Autofocusing system for tracking a sample surface with configurable focus offsets

Abstract

To accurately identify the type and size of defects in the context of semiconductor fabrication.SOLUTION: An auto-focusing system comprises an illumination source, an aperture, a projection mask, a detector assembly, and a relay system. The relay system is configured to optically couple illumination transmitted through the projection mask to an imaging system. The relay system is also configured to project one or more patterns from the projection mask onto a specimen and transmit an image of the projection mask from the specimen to the detector assembly. The system comprises a controller including one or more processors configured to execute a set of program instructions to execute steps of receiving one or more images of the projection mask from the detector assembly and determining the quality of the one or more images of the projection mask.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates generally to the field of optical imaging systems, and more particularly to an autofocus system for tracking a sample surface with a configurable focus offset. [Background technology]

[0002] CROSS-REFERENCE TO RELATED APPLICATIONS This application claims priority to U.S. Provisional Patent Application No. 62 / 829,831, entitled "AUTOMATED FOCUSING SYSTEM TRACKING SPECIMEN SURFACE WITH Configurable Focus Offset," filed April 5, 2019, to inventors Xiumei Liu, Kai Cao, Richard Wallingford, Matthew Giusti, and Brooke Bruguier, which is incorporated herein by reference in its entirety.

[0003] The demand for electronic logic and memory devices with ever smaller footprints and features presents a wide range of manufacturing challenges beyond desirable scale manufacturing. In the context of semiconductor manufacturing, accurately identifying defect types and sizes is a critical step in improving throughput and yield. Furthermore, to achieve the best imaging quality and defect detection sensitivity, the focal plane of the imaging system must be preserved. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] U.S. Patent No. 5,604,344 [Patent Document 2] U.S. Patent Application Publication No. 2013 / 0093874 Summary of the Invention [Problem to be solved by the invention]

[0005] It would therefore be desirable to provide a system that ameliorates one or more of the shortcomings of the conventional approaches discussed above. [Means for solving the problem]

[0006] An autofocusing system is disclosed. In one embodiment, the system includes an illumination source. In another embodiment, the system includes an aperture. In another embodiment, the system includes a projection mask. In another embodiment, the system includes a detector assembly. In another embodiment, the system includes a relay system configured to optically couple illumination transmitted through the projection mask to an imaging system, the relay system configured to project one or more patterns from the projection mask onto a sample disposed on a stage assembly of the imaging system, and transmit images of the projection mask from the sample to the detector assembly. In another embodiment, the system includes a controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to receive one or more images of the projection mask from the detector assembly and determine quality of the one or more images of the projection mask.

[0007] A system is disclosed. In one embodiment, the system includes an imaging system. In another embodiment, the system includes an autofocus system. In another embodiment, the autofocus system includes an illumination source. In another embodiment, the autofocus system includes an aperture. In another embodiment, the autofocus system includes a projection mask. In another embodiment, the autofocus system includes a detector assembly. In another embodiment, the autofocus system includes a relay system configured to optically couple illumination transmitted through the projection mask to the imaging system, the relay system configured to project one or more patterns from the projection mask onto a sample disposed on a stage assembly of the imaging system, and transmit images of the projection mask from the sample to the detector assembly. In another embodiment, the system includes a controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to receive images of the one or more projection masks from the detector assembly and determine quality of the one or more images of the projection mask.

[0008] An autofocusing system is disclosed. In one embodiment, the autofocusing system includes a projection mask image quality (PMIQ) autofocusing system. In another embodiment, the PMIQ autofocusing system includes an illumination source. In another embodiment, the PMIQ autofocusing system includes a first aperture. In another embodiment, the PMIQ autofocusing system includes a first projection mask. In another embodiment, the PMIQ autofocusing system includes a first PMIQ detector assembly and a second PMIQ detector assembly. In another embodiment, the system includes a normalized s-curve (NSC) autofocusing system. In another embodiment, the NSC autofocusing system includes an illumination source. In another embodiment, the NSC autofocusing system includes a second aperture. In another embodiment, the NSC autofocusing system includes a second projection mask. In another embodiment, the NSC autofocusing system includes a first NSC detector assembly and a second NSC detector assembly. In another embodiment, the system includes a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to the imaging system, the relay system configured to project one or more patterns from a first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to the first PMIQ detector assembly and the second PMIQ detector assembly, and the relay system configured to project one or more patterns from a second projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the first NSC detector assembly and the second NSC detector assembly.In another embodiment, a system includes a controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to receive one or more signals from a first PMIQ detector assembly, a second PMIQ detector assembly, a first NSC detector assembly, and a second NSC detector assembly, and to execute a dual control loop based on one or more signals from the first PMIQ detector assembly, the second PMIQ detector assembly, the first NSC detector assembly, and the second NSC detector assembly to adjust a stage assembly to maintain focus of the imaging system.

[0009] An autofocusing system is disclosed. In one embodiment, the autofocusing system includes a PMIQ autofocusing system. In another embodiment, the PMIQ autofocusing system includes an illumination source. In another embodiment, the PMIQ autofocusing system includes a first aperture. In another embodiment, the PMIQ autofocusing system includes a first projection mask. In another embodiment, the PMIQ autofocusing system includes a first PMIQ detector assembly. In another embodiment, the system includes an NSC autofocusing system. In another embodiment, the NSC autofocusing system includes an illumination source. In another embodiment, the NSC autofocusing system includes a second aperture. In another embodiment, the NSC autofocusing system includes a second projection mask. In another embodiment, the NSC autofocusing system includes a first NSC detector assembly. In another embodiment, the system includes a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to the imaging system, the relay system configured to project one or more patterns from a first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to a first PMIQ detector assembly, and the relay system configured to project one or more patterns from a second projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the first NSC detector assembly.In another embodiment, a system includes a controller including one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to perform the steps of receiving one or more signals from a first PMIQ detector assembly and a first NSC detector assembly, applying a digital binary return mask to the one or more signals from the first NSC detector assembly, and executing a dual control loop based on one or more signals from the outputs of the first PMIQ detector assembly, the first NSC detector assembly, and the digital binary return mask to adjust a stage assembly to maintain focus of the imaging system.

[0010] An autofocusing system is disclosed. In one embodiment, the autofocusing system includes a PMIQ autofocusing system. In another embodiment, the PMIQ autofocusing system includes an illumination source. In another embodiment, the PMIQ autofocusing system includes a first aperture. In another embodiment, the PMIQ autofocusing system includes a tilted first projection mask. In another embodiment, the system includes an NSC autofocusing system. In another embodiment, the NSC autofocusing system includes an illumination source. In another embodiment, the NSC autofocusing system includes a second aperture. In another embodiment, the NSC autofocusing system includes a second projection mask. In another embodiment, the system includes a detector assembly. In another embodiment, the system includes a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to the imaging system, the relay system configured to project one or more patterns from a first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to a detector assembly, and the relay system configured to project one or more patterns from a second projection mask onto a sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the detector assembly. In another embodiment, the system includes a controller including one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to receive one or more signals from the detector assembly, apply a digital binary return mask to the one or more signals from the detector assembly, and execute a dual control loop based on the output of the digital binary return mask and the one or more signals from the detector assembly to adjust the stage assembly to maintain focus of the imaging system.

[0011] An autofocusing system is disclosed. In one embodiment, the autofocusing system includes a PMIQ autofocusing system. In another embodiment, the PMIQ autofocusing system includes an illumination source. In another embodiment, the PMIQ autofocusing system includes a first aperture. In another embodiment, the PMIQ autofocusing system includes a first projection mask. In another embodiment, the PMIQ autofocusing system includes one or more PMIQ detector assemblies. In another embodiment, the system includes an NSC autofocusing system. In another embodiment, the NSC autofocusing system includes an illumination source. In another embodiment, the NSC autofocusing system includes a second aperture. In another embodiment, the NSC autofocusing system includes a second projection mask. In another embodiment, the NSC autofocusing system includes one or more NSC detector assemblies. In another embodiment, the system includes a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to the imaging system, the relay system configured to project one or more patterns from a first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to one or more PMIQ detector assemblies, and the relay system configured to project one or more patterns from a second projection mask onto the sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to one or more NSC detector assemblies. In another embodiment, a system includes a controller including one or more processors configured to execute a set of program instructions stored in a memory, the program instructions configured to cause the one or more processors to receive one or more signals from the one or more PMIQ detector assemblies and the one or more NSC detector assemblies, and generate a focus error map based on the one or more signals from at least one of the one or more PMIQ detector assemblies or the one or more NSC detector assemblies.

[0012] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and do not necessarily restrict the invention as claimed. The accompanying drawings, which are incorporated in and constitute a part of the specification, illustrate embodiments of the invention and, together with the summary, serve to explain the principles of the invention. [Brief explanation of the drawings]

[0013] The many advantages of the present disclosure may be better understood by those skilled in the art by reference to the accompanying drawings, in which:

[0014] [Figure 1] 1 is a simplified diagram of a conventional autofocus (AF) system, in accordance with one or more embodiments of the present disclosure. [Figure 2A] 1 is a plot including multiple s-curves from an AF system in accordance with one or more embodiments of the present disclosure. [Figure 2B] 1 is a normalized s-curve (NSC) plot according to one or more embodiments of the present disclosure. [Figure 3] 10A-10C are cross-sectional views of channel holes of samples in accordance with one or more embodiments of the present disclosure. [Figure 4] FIG. 2 is a plan view of the sensitivity of the AF system shown in FIG. 1 with respect to pattern geometry, in accordance with one or more embodiments of the present disclosure. [Figure 5] 1 is a plot including a skewed s-curve and a symmetric s-curve in accordance with one or more embodiments of the present disclosure. [Figure 6] 2 is a specimen defect map acquired by an imaging system coupled to the AF system shown in FIG. 1 in accordance with one or more embodiments of the present disclosure. [Figure 7] 1 is a plot including a curved asymmetric s-curve and a symmetric s-curve in accordance with one or more embodiments of the present disclosure. [Figure 8A] 1 is a simplified diagram of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 8B] FIG. 10 illustrates an AF light pattern of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 8C] FIG. 1 illustrates a through-focus curve (TFC) of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 8D] FIG. 1 is a process flow diagram illustrating a focus control loop of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 8E] 10A-10C illustrate additional / alternative embodiments of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 8F] 10A-10C illustrate additional / alternative embodiments of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9A] 1 is a simplified diagram of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9B] FIG. 1 illustrates a field of view of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9C] 10A-10C illustrate additional / alternative embodiments of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9D] 1 is a simplified diagram of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9E] FIG. 1 is a process flow diagram illustrating a dual control loop of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 9F] 10 is a plot including an offset from the top surface of the sample, according to one or more embodiments of the present disclosure. [Figure 10] FIG. 1 illustrates an s-curve in accordance with one or more embodiments of the present disclosure. [Figure 11] 10A-10C illustrate additional / alternative embodiments of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 12] 1 is a simplified diagram of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 13] 1 is a simplified diagram of an AF system in accordance with one or more embodiments of the present disclosure. [Figure 14] 1A-1C illustrate exemplary projection mask patterns in accordance with one or more embodiments of the present disclosure. DETAILED DESCRIPTION OF THE INVENTION

[0015] The present disclosure has been particularly shown and described with reference to certain embodiments and specific features thereof. The embodiments described herein are considered to be illustrative and not limiting. It will be readily apparent to those skilled in the art that various changes and modifications in form and detail may be made therein without departing from the spirit and scope of the present disclosure.

[0016] Reference will now be made in detail to the disclosed subject matter, which is illustrated in the accompanying drawings.

[0017] 1 shows a simplified diagram of a conventional auto-focus (AF) system 100 coupled to an imaging system 130 in accordance with one or more embodiments of the present disclosure. In one embodiment, the AF system 100 is coupled to the imaging system 130 via a relay system 115.

[0018] In one embodiment, AF system 100 includes an illumination source 102 configured to generate illumination 101. Illumination source 102 may include any illumination source known in the art for generating illumination 101, including, but not limited to, a broadband radiation source, a narrowband radiation source, etc.

[0019] In another embodiment, the AF system 100 includes an aperture 104. For example, the AF system 100 may include a pupil aperture 104. The aperture may have any numerical aperture value known in the art. For example, the pupil aperture 104 may have a numerical aperture of 0.9 NA.

[0020] In another embodiment, the AF system 100 includes a projection mask 106 configured to project a geometric pattern 105 .

[0021] The relay system 115 may include any set of optical elements known in the art for relaying illumination. For example, but not limited to, the relay system 115 may include an adjustable focusing lens 114. For example, the adjustable focusing lens 114 may include a z-adjustable adjustable focusing lens 114.

[0022] In another embodiment, AF system 100 includes one or more sets of sensors 116. For example, AF system 100 may include a first set of sensors 116a and a second set of sensors 116b. For example, the first set of sensors 116a may be a set of focus sensors 116a, and the second set of sensors 116b may be a set of normal sensors 116b.

[0023] In another embodiment, the AF system 100 includes a return mask 118 .

[0024] The AF system 100 may include optical elements 108 known in the art. For example, the one or more optical elements 108 may include, but are not limited to, one or more mirrors 110, one or more beam splitters 112a, 112b, etc. In addition, the AF system 100 may include any additional optical elements known in the art, which may include, but are not limited to, one or more mirrors, one or more lenses, one or more polarizers, one or more beam splitters, one or more wave plates, etc.

[0025] Imaging system 130 may include one or more optical elements 132, including, but not limited to, one or more mirrors 134, one or more objective lenses 136, etc. It is noted that one or more optical elements 132 may include any optical element known in the art, including, but not limited to, one or more mirrors, one or more lenses, one or more polarizers, one or more beam splitters, one or more wave plates, etc.

[0026] In another embodiment, imaging system 130 includes one or more detectors 138 configured to acquire illumination from sample 140 via illumination source 102 or a separate, independent light source (not shown in FIG. 1).

[0027] The sample 140 may include any sample known in the art, including, but not limited to, a wafer, a reticle, a photomask, etc.; a biological sample, including, but not limited to, a tissue, an organ phantom, etc.; or a non-biological sample, including, but not limited to, one or more curved glass plates (or slabs), one or more non-curved glass plates (or slabs), etc. In one embodiment, the sample 140 is disposed on a stage assembly 142 to facilitate movement of the sample 140. In another embodiment, the stage assembly 142 is an actuable stage. For example, but not limited to, the stage assembly 142 may include one or more translation stages suitable for selectively translating the sample 140 along one or more linear directions (e.g., x-direction, y-direction, and / or z-direction). As another example, but not limited to, the stage assembly 142 may include one or more rotation stages suitable for selectively rotating the sample 140 along a rotational direction. As another example, the stage assembly 142 may optionally include, but is not limited to, a rotation stage and a translation stage suitable for translating the sample 140 along a linear direction and / or rotating the sample 140 along a rotational direction.

[0028] A description of an automatic focusing system is discussed in U.S. Pat. No. 4,639,587, issued Jan. 27, 1987, entitled "AUTOMATIC FOCUSING SYSTEM FOR A MICROSCOPE," the contents of which are incorporated herein by reference in their entirety.

[0029] 2A shows a plot 200 including multiple s-curves from AF system 100, in accordance with one or more embodiments of the present disclosure. FIGURE 2B shows a plot 220 of normalized s-curves for the multiple s-curves shown in FIGURE 2A, in accordance with one or more embodiments of the present disclosure.

[0030] In one embodiment, AF system 100 is configured to generate multiple s-curves. For example, as shown in FIG. 2A , the multiple s-curves may include a normal channel A curve 202, a normal channel B curve 204, a focus channel A curve 206, a focus channel B curve 208, and a normalized s-curve (NSC) 212.

[0031] As shown in FIG. 2A, the linear range may be determined using the slope 210 of the curve 202.

[0032] In plot 220, a normalized s-curve (NSC) 222 is depicted, expressed as:

number

[0033] In Equation 1, F a represents the focus signal for channel A, and F b represents the focal signal for channel B, and N a represents the normal signal for channel A, and N b represents the normal signal for channel B. For example, one or more normal signals (N a , N b ) may be obtained from a normal sensor. As another example, one or more focus signals may be obtained from a focus sensor.

[0034] It is noted here that the control system may be designed in such a way that the z-stage is set as NSC=0, but a focusing lens with z-axis adjustment (e.g., focusing lens 114) is required to adjust the user-configurable focus offset in the z-plane of the sample.

[0035] FIG. 3 is a comparison 300 of desirable and distorted channel holes through a sample stack, according to one or more embodiments of the present disclosure.

[0036] During the channel hole etching process step, the desired channel holes (e.g., channel holes 302) should be cylindrical through the sample stack (as shown in FIG. 3). AF system 100 may maintain focus at the desired focus offset if the sample has uniform, straight channel holes 302 across the entire sample surface. However, it is noted that one or more processing variations of the sample may cause AF system 100 to shift the sample surface up and / or down. As shown in FIG. 3, this shift is caused by tapered channel holes 304.

[0037] It is noted that process variations may cause certain regions of the specimen to have tapered channel holes 304 (e.g., variations in channel hole size). Although the physical thickness of the specimen remains the same, the AF system 100 may shift the specimen surface into and / or out of the plane of best focus of the high performance imaging system, depending on the strength of the process variations, thus resulting in a loss of surface defect detection sensitivity.

[0038] FIG. 4 is a top view of the sensitivity 400 of the AF system 100 for patterning geometric structures on a specimen, in accordance with one or more embodiments of the present disclosure.

[0039] It is noted that unpatterned areas on the specimen may cause the specimen focus to shift relative to patterned areas on the specimen, with the amount of focus shift depending on the width of the unpatterned areas.

[0040] As shown in Figure 4, the AF system 100 senses the sample pattern geometry. For example, the presence of an unpatterned region 402 within an etched array of channel holes 404 can cause the focus to shift (e.g., region 406 is shifted) even if the unpatterned region has the same physical height as the etched array. For example, for an unpatterned region having a width between 5 and 30 μm, the focus can shift between 100 and 400 nm depending on the brightness and width of the pattern.

[0041] It is noted here that focus shift due to unpatterned areas and shift of the specimen up and / or down due to process variations cause inconsistencies and loss of defect detection sensitivity across the surface of the specimen.

[0042] FIG. 5 is a plot 500 including a skewed s-curve 502 and a symmetric s-curve 504 in accordance with one or more embodiments of the present disclosure.

[0043] It is noted here that one significant issue with the AF system 100 is loss of focus at the sample (e.g., a 3D NAND wafer with a conventional AF setup). As shown in Figure 5, this is due to the sample pattern causing diffraction when the AF light penetrates below the sample surface, producing a high degree of s-curve linear range reduction.

[0044] 5, when the AF light penetrates below the 3D NAND wafer surface, the 3D NAND wafer s-curve 502 is distorted. In comparison, a mirrored surface without sample patterning to produce diffraction exhibits a symmetric s-curve 504 when the AF light penetrates below the sample surface.

[0045] FIG. 6 illustrates a specimen defect map 600 acquired by an imaging system 150 coupled to an AF system 100, in accordance with one or more embodiments of the present disclosure.

[0046] In the sample map 600, each dot corresponds to one detected defect. As shown in FIG. 6, the bottom 602 of the sample map 600 contains zero dots, meaning that no defects were detected at the bottom of the sample. This is due to a loss of focus within the AF system 100. It is noted that to inspect defects at the very bottom of a tall sample stack, which can be up to approximately 30 μm in size, the focusing lens in the AF system needs to support a z-axis adjustment range of 80 mm with high resolution. This can be very challenging for engineering designs. Furthermore, the s-curve will be distorted at large focus offsets due to excessive spherical aberration.

[0047] FIG. 7 shows a plot including a curved asymmetric s-curve 700 and a symmetric s-curve 702 in accordance with one or more embodiments of the present disclosure.

[0048] Note that when the sample is moved up, a curved asymmetric s-curve results. As shown in Figure 7, when the sample is moved up by 10 μm along the z-axis, a curved asymmetric s-curve 700 results due to excess spherical aberration. In comparison, when the sample focus offset is zero, a symmetric s-curve 702 results.

[0049] Autofocus (AF) systems have helped achieve peak defect detection sensitivity for optical imaging systems. These optical AF systems have advantages over non-optical systems. For example, optical AF systems have fast signal response and high sensitivity. However, optical AF systems such as AF system 100 have some disadvantages. For example, a sample may be thick and transparent (or translucent), allowing light to propagate below the top surface. This makes it very difficult to distinguish between AF light returned from the top and bottom surfaces, especially when the sample has two or multiple surfaces separated by a selected distance (e.g., about 10 nm to μm).

[0050] Furthermore, it can be very attractive for an optical AF system to keep the imaging system's best focal plane focused on the top surface of the sample within one depth of focus (DOF). The sample itself may have different refractive indices at different locations (e.g., x-axis and y-axis), i.e., AF signal strength at the return module. This becomes even more attractive when the DOF is very short. For example, the DOF may be approximately 100 nm for an imaging system operating at a numerical aperture (NA) of 0.9 with a wavelength of 200 nm.

[0051] For a fully automated imaging system, the best focal plane should be maintained, typically at a user-configurable focal offset on the sample surface, to achieve the best image quality and therefore the best detection sensitivity. Automated focusing systems may be integrated with high performance imaging systems to achieve this goal.

[0052] Based on the shortcomings of AF system 100, embodiments of the present disclosure are directed to an autofocus (AF) system for tracking a sample surface with a configurable focus offset. In particular, embodiments of the present disclosure are directed to an AF system that is integrated with a high-performance imaging system to achieve the best image quality and best detection sensitivity.

[0053] 8A is a simplified diagram of an AF system 800 coupled to an imaging system 830, in accordance with one or more embodiments of the present disclosure. In one embodiment, the AF system 800 is optically coupled to the imaging system 830 via a relay system 810.

[0054] In one embodiment, AF system 800 includes an illumination source 802 configured to generate illumination 801. Illumination source 802 may include any illumination source known in the art for generating illumination 801, including, but not limited to, a broadband radiation source, a narrowband radiation source, etc.

[0055] In another embodiment, AF system 800 includes an aperture 804. For example, AF system 800 may include a pupil aperture 804. The aperture may have any shape or numerical aperture value known in the art. For example, pupil aperture 804 may have a numerical aperture of 0.9 NA.

[0056] In another embodiment, the AF system 800 includes a projection mask 806 configured to project a geometric pattern 808 onto the sample 840. For example, the projection mask 806 may include an external projection mask including one or more selected patterns (as depicted in FIG. 14 and discussed further herein), which may be projected onto a plane of the sample 840 via a relay system 810 and an imaging system 830. It is noted that the geometric pattern 808 may be generated via any method known in the art. For example, the geometric pattern 808 may be a simple binary mask. As another example, the geometric pattern 808 may be generated by a spatial light modulator. As a further example, the geometric pattern 808 may be generated by optical diffraction (or interferometric means).

[0057] The relay system 810 may include any set of optical elements known in the art for relaying the projected mask image 819 from the first optical system and the second optical system. For example, the relay system 810 may include, but is not limited to, an adjustable focusing lens 812. For example, the adjustable focusing lens 812 may include a z-adjustable adjustable focusing lens 812.

[0058] In another embodiment, AF system 800 includes a detector assembly 814. For example, as shown in FIG. 8A , detector assembly 814 may include, but is not limited to, one or more cameras 814. AF system 800 may include any type of camera. For example, but is not limited to, AF system 800 may include, but is not limited to, a two-dimensional (2D) camera. As another example, AF system 800 may include, but is not limited to, a tilted 2D camera. As a further example, AF system 800 may include, but is not limited to, a tilted projection mask.

[0059] In another embodiment, the detector assembly 814 is communicatively coupled to a controller 816. The controller 816 may include one or more processors 818. The one or more processors 818 are configured to execute a set of program instructions stored in a memory 820. The set of program instructions are configured to cause the one or more processors 818 to perform one or more steps of the present disclosure. In one embodiment, the one or more processors 818 are configured to receive one or more projected mask images 819 from the detector assembly 814 of the AF system 800. In another embodiment, the one or more processors 818 are configured to determine projected mask image quality (PMIQ). For example, the one or more processors 818 may apply one or more focus metrics, which may be optimized for different purposes or applications, to determine the image quality of the projected mask images 819.

[0060] In another embodiment, the one or more processors 818 may adjust the stage assembly 842 in response to the projection mask image quality (PMIQ). For example, in response to the monitored projection mask image quality, the one or more processors 818 may dynamically adjust the vertical position (i.e., z-position) of the stage assembly 842 so that the sample z-position is adjusted to (or held at) an optimal (or at least sufficient) focus position.

[0061] AF system 800 may include any optical elements 822 known in the art to facilitate the operation of AF and the imaging system, and the coupling between A and F and the imaging system. For example, one or more optical elements 822 may include, but are not limited to, one or more lenses 824, one or more mirrors 826, or one or more beam splitters 828a, 828b. Furthermore, although not shown, AF system 800 may include any additional optical elements known in the art, including, but not limited to, one or more polarizers, one or more beam splitters, one or more wave plates, etc.

[0062] Imaging system 830 may include one or more optical elements 832, including, but not limited to, one or more mirrors 834, one or more objective lenses 836, etc. In another embodiment, imaging system 830 includes one or more detectors 838 configured to acquire illumination (e.g., reflected, diffracted, or scattered) from sample 840. One or more detectors 838 may be communicatively coupled to controller 816. In this regard, one or more processors 818 of controller 816 may receive signals and / or image data from one or more detectors 838 of imaging system 830. Imaging system 830 may include any imaging system known in the art. For example, the imaging system may include an inspection system, an image-based metrology system, a machine vision system, or a biological / biomedical imaging system.

[0063] The sample 840 may include any sample known in the art, including, but not limited to, a wafer, a reticle, a photomask, etc. In one embodiment, the sample 840 is positioned on a stage assembly 842 to facilitate movement of the sample 840. In another embodiment, the stage assembly 842 is an actuable stage. For example, but not limited to, the stage assembly 842 may include one or more translation stages suitable for selectively translating the sample 840 along one or more linear directions (e.g., x-direction, y-direction, and / or z-direction). As another example, but not limited to, the stage assembly 842 may include one or more rotation stages suitable for selectively rotating the sample 840 along a rotational direction. As another example, but not limited to, the stage assembly 842 may include a rotational stage and a translation stage suitable for selectively translating the sample 840 along a linear direction and / or rotating the sample 840 along a rotational direction.

[0064] FIG. 8B illustrates AF light patterns 850, 852 of the AF system 800 shown in FIG. 8A, in accordance with one or more embodiments of the present disclosure.

[0065] In one embodiment, AF light reflected from the surface of the sample forms AF light pattern 850. In another embodiment, AF light penetrating into the sample forms AF light pattern 852. Note that AF light pattern 850 illustrates that AF system 800 has the best PMIQ when a tightly focused spot is reflected from the sample surface. Note further that the focal extension of AF light pattern 852 extends along the X, Y, and Z axes. AF light pattern 852 illustrates that a tightly focused spot can be extended in the X, Y, and Z directions, which implies a degraded point spread function due to light penetrating into the sample.

[0066] It should be noted that if the projection mask (PM) image projected onto the sample from the PM has a high numerical aperture and diffraction is limited by imaging quality, the sample reflected PM image will have the best image quality only when it is reflected from the top surface. For a highly focused spot, which can be considered the point spread function (PSF) of the optical system from the PM to the sample, as shown in Figure 8B, when light penetrates the sample and is reflected from one or more points on the bottom surface, the sample thickness and material refraction cause the spot size to expand both laterally and along the optical axis. This results in a near-perfect aberration of the PSF. Therefore, PM imaging quality is degraded.

[0067] FIG. 8C shows a through-focus curve (TFC) 860 of the AF system 800 in accordance with one or more embodiments of the present disclosure.

[0068] In one embodiment, the one or more processors 818 of the AF system 800 are configured to determine the image quality of the one or more images 819 of the projection mask 806 based on applying one or more focus metrics to the one or more images 819 of the projection mask 806. For example, the one or more processors 818 may be configured to apply a through-focus curve (e.g., TFC 860) to the one or more images 819 of the projection mask 806. It is noted that when the sample 840 moves up and down, the PMIQ may be quantitatively measured by one or more focus metrics (e.g., TFC 860), which may be adjusted for different application purposes. The TFC 860 shown in FIG. 8C includes five repeats measured on the sample 840 (e.g., a mirror sample). The peak-to-peak variation of the five repeats is approximately 30 nm.

[0069] 8D is a process flow diagram illustrating a focus control loop 870 of the AF system 800 in accordance with one or more embodiments of the present disclosure. It is noted that the descriptions of various embodiments, components, and operations previously described herein for PMIQ should be construed to extend to the dual control loop 870 unless otherwise indicated. It is further noted that the various steps 872-892 should not be construed as limited to the particular order depicted in FIG. 8D or described herein. Rather, it is noted that the control loop 870 may begin at any number of locations within the control loop 870, and may bypass and / or repeat any number of steps.

[0070] In step 872, the focus control loop 870 generates a focus target.

[0071] In step 874, the focus control loop 870 adjusts the focus target.

[0072] In step 876, the focus control loop 870 generates the height of the sample.

[0073] In step 878, focus control loop 870 applies a control algorithm (eg, control algorithm 1).

[0074] In step 880, focus control loop 870 adjusts the stage assembly based on the output of a control algorithm (e.g., control algorithm 1). For example, system 800 may be configured to adjust stage assembly 842 in the z-direction.

[0075] In step 882, the focus control loop 870 takes one or more measurements using one or more PMIQ optics.

[0076] In step 884, focus control loop 870 obtains the PMIQ TFC via a detector assembly. For example, detector assembly 814 of AF system 800 may be configured to obtain the PMIQ TFC.

[0077] In step 886, the focus control loop 870 forwards the data based on the PMIQ TFC. For example, the second loop 962 may be configured to forward the selected data over a data path to a selected destination for processing.

[0078] In step 888, the focus control loop 870 processes one or more PM images to calculate the focus error and signature.

[0079] The focus control loop 870 passes the data to the stage assembly in step 890. For example, the system 800 may be configured to pass the data to the stage assembly 842.

[0080] In step 892, focus control loop 870 generates one or more focus errors. For example, focus control loop 870 may calculate a focus error expression as a distance (e.g., a number of nanometers).

[0081] It is noted here that the control system may be designed in such a way that the sample z-position is dynamically adjusted to keep the sample z-position at the peak position of the TFC.

[0082] FIG. 8E illustrates an AF system 800 according to one or more additional / alternative embodiments of the present disclosure. In this embodiment, the detector assembly 814 of the AF system 800 includes one or more tilted 2D cameras 896 configured to be tilted in and out of the focal plane. For example, the one or more tilted 2D cameras 896 may be tilted in and out of the focal plane in at least one of the rX direction (rotation about the x-axis) or the rY direction (rotation about the y-axis). It is noted that the optical axis may be defined as the z-axis. In this regard, the complete TFC may be acquired by the one or more tilted 2D cameras 896 while the sample 840 is moving in the XY plane for automated imaging. Furthermore, each point of the TFC may be mapped from one or more images of the projection mask at each XY location on the one or more tilted 2D cameras. It is further noted that the one or more tilted 2D cameras 896 may be configured to acquire the TFC without continuously moving the sample 840 in the z-direction.

[0083] 8F shows an AF system 800 according to one or more additional / alternative embodiments of the present disclosure. In this embodiment, the detector assembly 814 of the AF system 800 includes one or more 2D cameras 814 and one or more transparent plates 898. For example, the one or more transparent plates 898 may be disposed in front of the one or more 2D cameras 814 and may have a thickness that varies across the one or more transparent plates 898. It is noted that the one or more transparent plates 898 may be formed from any known transparent material, including, but not limited to, glass, quartz, etc.

[0084] 9A shows a simplified diagram of an AF system 900 coupled to an imaging system 930 in accordance with one or more embodiments of the present disclosure. In particular, FIG. 9A shows the AF system 900 configured for dual-mode simultaneous operation. The AF system 900 may include a PMIQ projection system 903 (or a PMIQ module) and an NSC projection system 905 (or an NSC module). In another embodiment, the AF system 900 is coupled to the imaging system 930 via a relay system 910. In this regard, the relay system 910 is configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to the imaging system 930.

[0085] In this embodiment, the PMIQ projection system 903 and the NSC projection system 905 may each include their own illumination source, aperture, projection mask, illumination reference control, and NA setting. For example, the PMIQ projection system 903 may include, but is not limited to, a first illumination source 902a, a first aperture 904a, and a first projection mask 906a. The NSC projection system 905 may include, but is not limited to, a second illumination source 902b, a second aperture 904b, and a second projection mask 906b.

[0086] In one embodiment, the illumination source 902a of the PMIQ autofocusing projection system 903 is configured to operate in a continuous on mode. In another embodiment, the illumination source 902b of the NSC autofocusing projection system 905 includes a first illumination channel (channel A) and a second illumination channel (channel B). The output of the illumination source 902b of the NSC autofocusing projection system 905 may be time multiplexed to mitigate crosstalk between the first illumination channel (channel A) and the second illumination channel (channel B).

[0087] In another embodiment, the first projection mask 906a and the second projection mask 906b are positioned such that the first projection mask 906a is projected into a first half of the field of view and the second projection mask 906b is projected into a second half of the field of view. In this regard, as shown in FIG. 9B , the system 900 may be configured such that the PMIQ projection system 903 uses the first half of the field of view (e.g., the left side) and the NSC projection system 905 uses the second half of the field of view (e.g., the right side). Such an arrangement helps reduce optical crosstalk between the PMIQ autofocus projection system 903 and the NSC autofocus projection system 905. For example, as shown in FIG. 9B , the projection from the PMIQ projection system 903 may occupy the left side 913a of the field of view (FOV), while the projection from the NSC projection system 905 may occupy the right side 913b of the FOV.

[0088] In another embodiment, the first projection mask 906 a and the second projection mask 906 b may have one or more different characteristics. For example, the first projection mask 906 a and the second projection mask 906 b may have different grid mask patterns, grid mask pitches, or grid mask orientations. The projection masks 906 a, 906 b may include one or more external projection masks containing one or more selected patterns (as depicted in FIG. 14 and discussed further herein), which may be projected onto the plane of the sample 940 via the relay system 910 and the imaging system 930.

[0089] It is noted that the PMIQ projection system 905 may operate with a 0.9 NA setting for both the illumination and collection paths 907, 909, respectively. Additionally, the NSC projection system 905 may operate with a reduced NA for both the illumination and collection paths 907, 909, respectively. For example, the NSC projection system 905 may operate with an NA less than 0.9 NA. For example, the NSC projection system 905 may operate with an NA between 0.4 and 0.6 NA. Additionally, the NSC projection system may operate with an NA of 0.5 NA. However, it is noted that the setting for NA may be optimized based on the application.

[0090] In another embodiment, the AF system 900 includes one or more PMIQ detector assemblies. For example, as shown in FIG. 9A , the PMIQ projection system 903 may include a first PMIQ detector assembly 914 a and a second PMIQ detector assembly 914 b. For example, but not limited to, the first PMIQ detector assembly 914 a and the second PMIQ detector assembly 914 b may include a first 2D camera 914 a and a second 2D camera 914 b, respectively. Note that the one or more 2D cameras 914 may have predetermined z-offsets for acquiring several discrete points on the TFC curve.

[0091] In another embodiment, the AF system 900 includes one or more NSC detector assemblies. For example, as shown in FIG. 9A , the NSC projection system 903 may include a first detector assembly 920a and a second detector assembly 920b. For example, the NSC projection system 903 may include a first sensor 920a and a second sensor 920b. The first sensor 920a receives one or more focus signals (e.g., F) from one or more illumination channels (e.g., channel A and channel B) of the NSC projection system 905. a , F bThe second sensor 920b may include one or more focus sensors configured to receive one or more normal signals (e.g., N a , N b ) may include a normal sensor 920b configured to receive the

[0092] In another embodiment, the AF system 900 includes one or more collection pupil aperture stops 918. For example, the AF system 900 may include a first collection pupil aperture stop 918a and a second collection pupil aperture stop 918b associated with the first sensor 920a and the second sensor 920b of the NSC projection system 905, respectively. For example, the first collection pupil aperture stop 918a may have a first numerical aperture (e.g., 0.5 NA). In another example, the second collection pupil aperture stop 918b may have a second numerical aperture (e.g., 0.5 NA). It is noted that the one or more collection pupil aperture stops 918a, 918b may have any numerical aperture value.

[0093] In another embodiment, the AF system 900 includes a return mask 916. For example, the AF system 900 may include a return mask 916 with the same pattern as the projection mask. As another example, the AF system 900 may include a return mask with a different pattern than the projection mask. Note that the return mask may be used in a focus channel to generate a focus signal for the NSC projection system 905. The return mask 916 acts like an optical valve on the reflected projection mask image. When the sample is in focus, focus sensor channels A and B receive the same amount of light. When the sample is out of focus, one channel receives more light than another channel, and vice versa. The defocus directionality may be determined by which channel receives more light.

[0094] In another embodiment, the one or more PMIQ detector assemblies 914 and the one or more NSC sensors 920 are communicatively coupled to a controller 921. The controller 921 may include one or more processors 925. The one or more processors 925 are configured to execute a set of program instructions stored in a memory 927. The set of program instructions are configured to cause the one or more processors 925 to perform one or more steps of the present disclosure. In one embodiment, the one or more processors 925 are configured to receive one or more signals from the first PMIQ detector assembly 914a, the second PMIQ detector assembly 914b, the first NSC detector assembly 920a, and the second NSC detector assembly 920b. In another embodiment, the one or more processors 925 are configured to adjust the stage assembly 942 (e.g., z position) to maintain (or establish) the focus of the imaging system 930 by executing a dual control loop based on one or more signals from the first PMIQ detector assembly, the second PMIQ detector assembly, the first NSC detector assembly, and the second NSC detector assembly.

[0095] The relay system 910 may include any set of optical elements known in the art for relaying illumination from the first optical system and the second optical system. For example, the relay system 910 may include, but is not limited to, an adjustable focusing lens 912. For example, the adjustable focusing lens 912 may include a z-adjustable adjustable focusing lens 912.

[0096] Imaging system 930 may include any imaging system known in the art, and the description of imaging system 830 provided previously herein should be construed to extend to imaging system 930. Imaging system 930 may include one or more optical elements 932, including, but not limited to, one or more mirrors 934, one or more objective lenses 936, etc. In another embodiment, imaging system 930 includes one or more detectors configured to acquire illumination (e.g., reflected, diffracted, or scattered) from sample 940. The one or more detectors may be communicatively coupled to controller 921. In this regard, one or more processors of the controller may receive signals and / or image data from the one or more detectors of imaging system 930. Imaging system 930 may include any imaging system known in the art. For example, the imaging system may include an inspection system, an image-based metrology system, a machine vision system, or a biological / biomedical imaging system.

[0097] The specimen 940 and stage assembly 942 may include any specimen and stage assembly known in the art, and the descriptions of the specimen 840 and stage assembly 842 previously provided herein should be construed to extend to the specimen 940 and stage assembly 942.

[0098] The AF system 900 may include any optical elements 922 known in the art to facilitate the operation of, and coupling between, the AF and imaging systems. For example, the one or more optical elements 922 may include, but are not limited to, one or more prism mirrors 924 (e.g., top-surface reflective or internally reflective), one or more lenses 926a, 926b, and one or more beam splitters 928a, 928b, and / or 928c. In addition, although not shown, the AF system 900 may include any additional optical elements known in the art, including, but not limited to, one or more polarizers, one or more beam splitters, one or more mirrors, one or more wave plates, etc.

[0099] 9C illustrates an additional / alternative embodiment of AF system 900, in accordance with one or more embodiments of the present disclosure. It is noted that the descriptions of the embodiments of systems 800 and 900 shall extend to the embodiment depicted in FIG. 9B unless otherwise stated herein.

[0100] In this embodiment, the AF system 900 includes a PMIQ camera 950a and an NSC camera 950b. For example, the system 900 may include a 2D camera 950a configured as a PMIQ camera and a 2D camera 950b configured as an NSC AF camera. In another embodiment, the AF system 900 may apply a digital binary return mask 952 during image processing to calculate the total integrated transmitted energy.

[0101] In this embodiment, the PMIQ camera 950a and the NSC camera 950b may be communicatively coupled to a controller 921 of the AF system 900. In this regard, the NSC camera 950b replaces the normal channel and the focus channel of Figure 9A. Furthermore, one or more processors 925 of the controller 921 may be configured to generate the NSC using data from the NSC camera 950b.

[0102] Digital Binary Return Mask 952 is F a , F b The NSC signal may be configured to calculate the total integrated energy transmitted across the entire field of view (FOV) of each of the NSC and AF cameras 950b as: (i) NSC signal = ∑ n ∑ ∑ n ∑ b ...

[0103] It is noted here that the second illumination source 902b of the NSC projection system 905, which includes channels A and B, is configured to be turned on in a time sequence. Further, for purposes of this disclosure, the term "N a Signal" or "N b "Signal" refers to the total integrated energy within the FOV of AF camera 950a.

[0104] In another embodiment, NSC may be calculated using the total integrated energy within the FOV of the NSC camera 950b. For example, when the sample moves in the z direction, one channel of illumination may be turned on to detect the lateral shift of a single edge of the projection mask image. For example, if channel A (or B) illuminates the projection mask from the right (or left) side of the pupil, the lateral movement of the right (or left) edge of the projection mask may be analyzed. The movement directions of the two channels must be opposite. After subtracting the movements of the two channels, the detection sensitivity may be doubled. The NSC signal obtained by edge movement detection may then be calculated using the F, which causes defocusing from the sample surface. a , F b , N a , N b This may reduce or even avoid the energy resulting from subsurface reflections, which deflects the total energy at Conceptually, image edges may be detected simply by taking the derivative of the original image.

[0105] FIG. 9D illustrates an additional / alternative embodiment of an AF system 900 in accordance with one or more embodiments of the present disclosure.

[0106] In one embodiment, the one or more projection masks 906 of the AF system 900 include one or more tilted projection masks 954. For example, the one or more tilted projection masks 954 may be tilted to obtain a complete TFC curve without moving one or more components of the AF system 900. In this additional / alternative embodiment, the geometric pattern of the tilted projection mask 954 may be designed to be different from the geometric pattern of the second projection mask 906b (as shown in FIG. 9B ).

[0107] In another embodiment, the detector assembly 914 of the AF system 900 includes a camera 914. For example, the camera 914 may be configured to acquire PMIQ from a left side 913a of the FOV 911 and NSC from a right side 913b of the FOV 911, as shown in FIG. 9B . In this embodiment, the camera 914 may be communicatively coupled to a controller 921. One or more processors 925 of the controller 921 may be configured to measure the PMIQ and generate an NSC signal.

[0108] In this embodiment, the left PMIQ image and the right NSC image may be read out simultaneously. For example, an image processing algorithm may split the two halves of the FOV. For example, a separate image processing algorithm may be used to process the PMIQ image and the NSC image to obtain PMIQ and NSC corresponding focus signals. The two focus signals may be combined by a dual control loop as further described herein with respect to FIG. 9E.

[0109] It is noted that the second illumination source 902b of the NSC projection system 905 is configured to time multiplex for A / B channel discrimination.

[0110] FIG. 9E shows a process flow diagram illustrating a dual control loop 960 in accordance with one or more embodiments of the present disclosure.

[0111] The dual control loop 960 may include a first control loop 961 and a second control loop 962 for maintaining or establishing focus of the imaging system. In this embodiment, the first control loop 961 implements an NSC autofocus routine and the second control loop 962 implements a PMIQ autofocus routine consistent with the NSC and PMIQ embodiments previously described herein, respectively. Accordingly, various embodiments, components, and operations described with respect to the NSC and / or PMIQ embodiments should be interpreted to extend to the dual control loop 960 unless specifically stated otherwise.

[0112] The second loop 962 may be configured to correct for one or more process variations induced by defocus from the first loop 961. For example, the second loop 962 may be configured to detect a peak position TFC so that the second loop 962 can find the best focal plane from the sample surface.

[0113] In one embodiment, as a starting point, the first control loop 961 may adjust the stage assembly based on the NSC optics and control feedback. Then, in the presence of process variations (e.g., process variations induced by defocus from the first control loop 961), the second control loop 962 may detect a focus error signal. The focus error signal may be calculated from a set of through-focus images acquired via the PMIQ optics and one or more detector assemblies. The control algorithm of the second loop 962 may calculate one or more focus metrics of the PMIQ images at each focus offset to obtain a few discrete points on the through-focus curve or TFC. The measured TFC data points may be used to calculate the offset of the PMIQ best focus plane with respect to the sample surface at the current location. This offset corresponds to the focus error. This quantity may then be converted to an NSC signal and fed back to the first control loop 961. Upon detecting the focus error signal, the first control loop 961 may then move the stage assembly to a new z position, and the focus error may be fully corrected.

[0114] It is noted that the various steps 964-980 should not be construed as limited to the particular order depicted in Figure 9E or described herein. Rather, it is noted that the dual control loop 960 may start at any location number within the control loop 960 and bypass and / or repeat any number of steps.

[0115] In step 964, the first loop 961 utilizes one or more NSC optics to acquire one or more NSC signals. For example, the controller 921 of the AF system 900 may be configured to acquire one or more NSC signals from one or more NSC optics.

[0116] In step 966 , the first loop 961 applies a first control algorithm (eg, Control Algorithm 1 ) to the one or more NSC signals obtained in step 964 .

[0117] In step 968, the first loop 961 adjusts the stage assembly based on the output of the first control algorithm (e.g., control algorithm 1). For example, the controller 921 of the AF system 900 may be configured to adjust the stage assembly 942. For example, the stage assembly 942 may be adjusted in the z-direction.

[0118] It is noted that the first loop 961 of the dual control loop 960 may be configured as a feedback loop. The bandwidth of the first loop 961 may be adjusted based on the application of the control loop and / or one or more hardware selections. It is further noted that when a focus error is present, it indicates process variation. The magnitude of the focus error correlates to the magnitude of the process variation.

[0119] In step 970, the second loop 962 obtains one or more measurements using one or more PMIQ optics.

[0120] In step 972, the second loop 962 acquires a PMIQ through-focus curve (TFC) via a detector assembly. For example, one or more detectors 914a, 914b of the AF system 900 may acquire a PMIQ TFC. For example, the TFC acquired via the PMIQ subsystem in step 970, or a small number of discrete points on the TFC, may be used to generate the PMIQ TFC.

[0121] In step 974, the second loop 962 forwards the data based on the PMIQ TFC. For example, the second loop 962 may be configured to forward the selected data via the data path to the selected destination for processing.

[0122] In step 976, the second loop 962 calculates the focus error and sign based on the transferred data. For example, the second loop 962 may calculate the focus error expressed as a distance (e.g., a number of nanometers). It is noted that the focus error is typically measured in nanometers, while the NSC count represents an electronic digital signal that has a linear relationship versus focus error corresponding to the slope of the S-curve in the linear region of the data (FIG. 2A).

[0123] In step 978, the second loop 962 passes the data to the first loop 961 for NSC calculations. In step 980, the second loop 962 applies a second control algorithm (e.g., control algorithm 2) to the data passed to the first loop 961. In this regard, the second loop 962 may convert the focus error into an NSC signal. The second loop 962 may then provide the focus error NSC signal to the first loop 961 of the dual control loop 960. The focus error may then be used by the first control loop 961 to adjust the z position of the stage assembly to sufficiently compensate for the focus error.

[0124] The NSC autofocus routine and the PMIQ autofocus routine may be operated independently for non-aligned areas of 2D wafer inspection and 3D NAND wafer inspection. Furthermore, the PMIQ autofocus routine may be operated independently when process variations are small and the required linear range is less than about 500 nm.

[0125] FIG. 9F shows a plot 990 including an offset from the top surface of the sample, according to one or more embodiments of the present disclosure.

[0126] It is noted that a large focus offset is required to inspect defects deeper within the sample stack. In one embodiment, the AF system 900 is configured to set the sample at a user-configurable focus offset that matches the sample top surface focus locus, which may be recorded during sample surface inspection, as shown by curve 992 in FIG.

[0127] In another embodiment, the AF system 900 may be configured to collect one or more focus error signals passed to the first loop 962 of the control loop 960. When a focus error is present, it indicates a process variation. The magnitude of the focus error correlates with the magnitude of the process variation. When the focus error map (FEM) is used in combination with a defect distribution map (e.g., FIG. 5), a correlation analysis of these two maps, or with other process control parameter values, may provide useful information to the user to find the root cause of yield-limiting factors.

[0128] In another embodiment, a focus error map (FEM) may be generated using the NSC projection system 905. Due to the focus sensitivity of the NSC's AF principle to process variations, the defect distribution map is not very reliable. However, the focus error map may still contain useful information for a user to identify yield-limiting factors by correcting it with other process parameters.

[0129] It is noted here that the NSC projection system 905 may be operated as a stand-alone AF system, which provides desirable functionality and excellent focus tracking performance for 2D wafer inspection and other non-aligned areas of 3D NAND wafers where PMIQ is difficult but where NSC's AF principles work well. It is noted here that the only difference with NSC's AF is that it has reduced numerical apertures in both the illumination and collection paths associated with the PMIQ projection system 903. This can increase focus tracking random noise, which is due to the focus signal (F a ,F b ) normal signal (N a ,N b) which is 1:2 in NSC projection system 905. For example, second beam splitter 928b may utilize a splitting ratio different from 50 / 50. For example, second beam splitter 928b may have a 66% transmission into the focal channel and a 33% reflection into the normal channel. As another example, a neutral density filter may be used to reduce light in the normal channel.

[0130] FIG. 10 illustrates an s-curve 1000 in accordance with one or more embodiments of the present disclosure.

[0131] 10, the linear range 1002 of the s-curve 1000 may be extended by a reduced NA setting in the NSC projection system 905 relative to the PMIQ projection system 903 in both the illumination and collection paths. For example, the linear range 1002 of the s-curve may be extended by a 0.5 NA setting in both the illumination and collection paths of the NSC projection system 905. The NSC projection system 905 may have a numerical aperture less than 0.9 NA. For example, the NSC projection system 905 may have a numerical aperture between 0.4 and 0.6 NA. For example, the NSC projection system 905 may have a numerical aperture of 0.5 NA.

[0132] 11 illustrates an additional / alternative embodiment of an AF system 900 in accordance with one or more embodiments of the present disclosure. In particular, the PMIQ projection system 903 of the AF system 900 may be implemented with a different magnification than the NSC projection system 905. In this regard, the PMIQ projection system 903 and the NSC projection system 905 may share the same illumination (e.g., as shown in FIG. 9B ) for FOV division. Furthermore, the PMIQ projection system 903 may both lead / succeed the NSC projection system 905 for left-to-right and right-to-left scanning.

[0133] Additionally, the grid mask for the PMIQ projection system 903 field of view may be eliminated if the sample's intrinsic pattern is resolvable by the 2D camera. In this regard, instead of detecting the image quality of the externally projected pattern, the imaging quality of the sample pattern is directly detected and analyzed. Similar control and focus metric algorithms may be applied to the systems previously described herein. Note that the focus metric is not limited to edge gradient. For example, robust contrast, accumulation density function (CDF), high frequency energy, etc. may be applied separately or in combination to determine the best focus plane.

[0134] 12 illustrates an additional / alternative embodiment of an AF system 900 in accordance with one or more embodiments of the present disclosure. In particular, a low NA setting of the NSC projection system 905 may be configured for 3D NAND wafer surface tracking, which requires insensitivity to process variations. Note that this allows for different magnifications, independent aberration, and focus control of the 2D and 3D inspection modules.

[0135] In one embodiment, the AF system 900 includes a detector 1200. For example, the AF system 900 may include a camera 1200. In another embodiment, the AF system 900 includes a stepped focus delay 1202.

[0136] In another embodiment, the AF system 900 includes multiple focus sensors 920a', 920a". In another embodiment, the AF system 900 includes multiple normal sensors 920b', 920b".

[0137] 13 illustrates an additional / alternative embodiment of an AF system 900 in accordance with one or more embodiments of the present disclosure. In particular, the PMIQ projection system 903 and the NSC projection system 905 of the AF system 900 may be configured to perform with similar NA settings. For example, the AF system 900 may be configured to have the same NA with illumination transmitted through one or more beam splitters.

[0138] In one embodiment, AF system 900 includes a tilted camera 1300. In another embodiment, AF system 900 includes a transparent plate 1302 disposed in front of detector assembly 914. Transparent plate 1302 may be formed from any transparent material known in the art, including, but not limited to, glass.

[0139] In this embodiment, the illumination source 902 may include a light emitting diode (LED) illumination source 902 .

[0140] FIG. 14 shows an exemplary projection mask pattern 1400 in accordance with one or more embodiments of the present disclosure.

[0141] In one embodiment, the projection mask pattern 1400 includes a linear spatial pattern 1402. In another embodiment, the projection mask pattern 1400 includes a square (or rectangular) box pattern 1404. In another embodiment, the projection mask pattern 1400 includes a star pattern 1406. It is noted that the projection mask pattern 1400 may include any specially designed pattern, and therefore the above discussion should not be construed as a limitation on the scope of the present disclosure.

[0142] In another embodiment, the projection mask pattern 1400 may include a grid mask pattern configured to improve focus detection sensitivity. For example, a series of binary square boxes oriented at different angles relative to the sample x-axis may enable detection of imaging quality with detailed information about different aberration types. It is noted that the imaging contrast of a grid mask may be improved by applying special coatings or modifying the material design of the transmittance and blocking characteristics of the light and dark parts of the mask.

[0143] It should be noted that AF systems 800, 900, 1100, 1200, and 1300 may have several advantages over AF system 100. For example, the AF system may track a sample surface having process variations and unpatterned areas. For example, the sample surface plane determined by AF system 800 is insensitive to process variations and unpatterned areas within the array. In this regard, surface defect detection sensitivity may fully qualify a high-performance imaging system (e.g., imaging system 830). As another example, the AF system has an enhanced ability to detect defocus errors. For example, when testing the AF system on a 3D NAND wafer with a 0.9 NA AF, a defocus error of 40 nm, well within one depth of focus range, was detected.

[0144] As another example, the NSC projection system 905 extended the s-curve linear range by using a reduced numerical aperture in both the illumination and collection paths. This extended linear range may avoid the loss of focus that is typical when sensitive methods set the NA to 0.9 NA for both the illumination and collection apertures. As shown in FIG. 10, a nominally symmetric s-curve has a distorted lower half. The s-curve linear range can be dramatically reduced, making it easy to lose focus.

[0145] As another example, an extended s-curve linear range is also an extreme design scheme that allows a focus error-based NSC signal to be fed to control algorithm 2 of the dual control loop 960 shown in FIG. 9E. As another example, a split field of view may eliminate crosstalk between one or more components of the AF system. As another example, the control loops of one or more components may be operated independently for 2D wafer inspection and non-array area 3D NAND wafer inspection. For example, the PMIQ control loops may be operated independently.

[0146] As another example, the through-focus curve (TFC) may alternatively be acquired with a tilted 2D camera without moving the sample z-stage or other parts in the optical system, which may otherwise introduce vibrations, air fluctuations, and / or acoustic noise. As a further example, the through-focus curve (TFC) may alternatively be acquired with a set of glass plates having different thicknesses, without moving the wafer z-stage or other parts in the optical system, which may otherwise introduce vibrations, air fluctuations, and / or acoustic noise.

[0147] As a further example, the AF field of view on the sample plane may be digitally truncated when a smaller size is needed. Additionally, undesirable sample features that may interfere with PMIQ detection may also be digitally masked. Furthermore, the NSC curve of the AF system 100 may be computationally generated by either an energy-based method or an edge-action method.

[0148] As another example, for bottom defect detection, the specimen may be placed at a user-configurable focus offset relative to the specimen surface shape, which is recorded during surface defect inspection. It is noted that the PMIQ and / or PMIQ+NSC techniques work very well to track the array-area wafer surface for 3D NAND inspection. However, when inspecting defects at the bottom of a wafer stack or at large focus offsets, a different strategy may be used to alleviate the excessive travel range requirements for the focus lens in the NSC technique. In this alternative approach, the z-stage z0(x, y, z) may be recorded during inspection of the wafer surface. For wafer bottom or large focus offset inspection, a fixed user-configurable focus offset may be added, and for inspection at large focus offsets, the autofocus may track to a virtual plane with a fixed offset from the top surface, as shown in FIG. 9F.

[0149] As a further example, a focus error map (FEM) may be collected during inspection. Additionally, a focus error map may be collected prior to inspection. The FEM may be useful to a user in finding process variation root causes and / or yield limiting factors.

[0150] It is noted that one or more components of system 800, 900 may be communicatively coupled to various other components of system 800, 900 in any manner known in the art. For example, one or more processors 818, 925 may be communicatively coupled to each other and to other components via a wired connection (e.g., copper wire, fiber optic cable, etc.) or via a wireless connection (e.g., RF coupling, IR coupling, WiMax, Bluetooth, 3G, 4G, 4G LTE, 5G, etc.). As another example, controller 816, 921 may be communicatively coupled to one or more components of system 800, 900 via any wired or wireless connection known in the art.

[0151] In one embodiment, the one or more processors 818, 925 may include any one or more processing elements known in the art. In this sense, the one or more processors 818, 925 may include any microprocessor-type device configured to execute software algorithms and / or instructions. In one embodiment, the one or more processors 818, 925 may comprise a desktop computer, a mainframe computer system, a workstation, an image computer, a parallel processor, or another computer system (e.g., a network computer) configured to execute programs configured to operate the systems 800, 900 as described throughout this disclosure. It should be recognized that the steps described throughout this disclosure may be performed by a single computer system, or alternatively, multiple computer systems. It should also be recognized that the steps described throughout this disclosure may be performed in any one or more of the one or more processors 818, 925. In general, the term “processor” may be broadly defined to encompass any device having one or more processing elements that executes program instructions from memory 820, 927. Additionally, the various subsystems of systems 800, 900 may include processors or logic elements suitable for performing at least a portion of the steps described throughout this disclosure. As such, the above description should be construed as merely illustrative and not limiting on the present disclosure.

[0152] The memory 820, 927 may include any storage medium known in the art suitable for storing program instructions executable by the associated processor(s) 818, 925 and data received from the system 800, 900. For example, the memory 820, 927 may include a non-transitory storage medium. For example, the memory 820, 927 may include, but is not limited to, read-only memory (ROM), random access memory (RAM), magnetic or optical memory devices (e.g., disks), magnetic tape, solid-state drives, etc. It is further noted that the memory 820, 927 may be housed within a common controller housing along with one or more processors 818, 925. In an alternative embodiment, the memory 820, 927 may be located remotely relative to the physical locations of the processors 818, 925, controllers 816, 921, etc. In another embodiment, the memory 820, 927 holds program instructions that cause one or more processors 818, 925 to perform the various steps described throughout this disclosure.

[0153] In one embodiment, a user interface is communicatively coupled to the controller 816, 921. In one embodiment, the user interface may include, but is not limited to, one or more desktops, tablets, smartphones, smartwatches, etc. In another embodiment, the user interface includes a display used to display data from the system 800, 900 to a user. The display of the user interface may include any display known in the art. For example, the display may include, but is not limited to, a liquid crystal display (LCD), an organic light emitting diode (OLED) display, or a CRT display. Those skilled in the art will recognize that any display device that can be integrated with a user interface is suitable for implementation in the present disclosure. In another embodiment, a user may input selections and / or commands in response to data displayed to the user via a user input device of the user interface.

[0154] Those skilled in the art will recognize that the components (e.g., operations), devices, objects, and accompanying discussion described herein are used as examples for conceptual clarity, and that various structural modifications are anticipated. Accordingly, as used herein, the specific examples described and accompanying discussion are intended to refer to their more general classes. In general, the use of any specific example is intended to be representative of its class, and the absence of specific components (e.g., operations), devices, and objects should not be considered limiting.

[0155] Those skilled in the art will understand that there are a variety of means (e.g., hardware, software, and / or firmware) by which the processes and / or systems and / or other techniques described herein may be achieved, and that the preferred means will vary with respect to the manner in which the processes and / or systems and / or other techniques are deployed. For example, if an implementer determines that speed and accuracy are paramount, the implementer may opt for a primarily hardware and / or firmware means; alternatively, if flexibility is paramount, the implementer may opt for a primarily software implementation, or even alternatively, the implementer may opt for some combination of hardware, software, and / or firmware. Thus, there are several possible means by which the processes and / or devices and / or other techniques described herein may be achieved, and any one means that may be utilized is not inherently superior or inferior to another, as the choice depends on the context in which the means is deployed and the particular concerns of the implementer (e.g., speed, flexibility, or predictability), any of which may vary.

[0156] The foregoing description is presented to enable one skilled in the art to make and use the invention as provided in connection with a particular application and its requirements. As used herein, directional terms such as "top," "bottom," "above," "below," "upper," "upward," "lower," "below," and "downward" are intended to provide relative positions for descriptive purposes and are not intended to indicate an absolute frame of reference. Various modifications to the described embodiments will be apparent to those skilled in the art, and the general principles defined herein may be applied to other embodiments. Thus, the present invention is not intended to be limited to the particular embodiments shown and described, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

[0157] With respect to the use of virtually any plural and / or singular term herein, those skilled in the art will be able to convert from plural to singular and / or from singular to plural as appropriate to the situation and / or application. The various singular / plural permutations are not expressly set forth herein for the sake of clarity.

[0158] All of the methods described herein may include storing results of one or more steps of the method embodiments in memory. The results may include any of the results described herein and may be stored in any manner known in the art. The memory may include any memory described herein or any other suitable storage medium known in the art. After the results are stored, they may be accessed in memory and used by any of the method or system embodiments described herein, formatted for display to a user, used by another software module, method, or system, etc. Furthermore, the results may be stored “permanently,” “semi-permanently,” “temporarily,” or for some period of time. For example, the memory may be random access memory (RAM), and the results may not necessarily persist in memory indefinitely.

[0159] It is further contemplated that each of the above method embodiments may include any other step(s) of any other method(s) described herein. In addition, each of the above method embodiments may be performed by any of the systems described herein.

[0160] The subject matter described herein sometimes shows different components contained within or connected to another component. It should be understood that such shown configurations are merely exemplary, and that in fact, many other configurations that achieve the same functionality may be implemented. In a conceptual sense, any arrangement of components to achieve the same functionality is effectively "associated" such that the desired functionality is achieved. Thus, any two components herein that combine to achieve a particular function may be considered to be "associated" with each other such that the desired functionality is achieved, regardless of configuration or intermediate components. Similarly, any two components so associated may also be considered to be "connected" or "coupled" with each other to achieve the desired functionality, and any two components that can be so associated may also be considered to be "couplable" with each other to achieve the desired functionality. Specific examples of connectable include, but are not limited to, physically interlocking components, physically interacting components, wirelessly interacting components, wirelessly interacting components, logically interacting components, and / or logically interacting components.

[0161] It should further be understood that the present invention is defined by the appended claims. Those skilled in the art will understand that, generally, the terms used in this specification, and particularly the appended claims (e.g., the appended claim text), are generally intended as "open" terms (e.g., the term "comprises" should be interpreted as "including, but not limited to," the term "having" should be interpreted as "having at least," the term "including" should be interpreted as "including, but not limited to," etc.). Those skilled in the art will further understand that if a specific number of introduced claim recitations is intended, such intention will be expressly set forth in the claim, and in the absence of such recitation, no such intention exists. For example, as an aid to understanding, the following appended claims may include the use of the introductory phrases "at least one" and "one or more" to introduce claim recitations. However, the use of such phrases does not imply that the introduction of a claim recitation with the indefinite article "a" or "an" limits any particular claim containing such introduced claim recitation to an invention containing only one such recitation; the same applies to the use of definite articles used to introduce claim recitations, even when the same claim includes the introductory phrases "one or more" or "at least one," and indefinite articles such as "a" or "an" (e.g., "a" and / or "an" typically should be interpreted to mean "at least one" or "one or more"). In addition, even if a particular number of introduced claim recitations is explicitly recited, those skilled in the art will recognize that such a recitation typically should be interpreted to mean at least the recited number (e.g., a bare recitation of "two recitations" without another modifier typically means at least two recitations or more than two recitations).Furthermore, in instances where notation similar to "at least one of A, B, and C, etc." is used, such configuration is generally intended to mean what one of ordinary skill in the art would understand the notation (e.g., "a system having at least one of A, B, and C" includes, but is not limited to, a system having only A, only B, only C, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). In instances where notation similar to "at least one of A, B, or C, etc." is used, such configuration is generally intended to mean what one of ordinary skill in the art would understand the notation (e.g., "a system having at least one of A, B, or C" includes, but is not limited to, a system having only A, only B, only C, A and B together, A and C together, B and C together, and / or A, B, and C together, etc.). Moreover, those skilled in the art will understand that any disjunctive word and / or phrase, substantially presenting two or more alternative terms, whether in the specification, claims, or drawings, should be understood to contemplate the possibility of including one of the terms, either of the terms, or both terms. For example, the phrase "A or B" is understood to include the possibilities of "A" or "B" or "A and B."

[0162] It is believed that the present disclosure and many of its attendant advantages will be understood from the foregoing description, and it will be apparent that various changes may be made in the form, construction and arrangement of elements without departing from the disclosed subject matter or sacrificing all of its particular advantages. The described forms are merely illustrative, and it is the intent of the following claims to embrace and encompass all such changes. It is to be further understood that the present invention is defined by the appended claims.

Claims

1. 1. An autofocus system comprising:

1. A projection mask image quality (PMIQ) autofocus system, comprising: illumination source, A first opening, a first projection mask; and First PMIQ detector assembly and second PMIQ detector assembly a projection mask image quality (PMIQ) autofocus system comprising:

1. A normalized s-curve (NSC) autofocus system, comprising: illumination source, A second opening, a second projection mask; and First NSC detector assembly and second NSC detector assembly a normalized s-curve (NSC) autofocus system comprising: a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to an imaging system; the relay system is configured to project one or more patterns from the first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to the first PMIQ detector assembly and the second PMIQ detector assembly; the relay system configured to project one or more patterns from the second projection mask onto the sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the first NSC detector assembly and the second NSC detector assembly; A controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions causing the one or more processors to: receiving one or more signals from the first PMIQ detector assembly, the second PMIQ detector assembly, the first NSC detector assembly, and the second NSC detector assembly; and a controller configured to execute a dual control loop based on the one or more signals from the first PMIQ detector assembly, the second PMIQ detector assembly, the first NSC detector assembly, and the second NSC detector assembly to adjust the stage assembly to maintain focus of the imaging system; wherein the first projection mask and the second projection mask are positioned such that the first projection mask is projected into a first half of a field of view and the second projection mask is projected into a second half of the field of view, thereby reducing optical crosstalk between the PMIQ autofocus system and the NSC autofocus system.

2. The system of claim 1 , wherein at least one of a grid mask pattern, a grid mask pitch, or a grid mask orientation of the first projection mask is different from the second projection mask.

3. The system of claim 1 , wherein the illumination source of the PMIQ autofocus system is configured to operate in a continuous on state.

4. 2. The system of claim 1, wherein the illumination source of the NSC autofocus system includes a first illumination channel and a second illumination channel, and wherein the output of the illumination source of the NSC autofocus system is time multiplexed to reduce crosstalk between the first illumination channel and the second illumination channel.

5. The system of claim 1 , wherein the NSC autofocus system has a reduced numerical aperture relative to the PMIQ autofocus system in at least one of an illumination path or a collection path.

6. The system of claim 5 , wherein the NSC autofocus system has an s-curve linear range.

7. The system of claim 5 , wherein the NSC autofocus system has a numerical aperture of less than 0.9 NA.

8. The system of claim 7, wherein the NSC autofocus system has a numerical aperture between 0.4 and 0.6 NA.

9. 1. An autofocus system comprising: a projection mask image quality (PMIQ) autofocus system comprising an illumination source, a first aperture, a first projection mask, and a first PMIQ detector assembly; a normalized s-curve (NSC) autofocus system comprising an illumination source, a second aperture, a second projection mask, and a first NSC detector assembly; a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to an imaging system; the relay system is configured to project one or more patterns from the first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to the first PMIQ detector assembly; the relay system configured to project one or more patterns from the second projection mask onto the sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the first NSC detector assembly; A controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions causing the one or more processors to: receiving one or more signals from the first PMIQ detector assembly and the first NSC detector assembly; applying a digital binary return mask to the one or more signals from the first NSC detector assembly; and executing a dual control loop based on the one or more signals from the outputs of the first PMIQ detector assembly, the first NSC detector assembly, and the digital binary return mask to adjust the stage assembly to maintain focus of the imaging system; a controller configured to cause wherein the first projection mask and the second projection mask are positioned such that the first projection mask is projected into a first half of a field of view and the second projection mask is projected into a second half of the field of view, thereby reducing optical crosstalk between the PMIQ autofocus system and the NSC autofocus system.

10. 1. An autofocus system comprising: a projection mask image quality (PMIQ) autofocus system comprising an illumination source, a first aperture, and a tilted first projection mask; a normalized s-curve (NSC) autofocus system comprising an illumination source, a second aperture, and a second projection mask; a detector assembly; a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to an imaging system; the relay system is configured to project one or more patterns from the tilted first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the tilted first projection mask from the sample to the detector assembly; the relay system configured to project one or more patterns from the second projection mask onto the sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the detector assembly; and A controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions causing the one or more processors to: receiving one or more signals from the detector assembly; applying a digital binary return mask to the one or more signals from the detector assembly; and executing a dual control loop based on the one or more signals from the detector assembly and the output of the digital binary return mask to adjust the stage assembly to maintain focus of the imaging system; a controller configured to cause wherein the tilted first projection mask and the second projection mask are positioned such that the tilted first projection mask is projected within a first half of a field of view and the second projection mask is projected within a second half of the field of view, thereby reducing optical crosstalk between the PMIQ autofocus system and the NSC autofocus system.

11. The system of claim 10 , wherein the tilted first projection mask is configured to provide a through-focus curve (TFC).

12. The system of claim 10 , wherein at least one of a grid mask pattern, a grid mask pitch, or a grid mask orientation of the tilted first projection mask is different from the second projection mask.

13. 1. An autofocus system comprising: a projection mask image quality (PMIQ) autofocus system comprising an illumination source, a first aperture, a first projection mask, and one or more PMIQ detector assemblies; a normalized s-curve (NSC) autofocus system comprising an illumination source, a second aperture, a second projection mask, and one or more NSC detector assemblies; a relay system configured to optically couple illumination from the PMIQ autofocus system and the NSC autofocus system to an imaging system; the relay system is configured to project one or more patterns from the first projection mask onto a sample disposed on a stage assembly of the imaging system and transmit an image of the first projection mask from the sample to the one or more PMIQ detector assemblies; the relay system configured to project one or more patterns from the second projection mask onto the sample disposed on the stage assembly of the imaging system and transmit an image of the second projection mask from the sample to the one or more NSC detector assemblies; A controller including one or more processors, the one or more processors configured to execute a set of program instructions stored in a memory, the program instructions causing the one or more processors to: receiving one or more signals from the one or more PMIQ detector assemblies and the one or more NSC detector assemblies; and generating a focus error map based on the one or more signals from at least one of the one or more PMIQ detector assemblies or the one or more NSC detector assemblies; a controller configured to cause wherein the first projection mask and the second projection mask are positioned such that the first projection mask is projected into a first half of a field of view and the second projection mask is projected into a second half of the field of view, thereby reducing optical crosstalk between the PMIQ autofocus system and the NSC autofocus system.

14. 14. The system of claim 13, wherein at least one of a grid mask pattern, a grid mask pitch, or a grid mask orientation of the first projection mask is different from the second projection mask.

Images