Sample transport device for space probe and space probe equipped with same

Abstract

To provide a space probe which achieves weight saving and low cost in addition to improving reliability of a sample transport device.SOLUTION: A sample transport device of a space probe comprises: a link mechanism; a carrier which is connected with the link mechanism; and an actuator which drives the link mechanism. When A is a distance from a first support shaft to a first connection shaft, B is a distance from the first support shaft to a second support shaft, C is a distance from the second support shaft to a second connection shaft, and D is a distance from the first connection shaft to the second connection shaft, the following expression (1) is satisfied. The link mechanism is arranged, when the carrier is at an intermediate position of a movement path between a lower position and an upper position, so that the first support shaft, the second support shaft, and the second connection shaft are arrayed on the same line when viewed from an axial direction of the first support shaft. A+B<C+D ... (1)SELECTED DRAWING: Figure 3

Description

[Technical Field]

[0001] The present disclosure relates to a sample transport device for a space probe and a space probe equipped with the same. [Background technology]

[0002] Patent Document 1 discloses a space probe used for exploration activities on the moon or other planets. The space probe is equipped with a hole-digging device for collecting samples of underground rocks, sand, etc. The hole-digging device has a link mechanism including multiple arms connected to each other, and a shovel attached to the bottom of the link mechanism. The link mechanism is driven by an arm actuator, a tilt actuator, and a shovel actuator to move the shovel up and down. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-106198 Summary of the Invention [Problem to be solved by the invention]

[0004] The space probe is equipped with multiple actuators for each shovel used to transport samples. The more actuators there are, the greater the chance of malfunctions, and the greater the weight and cost.

[0005] Therefore, an object of the present disclosure is to improve the reliability of a sample transport device in a space probe, while also reducing its weight and cost. [Means for solving the problem]

[0006] A sample transport device for a space probe according to one aspect of the present disclosure is a sample transport device for loading a sample into an inlet of a sample receiver of the space probe, comprising: a link mechanism; a carrier connected to the link mechanism and configured to transport the sample; and an actuator configured to drive the link mechanism. The link mechanism includes a first support shaft, a second support shaft, a first arm having a base end connected to the first support shaft, a second arm having a base end connected to the second support shaft, and a connecting arm configured to support the carrier, the connecting arm having a first end connected to a tip end of the first arm via a first connecting shaft and a second end connected to a tip end of the second arm via a second connecting shaft. The first support shaft or the second support shaft is driven by the actuator. The link mechanism is configured such that, upon driving the actuator, the carrier moves along a movement path between a lower position where the carrier receives a sample and an upper position where the carrier loads the sample into the inlet, which is above the lower position. When the distance from the first support shaft to the first connecting shaft is A, the distance from the first support shaft to the second support shaft is B, the distance from the second support shaft to the second connecting shaft is C, and the distance from the first connecting shaft to the second connecting shaft is D, the following mathematical formula (1) is satisfied. The link mechanism is arranged such that the first support shaft, the second support shaft, and the second connecting shaft are aligned on the same straight line when viewed from the axial direction of the first support shaft when the carrier is in an intermediate position between the lower position and the upper position on the movement path. A+B <C+D ·····(1)

[0007] A sample transport device for a space probe according to one aspect of the present disclosure is a sample transport device for loading a sample into an insertion port of a sample receiver of the space probe, the sample transport device comprising: a carrier for transporting the sample; and a link mechanism having an arm with one end as a swing center and the other end rotatably supporting the carrier. The link mechanism changes its posture as the carrier rotates in accordance with the swing of the arm, and moves the carrier along a movement path between a lower position for receiving a sample and an upper position for loading the sample into the insertion port above the lower position. When a predetermined position between the lower position and the upper position on the movement path is defined as an intermediate position, when the arm angularly displaces in a lower region from the lower position to the intermediate position, the amount of angular displacement of the carrier is smaller than the amount of angular displacement of the arm. When the arm angularly displaces in an upper region of the movement path from the intermediate position to the upper position, the amount of angular displacement of the carrier is larger than the amount of angular displacement of the arm. [Effects of the Invention]

[0008] According to one aspect of the present disclosure, the angular displacement of the carrier is small in the lower region of the carrier's movement path, preventing samples from spilling out of the carrier. Furthermore, the angular displacement of the carrier is large in the upper region of the carrier's movement path, allowing samples to be introduced from the carrier into the sample receiver's inlet near the inlet. Therefore, by simply rotating either the first or second support shaft with an actuator, the carrier can perform the desired sample transport operation, reducing the number of actuators. As a result, the sample transport device can be made lighter and less expensive while improving its reliability. [Brief explanation of the drawings]

[0009] [Figure 1] FIG. 1 is a perspective view of a space probe according to an embodiment. [Figure 2] FIG. 2 is a longitudinal sectional view of the sample excavation device of FIG. [Figure 3] FIG. 3 is an enlarged view of the sample transport device of FIG. [Figure 4] FIG. 4 is a side view of the sample transport device of FIG. [Figure 5] FIG. 5 is a diagram illustrating the operation of the sample transport device of FIG. [Figure 6] FIG. 6 is a diagram illustrating the operation of the sample transport device of FIG. [Figure 7] FIG. 7 is a diagram illustrating the operation of the sample transport device of FIG. [Figure 8] FIG. 8 is a diagram illustrating the operation of the sample transport device of FIG. [Figure 9] FIG. 9 is a diagram illustrating the operation of the sample transport device of FIG. DETAILED DESCRIPTION OF THE INVENTION

[0010] Hereinafter, an embodiment will be described with reference to the drawings.

[0011] FIG. 1 is a perspective view of a space probe 1 according to an embodiment. As shown in FIG. 1, the space probe 1 is a mobile vehicle used to explore celestial bodies and travels on the surface of the celestial body. The space probe 1 may be, for example, an unmanned vehicle that collects and analyzes samples of material from the underground of the celestial body. The space probe 1 includes a body 2, wheels 3, a sample excavation device 4, a sample analyzer 5, a sample receiver 6, a motor 7, a controller 8, a sample transport device 10, and the like. Here, the direction in which the sample excavation device 4 extends is defined as a vertical direction V, which coincides with the vertical up-down direction of the space probe 1. The vertical down direction is the direction in which the surface of the celestial body lies relative to the body 2. The direction perpendicular to the vertical direction V is defined as a horizontal direction H of the space probe 1.

[0012] The body 2 is supported by wheels 3. The body 2 supports a sample excavation device 4, a sample analyzer 5, a sample receiver 6, a prime mover 7, a controller 8, and a sample transport device 10. The space probe 1 moves on the surface of a celestial body using wheels 3 driven by the prime mover 7. Note that walking legs or tracks may be used instead of the wheels 3. The sample analyzer 5 is a device that analyzes the components of the sample. The sample receiver 6 is provided on the body 2 and has an inlet 6a through which the sample is inserted. The sample receiver 6 guides the received sample to the sample analyzer 5. The prime mover 7 may be, for example, an electric motor. The controller 8 includes a processing circuit and controls the sample excavation device 4, the prime mover 7, the sample transport device 10, etc. The processing circuit may be, for example, at least one processor that executes a program.

[0013] The functions of the elements disclosed herein can be performed using circuits or processing circuits, including general-purpose processors, special-purpose processors, integrated circuits, ASICs (Application Specific Integrated Circuits), conventional circuits, and / or combinations thereof, configured or programmed to perform the disclosed functions. A processor is considered a processing circuit or circuit because it includes transistors and other circuitry. In this disclosure, a circuit, unit, or means is hardware that performs the recited functions or hardware that is programmed to perform the recited functions. The hardware may be hardware disclosed herein or other known hardware that is programmed or configured to perform the recited functions. Where the hardware is a processor, which is considered a type of circuit, the circuit, means, or unit is a combination of hardware and software, and the software is used to configure the hardware and / or processor.

[0014] Figure 2 is a vertical cross-sectional view of the sample excavation device 4 of Figure 1. As shown in Figures 1 and 2, the sample excavation device 4 excavates material from underground of a celestial body as samples. The sample excavation device 4 comprises a tube 11, a drill 12, an elevator motor 13, a base 14, and a drill motor 15. The elevator motor 13 and the drill motor 15 are controlled by a controller 8 (see Figure 1). The tube 11 extends in a vertical direction V. The internal space of the tube 11 houses a drill 12 extending in the vertical direction V. The elevator motor 13 raises and lowers the tube 11 and the drill 12 in the vertical direction V. The base 14 is supported by the body 2 while supporting the tube 11, the drill 12, and the elevator motor 13.

[0015] The drill 12 is driven by the drill motor 15 to rotate around its axis, and is driven by the lift motor 13 to insert it into the ground. The sample excavated by the drill 12 is then introduced into the pipe 11 through the lower opening 11a of the pipe 11. After the sample is excavated, the pipe 11 holding the sample is raised together with the drill 12 by the lift motor 13. When the drill motor 15 is rotated in the reverse direction, the sample inside the pipe 11 falls downward through the lower opening 11a. In other words, the lower opening 11a of the pipe 11 is the sample discharge port of the sample excavation device 4 (hereinafter, the symbol 11a will also be referred to as the sample discharge port). The configuration of the sample excavation device 4 is not particularly limited, as long as it can capture a sample from the underground of the exploration target and pull it up to the surface of the exploration target. For example, the sample excavation device 4 may be configured to include a scoop and an actuator that drives the scoop.

[0016] As shown in FIG. 1 , the sample transport device 10 receives a sample excavated from the ground by the sample excavation device 4 and lifted above the ground surface, and transports the sample toward the inlet 6a of the sample receiver 6. The sample transport device 10 is disposed to the side of the body 2 in the horizontal direction H. The sample transport device 10 includes a link mechanism 21, an actuator 22, a carrier 23, and a support 24. The link mechanism 21 is supported by the body 2 via the support 24. As described below, the link mechanism 21 is a device that changes the position and posture of the carrier 23 through its operation. The portion of the link mechanism 21 whose relative position with the body 2 does not change during this operation is referred to as the base end of the link mechanism 21, and the portion of the link mechanism 21 connected to the carrier 23 is referred to as the tip end of the link mechanism 21. A first arm 33 and a second arm 34, which will be described below, each have one end and the other end, with the one end being referred to as the base end connected to the base end of the link mechanism 21, and the other end being referred to as the tip end.

[0017] The actuator 22 is connected to the base end of the link mechanism 21 and drives the link mechanism 21. The actuator 22 is controlled by the controller 8. The carrier 23 is connected to the tip end of the link mechanism 21 and, by operation of the link mechanism 21, transports the sample received from the sample excavation device 4 and deposits it into the deposit port 6a of the sample receiver 6. Note that the carrier 23 may be connected to a part other than the tip end of the link mechanism 21 depending on the purpose, etc.

[0018] FIG. 3 is an enlarged view of the sample transport device 10 of FIG. 1. As shown in FIG. 3, the link mechanism 21 of the sample transport device 10 includes a base plate 30, a first support shaft 31, a second support shaft 32, a first arm 33, a second arm 34, a connecting arm 35, and a stopper 39. The base plate 30 is supported on the body 2 via a support 24 (see FIG. 1). The base plate 30 is plate-shaped with one end and the other end, and constitutes the base end of the link mechanism 21. The first support shaft 31 is rotatably connected to one end of the base plate 30. The first support shaft 31 is connected to the actuator 22 so as to rotate co-rotatably with the drive shaft of the actuator 22. Note that the first support shaft 31 may be the drive shaft of the actuator 22. The second support shaft 32 is attached to the other end of the base plate 30. The base plate 30 extends in a horizontal direction H.

[0019] The first arm 33 is fixed at its base end 33a to the first support shaft 31. When the first support shaft 31 rotates around its own axis, the first arm 33 swings around the base end 33a as the swing center. The second arm 34 is connected at its base end 34a to the second support shaft 32. When the second support shaft 32 is fixed to the base plate 30, the second arm 34 is rotatably connected to the second support shaft 32. When the second support shaft 32 is rotatably connected to the base plate 30, the second arm 34 may be fixed to the second support shaft 32 or rotatably connected to the second support shaft 32.

[0020] The second arm 34 has a shape in which an intermediate portion 34c between its base end 24a and tip end 34b is bent so as to move away from the sample excavation device 4 (see FIG. 1). That is, the second arm 34 has a shape in which the intermediate portion 34c is bent so as to move closer to the first arm 33. In this embodiment, the second arm 34 has a bent shape at the intermediate portion 34c, but it may also have a curved shape overall.

[0021] The actuator 22 may be arranged to drive the second support shaft 32 instead of the first support shaft 31. In that case, the second support shaft 32 driven by the actuator 22 may co-rotate with the second arm 34, and the first support shaft 31 may be rotatably connected to the first arm 33. The actuator 22 in this embodiment is a servo motor, but may also be, for example, a stepping motor, and the type of actuator 22 is not limited to these.

[0022] The connecting arm 35 has a first end 35a and a second end 35b opposite the first end 35a. The first end 35a of the connecting arm 35 is rotatably connected to a tip end 33b of the first arm 33 via a first connecting shaft 36. The second end 35b of the connecting arm 35 is rotatably connected to a tip end 34b of the second arm 34 via a second connecting shaft 37.

[0023] That is, the connecting arm 35 connects the tip 33b of the first arm 33 and the tip 34b of the second arm 34 to each other. The axes of the first support shaft 31, the second support shaft 32, the first connecting shaft 36, and the second connecting shaft 37 extend in the same direction. The connecting arm 35 supports the carrier 23. That is, the tip ends 33b, 34b of the first arm 33 and the second arm 34 rotatably support the carrier 23 via the connecting arm 35. In this embodiment, the connecting arm 35 supports the carrier 23 via a bracket 38. Note that the bracket 38 may be omitted, and the connecting arm 35 may directly support the carrier 23.

[0024] Here, the distance from the first support shaft 31 to the first connecting shaft 36 is defined as A, the distance from the first support shaft 31 to the second support shaft 32 is defined as B, the distance from the second support shaft 32 to the second connecting shaft 37 is defined as C, and the distance from the first connecting shaft 36 to the second connecting shaft 37 is defined as D. The inter-shaft distance here refers to the distance between the shaft centers. The link mechanism 21 is configured to satisfy the following mathematical formula (1).

[0025] [Formula 1] A+B <C+D ·····(1)

[0026] Fig. 4 is a side view of the sample transport device 10 of Fig. 1. As shown in Fig. 4, the second arm 34 is disposed offset from the first arm 33 in the axial direction X of the first support shaft 31. That is, the second arm 34 is disposed so as not to overlap the first arm 33 when viewed from a direction perpendicular to the axial direction X. The distance in the axial direction X from the base plate 30 to the second arm 34 is longer than the distance in the axial direction X from the base plate 30 to the first arm 33.

[0027] A stopper 39 is fixed to the first arm 33, protruding from the first arm 33 in the axial direction X. The stopper 39 overlaps with the second arm 34 when viewed from a direction perpendicular to the axial direction X and perpendicular to the extending direction of the first arm 33. In other words, the stopper 39 is disposed on the movement path of the second arm 34 when the link mechanism 21 is in operation.

[0028] The sample discharge port 11a of the sample excavation device 4 and the input port 6a of the sample receiver 6 are arranged so as to be offset from each other in the horizontal direction H. In other words, the sample receiving position of the carrier 23 and the input port 6a of the sample receiver 6 are arranged so as to be offset from each other in the horizontal direction H. The sample discharge port 11a of the sample excavation device 4 is farther from the body 2 in the horizontal direction H than the input port 6a of the sample receiver 6. Note that the sample discharge port 11a of the sample excavation device 4 opens downward, and the input port 6a of the sample receiver 6 opens upward.

[0029] The link mechanism 21 is disposed in a position where the axial direction X of the first support shaft 31 is inclined with respect to the horizontal direction H. Specifically, the axial direction X is inclined with respect to the horizontal direction H so that when the carrier 23 is in a position below the sample discharge port 11a of the sample excavation device 4, i.e., in the lower position P1, it is farther away from the body 2 in the horizontal direction H than when the carrier 23 is in a position above the input port 6a of the sample receiver 6, i.e., in the upper position P2. As shown in FIG. 5 , the lower position P1 is a position where the carrier 23 is vertically below the sample discharge port 11a of the sample excavation device 4, and the upper position P2 is a position where the carrier 23 is vertically above the input port 6a of the sample receiver 6.

[0030] The carrier 23 has a bottom wall 23a, a peripheral wall 23b, an opening 23c, and a storage space S. The bottom wall 23a is fixed to a bracket 38 provided on the connecting arm 35. The peripheral wall 23b protrudes from the peripheral edge of the bottom wall 23a. The bottom wall 23a and the peripheral wall 23b define the storage space S. The tip of the peripheral wall 23b defines an opening 23c that communicates with the storage space S. The peripheral wall 23b has a tapered shape toward the opening 23c. The shape of the carrier 23 is not particularly limited, and may be any shape that can receive samples discharged downward from the sample discharge port 11a at the lower position P1 and can insert samples into the inlet 6a of the sample receiver 6 by rotating the carrier 23 at the upper position P2. The shape of the carrier 23 may be, for example, a tray-like shape.

[0031] 5 to 9 are diagrams illustrating the operation of the sample transport device 10 of FIG. 2. FIG. 5 shows a state in which the carrier 23 is in a lower position to receive the sample 100 from the sample discharge port 11a of the sample excavation device 4. As shown in FIG. 5, the sample receiver 6 is offset in the horizontal direction H from the sample discharge port 11a of the sample excavation device 4 when viewed from the axial direction X shown in FIG. 4. The carrier 23 of the sample transport device 10 moves along a predetermined movement path P by the operation of the link mechanism 21 by the actuator 22. The first arm 33 swings around the first support shaft 31. The second arm 34 swings around the second support shaft 32.

[0032] Here, the position of the carrier 23 below the sample discharge port 11a of the sample excavation device 4 is referred to as the lower position P1, the position of the carrier 23 above the sample input port 6a of the sample receiver 6 is referred to as the upper position P2, and the predetermined position of the carrier 23 between the lower position P1 and the upper position P2 on the movement path P is referred to as the intermediate position P3.

[0033] The first support shaft 31 is disposed between a lower position P1 and an upper position P2 in both the vertical direction V and the horizontal direction H. The first support shaft 31 is disposed between the sample discharge port 11a of the sample excavation device 4 and the sample inlet 6a of the sample receiver 6 in both the vertical direction V and the horizontal direction H. The first support shaft 31 is disposed so as to be closer to the sample inlet 6a of the sample receiver 6 than the second support shaft 32 in the horizontal direction H. When the carrier 23 is in the lower position P1, the first arm 33 and the second arm 34 extend downward from the first support shaft 31 and the second support shaft 32, respectively, below an imaginary line L connecting the axial centers of the first support shaft 31 and the second support shaft 32, as viewed in the axial direction X shown in FIG. 4.

[0034] When the carrier 23 is in the lower position P1, the stopper 39 interferes with the second arm 34, thereby preventing the carrier 23 from moving from the lower position P1 toward the opposite side from the intermediate position P3. When the carrier 23 is in the upper position P2, the stopper 39 interferes with the second arm 34, thereby preventing the carrier 23 from moving from the upper position P2 toward the opposite side from the intermediate position P3. In other words, the stopper 39 is used to align the carrier 23 at the lower position P1 and the upper position P2, and can physically position the carrier 23 in addition to positioning under the control of the actuator 22. Note that the stopper that prevents the carrier 23 from moving beyond the lower position P1 and the stopper that prevents the carrier 23 from moving beyond the upper position P2 may be separate from each other.

[0035] When the carrier 23 is in the lower position P1, the opening 23c is connected to the connecting arm 35 so that the opening 23c faces upward. When the carrier 23 is in the lower position P1, the carrier 23 receives the sample 100 that drops from the sample discharge port 11a through the opening 23c.

[0036] 6, when the first support shaft 31 is rotated by the actuator 22, the first arm 33 swings around the base end 33a, and the carrier 23 moves along the movement path P. Between the lower position P1 and the intermediate position P3 on the movement path P, the carrier 23 maintains a position in which the opening 23c faces upward.

[0037] As shown in FIG. 7 , when the first support shaft 31 is further rotated by the actuator 22, the carrier 23 reaches a predetermined intermediate position P3. In this state, the first support shaft 31, the second support shaft 32, and the second connecting shaft 37 are aligned on the same straight line, i.e., on the imaginary line L, as viewed from the axial direction X of the first support shaft 31. That is, the second arm 34 crosses the first support shaft 31 as the carrier 23 moves from the lower position P1 to the upper position P2, as viewed from the axial direction X. When the carrier 23 is in the intermediate position P3, at least a portion of the second arm 34 overlaps with the base plate 30 and the first arm 33, as viewed from the axial direction X. At the intermediate position P3, the carrier 23 maintains an orientation in which the opening 23c faces upward.

[0038] In this way, as the first arm 33 is angularly displaced about the first support shaft 31, the carrier 23 moves in a lower region (P1-P3) from the lower position P1 to the intermediate position P3 on the movement path P. At this time, even if the carrier 23 is angularly displaced about the first connecting shaft 36 due to the angular displacement of the first arm 33, the amount of angular displacement of the carrier 23 in the relative coordinate system with the first connecting shaft 36 as the axis is smaller than the amount of angular displacement of the first arm 33 in the absolute coordinate system with the first support shaft 31 as the axis.

[0039] As shown in FIG. 8 , when the actuator 22 further rotates the first support shaft 31, the second arm 34 moves above the first support shaft 31 and intersects with the first arm 33 when viewed from the axial direction X of the first support shaft 31. The first arm 33 and the second arm 34 extend upward from the first support shaft 31 and the second support shaft 32, respectively, above the imaginary line L. In this state, the carrier 23 is oriented with the opening 23c facing slightly diagonally upward. The link mechanism 21 is configured so that the carrier 23 begins to tilt when the carrier 23 moves above the intermediate position P3 on the movement path P. That is, the orientation of the carrier 23 changes due to angular displacement of the carrier 23 about the first connecting shaft 36 between the intermediate position P3 and the upper position P2 on the movement path P, so that the opening 23c faces the lower insertion opening 6a.

[0040] As shown in FIG. 9, when the first support shaft 31 is further rotated by the actuator 22, the opening 23c of the carrier 23 is positioned above the inlet 6a of the sample receiver 6. At this time, the carrier 23 is oriented such that the opening 23c faces diagonally downward. Therefore, the sample 100 accommodated in the carrier 23 is inserted into the inlet 6a through the opening 23c and received by the sample receiver 6. The sample 100 received by the sample receiver 6 is guided to the sample analyzer 5 (see FIG. 1). When the carrier 23 is in the upper position P2, the stopper 39 interferes with the second arm 34, thereby preventing the carrier 23 from moving beyond the upper position P2, i.e., from moving in the direction opposite to the intermediate position P3.

[0041] 1 does not need to perform highly accurate positioning control at the lower position P1 and the upper position P2. Specifically, the controller 8 does not need to instruct the actuator 22 on the amount of movement, i.e., the amount of angular displacement, but may simply control the start of movement at a constant speed and the stop of movement based on the detection of the movement resistance caused by the stopper 39.

[0042] In this way, when the carrier 23 moves in the upper region (P3-P2) from the intermediate position P3 to the upper position P2 on the movement path P, the carrier 23 is angularly displaced about the first connecting shaft 36 due to the angular displacement of the first arm 33. At that time, the amount of angular displacement of the carrier 23 in the absolute coordinate system with the first support shaft 31 as the axis is larger than the amount of angular displacement of the first arm 33 in the relative coordinate system with the first connecting shaft 36 as the axis.

[0043] According to the configuration described above, the amount of angular displacement of the carrier 23 is small in the lower region (P1-P3) of the movement path P of the carrier 23, so it is possible to prevent the sample 100 from dropping off from the carrier 23. Furthermore, the amount of angular displacement of the carrier 23 is large in the upper region (P3-P2) of the movement path P of the carrier 23, so the sample 100 can be inserted from the carrier 23 into the insertion port 6a of the sample receiver 6 near the insertion port 6a.

[0044] Therefore, by rotating the first support shaft 31, the carrier 23 can perform the desired sample transport operation, thereby reducing the number of actuators 22. As a result, the reliability of the sample transport device 10 can be improved while reducing its weight and cost.

[0045] Since the first support shaft 31 is disposed between the lower position P1 and the upper position P2 of the movement path P in both the vertical direction V and the horizontal direction H, the link mechanism 21 can be made compact.

[0046] The stopper 39 prevents the carrier 23 from going beyond the lower position P1 toward the opposite side to the intermediate position P3 side and also prevents the carrier 23 from going beyond the upper position P2 toward the opposite side to the intermediate position P3 side, so that the carrier 23 can be accurately positioned at the lower position P1 and the upper position P2 even with simple control.

[0047] The carrier 23 is connected to the connecting arm 35 in such a position that the opening 23c faces upward when in the lower position P1 and faces downward when in the upper position P2, so that the carrier 23 can stably receive and insert the sample 100.

[0048] The peripheral wall 23b of the carrier 23 has a shape that tapers toward the opening 23c, so that the samples 100 can be prevented from spilling out of the carrier 23 even if the opening 23c of the carrier 23 does not face completely vertically upward.

[0049] As described above, the above-described embodiments have been described as examples of the technology disclosed in this application. However, the technology of the present disclosure is not limited to these embodiments and can be applied to embodiments in which modifications, substitutions, additions, omissions, etc. are made as appropriate. Furthermore, the components described in the above-described embodiments can be combined to create new embodiments. For example, some configurations in the embodiments can be separated and arbitrarily extracted from other configurations in the embodiment. Furthermore, the components described in the accompanying drawings and detailed description include not only components essential for solving the problem, but also components that are not essential for solving the problem, and are used to illustrate the technology. [Explanation of symbols]

[0050] 1. Space probe 4. Sample extraction equipment 6 Sample Receiver 6a Inlet 10 Sample transport device 11a Lower opening (sample outlet) 21 Link mechanism 22 Actuator 23 Career 23a Bottom wall 23b Surrounding wall 23c aperture 24 Support 30 base plate 31 1st spindle 32 2nd support shaft 33 First Arm 33a Proximal end 33b Tip 34 Second Arm 34a Proximal end 34b Tip 35 Connecting Arm 35a 1st end 35b 2nd end 36 1st connection shaft 37 2nd connection shaft 39 Stopper 100 samples L Virtual Line P Movement route P1 lower position P2 upper position P3 intermediate position S Storage space X-axis direction

Claims

1. A sample transport device for introducing a sample into an insertion port of a sample receiver of a space probe, comprising: A link mechanism; a carrier connected to the link mechanism and carrying the sample; an actuator that drives the link mechanism, The link mechanism includes: A first support shaft; A second support shaft; a first arm having a base end connected to the first support shaft; a second arm having a base end connected to the second support shaft; a connecting arm that supports the carrier and has a first end connected to a tip end of the first arm via a first connecting shaft and a second end connected to a tip end of the second arm via a second connecting shaft, the first support shaft or the second support shaft is driven by the actuator, the link mechanism is arranged in a state in which, by driving the actuator, the carrier moves along a movement path between a lower position where the carrier receives a sample and an upper position where the carrier deposits the sample into the deposit port that is above the lower position; When the distance from the first support shaft to the first connecting shaft is A, the distance from the first support shaft to the second support shaft is B, the distance from the second support shaft to the second connecting shaft is C, and the distance from the first connecting shaft to the second connecting shaft is D, the following formula (1) is satisfied: A+B<C+D...(1) A sample transport device for a space probe, wherein the link mechanism is arranged so that when the carrier is in an intermediate position between the lower position and the upper position on the movement path, the first support shaft, the second support shaft, and the second connecting shaft are aligned on the same straight line when viewed from the axial direction of the first support shaft.

2. 2. The space probe sample transfer device of claim 1, wherein the first support shaft is disposed between the lower position and the upper position in both the vertical and horizontal directions.

3. 3. The sample transport device for a space probe according to claim 1, wherein the link mechanism further includes at least one stopper that prevents the carrier from moving from the lower position toward the opposite side of the intermediate position and that prevents the carrier from moving from the upper position toward the opposite side of the intermediate position.

4. the carrier has an accommodation space and an opening communicating with the accommodation space; 4. A sample transport device for a space probe according to claim 1, wherein the carrier is connected to the connecting arm in such a manner that the opening faces upward when in the lower position and the opening faces downward when in the upper position.

5. the carrier has a peripheral wall that defines the receiving space and the opening; 5. The sample transfer device for a space probe according to claim 4, wherein the peripheral wall has a shape that tapers toward the opening.

6. The sample transport device according to any one of claims 1 to 5; the sample receiver having the inlet into which the sample is introduced; a sample excavation device that excavates the sample from the ground and drops the sample onto the carrier at the lower position.

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