Design support method and design support device

Abstract

To allow a design support apparatus to extract and analyze parameters of an analysis model even if information of electronic components for used in a circuit system using the electronic components is not sufficient.SOLUTION: The present invention is directed to a design support apparatus having an input unit for inputting data of design and structure of a circuit system and data of components, an arithmetic unit for generating a component model from data of components input from the input unit to process the component model and data of design and structure for evaluation of performance of the circuit system, and an output unit for outputting a result of evaluation of performance of the circuit system by the arithmetic unit. The arithmetic unit is arranged by having a component model generating unit for, if the component data input from the input unit lacks a part of data necessary for evaluation of the performance of the circuit system, generating complement data for compensating the missing data to generate the component model by using the component data input from the input unit and the complement data.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a design support method and a design support device. [Background technology]

[0002] As electronic and electrified systems and devices become more prevalent in the industrial, infrastructure, and automotive sectors, it is important to operate electronic systems and devices safely and securely over the long term and continue to provide value.

[0003] For example, in products with a long life cycle such as elevators, the various semiconductors that make up the internal control circuit system have a short life cycle, and there are many cases where they reach EOL (End of Life) status shortly after installation. As a countermeasure, EOL target parts that have reached the end of their product life among the parts that make up the control circuit system may be replaced with alternative parts, but when replacing with alternative parts, verification testing of the changed control circuit system is required.

[0004] To reduce the man-hours required for this verification testing, design support techniques are being used that use simulations to predict various performance characteristics of the control circuit system after modifications and provide feedback to the design in advance.

[0005] For example, Patent Document 1 describes a design support device that analyzes new CAD data using past analysis results for CAD data, and includes a database that stores analysis result data for the past CAD data in association with a plurality of shape parameters and analysis conditions that constitute the past CAD data, and a learning unit that learns the plurality of shape parameters and analysis conditions as training data, and an analysis process execution determination unit that skips the analysis process for the newly input CAD data if analysis results corresponding to the shape parameters and analysis conditions that constitute the newly input CAD data are stored in the database. [Prior art documents] [Patent documents]

[0006] [Patent Document 1] Japanese Patent Application Publication No. 2017-111658 Summary of the Invention [Problem to be solved by the invention]

[0007] When constructing a circuit analysis model or an electromagnetic field analysis model, if a new component is adopted or replaced with an alternative component, there may be a problem that sufficient information about the component is not available, making it difficult to model the modified system for verification testing.

[0008] Furthermore, even when comparing new design data with previous design data and extracting differences, there was a problem in that there was not enough design data information for newly adopted parts, making it difficult to extract the difference data.

[0009] However, Patent Document 1 does not take these issues into consideration, and when sufficient information on new or alternative parts is not available, it is difficult to model the modified system for verification testing.

[0010] The present invention solves the problems of the conventional techniques described above and provides a design support method and device that has a component model generation unit that can analyze and predict trends in component characteristic values ​​that are lacking for modeling from past component characteristic values, measurement results, and analysis results, and extract parameters for an analytical model, even when sufficient information about newly adopted electronic components is not available in a circuit system that uses electronic components, thereby complementing the component information and realizing analytical design. [Means for solving the problem]

[0011] In order to solve the above-mentioned problems, the present invention provides a design support device comprising an input unit for inputting design and structure data and component data of a circuit system, a calculation unit for creating a component model from the component data input from the input unit and processing the component model and the design and structure data to evaluate the performance of the circuit system, and an output unit for outputting the results of the performance evaluation of the circuit system by the calculation unit, wherein the calculation unit comprises a component model generation unit for generating complementary data to complement the missing data when the component data input from the input unit lacks part of the data necessary for evaluating the performance of the circuit system, and generating a component model using the component data input from the input unit and the complementary data. The component model generation unit includes a missing information identification unit that identifies missing data in component data input from the input unit among data necessary for evaluating the performance of the circuit system in the component data; a storage unit that accumulates past data related to the circuit system; a complementary parameter generation unit that uses the past data stored in the storage unit to create complementary data corresponding to the missing data identified by the missing information identification unit; and a component model creation unit that creates a component model using the component data input from the input unit and the complementary data created by the complementary parameter generation unit. It was composed as follows.

[0012] Furthermore, in order to solve the above-mentioned problems, the present invention provides a design support method using a design support device having an input unit, a calculation unit, and an output unit, in which design and structure data and component data of a circuit system are input from the input unit, a component model is created in the calculation unit from the component data input from the input unit, the component model and the design and structure data are processed in the calculation unit to evaluate the performance of the circuit system, and the results of the evaluation of the performance of the circuit system are output from the output unit, and if part of the data necessary for evaluating the performance of the circuit system is missing in the component data input from the input unit when the component model is created in the calculation unit, complementary data is generated to complement the missing data, and the component model is created using the component data input from the input unit and the complementary data. and generating a component model by identifying missing data in the component data input from the input unit among data necessary for evaluating the performance of the circuit system in the component data, creating complementary data corresponding to the identified missing data using past data stored in a storage unit that accumulates past data related to the circuit system, and creating a component model using the component data input from the input unit and the complementary data. I tried to do that. [Effects of the Invention]

[0013] According to the present invention, even when sufficient component information is not available, it is possible to realize analytical design by supplementing the missing component information using information on past component characteristic values, measurement results, and analysis results. [Brief explanation of the drawings]

[0014] [Figure 1]1 is a block diagram showing a configuration of an analysis support device according to a first embodiment of the present invention. [Figure 2] 1 is a flowchart showing a processing flow of an analysis support method according to Example 1 of the present invention. [Figure 3] 4 is a flowchart showing a detailed process flow of a part model generation step in the processing of the analysis support method according to the first embodiment of the present invention. [Figure 4] These are examples of past data stored in the past data storage unit that is referenced in the component model generation process. (a) is a graph showing the yearly change trend in the ESL of a capacitor from Company A, (b) is a graph showing the change in data for each generation of the switching transient characteristics (dv / dt) of an IGBT from Company D, and (c) is a graph showing the yearly change trend in the parasitic capacitance of an IGBT from Company G. [Figure 5] 10 is a graph showing the relationship between the impedance Z of the circuit and the drive speed, as an example of a function representing the change trends of parameters found in past analyses stored in a past data storage unit. [Figure 6] 10 is a graph showing the results of measurements of the relationship between frequency and pass characteristics of electronic devices stored in a past data storage unit. [Figure 7] FIG. 10 is a block diagram showing a structural model for conducting noise analysis of a power conversion device (inverter) according to a second embodiment of the present invention. [Figure 8] 10 is a table showing, in a list format, parameters required for a component model of a power module (IGBT) shown as an example of a component model used in a structural model for conducting noise analysis of a power conversion device (inverter) according to Example 2 of the present invention. [Figure 9] FIG. 10 is a circuit diagram showing a component model of a power module (IGBT) shown as an example of a component model used in a structural model for conducting noise analysis of a power converter (inverter) according to a second embodiment of the present invention. [Figure 10] 10 is a table showing a list of past data of a component model of a power module (IGBT) shown as an example of past data required to analyze a structural model for conducting noise analysis of a power conversion device (inverter) according to Example 2 of the present invention. [Figure 11]10A and 10B are circuit block diagrams showing component models used in the conduction noise analysis of a power conversion device (inverter) according to a second embodiment of the present invention, in which (a) is a circuit block diagram of an LISN (Line Impedance Stabilization Network: pseudo power supply circuit network), (b) is a circuit block diagram of a Y capacitor, (c) is a circuit block diagram of a power module (IGBT), and (d) is a circuit block diagram of a load. [Figure 12] FIG. 10 is a circuit block diagram of an analysis model for analyzing conduction noise of a power conversion device (inverter) according to a second embodiment of the present invention. [Figure 13] 10 is a graph showing the frequency characteristics of the conducted noise voltage output as a result of the conducted noise analysis of the power conversion device (inverter) according to Example 2 of the present invention, and shows a state in which the conducted noise voltage is below the allowable voltage value in the measured frequency range. [Figure 14] FIG. 10 is a block diagram showing the configuration of an analysis support device according to a third embodiment of the present invention. [Figure 15] 10 is a flowchart showing the flow of processing in an analysis support method according to a third embodiment of the present invention. [Figure 16] 10 is a graph showing the frequency characteristics of the conducted noise voltage output as a result of the conducted noise analysis of the power conversion device (inverter) according to Example 3 of the present invention, and shows a state in which the conducted noise voltage exceeds the allowable voltage value in a certain frequency range. [Figure 17] FIG. 11 is a circuit block diagram of a Y capacitor illustrating a case where a Y capacitor is replaced as an example of a case where a part is replaced when the characteristics of a conducted noise voltage do not satisfy the target specifications as a result of a conducted noise analysis of a power conversion device (inverter) according to a third embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0015] The present invention relates to an analysis support method and device that has a part model generation unit that can analyze and predict trends in part characteristic values ​​that are lacking in modeling from past part characteristic values, measurement results, and analysis results, and extract parameters for an analysis model, thereby complementing part information and realizing analytical design.

[0016] The present invention also relates to an analysis support method and device that uses past data to predict change trends and complement parameters that cannot be extracted from existing component data or design data or whose information is not disclosed, among the component and structural parameters required for analysis.

[0017] Specifically, in the design support method and device, in a circuit system using electronic components, it is determined whether modeling is possible from the data sheets of the electronic components, and if information is insufficient, this is identified by an insufficient information identifying unit, and various performances are predicted by having a characteristic trend predicting unit that predicts trends in component characteristic values ​​from past data and a component parameter extracting unit that extracts component parameters from the predicted component characteristics.

[0018] Furthermore, in the design support method and device of the present invention, it is determined whether modeling is possible from a component data sheet, and if information is insufficient, this is identified by a missing information identifying unit, and the device has a characteristic trend predicting unit that predicts trends in component characteristic values ​​from past data and a component parameter extracting unit that extracts component parameters from the predicted component characteristics, and various performances are predicted by providing the parameters necessary for the analysis model.

[0019] Hereinafter, an embodiment of the present invention will be described in detail with reference to the drawings. In all drawings for explaining the embodiment, components having the same functions are assigned the same reference numerals, and repeated explanations thereof will be omitted as a general rule.

[0020] However, the present invention should not be construed as being limited to the description of the embodiments shown below. Those skilled in the art will readily understand that the specific configurations can be modified without departing from the spirit or intent of the present invention. [Example]

[0021] A first embodiment of the present invention will be described with reference to FIGS.

[0022] The design support device 10 according to this embodiment includes a data input unit 200, a calculation unit 100, and an output unit 300. The calculation unit 100 includes a structural model generation unit 110 that receives design, structure, and control data 210 of a circuit system using electronic components from the data input unit 200 and generates a structural model, a component model generation unit 120 that receives data of a component data specification 220 of each component constituting the circuit system using electronic components from the data input unit 200 and generates a component model, an analytical model construction unit 130 that receives the structural model generated by the structural model generation unit 110 and the component model generated by the component model generation unit 120 and constructs an analytical model, and an analysis result determination unit 140 that analyzes the analytical model constructed by the analytical model construction unit 130 and determines performance. The output unit 300 outputs a performance evaluation result 310 determined by the analysis result determination unit 140.

[0023] The part model generating unit 120 further comprises a part parameter extracting unit 121 , a missing information identifying unit 122 , a supplementary parameter generating unit 123 , a past data accumulating unit 124 , and a part model creating unit 125 .

[0024] Using the design support device 10 shown in FIG. 1, the flow of processing for inputting design, structure, and control data 210 and data of a parts data specification 220 from a data input unit 200 to a calculation unit 100 and outputting a performance evaluation result 310 to an output unit 300 will be described with reference to FIGS. 2 and 3.

[0025] FIG. 2 shows the overall processing flow, and FIG. 3 explains the details of the processing performed by the part model generation unit 120 in the processing flow in FIG.

[0026] 2, first, design, structure, and control data 210 is input from data input unit 200 to structural model generation unit 110 of calculation unit 100 (S21), and a structural model is generated in structural model generation unit 110 (S22). Meanwhile, data of part data specification 220 is input from data input unit 200 to part model generation unit 120 of calculation unit 100 (S23), and a part model is generated in part model generation unit 120 (S24).

[0027] Next, the structural model generated in the structural model generation unit 110 and the component model generated in the component model generation unit 120 are input to the analytical model construction unit 130 to construct an analytical model (S25). The analytical model constructed in the analytical model construction unit 130 is sent to the analysis result determination unit 140 where it is analyzed, and the performance of the circuit system using the electronic components is determined (S26), and this determination result is sent to the output unit 300 where it is output as the performance evaluation result 310 (S27).

[0028] In the processing flow explained in Fig. 2, when an alternative part is used when a conventional part breaks down or is replaced periodically, if data related to this alternative part is insufficient in the data of part data specification 220 input to part model generation unit 120 in S23, processing must be performed to supplement this insufficient data in order to generate a part model in S24. Fig. 3 explains the detailed processing flow in S24, including this processing flow.

[0029] 3, first, the part parameter extraction unit 121 extracts parameters necessary for generating a part model from the data of the part data specification 220 input in S23 (S241). Next, it is checked whether all parameters necessary for generating the part model are available using the parameters extracted in S241, and whether any are missing (S242). If the part parameter extraction unit 121 extracts all parameters necessary for generating the part model and determines that there are no missing parameters (No in S242), the extracted part parameters are output as a part model to the analysis model construction unit 130 (S243), and the process proceeds to step (S25).

[0030] On the other hand, if it is determined in S242 that the part parameter extraction unit 121 lacks the parameters necessary to generate the part model (Yes in S242), the information is sent to the missing information identification unit 122, and the missing parameters are listed (S244).

[0031] Information on the listed missing parameters is sent to the complementary parameter generation unit 123, which reads past data such as analysis results, measurement results, and specifications stored in the past data storage unit 124 (S245), creates approximation formulas, function formulas, etc. from the read past data, and predicts the physical property trends of the substitute parts that are missing parameters (S246).

[0032] Next, the complementary parameter generating unit 123 generates complementary parameters that complement the missing parameters using the property trend information of the alternative part for which the parameters predicted in S246 are missing (S247).

[0033] The information on the complementary parameters created in S247 is sent to the part model creation unit 125, where it is processed together with the parameters necessary for the part model extracted in S241 by the part parameter extraction unit 121 to generate a part model (S243), which is output to the analysis model construction unit 130, and the process proceeds to step (S25) described in FIG. 2.

[0034] In this way, when a conventional part is replaced with an alternative part, even if the alternative part lacks some of the parameter information required to generate a part model similar to the conventional part, by providing the design support device with a function for complementing the missing parameters from accumulated past data, it becomes possible to analyze the performance after replacement with the alternative part.

[0035] When missing information is identified in the component data specification 220 input by the missing information identification unit 122, the complementary parameter generation unit 123 obtains an approximate formula from the data stored and accumulated in the past data accumulation unit 124, for example, from the annual trends of past actual measurement data and the change trends of product generations, and predicts the necessary parameter values.

[0036] As an example of data stored and accumulated in past data accumulation unit 124 of component model generation unit 120 in Fig. 1, Fig. 4(a) shows graph 410 illustrating the annual change trend of the ESL (Equivalent Series Inductance) of a capacitor from Company A, which is a characteristic of an electronic component used in a circuit board of an electronic device. When the ESL value of the capacitor from Company A is specified as the missing information by missing information identification unit 122, complementary parameter generation unit 123 obtains an approximation curve 411 from graph 410, calculates a predicted value of the ESL of the target capacitor from Company A, creates storage parameters, and sends the results to component model creation unit 125. In this way, the ESL value of the capacitor from Company A to be used as a substitute component, which was not obtained from component data specification 220, is added to the information extracted by component parameter extraction unit 121, and component model creation unit 125 can generate a component model.

[0037] 4(b) shows an example of data stored in the past data storage unit 124, in the form of graph 420, illustrating an example of data changes for each generation of the switching transient characteristics (dv / dt) of an IGBT (Integrated Gate Bipolar Transistor) manufactured by Company D. When the missing information identification unit 122 specifies the switching transient characteristics (dv / dt) of the IGBT manufactured by Company D as missing information, the complementary parameter generation unit 123 obtains an approximate curve 421 from this graph 420, calculates a predicted value of the switching transient characteristics (dv / dt) of the target IGBT manufactured by Company D, and sends the result to the component model creation unit 125. In this way, the component model creation unit 125 can generate a component model by supplementing the information extracted by the component parameter extraction unit 121 with the value of the switching transient characteristics (dv / dt) of the IGBT manufactured by Company D to be used as a substitute component that was not obtained from the component data specification 220.

[0038] FIG. 4(c) shows an example of data stored in the historical data storage unit 124, in graph 430, illustrating the annual trend of the Cpar (parasitic capacitance) value of an IGBT manufactured by Company G. This Cpar data is not included in the device specifications because it is affected by the relationship between the IGBT and its surrounding circuits. Instead, it is typically measured and determined by the device user, and the data shown in FIG. 4(c) is registered in the complementary parameter generation unit 123. When the missing information identification unit 122 specifies the Cpar value of Company G's IGBT as missing information, the complementary parameter generation unit 123 obtains an approximate curve 431 from this graph 430, calculates a predicted Cpar value for the target IGBT manufactured by Company G, and sends the result to the component model creation unit 125. This allows the component model creation unit 125 to generate a component model by supplementing the Cpar value of the IGBT manufactured by Company G that was not obtained from the component data specification 220.

[0039] In the example described with reference to (a) to (c) of FIG. 4, the parameter value to be determined may be a single point or a range of values.

[0040] 4(a) to 4(c), the data to be stored in the past data storage unit 124 may be a function of the change trends of parameters found in past analyses, and values ​​may be predicted by setting conditions according to the analysis to be performed. Also, there may be cases where it is necessary to take into account cases where parameters are correlated with each other due to trade-off relationships, etc.

[0041] 5 shows an example of a function representing the change trends of parameters obtained by past analyses stored in past data storage unit 124, in which relationship 511 between circuit impedance Z and drive speed is obtained and graphed as in graph 510. When the circuit impedance in a certain drive range is specified as missing information by missing information identification unit 122, complementary parameter generation unit 123 obtains data on the change range of impedance Z in specified drive range 512 from graph 510 and sends the result to component parameter extraction unit 121. This allows the data on the change range of impedance Z in specified drive range 512, which was not obtained from component data specification 220, to be supplemented as component data, and component parameter extraction unit 121 can generate a component model.

[0042] FIG. 6 shows a case where information with a range of characteristic variation 611 is obtained for a graph 610 of actual measurement data measured on the relationship between the frequency of an electronic device and currency characteristics from data accumulated by the complementary parameter generation unit 123 in the past data accumulation unit 124.

[0043] According to this embodiment, it is determined whether modeling is possible from the component data sheet, and if information is insufficient, the missing information is identified by the missing information identifying unit, information corresponding to the missing information is predicted from past data by the characteristic trend predicting unit, and the missing information is supplemented with this predicted information to generate a component model. Therefore, even if the component data sheet is lacking some of the information necessary for modeling, it is possible to realize analysis and design by supplementing the missing component information by providing the parameters necessary for the analysis model. [Example]

[0044] Next, an example in which the design support device 10 described in the first embodiment is applied to a conduction noise analysis model of a power converter (inverter) will be described as a second embodiment.

[0045] First, corresponding to S21 in the flowchart of FIG. 2 described in the first embodiment, data of a conduction noise analysis model of a power conversion device (inverter) is input as design, structure, and control data 210 from the data input unit 200 in FIG.

[0046] Next, in response to S22, the structural model generation unit 110 of the calculation unit 100 extracts necessary parameters and generates a structural model 700 for conducting noise analysis of a power conversion device, as shown in FIG. 7, which includes a LISN (Line Impedance Stabilization Network: pseudo power circuit network) 710, a Y capacitor 720, an IGBT 730 as a power module, and a load 740, with these connected by a DC cable 750, a bus bar 760, and an AC cable 770, and the Y capacitor 720 and the IGBT 730 are connected to the ground by a ground strap 780.

[0047] Meanwhile, corresponding to S23 in the flowchart of Fig. 2, information on component data specifications 220 is input from data input unit 200 of Fig. 1 to component model generation unit 120. For example, when the target component is an IGBT 703, the information on component data specifications 220 to be input to component model generation unit 120 includes component parameters including dv / dt (switching transient characteristics) 801, parasitic inductance Lpar: 802, parasitic capacitance Cpar: 803, etc., as shown in component model required parameters 810 of Fig. 8.

[0048] Next, in response to S24, the part model generation unit 120, which has inputted the information of the part data specification 220, generates a part model.

[0049] Figure 9 shows an example of a component model in which a configuration of an IGBT 730 in a structural model 700 for conducting noise analysis of a power conversion device shown in Figure 7 is created, with parasitic inductances Lpar,d:732 and Lpar,a:733 and parasitic capacitances Cpar,d:734 and Cpar,a:735 before and after a noise source model Vcm:731 that reflects dv / dt:801.

[0050] In the flowchart shown in FIG. 3 which shows the detailed steps of S24, if the part parameter extraction unit 121 of the part model generation unit 120 determines that there are insufficient part model parameters to be extracted in step S242 compared to the necessary parameters of the part model extracted in step S241, the missing information identification unit 122 lists the missing part model parameters in S244.

[0051] Next, in response to S245, the complementary parameter generating unit 123 generates the missing parameters.

[0052] For example, if the missing parameter is dv / dt: 801 of IGBT730, the switching time t: 1011 and the emitter-collector voltage V in the past part specifications can be calculated from the past data for each part as shown in FIG. 10 stored in the past data storage unit 124. CE :10122, which can be roughly calculated.

[0053] Also, the required emitter-collector voltage V CE Since the breakdown voltage value of t:10122 differs depending on the application of the IGBT 730, for an IGBT that meets the required conditions such as the breakdown voltage value and maximum Ic, other parameters such as the switching time t:1011 can be stored and accumulated in the past data accumulation unit 124 for multiple IGBTs of the same type, and the switching time t:1011 of the next-generation product can be predicted as a physical property trend.

[0054] However, when the missing parameters are the parasitic inductance Lpar:802 or the parasitic capacitance Cpar:803 in Figure 8, they are often not described in the specifications, so the physical property trend is predicted from the past measurement data of the parasitic inductance Lpar:1013 and the parasitic capacitance Cpar:1014 stored in the past data storage unit 124 as described in Example 1 using Figures 4 and 5.

[0055] The LISN 710, Y capacitor 720, and load 740 can also be processed in the same manner as in the case of the IGBT 730 described above to create component models.

[0056] That is, when the component parameter extraction unit 121 determines that there is a shortage of component model parameters in the component data specification 220 of the LISN 710, or the Y capacitor 720, or the load 740 input from the data input unit 200, the missing information identification unit 122 identifies the missing information, the complementary parameter generation unit 123 creates the component model parameters that are found to be missing using related past data accumulated in the past data accumulation unit 124, and the component model creation unit 125 creates a component model of the LISN 710, or the Y capacitor 720, or the load 740.

[0057] 11 shows the component models thus created in the step corresponding to S24 in FIG. 2, including (a) a component model 1110 of LISN 710 comprising inductance Lisn: 1111 and capacitance 1112, (b) a component model of Y capacitor 720 comprising inductance Ly: 1121 and capacitance Cy: 1122, (c) a component model 1130 of IGBT 730 comprising noise source model Vcm: 1131, parasitic inductances Lpar,d: 1132 and Lpar,a: 1133, and parasitic capacitances Cpar,d: 1134 and Cpar,a: 1135, and (d) a component model 1140 of load 740 comprising capacitance Cload: 1141.

[0058] Next, corresponding to step S25 in Fig. 2, a conduction noise analysis model of the power conversion device (inverter) is constructed by the analysis model construction unit 130 in Fig. 1, and the conduction noise is analyzed. Fig. 12 shows the configuration of a conduction noise analysis model 1200 of the power conversion device (inverter) created in this example.

[0059] The conduction noise analysis model 1200 of the power conversion device (inverter) is constructed by combining, in the analysis model construction unit 130, the component models 1110, 1120, 1130, and 1140 shown in (a) to (d) of Figure 11 which are generated by the component model generation unit 120, and the DC cable 750, bus bar 760, AC cable 770, and ground strap 780 in the structural model described in Figure 7 which are generated by the structural model generation unit 110.

[0060] Using the conduction noise analysis model 1200 of the power conversion device (inverter) constructed in this manner, the analysis result determination unit 140 performs a conduction noise analysis (S25), determines the performance by determining whether the analysis result of the conduction noise voltage satisfies the noise tolerance value (S26), and outputs the performance evaluation result 310 from the output unit 300 (S27).

[0061] 13 shows an example of performance evaluation result 310 output from output unit 300, in which graph 1300 is shown the relationship between voltage Vlisn:1320 of conducted noise amount (conducted noise voltage) 1310 and frequency 1330, and the relationship with noise tolerance 1340. Fig. 13 shows that the conducted noise amount (conducted noise voltage) 1310 is smaller than noise tolerance 1340 within a predetermined frequency range 1330, and the conducted noise of the power conversion device (inverter) satisfies the predetermined performance.

[0062] According to this embodiment, when conducting noise analysis of a power conversion device (inverter), even if there is insufficient information to model the component data, it is possible to generate a component model by predicting information corresponding to the insufficient information from past data and supplementing the insufficient information with this predicted information, so that it is possible to supplement the insufficient component information and perform conducted noise analysis of the power conversion device (inverter). [Example]

[0063] A third embodiment of the present invention will be described with reference to Figures 14 to 17. Components common to the first and second embodiments are given the same part numbers, and descriptions thereof will be omitted.

[0064] 14 differs from the design support device 10 in the first embodiment in that the calculation unit 100 of the design support device 10 in the first embodiment is replaced with a calculation unit 1410, and the output unit 300 of the first embodiment is replaced with an output unit 1430. In the calculation unit 1410, the analysis result determination unit 140 of the first embodiment is replaced with an analysis result determination unit 1440. The configuration and operation of the part model generation unit 120 are the same as those in the first embodiment, and therefore a description thereof will be omitted.

[0065] In the first embodiment, the analytical model constructed by the analytical model construction unit 130 is analyzed by the analytical result determination unit 140 to determine its performance, and the result is output from the output unit 300. However, in the present embodiment, if the analytical model constructed by the analytical model construction unit 130 is analyzed by the analytical result determination unit 1440 to determine its performance and it is determined that the predetermined performance is not satisfied, the design, structure, and control data 210 and the part data specification 220 input from the data input unit 200 to the calculation unit 1410 are updated, and the analytical model construction unit 130 constructs and evaluates the analytical model again. This process is repeated until it is determined that the analysis result of the analytical model satisfies the predetermined performance, and the output unit 1450 outputs the finally obtained performance evaluation result and the corresponding updated design and structure control data as performance evaluation and design update data 40.

[0066] The flow of processing in this embodiment is shown in Fig. 15. In Fig. 15, steps S1501 to S1505 are the same as steps S21 to S25 of the processing described in the first embodiment with reference to Fig. 2.

[0067] In S1506, the analytical model constructed by the analytical model constructing unit 130 is analyzed by the analytical result determining unit 140, and it is determined whether the analytical result satisfies predetermined performance.

[0068] If it is determined that the analysis results do not satisfy the predetermined performance (No in S1506), the design and structure control data in the data input unit 200 and the corresponding data in the part data specification 220 are updated based on preset conditions (S1508), and the process returns to S1501 where this updated design and structure control data is input again to the structural model generation unit 110, and also returns to S1503 where the updated data in the part data specification 220 is input again to the part model generation unit 120, and the processing of steps S1502, S1504 and subsequent steps is repeatedly executed until Yes is determined in S1506.

[0069] On the other hand, if it is determined that the analysis results satisfy the predetermined performance (Yes in S1506), this determination result is sent to the output unit 1450 in a performance evaluation result output step (S1507) and output as performance evaluation / design update data 40.

[0070] FIG. 16 shows an example of a case where the analysis result is determined not to satisfy the predetermined performance (No in S1506) when the analysis target is the conduction noise of the power conversion device (inverter) as described in Example 2.

[0071] As in Example 2, Figure 16 shows the results of conducting noise analysis performed by the analysis result determination unit 1440 using the conducted noise analysis model 1200 of the power conversion device (inverter) constructed by the analysis model construction unit 130, and shows in graph 1600 the relationship between the voltage Vlisn:1620 of the conducted noise amount (conducted noise voltage) 1610 and the frequency 1630, as well as the relationship with the noise tolerance value 1640.

[0072] FIG. 16 shows that within a predetermined frequency range 1630, the amount of conducted noise (conducted noise voltage) 1610 exceeds the noise tolerance value 1640 in an area 1659, and the conducted noise of the power conversion device (inverter) does not meet the predetermined performance.

[0073] In this way, if the analysis result of the conducted noise voltage Vlisn shows that it does not satisfy the noise tolerance value 1640, the design, structure, and control data 210 and the component data specification 220 input from the data input unit 200 are updated, and the processing from S1510 and S1503 is repeated.

[0074] 17, when changing the Y capacitor 720 used for noise removal, the component model 1120 of the Y capacitor 720 having the inductance Ly: 1121 and capacitance Cy: 1122 recorded in the component data specification 220 used in the initial analysis is updated to a new component model 1720 having the inductance Ly2: 1721 and capacitance Cy2: 1722 also recorded in the component data specification 220, and the processes from S1510 to S1503 are repeated. This process is repeated until the analysis result of the conducted noise voltage Vlisn satisfies the noise tolerance value 1640, thereby making it possible to reliably select a replacement component that guarantees the specified performance for the conducted noise of the power conversion device (inverter).

[0075] According to this embodiment, in addition to the effects described in the first embodiment, even when alternative components are used, it is possible to reliably select alternative components that will ensure predetermined performance as a circuit system using electronic components.

[0076] The invention made by the inventor has been specifically described above based on the embodiments, but it goes without saying that the present invention is not limited to the above embodiments and can be modified in various ways without departing from the spirit of the invention. For example, the above embodiments have been described in detail to clearly explain the present invention, and the present invention is not necessarily limited to those having all of the described configurations. Furthermore, it is possible to add, delete, or replace part of the configuration of each embodiment with other configurations. [Explanation of symbols]

[0077] 10,1400 Design support equipment 100,1410 Arithmetic unit 110 Structural model generation unit 120 Part model generation unit 121 Part parameter extraction unit 122 Missing Information Identification Department 123 Complementary parameter generation unit 124 Past Data Storage Unit 125 Parts Model Creation Department 130 Analysis Model Construction Department 140,1440 Analysis result judgment section 200 Data Entry Section 300,1450 Output section

Claims

1. an input unit for inputting design and structure data of a circuit system and component data; a calculation unit that creates a component model from the component data input from the input unit, and processes the component model and the design / structure data to evaluate the performance of the circuit system; an output unit that outputs the result of the performance evaluation of the circuit system by the calculation unit; A design support device comprising: the calculation unit includes a component model generation unit that, when the component data input from the input unit lacks a portion of data necessary for evaluating the performance of the circuit system, generates complementary data to complement the missing data, and generates the component model using the component data input from the input unit and the complementary data; The part model generation unit a missing information identifying unit that identifies missing data that is missing from the component data input from the input unit among data necessary for evaluating the performance of the circuit system; a storage unit that stores past data related to the circuit system; a complementary parameter generating unit that generates complementary data corresponding to the missing data identified by the missing information identifying unit using the past data stored in the storage unit; a part model creation unit that creates the part model using the part data input from the input unit and the complementary data created by the complementary parameter generation unit; A design support device comprising:

2. A design support device according to claim 1, the complementary parameter generation unit predicts a property trend corresponding to the missing data identified by the missing information identification unit from the past data stored in the storage unit, and generates the complementary data based on the predicted property trend.

3. Using a design support device equipped with an input unit, a calculation unit, and an output unit, inputting design and structure data of a circuit system and component data from the input unit; creating a part model in the calculation unit from the part data input from the input unit; the calculation unit processes the component model and the design / structure data to evaluate the performance of the circuit system; A design support method for outputting a result of evaluation of performance of the circuit system from the output unit, when the data of the component input from the input unit when creating the component model in the calculation unit lacks a portion of data necessary for evaluating the performance of the circuit system, generate complementary data to complement the lacking data, and create the component model using the data of the component input from the input unit and the complementary data; generating the part model; Identifying missing data that is missing from the component data input from the input unit among data necessary for evaluating the performance of the circuit system in the component data; creating the complementary data corresponding to the identified missing data using past data stored in a storage unit that accumulates past data related to the circuit system; The part model is created using the part data and the complementary data input from the input unit. A design support method characterized by being performed by

4. A design support method according to claim 3, A design support method characterized in that generating the complementary data comprises predicting a property trend corresponding to the identified missing data from the past data stored in the storage unit, and generating the complementary data based on the predicted property trend.

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