X-ray analyzer and control method for the X-ray analyzer

Abstract

In the present invention, a new analysis process generated after an analysis schedule is defined is preferentially performed. A control device (80) controls an analysis device (10) on the basis of the analysis schedule (160). The analysis schedule defines a first analysis process among a plurality of analysis processes, and a second analysis process to be executed subsequent to the first analysis process. The control device (80) updates the analysis schedule (160) so as to execute a new analysis process between the first analysis process and the second analysis process.

Description

Technical Field

[0001] The present disclosure relates to an X-ray analyzer and a method for controlling the X-ray analyzer.

Background Art

[0002] For example, Japanese Patent Application Laid-Open No. 2021-135160 (Patent Document 1) discloses an energy dispersive X-ray spectroscopy (EDX) fluorescent X-ray analyzer (hereinafter, also simply referred to as an "X-ray analyzer").

[0003] This X-ray analyzer includes a sample tray, a transport device, and a measurement device. The sample tray has a plurality (for example, 48) of sample cells for accommodating samples. The transport device transports the sample cells containing samples one by one to the measurement device based on a predetermined order (hereinafter, also referred to as an "analysis schedule") and analyzes the samples with the measurement device. Thus, the X-ray analyzer executes a plurality of analysis processes based on the analysis schedule.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] As described above, the X-ray analyzer executes the plurality of analysis processes based on the analysis schedule. Here, after the analysis schedule is set, for example, a new analysis process having urgency may occur. In such a case, it is desirable to preferentially execute the new analysis process on the X-ray analyzer.

[0006] The purpose of this disclosure is to solve these problems and to provide an X-ray analyzer capable of prioritizing the execution of new analytical processes that occur after the analysis schedule has been defined, and a method for controlling the X-ray analyzer. [Means for solving the problem]

[0007] The X-ray analyzer of this disclosure comprises an analyzer, a memory device, and a control device. The analyzer performs analytical processing of a sample in an analysis room. The memory device stores an analysis schedule that defines the sequence of multiple analytical processes performed by the analyzer. The control device controls the analyzer based on the analysis schedule. The analysis schedule includes a first analytical process and a second analytical process performed after the first analytical process. The control device updates the analysis schedule so that a new analytical process is performed between the first and second analytical processes.

[0008] The control method disclosed herein is a control method for an X-ray analyzer. The control method comprises determining an analysis schedule that defines the sequence of multiple analysis processes performed by the X-ray analyzer. The multiple analysis processes include a first analysis process and a second analysis process performed after the first analysis process. The control method further comprises updating the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process. [Effects of the Invention]

[0009] According to the X-ray analyzer and control method for the X-ray analyzer of this disclosure, new analytical processes that occur after the analysis schedule has been defined can be given priority. [Brief explanation of the drawing]

[0010] [Figure 1] This figure shows an example of an X-ray analyzer according to this embodiment. [Figure 2] This figure shows an example of an X-ray analyzer according to this embodiment. [Figure 3] This figure shows the hardware configuration of the analytical instrument and information processing device. [Figure 4] This figure shows an example of the configuration of a measuring device. [Figure 5] This is a functional block diagram of the control unit. [Figure 6] This is a diagram to explain the update of the analysis schedule. [Figure 7] This figure shows an example of the concepts of batch queues and batch tables. [Figure 8] This is an example of the analysis schedule update screen. [Figure 9] This is an example of the analysis schedule update screen. [Figure 10] This is an example of the analysis schedule update screen. [Figure 11] This is an example of the analysis schedule update screen. [Figure 12] This is an example of a tray screen. [Figure 13] This is a flowchart showing some of the processes performed by an X-ray analyzer. [Figure 14] This is a subroutine for updating the analysis schedule. [Modes for carrying out the invention]

[0011] Embodiments of the present invention will be described in detail below with reference to the drawings. The same or corresponding parts in the drawings are denoted by the same reference numerals, and their descriptions will not be repeated.

[0012] [Example Configuration] Figures 1 and 2 show an example of an X-ray fluorescence analyzer according to this embodiment (hereinafter also referred to as "X-ray analyzer 1"). In this embodiment, an example is described in which the concept of this embodiment is applied to an energy-dispersive (EDX) X-ray analyzer, but it may also be applied to other X-ray analyzers (for example, wavelength-dispersive (WDX) X-ray spectrometry).

[0013] The X-ray analyzer 1 includes an analyzer 10 and an information processing device 90 connected to the analyzer 10. FIG. 1 is a diagram showing a state in which a part of the housing of the analyzer 10 is transparent. FIG. 2 is a diagram showing a state in which the housing of the analyzer 10 is not transparent. In FIG. 1, the height direction of the analyzer 10 is shown as the Z-axis, and the depth direction is shown as the Y-axis. Also, an axis orthogonal to the Z-axis and the Y-axis is defined as the X-axis. The X-axis direction is also the width direction of the analyzer 10.

[0014] In the examples of FIGS. 1 and 2, a notebook computer is shown as the information processing device 90. However, the information processing device 90 may be a desktop computer, a tablet terminal, a smartphone, or the like. The analyzer 10 irradiates the surface of a sample with X-rays and analyzes the sample based on detecting fluorescent X-rays generated from the surface.

[0015] The analyzer 10 includes a measuring device 20, a mounting portion 31, a retracting portion 60, a transport device 70, and a control device 80. Further, the analyzer 10 includes a plurality of sample trays and a plurality of locking devices. In the present embodiment, the analyzer 10 includes sample trays 30a to 30d and locking devices 33a to 33d.

[0016] Hereinafter, the sample trays 30a to 30d are also collectively referred to as "sample tray 30". The sample tray 30 corresponds to the "arrangement body" of the present disclosure. Also, the locking devices 33a to 33d are collectively referred to as "locking device 33".

[0017] The sample tray 30 is placed on the mounting portion 31. Each of the sample trays 30a to 30d is a tray that can be independently pulled out by the user (see FIG. 2). The state in which the sample tray 30 is pulled out is also referred to as the "pulled-out state", and the state in which the sample tray 30 is stored in the analyzer 10 is also referred to as the "stored state". When the sample tray 30 is in the pulled-out state, the sample tray 30 is exposed outside the analyzer 10. In the example of FIG. 2, the sample trays 30a to 30c are in the stored state, and the sample tray 30d is in the pulled-out state.

[0018] The locking device 33 includes a protrusion that is movable in the X-axis direction. The sample tray 30 also has a recess formed in which the protrusion can engage. In Figure 2, the recess 33x is shown as a recess formed in the sample tray 30d. When the sample tray 30 is in the stored position, the locking device 33 becomes "locked" when the protrusion moves and engages with the recess. When the protrusion is not engaged with the recess, the locking device is in the "unlocked state". The transition from the locked state to the unlocked state is also referred to as "releasing the lock". When the sample tray 30 is in the stored position and the locking device 33 corresponding to the sample tray 30 is in the locked state, the user cannot pull out the sample tray 30.

[0019] The sample container 40, placed on the sample tray 30, is a container for holding samples. The sample container 40 is, for example, a milky white container with a transparent film on the analysis surface that is irradiated with X-rays. The top of the sample container 40 is open, and the inside of the sample container 40 is an unsealed space. The sample container 40 can hold a wide variety of samples, such as solid samples, powder samples, and liquid samples.

[0020] In this embodiment, the sample container 40 is detachable from the sample tray 30. The user pulls out the sample tray 30, removes the sample container 40 from the sample tray 30, and places the sample into the sample container 40. Therefore, the user can place the sample container 40 in the desired position and place the sample into it, thus reducing the burden on the user in placing the sample into the sample container 40. The sample container 40 and the sample tray 30 may be integrated. The user then places the sample container 40 containing the sample onto the sample tray 30 and stores the sample tray 30 in the analyzer 10 (putting it in the stored state).

[0021] The transport device 70 is controlled by the control device 80. The transport device 70 selects one sample container 40 from a plurality of sample containers 40 placed on the sample tray 30 based on the analysis schedule described later. The transport device 70 transports the selected sample container 40 (hereinafter also referred to as the "target container") to the measuring device 20. The transport device 70 includes an arm 51, a plurality of claws 52, and a drive source (not shown). The drive source is, for example, a motor. The arm 51 is movable in the X-axis, Y-axis, and Z-axis directions by the drive source. The sample container 40 is gripped by four claws 52 provided at the tip 53 of the arm 51.

[0022] The details of transporting the sample container 40 are described below. The control device 80 moves the arm 51 so that its tip 53 is positioned above the target container. When the tip 53 of the arm 51 reaches above the target container, the control device 80 lowers the arm 51 and grips the target container with the claw 52.

[0023] Next, the control device 80 raises the arm 51 to a predetermined position. Once the arm 51 has reached the predetermined position, the control device 80 moves the arm 51 so that its tip 53 is positioned above the measuring device 20. When the tip 53 of the arm 51 reaches above the measuring device 20 of the sample container 40, the control device 80 opens the opening / closing lid 24 of the measuring device 20 and lowers the arm 51. When the bottom surface of the sample container 40 reaches the measuring device 20, the control device 80 spreads its claws 52 and places the sample container 40 inside the measuring device 20. Through this process, the control device 80 transports the target sample container 40 to the measuring device 20. The sample inside the transported sample container 40 is analyzed by the measuring device 20. Details of the analysis will be described later.

[0024] Once the analysis of the sample by the measuring device 20 is complete, the transport device 70 transports the sample container 40 from the measuring device 20 to the original sample tray 30 or the retraction section 60. Specifically, if the target container can be returned to its original position on the original sample tray 30, the transport device 70 returns the target container to its original position on the original sample tray 30. On the other hand, if the target container cannot be returned to its original position on the original sample tray 30, the transport device 70 transports the target container to the retraction section 60.

[0025] Furthermore, the control device 80 locks the sample tray in use using the locking device 33. Here, the sample tray in use refers to, for example, the sample tray that is in storage and on which the sample container 40 (target container) to be transported by the transport device 70 is placed. For example, in the example shown in Figure 1, the sample tray 30a is the sample tray in use, and the control device 80 locks the sample tray 30a with the locking device 33a.

[0026] If the lock on the sample tray in use is released, the user can pull out the sample tray. Therefore, if the arm 51 descends while the sample tray is pulled out, problems may occur, such as being unable to grasp the intended sample container 40. In this embodiment, the sample tray on which the sample container 40 to be transported by the transport device 70 is placed (the sample tray in use) is locked. This suppresses the above-mentioned problems.

[0027] Furthermore, as will be described later, the X-ray analyzer 1 can update its analysis schedule to accommodate new, urgent analysis processes. For example, even if sample tray 30a is locked, the other sample trays 30b to 30d remain unlocked. Therefore, the user can pull out one of the other sample trays 30b to 30d and place a sample to be used for a new analysis process (hereinafter also referred to as the "new sample").

[0028] [Hardware configuration of analytical instruments and information processing equipment] Figure 3 shows the hardware configuration of the analysis device 10 and the information processing device 90. As described above, the analysis device 10 includes a control device 80, a measuring device 20, a transport device 70, and locking devices 33a to 33d.

[0029] The control unit 80 includes a CPU (Central Processing Unit) 81, a ROM (Read Only Memory) 82, a RAM (Random Access Memory) 83, a communication interface 84, a memory 85, and an I / O (Input / Output) interface 86.

[0030] The CPU 81 provides overall control for the entire analysis device 10. The CPU 81 loads the program stored in the ROM 82 into the RAM 83 and executes it. The ROM 82 stores the program that describes the processing procedure of the control device 80. The RAM 83 serves as the workspace for the CPU 81 when executing the program, and temporarily stores the program and data used when executing the program.

[0031] The communication interface 84 is an interface for communicating with the information processing device 90. The memory 85 stores analysis results and the analysis schedule described later. The I / O interface 86 is an interface for input to or output from the control device 80. The I / O interface 86 is connected to the measuring device 20, the transport device 70, and the locking devices 33a to 33d. The control device 80 can control the measuring device 20, the transport device 70, and the locking devices 33a to 33d via the I / O interface 86.

[0032] The information processing device 90 includes a control device 95, a communication interface 94, a memory 98, an input device 96, and a display device 97. The control device 95 includes a CPU 91, a ROM 92, and a RAM 93.

[0033] The CPU 91 provides overall control over the entire information processing unit 90. The CPU 91 loads the program stored in the ROM 92 into the RAM 93 and executes it. The ROM 92 stores the program that describes the processing procedures of the information processing unit 90. The RAM 93 is the workspace for the CPU 91 when executing the program, and it temporarily stores the program and data used when executing the program.

[0034] The communication interface 94 is an interface for communicating with the analysis device 10. The memory 98 stores various types of information.

[0035] The input device 96 accepts user instructions. User instructions include, for example, instructions to update the analysis schedule, as described later. The input device 96 may be, for example, a keyboard, mouse, or touch panel. The display device 97 may, for example, display various screens.

[0036] [Measuring device] Figure 4 shows an example of the configuration of the measuring device 20. The measuring device 20 includes a housing 102, a housing 112, a sample stage 104, an exhaust device 130, an air supply device 132, and a switching valve 134. The housing 102 is installed on the upper surface of the sample stage 104, and the housing 102 and the sample stage 104 form the first chamber 106. The housing 112 is installed on the lower surface of the sample stage 104, and the housing 112 and the sample stage 104 form the second chamber 114. The analysis chamber 135 is composed of the first chamber 106 and the second chamber 114. The analysis chamber 135 is airtightly enclosed by the housings 102 and 112, and the first chamber 106 and the second chamber 114 are connected by a connecting passage 110 provided on the sample stage 104.

[0037] An opening 108 is formed in the sample stage 104, and the sample container 40 is placed on the sample stage 104 so as to cover the opening 108. During measurement, the sample container 40 is placed on the sample stage 104 such that the measurement position of the sample inside the sample container 40 is exposed to the second chamber 114 at the opening 108. Above the opening 108 on which the sample container 40 is placed, an opening 22 is formed in the housing 102, and an opening / closing lid 24 is provided on the opening 22. The opening / closing lid 24 is in the open state when the sample container 40 is brought into and out of the first chamber 106, and the opening / closing lid 24 is in the closed state during measurement. The opening / closing lid 24 is configured to maintain airtightness between the first chamber 106 and the second chamber 114 when it is closed.

[0038] Furthermore, when the opening / closing lid 24 is in the closed state, leakage of X-rays from the analysis chamber 135 can be prevented. The second chamber 114 is equipped with an X-ray tube 116 and a detector 126 in the housing 112. The X-ray tube 116 irradiates primary X-rays toward the lower surface (analysis surface) of the sample container 40. The X-ray tube 116 is composed of a filament and a target, and generates X-rays from the target by accelerating thermionic electrons generated from the filament with a high voltage and causing them to collide with the target. The primary X-rays emitted from the X-ray tube 116 are irradiated through the opening 108 to the measurement position of the sample in the sample container 40.

[0039] When X-rays are irradiated from the X-ray tube 116 onto the sample in the sample container 40, fluorescent X-rays are generated from the sample due to the photoelectric effect. Fluorescent X-rays have a unique energy for each element. Therefore, the X-ray analyzer 1 can perform a qualitative analysis of the elements contained in the sample by detecting the energy of the fluorescent X-rays with the detector 126. The X-ray analyzer 1 can also perform a quantitative analysis of the elements contained in the sample by measuring the intensity of the fluorescent X-rays. The detector 126 is composed of, for example, a semiconductor detector including a Si element. Alternatively, the detector 126 may be composed of a semiconductor detector including an element doped with a Li element in the Si element.

[0040] The second chamber 114 is equipped with a shutter 118, a primary X-ray filter 120, and a collimator 122. The shutter 118, primary X-ray filter 120, and collimator 122 are configured to slide in a direction perpendicular to the optical path of the primary X-rays by a drive mechanism 124.

[0041] The shutter 118 is made of an X-ray absorbing material such as lead and can be inserted into the primary X-ray optical path as needed to shield the primary X-rays. The primary X-ray filter 120 is made of metal foil selected according to the purpose and attenuates the background component of the primary X-rays emitted from the X-ray tube 116 to improve the signal-to-noise ratio of the required characteristic X-rays. In the actual device, multiple primary X-ray filters 120 made of different types of metal are used, and the primary X-ray filter 120 selected according to the purpose is inserted into the primary X-ray optical path by the drive mechanism 124.

[0042] The collimator 122 is an aperture with a circular opening in the center, which determines the size of the primary X-ray beam irradiated onto the sample. The collimator 122 is made of an X-ray absorbing material, such as lead or brass. In an actual apparatus, multiple collimators 122 with different aperture diameters are arranged side by side perpendicular to the primary X-ray optical path, and the collimator 122 selected according to the purpose is inserted into the primary X-ray optical path by the drive mechanism 124.

[0043] The exhaust system 130 is a device for exhausting the atmosphere in the first chamber 106 and the second chamber 114, and consists of, for example, an exhaust pump, an on-off valve, a pressure control valve, a pressure gauge, etc. The exhaust system 130 is controlled by the control device 80 according to the analysis parameters, and can create a vacuum atmosphere in the chamber (for example, 30 Pa or less) by exhausting the air in the chamber through the vent 128 and the switching valve 134.

[0044] The air supply device 132 is a device for supplying air or helium gas into the first chamber 106 and the second chamber 114, and is composed of, for example, an air supply pump, an on / off valve, a pressure gauge, etc. The air supply device 132 is controlled by the control device 80 according to the analysis parameters. If the chamber is under a vacuum when an air atmosphere is set, the air supply device 132 supplies air to the chamber through the switching valve 134 and the vent 128. If a helium atmosphere is set, the air supply device 132 supplies a helium atmosphere to the chamber through the switching valve 134 and the vent 128.

[0045] The switching valve 134 is controlled by the control device 80. When exhaust is being performed by the exhaust device 130, the switching valve 134 connects the exhaust device 130 to the vent 128 and shuts off the inflow of gas from the air supply device 132. When air is being supplied by the air supply device 132, the switching valve 134 connects the air supply device 132 to the vent 128 and shuts off the discharge of gas to the exhaust device 130.

[0046] In this example, the vent 128 is provided around the detector 126, but the configuration of the vent 128 is not limited to this.

[0047] When measuring a sample, the control device 80 first controls the atmosphere inside the analysis chamber 135 of the measuring device 20 according to the analysis parameters of the target container. The analysis parameters are set in advance by the user, for example. The analysis parameters are set by the user using the input device 96 for each sample container 40 placed on the sample tray 30 (see Figure 1). Specifically, the control device 80 controls the atmosphere inside the second chamber 114 to either an atmospheric atmosphere, a vacuum atmosphere, or a helium atmosphere according to the analysis parameters.

[0048] Once the atmosphere in the second chamber 114 is adjusted, the control device 80 starts measurement by the measuring device 20 according to the analysis parameters of the target container. Specifically, the control device 80 controls the tube voltage, tube current, and irradiation time of the X-ray tube 116 according to the analysis parameters, and also drives the shutter 118, primary X-ray filter 120, and collimator 122.

[0049] Next, the control device 80 analyzes the various elements contained in the sample in the target container (qualitative analysis, quantitative analysis) based on the spectrum of secondary X-rays (fluorescent X-rays) detected by the detector 126, and stores the analysis results in the memory 85.

[0050] [Functional block diagram of the control unit] Figure 5 is a functional block diagram of the control device 80. The control device 80 has an input unit 152, a control unit 154, an output unit 156, and a storage unit 158. The storage unit 158 ​​corresponds to the memory 85 in Figure 3.

[0051] The input unit 152 receives input information entered by the user into the input device 96. The input unit 152 outputs the received input information to the control unit 154. The control unit 154 performs control according to the input information. For example, the control unit 154 performs control of the analyzer 10 and display control of the display device 97.

[0052] The control unit 154 generates an analysis control signal and outputs it to the analysis device 10 via the output unit 156. The analysis device 10 performs analysis processing based on the received analysis control signal. The control unit 154 also generates a display control signal and outputs the generated display control signal to the display device 97 via the output unit 156. The display device 97 displays an image based on the display control signal.

[0053] In the X-ray analyzer 1 of this embodiment, multiple analysis processes can be performed. The user can determine an "analysis schedule 160" that defines the order of the multiple analysis processes. The user sets the analysis schedule 160 using a predetermined setting screen displayed on the display device 97. The analysis schedule 160 defined by the user is stored in the storage unit 158. The control unit 154 executes the multiple analysis processes in the order defined in the analysis schedule 160.

[0054] [Analysis schedule update] Next, we will explain how to update the analysis schedule 160. Generally, in daily analysis work, if multiple samples are measured according to a pre-created analysis schedule, interrupt analysis is not necessary. However, after setting the analysis schedule, the user may want to prioritize the execution of a new, urgent analysis process by the X-ray analyzer 1. This is the case, for example, when various products (e.g., pharmaceuticals, chemical products, and electrical / electronic products) are found to be defective and the user wants to perform an analysis to investigate the defects in those defective products.

[0055] In this embodiment, the control unit 154 updates the analysis schedule 160 by interrupting the already set multiple analysis processes with newly occurring analysis processes that it wants to prioritize.

[0056] Figure 6 is a diagram illustrating the update of analysis schedule 160. The upper part of Figure 6 shows analysis schedule 160 before the update. The lower part of Figure 6 shows analysis schedule 160A after the update.

[0057] In the analysis schedule 160 shown in the upper part of Figure 6, the sequence of multiple analysis processes is defined. Then, through user operation, a new analysis process can be inserted between any analysis process and the analysis process following that arbitrary analysis process, as shown in the lower part of Figure 6. In this embodiment, the arbitrary analysis process is also referred to as the "first analysis process," and the "analysis process following that arbitrary analysis process" is also referred to as the "second analysis process." In this embodiment, the control unit 154 (see Figure 5) updates the analysis schedule 160 in response to an update instruction from the user to the input device 96.

[0058] As described above, the X-ray analyzer 1 updates the analysis schedule 160 so that the analyzer 10 executes a new analysis process between the first and second analysis processes (see Figure 6). Therefore, for example, the X-ray analyzer 1 can prioritize an analysis process that requires urgency over the second analysis process. Furthermore, even if the analysis schedule for multiple analysis processes is set, the user can prioritize an analysis process that requires urgency without waiting for the completion of the continuous analysis of those multiple analysis processes, thereby saving time. In addition, the user does not need to purchase another X-ray analyzer for interruption, and can flexibly execute an analysis process that requires urgency with a single X-ray analyzer 1.

[0059] Furthermore, the X-ray analyzer 1 may manage the analysis schedule 160 using a batch table and a batch queue. Figure 7 shows an example of the concepts of a batch queue and a batch table. A batch table is information that defines the analysis schedule for multiple analytical processes on a sample. A batch queue is information that defines the order of multiple batch tables.

[0060] In the example shown in Figure 7, a batch queue defines a first batch table, a second batch table, a third batch table, and a fourth batch table. Furthermore, this batch queue specifies that the analysis process is executed in the order of the first batch table, the second batch table, the third batch table, and the fourth batch table.

[0061] The first batch table specifies an analysis schedule for performing multiple analyses of unknown samples. The first batch table specifies three analysis processes: unknown sample analysis 1-1, unknown sample analysis 1-2, and unknown sample analysis 1-3. An unknown sample is a sample in which the components to be analyzed are unknown. Different samples are analyzed in each of these three unknown sample analyses. In other words, three samples are used in these three unknown sample analyses. These three unknown sample analyses are independent analysis processes. Therefore, in this embodiment, they are also referred to as "independent analysis processes." The X-ray analyzer 1 can insert a new analysis process between the two independent analysis processes (first analysis process and second analysis process). For example, unknown sample analysis 1-1 can be designated as the first analysis process, unknown sample analysis 1-2 as the second analysis process, and a new analysis process can be inserted between unknown sample analysis 1-1 and unknown sample analysis 1-2.

[0062] The second batch table specifies an analysis schedule for repeat analysis, in which the analysis process is performed multiple times on the sample while the sample remains located in the analysis room 135. In the example in Figure 7, three analysis processes are specified: repeat analysis 2-1, repeat analysis 2-2, and repeat analysis 2-3. In repeat analysis, the same unknown sample is subjected to multiple analysis processes, and a value based on the analysis values ​​obtained from these multiple analysis processes is output as the analysis result for the unknown sample. The analysis result is, for example, the average value of the analysis values ​​obtained from the multiple analysis processes.

[0063] If a new analytical process is interrupted between multiple analyses, the accuracy of the "value based on the results of multiple preliminary analyses" may decrease. The reason for this decrease in accuracy is that if a new analytical process is interrupted between multiple analyses, the sample that was placed (the sample to be analyzed multiple times) is replaced with the sample to be analyzed by the new process. When a sample is replaced, the atmosphere inside the analysis room 135 may change. Therefore, multiple analyses may be performed in different atmospheres, which may decrease the accuracy of the "value based on the results of multiple preliminary analyses."

[0064] Therefore, the X-ray analyzer 1 of this embodiment prohibits the insertion of new analytical processes between multiple analyses (repeated analyses). This suppresses a decrease in the accuracy of the "values ​​based on the results of multiple preliminary analyses." Multiple analyses are collectively referred to as the "first process."

[0065] The third batch table specifies standard sample analysis 3-1, standard sample analysis 3-2, and standard sample analysis 3-3, which are multiple (three in Figure 7) standard sample analyses. Standard sample analysis is a process that creates a calibration curve by performing multiple analytical processes on the same known sample. A known sample is a sample in which the components to be analyzed are known.

[0066] If a new analytical process is interrupted between multiple standard sample analyses, the accuracy of the calibration curve may decrease for the reasons mentioned above. Therefore, the X-ray analyzer 1 of this embodiment prohibits interrupting new analytical processes between multiple standard sample analyses (it prohibits updating the analysis schedule). This suppresses a decrease in the accuracy of the calibration curve. Multiple standard sample analyses are collectively referred to as the "second process."

[0067] The fourth batch table specifies control sample analysis 4-1, control sample analysis 4-2, and control sample analysis 4-4, which are multiple (three in Figure 7) control sample analyses. A control sample analysis is a process that performs calibration of the X-ray analyzer 1 by performing multiple analysis processes on the same known sample.

[0068] If a new analytical process is interrupted between multiple control sample analyses, the accuracy of the calibration may decrease for the reasons mentioned above. Therefore, the X-ray analyzer 1 of this embodiment prohibits interrupting new analytical processes between multiple control sample analyses (it prohibits updating the analysis schedule). This suppresses a decrease in the accuracy of the calibration. Multiple control sample analyses are collectively referred to as the "third process."

[0069] Furthermore, the first, second, and third processes are collectively referred to as the "continuous analysis process." The continuous analysis process is a process consisting of multiple analysis processes. The continuous analysis process is a process that achieves its effect through these multiple analysis processes. Therefore, if the first and second analysis processes are included in the continuous analysis process, the control device 80 prohibits updating the analysis schedule 160 in a way that would cause a new analysis process to be executed between the first and second analysis processes.

[0070] Therefore, the X-ray analyzer 1 can properly execute the continuous analysis process without impairing the effects achieved by the continuous analysis process. In this case, the control device 80 updates the analysis schedule 160 to execute a new analysis process after the continuous analysis process. Thus, the X-ray analyzer 1 can execute a new analysis process after the continuous analysis process.

[0071] [Analysis schedule update screen] The user can update the analysis schedule 160 via the analysis schedule update screen. Figures 8 to 11 show examples of the analysis schedule update screen. This update screen is displayed in the display area 97A of the display device 97 when a predetermined operation is performed by the user on the input device 96. In the example in Figure 8, the screen for the analysis schedule already set by the user is shown.

[0072] In the example in Figure 8, an item image 250, a first image 251, a second image 252, a pointer image 254, an add button 256, and an OK button 258 are shown. When an analysis schedule for N (where N is an integer greater than or equal to 2) analysis processes is set, the display device 97 displays N analysis images corresponding to each of the N analysis processes. The display device 97 also displays the N analysis images in a manner that allows the user to recognize the order of the N analysis processes. For example, the display device 97 displays the analysis images from top to bottom based on the order of the N analysis processes. For example, the analysis image corresponding to the first analysis process executed among the N analysis processes is displayed directly below the item image 250 and at the top of the N analysis images. The analysis image corresponding to the last analysis process executed among the N analysis processes is displayed at the bottom of the N analysis images.

[0073] Furthermore, in the example in Figure 8, the first image 251 and the second image 252 are shown as N analysis images, and the remaining analysis images are not described. The first image 251 is the image corresponding to the first analysis process (see Figure 6). The second image 252 is the image corresponding to the second analysis process (see Figure 6). Also, since the second image 252 is displayed below the first image 251, the user can be made aware that the second analysis process corresponding to the second image 252 is executed after the first analysis process corresponding to the first image 251.

[0074] Item image 250 is an image showing the items of the analysis parameters. Analysis parameters include, for example, sample number, tray number, sample name, analysis conditions, and other information. The sample number indicates the number of the sample to be analyzed. The tray number identifies sample trays 30a to 30d, respectively. The sample name indicates the name of the sample to be analyzed. The analysis conditions indicate the analysis conditions for the sample to be analyzed. Other information includes, for example, information indicating the measurement environment. When setting an analysis schedule, the user enters these analysis parameters. The user can also move the pointer image 254 within the display area 97A by operating the mouse.

[0075] In the first image 251, it is shown that the sample number for the first analytical process corresponding to the first image 251 is A1, the tray number is B1, the sample name is C1, the analytical conditions are D1, and other information is E1. In the second image 252, it is shown that the sample number for the second analytical process corresponding to the second image 252 is A2, the tray number is B2, the sample name is C2, the analytical conditions are D2, and other information is E2.

[0076] Next, we will explain the operation for the user to insert a new analysis process between the first and second analysis processes. As shown in Figure 9, the user specifies the display area of ​​the analysis image corresponding to the analysis process immediately preceding the new analysis process desired by the user. In this embodiment, since the immediately preceding analysis process is the first analysis process, the user specifies the first image 251 corresponding to the first analysis process. This specification is achieved, for example, by clicking the pointer image 254 over the first image 251. When the first image 251 is specified, the first image 251 is displayed with a thick line. In this specified state, the user operates the add button 256. The specified area is also referred to as the "specific display area".

[0077] Then, as shown in Figure 10, the display device 97 displays a third image 253 corresponding to the new analysis process. At this point, the fields for each analysis parameter in the third image 253 are blank. The user then enters the analysis parameters to be used for the new analysis process into the blank area of ​​the third image 253. Then, as shown in Figure 11, the display device 97 displays the analysis parameters to be used for the new analysis process. In the example in Figure 11, the third image 253 shows that the sample number for the new analysis process is A3, the tray number is B3, the sample name is C3, the analysis conditions are D3, and other information is E3. Once the analysis parameters for the new analysis process are entered and the user operates the OK button 258, the control device 80 updates the analysis schedule so that the new analysis process is executed. Furthermore, by operating the OK button 258, the user has entered an update instruction.

[0078] As explained in Figures 8 to 11, the display device 97 displays the first image 251 and the second image 252 in a manner that allows the user to recognize the order of the first and second analysis processes. The control device 80 updates the analysis schedule 160 when the user specifies a particular display area within the display area of ​​the display device 97. Therefore, the user can update the analysis schedule 160 while viewing the first image 251 and the second image 252.

[0079] In this embodiment, the specified display area described above is the display area of ​​the first image 251. Therefore, by specifying the first image 251, the user can update the analysis schedule 160 to execute a new analysis process after the first analysis process corresponding to the first image 251. Thus, the user can intuitively update the analysis schedule 160.

[0080] As a variation, the specific display area may be any other display area. For example, the specific display area may be the display area of ​​the second image 252. In this case, the user can update the analysis schedule 160 to execute a new analysis process before the second analysis process corresponding to the second image 252 by specifying the display area of ​​the second image 252. Therefore, the user can intuitively update the analysis schedule 160.

[0081] Furthermore, the display device 97 displays a third image 253 corresponding to the new analysis process when the user specifies a particular display area. Therefore, by viewing the third image 253, the user can recognize that "the analysis schedule 160 has been updated so that a new analysis process will be executed."

[0082] Furthermore, the display device 97 displays the first image 251, the second image 252, and the third image 253 in a manner that allows the user to recognize that the first analysis process, the new analysis process, and the second analysis process are performed in this order. Therefore, by viewing the first image 251, the second image 252, and the third image 253, the user can recognize that a new analysis process is performed between the first and second analysis processes.

[0083] Furthermore, the analysis schedule update screen may be made editable by the user as appropriate. Editing includes deleting analysis processes specified in the analysis schedule, and changing the order of analysis processes specified in the analysis schedule. Additionally, updating the analysis schedule may be performed by temporarily pausing the multiple analysis processes specified in the previous analysis schedule. Alternatively, updating the analysis schedule may be performed without such pausing.

[0084] [Placement of new samples] Next, we will explain how to add a new sample (a sample to be used in a new analytical procedure). Adding a new sample may be done before or after updating the analysis schedule.

[0085] In this embodiment, the sample container 40 containing the sample used in the analytical process specified in the analysis schedule before the update corresponds to the "first sample chamber" in this disclosure. The sample container 40 containing the new sample corresponds to the "second sample chamber" in this disclosure. The sample tray in which the first sample chamber is formed corresponds to the "first configuration" in this disclosure. The sample tray in which the second sample chamber is formed corresponds to the "second configuration" in this disclosure.

[0086] In this embodiment, the first configuration corresponds to the sample tray 30a. The first sample chamber corresponds to "a sample container 40 that is placed on the sample tray 30a and contains samples used in the analytical processing specified in the analysis schedule prior to the update."

[0087] The second configuration corresponds to sample trays 30b to 30d. The second sample chamber corresponds to "a sample container 40 placed on one of the sample trays 30b to 30d".

[0088] The control device 80 locks the sample tray (sample tray 30a) in use with a locking device. This prevents the sample tray from being pulled out. Therefore, the X-ray analyzer 1 suppresses malfunctions caused by attempting to transport the sample in the sample tray 30a while the sample tray 30a is exposed to the outside.

[0089] On the other hand, even if sample tray 30a is in use, the control device 80 releases the lock on the unused sample trays (sample trays 30b to 30d). This allows the sample trays to be pulled out. Therefore, the user can place a new sample by pulling out sample trays 30b to 30d without waiting for sample tray 30a to be used up.

[0090] The locking device for the sample tray in use (sample tray 30a) is also called the "first locking device." The locking devices for unused sample trays (sample trays 30b to 30d) are also called the "second locking devices."

[0091] Furthermore, the user can place a new sample by pulling out one of the sample trays 30b to 30d and exposing it to the outside. This reduces the burden on the user when adding new samples.

[0092] Furthermore, the control device 80 allows the user to pull out any of the unlocked sample trays 30b to 30d while the measurement device 20 is performing sample analysis, i.e., when the opening / closing lid 24 is closed. Therefore, the user can place a new sample in the sample tray without X-ray leakage.

[0093] Figure 12 shows an example of a tray screen displayed by the display device 97. This tray screen is displayed in the display area 97A of the display device 97 when a predetermined operation is performed by the user on the input device 96.

[0094] On this tray screen, tray images 260a, 260b, 260c, and 260d, corresponding to sample trays 30a, 30b, 30c, and 30d, respectively, are displayed. Tray images 260a, 260b, 260c, and 260d are collectively referred to as "tray image 260".

[0095] Each tray image 260 contains 12 circular images. Each circular image corresponds to one sample container 40. As also shown in explanatory image 275, hatched circular images indicate that the container is in use, while unhatched circular images indicate that the container is available for use.

[0096] In this embodiment, sample tray 30a is in use. Therefore, the circular image 271 of tray image 260a corresponding to sample tray 30a is hatched on the display device 97. On the other hand, the circular images 272 of tray images 260b to 260d corresponding to sample trays 30b to 30d are not hatched on the display device 97.

[0097] Furthermore, the display device 97 displays a lock image in association with the tray image 260. The lock image includes a locked image 281 indicating that the tray is locked, and an unlocked image 282 indicating that the tray is unlocked.

[0098] In the example shown in Figure 12, the display device 97 displays a locked image 281 corresponding to tray image 260a. The display device 97 also displays unlocked images 282 corresponding to tray images 260b to 260d.

[0099] Thus, the display device 97 displays tray image 260a and tray image 260b. Tray image 260a is the image corresponding to sample tray 30a (first sample chamber), and tray images 260b to 260d are the images corresponding to sample trays 30b to 30d (second sample chamber), respectively. Therefore, by viewing the tray image 260, the user can recognize the sample tray in which to place the new sample.

[0100] [flowchart] Figure 13 is a flowchart showing part of the process performed by the X-ray analyzer 1. In step S2, the X-ray analyzer 1 determines the analysis schedule based on user input. Next, in step S4, the X-ray analyzer 1 performs the process of updating the analysis schedule. After determining the analysis schedule in step S2, the X-ray analyzer 1 performs the analysis process based on the analysis schedule while simultaneously performing the process in step S4. The process shown in Figure 13 ends when all analysis processes for the analysis schedule set by the user are completed.

[0101] Figure 14 shows the subroutine for the analysis schedule update process in step S4. First, in step S42, the X-ray analyzer 1 determines whether or not an update instruction has been entered by the user. If no update instruction has been entered by the user (NO in step S42), the analysis schedule update process ends. If an update instruction has been entered by the user (YES in step S42), the process proceeds to step S44.

[0102] In step S44, the X-ray analyzer 1 determines whether the first and second analysis processes (see Figure 6), into which a new analysis process is interrupted, are included in the continuous analysis process (see Figure 7).

[0103] If the first and second analysis processes are included in the continuous analysis process (YES in step S44), in step S46, the X-ray analyzer 1 updates the analysis schedule so that a new analysis process is executed after the continuous analysis process. Then, the schedule update process ends.

[0104] Furthermore, if the first and second analytical processes are not included in a continuous analytical process (YES in step S44), the process proceeds to step S48. The case in which the first and second analytical processes are not included in a continuous analytical process is when the first and second analytical processes are independent analytical processes as described above. In step S48, the X-ray analyzer 1 determines whether or not the second analytical process is being prepared.

[0105] Next, we will explain what it means when "the second analysis process is being prepared." When the X-ray analyzer 1 is to perform an analysis process specified in the analysis schedule, it places the data corresponding to the analysis process into a queue and performs the analysis process corresponding to the data by retrieving the data from the queue. If the data corresponding to the second analysis process is in the queue, it is determined that the second analysis process is being prepared. Note that the definition of "whether the second analysis process is being prepared" may be defined in other ways.

[0106] If the second analysis process is being prepared (YES in step S48), in step S50, the X-ray analyzer 1 updates the analysis schedule so that a new analysis process is performed after the second analysis process. If the second analysis process is not being prepared (NO in step S48), in step S52, the X-ray analyzer 1 updates the analysis schedule so that a new analysis process is performed before the second analysis process.

[0107] Thus, when the X-ray analyzer 1 receives an update instruction (YES in step S42), it determines whether to execute the second analysis process or the new analysis process first. Therefore, the X-ray analyzer 1 can flexibly determine the execution order of the second analysis process and the new analysis process.

[0108] Furthermore, if the X-ray analyzer 1 has not performed the preparatory processing for the second analytical process (NO in step S48), it decides in step S52 to perform a new analytical process before the second analytical process.

[0109] Furthermore, if, despite the preparatory processing for the second analysis process being executed, a new analysis process is executed before the second analysis process, it becomes necessary to erase the preparatory processing (erase the data corresponding to the second analysis process stored in the queue), which places a burden on the control device 80.

[0110] Therefore, if the X-ray analyzer 1 has performed the preparation process for the second analysis process (YES in step S48), it decides in step S50 to perform a new analysis process after the second analysis process. Although this decision is contrary to the user's wishes, the X-ray analyzer 1 can reduce the burden on the control device 80, such as having to erase the preparation process.

[0111] [Differentiation] (1) In the above-described embodiment, an update instruction was described in which the user inputs the instruction. However, the update instruction may also be input to the X-ray analyzer 1 from another device. The other device may be, for example, a decision device located outside the X-ray analyzer 1. The decision device determines the validity of the analysis result output by the X-ray analyzer 1. If the decision device determines that the analysis result is not valid, the decision device outputs an update instruction to the X-ray analyzer 1 to interrupt the analysis process and restart the analysis. When the X-ray analyzer 1 receives the update instruction, it updates the analysis schedule.

[0112] Furthermore, when the X-ray analyzer 1 analyzes a sample related to the pharmaceutical field, the sample is analyzed using validated procedures and conditions. Therefore, it may not be desirable for the judgment device to make a judgment on the analysis results of a sample related to the pharmaceutical field. For this reason, it is preferable that the judgment device be applied to a field different from the pharmaceutical field (for example, a field that detects the presence or absence of pollution).

[0113] (2) In the embodiments described above, the new analysis process was described as a single analysis process. However, the new analysis process may consist of two or more analysis processes.

[0114] (3) In the embodiments described above, as shown in steps S44 and S46 of Figure 14, a configuration was described in which the analysis schedule is updated so that the new analysis is performed after the continuous analysis when the first analysis and the second analysis are included in a continuous analysis. However, even when the first analysis and the second analysis are included in a continuous analysis, the X-ray analyzer 1 may update the analysis schedule so that the new analysis is performed between the first analysis and the second analysis.

[0115] [Pattern] Those skilled in the art will understand that the above-described exemplary embodiments are specific examples of the following embodiments.

[0116] (Section 1) The X-ray analyzer of the present disclosure comprises an analyzer, a memory device, and a control device. The analyzer performs analytical processing of a sample in an analysis room. The memory device stores an analysis schedule that defines the sequence of multiple analytical processing steps performed by the analyzer. The control device controls the analyzer based on the analysis schedule. The multiple analytical processing steps include a first analytical processing step and a second analytical processing step performed after the first analytical processing step. The control device updates the analysis schedule so that a new analytical processing step is performed between the first analytical processing step and the second analytical processing step.

[0117] With this configuration, the control device updates the analysis schedule so that the analytical instrument performs a new analytical process between the first and second analytical processes. Therefore, for example, an analytical process requiring urgency can be performed with priority over the second analytical process.

[0118] (Paragraph 2) The X-ray analyzer described in Paragraph 1, wherein the analyzer performs a continuous analysis process consisting of multiple analysis processes. The control device prohibits updating the analysis schedule so that a new analysis process is performed between the first and second analysis processes if the first and second analysis processes are included in the continuous analysis process.

[0119] With this configuration, since the execution of new analysis processes between the first and second analysis processes that constitute the continuous analysis process is prohibited, the continuous analysis process can be properly executed without impairing the functions achieved by the continuous analysis process.

[0120] (Clause 3) The X-ray analyzer described in paragraph 2, wherein the control device updates the analysis schedule so that a new analysis process is performed after a continuous analysis process.

[0121] With this configuration, a new analysis process can be executed after a series of analysis processes.

[0122] (Article 4) An X-ray analyzer as described in Article 2 or Article 3, wherein the continuous analysis process includes at least one of the following processes: a first process, a second process, and a third process. The first process is a process of performing multiple preliminary analysis processes on an unknown sample and outputting the analysis result of the unknown sample based on the results of the multiple preliminary analysis processes. The second process is a process of creating a calibration curve by performing multiple preliminary analysis processes on a known sample. The third process is a process of calibrating the X-ray analyzer by performing multiple preliminary analysis processes on a known sample.

[0123] With this configuration, the first to third processes described above can be executed appropriately.

[0124] (Article 5) An X-ray analyzer according to any one of paragraphs 1 to 4, the X-ray analyzer further comprises a first sample chamber for containing a sample on which a first analytical process is performed, and a second sample chamber for containing a sample on which a new analytical process is performed. The sample on which a new analytical process is performed is contained in the second sample chamber even if the first sample chamber is in use.

[0125] This configuration allows for the separation of sample chambers: one for samples already analyzed in the first analytical process set in the analysis schedule, and another for samples undergoing new analytical processes. Therefore, for example, a user can place samples undergoing new analytical processes into the second sample chamber without waiting for the first sample chamber to be fully utilized.

[0126] (Clause 6) The X-ray analyzer described in Clause 5 further comprises a drawer-type first configuration having a first sample chamber and a drawer-type second configuration having a second sample chamber. With the second configuration extended, a sample to be subjected to a new analytical process is placed in the second sample chamber.

[0127] With this configuration, even when the first sample chamber is in use, the user can expose the second sample chamber to the outside and place samples to be subjected to new analytical processing into the second sample chamber. Therefore, the burden on the user of placing samples in the second sample chamber can be reduced.

[0128] (Section 7) The X-ray analyzer described in Section 6 further comprises a lid that can be opened and closed. When the lid is closed, leakage of X-rays into the analysis chamber is prevented. When the lid is closed, the second assembly is pulled out.

[0129] With this configuration, since X-ray leakage is prevented when the lid is closed, the user can safely remove the second container and place the sample to be subjected to new analytical processing into the second container.

[0130] (Clause 8) An X-ray analyzer according to any one of paragraphs 5 to 7, further comprising a transport device for transporting a sample contained in a first sample chamber and a sample contained in a second sample chamber to an analysis chamber, a first locking device for prohibiting a sample from being placed in the first sample chamber, and a second locking device for prohibiting a sample from being placed in the second sample chamber, wherein the control device locks the first sample chamber with the first locking device and unlocks the second locking device when the first sample chamber is in use.

[0131] With this configuration, while the transport device is transporting the sample contained in the first sample chamber to the analysis chamber, a first lock is performed to lock the first sample chamber so that it is not exposed to the outside. Therefore, malfunctions caused by attempting to transport the sample in the first sample chamber while it is exposed to the outside are suppressed. Furthermore, since the second lock is released, the second sample chamber can be exposed to the outside, and the user can place a sample to be subjected to new analysis processing into the second sample chamber.

[0132] (Paragraph 9) An X-ray analyzer according to any one of paragraphs 1 to 8, wherein the X-ray analyzer further comprises a display device. The display device displays a first image corresponding to a first analysis process and a second image corresponding to a second analysis process in a manner that allows the user to recognize the order. The control device updates the analysis schedule by allowing the user to specify a particular display area within the display area of ​​the display device.

[0133] With this configuration, the user can view the first and second images while updating the analysis schedule by specifying a particular display area.

[0134] (Item 10) An X-ray analyzer as described in Item 9, wherein the display device displays a second image below the first image in the display area of ​​the display device. The specific display area is the display area of ​​the first image or the display area of ​​the second image.

[0135] With this configuration, the user can update the analysis schedule by specifying the display area of ​​the first image or the display area of ​​the second image, so that a new analysis process is executed between the first analysis process corresponding to the first image and the second analysis process corresponding to the second image. Therefore, the user can intuitively update the analysis schedule.

[0136] (Clause 11) An X-ray analyzer as described in paragraph 9 or 10, wherein the display device displays a third image corresponding to a new analysis process by specifying a particular display area with the user.

[0137] With this configuration, users can recognize that the analysis schedule has been updated by viewing the third image.

[0138] (Clause 12) An X-ray analyzer as described in paragraph 11, wherein the display device displays a first image, a second image, and a third image in a manner that allows the user to recognize that the first analysis process, a new analysis process, and a second analysis process are performed in this order.

[0139] With this configuration, the user can recognize that a new analysis process is performed between the first and second analysis processes by viewing the first, second, and third images.

[0140] (Item 13) An X-ray analyzer according to any one of items 5 to 8, the X-ray analyzer further comprises a display device. The display device displays an image corresponding to the first sample chamber and an image corresponding to the second sample chamber.

[0141] With this configuration, the user can recognize the sample chamber in which the sample to be subjected to new analytical processing is placed.

[0142] (Paragraph 14) An X-ray analyzer as described in any one of paragraphs 1 to 13, wherein the control device, upon receiving an update instruction, decides to execute a new analysis process after the second analysis process if it has already performed preparatory processing for the second analysis process, and decides to execute a new analysis process before the second analysis process if it has not already performed preparatory processing.

[0143] This configuration prevents the irrationality of a new analysis process being executed even though the preparatory process for the second analysis process is already running.

[0144] (Paragraph 15) An X-ray analyzer as described in any one of paragraphs 1 to 14, wherein the control device updates the analysis schedule in accordance with the update instruction entered by the user.

[0145] With this configuration, the analysis schedule can be updated at the user's desired timing.

[0146] (Section 16) A control method of the present disclosure is a control method for an X-ray analyzer. The control method comprises determining an analysis schedule that defines the sequence of a plurality of analysis processes performed by the X-ray analyzer. The plurality of analysis processes include a first analysis process and a second analysis process performed after the first analysis process. The control method further comprises updating the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process.

[0147] With this configuration, the control device updates the analysis schedule so that the analytical instrument performs a new analytical process between the first and second analytical processes. Therefore, for example, an analytical process requiring urgency can be performed with priority over the second analytical process.

[0148] Furthermore, regarding the embodiments and modifications described above, it was intended from the outset that the configurations described in the embodiments could be appropriately combined, including combinations not mentioned in the specification, to the extent that no inconvenience or inconsistency arises.

[0149] The embodiments disclosed herein should be considered in all respects to be illustrative and not restrictive. The scope of the invention is indicated by the claims rather than by the foregoing description, and all modifications within the meaning and scope of equivalents of the claims are intended to be included. [Explanation of Symbols]

[0150] 1 X-ray analyzer, 10 analyzer, 20 measuring device, 24 opening / closing lid, 30 sample tray, 33 locking device, 40 sample container, 70 transport device, 80 control device, 90 information processing device, 96 input device, 97 display device, 97A display area, 104 sample stage, 106 first chamber, 110 connecting passage, 114 second chamber, 152 input unit, 154 control unit, 156 output unit, 158 storage unit, 160 analysis schedule, 250 parameter image, 251 first image, 252 second image, 253 third image, 254 pointer image, 256 add button, 258 OK button, 260 tray image, 275 explanatory image, 281 lock image, 282 unlock image.

Claims

1. An X-ray analyzer, Analytical equipment used to perform sample analysis in the analysis laboratory, A storage device that stores an analysis schedule that defines the sequence of multiple analysis processes performed by the aforementioned analysis device, The system includes a control device that controls the analytical device based on the aforementioned analysis schedule, The aforementioned plurality of analysis processes include a first analysis process and a second analysis process performed after the first analysis process, The control device updates the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process. The aforementioned X-ray analyzer further, A first sample chamber containing a sample on which the first analytical process is performed, A second sample chamber containing a sample on which the aforementioned new analytical process is to be performed, A drawer-type first arrangement in which the first sample chamber is formed, A second assembly of the pull-out type, in which the second sample chamber is formed, It has a lid that can be opened and closed, The sample on which the new analytical process is performed is placed in the second sample chamber, even if the first sample chamber is in use. With the second assembly pulled out, the sample on which the new analytical process is to be performed is placed in the second sample chamber. When the lid is closed, leakage of X-rays from the analysis chamber is prevented. An X-ray analyzer in which the second assembly is pulled out when the lid is in the closed state.

2. An X-ray analyzer, Analytical equipment used to perform sample analysis in the analysis laboratory, A storage device that stores an analysis schedule that defines the sequence of multiple analysis processes performed by the aforementioned analysis device, The system includes a control device that controls the analytical device based on the aforementioned analysis schedule, The aforementioned plurality of analysis processes include a first analysis process and a second analysis process performed after the first analysis process, The control device updates the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process. The aforementioned X-ray analyzer further, A first sample chamber containing a sample on which the first analytical process is performed, A second sample chamber containing a sample on which the aforementioned new analytical process is to be performed, A transport device for transporting the samples contained in the first sample chamber and the samples contained in the second sample chamber to the analysis chamber, A first locking device that prevents a sample from being placed in the first sample chamber, The system includes a second locking device that prevents a sample from being placed in the second sample chamber, The sample on which the new analytical process is performed is placed in the second sample chamber, even if the first sample chamber is in use. The control device locks the first sample chamber with the first locking device and unlocks the second locking device when the first sample chamber is in use, in an X-ray analyzer.

3. The aforementioned analytical device performs a continuous analytical process consisting of multiple analytical processes. The X-ray analyzer according to claim 1 or 2, wherein the control device prohibits updating the analysis schedule so that a new analysis process is performed between the first analysis process and the second analysis process when the first analysis process and the second analysis process are included in the continuous analysis process.

4. The X-ray analyzer according to claim 3, wherein the control device updates the analysis schedule so that the new analysis process is performed after the continuous analysis process.

5. The aforementioned continuous analysis process includes at least one of the following processes: a first process, a second process, and a third process. The first process involves performing the multiple preliminary analysis processes on an unknown sample and outputting the analysis results of the unknown sample based on the results of the multiple preliminary analyses. The second process is a process of creating a calibration curve by performing the above-mentioned multiple preliminary analysis processes on a known sample. The X-ray analyzer according to claim 3, wherein the third process is a process of performing the calibration of the X-ray analyzer by performing the multiple preliminary analysis processes on a known sample.

6. The aforementioned X-ray analyzer further includes a display device, The display device displays a first image corresponding to the first analysis process and a second image corresponding to the second analysis process in a manner that allows the user to recognize the order. The X-ray analyzer according to claim 1 or 2, wherein the control device updates the analysis schedule by allowing the user to specify a particular display area among the display areas of the display device.

7. The display device displays the second image below the first image in the display area of ​​the display device. The X-ray analyzer according to claim 6, wherein the specified display area is the display area of ​​the first image or the display area of ​​the second image.

8. The X-ray analyzer according to claim 6, wherein the display device displays a third image corresponding to the new analysis process when the user specifies the particular display area.

9. The X-ray analyzer according to claim 8, wherein the display device displays the first image, the second image, and the third image in a manner that allows the user to recognize that the first analysis process, the new analysis process, and the second analysis process are performed in that order.

10. The aforementioned X-ray analyzer further includes a display device, The X-ray analyzer according to claim 1, wherein the display device displays an image corresponding to the first sample chamber and an image corresponding to the second sample chamber.

11. When the control device receives an update instruction, If the preparatory process for the second analysis process has been performed, it is decided to perform the new analysis process after the second analysis process. The X-ray analyzer according to claim 1 or claim 2, wherein if the preparatory process has not been performed, it is decided to perform the new analysis process before the second analysis process.

12. The X-ray analyzer according to claim 1 or 2, wherein the control device updates the analysis schedule in response to an update instruction input by the user.

13. A control method for an X-ray analyzer that performs analytical processing of a sample in an analytical laboratory, The system includes determining an analysis schedule that defines the sequence of multiple analysis processes performed by the aforementioned X-ray analyzer. The aforementioned plurality of analysis processes include a first analysis process and a second analysis process performed after the first analysis process, The control method further includes updating the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process. The aforementioned X-ray analyzer, A first sample chamber containing a sample on which the first analytical process is performed, A second sample chamber containing a sample on which the aforementioned new analytical process is to be performed, A drawer-type first arrangement in which the first sample chamber is formed, A second assembly of the pull-out type, in which the second sample chamber is formed, It has a lid that can be opened and closed, The sample on which the new analytical process is performed is placed in the second sample chamber, even if the first sample chamber is in use. With the second assembly pulled out, the sample on which the new analytical process is to be performed is placed in the second sample chamber. When the lid is closed, leakage of X-rays from the analysis chamber is prevented. A control method wherein the second assembly is pulled out when the lid is in the closed state.

14. A control method for an X-ray analyzer that performs analytical processing of a sample in an analytical laboratory, The system includes determining an analysis schedule that defines the sequence of multiple analysis processes performed by the aforementioned X-ray analyzer. The aforementioned plurality of analysis processes include a first analysis process and a second analysis process performed after the first analysis process, The control method further includes updating the analysis schedule so that a new analysis process is executed between the first analysis process and the second analysis process. The aforementioned X-ray analyzer further, A first sample chamber containing a sample on which the first analytical process is performed, A second sample chamber containing a sample on which the aforementioned new analytical process is to be performed, A transport device for transporting the samples contained in the first sample chamber and the samples contained in the second sample chamber to the analysis chamber, A first locking device that prevents a sample from being placed in the first sample chamber, The system includes a second locking device that prevents a sample from being placed in the second sample chamber, The sample on which the new analytical process is performed is placed in the second sample chamber, even if the first sample chamber is in use. The control method further comprises locking the first sample chamber with the first locking device when the first sample chamber is in use, and unlocking the second locking device.

Images