Control method and measuring device for measuring device

Abstract

To provide a method of controlling a measurement device, and a measurement device.SOLUTION: A method of controlling a measurement device is provided, comprising: causing a controller (110; 200) to receive a request to determine a specific measured value; causing the controller (110; 200) to establish a measurement schedule of steps to be performed for the specific measured value; establishing a parameter list of parameters of the measurement device to be set in order to be able to determine the specific measured value; and causing the controller (110; 200) to output (M3) the established parameter list to a user of the measurement device (100).SELECTED DRAWING: Figure 2

Description

Technical Field

[0001] The present invention relates to a method for controlling a measuring device and a measuring device.

Background Art

[0002] Clarifying the properties of various materials is very important for many applications in research and industry. For this purpose, various measuring devices that provide sometimes very complex measurement processes are used depending on the application.

[0003] In order to ensure the successful completion of the intended measurement, since it is necessary to consider the technical and scientific background of the individual measurement processes, the user who performs these measurements needs a certain amount of expertise.

[0004] As a result, not only the pure measurement time but sometimes a long preparation time is also required to perform the measurement, during which the user of the measuring device to be used must first determine which measurement method to use and how to execute it in order to determine the measured value.

Summary of the Invention

[0005] From such a background, an object of the present invention is to facilitate and make more efficient the use of a measuring device.

[0006] This problem is solved by a method having the features of claim 1 and a measuring device having the features of claim 10.

[0007] Therefore, a method for controlling a measuring device is provided. The method includes receiving, by a controller, a request for determining a specific measured value, establishing, by the controller, a parameter list of parameters set in the measuring device to enable determination of the specific measured value, and outputting, by the controller, the established parameter list to a user of the measuring device.

[0008] Furthermore, a measuring device configured to carry out the method according to the present invention is provided.

[0009] The parameters of a measuring device are understood here to mean any settings that are set on the measuring device or its components and that may affect the measurement being performed. These include factors that may prevail in the sample receiving device of the measuring device during the measurement process, such as temperature and pressure. The parameters of the measuring device may also be information regarding the amount and / or duration of thermal, electrical, and / or mechanical energy supplied during the measurement process of the sample being tested, or information regarding the characteristics of the measurement value of the sample being tested. For example, they can be used when a desired measurement value cannot be measured directly but can only be derived indirectly through the measurement of other characteristics of the sample. In principle, by establishing a parameter list, the controller can specify a process through which a desired measurement value can be determined.

[0010] The fundamental idea of ​​this invention is that the user of the measuring device is assisted by a controller designed for this purpose. The controller informs the user which parameters of the measuring device need to be set, significantly shortening this step during measurement preparation. Output of the parameter list to the user can also be performed during the measurement process, further reassuring the user while the measurement is being performed.

[0011] According to an exemplary embodiment of this method, the requirement for determining a specific measurement further includes information regarding the desired measurement accuracy and / or measurement time. This information is extremely useful for establishing a list of parameters suitable for the measuring device.

[0012] According to an exemplary embodiment of this method, the controller accesses the database when establishing the parameter list. Establishing a suitable parameter list can be advantageously facilitated by a proper configuration of the database.

[0013] In a further development of this method, the database includes multiple pieces of information on material properties and measurement methods, and the controller autonomously establishes the parameter list based on the multiple pieces of information. As a result, the controller can advantageously support multiple virtually possible measurements.

[0014] According to one embodiment of this method, the controller updates the database after the measured value has been determined. As a result, the knowledge gained during the measurement can be used for future measurements.

[0015] According to an exemplary embodiment of this method, the sensor device of the measuring device also provides monitoring of measurement parameters during the determination of the measurement value, and the controller provides evaluation of the monitored measurement parameters. The term "measurement parameters" refers, on the one hand, to the parameters of the measuring device as described above, but may also refer to characteristics such as the temperature of the measuring device itself or its components. As a result, the controller can provide the user with further advantage when determining the measurement value.

[0016] A further development of this method involves the controller issuing a warning if the monitored measurement parameter deviates from the parameter in the established parameter list. As a result, inaccurate measurements can be avoided.

[0017] In a further development of this method, if the monitored measurement parameter deviates from the parameter in the established parameter list, the controller interrupts the determination of the measurement value. As a result, erroneous measurements can be avoided.

[0018] In a further development of this method, if the monitored measurement parameter deviates from the parameter in the established parameter list, the controller autonomously changes the parameter of the measuring device. As a result, inaccurate measurements can be avoided. [Brief explanation of the drawing]

[0019] Hereinafter, the present invention will be described with reference to the drawings. [Figure 1] It is a schematic flowchart of a method according to an exemplary embodiment of the present invention. [Figure 2] It is a schematic diagram of a measuring device according to an exemplary embodiment of the present invention. [Figure 3] It is a schematic diagram of a system including a plurality of measuring devices according to an exemplary embodiment of the present invention.

[0020] In the drawings, the same reference numerals indicate the same or functionally identical components unless otherwise indicated.

Mode for Carrying Out the Invention

[0021] FIG. 1 is a schematic flowchart of a control method M of a measuring device according to an exemplary embodiment of the present invention.

[0022] In the first method step M1, the controller receives a request for determining a specific measurement value. In a further method step M2, the controller establishes a parameter list of the parameters set in the measuring device to enable the determination of the specific measurement value. In a further method step M3, the controller outputs the established parameter list to the user of the measuring device.

[0023] The method M shown below will be described in detail with reference to FIGS. 2 and 3. [[ID=3...]]

[0024] FIG. 2 is a schematic diagram of a measuring device 100 according to an exemplary embodiment of the present invention.

[0025] ... The measuring device 100 includes a controller 110, a database 120, a sensor device 130, an output device 140, an input device 150, and a sample receiving device 160.

[0026] In the exemplary embodiment shown here, the controller 110 is incorporated into the measuring device 100 and is configured to receive a request for determining a specific measured value. This request can be sent to the controller 110 by the user of the measuring device 100, for example, via the input device 150 of the measuring device 100. The input device 150 may include, for example, a keyboard, a touch screen, etc. Alternatively, the request may be sent to the controller 110 via an external interface.

[0027] The controller 110 is further configured to establish a parameter list indicating which parameters of the measuring device should be set in order to be able to determine a specific measured value in response to the received request. For this purpose, the controller 110 can access the database 120, and in this exemplary embodiment, the database 120 is configured in the form of the internal memory of the measuring device 100. The database 120 may include a plurality of information regarding material properties and measurement methods. In this case, the controller autonomously establishes a parameter list based on this plurality of information. During this process, the controller 110 can also determine that the desired measured value cannot be determined at all by the measuring device 100. In this case, instead of the parameter list, a corresponding notification can also be output.

[0028] The controller 110 is further configured to output the established parameter list to the user of the measuring device 100. For example, the output device 140 of the measuring device 100 can be used for this purpose. The output device 140 may include, for example, a screen and / or a speaker for this purpose. For example, the output device 140 and the input device 150 may be combined into a touch screen. Alternatively or additionally, individual components of the measuring device 100, such as the input device 150 and the sample receiving device 160, may be highlighted, for example, by illuminating buttons to be operated.

[0029] In particular, the controller 110 may be configured to update the database 120 after a specific measurement has been performed. The measurement results regarding the material properties of the sample used for the measurement are then recorded, for example, in the database 120 and made available for future measurements and measurement schedules. The predetermined measurement schedule may also be modified in consideration of the measurements that have been performed. The information necessary for this purpose regarding the measurements that have been performed may be transferred to the controller 110 by the user of the measuring device 100. Alternatively or additionally, the controller 110 may directly receive relevant information from the measuring device 100, specifically from the sensor device 130.

[0030] The sensor device 130 is configured to monitor measurement parameters while determining the measurement value. In this case, the controller 110 may be configured to evaluate the monitored measurement parameters. This allows the controller 110 to output a warning if the monitored measurement parameters deviate from the parameters in the established parameter list. Alternatively or additionally, the controller 110 may also suspend the determination of the measurement value if the monitored measurement parameters deviate from the parameters in the established parameter list. As a further alternative or additional function, the controller 110 may be configured to autonomously change the parameters of the measuring device 100 if the monitored measurement parameters deviate from the parameters in the established parameter list.

[0031] The measuring device 100 may be configured in particular as a device for the thermal analysis of materials. Specifically, the measuring device 100 may be configured to perform differential thermal analysis, dynamic differential calorimetry, dynamic mechanical analysis, thermomechanical analysis, and the like. In such a measurement process, user assistance by the controller 110 is particularly advantageous.

[0032] Figure 3 is a schematic diagram of a system 10 equipped with a plurality of measuring devices 100 according to an exemplary embodiment of the present invention.

[0033] In the illustrated exemplary embodiment, the system 10 comprises a total of two measuring devices 100, a controller 200, and a database 300.

[0034] In principle, the individual components of system 10 can be configured in exactly the same way as the corresponding components described with reference to Figure 2. In the exemplary embodiment shown here, only the controller 200 and the database 300 are configured as independent devices outside the two measuring devices 100. However, in principle, the database 300 can also be configured as a subcomponent of the controller 200.

[0035] Since the controller 200 is configured as a standalone device, it can be configured to be used with either of the two measuring devices 100. In this configuration, the parameter list established by the controller 200 can include which measuring device 100 to use.

[0036] Figure 3 shows two measuring devices 100. However, any number of measuring devices 100 may be provided. In particular, it is conceivable to use individual measuring devices 100 equipped with an external controller 200 and / or an external database 300.

[0037] The measuring device 100 can be configured to have the same function, or it can be configured to perform different measurements in each case. Depending on the application, each measurement process can be performed simultaneously or sequentially.

[0038] Database 300 is shown here as a specific component of System 10. However, it is also conceivable that the controller 200 and / or database 300 are connected to an extended network, specifically the Internet, and that relevant information is retrieved directly via this network instead of being stored locally. [Explanation of Symbols]

[0039] 10 Systems 100 measuring devices 110 Controller 120 databases 130 Sensor device 140 Output device 150 Input Devices 160 Sample receiving device 200 controllers 300 databases M method M1 Method Step M2 Method Steps M3 Method Steps

Claims

1. The controller receives a request to determine a specific measurement, The controller establishes a parameter list of parameters set in the measuring device in order to determine the specific measured value, The controller outputs the established parameter list to the user of the measuring device, The sensor device of the measuring device monitors the measurement parameters during the actual measurement of the measured value, The controller evaluates the monitored measurement parameters, Includes, A method for controlling a measuring device, wherein if the monitored measurement parameter deviates from a predetermined range of the parameter values ​​in the established parameter list, the controller outputs a warning, interrupts the determination of the measurement value, or autonomously changes the parameter of the measuring device.

2. The method according to claim 1, wherein the requirement for determining a specific measurement includes information regarding a desired measurement accuracy and / or measurement time.

3. The method according to claim 1, wherein the controller accesses the database when establishing the parameter list.

4. The aforementioned database includes multiple pieces of information on material properties and measurement methods, The method according to claim 3, wherein the controller autonomously establishes the parameter list based on the plurality of pieces of information.

5. The method according to claim 3, wherein the controller updates the database after the measured value has been determined.

6. A measuring device configured to perform the method described in any one of claims 1 to 5.

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