Light intensity monitoring device and light intensity monitoring method

Abstract

To provide an optical intensity monitoring device and an optical intensity monitoring method that enable accurate monitoring of the intensity of light radiated to coated parts of a support that is continuously running.SOLUTION: An optical intensity monitoring device of the present disclosure includes: a light source that radiates light from a front face side through a window material to a support that has the front face in which coated parts, coated with a coating material, and uncoated parts, not coated with the coating material, are formed alternately in a running direction, and the back face in contact with a roller, and that is wound around the roller and runs continuously; an optical intensity measuring instrument that measures the intensity of reflected light that is generated by the light that has passed through the window material and support from the light source being reflected on the front face of the roller, and that has passed through the support and window material; and a processor that estimates the intensity of light radiated from the light source to the coated parts based on a measurement value of the intensity of the reflected light that has passed through the support in the uncoated parts, among measurement values measured by the optical intensity measuring instrument.SELECTED DRAWING: Figure 7

Description

[Technical Field]

[0001] The technology of the present disclosure relates to an optical power monitoring device and an optical power monitoring method. [Background technology]

[0002] The process for manufacturing display components includes an irradiation step in which a polymerizable liquid crystal material (coating material) is applied to a transported support, which is then dried, and then irradiated with light including ultraviolet light to harden the liquid crystal material. The support is a strip-shaped roll that is wound around a roller and travels continuously.

[0003] In the irradiation process, the components of the coating material contained in the coated portion of the support are volatilized by light and heat, contaminating the window material located between the light source and the support. If the window material is contaminated, the intensity of the light irradiated to the coated portion of the support decreases even if the output of the light source is constant, resulting in a deterioration in quality.

[0004] Patent Document 1 discloses a technology for detecting contamination of a transparent plate (corresponding to a window material) in a color thermal printer that irradiates color thermal recording paper with ultraviolet light from a light source through the transparent plate. Specifically, the color thermal printer described in Patent Document 1 is equipped with a first illuminance sensor that measures the illuminance of ultraviolet light that has passed through the transparent portion from the light source, and a second illuminance sensor that directly measures the illuminance of ultraviolet light emitted from the light source. By comparing the outputs of the first and second illuminance sensors, it is possible to determine whether the transparent portion is contaminated. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-322301 Summary of the Invention [Problem to be solved by the invention]

[0006] The technology described in Patent Document 1 makes it possible to detect contamination of a window material, but it is a technology that detects contamination of a window material when color thermosensitive recording paper (corresponding to the support) is not present on the guide plate between the light source and the second illuminance sensor. Therefore, the technology described in Patent Document 1 cannot be applied to devices that irradiate light onto a continuously running support. Furthermore, the technology described in Patent Document 1 merely detects the intensity of light that has passed through the window material from the light source, but does not detect the intensity of light irradiated onto the color thermosensitive recording paper. Therefore, the technology described in Patent Document 1 cannot monitor the intensity of light irradiated onto the coated portion of the support.

[0007] Therefore, it is conceivable to estimate the intensity of light irradiated onto the coated portion of the continuously running support by detecting the intensity of reflected light from the light irradiated onto the coated portion. However, since the coated portion absorbs most of the light irradiated onto it, the intensity of the reflected light is small, making it impossible to accurately monitor the intensity of light irradiated onto the coated portion.

[0008] The technology disclosed herein aims to provide a light intensity monitoring device and a light intensity monitoring method that enable accurate monitoring of the intensity of light irradiated onto the coating portion of a continuously running support. [Means for solving the problem]

[0009] In order to achieve the above object, the light intensity monitoring device disclosed herein has a surface on which coated areas where the coating material is applied and uncoated areas where the coating material is not applied are formed alternately in the running direction, and a back surface with which the roller comes into contact, and is equipped with: a light source that irradiates light from the surface side through a window material onto a support that is wound around the roller and running continuously; a light intensity meter that measures the intensity of the reflected light that is generated when light from the light source passes through the window material and the support and is reflected on the surface of the roller, and that passes through the support and window material; and a processor that estimates the intensity of light irradiated from the light source to the coated areas based on the measurement value of the intensity of the reflected light that passes through the support in the uncoated areas, from the measurement values ​​measured by the light intensity meter.

[0010] The light intensity measuring device is preferably a spectrometer that measures the intensity of reflected light for each wavelength.

[0011] It is preferable that the light emitted from the light source contains ultraviolet light, and that the coated portion absorbs the ultraviolet light.

[0012] The coating material is preferably a liquid crystal material that hardens when exposed to ultraviolet light.

[0013] It is preferable that the processor determines whether the measurement value measured by the light intensity meter is a measurement value of the intensity of reflected light that has passed through the support in the uncoated portion, based on the ratio between the intensity of ultraviolet light contained in the reflected light and the intensity of light in a wavelength band other than ultraviolet light.

[0014] Preferably, the processor uses a pre-created linear calibration to estimate the intensity of light irradiated from the light source onto the coated portion from the measured value of the intensity of light reflected from the support in the uncoated portion.

[0015] Preferably, the processor generates a graph showing the measured intensity of reflected light passing through the support in the uncoated portion, or the estimated intensity of light irradiated from the light source onto the coated portion, against the cumulative coating length of the coating material applied to the support, and displays this on the display.

[0016] The processor preferably calculates the cumulative coating length based on the cumulative coating time and the running speed of the support.

[0017] The processor preferably adjusts the intensity of the light emitted from the light source so that the estimated value of the intensity of the light irradiated from the light source onto the application area falls within a certain range.

[0018] The support is formed by joining a plurality of strip-shaped flexible supports in the running direction, and the uncoated portion is preferably formed in an area including the joined portions of the strip-shaped flexible supports.

[0019] The light intensity monitoring method disclosed herein includes irradiating light from the front side through a window material onto a support that has a front surface in which coated areas where a coating material is applied and uncoated areas where no coating material is applied are alternately formed in the running direction, and a back surface that comes into contact with a roller, and that runs continuously while wrapped around a roller; measuring the intensity of reflected light that is generated when light from the light source passes through the window material and the support and is reflected by the surface of the roller, and that passes through the support and window material, with a light intensity meter; and estimating the intensity of light irradiated from the light source to the coated areas based on the measurement value of the intensity of reflected light that passes through the support in the uncoated areas, from the measurement values ​​measured by the light intensity meter. [Effects of the Invention]

[0020] According to the technology of the present disclosure, it is possible to provide a light intensity monitoring device and a light intensity monitoring method that enable accurate monitoring of the intensity of light irradiated onto the coating portion of a continuously traveling support. [Brief explanation of the drawings]

[0021] [Figure 1] FIG. 2 is a diagram schematically illustrating the configuration of a manufacturing apparatus. [Figure 2] FIG. 2 is a diagram schematically illustrating the configuration of an unwinding device. [Figure 3] FIG. 2 is a diagram schematically illustrating the support after coating. [Figure 4] FIG. 2 is a diagram schematically illustrating the configuration of a light irradiation device. [Figure 5] FIG. 2 is a diagram schematically illustrating a state in which light is irradiated from a light source onto a support. [Figure 6] FIG. 2 is a diagram schematically illustrating the shapes of a backup roller and an ultraviolet lamp. [Figure 7] FIG. 10 is a diagram showing an example of measurement values ​​output from a spectroscope when a coated portion of a support is irradiated with light. [Figure 8] FIG. 10 is a diagram showing an example of measurement values ​​output from a spectroscope when an uncoated portion of a support is irradiated with light. [Figure 9] FIG. 1 illustrates an example of a configuration of an information processing device. [Figure 10] FIG. 2 is a diagram illustrating an example of functions configured in a processor. [Figure 11] FIG. 10 is a diagram showing an example of a linear calibration used to estimate irradiation intensity. [Figure 12] FIG. 4 is a diagram illustrating an example of a graph generated by a graph generating unit. [Figure 13] FIG. 10 is a diagram showing an example of a graph when the intensity of light emitted from a light source is adjusted. [Figure 14] 10 is a flowchart showing an example of a processing flow of the optical intensity monitoring device. DETAILED DESCRIPTION OF THE INVENTION

[0022] DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, embodiments of the technology of the present disclosure will be described with reference to the drawings. In the following, the embodiments will be described by taking as an example a manufacturing process of a liquid crystal film as a display member.

[0023] 1 shows a schematic configuration of a manufacturing apparatus 10 for manufacturing a liquid crystal film. The manufacturing apparatus 10 is a so-called roll-to-roll type manufacturing apparatus. The manufacturing apparatus 10 includes an unwinding device 11, a coating device 12, a heating device 13, a light irradiation device 14, and a winding device 15. The light irradiation device 14 is provided with a light intensity monitoring device 16.

[0024] The support 2 is transported between the unwinding device 11 and the winding device 15, passing through the coating device 12, the heating device 13, and the light irradiation device 14. The support 2 is in a roll form within the unwinding device 11, is unwound from the unwinding device 11, and is wound up by the winding device 15. The support 2 is a flexible, strip-shaped transparent film. For example, the support 2 is a resin film such as a cellulose acylate film, an acrylic film, or a polycarbonate film.

[0025] A plurality of sets of coating devices 12, heating devices 13, and light irradiation devices 14 are provided between the unwinding device 11 and the winding device 15. For example, in order to form an alignment layer and a liquid crystal layer on the support 2, two sets of heating devices 13 and light irradiation devices 14 are provided between the unwinding device 11 and the winding device 15.

[0026] The coating device 12 is a device that uses a coating head to apply (coat) a liquid coating material onto the support 2. The coating material is a polymerizable liquid crystal material that hardens when exposed to ultraviolet light. For example, a die coating method is used as a coating method using the coating device 12. The die coating method has the advantage that coating can be performed without contacting the support 2, and therefore the surface of the support 2 is not damaged.

[0027] The heating device 13 is a device that heats and dries the coating material applied onto the support 2. Examples of drying methods using the heating device 13 include heating and drying with a heater and heating and drying with hot air.

[0028] The light irradiation device 14 includes a light source that irradiates the dried coating material applied to the support 2 with light including ultraviolet light to polymerize the coating material. The coating material hardens to become an alignment layer or a liquid crystal layer.

[0029] In addition to the components shown in the figure, the manufacturing apparatus 10 is provided with a transport roller for transporting the support 2, a guide member for regulating the position of the support 2 in the width direction, various sensors, a static eliminator, etc.

[0030] FIG. 2 shows a schematic configuration of the unwinding device 11. The unwinding device 11 includes a first rotating shaft 11A, a second rotating shaft 11B, a turret arm 17, and a joining device 18. The turret arm 17 is rotatably mounted on a shaft 17A. The first rotating shaft 11A is connected to one end of the turret arm 17, and the second rotating shaft 11B is connected to the other end. The first rotating shaft 11A rotatably supports the old roll 3A, which finishes unwinding the support 2. The second rotating shaft 11B rotatably supports the new roll 3B, which starts unwinding the support 2.

[0031] The support 2 unwound from the old roll 3A and the support 2 unwound from the new roll 3B are guided to a joining device 18. The joining device 18 joins the end portion of the support 2 from the old roll 3A to the front end portion of the support 2 from the new roll 3B. For example, the joining device 18 joins the end portion and the front end by applying tape 4 so as to cover them. Hereinafter, the area where the end portion and the front end are joined is referred to as a joining portion 5.

[0032] When joining by the joining device 18 is completed, the turret arm 17 rotates to change the positions of the first rotating shaft 11A and the second rotating shaft 11B, and the new roll 3B is attached to the first rotating shaft 11A that has finished unwinding the support 2. The joining of the old roll 3A and the new roll 3B is repeated.

[0033] As described above, the support 2 of this embodiment is constructed by joining a plurality of strip-shaped flexible supports in the running direction, and runs continuously without stopping along the conveyance path in the manufacturing apparatus 10. Furthermore, since the support 2 is constructed by joining a plurality of strip-shaped flexible supports in the running direction, joint portions 5 exist at regular intervals. In the support 2, the joint portions 5 include members such as tape 4, and therefore are thicker than the non-jointed portions other than the joint portions 5.

[0034] FIG. 3 is a schematic diagram of the support 2 after coating. As shown in FIG. 3, the thickness of the bonded portion 5 of the support 2 is greater than the thickness of the non-bonded portion. For this reason, in the coating device 12, the coating head for applying the coating material to the surface 2A of the support 2 must temporarily move away from its fixed position as the bonded portion 5 passes, in order to avoid contact with the bonded portion 5. As such, the bonded portion cannot be coated with the coating material, and therefore, intermittent uncoated portions of the support 2 are produced where the coating material has not been applied.

[0035] 3, coated portions A coated with the coating material 6 and uncoated portions B not coated with the coating material 6 are formed alternately in the running direction on the surface 2A of the support 2. The uncoated portions B are formed in an area including the joint portion 5.

[0036] 4 is a schematic diagram showing the configuration of the light irradiation device 14. The light irradiation device 14 includes a light source 20, a backup roller 23, a frame 24, a spectroscope 25, and an information processing device 27.

[0037] The surface of the backup roller 23 contacts the back surface 2B (see FIG. 3) of the support 2, and supports the support 2 from the back surface 2B side. The support 2 runs continuously while being wrapped around the backup roller 23. The backup roller 23 is an example of a "roller" according to the technology of the present disclosure.

[0038] In this embodiment, the light irradiation device 14 has a plurality of light sources 20 arranged along the running direction of the support 2. Specifically, a plurality of light sources 20 are provided for one backup roller 23. The frame 24 is formed of a light-blocking material such as metal, and is disposed between the backup roller 23 and the plurality of light sources 20. The frame 24 has window members 24A provided at positions corresponding to the respective light sources 20. The window members 24A are formed of a light-transmitting material such as glass.

[0039] The light source 20 includes an ultraviolet lamp 21 and a reflector 22. The ultraviolet lamp 21 is, for example, a high-pressure mercury lamp, and emits light containing ultraviolet rays. The reflector 22 reflects a portion of the light emitted from the ultraviolet lamp 21. The light source 20 irradiates light onto the support 2 through a window material 24A. Each light source 20 irradiates light onto an area of ​​the support 2 that is wrapped around a backup roller 23.

[0040] One spectroscope 25 is provided for each light source 20. An optical fiber 26 serving as a light receiving section is connected to the spectroscope 25, and the reflected light that has passed through the window material 24A from the support body 2 is received via the optical fiber 26. The tip of the optical fiber 26 is positioned near the window material 24A using a fixing jig (not shown).

[0041] Each spectrometer 25 measures the intensity of the received reflected light for each wavelength and outputs the measurement value to the information processing device 27. The spectrometer 25 is, for example, an ultraviolet-visible spectrophotometer that can measure the intensity of light from the ultraviolet to the visible region. The spectrometer 25 is an example of a "light intensity measuring device" according to the technology of the present disclosure.

[0042] The light intensity monitor 16 (see FIG. 1) is composed of a spectrometer 25 and an information processor 27.

[0043] FIG. 5 schematically shows how light L is irradiated from light source 20 onto support 2. Light source 20 irradiates light L onto support 2 from the surface 2A side through window material 24A. Light L that passes from light source 20 and passes through window material 24A passes through support 2 and is incident on the surface of backup roller 23. The surface of backup roller 23 reflects the incident light L to generate reflected light R. A portion of reflected light R passes through support 2 and window material 24A. Spectrometer 25 receives reflected light R that has passed through window material 24A via optical fiber 26.

[0044] 6 shows a schematic diagram of the shapes of the backup roller 23 and the ultraviolet lamp 21. The backup roller 23 and the ultraviolet lamp 21 each extend in a direction perpendicular to the running direction of the support 2. The face length of the backup roller 23 is longer than the width of the support 2. The width of the support 2 is approximately 1.3 to 2 m.

[0045] In the irradiation step in which light is irradiated onto the support 2 by the light source 20, the components of the coating material 6 (see FIG. 3) contained in the coating portion A of the support 2 are volatilized by the light and heat, but the center portion of the backup roller 23 is always covered by the support 2 and is therefore kept clean and free from contamination. On the other hand, contamination occurs at the end portion of the backup roller 23 that is exposed from the support 2. For this reason, in this embodiment, it is preferable that the optical fiber 26 is positioned so that the spectrometer 25 receives reflected light R from the center portion of the backup roller 23, which is less affected by contamination.

[0046] The window material 24A is also contaminated due to the volatilization of the components of the coating material 6. The window material 24A turns brown or black due to the contamination. Therefore, when the window material 24A is contaminated, the intensity of the light L irradiated onto the support 2 decreases even if the output of the light source 20 is constant. This reduces the quality of the liquid crystal film manufactured by the manufacturing apparatus 10. In this embodiment, the light intensity monitor 16 monitors the decrease in the intensity of the light irradiated onto the support 2. Hereinafter, the intensity (i.e., illuminance) of the light irradiated onto the support 2 is referred to as the irradiation intensity. The light intensity monitor 16 estimates the irradiation intensity based on the above-mentioned measured values.

[0047] 7 and 8 show examples of measurement values ​​output from the spectroscope 25. The vertical axis of the graphs shown in FIGS. 7 and 8 represents the light intensity of the reflected light R, and the horizontal axis represents the wavelength. The first band is the wavelength band of ultraviolet light necessary for the polymerization reaction of the coating material 6. The second band is the band of visible light. For example, the first band is a wavelength range of 360 to 370 nm, and the second band is a wavelength range of 400 to 750 nm.

[0048] FIG. 7 shows an example of the measurement values ​​output from the spectroscope 25 when light L is irradiated onto the coated portion A of the support 2. When light L is irradiated onto the coated portion A, the intensity of the first band contained in the reflected light R decreases because most of the ultraviolet light is absorbed by the coating material 6. On the other hand, the intensity of the second band hardly decreases because almost no visible light is absorbed by the coating material 6. The coating material 6 is, for example, a coating liquid that appears transparent.

[0049] 8 shows an example of the measurement values ​​output from the spectroscope 25 when light L is irradiated onto the uncoated portion B of the support 2. When light L is irradiated onto the uncoated portion B, there is no coating material 6 that absorbs ultraviolet light, so the intensity of the first band contained in the reflected light R hardly decreases, and the intensity of the second band hardly decreases either.

[0050] Therefore, in this embodiment, the light intensity monitor 16 estimates the irradiation intensity based on the measured value of the intensity of the reflected light R when the uncoated portion B is irradiated with the light L.

[0051] 9 shows an example of the configuration of the information processing device 27. The information processing device 27 has a processor 30, a storage unit 31, an input unit 32, a display unit 33, a communication I / F (interface) 34, and a bus 35. The processor 30 is a computer that realizes various functions by reading out a program 36 and various data stored in the storage unit 31 and executing processing. The processor 30 is, for example, a CPU (Central Processing Unit).

[0052] The memory unit 31 is a storage device that stores the program 36 and various data used when the processor 30 executes processing. The memory unit 31 includes, for example, a random access memory (RAM), a read-only memory (ROM), or a storage. The RAM is, for example, a volatile memory used as a work area or the like for the processor 30. The ROM is, for example, a non-volatile memory such as a flash memory that stores the program 36 and various data. The storage is, for example, a large-capacity storage device such as a hard disk drive (HDD) or a solid state drive (SSD), and stores an operating system (OS), various data, etc. The memory unit 31 may be configured as an external device connected to the information processing device 27.

[0053] The input unit 32 is an input device such as a keyboard, a touchpad, or a mouse. The display unit 33 is a display such as a liquid crystal display. The input unit 32 and the display unit 33 may be configured as external devices connected to the information processing device 27. The processor 30 communicates with the spectrometer 25 and the light source 20 via a communication I / F 34.

[0054] 10 shows an example of functions configured in the processor 30. The processor 30 functions as a main control unit 40, an acquisition unit 41, a determination unit 42, an estimation unit 43, and a graph generation unit 44. These functions are realized by the processor 30 executing processes based on a program 36 (see FIG. 9). These functions may also be realized by hardware.

[0055] The main control unit 40 comprehensively controls various functions within the processor 30. The main control unit 40 also receives operation signals input from the input unit 32 and performs display control to display various information on the display unit 33.

[0056] The main control unit 40 controls the spectroscope 25 and causes the spectroscope 25 to output measurement values. The acquisition unit 41 acquires the measurement values ​​output from the spectroscope 25. The main control unit 40 causes the spectroscope 25 to output measurement values ​​at predetermined time intervals.

[0057] Based on the measurement value acquired by the acquisition unit 41, the determination unit 42 determines whether the measurement value is a measurement value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B. Specifically, the determination unit 42 makes the determination based on the intensity of the first band described above. For example, as shown in FIG. 7, when the intensity of the first band is low, the determination unit 42 determines that the measurement value is a measurement value of the intensity of reflected light R that has passed through the support 2 of the coated portion A. Furthermore, as shown in FIG. 8, when the intensity of the first band is high, the determination unit 42 determines that the measurement value is a measurement value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B.

[0058] Furthermore, to make a more accurate determination, the determination unit 42 may make a determination based on the ratio between the intensity of ultraviolet light contained in the reflected light R and the intensity of light in a wavelength band other than ultraviolet light. Specifically, the determination unit 42 may make a determination based on the ratio between the intensity of the first band and the intensity of the second band. For example, the determination unit 42 may define the intensity of the first band as I1 and the intensity of the second band as I2, and if I1 / I2 is less than a reference value, determine that the measured value is the measured value of the intensity of reflected light R that has passed through the support 2 of the coated portion A. If I1 / I2 is equal to or greater than the reference value, determine that the measured value is the measured value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B.

[0059] The estimation unit 43 estimates the intensity of light L irradiated from the light source 20 to the coated portion A (i.e., the irradiation intensity) based on the measured value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B. Specifically, the estimation unit 43 estimates the irradiation intensity from the measured value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B, using a line calibration created in advance.

[0060] FIG. 11 shows an example of a linear calibration used to estimate the irradiation intensity. The linear calibration shown in FIG. 11 represents the relationship between the intensity of a first band contained in reflected light R that has passed through the support 2 of the uncoated portion B and the irradiation intensity. The estimation unit 43 estimates the irradiation intensity by using the linear calibration to determine the irradiation intensity corresponding to the intensity of the first band. The linear calibration data is stored in advance in the memory unit 31.

[0061] For example, the linear calibration is created using a UV (ultraviolet) scale. The UV scale is a film for measuring the distribution of ultraviolet light intensity that is sensitive to ultraviolet light and changes color density depending on the amount of light. By attaching a small piece of the UV scale to a support 2 or a web that serves as a substitute for it and transporting it, light L is irradiated onto the UV scale from a light source 20, and the density of the irradiated UV scale is measured, thereby determining the irradiation intensity corresponding to the intensity of the first band.

[0062] Furthermore, when the window material 24A is contaminated, a difference occurs between the rate of change in the irradiation intensity before and after the contamination and the rate of change in the intensity of the first band before and after the contamination. This is because the irradiation intensity changes when light L passes through the contaminated window material 24A, whereas the intensity of the first band changes when light L passes through the contaminated window material 24A and when reflected light R passes through the window material 24A. The linear calibration may be corrected based on the difference between these rates of change.

[0063] For example, assuming that the irradiation intensity is I, the intensity of the first band is i, the rate of change in irradiation intensity before and after contamination is Vu, the rate of change in the intensity of the first band before and after contamination is Vs, and the initial value of the intensity of the first band is i1, the linear calibration expressed by the following equation (1) is corrected as shown in the following equation (2). I = (I0 / i0) × i (1) I=(I0 / i0)×(i1-(i1-i)×(Vu / Vs)) ···(2)

[0064] The line calibration may be created individually for each of the plurality of light sources 20 and stored in advance in the storage unit 31. The estimation unit 43 estimates the irradiation intensity for each of the plurality of light sources 20.

[0065] The graph generating unit 44 generates a graph showing the estimated value of the irradiation intensity estimated by the estimating unit 43 against the cumulative coating length of the coating material 6 applied to the support 2. The graph generating unit 44 calculates the cumulative coating length based on the cumulative coating time and the traveling speed of the support 2. Every time the estimating unit 43 estimates the irradiation intensity, the graph generating unit 44 updates the graph by plotting the estimated value against the cumulative coating length.

[0066] The graph generating unit 44 may generate a graph for each of the plurality of light sources 20 individually, or may generate one graph by integrating the plurality of graphs generated for each of the plurality of light sources 20.

[0067] Fig. 12 shows an example of a graph generated by the graph generating unit 44. As shown in Fig. 12, the estimated value of the irradiation intensity decreases as the cumulative application time increases. This is because the irradiation intensity decreases due to contamination of the window material 24A.

[0068] The graph generating unit 44 may generate a graph showing, instead of the irradiation intensity, the measured value of the intensity of the reflected light R that has passed through the support 2 in the uncoated portion B, relative to the cumulative coating length.

[0069] The main control unit 40 causes the graph created by the graph creation unit 44 to be displayed on the display unit 33. As the graph creation unit 44 updates the graph, the graph displayed on the display unit 33 is updated.

[0070] The main control unit 40 monitors the transition of the estimated value of the irradiation intensity and adjusts the intensity of the light L emitted from the light source 20 to keep the estimated value of the irradiation intensity within a certain range C, as shown in Fig. 13, for example. In the example shown in Fig. 13, when the estimated value reaches a certain lower limit, the output of the light source 20 is increased, thereby increasing the irradiation intensity.

[0071] It is also possible for the operator to adjust the output of the light source 20 via the input unit 32 while monitoring the graph displayed on the display unit 33. The main control unit 40 changes the output of the light source 20 in response to instructions given via the input unit 32.

[0072] 14 shows an example of the processing flow of the light intensity monitoring device 16. In step S10, the main control unit 40 controls the spectroscope 25 to output a measurement value. In step S11, the acquisition unit 41 acquires the measurement value output from the spectroscope 25. In step S12, the determination unit 42 determines whether the measurement value is a measurement value of the intensity of reflected light R that has passed through the support 2 in the uncoated portion B.

[0073] If it is determined in step S12 that the measurement value is a measurement value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B, the process proceeds to step S14. If it is determined in step S12 that the measurement value is not a measurement value of the intensity of reflected light R that has passed through the support 2 of the uncoated portion B, the process proceeds to step S13. In step S13, the cumulative coating length is calculated. After step S13, the process proceeds to step S17.

[0074] In step S14, the estimation unit 43 estimates the irradiation intensity based on the measured value of the intensity of reflected light R that has passed through the support 2 in the uncoated portion B. In step S15, a graph is created by plotting the estimated value of irradiation intensity against the cumulative coating length at that time. In step S16, the main control unit 40 causes the display unit 33 to display the graph created by the graph generation unit 44.

[0075] In step S17, the main control unit 40 determines whether or not a termination condition is satisfied, for example, when an operator inputs a termination instruction via the input unit 32.

[0076] If it is determined in step S17 that the termination condition is not satisfied, the process proceeds to step S10. Steps S10 to S17 are repeatedly executed until it is determined in step S17 that the termination condition is satisfied. If it is determined in step S17 that the termination condition is satisfied, the process ends.

[0077] As described above, according to the technology disclosed herein, the irradiation intensity is estimated based on the measured value of the intensity of reflected light R that passes through the support 2 in the uncoated portion B, so that the intensity of light irradiated to the coated portion A of the continuously running support 2 can be monitored accurately in real time.

[0078] Furthermore, the spectroscope 25 uses an optical fiber 26 as a light receiving section and receives the reflected light R through the window material 24A, so that contamination of the light receiving section due to volatilization of the components of the coating material 6 can be prevented.

[0079] In the above embodiment, the light irradiation device 14 is provided with a plurality of light sources 20 and a plurality of spectroscopes 25, but the light irradiation device 14 may be provided with only one light source 20 and one spectroscope 25.

[0080] Furthermore, in the above embodiment, the spectrometer 25 is used as the light intensity measuring device, but the light intensity measuring device is not limited to a spectrometer and may be an ultraviolet illuminance meter that measures the intensity of the first band.

[0081] The hardware structure of the processing units that perform various processes, such as the main control unit 40, acquisition unit 41, judgment unit 42, estimation unit 43, and graph generation unit 44, is, for example, various processors as shown below.

[0082] Various types of processors include CPUs, programmable logic devices (PLDs), dedicated electrical circuits, etc. As is well known, a CPU is a general-purpose processor that executes software (programs) and functions as various processing units. A PLD is a processor whose circuit configuration can be changed after manufacturing, such as an FPGA (Field Programmable Gate Array). A dedicated electrical circuit is a processor with a circuit configuration designed specifically to execute specific processes, such as an ASIC (Application Specific Integrated Circuit).

[0083] A single processing unit may be configured with one of these various processors, or may be configured with a combination of two or more processors of the same or different types (for example, multiple FPGAs, or a combination of a CPU and an FPGA). Also, multiple processing units may be configured with a single processor. As an example of configuring multiple processing units with one processor, first, there is a form in which one processor is configured by combining one or more CPUs and software, and this processor functions as multiple processing units. Second, there is a form in which a processor is used that realizes the functions of an entire system including multiple processing units with one IC chip, as typified by a system on chip (SoC). In this way, various processing units are configured using one or more of the above-mentioned various processors as a hardware structure.

[0084] Furthermore, the hardware structure of these various processors is, more specifically, an electric circuit made up of a combination of circuit elements such as semiconductor elements.

[0085] The present disclosure is not limited to the above-described embodiments, and various configurations may be adopted without departing from the spirit of the present disclosure. Furthermore, the present disclosure extends to not only programs but also computer-readable storage media that non-temporarily store programs.

[0086] The above explanation allows one to understand the following techniques. [Additional note 1] a light source that irradiates light from the surface side through a window material onto a support that has a surface on which coated portions coated with a coating material and uncoated portions not coated with the coating material are alternately formed in the running direction, and a back surface that comes into contact with a roller, the support being wound around the roller and running continuously; a light intensity meter that measures the intensity of the reflected light that is generated by light that has passed through the window material and the support and is reflected by the surface of the roller, and that has passed through the support and the window material; a processor that estimates the intensity of light irradiated from the light source to the coated portion based on a measurement value of the intensity of the reflected light that has passed through the support of the uncoated portion, among the measurement values ​​measured by the light intensity meter; and A light intensity monitoring device comprising: [Additional note 2] the light intensity measuring instrument is a spectrometer that measures the intensity of the reflected light for each wavelength; Item 1. A light intensity monitoring device according to item 1. [Additional note 3] The light emitted from the light source includes ultraviolet light, and the coated portion absorbs the ultraviolet light. Item 2. A light intensity monitoring device. [Additional note 4] The coating material is a liquid crystal material that hardens when irradiated with ultraviolet light. Item 3. A light intensity monitoring device according to claim 3. [Additional note 5] the processor determines whether or not the measurement value measured by the light intensity meter is a measurement value of the intensity of the reflected light that has passed through the support in the uncoated portion, based on a ratio between the intensity of ultraviolet light contained in the reflected light and the intensity of light in a wavelength band different from ultraviolet light. 5. The optical intensity monitoring device according to claim 3 or 4. [Additional note 6] The processor estimates the intensity of the light irradiated from the light source onto the coated portion from a measured value of the intensity of the reflected light that has passed through the support of the uncoated portion using a pre-created linear calibration. Item 5. A light intensity monitoring device according to any one of items 1 to 5. [Additional note 7] The processor generates a graph showing the measured value of the intensity of the reflected light that has passed through the support of the uncoated portion or the estimated value of the intensity of the light irradiated from the light source to the coated portion against the cumulative coating length of the coating material applied to the support, and displays the graph on a display. 7. A light intensity monitoring device according to any one of claims 1 to 6. [Additional note 8] the processor calculates the cumulative coating length based on a cumulative coating time and a running speed of the support. 8. The optical intensity monitoring device according to claim 7. [Additional note 9] The processor adjusts the intensity of the light emitted from the light source so that the estimated value of the intensity of the light irradiated from the light source to the application portion is within a certain range. Item 10. The optical intensity monitoring device according to any one of items 1 to 8. [Additional Note 10] the support is formed by joining a plurality of strip-shaped flexible supports in a running direction, the uncoated portion is formed in a region including a joint portion of the strip-shaped flexible support; 10. The optical intensity monitoring device according to claim 1, wherein the optical intensity monitoring device is a light intensity monitoring device. [Additional Note 11] a support having a surface on which coated portions coated with a coating material and uncoated portions not coated with the coating material are alternately formed in the running direction, and a back surface with which a roller comes into contact, the support being wound around the roller and running continuously, and irradiating the support with light from the surface side through a window material; measuring the intensity of the reflected light, which is generated by light from a light source passing through the window material and the support and is reflected by the surface of the roller, and which has passed through the support and the window material, with a light intensity meter; estimating the intensity of light irradiated from the light source to the coated portion based on a measurement value of the intensity of the reflected light that has passed through the support of the uncoated portion, among the measurement values ​​measured by the light intensity meter; A light intensity monitoring method comprising: [Explanation of symbols]

[0087] 2 Support 2A surface 2B back side 3A Old Roll 3B New Role 4 Tape 5 Joint part 6 Coating material 10 Manufacturing equipment 11 Unwinding device 11A First rotating shaft 11B Second rotation axis 12 Coating equipment 13 Heating device 14 Light irradiation device 15 Winding device 16 Light intensity monitoring device 17 Turret Arm 17A axis 18 Bonding equipment 20 light source 21 Ultraviolet lamp 22 Reflector 23 Backup roller 24 frames 24A Window Material 25 Spectrometer 26 Optical Fiber 27 Information processing equipment 30 processors 31 Storage section 32 Input section 33 Display section 34 Communication I / F 35 Bus 36 Programs 40 Main control unit 41 Acquisition Department 42 Judgment section 43 Estimation part 44 Graph Generation Unit A Application area B Uncoated area C range L light R Reflected light

Claims

1. a light source that irradiates light from the surface side through a window material onto a support that has a surface on which coated portions coated with a coating material and uncoated portions not coated with the coating material are alternately formed in the running direction, and a back surface that comes into contact with a roller, the support being wound around the roller and running continuously; a light intensity meter that measures the intensity of the reflected light that is generated by light that has passed through the window material and the support and is reflected by the surface of the roller, and that has passed through the support and the window material; a processor that estimates the intensity of light irradiated from the light source to the coated portion based on a measurement value of the intensity of the reflected light that has passed through the support of the uncoated portion, among the measurement values ​​measured by the light intensity meter; and A light intensity monitoring device comprising:

2. the light intensity measuring instrument is a spectrometer that measures the intensity of the reflected light for each wavelength; 2. The optical power monitor of claim 1.

3. The light emitted from the light source includes ultraviolet light, and the coated portion absorbs the ultraviolet light.

3. The optical power monitor of claim 2.

4. The coating material is a liquid crystal material that hardens when irradiated with ultraviolet light.

4. The optical power monitor of claim 3.

5. the processor determines whether or not the measurement value measured by the light intensity meter is a measurement value of the intensity of the reflected light that has passed through the support in the uncoated portion, based on a ratio between the intensity of ultraviolet light contained in the reflected light and the intensity of light in a wavelength band different from ultraviolet light.

4. The optical power monitor of claim 3.

6. The processor estimates the intensity of the light irradiated from the light source onto the coated portion from a measured value of the intensity of the reflected light that has passed through the support of the uncoated portion using a pre-created linear calibration.

2. The optical power monitor of claim 1.

7. The processor generates a graph showing the measured value of the intensity of the reflected light that has passed through the support of the uncoated portion or the estimated value of the intensity of the light irradiated from the light source to the coated portion against the cumulative coating length of the coating material applied to the support, and displays the graph on a display.

2. The optical power monitor of claim 1.

8. the processor calculates the cumulative coating length based on a cumulative coating time and a running speed of the support.

8. The optical power monitor of claim 7.

9. The processor adjusts the intensity of the light emitted from the light source so that the estimated value of the intensity of the light irradiated from the light source to the application portion is within a certain range.

2. The optical power monitor of claim 1.

10. the support is formed by joining a plurality of strip-shaped flexible supports in a running direction, the uncoated portion is formed in a region including a joint portion of the strip-shaped flexible support; 2. The optical power monitor of claim 1.

11. a support having a surface on which coated portions coated with a coating material and uncoated portions not coated with the coating material are alternately formed in the running direction, and a back surface with which a roller comes into contact, the support being wound around the roller and running continuously, and irradiating the support with light from the surface side through a window material; measuring the intensity of the reflected light, which is generated by light from a light source passing through the window material and the support and is reflected by the surface of the roller, and which has passed through the support and the window material, with a light intensity meter; estimating the intensity of light irradiated from the light source to the coated portion based on a measurement value of the intensity of the reflected light that has passed through the support of the uncoated portion, among the measurement values ​​measured by the light intensity meter; A light intensity monitoring method comprising:

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