Measuring equipment

Abstract

To improve work efficiency of material property measurement.SOLUTION: A measurement device 1 is provided, comprising first fixture 30 comprising a first fixing part 31 to be fixed to a surface F1 of a test piece TP and a first contact part 32 to be in contact with the surface F1 of the test piece TP; a second fixture 40 comprising a second fixing part 41 to be fixed to the surface F1 of the test piece TP and a second contact part 42 to be in contact with the surface F1 of the test piece TP; and a displacement sensor 50 provided on at least either of the first contact part 32 and the second contact part 42.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to a measurement device. [Background technology]

[0002] Measuring devices are widely used to measure the physical properties of various materials such as metal materials, resin materials, etc. For example, as disclosed in Patent Document 1, there is a tensile testing device that holds both ends of a test piece, applies a tensile load to the test piece, and detects the amount of displacement of the deformed portion of the test piece. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2002-195805 Summary of the Invention [Problem to be solved by the invention]

[0004] In measuring material properties, in addition to detecting the displacement of a test piece, optical measurement may also be performed, in which an image of the test piece is captured and the resulting image data is used to measure the properties. In this case, a jig is used in the measurement device to attach a displacement sensor to the test piece. In conventional measurement devices, both sides of the test piece are covered by the jig, making it difficult to simultaneously detect the displacement of the test piece and perform optical measurement, reducing work efficiency.

[0005] An object of the present disclosure is to provide a measurement device that can improve the work efficiency of measuring material properties. [Means for solving the problem]

[0006] In order to solve the above problem, the measuring device of the present disclosure includes a first fixing portion fixed to a surface of a test piece, and a second fixing portion abutting against the surface of the test piece. and is supported by the first fixed part. a first jig having a first contact portion, a second fixing portion fixed to the surface of the test piece, and a second fixing portion that abuts against the surface of the test piece; and is supported by the second fixed part. a second jig having a second contact portion, and a displacement sensor provided on at least one of the first contact portion and the second contact portion. The first and second fixing portions are bonded to the test piece. .

[0007] The first contact portion and the second contact portion may have a sharp portion on the test piece side.

[0008] The first abutment portion may be arranged to be movable relative to the first fixing portion in a direction intersecting the surface of the test piece, and the second abutment portion may be arranged to be movable relative to the second fixing portion in a direction intersecting the surface of the test piece.

[0009] The device may further include biasing members that bias the first contact portion and the second contact portion toward the test piece.

[0010] The first fixing portion may be located on the opposite side of the first contact portion from the second jig side, and the second fixing portion may be located on the opposite side of the second contact portion from the first jig side. [Effects of the Invention]

[0012] According to the present disclosure, it is possible to improve the work efficiency of measuring material properties. [Brief explanation of the drawings]

[0013] [Figure 1] FIG. 1 is a plan view showing a schematic configuration of a measurement device according to an embodiment of the present disclosure. [Figure 2] FIG. 2 is a side view showing a schematic configuration of the measurement device according to the embodiment of the present disclosure. [Figure 3] FIG. 3 is an exploded perspective view showing a first jig of the measurement device according to the embodiment of the present disclosure. [Figure 4] FIG. 4 is a perspective view showing the first jig after the measurement device according to the embodiment of the present disclosure has been installed. [Figure 5] FIG. 5 is an exploded perspective view showing a first jig of a measuring device according to a first modified example. [Figure 6] FIG. 6 is a perspective view showing the first jig after the measurement device according to the first modified example is installed. [Figure 7] FIG. 7 is an exploded perspective view showing a first jig of a measuring device according to a second modified example. [Figure 8] FIG. 8 is a perspective view showing the first jig after the measurement device according to the second modified example is installed. DETAILED DESCRIPTION OF THE INVENTION

[0014] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. Dimensions, materials, and other specific numerical values ​​shown in the embodiments are merely examples for ease of understanding and, unless otherwise specified, do not limit the present disclosure. In this specification and drawings, elements having substantially the same functions and configurations are designated by the same reference numerals to avoid redundant explanation, and elements not directly related to the present disclosure are not shown.

[0015] FIG. 1 is a plan view showing the schematic configuration of a measuring device 1 according to this embodiment. FIG. 2 is a side view showing the schematic configuration of the measuring device 1 according to this embodiment. The measuring device 1 is an apparatus for measuring the physical properties of a flat test piece TP. However, the test piece TP may have a shape other than a flat plate as long as it has a surface formed on at least a portion thereof. In FIGS. 1 and 2, the longitudinal direction D1, width direction D2, and thickness direction D3 of the test piece TP are indicated by arrows. FIG. 1 shows the test piece TP as viewed in the thickness direction D3. FIG. 2 shows the test piece TP as viewed in the width direction D2. The test piece TP is placed, for example, with the longitudinal direction D1 aligned vertically. For example, the upward direction in FIGS. 1 and 2 corresponds to the vertically upward direction.

[0016] As shown in FIG. 1, the test piece TP extends in a longitudinal direction D1. The width of the test piece TP, which is the length in a width direction D2, is basically substantially constant. However, the test piece TP has a narrow portion P1 in a certain section in the longitudinal direction D1, where the width is narrower than the other sections. In measurements using the measuring device 1, the test piece TP is pulled in the longitudinal direction D1, and the amount of displacement of the narrow portion P1, which is the deformed area, is detected. Then, various material properties of the test piece TP are measured using the detection results of the amount of displacement of the narrow portion P1.

[0017] In the following, an example will be described in which the measuring device 1 is a tensile testing device. In this case, Young's modulus, Poisson's ratio, yield strength, etc. of the test piece TP are measured as material properties. However, the measuring device 1 is not limited to a tensile testing device as long as it is a device that can measure the material properties of the test piece TP using the detection results of the displacement amount of the narrow portion P1. For example, the measuring device 1 may be a fatigue testing device.

[0018] As shown in FIGS. 1 and 2, the measurement device 1 includes a first gripping unit 10, a second gripping unit 20, a first jig 30, a second jig 40, a displacement sensor 50, a camera 60, and a control device 70.

[0019] The first gripping unit 10 grips one end of the test piece TP in the longitudinal direction D1. The second gripping unit 20 grips the other end of the test piece TP in the longitudinal direction D1. The first gripping unit 10 and the second gripping unit 20 are relatively movable in the longitudinal direction D1. For example, the position of the first gripping unit 10 in the longitudinal direction D1 is fixed, and the second gripping unit 20 is movable in the longitudinal direction D1. With both ends of the test piece TP gripped by the first gripping unit 10 and the second gripping unit 20, the second gripping unit 20 moves in the longitudinal direction D1 away from the first gripping unit 10, thereby applying a tensile load in the longitudinal direction D1 to the test piece TP. Note that the second gripping unit 20 may be fixed, and the first gripping unit 10 may be movable. Alternatively, both the first gripping unit 10 and the second gripping unit 20 may be movable.

[0020] The first jig 30, the second jig 40, and the displacement sensor 50 are provided to detect the amount of displacement of the narrow portion P1 of the test piece TP. The amount of displacement of the narrow portion P1 is detected by the displacement sensor 50. The first jig 30 and the second jig 40 are provided to attach the displacement sensor 50 to the test piece TP.

[0021] The first jig 30 and the second jig 40 are fixed to one surface F1 of the test piece TP. The surface F1 is one of the surfaces of the test piece TP extending in the longitudinal direction D1 and the width direction D2. Specifically, the first jig 30 and the second jig 40 are fixed to an area of ​​the surface F1 of the test piece TP that is included in the narrow width portion P1.

[0022] The first jig 30 has a first fixing portion 31 and a first contact portion 32. The first fixing portion 31 is fixed to the surface F1 of the test piece TP. The first contact portion 32 contacts the surface F1 of the test piece TP. In other words, the first contact portion 32 is in direct contact with the surface F1 of the test piece TP. The first contact portion 32 is supported by the first fixing portion 31. The second jig 40 has a second fixing portion 41 and a second contact portion 42. The second fixing portion 41 is fixed to the surface F1 of the test piece TP. More specifically, the second fixing portion 41 is fixed at a position on the surface F1 of the test piece TP that is different from the position at which the first fixing portion 31 is fixed. The second contact portion 42 contacts the surface F1 of the test piece TP. In other words, the second contact portion 42 is in direct contact with the surface F1 of the test piece TP. Specifically, the second contact portion 42 contacts a position on the surface F1 of the test piece TP that is different from the position at which the first contact portion 32 contacts. The second contact portion 42 is supported by the second fixing portion 41.

[0023] The first jig 30 and the second jig 40 are arranged with an interval in the longitudinal direction D1. In the example of FIGS. 1 and 2, the first jig 30 is located on the first gripping unit 10 side relative to the second jig 40. The first fixing portion 31 is located on the opposite side of the first abutting portion 32 from the second jig 40 side. The second fixing portion 41 is located on the opposite side of the second abutting portion 42 from the first jig 30 side. The first abutting portion 32 and the second abutting portion 42 face each other in the longitudinal direction D1. Details of the first jig 30 and the second jig 40 will be described later.

[0024] The displacement sensor 50 is, for example, an eddy current type displacement sensor. The displacement sensor 50 has a sensor head 51 and an eddy current generator 52. The sensor head 51 is provided on the first contact portion 32 of the first jig 30. Specifically, the sensor head 51 is provided on the second contact portion 42 side of the first contact portion 32 and faces the second contact portion 42. The eddy current generator 52 is provided on the second contact portion 42 of the second jig 40. Specifically, the eddy current generator 52 is provided on the first contact portion 32 side of the second contact portion 42 and faces the first contact portion 32.

[0025] The sensor head 51 has a coil (not shown). A high-frequency magnetic field can be generated by passing a high-frequency current through the coil of the sensor head 51. The eddy current generating unit 52 is made of a metal material. The eddy current generating unit 52 is located within the magnetic field generated by the sensor head 51. Therefore, eddy currents are generated in the eddy current generating unit 52 by electromagnetic induction. The closer the distance between the sensor head 51 and the eddy current generating unit 52, the larger the eddy current. The impedance of the coil of the sensor head 51 changes depending on the magnitude of the eddy current, and the oscillation amplitude also changes. Therefore, the displacement sensor 50 can detect the distance between the sensor head 51 and the eddy current generating unit 52 based on the oscillation amplitude of the coil of the sensor head 51. Therefore, the displacement sensor 50 can detect the distance between the first contact portion 32 and the second contact portion 42. The displacement sensor 50 detects the change in the distance before and after application of a tensile load to the test piece TP as the displacement of the narrow portion P1 of the test piece TP.

[0026] The displacement sensor 50 is not limited to the above example, as long as it can detect the distance between the first contact portion 32 and the second contact portion 42. For example, the eddy current generator 52 may be provided on the first contact portion 32 of the first jig 30, and the sensor head 51 may be provided on the second contact portion 42 of the second jig 40. For example, the eddy current generator 52 may be omitted from the above example, and the distance between the sensor head 51 and the second contact portion 42 may be detected using the eddy current generated in the second contact portion 42.

[0027] The displacement sensor 50 may be an optical displacement sensor. In this case, for example, the sensor head 51 and eddy current generator 52 in the above example are replaced with a laser head and a reflector, respectively. A laser is irradiated from the laser head to the reflector, and the laser reflected by the reflector is received by the laser head. The distance between the laser head and the reflector is detected based on the light reception results, such as the incident angle of the laser received by the laser head. In this example, too, the change in the distance before and after the application of a tensile load to the test piece TP is detected as the displacement of the narrow portion P1 of the test piece TP. The reflector may be provided on the first contact portion 32 of the first jig 30, and the laser head may be provided on the second contact portion 42 of the second jig 40. In addition, in the example using an optical displacement sensor, the reflector may be omitted.

[0028] The displacement sensor 50 does not have to be a non-contact type displacement sensor. For example, the displacement sensor 50 may be a member provided between the first contact portion 32 and the second contact portion 42 and a strain gauge installed on the member.

[0029] As described above, the displacement sensor 50 is provided on at least one of the first contact portion 32 and the second contact portion 42.

[0030] The camera 60 is provided for optical measurement, which is a physical property measurement different from the physical property measurement based on the detection result of the displacement amount of the test piece TP. The camera 60 images the other surface F2 of the test piece TP. Specifically, the camera 60 images the area of ​​the surface F2 of the test piece TP that is included in the narrow portion P1.

[0031] The control device 70 includes a central processing unit (CPU), a ROM storing programs and the like, and a RAM as a work area. The control device 70 performs various processes related to the measurement of the physical properties of the test piece TP. For example, the control device 70 applies a tensile load in the longitudinal direction D1 to the test piece TP by controlling the operation of the second gripping unit 20. The control device 70 then acquires the amount of displacement of the narrow portion P1 of the test piece TP from the displacement sensor 50. The control device 70 measures various physical properties of the test piece TP based on the information acquired from the displacement sensor 50. In this way, physical property measurements are performed based on the detection results of the amount of displacement of the test piece TP.

[0032] The control device 70 also acquires imaging data captured by the camera 60 from the camera 60. The control device 70 measures various physical properties of the test piece TP by performing various image processing on the imaging data acquired from the camera 60. For example, distortion at each position on the surface of the narrow portion P1 of the test piece TP is measured as a material property. In this way, optical measurement, which is a physical property measurement based on the imaging data captured by the camera 60, is performed. Note that the optical measurement can be realized, for example, by a method such as digital image correlation.

[0033] 3 and 4, the first jig 30 and the second jig 40 will be described in detail below. Of the first jig 30 and the second jig 40, only the first jig 30 will be described below. The configuration of the second jig 40 is the same as that of the first jig 30, so its description will be omitted.

[0034] Fig. 3 is an exploded perspective view showing the first jig 30 of the measuring device 1 according to this embodiment. Fig. 4 is a perspective view showing the first jig 30 after the measuring device 1 according to this embodiment has been installed. The upward direction in Figs. 3 and 4 corresponds to the upward direction in Figs. 1 and 2. Hereinafter, the upward direction in Figs. 3 and 4 will be simply referred to as the upward direction, and the downward direction in Figs. 3 and 4 will be simply referred to as the downward direction.

[0035] As shown in FIGS. 3 and 4, the first jig 30 has a first fixing portion 31, a first contact portion 32, a bolt 33, and a bolt .

[0036] In the examples of FIGS. 3 and 4, the first fixing portion 31 has a rectangular parallelepiped shape. However, the shape of the first fixing portion 31 is not particularly limited and may be a shape other than a rectangular parallelepiped. The first fixing portion 31 is formed, for example, from a metal material or the like. The first fixing portion 31 is adhered to the test piece TP. Specifically, the surface of the first fixing portion 31 facing the surface F1 of the test piece TP is fixed to the surface F1 of the test piece TP via an adhesive. However, the first fixing portion 31 may be fixed to the test piece TP by a method other than adhesion, such as bolting or welding.

[0037] In the examples of FIGS. 3 and 4 , the first contact portion 32 has a flat plate shape. The first contact portion 32 extends in the width direction D2 and the thickness direction D3. However, the shape of the first contact portion 32 is not particularly limited and may be a shape other than a flat plate. The first contact portion 32 is formed, for example, from a metal material. The first contact portion 32 is installed on the upper surface of the first fixing portion 31. The first contact portion 32 has, for example, two through holes 32a, 32b spaced apart in the width direction D2. The through holes 32a, 32b pass through in the longitudinal direction D1. The upper surface of the first fixing portion 31 has two screw holes 31a, 31b spaced apart in the width direction D2. The screw holes 31a, 31b extend in the longitudinal direction D1.

[0038] With the first abutment portion 32 placed on the upper surface of the first fixing portion 31 so that the two through holes 32a, 32b and the two screw holes 31a, 31b overlap, the first abutment portion 32 is fixed to the first fixing portion 31 by bolts 33, 34. This brings the first jig 30 into the state shown in FIG. 4. The bolt 33 is inserted through the through hole 32a of the first abutment portion 32 and screwed into the screw hole 31a of the first fixing portion 31. The bolt 34 is inserted through the through hole 32b of the first abutment portion 32 and screwed into the screw hole 31b of the first fixing portion 31. In this way, the first abutment portion 32 is fixed to the first fixing portion 31 by fastening the bolts.

[0039] However, the mechanism for fixing the first contact portion 32 to the first fixed portion 31 is not limited to the above example. For example, the first contact portion 32 may be fixed to the first fixed portion 31 by two or more bolts. For example, the first contact portion 32 may be fixed to the first fixed portion 31 by a method other than bolt fastening, such as gripping with a clamping mechanism.

[0040] The first contact portion 32 has a sharp portion 32c on the side of the test piece TP. The sharp portion 32c is a sharp portion that is pointed toward the side of the test piece TP. In the example of Figures 3 and 4, the thickness of the first contact portion 32 on the side of the test piece TP of the first contact portion 32 becomes thinner as it approaches the side of the test piece TP. The tip of the first contact portion 32 on the side of the test piece TP corresponds to the sharp portion 32c. The sharp portion 32c is a knife edge. The sharp portion 32c comes into line contact with the surface F1 of the test piece TP.

[0041] Here, the first contact portion 32 is provided so as to be movable in the thickness direction D3 of the test piece TP relative to the first fixing portion 31. The direction in which the first contact portion 32 can move relative to the first fixing portion 31 may be any direction intersecting the plane F1, and may be tilted to some extent relative to the thickness direction D3, which is perpendicular to the plane F1. In the example shown in FIGS. 3 and 4, the length of the two through holes 32a and 32b in the thickness direction D3 is longer than the length in the width direction D2. For example, the through holes 32a and 32b are elongated holes. Therefore, with the bolts 33 and 34 loosened, the first contact portion 32 can be moved in the thickness direction D3 relative to the first fixing portion 31 and the bolts 33 and 34. After adjusting the position of the first contact portion 32 in the thickness direction D3, the bolts 33 and 34 can be tightened to fix the first contact portion 32 to the first fixing portion 31. This appropriately presses the first contact portion 32 against the surface F1 of the test piece TP. Specifically, the sharp portion 32c of the first contact portion 32 presses against the surface F1 of the test piece TP. Note that the use of the two bolts 33, 34 allows for the application of substantially equal parallel fastening forces to the first contact portion 32, thereby enabling the first contact portion 32 to be stably fixed to the first fixing portion 31.

[0042] However, the mechanism for allowing the first contact portion 32 to move in the thickness direction D3 of the test piece TP relative to the first fixing portion 31 is not limited to the above example. For example, even if the through holes 32a, 32b have a perfect circular shape, the first contact portion 32 may be movable in the thickness direction D3 of the test piece TP relative to the first fixing portion 31. For example, a guide mechanism may be provided that guides the first contact portion 32 so that it can move in the thickness direction D3 of the test piece TP relative to the first fixing portion 31, in addition to the mechanism for fixing the first contact portion 32 to the first fixing portion 31.

[0043] As described above, the measuring device 1 includes a first jig 30, a second jig 40, and a displacement sensor 50. The first jig 30 has a first fixing portion 31 fixed to the face F1 of the test piece TP, and a first contact portion 32 that contacts the face F1 of the test piece TP. The second jig 40 has a second fixing portion 41 fixed to the face F1 of the test piece TP, and a second contact portion 42 that contacts the face F1 of the test piece TP. The displacement sensor 50 is provided on at least one of the first contact portion 32 and the second contact portion 42.

[0044] Therefore, in the measuring device 1, the first contact portion 32 and the second contact portion 42 move in response to the deformation of the test piece TP. For example, when a tensile load is applied to the test piece TP in the longitudinal direction D1 and the narrow portion P1 of the test piece TP deforms so as to extend in the longitudinal direction D1, the first contact portion 32 and the second contact portion 42 move relatively apart in the longitudinal direction D1. Therefore, the displacement sensor 50 can detect the amount of displacement of the narrow portion P1 of the test piece TP. Furthermore, by fixing the first fixing portion 31 to the surface F1, the first contact portion 32 can be held in contact with the surface F1. By fixing the second fixing portion 41 to the surface F1, the second contact portion 42 can be held in contact with the surface F1.

[0045] Here, in the measuring device 1, as described above, the first jig 30 and the second jig 40 are fixed to the same surface F1 of the test piece TP. Specifically, the first jig 30 and the second jig 40 are fixed at different positions on the same surface F1 of the test piece TP. Therefore, the surface F2 of the test piece TP, which is the portion of the test piece TP opposite to the surface F1, is not covered by the first jig 30 and the second jig 40. As a result, when the surface F2 of the test piece TP is imaged by the camera 60, the jig is prevented from being reflected in part of the surface F2. Therefore, it is possible to simultaneously detect the displacement amount of the test piece TP and perform optical measurement. This improves the work efficiency of measuring material properties.

[0046] In particular, the first contact portion 32 and the second contact portion 42 have sharp portions on the test piece TP side. For example, the first contact portion 32 has a sharp portion 32c on the test piece TP side. In this case, the sharp portions of each contact portion abut against the surface F1 of the test piece TP. Therefore, the first contact portion 32 and the second contact portion 42 can more easily follow the deformation of the test piece TP. For example, the sharp portions of each contact portion are engaged with minute irregularities formed by machining on the surface F1 of the test piece TP. This makes it less likely that the first contact portion 32 and the second contact portion 42 will slip relative to the test piece TP, allowing them to more easily follow the deformation of the test piece TP.

[0047] In particular, the first contact portion 32 is provided to be movable relative to the first fixing portion 31 in a direction intersecting the plane F1, and the second contact portion 42 is provided to be movable relative to the second fixing portion 41 in a direction intersecting the plane F1. For example, in the example shown in FIGS. 3 and 4 , the first contact portion 32 is provided to be movable relative to the first fixing portion 31 in the thickness direction D3, and the second contact portion 42 is provided to be movable relative to the second fixing portion 41 in the thickness direction D3. This allows the first contact portion 32 and the second contact portion 42 to be appropriately brought into contact with the plane F1 of the test piece TP. This allows the first contact portion 32 and the second contact portion 42 to be appropriately moved in response to deformation of the test piece TP.

[0048] In particular, the first fixing portion 31 is located on the opposite side of the first contact portion 32 from the second jig 40, and the second fixing portion 41 is located on the opposite side of the second contact portion 42 from the first jig 30. In other words, neither the first fixing portion 31 nor the second fixing portion 41 is fixed to the region of the test piece TP between the position where the first contact portion 32 contacts and the position where the second contact portion 42 contacts. Here, in the narrow width portion P1 of the test piece TP, the deformation behavior of the portion where the first fixing portion 31 or the second fixing portion 41 is fixed may differ from the deformation behavior of the portion where the first fixing portion 31 or the second fixing portion 41 is not fixed. The measuring device 1 measures the deformation amount of the region of the test piece TP between the position where the first contact portion 32 contacts and the position where the second contact portion 42 contacts. Therefore, by fixing neither the first fixing portion 31 nor the second fixing portion 41 to this region, the influence of the fixing of the jig on the measurement results of the deformation amount of the test piece TP is suppressed.

[0049] In particular, the first fixing part 31 and the second jig 40 are bonded to the test piece TP. This allows the first fixing part 31 and the second jig 40 to be easily attached to and detached from the test piece TP. Furthermore, compared to when the first fixing part 31 and the second jig 40 are fixed to the test piece TP by bolting, there is no need to machine the test piece TP, and changes in the physical properties of the test piece TP due to machining are suppressed. Furthermore, compared to when the first fixing part 31 and the second jig 40 are fixed to the test piece TP by welding, heat is not input to the test piece TP, and changes in the physical properties of the test piece TP due to heat input are suppressed.

[0050] Various modifications will be described below with reference to FIGS.

[0051] FIG. 5 is an exploded perspective view showing the first jig 30 of the measuring apparatus 1A according to the first modified example. FIG. 6 is a perspective view showing the first jig 30 after the measuring apparatus 1A according to the first modified example has been installed. The upward direction in FIGS. 5 and 6 corresponds to the upward direction in FIGS. 1 and 2. Hereinafter, the upward direction in FIGS. 5 and 6 will be simply referred to as the upward direction, and the downward direction in FIGS. 5 and 6 will be simply referred to as the downward direction. Note that, of the first jig 30 and the second jig 40, only the first jig 30 will be described below. The configuration of the second jig 40 is similar to that of the first jig 30, and therefore description thereof will be omitted.

[0052] The measuring apparatus 1A differs from the measuring apparatus 1 described above in that a mounting member 35 and biasing members 36 and 37 are further provided on the first jig 30. The mounting member 35 is fixed to the first contact portion 32. Specifically, the mounting member 35 is provided on the upper surface of the first contact portion 32, on the side opposite the test piece TP side with respect to the through holes 32a and 32b. In the example shown in FIGS. 5 and 6, the mounting member 35 has a flat plate shape. The mounting member 35 extends in the longitudinal direction D1 and the width direction D2. However, the shape of the mounting member 35 is not particularly limited.

[0053] In the examples shown in FIGS. 5 and 6, the biasing members 36 and 37 are springs. The biasing members 36 and 37 are provided to bias the first contact portion 32 toward the test piece TP. However, the biasing members 36 and 37 may be members other than springs as long as they bias the first contact portion 32 toward the test piece TP. The biasing members 36 and 37 are spaced apart in the width direction D2. One end of the biasing members 36 and 37 is attached to the surface of the mounting member 35 facing the test piece TP. The other ends of the biasing members 36 and 37 are provided with locking portions 36a and 37a, respectively. The locking portions 36a and 37a are portions that are locked to the bolts 33 and 34. In the examples shown in FIGS. 5 and 6, the locking portions 36a and 37a are ring-shaped. However, the shape of the locking portions 36a and 37a is not limited to this example.

[0054] In the measurement device 1A, similarly to the above-described measurement device 1, the bolt 33 is inserted into the through hole 32a of the first contact portion 32 and screwed into the screw hole 31a of the first fixing portion 31. The bolt 34 is inserted into the through hole 32b of the first contact portion 32 and screwed into the screw hole 31b of the first fixing portion 31. Here, as shown in FIG. 6 , in the measurement device 1A, unlike the above-described measurement device 1, the heads of the bolts 33 and 34 are spaced upward from the upper surface of the first contact portion 32.

[0055] The locking portion 36a of the biasing member 36 is locked to the bolt 33. For example, when the bolt 33 is threaded into the threaded hole 31a of the first fixing portion 31, the ring-shaped locking portion 36a is hooked onto the bolt 33. The locking portion 37a of the biasing member 37 is locked to the bolt 34. For example, when the bolt 34 is threaded into the threaded hole 31b of the first fixing portion 31, the ring-shaped locking portion 37a is hooked onto the bolt 34. As described above, the first abutting portion 32 is provided so as to be movable in the thickness direction D3 of the test piece TP relative to the first fixing portion 31. Furthermore, the lengths of the biasing members 36 and 37 are longer than their natural lengths when the locking portions 36a and 37a are locked onto the bolts 33 and 34. Therefore, the first abutting portion 32 is biased toward the test piece TP by the biasing members 36 and 37.

[0056] As described above, the measurement device 1A further includes biasing members that bias the first contact portion 32 and the second contact portion 42 toward the test piece TP. For example, the first contact portion 32 is biased toward the test piece TP by the biasing members 36 and 37. This allows each contact portion to be more reliably pressed against and contact the surface F1 of the test piece TP. For example, the sharp portion 32c of the first contact portion 32 is pressed against and contacts the surface F1 of the test piece TP by the biasing force of the biasing members 36 and 37. This allows the first contact portion 32 and the second contact portion 42 to more easily follow deformation of the test piece TP.

[0057] FIG. 7 is an exploded perspective view showing a first jig 30B of a measuring apparatus 1B according to a second modified example. FIG. 8 is a perspective view showing the first jig 30B after installation of the measuring apparatus 1B according to the second modified example. The upward direction in FIGS. 7 and 8 corresponds to the upward direction in FIGS. 1 and 2. Hereinafter, the upward direction in FIGS. 7 and 8 will be simply referred to as the upward direction, and the downward direction in FIGS. 7 and 8 will be simply referred to as the downward direction. Note that the following will only describe the first jig 30B, which is an example of a shape for the first jig 30. However, the second jig 40 may also be modified in the same way as the first jig 30B.

[0058] The measuring device 1B differs from the measuring device 1A described above mainly in that the first contact portion 32 is replaced with a first contact portion 32B. The first contact portion 32B includes two needles 38, 38. The needles 38 are rod-shaped members. The two needles 38, 38 are spaced apart in the width direction D2. Each needle 38 extends in the thickness direction D3. The needles 38 have a sharp portion 38a on the test piece TP side. Specifically, the needles 38 have a tapered shape at the end on the test piece TP side. In other words, the outer diameter of the cross section of the needle 38 at the end on the test piece TP side becomes smaller as it approaches the test piece TP. The tip of the needle 38 on the test piece TP side corresponds to the sharp portion 38a. The sharp portion 38a makes point contact with the surface F1 of the test piece TP.

[0059] A guide member 39 is fixed to the first fixing portion 31. Specifically, the guide member 39 is provided on the upper surface of the first fixing portion 31, on the side opposite the test piece TP side with respect to the screw holes 31a and 31b. In the example of FIGS. 7 and 8, the guide member 39 has a flat plate shape. The guide member 39 extends in the longitudinal direction D1 and the width direction D2. However, the shape of the guide member 39 is not particularly limited. Two through holes 39a and 39b are provided in the guide member 39 with an interval in the width direction D2. The through holes 39a and 39b penetrate in the thickness direction D3.

[0060] Similar to the measuring apparatus 1A described above, the first jig 30B of the measuring apparatus 1B is provided with a mounting member 35 and biasing members 36 and 37. Two needles 38 are attached to the surface of the mounting member 35 on the side of the test piece TP. The two needles 38 are positioned so as not to interfere with the biasing members 36 and 37. The positional relationship between the two needles 38 and the biasing members 36 and 37 is not limited to the example shown in FIGS. 7 and 8.

[0061] In the measuring device 1B, the bolt 33 is screwed into the screw hole 31a of the first fixing part 31. The bolt 34 is screwed into the screw hole 31b of the first fixing part 31. The heads of the bolts 33 and 34 are spaced above the upper surface of the first fixing part 31. The bolt 33 is engaged with the locking part 36a of the biasing member 36. The bolt 34 is engaged with the locking part 37a of the biasing member 37.

[0062] 8, in the measuring device 1B, two needles 38 are inserted into through holes 39a and 39b of a guide member 39, respectively. As a result, each needle 38 is guided movably in the thickness direction D3 of the test piece TP relative to the first fixing part 31. Each needle 38 is biased toward the test piece TP by biasing members 36 and 37. Note that the penetration direction of the through holes 39a and 39b may be inclined to some extent with respect to the thickness direction D3, and the direction in which each needle 38 can move relative to the first fixing part 31 may also be inclined with respect to the thickness direction D3.

[0063] As described above, in the measuring device 1B, compared to the above-described measuring device 1A, the first contact portion 32 is replaced with the first contact portion 32B. In this case, the first contact portion 32B also contacts one surface F1 of the test piece TP, similar to the above-described first contact portion 32, and therefore the same effect as the above-described measuring device 1A is achieved.

[0064] Although the embodiments of the present disclosure have been described above with reference to the accompanying drawings, it goes without saying that the present disclosure is not limited to such embodiments. It is clear that a person skilled in the art can conceive of various modifications and alterations within the scope of the claims, and it is understood that such modifications and alterations also fall within the technical scope of the present disclosure.

[0065] In the above, an example has been described in which the first contact portion 32 and the second contact portion 42 have sharp portions on the test piece TP side. However, the first contact portion 32 and the second contact portion 42 do not have to have sharp portions on the test piece TP side. For example, the first contact portion 32 and the second contact portion 42 may be in surface contact with the face F1 of the test piece TP.

[0066] In the above, an example has been described in which the first abutment portion 32 is provided so as to be movable relative to the first fixed portion 31 in a direction intersecting the plane F1, and the second abutment portion 42 is provided so as to be movable relative to the second fixed portion 41 in a direction intersecting the plane F1. However, each abutment portion does not have to be movable relative to each fixed portion. For example, in the first jig 30, the first fixed portion 31 and the first abutment portion 32 may be formed from the same member. For example, in the second jig 40, the second fixed portion 41 and the second abutment portion 42 may be formed from the same member.

[0067] In the above, an example has been described in which the first fixing portion 31 is located on the opposite side of the first abutment portion 32 from the second jig 40, and the second fixing portion 41 is located on the opposite side of the second abutment portion 42 from the first jig 30. However, the first fixing portion 31 may be located on the second jig 40 side of the first abutment portion 32. The second fixing portion 41 may be located on the first jig 30 side of the second abutment portion 42.

[0068] The present disclosure contributes to improving the work efficiency of measuring material properties, and can therefore contribute to, for example, Goal 12 of the Sustainable Development Goals (SDGs), "Ensure sustainable consumption and production patterns." [Explanation of symbols]

[0069] 1. Measuring equipment 1A Measuring equipment 1B Measurement equipment 30 First jig 30B First jig 31 1st fixed part 32 1st contact part 32B 1st contact part 32c sharp part 36 biasing member 37 biasing member 38a Sharp part 40 Second jig 41 Second fixed part 42 Second contact part 50 Displacement Sensor F1 side TP test specimen

Claims

1. a first jig having a first fixing portion fixed to a surface of a test piece and a first abutment portion abutting the surface of the test piece and supported by the first fixing portion; a second jig including a second fixing portion fixed to the surface of the test piece and a second abutting portion abutting the surface of the test piece and supported by the second fixing portion; a displacement sensor provided on at least one of the first contact portion and the second contact portion; Equipped with the first fixing portion and the second fixing portion are adhered to the test piece; Measuring equipment.

2. the first contact portion and the second contact portion have sharp portions on the test piece side; The measurement device according to claim 1 .

3. the first contact portion is provided to be movable relative to the first fixing portion in a direction intersecting the surface of the test piece, the second contact portion is provided to be movable relative to the second fixing portion in a direction intersecting the surface of the test piece. The measuring device according to claim 1 or 2.

4. Further provided is a biasing member that biases the first contact portion and the second contact portion toward the test piece. The measurement device according to claim 3 .

5. the first fixing portion is located on the opposite side of the first abutment portion from the second jig side, The second fixing portion is located on the opposite side of the second abutment portion from the first jig side. The measuring device according to any one of claims 1 to 4.

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