Equivalent model creation device, equivalent model creation support method, and equivalent model creation support program

Abstract

To provide an equivalent model creation device which can reduce a work load when generating an equivalent model circuit.SOLUTION: An equivalent model creation device comprises: a first waveform data acquisition unit which acquires first waveform data indicating an impedance for each frequency; a display data output unit which outputs display data indicating a first waveform based on the first waveform data; a target condition acquisition unit which acquires a target condition for determining a target impedance for each region of different frequency bands; a second waveform data acquisition unit which generates second waveform data indicating the target impedance for each frequency determined by using the target condition and the first waveform data; and a third waveform data generation unit which generates third waveform data indicating an impedance for each frequency in a model circuit constituted by an LCR component. The display data output unit outputs the display data indicating a second waveform based on the second waveform data and the display data indicating a third waveform based on the third waveform data.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The disclosed technology relates to an equivalent model creation technology. [Background technology]

[0002] During the development stage of an integrated circuit, a verifier may use an equivalent circuit to perform various verifications, such as PI (power integrity) verification, on an integrated circuit designed by a designer. In this case, for example, the verifier generates an equivalent circuit (equivalent model circuit) that models the integrated circuit using LCR components (L (coil), C (capacitor), and R (resistor)). Specifically, the verifier receives actual measured values ​​of the circuit impedance from the designer and generates an equivalent model circuit by adjusting the LCR components in the model circuit so that the impedance characteristics approach those based on the actual measured values.

[0003] Incidentally, Patent Document 1 discloses a circuit analysis device that predicts the mutual effects between network elements that make up a circuit, generates a frequency response of the circuit, and graphically displays the frequency response. The circuit analysis device of Patent Document 1 displays a waveform of the so-called "correct frequency response" (Patent Document 1), which is close to a frequency response based on actual measurements, based on the circuit configuration. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 08-050152 Summary of the Invention [Problem to be solved by the invention]

[0005] However, in the past, as the waveform of the impedance characteristics based on actual measurements became more complex, the number of times that LCR components in the model circuit needed to be adjusted tended to increase, resulting in a large workload when generating an equivalent model circuit. Even if the above disclosure of the circuit analysis device of Patent Document 1 were to be used to create an equivalent model circuit, it would only be able to display a more complex waveform that is closer to the impedance characteristics based on actual measurements, and would still not be able to solve the above problem.

[0006] The present disclosure is intended to solve the above-mentioned problems, and has an object to provide an equivalent model creation device that can reduce the workload when generating an equivalent model circuit. [Means for solving the problem]

[0007] The equivalent model creation device of the present disclosure comprises: Target circuit a first waveform data acquisition unit that acquires first waveform data that indicates impedance for each frequency; a display data output unit that outputs display data that indicates a first waveform based on the first waveform data; a target condition acquisition unit that acquires target conditions for determining a target impedance for each region of a different frequency band; Regarding the target circuit It consists of a second waveform data generator that generates second waveform data that indicates the target impedance for each frequency, and an LCR component. The target circuit and a third waveform data generating unit that generates third waveform data that indicates the impedance for each frequency in the model circuit, and the display data output unit is further configured to output display data that indicates a second waveform based on the second waveform data and display data that indicates a third waveform based on the third waveform data. [Effects of the Invention]

[0008] According to the present disclosure, it is possible to reduce the workload when generating an equivalent model circuit. [Brief explanation of the drawings]

[0009] [Figure 1] 1 is a diagram illustrating an example of the configuration of an equivalent model creating device according to a first embodiment and peripheral devices. [Figure 2]FIG. 2 is a diagram illustrating a first example of the functions of the equivalent model creating device according to the first embodiment. [Figure 3] 4 is a diagram illustrating an example of the configuration of a third waveform data generating section according to the first embodiment. FIG. [Figure 4] 1 is a conceptual diagram of an equivalent model circuit used in the equivalent model creating device according to the first embodiment. [Figure 5] 3 is a diagram illustrating an example of the configuration of a display data output unit according to the first embodiment. FIG. [Figure 6] 4 is a flowchart showing an example of processing performed by the equivalent model creating device according to the first embodiment. [Figure 7] FIG. 10 is a diagram illustrating a second example of the functions of the equivalent model creating device according to the first embodiment. [Figure 8] 8A and 8B are enlarged views of waveforms in the respective regions of FIG. 7. [Figure 9] FIG. 10 is a diagram illustrating a configuration example of an equivalent model creating device according to a second embodiment and peripheral devices. [Figure 10] FIG. 10 is a diagram illustrating an example of the configuration of a third waveform data generating section according to the second embodiment. [Figure 11] 10 is a flowchart showing an example of processing performed by the equivalent model creating device according to the second embodiment. [Figure 12] FIG. 2 is a diagram illustrating a first example of a hardware configuration for realizing functions according to the present disclosure. [Figure 13] FIG. 10 is a diagram illustrating a second example of a hardware configuration for realizing functions according to the present disclosure. DETAILED DESCRIPTION OF THE INVENTION

[0010] In order to explain the present disclosure in more detail, embodiments of the present disclosure will be described below with reference to the accompanying drawings.

[0011] Embodiment 1 In the first embodiment, an embodiment is shown in which an impedance characteristic can be generated using the acquired impedance characteristic and a target condition for each frequency band. FIG. 1 is a diagram showing an example of the configuration of an equivalent model creating device 1000 according to the first embodiment and peripheral devices. The equivalent model creating device 1000 is communicably connected to an input device 2000 and a display device 3000. The equivalent model creating device 1000 generates target impedance characteristics (second waveform data) based on the impedance characteristics (first waveform data) acquired via the input device 2000 and target conditions for each frequency band. Furthermore, the equivalent model creating device 1000 generates impedance characteristics (third waveform data) of the model circuit based on the acquired information of the model circuit (model circuit information). The equivalent model creating device 1000 outputs to the display device 3000 display data indicating the impedance characteristics acquired via the input device 2000, display data indicating the target impedance characteristics, or display data indicating the impedance characteristics of the model circuit. Furthermore, the equivalent model creating device 1000 outputs the LCR value of the model circuit in accordance with an external command.

[0012] The internal configuration of the equivalent model creating device 1000 will be described. The equivalent model creating device 1000 shown in FIG. 1 includes a waveform data output unit 1100, a display data output unit 1200, and an LCR value output unit 1300.

[0013] The waveform data output unit 1100 outputs waveform data indicating the impedance characteristics for each frequency. Specifically, the waveform data output section 1100 outputs at least three types of waveform data: first waveform data, second waveform data, and third waveform data. The first waveform data indicates impedance characteristics acquired via the input device 2000, and specifically indicates impedance values ​​for each frequency based on actual measurement values. However, since it is not possible to determine whether the first waveform data itself is data based on actual measurement values, it is not intended to be limited to data based on actual measurement values. The second waveform data indicates a target impedance characteristic based on the first waveform data and target conditions for each frequency band. The third waveform data indicates the impedance characteristics of the model circuit based on the model circuit information. The model circuit information is information that indicates the configuration of a model circuit that is configured using LCR components. LCR components are passive components such as L (inductor), C (capacitor), and R (resistor). The LCR value indicates the value of these components. The model circuit can be modified with various combinations of passive components. The waveform data output unit 1100 will be described in detail later.

[0014] The display data output unit 1200 generates display data for the display device 3000 and outputs it to the display device 3000 . Specifically, the display data output section 1200 generates display data using the output data of the waveform data output section 1100 or the output data of the LCR value output section 1300 and outputs the generated display data to the display device 3000. The display data output unit 1200 will be described in detail later.

[0015] The LCR value output section 1300 outputs the LCR value in the model circuit used by the third waveform data generating section 1140 in response to a command signal (LCR value output command signal) obtained from the outside. Specifically, the LCR value output unit 1300 receives an external command signal (LCR value output command signal) that commands the output of an LCR value via the input device 2000. Upon receiving the LCR value output command signal, the LCR value output unit 1300 obtains the LCR value in the model circuit from the third waveform data generation unit 1140 and outputs the LCR value to the display data output unit 1200. The LCR value output unit 1300 may further output the LCR value to another external device.

[0016] The waveform data output unit 1100 includes a first waveform data acquisition unit 1110 , a target condition acquisition unit 1120 , a second waveform data generation unit 1130 , and a third waveform data generation unit 1140 .

[0017] The first waveform data acquiring unit 1110 acquires first waveform data that indicates impedance for each frequency based on actual measurement values. The first waveform data acquiring unit 1110 acquires, via the input device 2000, first waveform data that indicates impedance values ​​for each frequency and is based on actual measurements provided by, for example, a circuit design department.

[0018] The target condition acquisition unit 1120 acquires target conditions for determining a target impedance for each of the different frequency band regions. Specifically, the target condition acquiring unit 1120 first acquires, via the input device 2000, a plurality of pieces of frequency band information indicating different frequency bands into which the frequency band indicated in the first waveform data is divided. The target condition acquiring unit 1120 then acquires a target condition for each frequency band indicated in the plurality of pieces of frequency band information. The target conditions acquired by the target condition acquisition unit 1120 are configured by a combination of a plurality of different frequency band information and, for each of the frequency band information, a rate of increase or decrease based on the impedance value of the first waveform data or a target impedance value. The frequency band information is, for example, information indicated by the frequency itself, or area identification information that identifies an area for each frequency band. The area for each frequency band is arbitrarily determined by the operator. The rate of increase or decrease based on the impedance value of the first waveform data is indicated, for example, by the increase rate relative to the impedance value of the first waveform data, or by a combination of the increase rate and the decrease rate (increase or decrease rate). The target impedance value is expressed using a numerical value in units of Ω, for example. The target condition acquisition unit 1120 outputs target condition information that combines frequency band information and target conditions.

[0019] The second waveform data generating section 1130 generates second waveform data indicating a target impedance for each frequency determined using the first waveform data and the target conditions. Specifically, the second waveform data generating section 1130 acquires the first waveform data from the first waveform data acquiring section 1110 and acquires the target condition information from the target condition acquiring section 1120 . The second waveform data generation unit 1130 calculates the target impedance value for each frequency using the impedance value for each frequency indicated in the first waveform data and the target condition for each frequency band indicated in the target condition information, and generates the second waveform data. The second waveform data generating section 1130 calculates the target impedance value by, for example, adding the increase rate to the impedance value of the first waveform data. Furthermore, the second waveform data generating unit 1130 calculates the target impedance value by, for example, adding the increase rate to the impedance value of the first waveform data and subtracting the decrease rate from the impedance value of the first waveform data. In this case, the second waveform data indicates the range of the target impedance value by the upper limit second waveform data and the lower limit second waveform data. Furthermore, the second waveform data generating unit 1130 calculates an upper limit target impedance value by adding an increase rate to the impedance value of the first waveform data, and determines the maximum impedance value of the first waveform data within the frequency band as the lower limit target impedance value. In this case, the second waveform data indicates the range of target impedance values ​​by the upper limit second waveform data and the lower limit second waveform data.

[0020] FIG. 2 is a diagram illustrating a first example of the functions of the equivalent model creating device 1000 according to the first embodiment. FIG. 2 shows a first waveform 5100, a second waveform 5300, and the regions of each frequency band (A region 5210, B1 region 5220, B2 region 5230, C region 5240), with frequency on the horizontal axis and impedance value on the vertical axis. The first waveform data indicating the first waveform 5100 is acquired by the first waveform data acquisition unit 1110.

[0021] Region A 5210 is a frequency band that is distinguished from other regions because it is believed that the influence of the integrated circuit chip (see the chip portion of model circuit 4000 shown in Figure 4) is large around the maximum value of the impedance value (region with multiple peaks). The B1 region 5220 and the B2 region 5230 are frequency bands that are distinguished from other regions because they are thought to be significantly affected by the PCB (Printed Circuit Board) (see the PCB section 4100 of the model circuit 4000 shown in FIG. 4) and the PCB vias. The C region 5240 is a frequency band that is distinguished from other regions because it is believed to be significantly affected by the resistance of the power supply of the integrated circuit. The frequency band information indicating each of the A region 5210, the B1 region 5220, the B2 region 5230, and the C region 5240 is acquired by the target condition acquisition unit 1120 in the equivalent model creating device 1000.

[0022] Furthermore, the target conditions for each of the A area 5210, the B1 area 5220, the B2 area 5230, and the C area 5240 are acquired by the target condition acquisition unit 1120. The target conditions shown in Figure 2 are as follows: the target condition for area A 5210 is "+(a)%" of the maximum impedance value in first waveform 5100, the target condition for area B1 5220 is "+(b1)%" of the impedance value in first waveform 5100, the target condition for area B2 5230 is "+(b2)%" of the impedance value in first waveform 5100, and the target condition for area C 5240 is "+(c)%" of the impedance value in first waveform 5100. The above (a), (b1), (b2), and (c) may be set appropriately depending on the pattern of the first waveform 5100. Note that each of area A, area B (area B1, area B2), and area C may be further divided into multiple areas. For example, area A may be divided into areas A1 and A2, and area C may be divided into areas C1 and C2.

[0023] FIG. 3 is a diagram showing an example of the configuration of the third waveform data generating section 1140 according to the first embodiment. The third waveform data generating section 1140 generates third waveform data that indicates the impedance for each frequency in a model circuit configured with LCR components. The third waveform data generating unit 1140 shown in FIG. 3 includes a model circuit information acquiring unit 1141 and an analyzing unit 1143.

[0024] The model circuit information acquisition unit 1141 acquires model circuit information that indicates a model circuit configured with LCR components. FIG. 4 is a conceptual diagram of a model circuit 4000 used in the equivalent model creating device 1000 according to the first embodiment. The model circuit 4000 is a circuit modeling an integrated circuit made up of, for example, a printed wiring board on which a semiconductor package is mounted, and is configured to include a PCB section 4100, a PKG section 4200, and a CHIP section 4300. The PCB section 4100 is a circuit section in which, for example, a PCB in an integrated circuit is modeled using LCR components. The PCB section 4100 shown in Fig. 4 includes a power supply 4110, an LCR component 4120 of the power supply 4110, an LCR component 4130, LCR components 4140 (4140-1,...,4140-n), and LCR components 4150 (4150-1,...,4150-n). LCR components 4140 (4140-1, . . . , 4140-n) and LCR components 4150 (4150-1, . . . , 4150-n) configure a bypass capacitor. Specifically, a combination of LCR components 4140 and 4150 configures one bypass capacitor. In FIG. 4, n bypass capacitors are set, from the bypass capacitor configured with LCR components 4140-1 and 4150-1 to the bypass capacitor configured with LCR components 4140-n and 4150-n. The number n of bypass capacitors is changeable. The PKG section 4200 is a circuit section that models, for example, a semiconductor package in an integrated circuit, and is configured to include an LCR component 4210 of the PKG section 4200 . The CHIP section 4300 is a circuit section modeled after a semiconductor chip in an integrated circuit, for example, and is configured to include an LCR component 4310 of the CHIP section 4300 . The LCR value of each LCR component is variable. The number n of bypass capacitors and the LCR values ​​of each LCR component may be set or adjusted outside the equivalent model creation device 1000, or may be adjusted inside the equivalent model creation device 1000 using the configuration of embodiment 2 described below.

[0025] The analysis unit 1143 uses the model circuit information acquired from the model circuit information acquisition unit 1141 to generate third waveform data indicating the impedance value for each frequency in the model circuit indicated in the model circuit information. Specifically, the analysis unit 1143 acquires model circuit information from the model circuit information acquisition unit 1141. Next, the analysis unit 1143 analyzes the model circuit indicated in the model circuit information and generates third waveform data indicating impedance values ​​for each frequency in the model circuit indicated in the model circuit information. The analysis unit 1143 outputs the generated third waveform data.

[0026] Furthermore, the analysis unit 1143 analyzes the model circuit indicated in the model circuit information, and outputs the LCR values ​​of the LCR components of the model circuit. Specifically, when the LCR value output unit 1300 acquires an LCR value output command signal, the analyzer 1143 analyzes the model circuit and outputs the LCR values ​​of the LCR components of the model circuit to the LCR value output unit 1300 .

[0027] The display data output unit 1200 will now be described in detail. FIG. 5 is a diagram showing an example of the configuration of the display data output unit 1200 according to the first embodiment. The display data output section 1200 shown in FIG. 5 includes a first waveform image generating section 1210, a second waveform image generating section 1220, a third waveform image generating section 1230, a superimposed image generating section 1240, and an LCR value image generating section 1250.

[0028] The first waveform image generating section 1210 outputs display data showing the first waveform based on the first waveform data. Specifically, first waveform image generating section 1210 acquires the first waveform data output from first waveform data acquiring section 1110 of waveform data output section 1100. First waveform image generating section 1210 generates display data showing the first waveform using the first waveform data. First waveform image generating section 1210 outputs the display data showing the first waveform to display device 3000.

[0029] The second waveform image generating section 1220 outputs display data showing a second waveform based on the second waveform data. Specifically, second waveform image generating section 1220 acquires second waveform data output from second waveform data generating section 1130 of waveform data output section 1100. Second waveform image generating section 1220 generates display data showing the second waveform using the second waveform data. Second waveform image generating section 1220 outputs the display data showing the second waveform to display device 3000.

[0030] The third waveform image generating section 1230 outputs display data showing the third waveform based on the third waveform data. Specifically, third waveform image generating section 1230 acquires third waveform data output from third waveform data generating section 1140 of waveform data output section 1100. Third waveform image generating section 1230 generates display data showing the third waveform using the third waveform data. Third waveform image generating section 1230 outputs the display data showing the third waveform to display device 3000.

[0031] The superimposed image generating section 1240 uses at least two of the first waveform data, the second waveform data, and the third waveform data to generate a display image in which at least two waveforms are superimposed. The superimposed image generating unit 1240 uses, for example, the first waveform data and the second waveform data to output a display image in which the first waveform indicated in the first waveform data and the second waveform indicated in the second waveform data are superimposed. This display image is used, for example, when the second waveform data generating unit 1130 generates second waveform data and the operator is prompted to compare and confirm the first waveform data and the second waveform data. The superimposed image generating section 1240 uses, for example, the second waveform data and the third waveform data to output a display image in which the second waveform indicated in the second waveform data and the third waveform indicated in the third waveform data are superimposed. This display image is used, for example, when the third waveform data generating section 1140 generates the third waveform data and allows the operator to compare and confirm the second waveform data and the third waveform data. The superimposed image generating unit 1240 uses, for example, the first waveform data, the second waveform data, and the third waveform data to output a display image in which the first waveform indicated in the first waveform data, the second waveform indicated in the second waveform data, and the third waveform indicated in the third waveform data are superimposed. This display image is used, for example, when the third waveform data generating unit 1140 generates the third waveform data and allows the operator to compare and confirm the first waveform data, the second waveform data, and the third waveform data.

[0032] The LCR value image generating unit 1250 uses the LCR values ​​output by the LCR value output unit 1300 to output a display image indicating the LCR values. Specifically, the LCR value image generation unit 1250 acquires the LCR values ​​from the LCR value output unit 1300. The LCR value image generation unit 1250 generates a display image indicating the LCR values ​​using the LCR values. The LCR value image generation unit 1250 outputs the display image indicating the LCR values ​​to the display device 3000.

[0033] 1 is a device that can be operated by an operator to input or select information to be used in the equivalent model creating device 1000. Specifically, the input device 2000 is a mouse, a keyboard, a touch panel, or the like. The input device 2000 may also be operated by an operator to cause the equivalent model creating device 1000 to acquire information from a storage device (not shown). The input device 2000 in the present disclosure receives first waveform data indicating impedance for each frequency based on actual measured values, target conditions for each different frequency band, model circuit information, and a command to output an LCR value, and outputs these to the equivalent model creation device 1000.

[0034] 1 is a device that displays using the display data output from the equivalent model creating device 1000. Specifically, the display device 3000 is a display, a monitor, or the like. The display device 3000 according to the present disclosure receives display data indicating waveforms based on each waveform data and display data indicating LCR values ​​from the equivalent model creation device 1000, and displays them.

[0035] 1 are shown as separate devices, the input device 2000 and the display device 3000 may be an integrated input / output device, such as a display with a touch panel.

[0036] FIG. 6 is a flowchart showing an example of processing performed by the equivalent model creating device 1000 according to the first embodiment. When the equivalent model creating device 1000 starts the process, first, in step ST1000, the equivalent model creating device 1000 acquires first waveform data. Specifically, the display data output unit 1200 in the equivalent model creation device 1000 outputs, for example, display data prompting the input of first waveform data to the display device 3000. When the operator operates the input device 2000 in response to the display on the display device 3000, the first waveform data acquisition unit 1110 receives the first waveform data from the input device 2000 and outputs the first waveform data to the display data output unit 1200. When the display data output unit 1200 receives the first waveform data, the first waveform image generation unit 1210 in the display data output unit 1200 generates a first waveform image using the first waveform data. The display data output unit 1200 outputs the generated first waveform image to the display device 3000.

[0037] Next, the equivalent model creating device 1000 acquires a target condition for each frequency band (step ST1010). Specifically, the display data output unit 1200 in the equivalent model creation device 1000 outputs, for example, display data to the display device 3000 that prompts the user to input target conditions. When the operator operates the input device 2000 in response to the display on the display device 3000, the target condition acquisition unit 1120 acquires, via the input device 2000, a plurality of pieces of frequency band information that indicate different frequency bands for dividing the frequency band indicated in the first waveform data. Next, the display data output unit 1200 outputs, for example, display data to the display device 3000 that prompts the user to input target conditions for each region of the frequency band indicated in the frequency band information. When the operator operates the input device 2000 in response to the display on the display device 3000, the target condition acquisition unit 1120 acquires target conditions for each frequency band indicated in the plurality of pieces of frequency band information. The target condition acquisition unit 1120 outputs target condition information that combines frequency band information and target conditions for each frequency band to the second waveform data generation unit 1130.

[0038] Next, the equivalent model creating device 1000 acquires second waveform data (step ST1020). Specifically, the second waveform data generation unit 1130 acquires the first waveform data from the first waveform data acquisition unit 1110, and acquires the target condition information from the target condition acquisition unit 1120. The second waveform data generation unit 1130 calculates the target impedance value for each frequency using the impedance value for each frequency indicated in the first waveform data and the target condition for each frequency band indicated in the target condition information, and generates the second waveform data.

[0039] Next, the equivalent model creating device 1000 outputs the second waveform data (step ST1030). Specifically, the second waveform data generation unit 1130 in the equivalent model creation device 1000 outputs the generated second waveform data to the display data output unit 1200. When the display data output unit 1200 receives the second waveform data, the second waveform image generation unit 1220 in the display data output unit 1200 generates a second waveform image using the second waveform data. The display data output unit 1200 outputs the generated second waveform image to the display device 3000.

[0040] When the equivalent model generating device 1000 starts the process, it executes the process from step ST1040 to step ST1070 in parallel with the flow from step ST1000 to step ST1030. In step ST1040, the equivalent model creating device 1000 acquires model circuit information. Specifically, the display data output unit 1200 in the equivalent model creating device 1000 outputs, for example, display data prompting the input of model circuit information to the display device 3000. When the operator operates the input device 2000 in response to the display on the display device 3000, the model circuit information acquisition unit 1141 in the third waveform data generation unit 1140 of the equivalent model creating device 1000 acquires model circuit information indicating a model circuit configured of LCR components. The model circuit information acquisition unit 1141 outputs the model circuit information to the analysis unit 1143.

[0041] Next, the equivalent model creating device 1000 analyzes the model circuit (step ST1050). Specifically, the analysis unit 1143 in the third waveform data generation unit 1140 of the equivalent model creating device 1000 acquires the model circuit information output from the model circuit information acquisition unit 1141. The analysis unit 1143 analyzes the configuration of the model circuit indicated in the model circuit information.

[0042] The equivalent model creating device 1000 generates third waveform data (step ST1060). Specifically, the analysis unit 1143 generates, as the analysis result, third waveform data indicating the impedance value for each frequency in the model circuit indicated in the model circuit information.

[0043] The equivalent model creating device 1000 outputs the third waveform data (step ST1070). Specifically, analysis unit 1143 outputs the third waveform data to display data output unit 1200. Third waveform image generation unit 1230 of display data output unit 1200 acquires the third waveform data output from third waveform data generation unit 1140 of waveform data output unit 1100. Third waveform image generation unit 1230 generates display data indicative of the third waveform using the third waveform data. Third waveform image generation unit 1230 outputs the display data indicative of the third waveform to display device 3000.

[0044] After executing the processing of step ST1030 and the processing of step ST1070, the equivalent model creation device 1000 may output to the display device 3000 an image in which two or more images of the first waveform image, the second waveform image, and the third waveform image are superimposed. In this case, specifically, the superimposed image generating unit 1240 in the display data output unit 1200 of the equivalent model creating device 1000 generates an image in which two or more images of the first waveform image, the second waveform image, and the third waveform image are superimposed.

[0045] After executing the process of step ST1030 and the process of step ST1070, the equivalent model generating device 1000 proceeds to the process of step ST1080.

[0046] In step ST1080, the equivalent model generating device 1000 determines whether or not an "LCR value output command is present." Specifically, the display data output unit 1200 in the equivalent model creation device 1000 outputs, for example, display data showing an image of a button for executing an LCR value output command to the display device 3000. When the operator operates the input device 2000 in response to the button image displayed by the display device 3000, the LCR value output unit 1300 receives an LCR value output command signal and determines that an "LCR value output command has been issued." If no operation is performed within a predetermined period of time, the LCR value output unit 1300 determines that an "LCR value output command has not been issued."

[0047] When it is determined that "an LCR value output command has been issued" (step ST1080 "YES"), the equivalent model creating device 1000 outputs the LCR value (step ST1090). Specifically, when the LCR value output unit 1300 in the equivalent model creation device 1000 receives an LCR value output command signal, it determines that an "LCR value output command has been issued," obtains each LCR value of the LCR components of the model circuit from the analysis unit 1143 of the third waveform data generation unit 1140, and outputs each LCR value to the display data output unit 1200. The equivalent model creating device 1000 may output the LCR value from the analysis section 1143 of the third waveform data generating section 1140, and may also output model circuit information indicating the model circuit.

[0048] When it is determined that "an LCR value output command is not issued" (step ST1080 "NO"), or after executing step ST1090, the equivalent model creating device 1000 determines whether to end the process (step ST1100).

[0049] If the equivalent model generating device 1000 determines not to end the process ("NO" at step ST1100), the equivalent model generating device 1000 proceeds to the process at step ST1040 and waits until new model circuit information is acquired, for example.

[0050] If it is determined that the process should be ended ("YES" in step ST1100), the equivalent model generating device 1000 ends the process.

[0051] Here, a second example of the function of the equivalent model creating device 1000 will be described. FIG. 7 is a diagram illustrating a second example of the functions of the equivalent model creating device 1000 according to the first embodiment. The second example is an example in which the second waveform data indicates the range of the target impedance value by the upper limit second waveform data and the lower limit second waveform data. Figure 7 shows a first waveform 6100, an upper limit second waveform 6310, a lower limit second waveform 6320, a third waveform 6400, and the regions of each frequency band (A1 region 6210, B1 region 6220, B2 region 6230, C1 region 6240, C2 region 6250), with frequency on the horizontal axis and impedance value on the vertical axis. FIG. 8 is an enlarged view of the waveforms in each region of FIG. The first waveform data representing the first waveform 6100 indicates, for example, impedance characteristics based on actual measurements, and is acquired by the first waveform data acquiring unit 1110. The upper limit second waveform data indicating the upper limit second waveform 6310 indicates the target impedance characteristic on the upper limit side of the range of the impedance characteristic to be targeted, and is generated by the second waveform data generating section 1130. The lower-limit second waveform data indicating the lower-limit second waveform 6320 indicates a target impedance characteristic on the lower limit side of the range of the impedance characteristic to be targeted, and is generated by the second waveform data generating section 1130. The third waveform data representing the third waveform 6400 indicates the impedance characteristics of the model circuit, and is generated by the third waveform data generating section 1140.

[0052] The A1 region 6210 is a frequency band that is distinguished from other regions because it is believed that the influence of the integrated circuit chip (see the chip part of the model circuit shown in Figure 4) is large around the maximum value of the impedance value (a region with multiple peaks). In FIGS. 7 and 8, the A1 region 6210 is a frequency band region from 54 MHz to 130 MHz.

[0053] The B1 region 6220 and the B2 region 6230 are frequency bands that are distinguished from other regions because they are thought to be significantly affected by the PCB board (see the PCB section 4100 of the model circuit shown in FIG. 4) and the vias on the PCB board. In FIGS. 7 and 8, B1 region 6220 is a frequency band region from 10 MHz to 54 MHz. 7 and 8, the B2 region 6230 is a frequency band region from 130 MHz to 1 GHz.

[0054] The C1 region 6240 and the C2 region 6250 are frequency bands that are distinguished from other regions because they are thought to be significantly affected by the resistance of the power supply of the integrated circuit. In FIGS. 7 and 8, C1 region 6240 is a frequency band region from 1 kHz to 100 kHz. In FIGS. 7 and 8, the C2 region 6250 is a frequency band region from 100 kHz to 10 MHz.

[0055] The frequency band information indicating each of the A1 region 6210, the B1 region 6220, the B2 region 6230, the C1 region 6240, and the C2 region 6250 is acquired by the target condition acquisition unit 1120 in the equivalent model creating device 1000.

[0056] Furthermore, the target conditions for each of the A1 area 6210, the B1 area 6220, the B2 area 6230, the C1 area 6240, and the C2 area 6250 are acquired by the target condition acquisition unit 1120. The target conditions for the A1 region 6210 shown in Figures 7 and 8 are such that the upper limit target condition is "+(a1)%" of the maximum impedance value in the first waveform 6100, and the lower limit target condition is the same as the maximum impedance value in the first waveform 6100 (increase / decrease rate "0%"). The target conditions for the B1 region 6220 shown in Figures 7 and 8 are such that the upper limit target condition is "+(b1)%" of the impedance value in the first waveform 6100, and the lower limit target condition is "-(b1)%" of the impedance value in the first waveform 6100. In the explanation, the upper limit target condition and the lower limit target condition are the same (b1), but they may be set to different values. The target conditions for the B2 region 6230 shown in Figures 7 and 8 are such that the upper limit target condition is "+(b2)%" of the impedance value in the first waveform 6100, and the lower limit target condition is "-(b2)%" of the impedance value in the first waveform 6100. In the explanation, the upper limit target condition and the lower limit target condition are the same (b2), but they may be set to different values. The target conditions for the C1 region 6240 shown in Figures 7 and 8 are such that the upper limit target condition is "+(c1)%" of the impedance value in the first waveform 6100, and the lower limit target condition is "-(c1)%" of the impedance value in the first waveform 6100. In the description, the upper limit target condition and the lower limit target condition are the same (c1), but they may be set to different values. The target conditions for the C2 region 6250 shown in FIGS. 7 and 8 are such that the upper limit target condition is an impedance value of "50 mΩ" and the lower limit target condition is an impedance value of "0Ω." The above (a1), (b1), (b2), and (c1) may be set appropriately depending on the pattern of the first waveform 6100.

[0057] The above-described disclosure makes it possible to display a target impedance with a simplified waveform for each frequency band region divided according to the waveform, even if the waveform of the impedance characteristics based on the actual measurement value is complex. Furthermore, it becomes easy to change the LCR values ​​of the corresponding LCR components according to the region, thereby reducing the workload when generating an equivalent model circuit.

[0058] The equivalent model creation device according to the present disclosure includes a first waveform data acquisition unit that acquires first waveform data indicating impedance for each frequency, a display data output unit that outputs display data indicating the first waveform based on the first waveform data, a target condition acquisition unit that acquires target conditions for determining a target impedance for each region of a different frequency band, a second waveform data generation unit that generates second waveform data indicating the target impedance for each frequency determined using the first waveform data and the target conditions, and a third waveform data generation unit that generates third waveform data indicating the impedance for each frequency in a model circuit composed of LCR components, and the display data output unit is further configured to output display data indicating the second waveform based on the second waveform data and display data indicating the third waveform based on the third waveform data. This has the effect of reducing the workload involved in generating an equivalent model circuit.

[0059] The equivalent model creation support method according to the present disclosure includes a first waveform data acquisition step in which a first waveform data acquisition unit acquires first waveform data indicating impedance for each frequency; a display data output step in which a display data output unit outputs display data indicating a first waveform based on the first waveform data; a target condition acquisition step in which a target condition acquisition unit acquires target conditions for determining a target impedance for each region of a different frequency band; a second waveform data generation step in which a second waveform data generation unit generates second waveform data indicating a target impedance for each frequency determined using the first waveform data and the target conditions; and a third waveform data generation step in which a third waveform data generation unit generates third waveform data indicating impedance for each frequency in a model circuit composed of LCR components, and the display data output step is further configured to output display data indicating a second waveform based on the second waveform data and display data indicating a third waveform based on the third waveform data. This has the effect of reducing the workload involved in generating an equivalent model circuit.

[0060] The equivalent model creation support program according to the present disclosure is configured to cause a computer to operate as an equivalent model creation device, comprising: a first waveform data acquisition unit that acquires first waveform data indicating impedance for each frequency; a display data output unit that outputs display data indicating the first waveform based on the first waveform data; a target condition acquisition unit that acquires target conditions for determining a target impedance for each region of a different frequency band; a second waveform data generation unit that generates second waveform data indicating the target impedance for each frequency determined using the first waveform data and the target conditions; and a third waveform data generation unit that generates third waveform data indicating the impedance for each frequency in a model circuit composed of LCR components, wherein the display data output unit is further configured to output display data indicating the second waveform based on the second waveform data and display data indicating the third waveform based on the third waveform data. This has the effect of reducing the workload involved in generating an equivalent model circuit.

[0061] In the equivalent model creation device disclosed herein, the target conditions acquired by the target condition acquisition unit are configured to be composed of a combination of a plurality of different frequency band information and, for each of the frequency band information, a rate of increase or decrease based on the impedance value of the first waveform data or a target impedance value. This makes it possible to set more appropriate target conditions for each frequency band region, and has the effect of further reducing the workload when generating an equivalent model circuit. Furthermore, by applying the above configuration to an equivalent model creation support method or an equivalent model creation program, the equivalent model creation support method or the equivalent model creation support program can achieve the same effects as those described above.

[0062] In the equivalent model creation device of the present disclosure, the display data output unit is configured to use the second waveform data and the third waveform data to output a display image in which the second waveform indicated in the second waveform data and the third waveform indicated in the third waveform data are superimposed. This makes it easier to compare the target impedance characteristics with the impedance characteristics of the model circuit, and has the effect of further reducing the workload when generating an equivalent model circuit. Furthermore, by applying the above configuration to an equivalent model creation support method or an equivalent model creation program, the equivalent model creation support method or the equivalent model creation support program can achieve the same effects as those described above.

[0063] In the equivalent model creation device of the present disclosure, the display data output unit is configured to use the first waveform data, the second waveform data, and the third waveform data to output a display image in which the first waveform indicated in the first waveform data, the second waveform indicated in the second waveform data, and the third waveform indicated in the third waveform data are superimposed. This makes it easier to compare the impedance characteristics based on actual measurements, the target impedance characteristics, and the impedance characteristics of the model circuit, thereby achieving the effect of further reducing the workload when generating an equivalent model circuit. Furthermore, by applying the above configuration to an equivalent model creation support method or an equivalent model creation program, the equivalent model creation support method or the equivalent model creation support program can achieve the same effects as those described above.

[0064] The equivalent model creating device of the present disclosure is configured to further include an LCR value output unit that outputs the LCR value in the model circuit used by the third waveform data generating unit in response to a command signal obtained from the outside. This makes it easier to obtain the LCR value of the equivalent model circuit after adjusting the model circuit, and has the effect of further reducing the workload when generating the equivalent model circuit. Furthermore, by applying the above configuration to an equivalent model creation support method or an equivalent model creation program, the equivalent model creation support method or the equivalent model creation support program can achieve the same effects as those described above.

[0065] Embodiment 2 The second embodiment is an embodiment including a configuration in which the equivalent model creating device allows adjustment of LCR components in the model circuit. In the description of the second embodiment, the description of the configuration described in the first embodiment may be omitted as appropriate.

[0066] FIG. 9 is a diagram showing an example of the configuration of an equivalent model creating device 1000A according to the second embodiment and peripheral devices. An equivalent model creating device 1000A shown in FIG. 9 has a different configuration from the equivalent model creating device 1000 shown in FIG. The input device 2000 and the display device 3000 are the same as those in FIG. 1, and therefore their description will be omitted.

[0067] The internal configuration of the equivalent model creating device 1000A will be described. The equivalent model creating device 1000A shown in FIG. 9 includes a waveform data output section 1100A, a display data output section 1200, and an LCR value output section 1300.

[0068] The waveform data output section 1100A includes a first waveform data acquisition section 1110, a target condition acquisition section 1120, a second waveform data generation section 1130, and a third waveform data generation section 1140A.

[0069] FIG. 10 is a diagram showing an example of the configuration of the third waveform data generating section 1140A according to the second embodiment. The third waveform data generating section 1140A generates third waveform data indicating impedance for each frequency in a model circuit configured with LCR components. Furthermore, the third waveform data generating unit 1140A receives an editing operation on the model circuit, and generates third waveform data indicating the impedance for each frequency in the edited model circuit. The third waveform data generating unit 1140A shown in FIG. 3 includes a model circuit information acquiring unit 1141, a model circuit editing unit 1142, and an analyzing unit 1143.

[0070] The model circuit information acquisition unit 1141 acquires model circuit information that indicates a model circuit configured with LCR components. The model circuit information is the same as the model circuit information described in the first embodiment, and therefore a detailed description thereof will be omitted.

[0071] The model circuit editing unit 1142 edits the model circuit indicated in the model circuit information. Specifically, the model circuit editing unit 1142 edits the model circuit information in accordance with the operation information based on the model circuit information output by the model circuit information acquisition unit 1141 and the operation information acquired via the input device 2000. At this time, the model circuit information edited includes information such as the number n of bypass capacitors in the model circuit and the LCR value of each LCR component. When editing a model circuit, if the model circuit information is edited while comparing the second waveform data and the third waveform data, for example, if the difference is large in region A of FIG. 2 (or region A1 of FIGS. 7 and 8), adjusting the LCR value of the CHIP section of the model circuit shown in FIG. 4 is considered to change the impedance value of the model circuit in region A. Similarly, if the difference is large in region B1 or B2 of FIG. 2 (or region B1 or B2 of FIGS. 7 and 8), adjusting the LCR value of LCR component 4130 of PCB section 4100 is considered to change the impedance value of the model circuit in region B1 or B2. Similarly, if the difference is large in region C of FIG. 2, adjusting the LCR value of LCR component 4120 of power supply 4110 is considered to change the impedance value of the model circuit in region C.

[0072] The analysis unit 1143 uses the model circuit information acquired from the model circuit information acquisition unit 1141 or the model circuit editing unit 1142 to generate third waveform data indicating the impedance value for each frequency in the model circuit indicated in the model circuit information. Specifically, the analysis unit 1143 acquires model circuit information from the model circuit information acquisition unit 1141 or the model circuit editing unit 1142. Next, the analysis unit 1143 analyzes the model circuit indicated in the model circuit information and generates third waveform data indicating impedance values ​​for each frequency in the model circuit indicated in the model circuit information. The analysis unit 1143 outputs the generated third waveform data.

[0073] Furthermore, the analysis unit 1143 analyzes the model circuit indicated in the model circuit information, and outputs the LCR values ​​of the LCR components of the model circuit, and model circuit information indicating the model circuit used for the analysis. Specifically, when the LCR value output unit 1300 acquires an LCR value output command signal, the analysis unit 1143 analyzes the model circuit indicated in the model circuit information to obtain each LCR value of the LCR components in the model circuit and model circuit information indicating the model circuit used for the analysis. The analysis unit 1143 outputs the LCR values ​​to the LCR value output unit 1300. The analysis unit 1143 also outputs the model circuit information to the display data output unit 1200.

[0074] An example of processing by the equivalent model creation device 1000A according to the second embodiment will be described. FIG. 11 is a flowchart showing an example of processing by the equivalent model creating device 1000A according to the second embodiment. The process shown in the flowchart of FIG. 11 differs from the flowchart of FIG. 6 in that step ST2110 has been added. The processes from step ST2000 to step ST2100 shown in the flowchart of FIG. 11 correspond to the processes from step ST1000 to step ST1100 shown in the flowchart of FIG. 6, respectively, and therefore detailed description thereof will be omitted here.

[0075] The equivalent model creating device 1000A makes a determination in step ST2100 in the same manner as in step ST1100 shown in FIG. 6, and if it determines not to end the process (step ST2100 "NO"), executes a model circuit editing process (step ST2110). Specifically, the display data output unit 1200 of the equivalent model creation device 1000A generates display data that is an image for editing the model circuit and outputs it to the display device 3000. When the operator operates the input device 2000 in response to the display of the image for editing the model circuit by the display device 3000, the model circuit editing unit 1142 acquires operation information via the input device 2000. Based on the model circuit information output by the model circuit information acquisition unit 1141 and the operation information acquired via the input device 2000, the model circuit editing unit 1142 edits information such as the number n of bypass capacitors and the LCR values ​​of LCR components in the model circuit information in accordance with the operation information. The model circuit editing unit 1142 outputs the edited model circuit information to the analysis unit 1143.

[0076] After executing the process of step ST2110, the equivalent model generating device 1000A proceeds to the process of step ST2050. The equivalent model creating device 1000A analyzes the model circuit in the process of step ST2050. Specifically, the analysis unit 1143 in the third waveform data generation unit 1140A of the equivalent model creating device 1000A acquires the model circuit information output from the model circuit editing unit 1142. The analysis unit 1143 analyzes the configuration of the model circuit indicated in the model circuit information.

[0077] After executing the process of step ST2050, the equivalent model creating device 1000A proceeds to and executes the process of step ST2060. The process from step ST2060 onwards is the same as that already explained, and therefore the explanation will be omitted.

[0078] The above-described disclosure makes it easy to compare waveforms for each region and change the LCR values ​​of corresponding LCR components depending on the region, thereby reducing the workload when generating an equivalent model circuit.

[0079] In the equivalent model creation device of the present disclosure, the third waveform data generation unit is configured to include: a model circuit information acquisition unit that acquires model circuit information that indicates a model circuit; an equivalent model editing unit that edits the model circuit that is indicated in the model circuit information based on operation information; and an analysis unit that uses the model circuit information acquired from the model circuit information acquisition unit or the equivalent model editing unit to generate third waveform data that indicates an impedance value for each frequency in the model circuit that is indicated in the model circuit information. This makes it easy to compare waveforms for each region and change the LCR values ​​of the corresponding LCR components depending on the region, thereby reducing the workload when generating an equivalent model circuit. Furthermore, by applying the above configuration to an equivalent model creation support method or an equivalent model creation program, the equivalent model creation support method or the equivalent model creation support program can achieve the same effects as those described above.

[0080] Here, a hardware configuration for realizing the functions of the equivalent model creation devices 1000 and 1000A according to the present disclosure will be described. FIG. 12 is a diagram illustrating a first example of a hardware configuration for realizing the functions according to the present disclosure. FIG. 13 is a diagram illustrating a second example of a hardware configuration for realizing the functions according to the present disclosure. The equivalent model creating device 1000, 1000A of the present disclosure is realized by hardware such as that shown in FIG. 12 or FIG.

[0081] As shown in FIG. 12, the equivalent model generating devices 1000 and 1000A are configured with a processor 10001 and a memory 10002. The processor 10001 and the memory 10002 are, for example, installed in a computer. Memory 10002 stores programs that cause the computer to function as waveform data output units 1100, 1100A, first waveform data acquisition unit 1110, target condition acquisition unit 1120, second waveform data generation unit 1130, third waveform data generation unit 1140, 1140A, model circuit information acquisition unit 1141, model circuit editing unit 1142, analysis unit 1143, display data output unit 1200, first waveform image generation unit 1210, second waveform image generation unit 1220, third waveform image generation unit 1230, superimposed image generation unit 1240, LCR value image generation unit 1250, LCR value output unit 1300, and a control unit not shown. When the processor 10001 reads out and executes the program stored in the memory 10002, the functions of the waveform data output units 1100, 1100A, the first waveform data acquisition unit 1110, the target condition acquisition unit 1120, the second waveform data generation unit 1130, the third waveform data generation unit 1140, 1140A, the model circuit information acquisition unit 1141, the model circuit editing unit 1142, the analysis unit 1143, the display data output unit 1200, the first waveform image generation unit 1210, the second waveform image generation unit 1220, the third waveform image generation unit 1230, the superimposed image generation unit 1240, the LCR value image generation unit 1250, the LCR value output unit 1300, and a control unit not shown are realized. Furthermore, a storage unit (not shown) is realized by the memory 10002 or another memory (not shown). The processor 10001 is, for example, a central processing unit (CPU), a graphics processing unit (GPU), a microprocessor, a microcontroller, or a digital signal processor (DSP). Memory 10002 may be a non-volatile or volatile semiconductor memory such as RAM (Random Access Memory), ROM (Read Only Memory), EPROM (Erasable Programmable ROM), EEPROM (Electrically Erasable Programmable Read Only Memory) or flash memory, or a magnetic disk such as a hard disk or flexible disk, or an optical disk such as a CD (Compact Disc) or DVD (Digital Versatile Disc), or a magneto-optical disk. The processor 10001 and the memory 10002 are connected in a state where they can transmit data to each other. The processor 10001 and the memory 10002 are also connected to other hardware via the input / output interface 10003 in a state where they can transmit data to each other.

[0082] Alternatively, the functions of the waveform data output units 1100, 1100A, first waveform data acquisition unit 1110, target condition acquisition unit 1120, second waveform data generation unit 1130, third waveform data generation unit 1140, 1140A, model circuit information acquisition unit 1141, model circuit editing unit 1142, analysis unit 1143, display data output unit 1200, first waveform image generation unit 1210, second waveform image generation unit 1220, third waveform image generation unit 1230, superimposed image generation unit 1240, LCR value image generation unit 1250, LCR value output unit 1300, and a control unit not shown may be realized by a dedicated processing circuit 10004, as shown in FIG. 13. The processing circuit 10004 may be, for example, a single circuit, a composite circuit, a programmed processor, a parallel programmed processor, an ASIC (Application Specific Integrated Circuit), a PLD (Programmable Logic Device), an FPGA (Field-Programmable Gate Array), an SoC (System-on-a-Chip), or a system LSI (Large-Scale Integration). Furthermore, the memory 10005 or another memory not shown implements a storage unit not shown. The memory 10005 may be a non-volatile or volatile semiconductor memory such as RAM (Random Access Memory), ROM (Read Only Memory), EPROM (Erasable Programmable ROM), EEPROM (Electrically Erasable Programmable Read Only Memory) or flash memory, or a magnetic disk such as a hard disk or flexible disk, or an optical disk such as a CD (Compact Disc) or DVD (Digital Versatile Disc), or a magneto-optical disk. The processing circuit 10004 and the memory 10005 are connected in a state where they can transmit data to each other. The processing circuit 10004 and the memory 10005 are also connected in a state where they can transmit data to other hardware via the input / output interface 10006. The functions of the waveform data output units 1100, 1100A, first waveform data acquisition unit 1110, target condition acquisition unit 1120, second waveform data generation unit 1130, third waveform data generation unit 1140, 1140A, model circuit information acquisition unit 1141, model circuit editing unit 1142, analysis unit 1143, display data output unit 1200, first waveform image generation unit 1210, second waveform image generation unit 1220, third waveform image generation unit 1230, superimposed image generation unit 1240, LCR value image generation unit 1250, LCR value output unit 1300, and a control unit (not shown) may be realized by separate processing circuits, or may be realized collectively by a processing circuit.

[0083] Alternatively, some of the functions of the waveform data output units 1100, 1100A, first waveform data acquisition unit 1110, target condition acquisition unit 1120, second waveform data generation unit 1130, third waveform data generation unit 1140, 1140A, model circuit information acquisition unit 1141, model circuit editing unit 1142, analysis unit 1143, display data output unit 1200, first waveform image generation unit 1210, second waveform image generation unit 1220, third waveform image generation unit 1230, superimposed image generation unit 1240, LCR value image generation unit 1250, LCR value output unit 1300, and a control unit (not shown) may be realized by processor 10001 and memory 10002, and the remaining functions may be realized by processing circuit 10004.

[0084] It should be noted that, within the scope of the present disclosure, the embodiments may be freely combined, any component of each embodiment may be modified, or any component of each embodiment may be omitted. [Explanation of symbols]

[0085] 1000, 1000A equivalent model creating device, 1100, 1100A waveform data output unit, 1110 first waveform data acquisition unit, 1120 target condition acquisition unit, 1130 second waveform data generation unit, 1140, 1140A third waveform data generation unit, 1141 model circuit information acquisition unit, 1142 model circuit editing unit, 1143 analysis unit, 1200 display data output unit, 1210 first waveform image generation unit, 1220 second waveform image generation unit, 1230 third waveform image generation unit, 1240 superimposed image generation unit, 1250 LCR value image generation unit, 1300 LCR value output unit, 2000 input device, 3000 display device, 4000 model circuit, 4100 PCB unit, 4110 power supply, 4120 LCR component, 4130 LCR component, 4140 (4140-1,...,4140-n) LCR component, 4150 (4150-1,...,4150-n) LCR component, 4200 PKG section, 4210 LCR component, 4300 CHIP section, 4310 LCR component, 5100 1st waveform, 5210 A area, 5220 B1 area, 5230 B2 area, 5240 C area, 5300 2nd waveform, 6100 1st waveform, 6210 A1 area, 6220 B1 area, 6230 B2 area, 6240 C1 area, 6250 C2 area, 6310 2nd upper limit waveform, 6320 2nd lower limit waveform, 6400 3rd waveform, 10001 processor, 10002 memory, 10003 input / output interface, 10004 Processing circuit, 10005 memory, 10006 input / output interface.

Claims

1. A first waveform data acquisition unit that acquires first waveform data that indicates the impedance of a target circuit for each frequency; a display data output unit that outputs display data showing a first waveform based on the first waveform data; a target condition acquisition unit that acquires target conditions for determining a target impedance for each of different frequency band regions; a second waveform data generating unit that generates second waveform data indicating a target impedance for each frequency for the target circuit determined using the first waveform data and the target condition; a third waveform data generating unit that generates third waveform data indicating impedance for each frequency in a model circuit of the target circuit configured with LCR components; Equipped with the display data output unit further outputs display data showing a second waveform based on the second waveform data and display data showing a third waveform based on the third waveform data. Equivalent model creation device.

2. The third waveform data generating unit a model circuit information acquisition unit that acquires model circuit information indicating the model circuit; an equivalent model editing unit that edits the model circuit indicated in the model circuit information based on operation information; an analysis unit that generates third waveform data indicating an impedance value for each frequency in the model circuit indicated in the model circuit information, using the model circuit information acquired from the model circuit information acquisition unit or the equivalent model editing unit; Equipped with 2. The equivalent model creating device according to claim 1.

3. The target conditions acquired by the target condition acquisition unit are configured by a combination of a plurality of different frequency band information and, for each of the frequency band information, a rate of increase or decrease based on the impedance value of the first waveform data or a target impedance value.

3. The equivalent model creating device according to claim 1.

4. The display data output unit outputting a display image in which the second waveform represented by the second waveform data and the third waveform represented by the third waveform data are superimposed using the second waveform data and the third waveform data; 4. The equivalent model creating device according to claim 1.

5. The display data output unit outputting a display image in which a first waveform represented by the first waveform data, a second waveform represented by the second waveform data, and a third waveform represented by the third waveform data are superimposed using the first waveform data, the second waveform data, and the third waveform data; 5. The equivalent model creating device according to claim 1.

6. an LCR value output unit that outputs the LCR value in the model circuit used by the third waveform data generation unit in response to a command signal obtained from an external device; The equivalent model creating device according to claim 1 , further comprising:

7. a first waveform data acquiring step in which a first waveform data acquiring unit acquires first waveform data indicating impedance for each frequency of the target circuit; a display data output step in which a display data output unit outputs display data showing a first waveform based on the first waveform data; a target condition acquisition step in which a target condition acquisition unit acquires target conditions for determining a target impedance for each of different frequency band regions; a second waveform data generating step in which a second waveform data generating unit generates second waveform data indicating a target impedance for each frequency for the target circuit determined using the first waveform data and the target condition; a third waveform data generating step in which a third waveform data generating unit generates third waveform data indicating impedance for each frequency in a model circuit of the target circuit configured with LCR components; Equipped with The display data output step further includes outputting display data showing a second waveform based on the second waveform data and display data showing a third waveform based on the third waveform data. A method for supporting the creation of equivalent models.

8. Computer, a first waveform data acquisition unit that acquires first waveform data indicating the impedance of the target circuit for each frequency; a display data output unit that outputs display data showing a first waveform based on the first waveform data; a target condition acquisition unit that acquires target conditions for determining a target impedance for each of different frequency band regions; a second waveform data generating unit that generates second waveform data indicating a target impedance for each frequency for the target circuit determined using the first waveform data and the target condition; a third waveform data generating unit that generates third waveform data indicating impedance for each frequency in a model circuit of the target circuit configured with LCR components; Equipped with the display data output unit further outputs display data showing a second waveform based on the second waveform data and display data showing a third waveform based on the third waveform data. Equivalent model creation device, 10. An equivalent model creation support program that operates as follows.

Images