Camera housing and inspection device

Abstract

Provided is a housing for imaging and an inspection device with which it is possible to change the degree of diffusion of and radiate light from a light source, according to the shape of a subject. The housing for imaging (100) comprises: a housing (111) which covers an imaging space; an imaging device attachment section (125) at which an imaging device (10) is attached to a first surface of the housing (111); and a light source attachment section (113) which is provided to a second surface orthogonal to the first surface of the housing (111) and at which a first light source (20) for irradiating the interior of the housing (111) is attached, wherein the housing (111) has a diffusion member provided therein, has a first opening (U) which a lens of the imaging device (10) faces on the first surface, has a second opening (T) on the second surface, and has a movable plate (107) which changes the open region of the second opening (T) through which the light from the first light source (20) enters, and the light source attachment section (113) has a change mechanism (113a) which can change the orientation of the first light source in the open region.

Description

Technical Field

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[0001] The present invention relates to a photographing housing and an inspection device.

Background Art

[0002] Conventionally, technologies related to inspection devices including an imaging device and a lighting device have been proposed.

[0003] For example, Patent Document 1 proposes a housing including an imaging device and a lighting device, and a technology intended to stably evaluate fabric products has been proposed.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

[0005] One embodiment of the technology according to the present disclosure provides a photographing housing and an inspection device capable of changing the diffusion degree of light from a light source according to the shape of a subject and irradiating the subject.

Means for Solving the Problems

[0006] A photographing housing according to one aspect of the present invention for achieving the above object includes a housing that covers a photographing space, an imaging device mounting portion to which an imaging device is mounted on a first surface of the housing, and a light source mounting portion provided on a second surface that intersects the first surface of the housing and to which a first light source that irradiates the inside of the housing is mounted. The housing is provided with a diffusion member inside, has a first opening facing the lens of the imaging device on the first surface, has a second opening on the second surface, has a movable plate that changes the opening area of the second opening into which the light of the first light source enters, and the light source mounting portion has a changing mechanism capable of changing the direction of the first light source in the opening area.

[0007] [[ID=4"]]

[0008] ​ Preferably, the housing is equipped with an insertion / removal mechanism, and the diffusion member is provided in the housing by the insertion / removal mechanism.

[0009] Preferably, the diffusion member attached to the bottom of the housing is removable.

[0010] Preferably, a hood for the imaging device is provided on the first surface of the housing.

[0011] Preferably, the imaging device mounting section is detachably equipped with an imaging device.

[0012] Preferably, the imaging device mounting section has an imaging direction adjustment mechanism for adjusting the imaging direction of the imaging device.

[0013] Another aspect of the present invention is an inspection apparatus comprising the above-described imaging housing, an imaging device provided in the imaging device mounting section, and a first light source provided in the light source mounting section.

[0014] Preferably, the light source mounting section consists of a first light source mounting section and a second light source mounting section, with a first light source provided in the first light source mounting section and a second light source provided in the second light source mounting section.

[0015] Preferably, the system includes an intensity changing mechanism that changes the wavelength intensity of the first and second light sources.

[0016] Preferably, the first light source is a halogen lamp and the second light source is a metal halide lamp.

[0017] Preferably, the imaging device is a multispectral camera, and the multispectral camera is a pupil-splitting type with multiple bandpass filters arranged at or near the pupil position. [Brief explanation of the drawing]

[0018] [Figure 1] Figure 1 is a conceptual diagram illustrating the inspection device. [Figure 2] Figure 2 is a perspective view of the camera housing. [Figure 3] Figure 3 is a view of the photographing housing as seen from the Y-axis direction. [Figure 4] Figure 4 is a plan view of the photographing housing. [Figure 5] Figure 5 is a bottom view of the photographing housing. [Figure 6] Figure 6 is a diagram conceptually showing an example of the characteristics of the diffusion member. [Figure 7] Figure 7 is a front view with the irradiation aperture facing forward. [Figure 8] Figure 8 is a front view with the irradiation aperture facing forward. [Figure 9] Figure 9 is a diagram explaining the diffusion degree of the light of the first light source according to the position of the movable plate. [Figure 10] Figure 10 is a cross-sectional view in the direction of the optical axis L of the lens device attached to the multi-spectrum camera. [Figure 11] Figure 11 is a conceptual diagram explaining the inspection device. [Figure 12] Figure 12 is a perspective view of the photographing housing. [Figure 13] Figure 13 is a diagram showing the spectral data of the halogen lamp. [Figure 14] Figure 14 is a diagram showing the spectral data of the metal halide lamp.

Embodiments for Carrying Out the Invention

[0019] Hereinafter, preferred embodiments of the photographing housing and the inspection device according to the present invention will be described with reference to the accompanying drawings.

[0020] <The First Embodiment> Figure 1 is a conceptual diagram explaining the inspection device of the present embodiment.

[0021] The inspection device 1 includes a control unit 3, an imaging device 10, a first light source 20, and a photographing housing 100.

[0022] The imaging housing 100 is equipped with an imaging device 10 and a first light source 20, and the workpiece S to be inspected is placed inside the imaging housing 100.

[0023] The imaging device 10 is detachably attached to the imaging housing 100 and photographs the workpiece S, which is the object to be inspected. For example, a multispectral camera or a hyperspectral camera can be used as the imaging device 10. By photographing the workpiece S with the imaging device 10 and analyzing the obtained data, the workpiece S can be inspected. The imaging device 10 is attached to the imaging housing 100 and photographs the workpiece S in the imaging space covered by the imaging housing 100 (housing 111).

[0024] The first light source 20 is an illumination device that irradiates light onto the workpiece S. The first light source 20 can be a halogen lamp, a metal halide lamp, an LED (Light Emitting Diode) lamp, or the like. The first light source 20 is attached to the imaging housing 100 by a first light source mounting section (light source mounting section) 113 (Figure 2).

[0025] The control unit 3 is a computer, and its CPU (Central Processing Unit: processor) executes programs stored in memory to control the operation of the imaging device 10 and the first light source 20. For example, the control unit 3 controls the start and end of imaging by the imaging device 10. Also, for example, the control unit 3 acquires and analyzes still image or video data of the workpiece S acquired by the imaging device 10 and outputs inspection results. Also, for example, the control unit 3 controls the ON / OFF of the power to the first light source 20. In addition to these, the control unit 3 can comprehensively control the operation of the inspection device 1.

[0026] <<Filming cabinet>> Next, we will describe the imaging housing 100 provided in the inspection device 1.

[0027] Figures 2 to 5 illustrate the imaging housing 100. Figure 2 is a perspective view of the imaging housing 100, Figure 3 is a view of the imaging housing 100 from the Y-axis direction, Figure 4 is a plan view of the imaging housing 100, and Figure 5 is a bottom view of the imaging housing 100. Note that in Figure 3, some components are shown with dashed lines (two-dot lines). Also, in Figure 5, panel 101E is omitted.

[0028] As shown in Figure 2, the imaging housing 100 comprises a housing 111, an imaging device mounting section 125, and a first light source mounting section (light source mounting section) 113.

[0029] <<Enclosure>> The housing 111 preferably has a box-like shape, such as a cube or rectangular parallelepiped. The housing 111 is composed of a panel frame 103 and panels (101A, 101B, 101C, 101D, 101E) attached to the panel frame 103. Specifically, panel 101A is provided on the top surface of the housing 111, panel 101E is provided on the bottom surface of the housing 111, and panels 101B, 101C, and 101D are provided on three of the four sides of the housing 111 (see Figures 2 and 3). An illumination aperture T (second aperture) for irradiating light from the first light source 20 is formed on the one side of the housing 111 that does not have a panel (second surface) (see Figure 2). The aperture area of ​​the illumination aperture T is changed by a movable plate 107, as will be explained later. The movable plate 107 is attached to the panel frame 103 and the movable plate 107 by movable plate mounting parts 105A and 105B provided on the movable plate 107, respectively (see Figure 2). The movable plate 107 can be moved in the vertical direction (positive and negative directions of the Z axis). By moving the movable plate 107, the degree of light diffusion of the first light source 20 can be changed. Figures 2 and 3 show the state in which the movable plate 107 is positioned on the lower side. On the other hand, when the movable plate 107 is positioned on the upper side, the movable plate mounting parts 105A and 105B are attached on the upper side (positive side of the Z axis).

[0030] A lens aperture U (first aperture) is provided on the top surface of the housing 111 (the surface formed by panel 101A: first surface) (see Figures 3 and 5). The lens barrel (lens) 10a of the imaging device 10 is positioned to face the lens aperture U (see Figure 5). The imaging device 10 is installed facing downwards (in the negative Z-axis direction) and takes images of the workpiece S placed on the bottom surface of the housing 111 (the surface formed by panel 101E). An imaging device hood 117 is provided on the lens aperture U on panel 101A (see Figure 3). The imaging device hood 117 functions as a light shield for the imaging device 10 and assists in proper imaging by the imaging device 10. The top surface (first surface) and the side surface (second surface) of the housing 111 intersect.

[0031] <<Diffusion Member>> The interior of the housing 111 is provided with diffusion members. Specifically, panels 101A to 101E are composed of diffusion plates. In addition, the inner surface of the movable plate 107 (the surface opposite to the surface facing the first light source 20) is also provided with a diffusion member. Specifically, it is composed of a diffusion plate similar to that of panels 101A to 101E.

[0032] Figure 6 is a conceptual diagram illustrating an example of the characteristics of the diffusion material used in the housing 111. The vertical axis represents wavelength intensity, and the horizontal axis represents wavelength.

[0033] Considering that a multispectral camera or a hyperspectral camera is used as the imaging device 10, it is preferable to use a diffusion member having similar wavelength intensity at least between the wavelengths used in the imaging device 10. For example, as shown in Figure 6, it is preferable to use a diffusion member having flat wavelength intensity characteristics in a predetermined wavelength band. By using such a diffusion member in the housing 111, errors in the data obtained at each wavelength can be suppressed. The diffusion member is provided in the imaging housing 100 in a replaceable manner. Specifically, panels 101A to 101E are provided in the panel frame 103 by an insertion / removal mechanism (not shown), and panels 101A to 101E are replaceable. In addition, panel 101E, which is provided at the bottom of the imaging housing 100, is removable. By removing panel 101E and installing the imaging housing 100 on top of a belt conveyor, it is possible to inspect workpieces S that are continuously transported by the belt conveyor.

[0034] <<Light source mounting section>> The first light source 20 is attached to the imaging housing 100 by the first light source mounting section 113. The first light source mounting section 113 has a changing mechanism 113a that can change the orientation of the first light source 20 (see Figures 2 and 3). The first light source 20 illuminates the illumination aperture T by changing its orientation using the changing mechanism 113a. The orientation of the first light source 20 can be changed manually or automatically.

[0035] <<Imaging device mounting section>> The imaging device 10 is detachably attached to the housing 111 by an imaging device mounting section 125 provided on the panel 101A. The imaging device mounting section 125 consists of a first mounting member 110A, a second mounting member 110B, a mounting plate 110C, a tripod head 110D, and a height adjustment mechanism 110E (see Figures 2 and 4). Two pairs of the first mounting members 110A are provided on the panel 101A and the panel frame 103, running parallel to each other. Two pairs of the second mounting members 110B are provided on the first mounting members 110A, running parallel to each other and perpendicular to the first mounting members 110A. The lower end of the mounting plate 110C is attached to the second mounting member 110B, and the upper end of the mounting plate 110C is attached to the tripod head 110D (shooting direction adjustment mechanism). The tripod head 110D is attached to the body of the imaging device 10 and can adjust the shooting direction of the imaging device 10. Furthermore, a height adjustment mechanism 110E is attached to the body of the imaging device 10. The height adjustment mechanism 110E can adjust the height (displacement in the Z-axis direction) of the imaging device 10.

[0036] <<Movement of the movable plate>> Next, we will explain the irradiation aperture T which is changed by the movement of the movable plate 107. As the movable plate 107 moves, the aperture region of the irradiation aperture T into which the light from the first light source 20 enters changes. This makes it possible to change the degree of diffusion of the light from the first light source 20 that irradiates the workpiece S.

[0037] In inspections using the imaging device 10, shadows may occur in the imaging range, and if these shadows are captured, they may lead to false detections during inspection. Therefore, by diffusing the light from the first light source 20 and irradiating the workpiece S with it, shadow generation can be suppressed, allowing for more accurate inspections. On the other hand, when a multispectral camera (or polarized multispectral camera) is used in the imaging device 10, the attenuation of light intensity is greater than with a general camera because it handles input and polarization of only specific wavelengths. Therefore, when a multispectral camera (or polarized multispectral camera) is used in the imaging device 10, it may be possible to perform more accurate inspections by irradiating the workpiece S with the light from the first light source 20 as direct light rather than as diffused light.

[0038] Therefore, in the technology disclosed herein, the movable plate 107 is moved to change the aperture area of ​​the irradiation aperture T, and the degree of diffusion is changed according to the shape of the workpiece S and the required amount of light from the multispectral camera used in the imaging device 10. As a result, the inspection device 1 can achieve highly accurate inspection.

[0039] Figures 7 and 8 are front views with the irradiation aperture T facing forward. Figure 7 shows the case where the movable plate 107 is positioned on the lower side, and Figure 8 shows the case where the movable plate 107 is positioned on the upper side.

[0040] When the movable plate 107 is positioned downwards, the irradiation aperture T is positioned upwards (see Figure 7). Conversely, when the movable plate 107 is positioned upwards, the irradiation aperture T is positioned downwards (see Figure 8). The movable plate 107 can be moved manually or automatically. In the case shown in Figure 2, the movable plate 107 is moved manually, and the movable plate 107 is attached downwards by movable plate mounting parts 105A and 105B, which are made of magnets.

[0041] The position of the movable plate 107 is determined according to the height of the workpiece S. Specifically, if the height of the workpiece S is above a threshold, the movable plate 107 is moved downwards, and if the height of the workpiece S is below the threshold, the movable plate 107 is moved upwards. The height of the workpiece S can be measured by various methods. For example, the height of the workpiece S may be measured manually using a scale or the like. Alternatively, the height of the workpiece S may be measured using a LiDER (Light detection and ranging) sensor. Furthermore, if the imaging device 10 is a compound-eye type, the height of the workpiece S may be measured using the imaging device 10. Also, if the imaging device 10 is a polarized multispectral camera (Figure 10) which will be explained later, the height of the workpiece S may be estimated using positional shift due to pupil division or from the left and right perspective shapes.

[0042] Next, we will explain the degree of diffusion of the light beam of the first light source 20 according to the position of the movable plate 107.

[0043] Figure 9 is a diagram illustrating the degree of light diffusion of the first light source 20 according to the position of the movable plate 107.

[0044] Figure 9(A) shows a case where the height of the workpiece S is above a threshold, making it likely for shadows to be generated on the workpiece S. In such cases, the generation of shadows is suppressed by increasing the light diffusion of the first light source 20 and irradiating the workpiece S with it. Specifically, by moving the movable plate 107 downwards to form an irradiation aperture T at the top and irradiating the workpiece S with light from the first light source 20 toward the irradiation aperture T, the workpiece S can be irradiated with light with high diffusion.

[0045] In Figure 9(B), the height of the workpiece S is below the threshold, and shadows of the workpiece S are unlikely to occur. On the other hand, a multispectral camera is used as the imaging device 10, and it is preferable to illuminate the workpiece S with sufficient light. In such cases, the light from the first light source 20 is directly irradiated onto the workpiece S. Specifically, by moving the movable plate 107 upward to form an irradiation aperture T at the bottom and irradiating the first light source 20 toward the irradiation aperture T, the workpiece S can be directly irradiated with light.

[0046] As explained above, the imaging housing 100 of the inspection device 1 allows the degree of light diffusion of the first light source 20 to be changed by moving the movable plate 107, and the light can be irradiated onto the workpiece S. Specifically, the degree of light diffusion can be increased to suppress the occurrence of shadows on the workpiece S for inspection, or the degree of light diffusion can be decreased to directly illuminate the workpiece S for inspection. As a result, the inspection device 1 can properly photograph the workpiece S with the imaging device 10, and perform inspections with high accuracy.

[0047] <Second Embodiment> Next, a second embodiment will be described. The inspection apparatus 1 of this embodiment includes a first light source 20 and a second light source 21.

[0048] First, we will explain a multispectral camera used as an example of an imaging device 10.

[0049] The brightness information of a multispectral camera is determined by "ambient light," "BPF (Band-pass filter) spectral characteristics," and "sensor sensitivity." During the manufacturing of a multispectral camera, BPF and ND (Neutral Density) filters are stacked and adjusted to ensure that the brightness levels of each selected wavelength are uniform.

[0050] Figure 10 is a cross-sectional view of the lens device attached to the multispectral camera in the optical axis L direction. The multispectral camera used as an example of the imaging device 10 is a pupil-splitting type, in which multiple bandpass filters are arranged at or near the pupil position, as will be explained below.

[0051] The lens device 200 has a single imaging optical system consisting of a first lens 210 and a second lens 220 arranged in the lens barrel 10a. Zoom and / or focus are adjusted by moving the first lens 210 and the second lens 220 in the direction of the optical axis L. The first lens 210 and the second lens 220 may also be a lens group consisting of multiple lenses. In addition, a slit 208 is formed in the lens barrel 10a at the pupil position (near the pupil) of the lens device 200, and an optical member 130 is inserted into this slit 208.

[0052] The optical component 130 comprises an ND filter 129A, a frame 129B, a bandpass filter 129C, and a polarizing filter 129D. The optical component 130 can be inserted into and removed from the lens barrel 10a. The frame 129B is provided with four windows (aperture areas). Corresponding to these four windows, the bandpass filter 129C and the polarizing filter 129D transmit different types of light. The light that has passed through the lens device 200 is received by a dedicated image sensor, allowing for the simultaneous acquisition of four imaging data (images) with different wavelengths.

[0053] Furthermore, different optical components 130 with varying characteristics can be used depending on the characteristics of the light source (or subject). The amount of light corresponding to each of the four windows can also be adjusted by changing the filters of the optical component 130 (ND filter 129A, bandpass filter 129C, and polarizing filter 129D). However, adjusting the light intensity for each of the four windows by stacking or selecting filters is cumbersome. Moreover, even after adjustment, changes in ambient light necessitate readjustment, posing a problem in terms of versatility.

[0054] In this embodiment, the spectral weights of the first light source 20 and the second light source 21 (Figure 11) are changed to adjust the amount of light for each wavelength, according to the wavelength selection in the multispectral camera.

[0055] Figure 11 is a conceptual diagram illustrating the inspection apparatus 1 of this embodiment. Note that parts already explained in Figure 1 are denoted by the same reference numerals and their explanations are omitted.

[0056] The inspection device 1 comprises a control unit 3, an imaging device 10, a first light source 20, a second light source 21, a shooting housing 100, a first intensity changing mechanism 5, and a second intensity changing mechanism 7.

[0057] The second light source 21, like the first light source 20, is an illumination device that irradiates light onto the workpiece S. It is preferable that different types of light sources are used for the first light source 20 and the second light source 21. For example, a halogen lamp may be used for the first light source 20, and a metal halide lamp may be used for the second light source 21.

[0058] The control unit 3 controls the ON / OFF status of the first light source 20 and the second light source 21. The control unit 3 also changes the light intensity of the first light source 20 via the first intensity changing mechanism 5. The control unit 3 also changes the light intensity of the second light source 21 via the second intensity changing mechanism 7. The first intensity changing mechanism 5 and the second intensity changing mechanism 7 can change the respective light intensity of the first light source 20 and the second light source 21 by known techniques.

[0059] Figure 12 is a diagram illustrating the imaging housing 100 provided in the inspection device 1 of this embodiment. Figure 12 is a perspective view of the imaging housing 100. Note that parts that have already been explained in Figure 2 are denoted by the same reference numerals and their explanations are omitted.

[0060] The second light source 21 is provided on the upper surface of the housing 111 (the surface formed by the panel 101A). In the illustrated diagram, four second light sources 21 are provided. The second light sources 21 are attached by a second light source mounting section (light source mounting section) 121. Specifically, the upper end of the second light source mounting section 121 is connected to the second mounting member 110B, and the lower end is attached to the second light source 21.

[0061] If a second light source 21 is provided, the panel 101A is made of a transparent or translucent diffuser plate.

[0062] Next, specific examples of light sources used in the first light source 20 and the second light source 21 will be described.

[0063] Figure 13 shows the spectral data of the halogen lamp used as the first light source 20. The horizontal axis represents wavelength, and the vertical axis represents intensity.

[0064] As shown in Figure 13, halogen lamps exhibit intensity at longer wavelengths. Therefore, if you want to increase intensity at longer wavelengths depending on the wavelength selected for the multispectral camera, increase the light intensity of the first light source 20. This allows you to adjust the light intensity corresponding to the longer wavelength imaging data acquired by the multispectral camera.

[0065] Figure 14 shows the spectral data of the metal halide lamp used as the second light source 21. The horizontal axis represents wavelength, and the vertical axis represents intensity.

[0066] As shown in Figure 14, metal halide lamps have intensity at shorter wavelengths. Therefore, if you want to have intensity at shorter wavelengths depending on the wavelength selected for the multispectral camera, increase the light intensity of the second light source 21. This allows you to adjust the light intensity corresponding to the short-wavelength imaging data acquired by the multispectral camera.

[0067] As described above, according to the inspection device 1 of this embodiment, the imaging housing 100 is equipped with a first light source 20 and a second light source 21, and the control unit 3 changes the light intensity of the first light source 20 and the second light source 21, respectively, using a first intensity changing mechanism 5 and a second intensity changing mechanism 7. As a result, the inspection device 1 does not need to adjust the light intensity with an ND filter or the like, and can perform inspections with an appropriate light intensity depending on the environment in which the inspection is performed.

[0068] In the above embodiment, the hardware structure of the processing unit (control unit 3) that performs various processes is a variety of processors as shown below. These various processors include a CPU (Central Processing Unit), which is a general-purpose processor that executes software (programs) and functions as a processing unit; a Programmable Logic Device (PLD), such as an FPGA (Field Programmable Gate Array), which is a processor whose circuit configuration can be changed after manufacturing; and a dedicated electrical circuit, such as an ASIC (Application Specific Integrated Circuit), which is a processor with a circuit configuration specifically designed to perform a particular process.

[0069] A single processing unit may be composed of one of these various processors, or it may be composed of two or more processors of the same or different type (for example, multiple FPGAs, or a combination of a CPU and an FPGA). Alternatively, multiple processing units may be composed of a single processor. Examples of composing multiple processing units with a single processor include, firstly, a configuration where one or more CPUs and software are combined to form a single processor, and this processor functions as multiple processing units, as is typical of computers such as client and server systems. Secondly, a configuration using a processor that realizes the functions of the entire system, including multiple processing units, on a single IC (Integrated Circuit) chip, as is typical of System-on-a-Chip (SoC) systems. Thus, various processing units are configured, in terms of hardware structure, using one or more of the above-mentioned various processors.

[0070] Furthermore, the hardware structure of these various processors is, more specifically, an electrical circuit composed of circuit elements such as semiconductor devices.

[0071] Each of the above-described configurations and functions can be appropriately implemented using any hardware, software, or a combination thereof. For example, the present invention can also be applied to a program that causes a computer to execute the above-described processing steps (processing procedures), a computer-readable recording medium (non-temporary recording medium) that records such a program, or a computer on which such a program can be installed.

[0072] Although examples of the present invention have been described above, it goes without saying that the present invention is not limited to the embodiments described above, and various modifications are possible without departing from the spirit of the invention. [Explanation of Symbols]

[0073] 1: Inspection device 3: Control Unit 5: First strength change mechanism 7: Second strength adjustment mechanism 10: Imaging device 10a: Lens barrel 20: 1st light source 21:Second light source 100: Camera housing for shooting 101A: Panel 101B: Panel 101C: Panel 101D: Panel 101E: Panel 103: Panel frame 107: Movable plate 110A: First mounting member 110B: Second mounting member 110C: Mounting plate 110D: Panhead 110E: Height adjustment mechanism 111: Cabinet 113: First light source mounting section 113a: Change mechanism 117: Hood for imaging device 121: Second light source mounting section 125: Mounting section for imaging device 129A: ND filter 129B: Frame 129C: Bandpass filter 129D: Polarizing filter 130: Optical components 200: Lens device 202: Lens barrel 208: Slit 210: First lens 220: The second lens L: Optical axis S: Work T: Irradiation aperture U: Lens aperture

Claims

1. The system comprises a housing that covers the shooting space, an imaging device mounting section on the first surface of the housing to which an imaging device is attached, and a light source mounting section provided on the second surface of the housing that intersects with the first surface, to which a first light source that illuminates the inside of the housing is attached. The housing has a diffusing member inside, a first aperture facing the lens of the imaging device on the first surface, a second aperture on the second surface, and a movable plate that changes the aperture region of the second aperture into which light from the first light source enters. The light source mounting section is a photographic housing having a changing mechanism in the aperture region that can change the direction of the first light source.

2. The imaging housing according to claim 1, wherein the diffusion member is replaceable.

3. The photographic housing according to claim 1 or 2, wherein the housing is provided with an insertion / removal mechanism, and the diffusion member is provided in the housing by the insertion / removal mechanism.

4. The imaging housing according to claim 1, wherein the diffusion member attached to the bottom of the housing is removable.

5. The imaging housing according to claim 1, wherein a hood for an imaging device is provided on the first surface of the housing.

6. The imaging housing according to claim 1, wherein the imaging device mounting portion is detachably to which the imaging device is attached.

7. The imaging housing according to claim 1, wherein the imaging device mounting portion has an imaging direction adjustment mechanism for adjusting the imaging direction of the imaging device.

8. The imaging housing described in claim 1, The imaging device provided in the imaging device mounting section, The first light source provided in the light source mounting section, An inspection device equipped with the following features.

9. The light source mounting section consists of a first light source mounting section and a second light source mounting section. The first light source is provided in the first light source mounting section. The inspection apparatus according to claim 8, wherein a second light source is provided in the second light source mounting section.

10. The inspection apparatus according to claim 9, further comprising an intensity changing mechanism for changing the wavelength intensity of the first light source and the second light source.

11. The inspection apparatus according to any one of claims 8 to 10, wherein the first light source is a halogen lamp and the second light source is a metal halide lamp.

12. The imaging device is a multispectral camera. The inspection apparatus according to claim 8, wherein the multispectral camera is a pupil-splitting type, having multiple bandpass filters arranged at or near the pupil position.

Images