UV resist, UV resist patterning methods and applications
The ultraviolet resist composition with zirconium oxide nanoclusters addresses the limitations of high exposure doses and low sensitivity in current resists, achieving improved sensitivity and mechanical properties for precise photolithography.
Patent Information
- Application Number
- JP2024571260
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2022-06-21
- Filing Date
- 2023-04-11
- Publication Date
- 2026-07-02
- Estimated Expiration
- 2043-04-11
AI Technical Summary
Current ultraviolet resists used in semiconductor manufacturing require high exposure doses and have low sensitivity, limiting the resolution and efficiency of photolithography processes.
An ultraviolet resist composition comprising zirconium oxide nanoclusters and a photosensitizer, which allows for reduced exposure doses and improved sensitivity, enabling smaller line widths and higher fidelity patterns.
The use of zirconium oxide nanoclusters as a film-forming resin in ultraviolet resists results in reduced exposure doses, improved sensitivity, and enhanced mechanical properties, allowing for precise and efficient photolithography with minimal pattern deformation.
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Abstract
Citation Information
Patent Citations
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