Information processing system, information processing method, and information processing program

Abstract

Provided are an information processing system, an information processing method, and an information processing program by which it is possible to more easily analyze a defect existing in a laminate including a non-transparent web.　This information processing system comprises: an acquisition unit 511 that acquires first feature point information pertaining to a feature point existing in a first web and second feature point information pertaining to a feature point existing in a laminate obtained by laminating a non-transparent second web on the first web; a comparison unit 513 that compares the acquired first feature point information and the second feature point information; and an output unit 514 that outputs comparison information pertaining to the result of comparing the first feature point information and the second feature point information.

Description

Information processing system, information processing method, and information processing program

[0001] The present invention relates to an information processing system, an information processing method, and an information processing program.

[0002] Optical films are used in displays such as liquid crystal display devices. A web of the optical film or the like is composed of a laminate of multiple webs. In the manufacturing process of such optical films or the like, strict control is required for defects that occur in the web. For example, Patent Document 1 describes a technique related to defects that occur in the web.

[0003] Japanese Patent Application Laid-Open No. 2022-107419

[0004] A laminate of multiple webs may include an opaque web, such as a protector, separator, or antiglare film. It is often difficult to detect defects in a laminate including an opaque web. Therefore, it is desirable to be able to more easily analyze defects present in a laminate including an opaque web.

[0005] The present invention has been made in consideration of the above circumstances, and aims to provide an information processing system, an information processing method, and an information processing program that can more easily analyze defects present in a laminate including an opaque web.

[0006] The above object of the present invention can be achieved by the following means.

[0007] (1) An information processing system including an acquisition unit that acquires first feature point information regarding feature points present in a first web and second feature point information regarding feature points present in a laminate in which an opaque second web is laminated on the first web; a comparison unit that compares the acquired first feature point information with the acquired second feature point information; and an output unit that outputs comparison information regarding the comparison result between the first feature point information and the second feature point information.

[0008] (2) The comparison unit classifies, through the comparison, the feature points present on the first web and the feature points present on the laminate into first type feature points that are present on the first web and disappear in the laminate, second type feature points that are not present on the first web but appear in the laminate, and third type feature points that are present on the first web and remain in the laminate, and the comparison information includes information on at least one of the first type feature points, the second type feature points, and the third type feature points.

[0009] (3) The information processing system described in (1) above, wherein the acquisition unit further acquires third feature point information present in the second web, and the comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

[0010] (4) An information processing system as described in (1) above, further comprising an alignment unit that matches feature points present on the first web with feature points present on the laminate based on their relative positions, and the comparison unit uses the result of the matching to compare the first feature point information with the second feature point information.

[0011] (5) The information processing system according to (1), wherein the output unit outputs the comparison information by displaying the comparison information on a display unit.

[0012] (6) The information processing system according to (1) above, wherein the first web has a laminated structure of multiple webs.

[0013] (7) The information processing system according to (1), wherein the second web includes at least one of a protector, a separator, or an anti-glare film.

[0014] (8) The information processing system according to (1) above, wherein the second web has a haze of 5% or more.

[0015] (9) An information processing method including: acquiring first feature point information relating to feature points present in a first web and second feature point information relating to feature points present in a laminate in which an opaque second web is laminated on the first web; comparing the acquired first feature point information with the acquired second feature point information; and outputting comparison information relating to the comparison result between the first feature point information and the second feature point information.

[0016] (10) An information processing program that causes a computer to execute the information processing method described in (9) above.

[0017] In the information processing system, the information processing method, and the information processing program according to the present invention, the first feature information and the second feature information are compared, and comparison information regarding the comparison result is output. This allows, for example, a production manager or the like to easily grasp the feature points present in the laminate including the opaque second web that remain from the state of the first web, thereby making it possible to more easily analyze defects present in the laminate including the opaque web.

[0018] Advantages and features provided by one or more embodiments of the present invention will be more fully understood from the following detailed description and the accompanying drawings, which are intended for purposes of illustration only and are not intended to define limitations of the present invention.

[0023] FIG. 1 is a schematic diagram illustrating an application example of an information processing system according to a first embodiment.

[0024] FIG. 2 is a cross-sectional view illustrating an example of the configuration of the first stack and the second stack illustrated in FIG. 1.

[0025] FIG. 3A is a schematic diagram illustrating an example of the configuration of the inspection device illustrated in FIG. 1.

[0026] FIG. 3B is a schematic diagram illustrating another configuration of the inspection device illustrated in FIG. 3A.

[0027] FIG. 3C is a block diagram illustrating a schematic configuration of the terminal device illustrated in FIG. 1.

[0028] FIG. 4 is a table for explaining classification of feature points present in each of the first stack and the second stack illustrated in FIG. 2.

[0029] FIG. 5 is a block diagram illustrating a schematic configuration of the information processing system illustrated in FIG. 1.

[0030] FIG. 6 is an example of a user list stored in the memory unit illustrated in FIG. 6.

[0031] FIG. 7 is an example of a lot list stored in the memory unit illustrated in FIG. 6.

[0032] FIG. 7 is another example of an inspection data DB stored in the memory unit illustrated in FIG. 6.

[0033] FIG. 8 is another example of an inspection data DB stored in the memory unit illustrated in FIG. 6.

[0034] FIG. 9 is a diagram illustrating a comparison result between first feature point information and second feature point information by the control unit illustrated in FIG. 6. 14 is a flowchart showing an example of processing executed by the information processing system shown in FIG. 1. FIG. 15 is a subroutine flowchart of the processing of step S33 shown in FIG. 10. FIG. 16 is a subroutine flowchart executed by the information processing system according to a second embodiment. FIG. 17 is a diagram showing an example of a probability density function calculated by kernel density estimation shown in FIG. 12. FIG. 18 is a cross-sectional view showing an example of the configuration of a laminate to which an information processing system according to a third embodiment is applied. FIG. 19 is a schematic diagram showing an example of a manufacturing process of the laminate shown in FIG.

[0019] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, the scope of the present invention is not limited to the disclosed embodiments. In the description of the drawings, the same elements are denoted by the same reference numerals, and duplicate explanations will be omitted. Furthermore, the dimensional proportions in the drawings are exaggerated for the convenience of explanation and may differ from the actual proportions.

[0020] First Embodiment FIG. 1 is a schematic diagram illustrating an application example of an information processing system 50 according to a first embodiment. The information processing system 50 is configured with, for example, a server. The information processing system 50 is connected to a terminal device 70 in a factory 100 via a network. The network is a communication line such as a data communication network. Some networks may use a wired LAN or a wireless LAN. The wireless LAN is, for example, a LAN conforming to the IEEE 802.11 standard. The information processing system 50 may be connected to another factory via the network. In the factory 100, a manufacturing apparatus 2000 manufactures a first laminate 80A into a second laminate 80B. The second laminate 80B is wound, for example, into a roll. Here, the first laminate 80A corresponds to a specific example of a first web of the present invention, and the second laminate 80B corresponds to a specific example of a laminate of the present invention.

[0021] FIG. 2 shows an example of the cross-sectional configuration of the first laminate 80A and the second laminate 80B. The first laminate 80A includes a first web 81, a second web 82, and a third web 83. In the first laminate 80A, the first web 81, the second web 82, and the third web 83 are laminated in this order. An adhesive layer 801 is provided between the first web 81 and the second web 82. An adhesive layer 802 is provided between the second web 82 and the third web 83. The first web 81 and the third web 83 are, for example, TAC films. TAC is an abbreviation for triacetyl cellulose. The second web 82 is, for example, an optically functional film such as a polarizer. The adhesive layer 801 bonds the first web 81 and the second web 82 together. The adhesive layer 802 bonds the second web 82 and the third web 83 together. The first laminate 80A is an opaque web, and has a haze of, for example, 5% or more. This haze indicates the total haze.

[0022] The second laminate 80B includes the first laminate 80A and a fourth web 84. The fourth web 84 is bonded to the third web 83, for example, via an adhesive layer 803. The fourth web 84 is an opaque web, for example, having a haze of 5% or more. The fourth web 84, for example, irregularly reflects and scatters light on its surface. Here, the fourth web 84 corresponds to a specific example of the second web of the present invention. The fourth web 84 is, for example, a protector. After the fourth web 84 is bonded to the first laminate 80A, for example, the second laminate 80B is slit. At this time, the surface of the first laminate 80A is protected by the fourth web 84, preventing scratches and the like from occurring on the surface of the first laminate 80A. The fourth web 84 may be a separator, etc. In the second laminate 80B, an adhesive layer may be provided instead of the adhesive layers 801, 802, and 803.

[0023] [Factory 100] In the factory 100, for example, the second laminate 80B is produced by bonding the fourth web 84 to the first laminate 80A via an adhesive layer 803. The first laminate 80A may be produced in the factory 100 or in another factory. The width of the second laminate 80B is, for example, in the range of 1,000 mm to 5,000 mm. The thickness of each of the first web 81, the second web 82, the third web 83, and the fourth web 84 is set to, for example, in the range of 15 μm to 500 μm, taking into consideration quality, handling, and the like. When the first web 81, the second web 82, the third web 83, or the fourth web 84 contains a metal such as steel, the thickness of the first web 81, the second web 82, the third web 83, or the fourth web 84 may be 1 mm or more. The length of the roll-shaped second laminate 80B is, for example, in the range of 2,000 m to 10,000 m.

[0024] In the factory 100, the second stack 80B is inspected. For example, the surface of the second stack 80B is inspected by an inspection device 90. The inspection device 90 includes, for example, a camera. Inspection data of the second stack 80B is generated by the optical inspection by the inspection device 90. This inspection data includes second feature point information related to feature points present in the second stack 80B.

[0025] Here, the feature points present in the second laminate 80B are optical feature points present in the web, specifically, spots that are optically different from their surroundings. Note that a predetermined threshold may be set to determine the optical difference from the surroundings, and features exceeding that threshold may be considered feature points. Feature points present in the web may also be referred to as web defects, malfunctions, or failures. Feature points include, for example, defects caused by poor adhesion when bonding multiple webs together and defects caused by axial unevenness. For example, ultrasonic welding is used to bond multiple webs together. For example, tens to tens of thousands of feature points can be detected from image data captured of a single second laminate 80B. The total length of the second laminate 80B is, for example, several hundred meters to several kilometers. Note that multiple defects, malfunctions, and failures within a specified area (e.g., a 10 mm square) may be considered a single feature point.

[0026] The second feature point information regarding the feature points present in the second stack 80B includes, for example, information regarding the position, size, etc. of each of the multiple feature points present in the second stack 80B. The position of the feature point can be expressed using, for example, XY coordinates. In the second feature point information, multiple adjacent feature points may be clustered.

[0027] The inspection device 90 that detects feature points present in the second stack 80B is a transmission type or reflection type inspection device. The transmission type inspection device 90 irradiates the second stack 80B with light and receives the light that has passed through the second stack 80B. The reflection type inspection device 90 irradiates the second stack 80B with light and receives the light that has been reflected by the second stack 80B. The transmission type inspection device and the reflection type inspection device each include a bright-field type inspection device and a dark-field type inspection device. A plurality of inspection devices 90 may be installed in the factory 100.

[0028] 3A and 3B show an example of the configuration of a reflective inspection device 90. Fig. 3A shows the configuration of this inspection device 90 as viewed from the width direction of the second stack 80B. Fig. 3B shows the configuration of this inspection device 90 as viewed from the conveyance direction of the second stack 80B. The inspection device 90 includes, for example, a light source 91, a camera 92, an analysis unit 93, and a memory unit 94.

[0029] In the inspection device 90, cameras 92 capture images of the surface of the second laminate 80B to generate image data. The number of cameras 92, the angle of view, the distance to the surface of the second laminate 80B, etc. are appropriately set so that the entire width of the second laminate 80B is captured. Fig. 3B shows an inspection device 90 having two cameras 92 in the width direction.

[0030] The light source 91 irradiates the inspection area of ​​the second laminate 80B with light. The light source 91 irradiates the light uniformly in the width direction of the roll-shaped second laminate 80B. Here, irradiating the light uniformly means that the illuminance of the irradiated light is approximately the same.

[0031] The camera 92 is an optical sensor that optically reads the inspection area of ​​the second stack 80B. The camera 92 has an imaging element such as a CCD or CMOS, a lens, etc. CCD is an abbreviation for Charge Coupled Device. CMOS is an abbreviation for Complementary Metal Oxide Semiconductor. The camera 92 generates two-dimensional image data from the output signals of each imaging element. The camera 92 detects diffused light among the light irradiated by the light source 91 and reflected by the surface of the second stack 80B. The camera 92 may be a color camera or a monochrome camera. The camera 92 may detect light in the visible light range or infrared light range.

[0032] The camera 92 can read, for example, the entire widthwise range of the second stack 80B at once. The contrast of the image data captured by the camera 92 is preferably equal to or greater than a predetermined value. In other words, it is desirable that the area of ​​the second stack 80B irradiated with light from the light source 91 and the area not irradiated with light have a contrast equal to or greater than a predetermined value. In order to generate image data having a contrast equal to or greater than a predetermined value, it is desirable to use a light source 91 that is strong and has high linearity.

[0033] Here, "strong" means that, for example, when the illuminance at an irradiation distance of 50 mm is E50, the illuminance E50 is 50,000 lx or more. Also, "highly directional" means, for example, when the illuminance at an irradiation distance of 50 mm is E50 and the illuminance at an irradiation distance of 100 mm is E100, the relationship (E50-E100) / E50<0.5 is satisfied.

[0034] The camera 92 is disposed, for example, at a position where it receives specularly reflected light of the light emitted from the light source 91. The camera 92 may also be disposed at a position where it avoids specularly reflected light of the light emitted from the light source 91, that is, at a position where it receives diffused light from the second stacked body 80B.

[0035] The analysis unit 93 is composed of a CPU, RAM, etc. The analysis unit 93 reads various processing programs stored in the storage unit 94, loads them into the RAM, and performs various processes in cooperation with the programs. The analysis unit 93 processes image data captured by the camera 92 to detect feature points present in the second stack 80B. For example, the analysis unit 93 performs predetermined image processing on the image data, detects feature points, and quantitatively evaluates each of the detected feature points. For example, known techniques are used for image analysis. Specifically, pixels whose pixel values ​​in the image deviate by a predetermined amount or more from the average value of the surrounding pixels are extracted as feature points. The analysis unit 93 may detect feature points using the following method.

[0036] The analysis unit 93 divides the image data captured by the camera 92 into multiple regions. For example, the analysis unit 93 divides the image data into n regions in the width direction. n may be, for example, several to several tens of regions. Hereinafter, the n regions will be referred to as region a1 to region an.

[0037] Next, the analysis unit 93 acquires image data of one region a1 and performs mathematical processing on the image data of the region a1. The mathematical processing includes, for example, preprocessing, enhancement processing, signal processing, and image feature extraction.

[0038] Preprocessing includes, for example, image cropping, low-pass filtering, high-pass filtering, Gaussian filtering, median filtering, bilateral filtering, morphological conversion, color conversion, contrast adjustment, noise removal, restoration of blurred or blurred images, mask processing, Hough transform, and projective transformation. Color conversion includes, for example, L*a*b*, sRGB, HSV, and HSL.

[0039] The enhancement process includes, for example, a Sobel filter, a Scharr filter, a Laplacian filter, a Gabor filter, and a Canny algorithm.

[0040] Signal processing includes, for example, basic statistics, square root of sum of squares, difference, sum, product, ratio, distance matrix calculation, differential and integral calculus, threshold processing, Fourier transform, wavelet transform, and peak detection. Basic statistics include, for example, maximum, minimum, mean, median, standard deviation, variance, and quartile. Threshold processing includes, for example, binarization and adaptive binarization. Peak detection includes, for example, detection of peak value, peak number, half-width, etc.

[0041] Image feature extraction includes template matching, SIFT features, and the like.

[0042] The analysis unit 93 performs mathematical processing on the image data of the region a1, and then performs threshold processing on the values ​​obtained by this processing. The threshold processing is a process of determining whether or not a point is a feature point based on a predetermined threshold, and determining the size of the feature point, etc.

[0043] The analysis unit 93 performs the same process on areas other than the area a1.

[0044] After processing each of the regions a1 to an, the analysis unit 93 integrates the results for each of the regions a1 to an. As a result, feature points present in each region of the second stack 80B are detected in association with their positions, sizes, etc. The analysis unit 93 then stores the detection results of the feature points of the second stack 80B in the storage unit 94.

[0045] The analysis unit 93 may, for example, combine multiple images obtained by continuous shooting with one camera 92. The analysis unit 93 may, for example, generate one image data of the entire surface of the second stack 80B and store it in the storage unit 94. Alternatively, the analysis unit 93 may generate multiple image data in association with the shooting time and store it in the storage unit 94. The analysis unit 93 may combine multiple image data obtained by multiple cameras 92 lined up in the width direction. The analysis unit 93 may, for example, determine the longitudinal position of the second stack 80B based on the shooting time by referring to the stored transport speed.

[0046] The storage unit 94 is composed of an HDD, an SSD, etc. SSD is an abbreviation for Solid State Drive. The storage unit 94 stores various processing programs and data necessary for executing the programs. For example, the storage unit 94 stores image data captured by the camera 92, linking it to the time of capture. The storage unit 94 stores manufacturing conditions such as the winding speed of the manufacturing apparatus 2000. The manufacturing conditions for the second laminate 80B may be included in a process list of an inspection DB, which will be described later.

[0047] 3C shows an example of a transmission type inspection device 90. In this inspection device 90, a light source 91 is placed at a position facing a camera 92 with the second stack 80B therebetween.

[0048] The inspection device 90 may have multiple inspection units. For example, the camera 92 may include a camera for detecting scratches on the surface of the second stack 80B and a camera for detecting foreign matter inside the second stack 80B. The inspection data may use some of the data from the multiple inspection units, or may use a combination of the results from the multiple inspection units.

[0049] [Configuration of Terminal Device 70] The terminal device 70 is a computer such as a PC, a smartphone, or a tablet terminal. PC is an abbreviation for Personal Computer. The terminal device 70 is configured to be connectable to the information processing system 50. The terminal device 70 transmits and receives various information to and from the information processing system 50. For example, the terminal device 70 is a PC used by an employee of a manufacturing company that operates the factory 100.

[0050] 4 is a block diagram showing a schematic configuration of the terminal device 70. Each terminal device 70 has a CPU 71, a ROM 72, a RAM 73, a storage 74, a communication interface 75, a display unit 76, and an operation reception unit 77. CPU is an abbreviation for Central Processing Unit. ROM is an abbreviation for Read Only Memory. RAM is an abbreviation for Random Access Memory. Each component is connected to each other via a bus 78 so as to be able to communicate with each other.

[0051] The CPU 71 controls the above components and performs various arithmetic processing in accordance with a program recorded in the ROM 72 or the storage 74 .

[0052] The ROM 72 stores various programs and various data.

[0053] The RAM 73 serves as a work area for temporarily storing programs and data.

[0054] The storage 74 stores various programs including an operating system and various data. For example, an application for displaying various information transmitted from the information processing system 50 is installed in the storage 74.

[0055] The communication interface 75 is an interface for communicating with other devices. A wired or wireless communication interface conforming to various standards is used as the communication interface 75. The communication interface 75 is used, for example, when transmitting inspection data from the inspection device 90 to the information processing system 50 and when receiving comparison information (described later) from the information processing system 50.

[0056] The display unit 76 includes, for example, a liquid crystal display or an organic EL display. The display unit 76 displays various information. The display unit 76 may be configured with viewer software, a printer, or the like.

[0057] The operation acceptance unit 77 has, for example, a touch sensor, a pointing device such as a mouse, a keyboard, etc. The operation acceptance unit 77 accepts various operations from the user. Note that the display unit 160 and the operation acceptance unit 77 may form a touch panel by superimposing a touch sensor serving as the operation acceptance unit 77 on the display surface serving as the display unit 76.

[0058] The terminal device 70 may generate the second feature information by performing image analysis on the image data of the second stack 80B captured by the inspection device 90. The terminal device 70 transmits the inspection data including the second feature information to the information processing system 50, for example.

[0059] For example, the terminal device 70 further transmits inspection data of the first stack 80A to the information processing system 50. This inspection data includes first feature point information regarding feature points present in the first stack 80A. The feature points present in the first stack 80A are optically detected, for example, by an inspection device similar to the inspection device 90 described above.

[0060] The inspection data of the first stack 80A may be transmitted from another terminal device to the information processing system 50. The other terminal device is, for example, a terminal device in the factory where the first stack 80A was manufactured.

[0061] The information processing system 50, for example, compares the first feature point information and the second feature point information received from the terminal device 70 and classifies each feature point into three types: first type feature points, second type feature points, and third type feature points.

[0062] 5 is a table for explaining the first, second, and third type feature points. The feature points present in the first stack 80A can be classified, for example, into the first type feature points and the third type feature points. The feature points present in the second stack 80B can be classified, for example, into the second type feature points and the third type feature points.

[0063] The first type characteristic points are characteristic points that are present only in the first laminate 80A and not present in the second laminate 80B. That is, the first type characteristic points are characteristic points that disappear during the lamination process of the fourth web 84. Even if these first type characteristic points are present in the first laminate 80A, they are relatively unlikely to affect processes subsequent to the lamination process of the fourth web 84. In this specification, a characteristic point that does not exist in the web or has disappeared does not necessarily have to have completely disappeared, and the concept also includes a characteristic point that exists as a characteristic point but is unlikely to pose a problem as a defect.

[0064] The second type characteristic points are characteristic points that are not present in the first laminate 80A but are present in the second laminate 80B. That is, the second type characteristic points are characteristic points that are newly generated in the laminating process of the fourth web 84. These second type characteristic points are characteristic points that result from the laminating process of the fourth web 84.

[0065] The third type characteristic points are characteristic points that exist in both the first laminate 80A and the second laminate 80B. That is, the third type characteristic points are characteristic points that are generated in a process prior to the manufacturing process of the first laminate 80A and that remain in the second laminate 80B. These third type characteristic points are characteristic points that are relatively likely to affect processes subsequent to the lamination process of the fourth web 84. Note that the shape, size, etc. of the third type characteristic points may change during the lamination process of the fourth web 84 compared to when they existed in the first laminate 80A. Depending on the lamination process, additional faults may occur.

[0066] For example, the information processing system 50 classifies and stores the feature points present in the first stack 80A and the feature points present in the second stack 80B as first-type feature points, second-type feature points, and third-type feature points. By classifying and storing the feature points as first-type feature points and third-type feature points, it is possible to determine whether the feature points of the first stack 80A remain in the second stack 80B or have disappeared.

[0067] 6 is a block diagram showing a schematic configuration of the information processing system 50. The information processing system 50 includes, for example, a control unit 51, a storage unit 52, and a communication unit 53.

[0068] The control unit 51 includes, for example, a CPU and memories such as RAM and ROM. The CPU is configured with a multi-core processor or the like that controls the above-mentioned units and executes various arithmetic processing in accordance with a program. Each function of the information processing system 50 is realized by the CPU executing the corresponding program. Specific functions of the control unit 51 will be described later.

[0069] The memory unit 52 is a large-capacity auxiliary storage device that stores various programs including an operating system and various data. For example, a hard disk, a solid-state drive, a flash memory, or a ROM is used as the storage. For example, the memory unit 52 stores a user list, a lot list, an inspection data DB, and the like. For example, the manager of the factory 100 manages each of the user list and the lot list. The manager of the factory 100 is, for example, an employee of the manufacturer that operates the factory 100.

[0070] 7A shows an example of a user list. The user list includes information such as the user ID, user name, and contact information of each user. Each user may be assigned access rights to the test data DB, and each user may have access to various data related to a specific web site.

[0071] 7B shows an example of a lot list, which includes information such as the lot ID, product name, delivery destination user ID, manufacturing conditions, size, and manufacturing date for each lot.

[0072] 8A to 8C each show an example of the inspection data DB. The inspection data DB includes, for example, a process list for each manufacturing process of the first stack 80A and the second stack 80B, inspection data for each inspection performed in each manufacturing process, and the like.

[0073] 8A shows an example of a process list. The process list includes information such as the lot ID, the width and length of the web in each process, the process name, the stretch rate of the web, the number of layers of the web, the width direction and the length direction. The process list also includes, for example, information about the inspections performed in each manufacturing process. The information about each inspection is, for example, the inspection ID of each inspection, the inspection device ID of the inspection device used for each inspection, the inspection data, and the inspection date and time. The information about the width direction and the length direction of the web is expressed, for example, by whether the width direction and the length direction of the web are the same as those in the previous process or whether they are reversed.

[0074] 8B and 8C each show an example of inspection data for each inspection included in the process list. FIG. 8B shows an example of inspection data for inspection ID i0101. This inspection data is, for example, inspection data for the first stack 80A. This inspection data includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots of the feature points present in the first stack 80A. In other words, this inspection data includes first feature point information about the feature points present in the first stack 80A.

[0075] 8C shows an example of inspection data with an inspection ID of i0102. This inspection data is, for example, inspection data for the second stack 80B. This inspection data includes, for example, information about the feature point IDs, positions, areas, lengths, widths, maximum brightness, minimum brightness, divisions, and the presence or absence of concentrated dots of the feature points present in the second stack 80B. In other words, this inspection data includes second feature point information about the feature points present in the second stack 80B.

[0076] The positions of the feature points are expressed, for example, by X and Y coordinates based on a predetermined position on each web. The X coordinate is, for example, the coordinate in the width direction of each web and can range from 0 to 3000 mm. The Y coordinate is, for example, the coordinate in the length direction of each web and can range from 0 to 10000 m.

[0077] The classification of feature points represents, for example, the shape and brightness distribution of each feature point. Each feature point is classified into, for example, about 5 to 20 classifications according to its shape and brightness distribution. The presence or absence of concentrated dots represents, for example, whether or not multiple feature points exist around the feature point.

[0078] The inspection data may include inspection data of the fourth web 84. This inspection data includes, for example, information regarding the feature point IDs, positions, areas, lengths, widths, maximum luminance, minimum luminance, classifications, and the presence or absence of concentrated dots of the feature points present on the fourth web 84.

[0079] The communication unit 53 is an interface for connecting to an external device such as a terminal device 70 via a network.

[0080] [Functions of Information Processing System 50] As shown in FIG. 6 , the information processing system 50 functions as an acquisition unit 511, an alignment unit 512, a comparison unit 513, and an output unit 514 by the control unit 51 reading a program stored in the storage unit 52 and executing processing.

[0081] The acquisition unit 511 acquires first feature point information and second feature point information. The first feature point information is information about feature points present in the first stack 80A. The first feature point information includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, classification, and presence or absence of concentrated dots for each of the multiple feature points present in the first stack 80A.

[0082] The second feature point information is information about feature points present in the second stack 80 B. The second feature point information includes, for example, information about the feature point ID, position, area, length, width, maximum brightness, minimum brightness, division, and presence or absence of concentrated dots for each of the multiple feature points present in the second stack 80 B.

[0083] The first feature point information and the second feature point information preferably include at least information regarding the position of each feature point. The position of the feature point is expressed, for example, by XY coordinates based on a predetermined position on each web. The acquisition unit 511 acquires the first feature point information and the second feature point information from, for example, the terminal device 70. The acquisition unit 511 may also acquire the first feature point information and the second feature point information from the storage unit 52.

[0084] The acquiring unit 511 may further acquire third feature point information. The third feature point information is information about feature points present on the fourth web 84. The third feature point information includes, for example, information about each of the plurality of feature points present on the fourth web 84, such as the feature point ID, position, area, length, width, maximum brightness, minimum brightness, classification, and whether or not there is a concentrated dot.

[0085] The alignment unit 512 aligns the X and Y coordinates of the first laminate 80A with the X and Y coordinates of the second laminate 80B. For example, the alignment unit 512 associates a predetermined feature point present in the first laminate 80A with a predetermined feature point present in the second laminate 80B based on their relative positions. This association is made based on the first feature point information and the second feature point information acquired by the acquisition unit 511. This association of the feature points aligns the X and Y coordinates between the first laminate 80A and the second laminate 80B. The alignment unit 512 may also align the X and Y coordinates of the first laminate 80A, the X and Y coordinates of the second laminate 80B, and the X and Y coordinates of the fourth web 84.

[0086] The comparison unit 513 compares the first feature point information and the second feature point information acquired by the acquisition unit 511. The comparison unit 513 compares the first feature point information and the second feature point information using the result of the correspondence by the alignment unit 512. Specifically, the comparison unit 513 classifies the feature points present in the first stack 80A and the feature points present in the second stack 80B into first-type feature points, second-type feature points, and third-type feature points through this comparison. The comparison unit 513 classifies the feature points for the first stack 80A and the second stack 80B, whose X and Y coordinates have been aligned by the alignment unit 512.

[0087] 9 shows an example of a comparison result between the first feature point information and the second feature point information. The comparison unit 513, for example, integrates and compares the feature points present in the first stack 80A and the feature points present in the second stack 80B. The comparison unit 513, for example, assigns new feature point IDs to all of the integrated feature points. The comparison unit 513, for example, classifies the feature points into first-type feature points, second-type feature points, or third-type feature points for each feature point ID. The comparison result may include information regarding the accuracy of the classification of the first-type feature points, second-type feature points, and third-type feature points.

[0088] The comparison unit 513 may compare the first feature point information and the third feature point information acquired by the acquisition unit 511 with the second feature point information.

[0089] The output unit 514 outputs comparison information regarding the result of the comparison between the first feature point information and the second feature point information by the comparison unit 513. The output unit 514 outputs the comparison information by, for example, displaying the comparison information on the display unit 76 of the terminal device 70.

[0090] The output unit 514, for example, displays the feature points present in the first laminate 80A and the feature points present in the second laminate 80B on one screen of the display unit 76. This screen displays the first laminate 80A and the second laminate 80B, whose XY coordinates have been aligned by the alignment unit 512. The output unit 514, for example, displays a predetermined area of ​​the second laminate 80B and an area of ​​the first laminate 80A that corresponds to this predetermined area. The output unit 514, for example, displays the feature points present in the second laminate 80B and the feature points present in the first laminate 80A on the display unit 76 using different colors. The output unit 514 may also display the feature points present in each web included in the first laminate 80A on the display unit 76.

[0091] For example, on one screen, a predetermined area of ​​the second stack 80B and a corresponding area of ​​the first stack 80A may be displayed overlapping each other. On one screen, a predetermined area of ​​the second stack 80B and a corresponding area of ​​the first stack 80A may be displayed side by side.

[0092] The comparison information includes, for example, information on at least one of the first type feature points, the second type feature points, and the third type feature points. The output unit 514 preferably outputs the comparison information so that the first type feature points and the second type feature points are distinguishable from the third type feature points. The output unit 514, for example, causes the display unit 76 to display the first type feature points and the second type feature points and the third type feature points using different colors. The output unit 514 may, for example, cause the display unit 76 to display the first type feature points, the second type feature points, and the third type feature points using different colors.

[0093] The output unit 514 may output comparison information regarding the results of the comparison between the first feature point information and the third feature point information and the second feature point information by the comparison unit 513.

[0094] Fig. 10 is a flowchart showing an example of the procedure for a comparison information output process executed in the information processing system 50. The process of the information processing system 50 shown in the flowchart of Fig. 10 is stored as a program in the storage unit 52 of the information processing system 50, and is executed by the CPU controlling each unit.

[0095] (Step S31) Information processing system 50 acquires inspection data of first stack 80A and inspection data of second stack 80B in response to, for example, an instruction from a user via terminal device 70. This allows information processing system 50 to acquire first feature point information regarding feature points present in first stack 80A and second feature point information regarding feature points present in second stack 80B. Information processing system 50 may acquire the inspection data of first stack 80A and the inspection data of second stack 80B at a predetermined timing.

[0096] (Step S32) The information processing system 50 performs preprocessing on each piece of inspection data to align the coordinate systems of the first stack 80A and the second stack 80B. For example, the information processing system 50 aligns the XY coordinate system of the first stack 80A with the XY coordinate system of the second stack 80B.

[0097] For example, the information processing system 50 may invert the Y coordinate of the first laminate 80A as preprocessing for each piece of inspection data. The information processing system 50 may also invert the X coordinate of the first laminate 80A. The information processing system 50 may convert the X and Y coordinates of the first laminate 80A depending on the elongation ratios of the first laminate 80A and the second laminate 80B, etc.

[0098] The information processing system 50 further performs noise removal processing as preprocessing of each inspection data. The noise removal processing includes, for example, removal of low-intensity feature points, removal of extremely small feature points, and removal of continuous dots. The noise removal processing may also include removal of concentrated dots in the width direction. Concentrated dots in the width direction occur, for example, at the leading and trailing ends of the first stack 80A and the second stack 80B.

[0099] (Step S33) After performing preprocessing on each piece of inspection data, the information processing system 50 performs alignment processing between the coordinate system of the first stack 80A and the coordinate system of the second stack 80B.

[0100] FIG. 11 is a subroutine flowchart showing the alignment process in step S33.

[0101] (Steps S401 to S403) The information processing system 50 first roughly adjusts the XY coordinates of the feature points of the first stack 80A and the second stack 80B as follows. For example, the information processing system 50 first shifts the coordinate position of a predetermined feature point of the first stack 80A by a predetermined amount. Next, the information processing system 50 calculates distances L1 to Lm between the predetermined feature point of the first stack 80A and the corresponding feature point of the second stack 80B, and selects the shift amount (x1, y1) whose sum is the smallest. The information processing system 50 may use an average value instead of the sum. For example, the information processing system 50 determines the feature point of the second stack 80B whose coordinate position is closest to the coordinate position of the predetermined feature point of the first stack 80A as the feature point of the second stack 80B that corresponds to the predetermined feature point of the first stack 80A. If the information processing system 50 cannot determine a feature point of the second stack 80B that corresponds to a specified feature point of the first stack 80A, i.e., if the specified feature point is a first-type feature point, it may exclude this feature point and calculate the sum of the distances L1 to Lm.

[0102] The information processing system 50 sequentially shifts the coordinate positions of predetermined feature points of the first stack 80A from (-shift_x, -shift_y) to (+shift_x, +shift_y) around a central shift amount (0, 0) in increments of a fixed coarse adjustment shift amount a. The information processing system 50 calculates distances L1 to Lm from the coordinate positions of the predetermined feature points of the first stack 80A to feature points 1 to m of the second stack 80B. The information processing system 50 then selects the shift amount (x1, y1) from (-shift_x, -shift_y) to (+shift_x, +shift_y) that minimizes the sum of distances L1 to Lm.

[0103] For example, when the coarse adjustment shift amount a = 1.0 mm, (-shift_x, -shift_y) = (-10 mm, -10 mm), (-shift_x, +shift_y) = (+10 mm, +10 mm). The information processing system 50 may use different units for the X direction and the Y direction for the coarse adjustment shift amount a. For example, the X direction may be expressed in millimeters and the Y direction in meters, so that (-shift_x, -shift_y) = (-10 mm, -10 m), (-shift_x, +shift_y) = (+10 mm, +10 m).

[0104] (Steps S404 to S406) Next, the information processing system 50 fine-tunes the X and Y coordinates of the feature points of each of the first stack 80A and the second stack 80B and selects a shift amount (x2, y2). The information processing system 50 selects the shift amount (x2, y2) in substantially the same manner as in steps S401 to S403 described above. Steps S404 to S406 differ from steps S401 to S403, for example, in the following respects. The fine-adjustment shift amount b in step S404 is smaller than the coarse-adjustment shift amount a. Furthermore, the shift amount (x1, y1) selected in step S403 is used as the center shift amount in step S405. For example, the fine-adjustment shift amount b is sufficiently smaller than the coarse-adjustment shift amount a, for example, 0.1 mm, which is one order of magnitude smaller.

[0105] (Step S407) The information processing system 50 performs coordinate transformation processing on all of the feature points of the first stack 80A using the shift amount (x2, y2) selected in step S406.

[0106] (Step S408) The information processing system 50 calculates the distances L1 to Lm after the coordinate transformation in step S407 and checks whether the sum of the distances L1 to Lm is less than a predetermined threshold. If the sum is equal to or greater than the predetermined threshold, the information processing system 50 may determine that the coordinate transformation process in step S407 is inappropriate.

[0107] (Step S409) If the alignment is inappropriate, i.e., if the answer is YES, the information processing system 50 ends the process. If the alignment is inappropriate, the information processing system 50 may display an error message on the display unit 76 or record a message in the test data DB indicating that calculation is not possible. On the other hand, if the alignment is appropriate, i.e., if the answer is NO, the information processing system 50 ends the process of FIG. 11, returns to the process of FIG. 10, and executes the processes from step S34 onwards.

[0108] (Step S34) The information processing system 50 compares the first feature point information with the second feature point information. Specifically, the information processing system 50 compares the feature points present in the first stack 80A with the feature points present in the second stack 80B. For example, the coordinates of the feature points present in the first stack 80A have been transformed by the processing in step S33. For example, through this comparison, the information processing system 50 classifies the feature points present in the first stack 80A and the feature points present in the second stack 80B into one of first type feature points, second type feature points, and third type feature points.

[0109] (Step S35) The information processing system 50 outputs the comparison result of step S34 and ends the process.

[0110] [Effects of Information Processing System 50] The information processing system 50 according to the present invention compares the first feature information with the second feature information and outputs comparison information relating to the comparison results. This allows, for example, a production manager to easily identify feature points present in the second laminate 80B, which includes the opaque fourth web 84, that remain from the inspection of the first laminate 80A. This makes it possible to more easily analyze defects present in the second laminate 80B, which includes the opaque fourth web 84. The effects of this are described below.

[0111] Webs such as optical films require strict quality control. For example, defects in the web are strictly controlled. Defects include foreign matter, scratches, and dents. Such webs are manufactured through multiple processes, and quality inspections are carried out at each process.

[0112] In a web stack including an opaque web, it is more difficult to detect defects than in a stack consisting of only transparent webs. The opaque web, for example, has minute irregularities on its surface or contains a light-scattering material. This causes irregular scattering and reflection of light in the opaque web. Therefore, when a stack including an opaque web is inspected using an optical method, noise is likely to occur, which may reduce the sensitivity and accuracy of the inspection.

[0113] In contrast, in the information processing system 50, the feature points present in the second stack 80B are compared with the feature points present in the first stack 80A. Therefore, even if the inspection data of the second stack 80B contains noise, it is possible to easily grasp, for example, feature points present in both the first stack 80A and the second stack 80B, i.e., the third type feature points remaining in the second stack 80B from the first stack 80A. Therefore, even if the inspection data of the second stack 80B contains noise, it is possible to more easily analyze defects present in the second stack 80B.

[0114] In particular, the information processing system 50 aligns the coordinate system of the first stack 80A with the coordinate system of the second stack 80B, and then compares the feature points present in the first stack 80A with the feature points present in the second stack 80B. Therefore, it becomes possible to classify the feature points present in the first stack 80A and the feature points present in the second stack 80B into first-type feature points, second-type feature points, and third-type feature points with high accuracy.

[0115] Even if both the first laminate 80A and the second laminate 80B are opaque, there is a low possibility that noise will overlap between the inspection data of the first laminate 80A and the second laminate 80B. In other words, there is a high possibility that feature points whose coordinate positions overlap between the inspection data of the first laminate 80A and the second laminate 80B are third-type feature points.

[0116] Furthermore, even if the optical film such as the polarizer included in the first laminate 80A is opaque, regular transmission, reflection, scattering, etc. of light occurs. Therefore, unlike the protector or separator that constitutes the fourth web 84, the first laminate 80A can be inspected with high sensitivity and accuracy using an optical method.

[0117] Furthermore, it is preferable that the information processing system 50 further uses third feature point information regarding the feature points present in the fourth web 84. This makes it possible to classify the feature points present in the first laminate 80A and the feature points present in the second laminate 80B into first-type feature points, second-type feature points, and third-type feature points with higher accuracy.

[0118] Below, other embodiments of the information processing system 50 described in the first embodiment will be described. Note that, in order to avoid duplication of explanation, detailed explanations of components similar to those of the information processing system 50 described in the first embodiment will be omitted.

[0119] Second Embodiment Fig. 12 is a subroutine flowchart showing the alignment process of an information processing system 50 according to a second embodiment. Fig. 12 corresponds to Fig. 11 described in the first embodiment. This information processing system 50 uses kernel density estimation to align the X and Y coordinates of the first stack 80A with the X and Y coordinates of the second stack 80B. In this respect, the information processing system 50 according to the second embodiment differs from the information processing system 50 according to the first embodiment. Except for this point, the information processing system 50 according to the second embodiment has the same configuration as the information processing system 50 according to the first embodiment and achieves the same effects.

[0120] (Step S451) The information processing system 50 obtains a probability density function by performing kernel density estimation on the feature points of the first stack 80A. The kernel density estimation is performed two-dimensionally, and a Gaussian kernel is used as the kernel function. For example, a predetermined value is used as the bandwidth. For example, a table correlating web product names with bandwidths is stored in the storage unit 52. The information processing system 50 may use a bandwidth value corresponding to the web product name, or may use different bandwidth values ​​depending on the number of feature points present in the first stack 80A. When estimating the kernel density of a given feature point, the information processing system 50 takes into account data surrounding the feature point. Then, the information processing system 50 sums the densities of each feature point to obtain a probability density function.

[0121] Fig. 13 shows an example of a probability density function calculated by kernel density estimation, in which the vertical and horizontal axes represent XY coordinates, and the intensity of the color represents the density.

[0122] (Step S452) The information processing system 50 obtains a probability density function of each of the feature points of the second stack 80B in the same manner as in step S451.

[0123] (Steps S453 to S455) The information processing system 50 compares the two obtained probability density functions and performs correspondence based on the density distribution. Then, the information processing system 50 calculates a transformation matrix based on the correspondence result and performs coordinate transformation of the X and Y coordinates on the feature points of the first stack 80A.

[0124] (Steps S456 to S457) The information processing system 50 performs the processes of S456 to S457 in the same manner as steps S406 to S407 in FIG.

[0125] The information processing system 50 may use kernel density estimation for all or part of the alignment between the XY coordinates of the first stack 80A and the XY coordinates of the second stack 80B.

[0126] Similarly to the first embodiment, the information processing system 50 according to the second embodiment also compares the first feature information with the second feature information and outputs comparison information relating to the comparison result, thereby enabling a simpler analysis of defects present in the second stack 80B.

[0127] Furthermore, in kernel density estimation, the feature points of the first laminate 80A and the feature points of the second laminate 80B are not determined one-to-one, but the probability of existence of the feature points is calculated using a probability density function. Therefore, even if the fourth web 84 is opaque and the second feature point information contains a lot of noise, the accuracy of feature point extraction and classification is ensured. Therefore, the information processing system 50 can preferably use kernel density estimation.

[0128] The information processing system 50 may align the X and Y coordinates of the first stack 80A and the second stack 80B before stacking using other methods. For example, the information processing system 50 may perform kernel density estimation of the feature points of one of the first stack 80A and the second stack 80B. At this time, the information processing system 50 compares the obtained probability density function with the feature points of the other stack. This allows the information processing system 50 to align the X and Y coordinates of the first stack 80A and the second stack 80B.

[0129] Third Embodiment FIG. 14 shows an example of a cross-sectional configuration of a laminate 80C to which an information processing system 50 according to a third embodiment is applied. FIG. 14 corresponds to FIG. 2 described in the first embodiment. The laminate 80C includes a fifth web 85 and a sixth web 86 on the fifth web 85. The sixth web 86 is formed by coating the fifth web 85. In this respect, the information processing system 50 according to the third embodiment differs from the information processing system 50 according to the first embodiment. Except for this point, the information processing system 50 according to the third embodiment has the same configuration as the information processing system 50 according to the first embodiment and achieves the same effects. Here, the fifth web 85 corresponds to a specific example of a first web of the present invention, and the sixth web 86 corresponds to a specific example of a second web of the present invention.

[0130] The fifth web 85 is, for example, a base film. The fifth web 85 is, for example, transparent and has a haze of 2% or less. The sixth web 86 is, for example, opaque and has a haze of 5% or more. The sixth web 86 is, for example, an antiglare layer.

[0131] FIG. 15 shows an example of a manufacturing process for laminate 80C. For example, fifth web 85 is manufactured in factory 100A. In factory 100A, feature points present in fifth web 85 are inspected by inspection device 90A. This fifth web 85 is transported to factory 100B. The fifth web 85 may be further transported to another factory. In factory 100B, sixth web 86 is applied onto fifth web 85 to manufacture laminate 80C. In factory 100B, feature points present in laminate 80C are inspected by inspection device 90B. In factory 100A, for example, manufacturing device 2000A is provided, and in factory 100B, for example, manufacturing device 2000B is provided.

[0132] The information processing system 50 compares the first feature point information relating to the feature points present in the fifth web 85 with the second feature point information relating to the feature points present in the laminate 80C, and outputs comparison information.

[0133] Similarly to the first embodiment, the information processing system 50 according to the third embodiment also compares the first feature information with the second feature information and outputs comparison information relating to the comparison result, thereby enabling a simpler analysis of defects present in the laminate 80C.

[0134] The configuration of the information processing system 50 described above is a description of the main configuration in explaining the features of the above embodiment, but is not limited to the above configuration and can be modified in various ways within the scope of the claims. Furthermore, configurations included in general information processing devices or information processing systems are not excluded. For example, the information processing system 50 may include an inspection device 90. Furthermore, the feature point generation function of the analysis unit 93 of the inspection device 90 may be performed by the control unit 51 of the information processing system 50.

[0135] For example, in the above embodiment, an example was described in which the first web of the present invention includes an opaque optical film such as a polarizer. However, the first web may include other opaque webs. The first web may include, for example, a steel plate or an antiglare film. The first web may be transparent. A transparent first web may have, for example, a haze of 2% or less. A transparent first web may be, for example, a transparent optical film, a hard coat, an anti-reflection layer, or a liquid crystal layer. The second web of the present invention may include, for example, an opaque optical film such as a polarizer, a plastic film, a steel plate, paper, or the like.

[0136] Furthermore, the means and methods for performing various processes in the information processing system 50 according to the above-described embodiment can be realized by either a dedicated hardware circuit or a programmed computer. The program may be provided, for example, by a computer-readable recording medium such as a USB memory or a DVD-ROM, or may be provided online via a network such as the Internet. In this case, the program recorded on the computer-readable recording medium is typically transferred and stored in a storage unit such as a hard disk. The program may also be provided as standalone application software, or may be incorporated into the software of a device as a function of that device. DVD is an abbreviation for Digital Versatile Disc.

[0137] While embodiments of the present invention have been described and illustrated in detail, the disclosed embodiments are made for purposes of illustration and example only and are not intended to be limiting, and the scope of the present invention should be construed by the language of the appended claims.

[0138] This application is based on a Japanese patent application (Patent Application No. 2024-59896) filed on April 3, 2024, the disclosure of which is incorporated herein by reference in its entirety.

[0139] 50 Information processing system 51 Control unit 511 Acquisition unit 512 Alignment unit 513 Comparison unit 514 Output unit 52 Storage unit 90 Inspection device 2000 Manufacturing device

Claims

1. an acquisition unit that acquires first feature information relating to feature points present in a first web and second feature information relating to feature points present in a laminate obtained by laminating an opaque second web on the first web; a comparison unit that compares the acquired first feature point information with the acquired second feature point information; an output unit that outputs comparison information regarding a comparison result between the first feature point information and the second feature point information; Equipped with the comparison unit classifies, through the comparison, the characteristic points present on the first web and the characteristic points present on the laminate into first type characteristic points that are present on the first web and disappear in the laminate, second type characteristic points that are not present on the first web but appear in the laminate, and third type characteristic points that are present on the first web and remain in the laminate; the comparison information includes information relating to at least the first feature point and the third feature point, The output unit outputs the comparison information so that the first feature points and the third feature points are distinguished from each other.

2. the acquiring unit further acquires third feature point information present in the second web, The information processing system according to claim 1 , wherein the comparison unit compares the acquired first feature point information and third feature point information with the second feature point information.

3. a registration unit that associates feature points present on the first web with feature points present on the laminate based on their positions, The information processing system according to claim 1 , wherein the comparison unit compares the first feature point information with the second feature point information using the result of the association.

4. The information processing system according to claim 1 , wherein the output unit outputs the comparison information by displaying the comparison information on a display unit.

5. The information processing system according to claim 1 , wherein the first web has a laminated structure of a plurality of webs.

6. The information processing system according to claim 1 , wherein the second web includes at least one of a protector, a separator, and an anti-glare film.

7. The information processing system according to claim 1 , wherein the second web has a haze of 5% or more.

8. acquiring first feature information relating to feature points present in a first web and second feature information relating to feature points present in a laminate obtained by laminating an opaque second web on the first web; comparing the acquired first feature point information with the acquired second feature point information; outputting comparison information regarding a comparison result between the first feature point information and the second feature point information; Including, comparing the first feature point information with the second feature point information, the comparison classifying the feature points present on the first web and the feature points present on the laminate into first type feature points that are present on the first web and disappear in the laminate, second type feature points that are not present on the first web but appear in the laminate, and third type feature points that are present on the first web and remain in the laminate; the comparison information includes information relating to at least the first feature point and the third feature point, In the information processing method, the comparison information is output so that the first feature points and the third feature points are distinguished from each other.

9. An information processing program that causes a computer to execute the information processing method according to claim 8.