuit 412, a lens control circuit 413, a deflector control circuit 414, a reference image generation circuit 415, an image acquisition circuit 416, an estimation circuit 417, and a comparison circuit 418.

[0037] The inspection control circuit 411, the stage control circuit 412, the lens control circuit 413, the deflector control circuit 414, the reference image generation circuit 415, the image acquisition circuit 416, the estimation circuit 417, and the comparison circuit 418 can each be realized as hardware, computer software, or a combination of both. That is, the inspection control circuit 411, the stage control circuit 412, the lens control circuit 413, the deflector control circuit 414, the reference image generation circuit 415, the image acquisition circuit 416, the estimation circuit 417, and the comparison circuit 418 can each be realized by an integrated circuit such as an ASIC or FPGA, or can be an individual circuit controlled by an integrated circuit such as an ASIC or FPGA. Alternatively, the inspection control circuit 411, the stage control circuit 412, the lens control circuit 413, the deflector control circuit 414, the reference image generation circuit 415, the image acquisition circuit 416, the estimation circuit 417, and the comparison circuit 418 can each be realized by a program (firmware) being executed by a CPU and / or a GPU.

[0038] The inspection control circuit 411 controls the entire inspection of the sample 8. During the inspection, the inspection control circuit 411 controls a stage control circuit 412, a lens control circuit 413, a deflector control circuit 414, a reference image generation circuit 415, an image acquisition circuit 416, an estimation circuit 417, and a comparison circuit 418.

[0039] The stage control circuit 412 detects the position of the stage 11 using a means such as a sensor (not shown). The stage control circuit 412 also receives control data and controls the stage driving mechanisms 12 and 13 based on the received control data. The control data is supplied, for example, from the storage device 42, the input device 44, and / or other circuits in the control device 41. By driving the stage driving mechanisms 12 and 13, the stage 11, and therefore the sample 8, moves to a desired position and height.

[0040] The lens control circuit 413 receives control data and, based on the received control data, controls the illumination lens 22, the reduction lens 24, the objective lens 26, the beam separator 31, and the projection lenses 32 and 33. The control data may be supplied, for example, from the storage device 42, from the input device 44, and / or from other circuits in the control device 41.

[0041] The deflector control circuit 414 receives control data and controls the deflectors 27 and 28 based on the received control data, which may be provided, for example, from the storage device 42, from the input device 44, and / or from other circuits in the control device 41.

[0042] The reference image generation circuit 415 generates a reference image based on design data 421 describing a pattern to be formed on the sample 8. That is, the reference image generation circuit 415 receives the design data 421 from the storage device 42, expands the design data 421 into data for each pattern (figure), and interprets the figure code and figure dimensions, etc., indicating the figure shape, contained in the expanded data. The reference image generation circuit 415 expands (converts) the design data 421 into a binary or multi-value (e.g., 8-bit) image (expanded image) as a pattern to be arranged within a square with a predetermined grid as a unit. The reference image generation circuit 415 calculates the occupancy rate of the figure for each pixel in the expanded image. In this way, the calculated figure occupancy rate for each pixel functions as a gradation value for that pixel. The reference image generation circuit 415 extracts the contour of the pattern in the expanded image based on the gradation value of each pixel to generate a reference image (contour image). The reference image generation circuit 415 transmits the generated reference image to the comparison circuit 418 and the storage device 42.

[0043] The image acquisition circuit 416 controls the imaging mechanism 2 to acquire a secondary electron image of the sample 8. The image acquisition circuit 416 controls the imaging mechanism 2 based on control data. The control data is supplied, for example, from the storage device 42 and / or the input device 44 and / or generated by the image acquisition circuit 416. To acquire the secondary electron image, the image acquisition circuit 416 supplies control data for controlling the stage control circuit 412, the lens control circuit 413, and the deflector control circuit 414 to the stage control circuit 412, the lens control circuit 413, and the deflector control circuit 414. The image acquisition circuit 416 receives secondary electron image data from the detector 34. The image acquisition circuit 416 extracts contour data from the secondary electron image data to generate an inspection image (contour image). The contour data includes information about the contour points of the pattern and the contour lines connecting the contour points. In other words, the contour data includes, for each pixel, representative values ​​of the coordinates through which the contour lines pass, i.e., the contour points, and information about the normal directions of the contour vectors at the contour points. The image acquisition circuitry 416 transmits the generated inspection image to the comparison circuitry 418 and to the storage device 42 .

[0044] The estimation circuit 417 estimates the amount of rotation (angle) of the array of multi-electron beams MEB that has reached the sample 8 based on the reference position of each electron beam EBA of the multi-electron beam MEB and the position of each electron beam EBA of the multi-electron beam MEB that has reached the sample 8 for acquiring an inspection image.

[0045] The comparison circuit 418 compares the inspection image with the reference image to detect defects. More specifically, the comparison circuit 418 aligns the inspection image with the reference image and calculates the amount of misalignment of the inspection image relative to the reference image. Aligning the inspection image with the reference image involves shifting the inspection image to minimize the difference between the inspection image and the reference image using a method for evaluating image coincidence (a pattern matching evaluation method). Examples of pattern matching evaluation methods include SSD (Sum of Squared Difference).

[0046] The comparison circuit 418 measures the distortion of the inspection image based on, for example, variations in the shift amount within the surface of the sample 8, and calculates a distortion coefficient. For example, the distortion amount is expressed by a polynomial model of the coordinates (x, y) within the image, and the distortion coefficient is the coefficient of the polynomial. The comparison circuit 418 compares the inspection image with the reference image using an appropriate algorithm that takes into account the shift amount and the distortion coefficient. If the error between the inspection image and the reference image exceeds a predetermined value, the comparison circuit 418 determines that a defect exists in the sample 8 at the location where the error occurs.

[0047] The storage device 42 is a device including a storage medium that stores data and programs related to defect inspection. The storage device 42 includes RAM and ROM. The storage device 42 may include various storage devices such as a magnetic disk storage device (HDD: Hard Disk Drive) or a solid state drive (SSD) as external storage. The storage device 42 may also include a drive for reading programs stored on a non-transitory storage medium such as a CD (Compact Disc) or a DVD (Digital Versatile Disc).

[0048] The storage device 42 stores design data 421, inspection conditions 422 that specify inspection parameters, and inspection data 423. Examples of parameters of the inspection conditions 422 include the imaging conditions of the imaging mechanism 2, reference image generation conditions, secondary electron image contour extraction conditions, and defect detection conditions. The inspection data 423 includes image data (unfolded image, reference image, secondary electron image, and inspection image) and data related to detected defects (coordinates, size, etc.).

[0049] The storage device 42 stores a defect inspection program 424. The defect inspection program 424 is a program for causing the control device 41 to execute a defect inspection.

[0050] The display device 43 includes a display screen such as an LCD (Liquid Crystal Display) or an EL (Electroluminescence) display, etc. Under the control of the control device 41, the display device 43 displays information such as defect detection results.

[0051] The input device 44 is an input device such as a keyboard, a mouse, a touch panel, or a button switch.

[0052] The communication device 45 is a device for connecting the inspection device 1 to a network in order to transmit and receive data between the inspection device 1 and devices external to the inspection device 1. Various communication standards can be used for communication. For example, the communication device 45 receives design data from an external device and transmits defect inspection results and the like to the external device.

[0053] FIG. 2 shows the structure of the shaping aperture array plate 23 of the inspection apparatus 1 of the first embodiment along the xy plane. As shown in FIG. 2, the shaping aperture array plate 23 extends along the xy plane and has, for example, a rectangular shape. The shaping aperture array plate 23 includes, for example, silicon whose surface is covered with a thin film. The shaping aperture array plate 23 has a plurality of apertures 231. The apertures 231 penetrate two surfaces of the shaping aperture array plate 23 that face each other along the z axis. The apertures 231 are arranged in a matrix along, for example, the x and y axes. The apertures 231 are, for example, square and have substantially the same shape as each other.

[0054] The electron beam EB emitted from the electron gun 21 is shaped by the illumination lens 22 to be parallel along the z-axis, and is incident on the upper surface of the shaping aperture array plate 23. A portion of the incident electron beam EB is blocked by the shaping aperture array plate 23, and the remainder passes through the aperture 231. Due to this selective blocking and passage of the electron beam EB, the electron beam EB is split (multiplied) into a set of multiple electron beams EBA (multi-electron beams) traveling in the -z direction.

[0055] FIG. 3 shows an example of an area of ​​a sample 8 inspected by the inspection apparatus 1 of the first embodiment. The sample (mask) 8 has a pattern (not shown). As shown in FIG. 3, the area to be inspected of the sample 8 has a plurality of stripes 81, which are virtually divided into the plurality of stripes 81. FIG. 3 shows an example in which the sample 8 has N+1 stripes 81_0 to 81_N, where N is a positive odd number. The stripes 81 have a quadrilateral shape extending along the y-axis and are distributed across the xy plane of the sample without overlapping each other. The stripes 81_0 to 81_N are arranged in this order in the direction of decreasing coordinates on the y-axis (-y direction). Each stripe 81 extends near each of the two edges (left and right edges) of the sample 8 aligned along the x-axis. The stripes 81 aligned along the y-axis are in contact with each other.

[0056] Each stripe 81 is composed of a plurality of rectangular regions 83 and is virtually divided into the plurality of rectangular regions 83. FIG. 3 shows an example in which each stripe 81 has M+1 rectangular regions 83_0 to 83_M, where M is a positive integer. The rectangular regions 83_0 to 83_M are arranged in this order in the direction of increasing coordinates on the x-axis (+x direction). Images of the sample 8 are acquired for each rectangular region 83, and images of all rectangular regions 83 are acquired one by one by scanning. FIG. 3 shows an example of the order in which images of the rectangular regions 83 are acquired using thick lines. First, an image of stripe 81_0 is acquired. That is, images of rectangular region 83_m of stripe 81_0 are acquired sequentially in ascending order of m, where m is an integer greater than or equal to 0 and less than or equal to M. Next, an image of stripe 81_1 is acquired. That is, images of rectangular region 83_m of stripe 81_1 are acquired in descending order of m. Similarly, images are acquired in the order of stripes 81_2 to 81_N. In stripes 81_n where n is an integer between 0 and N, images of rectangular region 83_m are acquired sequentially in ascending order of m, i.e., the image acquisition direction is the +x direction, for stripes 81_n where n is an even number. In stripes 81_n where n is an odd number, images of rectangular region 83_m are acquired sequentially in descending order of m, i.e., the image acquisition direction is the -x direction.

[0057] The rectangular region 83 targeted for image acquisition is changed by a relative movement caused by movement of the stage 11. That is, when the image acquisition direction is the +x direction, the stage 11 moves in the -x direction, and when the image acquisition direction is the -x direction, the stage 11 moves in the +x direction.

[0058] FIG. 4 shows an example of a rectangular region 83 of a sample 8 inspected by the inspection apparatus 1 of the first embodiment. As shown in FIG. 4, each rectangular region 83 is made up of I sub-rectangular regions 85, and is virtually divided into I sub-rectangular regions 85. I is an integer greater than or equal to 2. FIG. 4 shows an example where I is 12. The sub-rectangular regions 85 are distributed along the xy plane without overlapping with each other. The sub-rectangular regions 85 are arranged in a matrix along the x-axis and y-axis. As an example, four sub-rectangular regions 85 are arranged along the x-axis, and three sub-rectangular regions 85 are arranged along the y-axis. Adjacent sub-rectangular regions 85 are in contact with each other.

[0059] To acquire an image of the rectangular region 83, the inspection device 1 scans the rectangular region 83 with multiple electron beams MEB. Different electron beams EBA of the multiple electron beams MEB are irradiated toward different sub-rectangular regions 85. Scanning of all sub-rectangular regions 85 in one rectangular region 83 is performed in parallel (simultaneously). In one irradiation (shot) of the multiple electron beams MEB, the multiple electron beams EBA irradiate the same position in each of the multiple sub-rectangular regions 85. Each time a shot is repeated, the position irradiated by the multiple electron beams MEB is changed. By repeatedly changing the irradiation position of the multiple electron beams MEB for each shot, a trajectory of irradiation positions is formed. An example of the trajectory of irradiation positions is indicated by arrows. For example, each electron beam EBA is first irradiated to the position CI with the smallest coordinates on the x-axis and y-axis of the sub-rectangular region 85 targeted for irradiation by that electron beam EBA. Next, each electron beam EBA is irradiated sequentially from position CI in the direction of increasing coordinates on the y-axis (+y direction). Next, at the position in the +x direction, the electron beam EBA is irradiated sequentially in the +y direction from the end on the -y direction side. Similarly, irradiation sequentially from the end on the -y direction side to the +y direction is performed sequentially on the more positive side. When irradiation sequentially in the +y direction at the end on the +x direction side is completed, scanning of the rectangular area 83 is completed, and an image of the rectangular area 83 is thereby acquired.

[0060] The images of all the rectangular areas 83 acquired by the method described above with reference to FIGS. 3 and 4 are combined to acquire an image of the inspection area of ​​the sample 8 .

[0061] Fig. 5 shows the flow of inspection by the inspection device 1 of the first embodiment. The flow of Fig. 5 is performed under the control of the inspection control circuit 411. As shown in Fig. 5, the inspection control circuit 411 controls the imaging mechanism 2 to perform calibration (S1). Through the calibration, the gradation value of the secondary electron image acquired by the image acquisition circuit 416 is adjusted.

[0062] The inspection control circuit 411 acquires an inspection image of the sample 8 (S2). The acquired inspection image is sent to the comparison circuit 418.

[0063] The reference image generation circuit 415 generates a reference image from the design data 421 (S3). More specifically, the reference image generation circuit 415 reads out the design data 421 stored in the storage device 42, and develops the read out design data 421 into an expanded image. The reference image generation circuit 415 generates a reference image from the developed image.

[0064] The comparison circuit 418 performs a comparison (S4). More specifically, the comparison circuit 418 first aligns the inspection image with the reference image, and aligns the pattern in the inspection image with the pattern in the reference image. Next, the comparison circuit 418 compares the inspection image with the reference image. The comparison circuit 418 calculates the difference in the contour positions contained in the inspection image and the reference image, and determines that a pixel whose difference is equal to or greater than a preset threshold is defective.

[0065] The inspection control circuit 411 outputs the comparison result (inspection data) (S5). The inspection control circuit 411 stores the inspection result in the storage device 42. The inspection control circuit 411 may display the inspection result on the display device 43, or may output the inspection result to an external device (e.g., a review device) via the communication device 45.

[0066] 6 shows a flow of acquiring an inspection image by the inspection device 1 of the first embodiment. FIG. 6 shows a detailed flow of step S2 of the flow of FIG.

[0067] 6, the inspection control circuit 411 adjusts the rotation of the array of the multi-electron beam MEB (S11). That is, the optical system (illumination lens 22, reduction lens 24, objective lens 26, etc.) is adjusted so that the rotation of the multi-electron beam MEB is minimized and the beam is focused.

[0068] 6, the inspection control circuit 411 controls the image acquisition circuit 416 to acquire an inspection image of the rectangular adjustment area 83 (rectangular adjustment area 83A) using the multi-electron beam MEB (S12). The rectangular adjustment area 83A may be, for example, the first rectangular area 83_0 of the first stripe 81_0, or may be any rectangular area 83 in which a pattern dedicated to adjustment is formed when the first rectangular area 83_0 of the first stripe 81_0 does not include a required pattern (for example, when no pattern is included in the area scanned by a specific beam).

[0069] The inspection control circuit 411 aligns the inspection image obtained in step S12 with a reference image obtained from design data that defines the pattern of the adjustment rectangular region 83A, and obtains the positions (coordinates) reached by each electron beam EBA in the first shot that is irradiated in parallel onto all the sub-rectangular regions 85 of the adjustment rectangular region 83A (S13). Specifically, this is as follows.

[0070] 7, the area (photographed area) 51 from which a secondary electron image is acquired may be misaligned with the sub-rectangular area 85 from which the image is originally acquired. The direction and magnitude of the misalignment are indicated by arrows. The arrows indicate the misalignment between each sub-rectangular area 85 and the photographed area 51 from which an image is acquired by the electron beam EBA for photographing this sub-rectangular area 85. The arrows, i.e., the direction and position of the misalignment, can be expressed as vectors.

[0071] If there is a misalignment between the inspection image of the adjustment rectangular area 83A and the corresponding reference image, the shape of the inspection image will differ from the shape of the reference image acquired from the design data that defines the pattern of the adjustment rectangular area 83A. Hereinafter, the reference image acquired from the design data that defines the pattern of the target area from which a certain inspection image was acquired, i.e., the area to which the multi-electron beam MEB was directed to acquire the inspection image, will be referred to as the "corresponding reference image."

[0072] The inspection control circuit 411 causes the comparison circuit 418 to align the inspection image with the corresponding reference image. That is, the inspection control circuit 411 causes the comparison circuit 418 to calculate the amount of movement of the inspection image that minimizes the deviation of the inspection image from the corresponding reference image while sequentially changing the position of the inspection image. This allows the amount of movement of the inspection image that minimizes the deviation between the inspection image and the reference image to be obtained. The amount of movement is the amount of deviation (misalignment amount) between the area from which the inspection image was acquired and the adjustment area, and is a two-dimensional vector consisting of the amount of misalignment on the x-axis and the amount of misalignment on the y-axis.

[0073] The deviation of the generated inspection image from the corresponding reference image means that the position (coordinate) PR(x,y) where the multiple electron beams MEB used to acquire the inspection image reach the adjustment rectangular area 83A is deviated from the position PT(x,y) where they should reach if there is no deviation (rotation), as shown in FIG. 7 . Therefore, the amount of positional deviation between the area where the inspection image is acquired and the adjustment rectangular area 83A represents the deviation from the position PT(x,y) where each electron beam EBA should reach. Therefore, the position (coordinate) PR(x,y) where each electron beam EBA of the multiple electron beam MBE reaches in the first shot used to acquire the inspection image of the adjustment rectangular area 83A is determined by the sum of the position (coordinate) PT(x,y) where the electron beam EBA should reach if there is no deviation (rotation) and the amount of positional deviation. Hereinafter, the position PR(x,y) will be referred to as the electron beam initial position PR(x,y). The components x and y are the coordinates on the x-axis and the y-axis, respectively, of the electron beam initial position PR(x,y). As a result of step S13, the electron beam initial position PR(x,y) in each sub-rectangular area 85 of the adjustment rectangular area 83A is obtained. The electron beam initial position PR(x,y) in a certain sub-rectangular area 85_i of the adjustment rectangular area 83A is referred to as the electron beam initial position PR_i(x,y). i is an integer between 0 and I. As a result of step S13, the electron beam initial position PR_i(x,y) is obtained for all cases where i is between 0 and I.

[0074] The test control circuit 411 sets variables n and m to 0 (S21).

[0075] The inspection control circuit 411 controls the image acquisition circuit 416 to acquire an inspection image of the rectangular region 83_m of the stripe SP_n using the multi-electron beam MEB (S22). Hereinafter, the inspection image of the rectangular region 83_m of the stripe SP_n may be referred to as an inspection image IM_n_m.

[0076] The inspection control circuit 411 aligns the inspection image IM_n_m with the corresponding reference image to obtain the amount of misalignment of the inspection image IM_n_m (S23). That is, the inspection control circuit 411 uses the comparison circuit 418 to obtain the amount of movement of the inspection image IM_n_m that minimizes the misalignment between the inspection image IM_n_m and the corresponding reference image. The amount of movement is the amount of displacement (misalignment amount) of the area from which the inspection image was acquired from the sub-rectangular area 85, and is a two-dimensional vector consisting of the amount of misalignment on the x-axis and the amount of misalignment on the y-axis.

[0077] The inspection control circuit 411 obtains the position (coordinates) of each electron beam EBA that reaches the rectangular region 83_m of the stripe SP_n in the first shot, using the same principle as described above for step S13. The position that each electron beam EBA reaches in the first shot in a certain sub-rectangular region 85_i of the rectangular region 83_m of the stripe SP_n, obtained by step S13, is referred to as the electron beam position PS_i(x,y). The components x and y are the coordinates on the x-axis and the y-axis of the electron beam position PS_i(x,y), respectively. As a result of step S23, the electron beam position PS_i(x,y) is obtained for all cases where i is between 0 and I.

[0078] The inspection control circuit 411 uses the electron beam initial position PR_i(x,y) and the electron beam position PS_i(x,y) to estimate the rotation angle of the array of the multi-electron beam MEB that has reached the rectangular region 83_m of the stripe SP_n (S24). The estimation of the rotation angle of the array of the multi-electron beam MEB will be described in detail later.

[0079] The inspection control circuit 411 uses the estimation circuit 417 to estimate the amount of defocus (the height of the surface of the sample 8) when acquiring a secondary electron image of the rectangular region 83_m of the stripe SP_n from the rotation angle (S25). The array of the multi-electron beam MEB can be rotated by the strong magnetic field of the objective lens 26. When the array of the multi-electron beam MEB rotates, the focus depth (position) of each electron beam EBA of the multi-electron beam MEB changes. Therefore, the amount of defocus for the rectangular region 83_m of the stripe SP_n can be determined from the rotation angle.

[0080] The inspection control circuit 411 determines the correction amount (z-coordinate correction amount) for the z-coordinate of the sample 8 from the defocus amount (S26). The defocus can be reduced by adjusting the z-coordinate of the sample 8. Therefore, from the defocus amount, the amount of z-coordinate correction that is sufficient to substantially cancel out this defocus amount can be determined. The method for determining the z-coordinate correction amount will be described in detail later. The z-coordinate correction amount is used to adjust the focus position outside the rectangular region 83_m of the stripe SP_n.

[0081] The inspection control circuit 411 determines whether the rectangular region 83_m is the rectangular region 83 in the stripe SP_n for which the z-coordinate correction amount was last estimated (S31). That is, the inspection control circuit 411 determines whether inspection images of all rectangular regions 83_m in the stripe SP_n have been acquired. For example, the inspection control circuit 411 counts the number of inspection images acquired in the current stripe SP, and if the counting result is M, it can determine that inspection images of all rectangular regions 83_m have been acquired. Alternatively, the inspection control circuit 411 can determine that inspection images of all rectangular regions 83_m have been acquired if m=M when the variable n is an even number, or if m=0 when the variable n is an odd number.

[0082] If it is not the last rectangular region 83 (S31_No), the inspection control circuit 411 determines whether inspection images are being acquired sequentially in the +x direction in the current stripe SP (stripe SP_n) (S32). For example, if the variable n is an even number, the inspection control circuit 411 can determine that inspection images are being acquired sequentially in the +x direction. On the other hand, if the variable n is an odd number, the inspection control circuit 411 can determine that inspection images are being acquired sequentially in the -x direction.

[0083] If inspection images have been acquired sequentially in the +x direction (S32_Yes), the inspection control circuit 411 increments the variable m by 1 to set m=m+1 (S33). If inspection images have not been acquired sequentially in the +x direction (S32_No), the inspection control circuit 411 decrements the variable m by 1 to set m=m-1 (S34).

[0084] If it is the last rectangular area 83 (S31_Yes), the inspection control circuit 411 determines whether stripe SP_n is the stripe SP for which the inspection image was last acquired (S36). That is, the inspection control circuit 411 determines whether the inspection images of all stripes SP have been acquired. For this purpose, for example, the inspection control circuit 411 can determine whether n=N. If the inspection image of the last stripe SP has been acquired (S36_Yes), the processing ends. If the inspection image of the last stripe SP has not been acquired (S36_No), the inspection control circuit 411 increments the variable n by 1 to make n=n+1 (step S37).

[0085] Steps S33, S34, and S37 are continued in step S38. In step S38, the inspection control circuit 411 adjusts the focus amount of the multi-electron beam MEB for acquiring an inspection image of the rectangular region 83_m of the stripe SP_n (S38). The adjustment takes into account the z-coordinate correction amount estimated for the rectangular region 83 other than the rectangular region 83_m of the stripe SP_n. For example, the inspection control circuit 411 uses the z-coordinate correction amount for the rectangular region 83_m of the stripe SP_n-1. More specifically, the inspection control circuit 411 adds the z-coordinate correction amount for the rectangular region 83_m of the stripe SP_n-1 to the focus position (z coordinate) predetermined for the rectangular region 83_m of the stripe SP_n. A z coordinate equal to the sum thus obtained is used during acquisition of the inspection image of the rectangular region 83_m of the stripe SP_n. The z-coordinate correction amount for the rectangular region 83_m other than the previous stripe SP_n-1 may also be added. Furthermore, when adjusting the focus position of the rectangular region 83_m of the stripe SP_n, the z-coordinate correction amount for the previous rectangular region 83_m may be added. For example, when inspection images are acquired sequentially in the +x direction, the z-coordinate correction amount for the rectangular region 83_m-1 of the stripe SP_n is added, and when inspection images are acquired sequentially in the -x direction, the z-coordinate correction amount for the rectangular region 83_m+1 of the stripe SP_n is added. Step S38 continues to step S22.

[0086] The estimation of the rotation angle performed in step S24 will be described with reference to FIGS. 8 and 9. FIG. 8 shows the correspondence between two types of imaging areas in the inspection by the inspection apparatus 1 of the first embodiment, namely, the imaging area for the adjustment rectangular area 83A and the imaging area for the rectangular area to be estimated. As shown in FIG. 8 and described above with reference to FIG. 6, at the start of step S24, the initial electron beam position PR_i(x,y) and the electron beam position PS_i(x,y) for each electron beam EBA have already been acquired. The area 55 in FIG. 8 is the imaging area where the electron beam position PS_i(x,y) is acquired, and is located at a different position from the imaging area 51 where the initial electron beam position PR_i(x,y) is acquired due to the rotation of the array of the multiple electron beams MEB.

[0087] From the electron beam initial position PR_i(x,y) and the electron beam position PS_i(x,y), as shown in FIG. 8, a vector from the electron beam initial position PR_i(x,y) to the electron beam position PS_i(x,y) for each electron beam EBA is calculated.

[0088]

number

[0089] is obtained. Vector

[0090]

number

[0091] can function as a vector indicating the deviation of the entire array of multiple electron beams irradiated toward the sub-rectangular region 85_i from the coordinates at which it should originally arrive (that is, the deviation between the imaging region 51 and the region 55).

[0092] FIG. 9 shows an example of vectors used in estimating the rotation of the multi-electron beam array performed by the inspection apparatus 1 of the first embodiment. As shown in FIG. 9, a center point CP1 is defined. The center point CP1 here corresponds to the point where the so-called "optical axis" of the optical system penetrates the surface (top surface) of the sample 8, and is adjusted to coincide with the center point of all (12 in the current example) sets of imaging regions 51. Furthermore, for all cases where i is 0 or more and I or less, the vector from the center point CP1 to the center point CP2 of each region 55 is

[0093]

number

[0094] 9 is a vector showing the deviation between the imaging area 51 and the area 55 described above with reference to FIG.

[0095]

number

[0096] are also shown as vectors starting from each center point CP2.

[0097] According to Equation 1, the rotation angle θ for each electron beam EBA i is calculated.

[0098]

number

[0099] According to Equation 2, the rotation angle θ of the electron beam EBA is i is calculated as the rotation angle Δθ of the array of the multi-electron beam MEB.

[0100]

number

[0101] The rotation angle of the multi-electron beam MEB array and the z-coordinate correction amount are described with reference to FIG. 10 . FIG. 10 shows an example of the correspondence between the rotation angle and the z-coordinate correction amount acquired by the inspection apparatus 1 of the first embodiment. Rotation of the multi-electron beam MEB array causes defocusing of each electron beam EBA. The rotation angle and the amount of defocus are proportional to each other based on the strength of the magnetic field of the objective lens 26, the distance of each electron beam EBA from the center of the multi-electron beam MEB array, the electron charge, and the electron mass. Therefore, defocus can be corrected by adjusting the z-coordinate of the sample 8. That is, the amount of defocus corresponds one-to-one to the z-coordinate correction amount Δz, which essentially cancels out the amount of defocus. Therefore, the rotation angle Δθ and the z-coordinate correction amount Δz can be determined. The z-coordinate correction amount Δz can be calculated from the rotation angle Δθ using Equation 3.

[0102]

number

[0103] where e is the charge of an electron and m e is the mass of the electron, Φ is the electric field potential, and B is the magnetic field due to the objective lens 26.

[0104] 6, each time an inspection image is acquired, the z-coordinate correction amount is acquired successively for each rectangular region 83. Thus, as shown in FIG. 10, the z-coordinate correction amount Δz_n_m for each rectangular region 83_m of stripe SP_n is acquired sequentially in parallel with the acquisition of the inspection image.

[0105] According to the first embodiment, the defocus amount can be detected with high accuracy. The accuracy of detecting the defocus amount using a general sensor that uses an optical lever is on the order of several hundred nanometers. On the other hand, the accuracy according to the first embodiment is as follows: For example, the circumferential positional deviation due to rotation of the multi-electron beam MEB array is Δθ = 515.8 × Δz when, for example, B = 0.11 [T] and Φ = 1000 [eV]. For example, if the spacing between the electron beams EBA of the multi-electron beam MEB that arrive at the sample 8 is 9 [μm] and the multi-electron beam MEB includes electron beams EBA arranged in an 11 × 11 array, the distance from the center of the electron beam EBA to the corner of the multi-electron beam MBE array is 63.6 [μm]. For example, assume that the size of one pixel is 7 [nm] × 7 [nm], and the SSD can detect a positional deviation of 0.1 pixel. This means that a rotation of 0.7 nm / 63.6 μm ≒ 11 μrad can be detected. Therefore, the defocus amount when Δθ is 11 μrad, i.e., the z-coordinate correction amount Δz, is approximately 21 nm. This is significantly higher than the accuracy of sensors that use optical levers. Furthermore, the z-coordinate correction amount can be calculated without using a large-scale device like a sensor that uses an optical lever, and defocus can be easily adjusted.

[0106] Furthermore, according to the first embodiment, defocus correction is performed by correcting the z-coordinate of the sample 8, and no change in the settings of the optical system is required. Therefore, there is no need to adjust the magnification and rotation angle that would result from adjusting the optical system, and there is no need to readjust the optical system due to the adjustment of the magnification and rotation angle. This makes it possible to easily adjust defocus.

[0107] Up to this point, an example has been described in which the inspection apparatus 1 uses a multi-electron beam MEB. However, the inspection apparatus 1 may also use a single electron beam. In this case, instead of multiple electron beams EBA multiplied by the shaping aperture array plate 23 being irradiated in parallel onto the sample 8, a single electron beam EBA is used. Hereinafter, such an electron beam may be referred to as a single electron beam EBA.

[0108] When a single electron beam EBA is used, the entire rectangular region 83 is irradiated by the single electron beam EBA, as shown in Fig. 11. An example of the locus of irradiation positions is similar to that when a multi-electron beam MEB is used (Fig. 4), that is, the locus of irradiation positions for each sub-rectangular region 85 by the multi-electron beam MEB has a form that is expanded to the entire rectangular region 83.

[0109] Even when using a single electron beam EBA, the rotation angle θ and z-coordinate correction amount Δz for each rectangular region 83 are obtained from the electron beam initial position PR(x, y) of the single electron beam EBA and the electron beam position PS(x, y) for each rectangular region 83.

[0110] The present invention is not limited to the above-described embodiments, and various modifications can be made in the implementation stage without departing from the spirit of the invention. Furthermore, the embodiments may be implemented in appropriate combinations, in which case the combined effects can be obtained. Furthermore, the above-described embodiments include various inventions, and various inventions can be extracted by combining selected elements from the disclosed elements. For example, if the problem can be solved and the desired effect can be obtained even if some elements are deleted from all elements shown in the embodiments, the configuration from which these elements are deleted can be extracted as an invention. [Explanation of symbols]

[0111] 1...inspection device, 2...imaging mechanism, 3...control mechanism, 5...sample chamber, 6...optical column, 8...sample, EB...electron beam, EBA...electron beam, MEB...multi-electron beam, 11...stage, 12...stage drive mechanism, 13...stage drive mechanism, 21...electron gun, 22...illumination lens, 23...shaping aperture array plate, 24...reduction lens, 25...limiting aperture array plate, 26...objective lens, 27...deflector, 28...deflector, 31...beam separator, 32...projection lens, 33...projection lens, 34...detector, 41...control device, 411...inspection control circuit, 412...stage control circuit, 413...lens control circuit, 414...deflector control circuit, 415...reference image generation circuit, 416...image acquisition circuit, 417...estimation circuit, 418...comparison circuit, 42...storage device, 43...display device, 44...input device, 45...communication device

Claims

1. a stage on which a sample is placed; an image acquisition circuit for acquiring a plurality of inspection images based on secondary electrons generated by a plurality of electron beams irradiated toward a first region including a plurality of subregions of the sample; an estimation circuit that estimates an amount of rotation of the array of the plurality of electron beams irradiated onto the first region based on an amount of misalignment between a plurality of reference images showing patterns formed in the plurality of sub-regions, respectively, and the plurality of inspection images; a stage control circuit that controls a focus position of the plurality of electron beams that are irradiated onto a second region of the sample based on the amount of rotation; a comparison circuit for comparing the plurality of reference images with the plurality of inspection images; An inspection device comprising:

2. the plurality of inspection images are based on secondary electrons generated by the plurality of electron beams irradiated one-to-one onto the plurality of sub-regions, respectively; The inspection device according to claim 1 .

3. The estimation circuit estimating a plurality of first positions in the first region at which the plurality of electron beams have reached, based on an amount of positional deviation between each of the plurality of inspection images and one of the plurality of reference images; estimating the amount of rotation based on the amount of deviation between a plurality of initial positions of each of the plurality of electron beams and the plurality of first positions; The inspection device according to claim 2 .

4. the image acquisition circuit acquires a plurality of second inspection images based on secondary electrons generated by the plurality of electron beams irradiated toward a third region including a plurality of second sub-regions of the specimen; an inspection control circuit configured to estimate the initial positions of the electron beams based on an amount of positional deviation between a plurality of second reference images representing patterns formed in the second sub-regions, respectively, and the plurality of second inspection images; The inspection device according to claim 3 .

5. the image acquisition circuit acquires, for each of a plurality of regions arranged along a first axis of the specimen and each including a plurality of sub-regions, a plurality of inspection images based on secondary electrons generated by a plurality of electron beams irradiated toward each of the plurality of regions; the estimation circuit estimates the amount of rotation of the array of the plurality of electron beams irradiated onto each of the regions based on the amount of positional deviation between the plurality of reference images showing patterns respectively formed in the plurality of sub-regions of each of the regions and the plurality of inspection images; The inspection device according to any one of claims 1 to 4.

6. a stage on which a sample is placed; an image acquisition circuit for acquiring an inspection image based on secondary electrons generated by an electron beam irradiated toward a first region of the sample; an estimation circuit that estimates an amount of rotation of the electron beam irradiated onto the first area based on an amount of positional deviation between a reference image showing a pattern formed in the first area and the inspection image; a stage control circuit that controls a focus position of the electron beam irradiated onto a second region of the sample based on the amount of rotation; a comparison circuit for comparing the reference image with the inspection image; An inspection device comprising:

7. the image acquisition circuit acquires, for each of a plurality of regions arranged along a first axis of the specimen, a plurality of inspection images based on secondary electrons generated by an electron beam irradiated toward each of the plurality of regions; the estimation circuit estimates the amount of rotation of the electron beam irradiated onto each of the regions based on the amount of positional deviation between a reference image showing a pattern formed in each of the regions and the inspection image. The inspection device according to claim 6.

Images