Measuring device and measuring method

Abstract

To achieve a measurement device that enables highly accurate synchronous detection, while reducing costs.SOLUTION: A measurement device 100 has: an electric current generation circuit 1 that generates an AC constant electric current corresponding to a reference signal Ss having a prescribed frequency, and supplies the constant electric current to a measurement object 200; a voltage detection circuit 2 that detects a voltage v generating in the measurement object 200; a signal generation circuit 3 that detects an electric current i flowing to the measurement object 200, and generates a two-value signal Sip synchronous with the electric current i; a first synchronous detection unit 6 that performs synchronous detection of the voltage v based on the reference signal Ss, and calculates amplitude |V| of the voltage v and a voltage phase difference φv; a second synchronous detection unit 7 that performs the synchronous detection of the two-value signal Sip based on the reference signal Ss, and calculates an electric current phase difference φi; and a computation unit 8 that calculates an electric characteristic of the measurement object based on the amplitude |V| and voltage phase difference φv of the voltage, the electric current phase difference φi, and amplitude |I| of the electric current.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a measuring device and a measuring method, for example, a measuring device and a measuring method for measuring electrical characteristics of a measurement object. [Background technology]

[0002] Conventionally, measuring devices such as LCR meters, C meters, and battery testers are known that measure electrical characteristics such as impedance of a measurement object (hereinafter also referred to as a "DUT: Device Under Test") using synchronous detection (see Patent Document 1). [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2020-76600 A Summary of the Invention [Problem to be solved by the invention]

[0004] Conventionally, the following two methods are known as synchronous detection methods used in measuring instruments.

[0005] The first method converts the current flowing through the DUT and the voltage generated in the DUT when a signal is applied to the DUT into digital signals, and performs synchronous detection through digital signal processing using an FPGA (Field Programmable Gate Array), MCU (Micro Controller Unit), etc. Hereinafter, this first method is also referred to as "digital synchronous detection."

[0006] The second method performs synchronous detection by frequency-modulating the voltage generated in the DUT when a current is applied to the DUT based on a reference signal synchronized with the current flowing through the DUT. Hereinafter, this second method will also be referred to as "analog synchronous detection."

[0007] Specifically, analog synchronous detection applies a constant sinusoidal current to the DUT, detects the voltage generated across the DUT, and generates a voltage signal. At the same time, a square-wave reference signal corresponding to the current flowing through the DUT is generated. Next, the voltage signal generated across the DUT is multiplied by -1 to generate a signal. Both the voltage signal generated across the DUT and the multiplied signal are input to a two-input, one-output switch. The switch's output is then alternately switched between the two inputs according to the reference signal, modulating the frequency component of the reference signal to a DC component. The switch's output signal is then passed through a low-pass filter. This performs synchronous detection of the voltage signal generated across the DUT and the reference signal, yielding |V|cosθ, which is proportional to the amplitude of the frequency component of the voltage signal generated across the DUT and the cosθ of the phase difference θ between the reference signal and the voltage signal. This yields the DUT impedance measurement result, R = |V| / |I| × cosθ.

[0008] However, with digital synchronous detection, it is necessary to measure not only the voltage generated in the DUT but also the current flowing through the DUT and perform A / D conversion. Therefore, achieving high-precision A / D conversion poses the problem of increased development costs, such as the need for expensive components, a large mounting area, and increased development man-hours. Furthermore, in cases where electrical isolation is required between the circuit generating the current applied to the DUT and the calculation circuit, as in a battery tester, the A / D converted data, which contains a large amount of information, must be transmitted to the CPU in an electrically isolated state, complicating the communication circuit.

[0009] On the other hand, in the case of analog synchronous detection, the reference signal used for synchronous detection is a rectangular wave and contains harmonic components. Therefore, when switching is performed by a lock-in amplifier, the harmonic components of the reference signal are also modulated to DC, which poses a problem of reduced impedance measurement accuracy. Furthermore, because the reference signal is generated from a current, which is an analog signal, a phase adjustment circuit (analog circuit) is required to adjust the phase of the reference signal. This also leads to problems such as expensive components and a large mounting area, which increases development costs.

[0010] The present invention has been made in view of the above-mentioned problems, and has as its object to realize a measuring device that is capable of highly accurate synchronous detection while suppressing costs. [Means for solving the problem]

[0011] A test apparatus according to a representative embodiment of the present invention is characterized by comprising: a current generation circuit that generates a constant AC current corresponding to a reference signal having a predetermined frequency and supplies the current to a measurement object; a voltage detection circuit that detects the voltage generated in the measurement object; a signal generation circuit that detects the current flowing through the measurement object and generates a binary signal synchronized with the detected current; a first synchronous detection unit that performs synchronous detection of the voltage detected by the voltage detection circuit based on the reference signal and calculates the amplitude of the voltage and a voltage phase difference that is the phase difference between the voltage and the reference signal; a second synchronous detection unit that performs synchronous detection of the binary signal based on the reference signal and calculates a current phase difference that is the phase difference between the current flowing through the measurement object and the reference signal; and a calculation unit that calculates the electrical characteristics of the measurement object based on the voltage amplitude and the voltage phase difference calculated by the first synchronous detection unit, the current phase difference calculated by the second synchronous detection unit, and the amplitude of the current flowing through the measurement object. [Effects of the Invention]

[0012] The measuring device according to the present invention makes it possible to perform highly accurate synchronous detection while keeping costs down. [Brief explanation of the drawings]

[0013] [Figure 1] 1 is a diagram showing a configuration of a measurement device according to an embodiment of the present invention. [Figure 2] 10A and 10B are diagrams for explaining a method for generating a current phase signal by a signal generating circuit. [Figure 3] 3 is a flowchart showing a flow of impedance measurement by the measurement device according to the embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0014] 1. Overview of the embodiment First, a typical embodiment of the invention disclosed in this application will be outlined. In the following description, for example, reference numerals in the drawings corresponding to components of the invention are written in parentheses.

[0015] [1] A measuring device (100) according to a representative embodiment of the present invention includes a current generating circuit (1) that generates a constant AC current corresponding to a reference signal (Ss) having a predetermined frequency and supplies the current to a measuring object (200), a voltage detecting circuit (2) that detects a voltage generated in the measuring object, a signal generating circuit (3) that detects a current flowing in the measuring object and generates a binary signal (Sip) synchronized with the detected current, and a voltage detecting circuit (4) that performs synchronous detection of the voltage detected by the voltage detecting circuit based on the reference signal and detects the amplitude (|V|) of the voltage and the phase of the voltage and the reference signal. a second synchronous detection unit (7) that performs synchronous detection of the binary signal based on the reference signal and calculates a current phase difference (φi) that is the phase difference between the current flowing through the object to be measured and the reference signal; and a calculation unit (8) that calculates the electrical characteristics of the object to be measured based on the voltage amplitude and the voltage phase difference calculated by the first synchronous detection unit, the current phase difference calculated by the second synchronous detection unit, and the amplitude (|I|) of the current flowing through the object to be measured.

[0016] [2] The measuring device described in [1] above may further include a communication circuit (13) that transmits and receives signals between a first circuit side including the signal generating circuit and a second circuit side including the first synchronous detection unit, the second synchronous detection unit, and the calculation unit while electrically isolating the first circuit side and the second circuit side.

[0017] [3] In the measuring device described in [1] or [2] above, the signal generating circuit may compare a voltage signal (Si) obtained by converting the current flowing through the object to be measured into a voltage with a reference voltage, and generate the binary signal according to the comparison result.

[0018] [4] In the measuring device described in any one of [1] to [3] above, the first synchronous detection unit may multiply a digital signal of the voltage detected by the voltage detection circuit by a digital signal representing the reference signal, and may multiply the digital signal of the voltage detected by the voltage detection circuit by a digital signal whose phase is shifted by 90° from the reference signal, thereby calculating the voltage amplitude and the voltage phase difference; and the second synchronous detection unit may multiply the binary signal by a digital signal representing the reference signal, and may multiply the binary signal by a digital signal whose phase is shifted by 90° from the reference signal, thereby calculating the current phase difference.

[0019] [5] A measurement method according to a representative embodiment of the present invention is characterized by including: a first step (S5) of calculating, based on a reference signal having a predetermined frequency, a voltage generated in an object to be measured when the object is supplied with an AC constant current corresponding to the reference signal, by performing synchronous detection on the reference signal, thereby calculating an amplitude of the voltage and a voltage phase difference, which is the phase difference between the voltage and the reference signal; a second step (S6) of calculating, based on the reference signal, a binary signal synchronized with a current flowing in the object to be measured when the constant current is supplied to the object to be measured, by performing synchronous detection on the reference signal, thereby calculating a current phase difference, which is the phase difference between the current flowing in the object to be measured and the reference signal; and a third step (S7) of calculating electrical characteristics of the object to be measured based on the voltage amplitude and the voltage phase difference calculated in the first step and the current phase difference calculated in the second step.

[0020] 2. Specific examples of embodiments Hereinafter, specific examples of embodiments of the present invention will be described with reference to the drawings. In the following description, components common to the embodiments will be designated by the same reference numerals, and repeated description will be omitted.

[0021] FIG. 1 is a diagram showing the configuration of a measurement device 100 according to an embodiment of the present invention. 1 is a device for measuring the electrical characteristics of a device under test (hereinafter also referred to as "DUT") 200. Examples of the measuring device 100 include an LCR meter or capacitance meter capable of measuring impedance using a four-terminal method, and a battery tester for measuring battery characteristics. Note that the measuring device 100 is not limited to the above examples as long as it is a device capable of measuring the electrical characteristics such as the impedance of the DUT 200.

[0022] As shown in Figure 1, the measuring device 100 has external terminals HC, LC, HP, and LP, a current generating circuit 1, a voltage detecting circuit 2, a signal generating circuit 3, an A / D converting circuit 4, a data processing control device 5, a D / A converting circuit 10, an output unit 11, an operating unit 12, and a communication circuit 13.

[0023] The external terminals HC, LC, HP, and LP are terminals for connecting the DUT 200. For example, one terminal of the DUT 200 is connected to the external terminals HC and HP as high-side terminals, and the other terminal of the DUT 200 is connected to the external terminals LP and LC as low-side terminals. Note that, in this embodiment, a case where the DUT 200 is measured by the four-terminal method using the external terminals HC, LC, HP, and LP will be described as an example, but the present invention is not limited to this, and the DUT 200 may also be measured by the two-terminal method.

[0024] For example, the measuring device 100 applies an AC signal or the like between the external terminals HC, HP and LP, LC of the DUT 200 connected between the external terminals HC, HP and LP, LC, detects the voltage v generated between the external terminals HP and LP at that time, and the current i flowing from the external terminal HC via the DUT 200 to the external terminal LC, and measures the impedance of the DUT 200 based on the detected voltage v and current i.

[0025] The current generating circuit 1 is a circuit that generates an AC signal to be supplied to the DUT 200 in order to measure the impedance of the DUT 200. Specifically, the current generating circuit 1 is a constant current source circuit that generates an AC constant current corresponding to a reference signal Ss having a predetermined frequency and supplies the AC constant current to the DUT 200.

[0026] The current generating circuit 1 generates, for example, an AC constant current signal synchronized with the reference signal Ss based on the data of the reference signal Ss output from the data processing control device 5 described later.

[0027] Here, the reference signal Ss is a signal that serves as a reference in synchronous detection, which will be described later, and has a predetermined frequency f and a predetermined amplitude. The reference signal Ss is, for example, a sine wave signal. For example, the data processing control device 5 outputs a digital signal (data) representing the sine wave signal as the reference signal Ss, and the D / A conversion circuit 10 converts the digital signal into an analog signal (voltage) and supplies it to the current generation circuit 1. The current generation circuit 1 generates an AC current having a frequency and amplitude corresponding to the input analog signal. Specifically, the current generation circuit 1 generates a constant current (i=|I| sin(2πft)) having a frequency f synchronized with the reference signal Ss and a constant amplitude |I|, and supplies it to the DUT 200.

[0028] The voltage detection circuit 2 is connected to the external terminals HP and LP, respectively, and detects the voltage v between the external terminals HP and LP. The voltage detection circuit 2 has, for example, an operational amplifier, and amplifies the detected voltage between the external terminals HP and LP using the operational amplifier, and outputs it as a voltage signal.

[0029] The A / D conversion circuit 4 samples the voltage v detected by the voltage detection circuit 2 at a predetermined sampling period (for example, a period sufficiently shorter than the period of the constant current signal output from the current generation circuit 1) to convert the voltage v into a digital signal and output it as voltage data. The A / D conversion circuit 4 may be realized by electronic components different from the data processing control device 5 described later, or may be realized by an A / D converter provided as a peripheral circuit in the data processing control device 5.

[0030] The signal generating circuit 3 is a circuit that generates a signal according to a current i flowing through the DUT 200. The signal generating circuit 3 detects the current i flowing through the DUT 200 and generates a binary signal synchronized with the current i.

[0031] For example, the current generating circuit 1 has a sense resistor R connected in series with the external terminals HC, LC, and the DUT 200, and the sense resistor R converts the current i flowing through the DUT 200 into a voltage to generate a voltage signal Si. The signal generating circuit 3 generates a binary signal based on the voltage signal Si and outputs it as a current phase signal Sip. The signal generating circuit 3 can be, for example, a known comparator circuit that compares two voltages and outputs a binary comparison result.

[0032] FIG. 2 is a diagram for explaining a method for generating the current phase signal Sip by the signal generating circuit 3. As shown in FIG.

[0033] 2, the signal generating circuit 3 compares a voltage signal Si obtained by converting a current i flowing through the DUT 200 into a voltage with a reference voltage (e.g., 0 V), and generates a binary signal according to the comparison result. The binary signal generated in this manner is synchronized with the phase of the current i flowing through the DUT 200, and is output as a current phase signal Sip.

[0034] The communication circuit 13 is a circuit that transmits and receives signals between circuits. For example, in the measurement device 100, a first circuit side including the current generating circuit, the signal generating circuit 3, and the D / A conversion circuit 10 and a second circuit side including the data processing device 5 (a first synchronous detection unit 6, a second synchronous detection unit 7, a calculation unit 8, and a storage unit 9, which will be described later) have different power supply voltages and ground voltages. The communication circuit 13 transmits and receives signals between the first circuit side and the second circuit side while electrically insulating them from each other.

[0035] For example, the communication circuit 13 transmits the reference signal Ss output from the data processing control device 5 to the D / A conversion circuit 10 while the data processing control device 5 and the D / A conversion circuit 10 are electrically isolated from each other. Furthermore, the communication circuit 13 transmits the current phase signal Sip generated by the signal generation circuit 3 to the data processing control device 5 (second synchronous detection unit 7) while the signal generation circuit 3 and the data processing control device 5 are electrically isolated from each other. Examples of the communication circuit 13 include a circuit using capacitive coupling or magnetic coupling such as a digital isolator, and a circuit using optical communication such as a photocoupler.

[0036] The operation unit 12 is an input interface that allows the user to operate the measurement apparatus 100. Examples of the operation unit 12 include various buttons and a touch panel. For example, by operating the operation unit 12, the user can set various measurement conditions for measuring the DUT 200 in the measurement apparatus 100 and instruct the measurement apparatus 100 to start and stop the measurement.

[0037] The data processing control device 5 is a functional unit that comprehensively controls each functional unit within the measuring device 100. The data processing control device 5 is a device capable of digital signal processing. Examples of the data processing control device 5 include an MCU or FPGA as a program processing device having a processor such as a CPU, a storage device such as a ROM, RAM, or flash memory, and peripheral circuits such as a timer.

[0038] The data processing control device 5 has, as functional units for measuring electrical characteristics, a first synchronous detection unit 6, a second synchronous detection unit 7, an arithmetic unit 8, and a memory unit 9. These functional blocks are realized, for example, in a program processing device serving as the data processing control device 5, by a processor executing various arithmetic processes in accordance with programs stored in a memory device and controlling peripheral circuits.

[0039] The storage unit 9 is a functional unit that stores the calculation formulas and various parameters required to measure the electrical characteristics of the DUT 200, the calculation results by the calculation unit 8, and the like.

[0040] The first synchronous detection unit 6 is a functional unit that performs synchronous detection of the voltage v generated in the DUT 200 and the reference signal Ss. The first synchronous detection unit 6 performs synchronous detection of the voltage v detected by the voltage detection circuit 2 based on the reference signal Ss, and calculates the amplitude |V| of the voltage v and the voltage phase difference φv, which is the phase difference between the voltage v and the reference signal Ss.

[0041] More specifically, the first synchronous detection unit 6 calculates |V|cosφv by multiplying the digital signal of the voltage v detected by the voltage detection circuit 2 by a digital signal representing the reference signal Ss. The first synchronous detection unit 6 also calculates |V|sinφv by multiplying the digital signal of the voltage v detected by the voltage detection circuit 2 by a digital signal whose phase is shifted by 90° with respect to the reference signal Ss. The first synchronous detection unit 6 then calculates the amplitude |V| of the voltage v and the voltage phase difference φv based on |V|cosφv and |V|sinφv.

[0042] The calculated information on the amplitude |V| of the voltage v and the voltage phase difference φv is input to the calculation unit 8. The information on the amplitude |V| of the voltage v and the voltage phase difference φv may be stored in the storage unit 9.

[0043] The second synchronous detection unit 7 is a functional unit that performs synchronous detection of the current i flowing through the DUT 200 and the reference signal Ss. The second synchronous detection unit 7 performs synchronous detection of the current phase signal Sip, which is a binary signal generated by the signal generation circuit 3, based on the reference signal Ss, and calculates a current phase difference φi, which is the phase difference between the current i flowing through the DUT 200 and the reference signal Ss.

[0044] More specifically, the second synchronous detector 7 calculates |Ix|cosφi by multiplying the current phase signal Sip by a digital signal representing the reference signal Ss. The second synchronous detector 7 also calculates |Ix|sinφi by multiplying the current phase signal Sip by a digital signal whose phase is shifted by 90° with respect to the reference signal Ss. The second synchronous detector 7 then calculates the current phase difference φi based on |Ix|cosφi and |Ix|sinφi.

[0045] The information on the current phase difference φi is input to the calculation unit 8. The information on the current phase difference φi may be stored in the storage unit 9.

[0046] Here, the current amplitude |Ix| obtained by synchronous detection by the second synchronous detection unit 7 does not represent the amplitude of the current i flowing through the DUT 200. This is because the current phase signal Sip, which is the target of synchronous detection, is a binary signal that does not contain information about the amplitude of the current i, but only about the phase of the current i. Therefore, the second synchronous detection unit 7 does not output the current amplitude |Ix|, but only outputs the current phase difference φi.

[0047] The calculation unit 8 is a functional unit that controls each functional unit in the measurement apparatus 100. For example, in response to a user's operation of the operation unit 12, the calculation unit 8 outputs data of the reference signal Ss, thereby instructing the current generating circuit 1 to apply a current to the DUT 200 and instructing the first synchronous detection unit 6 and the second synchronous detection unit 7 to perform digital calculations related to synchronous detection.

[0048] The calculation unit 8 also calculates the electrical characteristics of the DUT 200. Specifically, the calculation unit 8 calculates the impedance of the DUT 200 based on the voltage amplitude |V|, the voltage phase difference φv, the current phase difference φi, and the amplitude |I| of the current i flowing through the DUT 200.

[0049] Here, the amplitude |I| of the current i flowing through the DUT 200 is a known value. That is, the current i flowing through the DUT 200 has the same amplitude and frequency as the constant current generated by the current generating circuit 1 based on the reference signal Ss. That is, the amplitude |I| of the current i is a constant value regardless of the impedance of the DUT 200. Therefore, the value of the amplitude |I| of the current i may be stored in advance in the storage unit 9 as the current information 90.

[0050] The amplitude |I| of the current i is determined according to the reference signal Ss. Therefore, if the data of the reference signal Ss can be changed by the user, the calculation unit 8 may update the value of the amplitude |I| of the current i (current information 90) stored in the storage unit 9 according to the change in the data of the reference signal Ss.

[0051] The calculation unit 8 performs calculations using the current information 90 stored in the memory unit 9, the voltage amplitude |V| and voltage phase difference φv calculated by the first synchronous detection unit 6, and the current phase difference φi calculated by the second synchronous detection unit 7 to calculate impedance information of the DUT 200, such as |Z|=|V| / |I| and phase θ=φv-φi, and stores this information in the memory unit 9 and provides it to the output unit 11.

[0052] The output unit 11 is a functional unit for outputting various information such as measurement conditions and measurement results in the measurement device 100. The output unit 11 is, for example, a display device equipped with an LCD (Liquid Crystal Display) or an organic EL. For example, when a user inputs an instruction to measure the impedance of the DUT 200 into the operation unit 12, the output unit 11 displays information about the impedance of the DUT 200 calculated by the calculation unit 8 on the screen.

[0053] The output unit 11 may be a display device equipped with a touch panel that realizes some of the functions of the operation unit 12. The output unit 11 may also include a communication circuit or the like that outputs data such as measurement results to the outside via a wired or wireless connection.

[0054] Next, the flow of impedance measurement by the measurement device 100 according to this embodiment will be described.

[0055] FIG. 3 is a flowchart showing the flow of impedance measurement by the measurement device 100 according to one embodiment of the present invention.

[0056] For example, when a user operates the operation unit 12 to issue an instruction to measure the impedance of the DUT 200, the calculation unit 8 outputs data of the reference signal Ss (for example, sine wave data) (step S1).

[0057] Next, the D / A conversion circuit 10 converts the data of the reference signal Ss output from the calculation unit 8 and received via the communication circuit 13 into an analog signal (voltage), and the current generation circuit 1 generates a constant current based on the analog signal converted by the D / A conversion circuit 10 and supplies it to the DUT 200 (step S2).

[0058] Next, the voltage detection circuit 2 detects the voltage v generated in the DUT 200, and the A / D conversion circuit 4 converts the detected voltage v into a digital signal (step S3). Furthermore, the signal generation circuit 3 generates a current phase signal Sip (binary signal) according to the current i flowing through the DUT 200 using the method described above, and transmits it to the data processing control device 5 (second synchronous detection unit 7) via the communication circuit 13 (step S4).

[0059] Next, the first synchronous detection unit 6 performs synchronous detection of the voltage v converted into a digital signal in step S3 based on the reference signal Ss using the above-mentioned method (step S5), thereby obtaining the amplitude |V| and voltage phase difference φv of the voltage v generated in the DUT 200.

[0060] The second synchronous detection unit 7 then performs synchronous detection of the current phase signal Sip received in step S4 based on the reference signal Ss using the method described above (step S6), thereby obtaining the current phase difference φi of the current i flowing through the DUT 200.

[0061] Next, the calculation unit 8 calculates the impedance of the DUT 200 (step S7). Specifically, as described above, the calculation unit 8 calculates |Z|=|V| / |I| and phase θ=φv-φi of the DUT 200 based on the amplitude |V| and voltage phase difference φv of the voltage v calculated in step S5, the current phase difference φi of the current i calculated in step S6, and the amplitude |I| of the current i stored in the storage unit 9. Information about the calculated impedance of the DUT 200 is displayed, for example, on the screen of a display device serving as the output unit 11.

[0062] As described above, the measuring apparatus 100 according to this embodiment applies a constant current based on the reference signal Ss to the DUT 200, converts the current i flowing through the DUT 200 at that time into a current phase signal Sip, which is a binary signal containing phase information of the current i, and performs synchronous detection on the current phase signal Sip using the reference signal Ss.

[0063] This eliminates the need for A / D conversion of the detection signal of current i, as is the case with conventional measuring devices that perform digital synchronous detection, and reduces the number of A / D conversion circuits required, thereby reducing increases in development costs, such as the need for expensive components, a large mounting area, and increased development man-hours.

[0064] Here, the current phase signal Sip has phase information of the current i but does not have amplitude information of the current i, so the amplitude |I| of the current i cannot be calculated by synchronous detection of the current phase signal Sip. However, since a constant current with a constant amplitude is applied to the DUT 200 regardless of the impedance of the DUT 200, the amplitude |I| of the current i flowing through the DUT 200 is constant (known) and does not need to be calculated by synchronous detection.

[0065] Furthermore, a sine wave can be used as the reference signal Ss used for synchronous detection in the measurement device 100. This allows for more accurate impedance measurement than in measurement devices that perform conventional analog synchronous detection using a rectangular wave (pulse) as the reference signal, since the reference signal does not contain harmonic components.

[0066] Furthermore, the reference signal Ss can be realized using digital data, rather than being generated from the measurement current, which is an analog signal, as in conventional measuring devices that perform analog synchronous detection. This eliminates the need for a phase adjustment circuit (analog circuit) to adjust the phase of the reference signal, thereby further reducing costs.

[0067] As described above, the measuring device 100 according to this embodiment makes it possible to perform highly accurate synchronous detection while suppressing costs.

[0068] The measuring device 100 may also have a communication circuit 13 that transmits and receives signals between the first circuit side including the signal generating circuit 3 and the D / A conversion circuit 10 and the second circuit side including the data processing control device 5 (first synchronous detection unit 6, second synchronous detection unit 7, and calculation unit 8) while electrically insulating the first circuit side from the second circuit side.

[0069] As described above, the current phase signal Sip is not a data signal with a large amount of information, such as an A / D converted signal, but a simple binary signal containing only phase information. Therefore, even in specifications that require electrical isolation between the circuit generating the current applied to the DUT and the calculation circuit, such as a battery tester, the signal can be transmitted without using a highly accurate communication circuit. This further reduces costs.

[0070] Furthermore, in the measurement apparatus 100 according to this embodiment, the signal generation circuit 3 compares a voltage signal Si obtained by converting a current i flowing through the DUT 200 into a voltage with a reference voltage (0 V), and generates a binary signal according to the comparison result. This allows the signal generation circuit 3 to be realized by a circuit configuration with a relatively simple configuration such as a comparator circuit, thereby making it possible to further reduce costs.

[0071] <<Extension of Embodiment>> The invention made by the inventors of the present application has been specifically described above based on an embodiment, but it goes without saying that the present invention is not limited thereto and can be modified in various ways without departing from the spirit of the invention.

[0072] For example, the above-described flowcharts are examples for explaining the operation, and are not limited to these. That is, the steps shown in each diagram of the flowchart are specific examples, and the present invention is not limited to these flows. For example, the order of some processes may be changed, other processes may be inserted between each process, or some processes may be performed in parallel. [Explanation of symbols]

[0073] 1...current generation circuit, 2...voltage detection circuit, 3...signal generation circuit, 4...A / D conversion circuit, 5...data processing control device, 6...first synchronous detection unit, 7...second synchronous detection unit, 8...calculation unit, 9...memory unit, 10...D / A conversion circuit, 11...output unit, 12...operation unit, 13...communication circuit, HC, LC, HP, LP...external terminals, 90...current information, Si...voltage signal, Sip...current phase signal, Ss...reference signal.

Claims

1. a current generating circuit that generates a constant AC current corresponding to a reference signal having a predetermined frequency and supplies the constant AC current to the object to be measured; a voltage detection circuit for detecting a voltage generated in the object to be measured; a signal generating circuit that detects a current flowing through the object to be measured, synchronizes with the phase of the detected current, and generates a binary signal that does not include information about the amplitude of the current; a first synchronous detection unit that performs synchronous detection on the voltage detected by the voltage detection circuit based on the reference signal, and calculates an amplitude of the voltage and a voltage phase difference that is a phase difference between the voltage and the reference signal; a second synchronous detection unit that performs synchronous detection on the binary signal generated by the signal generation circuit based on the reference signal and calculates a current phase difference that is a phase difference between the current flowing through the object to be measured and the reference signal; a calculation unit that calculates an electrical characteristic of the object to be measured based on the voltage amplitude and the voltage phase difference calculated by the first synchronous detection unit, the current phase difference calculated by the second synchronous detection unit, and the amplitude of a current flowing through the object to be measured, The signal generating circuit compares a voltage signal obtained by converting a current flowing through the object to be measured with a reference voltage, and generates a binary signal representing the binary comparison result. Measuring equipment.

2. 2. The measuring device according to claim 1, The signal generating circuit further includes a communication circuit for transmitting and receiving signals between a first circuit side including the signal generating circuit and a second circuit side including the first synchronous detection unit, the second synchronous detection unit, and the calculation unit in a state where the first circuit side and the second circuit side are electrically insulated from each other. Measuring equipment.

3. a current generating circuit that generates a constant AC current corresponding to a reference signal having a predetermined frequency and supplies the constant AC current to the object to be measured; a voltage detection circuit for detecting a voltage generated in the object to be measured; a signal generating circuit that detects a current flowing through the object to be measured and generates a binary signal synchronized with the detected current; a first synchronous detection unit that performs synchronous detection on the voltage detected by the voltage detection circuit based on the reference signal, and calculates an amplitude of the voltage and a voltage phase difference that is a phase difference between the voltage and the reference signal; a second synchronous detection unit that performs synchronous detection on the binary signal generated by the signal generation circuit based on the reference signal and calculates a current phase difference that is a phase difference between the current flowing through the object to be measured and the reference signal; a calculation unit that calculates an electrical characteristic of the object to be measured based on the voltage amplitude and the voltage phase difference calculated by the first synchronous detection unit, the current phase difference calculated by the second synchronous detection unit, and the amplitude of the current flowing through the object to be measured; a communication circuit for transmitting and receiving signals between a first circuit side including the signal generating circuit and a second circuit side including the first synchronous detection unit, the second synchronous detection unit, and the calculation unit in a state in which the first circuit side and the second circuit side are electrically insulated from each other; Measuring equipment.

4. 4. The measuring device according to claim 3, The signal generating circuit compares a voltage signal obtained by converting a current flowing through the object to be measured with a reference voltage, and generates the binary signal according to the comparison result. Measuring equipment.

5. 5. The measuring device according to claim 1, the first synchronous detection unit multiplies a digital signal of the voltage detected by the voltage detection circuit by a digital signal representing the reference signal, and multiplies the digital signal of the voltage detected by the voltage detection circuit by a digital signal whose phase is shifted by 90° with respect to the reference signal, thereby calculating the amplitude of the voltage and the voltage phase difference; The second synchronous detection unit multiplies the binary signal by a digital signal representing the reference signal, and multiplies the binary signal by a digital signal whose phase is shifted by 90° with respect to the reference signal, thereby calculating the current phase difference. Measuring equipment.

6. a first step of calculating an amplitude of a voltage generated in a measurement object when a constant AC current corresponding to a reference signal having a predetermined frequency is supplied to the measurement object, and calculating a voltage phase difference between the voltage and the reference signal by performing synchronous detection based on the reference signal; a second step of generating a binary signal synchronized with the phase of a current flowing through the object to be measured when the constant current is supplied to the object to be measured, the binary signal not including information on the amplitude of the current; a third step of calculating a current phase difference between the current flowing through the object to be measured and the reference signal by performing synchronous detection on the binary signal generated in the second step based on the reference signal; a fourth step of calculating an electrical characteristic of the object to be measured based on the voltage amplitude and the voltage phase difference calculated in the first step and the current phase difference calculated in the third step, the second step includes a step of comparing a voltage signal obtained by converting a current flowing through the object to be measured into a voltage with a reference voltage, and generating a signal representing a binary comparison result as the binary signal. Measurement method.

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