Testing apparatus

Abstract

A testing apparatus (100), comprising: a testing chamber (12), wherein a testing cavity (20) is formed in the testing chamber (12), and the testing cavity (20) is used for accommodating a device under test; a radio frequency module (14), wherein the radio frequency module (14) is used for outputting a radio frequency signal; an antenna assembly (16), wherein the antenna assembly (16) is electrically connected to the radio frequency module (14), and the antenna assembly (16) is used for feeding the radio frequency signal into the testing cavity (20); and wave absorbing layers (18), wherein the wave absorbing layers (18) are provided on side walls of the testing cavity (20).

Description

Test equipment

[0001] Priority information

[0002] This application claims priority and benefits of patent application No. 202310793771.X filed with the State Intellectual Property Office of China on June 29, 2023, and the entire text of which is incorporated herein by reference. Technical Field

[0003] The present application relates to the technical field of equipment detection, and in particular to a testing device. Background Art

[0004] Electronic devices are susceptible to electromagnetic waves while operating. If their electromagnetic interference resistance (EMI) doesn't meet requirements, they're prone to malfunction. Therefore, electromagnetic interference resistance (EMS) testing is essential. However, the accuracy of the test results must be ensured to accurately assess the EMI resistance of electronic devices.

[0005] Summary of the Invention

[0006] The embodiments of the present application provide a testing device.

[0007] A testing device according to an embodiment of the present application includes:

[0008] A test chamber is provided in the test chamber, and the test chamber is used to accommodate the device to be tested;

[0009] A radio frequency module, wherein the radio frequency module is used to output a radio frequency signal;

[0010] an antenna assembly, the antenna assembly being electrically connected to the radio frequency module and configured to feed the radio frequency signal into the test cavity;

[0011] The wave absorbing layer is arranged on the side wall of the test cavity.

[0012] In the above-mentioned test device, the side wall of the test cavity is provided with an absorbing layer, which can reduce or avoid the radio frequency signal reflected or refracted by the side wall of the test cavity during the test process, thereby improving the accuracy of the test results.

[0013] In some embodiments, the sidewall of the test cavity includes a first sidewall and a second sidewall opposite to each other, and the absorbing layer is provided on at least one of the first sidewall and the second sidewall.

[0014] In some embodiments, the sidewall of the test cavity includes a third sidewall and a fourth sidewall opposite to each other, the third sidewall connecting the first sidewall and the second sidewall, and the fourth sidewall connecting the first sidewall and the second sidewall;

[0015] The wave absorbing layer is provided on at least one of the first side wall, the second side wall, the third side wall and the fourth side wall.

[0016] In some embodiments, the sidewalls of the test chamber include a fifth sidewall and a sixth sidewall opposite each other, the fifth sidewall connecting the first sidewall, the second sidewall, the third sidewall, and the fourth sidewall, and the sixth sidewall connecting the first sidewall, the second sidewall, the third sidewall, and the fourth sidewall;

[0017] The wave absorbing layer is provided on at least one of the first side wall, the second side wall, the third side wall, the fourth side wall, the fifth side wall and the sixth side wall.

[0018] In some embodiments, the area of ​​the absorbing layer is equal to the area of ​​the side wall of the test cavity where the absorbing layer is located.

[0019] In some embodiments, the absorbing layer includes a base layer and a plurality of cones, wherein the base layer is disposed on the side wall of the test cavity, and the plurality of cones are disposed on a surface of the base layer away from the side wall of the test cavity.

[0020] In some embodiments, the absorption rate characteristics of the absorbing layer meet the following requirements: the absorption rate between 30 MHz and 1 GHz is not less than 5 dB, and the reflection coefficient of the antenna in the cavity state is not higher than -5 dB.

[0021] In some embodiments, the testing device includes an electrical chamber and a heat dissipation assembly, the electrical chamber is located outside the test cavity, the heat dissipation assembly and the RF module are located in the electrical chamber, and the heat dissipation assembly is used to dissipate heat from the RF module.

[0022] In some embodiments, the heat dissipation assembly includes an air guide and a heat dissipation fan, the air guide covers the RF module, the air guide is provided with an air inlet and an air outlet, and the air inlet is arranged corresponding to the heat dissipation fan.

[0023] In some embodiments, the testing device further includes a power supply module, which is electrically connected to the RF module and the heat dissipation fan, and the power supply module is located above the air guide and is thermally connected to the air guide.

[0024] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become obvious from the description below, or will be learned through practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0026] FIG1 is an exploded schematic diagram of a testing device according to an embodiment of the present application;

[0027] FIG2 is a schematic diagram of the distribution of the side wall of the test cavity of the test device according to an embodiment of the present application;

[0028] FIG3 is a schematic diagram of the distribution of the absorbing layer on the side wall of the test cavity according to an embodiment of the present application;

[0029] FIG4 is a schematic structural diagram of the wave absorbing layer according to an embodiment of the present application.

[0030] Description of component symbols: Test device 100, test cavity 12, RF module 14, antenna assembly 16, absorbing layer 18, test cavity 20, antenna 22, base 24, control panel 26, door 28, opening 30, first side wall 32, second side wall 34, third side wall 36, fourth side wall 38, fifth side wall 40, sixth side wall 42, base layer 44, cone 46, electrical chamber 48, heat dissipation assembly 50, air guide 52, heat dissipation fan 54, air inlet 56, air outlet 58, air inlet end 60, air outlet end 62, power supply module 64. DETAILED DESCRIPTION

[0031] The embodiments of the present application are described in detail below. Implementations of the embodiments are illustrated in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application and are not to be construed as limiting the present application.

[0032] In the description of the embodiments of this application, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly specifying the number of the indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the described features. In the description of the embodiments of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0033] In the description of the embodiments of the present application, it should be noted that, unless otherwise expressly specified or limited, the terms "installed," "connected," and "connected" should be understood in a broad sense. For example, they can be fixedly connected, detachably connected, or integrally connected; they can be mechanically connected, electrically connected, or capable of mutual communication; they can be directly connected, or indirectly connected through an intermediate medium, and they can be internal communication between two elements or an interactive relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0034] The disclosure below provides many different embodiments or examples for realizing different structures of the embodiments of the present application. In order to simplify the disclosure of the embodiments of the present application, the components and settings of specific examples are described below. Of course, they are merely examples and are not intended to limit the present application. In addition, the embodiments of the present application may repeat reference numbers and / or reference letters in different examples, and such repetition is for the purpose of simplicity and clarity, and does not itself indicate the relationship between the various embodiments and / or settings discussed. In addition, the embodiments of the present application provide examples of various specific processes and materials, but those of ordinary skill in the art will appreciate the application of other processes and / or the use of other materials.

[0035] Referring to Figures 1 to 3 , a testing device 100 according to an embodiment of the present application includes a test chamber 12, a radio frequency module 14, an antenna assembly 16, and an absorbing layer 18. Within test chamber 12 is a test cavity 20 for accommodating the device under test. The radio frequency module 14 is configured to output radio frequency signals. The antenna assembly 16 is electrically connected to the radio frequency module 14 and is configured to feed the radio frequency signals into the test chamber 20. The absorbing layer 18 is provided on the sidewalls of the test chamber 20.

[0036] In the above-mentioned testing device 100 , the sidewall of the testing cavity 20 is provided with an absorbing layer 18 , which can reduce or avoid the RF signal reflected or refracted by the sidewall of the testing cavity 20 during the testing process, thereby improving the accuracy of the test results.

[0037] Specifically, in FIG1 , the test cavity 12 is rectangular in shape, and the test cavity 20 is also rectangular in shape. The device under test can be accommodated in the test cavity 20. The RF signal output by the RF module 14 can generate electromagnetic radiation, and the antenna assembly 16 feeds the RF signal into the test cavity 20 to form an electromagnetic interference environment within the test cavity 20 for testing the electromagnetic susceptibility (EMS) of the device under test. It will be understood that the shapes of the test cavities 12 and 20 are not limited to rectangular, and can also be other regular or irregular shapes, which are not specifically limited here.

[0038] Optionally, the test cavity 12 is made of a material having the ability to shield radio frequency signals, such as a metal cavity. Furthermore, the test cavity 12 may include a main body made of plastic and a metal layer covering the surface of the main body to reduce manufacturing costs and reduce weight.

[0039] In one embodiment, the device to be tested may include but is not limited to a control panel, a display screen, a chip, a circuit board or an electronic device, which is not specifically limited herein.

[0040] In one example, the dimensions of the test chamber 12 in this embodiment are within 3 meters by 3 meters by 3 meters (length by width by height). The reflection and refraction of electromagnetic waves in a small, enclosed cavity can degrade test results. Therefore, an absorbing layer 18 can be installed on the sidewalls of the test chamber 20 to enhance electromagnetic wave absorption, creating the equivalent of a far-field effect. The test chamber 20 can be configured as a microwave anechoic chamber.

[0041] The absorbing layer 18 may be made of absorbing materials, including but not limited to ferrite, foam, etc., which are not specifically limited here.

[0042] In one embodiment, the RF signal includes, but is not limited to, a RF signal in the microwave frequency band. The RF module 14 may include a signal generating circuit, an incident power detection circuit, and a reflected power detection circuit. The signal generating circuit may include components such as a crystal oscillator, an amplifier, a circulator, and a phase shifter. The incident power detection circuit is used to detect the power of the RF signal incident into the test cavity 20. The RF module 14 may adjust the RF signal output by the signal generating circuit based on data fed back by the incident power detection circuit so that the power of the RF signal incident into the test cavity 20 is close to or equal to the target power (set power).

[0043] The reflected power detection circuit is used to detect the power of the RF signal reflected by the test cavity 20. The RF module 14 can determine the energy of the RF signal absorbed by the device under test based on the data fed back by the incident power detection circuit and the reflected power detection circuit.

[0044] Referring to Figure 1 , antenna assembly 16 may include an antenna 22 and a base 24 . Base 24 is mounted on a side panel (e.g., a top panel) of test chamber 12 , and antenna 22 is mounted on base 24 . Optionally, antenna 22 may extend entirely or partially into test chamber 20 . Antenna 22 may be any type of antenna 22 , such as an array antenna 22 , and is not specifically limited herein. The number of antennas 22 may be one, two, or more, and is not specifically limited herein. Optionally, antenna 22 is a broadband antenna 22 .

[0045] In Figure 1 , the test apparatus 100 further includes a control panel 26 mounted on the test chamber 12, electrically connected to the RF module 14. The control panel 26 may include operating components such as buttons and a touch screen, through which an operator can set RF signal parameters, such as the frequency, phase, and power of the RF signal. This allows the operator to generate a variety of RF signals within a specific frequency band, simulating complex electromagnetic interference scenarios that might occur to the device under test in a real-world environment.

[0046] Testing apparatus 100 also includes a door 28. An opening 30 is provided on one side of test chamber 20. Door 28 is rotatably mounted at opening 30 to open or close opening 30. When door 28 opens opening 30, an operator can access the device under test. When door 28 is closed, testing can proceed. Door 28 prevents RF signals from leaking from test chamber 20 to the outside of test chamber 12, thereby improving the safety of the testing process. The sidewalls of test chamber 20 may include the sidewall where door 28 is located.

[0047] The RF module 14 generates a corresponding RF signal according to the set RF signal parameters, and the antenna assembly 16 feeds the RF signal into the test cavity 20 to generate electromagnetic interference to the device under test.

[0048] The testing device 100 may also include a detection module. During the test process, the detection module collects information about the device under test to determine whether the device's operating status is normal or abnormal. Specifically, the detection module may determine whether the device under test is operating normally or abnormally by collecting at least one of an image of the device under test, a sound emitted by the device under test, or the temperature of the device under test. For example, the detection module may use a camera to capture an image of the device under test and use image recognition technology to identify whether the device under test exhibits abnormalities such as screen flickering, a distorted screen, or a black screen. The detection module may use a sound sensor to collect sounds emitted by the device under test to determine whether the device under test exhibits abnormalities such as cracked components. The detection module may use a temperature sensor to collect the temperature of the device under test to determine whether the device under test exhibits abnormalities such as overheating.

[0049] In FIG2 , the test chamber 20 is in the shape of a rectangular parallelepiped. The sidewalls of the test chamber 20 include a first sidewall 32, a second sidewall 34, a third sidewall 36, a fourth sidewall 38, a fifth sidewall 40, and a sixth sidewall 42. The first sidewall 32 is opposite the second sidewall 34, the third sidewall 36 is opposite the fourth sidewall 38, and the fifth sidewall 40 is opposite the sixth sidewall 42. The third sidewall 36 connects the first and second sidewalls 32 and 34, the fourth sidewall 38 connects the first and second sidewalls 32 and 34, the fifth sidewall 40 connects the first, second, third, and fourth sidewalls 36 and 38, and the sixth sidewall 42 connects the first, second, third, and fourth sidewalls 32 and 34. The absorbing layer 18 may be provided on at least one of the first, second, third, fourth, third, and fourth sidewalls 38, the fifth and sixth sidewalls 40 and 42.

[0050] Specifically, the absorbing layer 18 may be provided on one of the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40, and the sixth side wall 42. The absorbing layer 18 may also be provided on two, three, four, five, or six of the first side wall 32, the second side wall 34, the third side wall 36, the fourth side wall 38, the fifth side wall 40, and the sixth side wall 42. In FIG. 3 , the absorbing layer 18 is provided on the first side wall 32, the second side wall 34, the third side wall 36, and the fourth side wall 38.

[0051] In FIG2 , the first sidewall 32 is the upper sidewall of the test cavity 20, the second sidewall 34 is the lower sidewall of the test cavity 20, the third sidewall 36 is the left sidewall of the test cavity 20, the fourth sidewall 38 is the right sidewall of the test cavity 20, the fifth sidewall 40 is the front sidewall of the test cavity 20, and the sixth sidewall 42 is the rear sidewall of the test cavity 20. It will be understood that in other embodiments, the first sidewall 32, the second sidewall 34, the third sidewall 36, the fourth sidewall 38, the fifth sidewall 40, and the sixth sidewall 42 may also be sidewalls in other directions of the test cavity 20, and are not limited to being upper, lower, left, right, front, and back sidewalls, respectively. The first sidewall 32 and the second sidewall 34 are opposing sidewalls, such as upper and lower sidewalls, left and right sidewalls, or front and back sidewalls. The third sidewall 36 and the fourth sidewall 38 are opposing sidewalls, such as upper and lower sidewalls, left and right sidewalls, or front and back sidewalls. The fifth side wall 40 and the sixth side wall 42 are two opposite side walls, such as upper and lower side walls, left and right side walls, or front and back side walls.

[0052] In other embodiments, the absorbing layer 18 is disposed on at least one of the first side wall 32 and the second side wall 34 .

[0053] In other embodiments, the absorbing layer 18 is disposed on at least one of the first side wall 32 , the second side wall 34 , the third side wall 36 , and the fourth side wall 38 .

[0054] In some embodiments, the area of ​​the absorbing layer 18 is equal to the area of ​​the sidewall of the test cavity 20 where the absorbing layer 18 is located.

[0055] In this way, the absorption of radio frequency signals (electromagnetic waves) can be enhanced.

[0056] Specifically, the area of ​​the absorbing layer 18 is equal to the area of ​​the side wall of the test cavity 20 where the absorbing layer 18 is located, so that the absorbing layer 18 can basically fully cover the side wall of the test cavity 20, which can minimize the reflection and refraction of electromagnetic waves on the side wall of the test cavity 20 where the absorbing layer 18 is located.

[0057] In one embodiment, the absorbing layer 18 is disposed on the first side wall 32 . The area of ​​the absorbing layer 18 is equal to the area of ​​the first side wall 32 , and the absorbing layer 18 substantially completely covers the first side wall 32 .

[0058] In one embodiment, the absorbing layer 18 is disposed on the third side wall 36 and the fifth side wall 40 . The area of ​​the absorbing layer 18 is equal to the area of ​​the third side wall 36 and the area of ​​the fifth side wall 40 . The absorbing layer 18 substantially completely covers the third side wall 36 and the fifth side wall 40 .

[0059] In some embodiments, referring to FIG. 4 , the absorbing layer 18 includes a base layer 44 and a plurality of cones 46 . The base layer 44 is disposed on the sidewall of the test cavity 20 , and the plurality of cones 46 are disposed on a surface of the base layer 44 away from the sidewall of the test cavity 20 .

[0060] In this way, the electromagnetic wave absorption effect is good.

[0061] Specifically, the absorbing layer 18 can be made of a foam material (such as polyurethane). In one embodiment, the base layer 44 can be fixed to the side wall of the test cavity 20 by adhesive.

[0062] The plurality of cones 46 can be arranged in an M*N array on the surface of the base layer 44 away from the sidewall of the test cavity 20. The cones 46 can be in the shape of a cone, a triangular pyramid, a square pyramid, a pentagonal pyramid, etc., which are not specifically limited here.

[0063] When a radio frequency signal is incident on the multiple cones 46 , a portion of the radio frequency signal is absorbed by the cones 46 , and another portion of the radio frequency signal is reflected and consumed between the multiple cones 46 . The multiple cones 46 have a good absorption effect on electromagnetic waves.

[0064] In some embodiments, the absorption rate characteristics of the absorbing layer 18 meet the following requirements: the absorption rate from 30 MHz to 1 GHz is not less than 5 dB, and the reflection coefficient of the antenna 22 in the cavity state is not higher than -5 dB.

[0065] In this way, the absorptivity characteristics of the absorbing layer 18 meet the test requirements.

[0066] Specifically, in one embodiment, the test frequency band of the device to be tested is 30MHz to 1GHz, and multiple frequency points can be selected within the test frequency band for testing. After selecting a frequency point, the power and phase corresponding to the frequency point are set, and the RF module 14 can output the RF signal according to the set frequency, power, and phase.

[0067] The empty state refers to a state when no device under test is placed in the test cavity 20. In the empty state, the antenna 22 receives radio frequency signals reflected in the test cavity 20, which are basically radio frequency signals reflected by the side walls of the test cavity 20.

[0068] The absorption rate characteristics of the absorbing layer 18 meet the requirements: the absorption rate of 30MHz~1GHz is not less than 5dB, and the reflection coefficient of the antenna 22 in the cavity state is not higher than -5dB, so that the absorption effect of electromagnetic waves in the test frequency band of 30MHz~1GHz meets the design requirements, ensuring the accuracy of the test results.

[0069] In some embodiments, the testing device 100 includes an electrical chamber 48 and a heat dissipation assembly 50 . The electrical chamber 48 is located outside the testing cavity 20 . The heat dissipation assembly 50 and the RF module 14 are located inside the electrical chamber 48 . The heat dissipation assembly 50 is used to dissipate heat for the RF module 14 .

[0070] In this way, the temperature of the RF module 14 may be prevented from increasing, thereby preventing the RF module 14 from reducing the accuracy of regulating the RF signal.

[0071] Specifically, when the RF module 14 is operating, it needs to output RF signals, causing its temperature to rise rapidly. When the temperature of the RF module 14 is high, the internal components of the RF module 14 are affected by the high temperature, reducing the accuracy of regulating the RF signal. By providing the heat dissipation assembly 50, the heat dissipation assembly 50 can be activated when the RF module 14 is operating to dissipate heat from the RF module 14, ensuring the accuracy of regulating the RF signal. At the same time, it can also prevent the components of the RF module 14 from aging too quickly due to excessive temperature, thereby reducing the occurrence of failures and extending the service life of the RF module 14.

[0072] In one embodiment, the heat dissipation assembly 50 can use liquid cooling to dissipate heat from the RF module 14. In one embodiment, the heat dissipation assembly 50 can use air cooling to dissipate heat from the RF module 14. In one embodiment, the heat dissipation assembly 50 can use liquid cooling and air cooling to dissipate heat from the RF module 14.

[0073] The antenna assembly 16 may also be at least partially disposed within the electrical chamber 48, and the heat dissipation assembly 50 may also dissipate heat for the antenna assembly 16. It is understood that the heat dissipation assembly 50 may dissipate heat for not only the RF module 14 and the antenna assembly 16, but also for other components within the electrical chamber 48.

[0074] In some embodiments, the heat dissipation assembly 50 includes an air guide 52 and a heat dissipation fan 54 . The air guide 52 covers the RF module 14 . The air guide 52 is provided with an air inlet 56 and an air outlet 58 . The air inlet 56 is provided corresponding to the heat dissipation fan 54 .

[0075] In this way, the heat dissipation component 50 can dissipate heat from the RF module 14 by air cooling.

[0076] Specifically, the heat dissipation fan 54 can provide air when in operation. The air blown by the heat dissipation fan 54 enters the interior of the air guide 52, removes heat from the RF module 14, and cools it down. The air inlet 56 of the air guide 52 is correspondingly arranged with the heat dissipation fan 54 so that the heat dissipation fan 54 can deliver the generated air into the air guide 52. After the air removes the heat from the RF module 14, it can be discharged from the air outlet 58 of the air guide 52, thereby reducing the temperature of the RF module 14 and the interior of the electrical chamber 48.

[0077] In FIG1 , the air guide 52 includes an air inlet end 60 and an air outlet end 62. The air inlet end 60 defines an air inlet 56, and the air outlet end 62 defines an air outlet 58. The area of ​​the air inlet 56 is larger than the area of ​​the air outlet 58. The internal flow path of the air guide 52 is tapered from the air inlet end 60 to the air outlet end 62, so that the wind can be accelerated within the air guide 52, which can quickly remove heat from the RF module 14 and improve heat dissipation efficiency.

[0078] In some embodiments, the testing device 100 further includes a power supply module 64 , which is electrically connected to the RF module 14 and the heat dissipation fan 54 . The power supply module 64 is located above the air guide 52 and is thermally connected to the air guide 52 .

[0079] In this way, the power supply module 64 can be cooled to ensure that the power supply module 64 operates within a normal temperature range.

[0080] Specifically, the power supply module 64 can be connected to the air guide 52 through thermal conductive adhesive. The power supply module 64 can transfer heat to the air guide 52 through the thermal conductive adhesive. The heat is dissipated from the surface of the air guide 52, and the heat is taken away by the wind in the internal flow channel of the air guide 52, thereby improving the heat dissipation efficiency of the power supply module 64.

[0081] The power supply module 64 is electrically connected to various components and parts of the test device 100, including but not limited to the RF module 14, the control panel 26, the heat sink assembly 50, etc. A socket is also provided in the test chamber 20, and the power supply module 64 is also electrically connected to the socket in the test chamber 20. The power plug of the device under test can be inserted into the socket, so that the power supply module 64 can provide the power required for operation (DC and / or AC) to the device under test, thereby operating the device under test and testing the device's anti-electromagnetic interference capability.

[0082] In summary, in the related art, the floor area of ​​conventional microwave darkrooms ranges from 3 meters * 3 meters to 10 meters * 10 meters. The cavity is too large, the floor area is too large, and it cannot be moved. It is expensive. Not all users have the conditions to build the required microwave darkroom, and microwave darkrooms cannot be popularized. The test device 100 of the embodiment of the present application can form a micro darkroom, which is easy to move and cheap, equivalent to the price of general laboratory instruments, and the floor area can be controlled within 3 meters * 3 meters. The test device 100 of the embodiment of the present application can achieve a test effect equivalent to or close to that of a conventional microwave darkroom. Moreover, the test device 100 of the present application is cheaper and more convenient to move, suitable for large-scale deployment by test personnel, and even one for each person. An absorbing layer 18 is provided on the side wall of the test cavity 20. The absorbing characteristics of the absorbing layer 18 are used to eliminate the reflection and refraction effects, so that the near-field test of the antenna 22 is equivalent to the far-field or open space test effect, thereby ensuring the accuracy of the test results.

[0083] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0084] Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are illustrative and cannot be understood as limitations on the present application. Ordinary technicians in this field can change, modify, replace and modify the above implementation methods within the scope of the present application.

Claims

1. A testing device, characterized in that: include: A test cavity, wherein a test cavity is provided in the test cavity, and the test cavity is used to accommodate the device to be tested; A radio frequency module, wherein the radio frequency module is used to output a radio frequency signal; An antenna assembly, the antenna assembly being electrically connected to the radio frequency module, and the antenna assembly being used to feed the radio frequency signal into the test cavity; A wave absorbing layer is arranged on a side wall of the test cavity.

2. The testing device according to claim 1, characterized in that: The side wall of the test cavity includes a first side wall and a second side wall that are opposite to each other, and the wave absorbing layer is disposed on at least one of the first side wall and the second side wall.

3. The testing device according to claim 2, characterized in that: The side wall of the test cavity comprises a third side wall and a fourth side wall opposite to each other, the third side wall connects the first side wall and the second side wall, and the fourth side wall connects the first side wall and the second side wall; The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall and the fourth side wall.

4. The testing device according to claim 3, characterized in that: The side wall of the test cavity comprises a fifth side wall and a sixth side wall opposite to each other, the fifth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall, and the sixth side wall connects the first side wall, the second side wall, the third side wall and the fourth side wall; The wave absorbing layer is disposed on at least one of the first side wall, the second side wall, the third side wall, the fourth side wall, the fifth side wall and the sixth side wall.

5. The testing device according to any one of claims 1 to 4, characterized in that: The area of ​​the wave absorbing layer is equal to the area of ​​the side wall of the test cavity where the wave absorbing layer is located.

6. The testing device according to any one of claims 1 to 5, characterized in that: The wave absorbing layer comprises a base layer and a plurality of cones, wherein the base layer is arranged on the side wall of the test cavity, and the plurality of cones are arranged on a surface of the base layer away from the side wall of the test cavity.

7. The testing device according to any one of claims 1 to 6, characterized in that: The absorption rate characteristics of the absorbing layer meet the following requirements: the absorption rate of 30MHz to 1GHz is not less than 5dB, and the reflection coefficient of the antenna in the cavity state is not higher than -5dB.

8. The testing device according to any one of claims 1 to 7, characterized in that: The testing device comprises an electrical room and a heat dissipation assembly, wherein the electrical room is located outside the testing cavity, the heat dissipation assembly and the radio frequency module are located in the electrical room, and the heat dissipation assembly is used for dissipating heat for the radio frequency module.

9. The testing device according to claim 8, characterized in that: The heat dissipation component includes an air guide and a heat dissipation fan. The air guide covers the radio frequency module. The air guide is provided with an air inlet and an air outlet. The air inlet is arranged corresponding to the heat dissipation fan.

10. The testing device according to claim 9, characterized in that: The testing device also includes a power supply module, which is electrically connected to the radio frequency module and the heat dissipation fan. The power supply module is located above the air guide and is thermally connected to the air guide.

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