Test system and method for TDD system, and medium and device

Abstract

The present invention belongs to the field of communication tests, and particularly relates to a test system and method for a TDD system, and a medium and a device. The method comprises: a phase-locked loop locking the phase of an RF continuous-wave signal output by an alternating-current signal source; on the basis of an instruction of an MCU, a radio frequency switch processing the RF continuous-wave signal into a fixed-waveform signal; a sampling module processing the fixed-waveform signal to obtain a first processing result and a second processing result, and outputting the first processing result to a TDD system to be tested; a comparison module acquiring a processed signal, performing conversion processing on the processed signal to obtain a rectangular signal, and sending the rectangular signal to the MCU; and the MCU making a comparison to determine whether a switching ratio in the instruction of the MCU is consistent with a switching ratio corresponding to the rectangular signal, wherein if the switching ratio in the instruction of the MCU is consistent with the switching ratio corresponding to the rectangular signal, the test is passed, and if not, the test fails. By means of the present solution, there is no need for multiple instruments during a test process, and the operation process is simple; thus, there is no need for a tester with operational capabilities to conduct a test, thereby saving on manpower and material resources.

Description

A TDD system test system, method, medium and equipment Technical Field

[0001] The present invention belongs to the field of communication testing, and in particular relates to a testing system, method, medium and equipment for a TDD system. Background Art

[0002] The TDD synchronization measurement method in the prior art is as follows:

[0003] 1) Signal source spectrum analyzer test method: Use a signal source to simulate TDD modulated signals, which are received and demodulated by the spectrum analyzer after passing through the device under test. The signal status after passing through the device under test can be read, such as EVM, time slot, rising and falling edges, and other parameters. However, there are the following defects:

[0004] ①This method requires two or even more instruments, which is not conducive to production;

[0005] ②The signal source needs to be able to output TDD modulated signals, and the spectrum analyzer needs to be able to demodulate TDD signals. The related instrumentation costs are high.

[0006] ③ Testers with instrument operation capabilities are required to conduct the test; the instruments need to be configured, which is not conducive to large-scale rapid testing and production.

[0007] 2) Signal source + detector + oscilloscope test method: Use a signal source to simulate the TDD modulated signal, which is received by the detector after passing through the device under test and measured with an oscilloscope. Parameters such as the time slot ratio, time slot period, rising and falling edges can be read out. However, there are the following defects:

[0008] ① Testing requires two or even more instruments, which is not conducive to production;

[0009] ②The signal source needs to be able to output TDD modulated signals, and the spectrum analyzer needs to be able to demodulate TDD signals. The related instrumentation costs are high.

[0010] ③ Testers with instrument operation capabilities are required to conduct the test; the instruments need to be configured, which is not conducive to large-scale and rapid testing and production.

[0011] Summary of the Invention

[0012] The technical problem to be solved by the present invention is to provide a test system, method, medium and equipment for a TDD system.

[0013] The technical solution of the present invention to solve the above technical problems is as follows: A test system for a TDD system includes: a phase-locked loop, a radio frequency switch, a sampling module, a comparison module and an MCU;

[0014] The phase-locked loop is used to: lock the phase of the RF continuous wave signal output by the AC signal source;

[0015] The RF switch is used to: open or close the channel for transmitting the RF continuous wave signal according to the instruction of the MCU, so as to process the RF continuous wave signal into a fixed waveform signal;

[0016] The sampling module is configured to process the fixed waveform to obtain a first processing result and a second processing result, output the first processing result to the TDD system to be detected, convert the second processing result to obtain a first DC signal, and send the first DC signal to the MCU;

[0017] The comparison module is configured to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, convert the processed signal to obtain a second DC signal, process the second DC signal to obtain a rectangular signal, and send the rectangular signal to the MCU;

[0018] The MCU is used to compare whether the switch ratio in the MCU instruction is consistent with the switch ratio corresponding to the rectangular signal. If they are consistent, the test is passed; if they are inconsistent, the test is failed.

[0019] The beneficial effects of the present invention are: the solution does not require multiple instruments during the test process, the operation process is simple, and no test personnel with operational capabilities are required to perform the test, thus saving manpower and material resources.

[0020] On the basis of the above technical solution, the present invention can also be improved as follows.

[0021] Furthermore, the sampling module includes a coupler and a first detector;

[0022] The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected;

[0023] The first detector is used to convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU.

[0024] Furthermore, the comparison module includes a second detector and a comparator;

[0025] The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal;

[0026] The comparator is used to process the second direct current signal to obtain a rectangular signal, and send the rectangular signal to the MCU.

[0027] Furthermore, it also includes:

[0028] The attenuator is used to adjust the amplitude of the RF continuous wave signal.

[0029] Another technical solution of the present invention to solve the above technical problem is as follows: A TDD system testing method comprising:

[0030] The phase-locked loop locks the phase of the RF continuous wave signal output by the AC signal source;

[0031] The radio frequency switch opens or closes the channel for transmitting the RF continuous wave signal according to the instruction of the MCU, so as to process the RF continuous wave signal into a fixed waveform signal;

[0032] The sampling module processes the fixed waveform to obtain a first processing result and a second processing result, outputs the first processing result to the TDD system to be detected, converts the second processing result to obtain a first direct current signal, and sends the first direct current signal to the MCU;

[0033] The comparison module obtains the first DC signal processed by the TDD system to be detected, records it as a processed signal, converts the processed signal to obtain a second DC signal, processes the second DC signal to obtain a rectangular signal, and sends the rectangular signal to the MCU;

[0034] The MCU compares whether the switch ratio in the MCU instruction is consistent with the switch ratio corresponding to the rectangular signal. If they are consistent, the test is passed; if they are inconsistent, the test is failed.

[0035] The beneficial effects of the present invention are: the solution does not require multiple instruments during the test process, the operation process is simple, and no test personnel with operational capabilities are required to perform the test, thus saving manpower and material resources.

[0036] Furthermore, the sampling module includes a coupler and a first detector;

[0037] The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected;

[0038] The first detector is used to convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU.

[0039] Furthermore, the comparison module includes a second detector and a comparator;

[0040] The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal;

[0041] The comparator is used to process the second direct current signal to obtain a rectangular signal, and send the rectangular signal to the MCU.

[0042] Furthermore, it also includes:

[0043] The attenuator is used to adjust the amplitude of the RF continuous wave signal.

[0044] Another technical solution of the present invention to solve the above technical problem is as follows: a storage medium, wherein instructions are stored in the storage medium, and when a computer reads the instructions, the computer executes any of the methods described above.

[0045] The beneficial effects of the present invention are: the solution does not require multiple instruments during the test process, the operation process is simple, and no test personnel with operational capabilities are required to perform the test, thus saving manpower and material resources.

[0046] Another technical solution of the present invention to solve the above technical problem is as follows: an electronic device includes the above storage medium and a processor that executes instructions in the above storage medium.

[0047] The beneficial effects of the present invention are: the solution does not require multiple instruments during the test process, the operation process is simple, and no test personnel with operational capabilities are required to perform the test, thus saving manpower and material resources. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] FIG1 is a structural framework diagram of an embodiment of a test system for a TDD system according to the present invention;

[0049] FIG2 is a flow chart of an embodiment of a method for testing a TDD system according to the present invention;

[0050] FIG3 is a complete structural framework diagram of an embodiment of a test system for a TDD system according to the present invention;

[0051] FIG4 is a comparison diagram of a TDD system test system embodiment according to the present invention after RF switch processing;

[0052] FIG5 is a comparison diagram after attenuator processing provided by an embodiment of a test system for a TDD system of the present invention;

[0053] FIG6 is a schematic diagram of switching time slots provided by an embodiment of a test system for a TDD system according to the present invention. DETAILED DESCRIPTION

[0054] The principles and features of the present invention are described below. The examples given are only used to explain the present invention and are not used to limit the scope of the present invention.

[0055] As shown in FIG1 , a test system for a TDD system includes: a phase-locked loop 100 , a radio frequency switch 200 , a sampling module 300 , a comparison module 400 , and an MCU 500 ;

[0056] The phase-locked loop 100 is used to: lock the phase of the RF continuous wave signal output by the AC signal source;

[0057] The RF switch 200 is used to: open or close the channel for transmitting the RF continuous wave signal according to the instruction of the MCU 500, so as to process the RF continuous wave signal into a fixed waveform signal;

[0058] The sampling module 300 is configured to process the fixed waveform to obtain a first processing result and a second processing result, output the first processing result to the TDD system to be detected, convert the second processing result to obtain a first DC signal, and send the first DC signal to the MCU 500;

[0059] The comparison module 400 is configured to obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, convert the processed signal to obtain a second DC signal, process the second DC signal to obtain a rectangular signal, and send the rectangular signal to the MCU 500;

[0060] The MCU 500 is used to compare whether the switch ratio in the MCU instruction is consistent with the switch ratio corresponding to the rectangular signal. If they are consistent, the test is passed; if not, the test is failed.

[0061] In some possible implementations, this solution does not require multiple instruments during the test process, and the operation process is simple, and does not require testers with operational capabilities to perform the test, saving manpower and material resources.

[0062] It should be noted that the phase-locked loop 100: locks the frequency and phase of the internal oscillation signal of the AC signal source outputting a fixed-amplitude, fixed-power RF continuous wave signal. The frequency and phase of the internal oscillation signal must be the same as the frequency band of the test system. At the same time, the MCU500 needs to configure the phase-locked loop 100. The configuration content includes but is not limited to: configuring the register to obtain the corresponding frequency point; or if the operating frequency band of the device under test is 2.6GHz, the output frequency point of the phase-locked loop configuration should also be 2.6GHz, otherwise the device under test cannot receive the corresponding frequency point, and the amplitude is achieved by the PLL chip, which is about 0dBm.

[0063] RF switch 200: Serves as a signal switch. When turned on, the channel is open, allowing signals to pass through the channel to the next processing module. When turned off, no output is generated. The on / off control is achieved by the MCU 500 outputting the switching time slots for the TDD system being tested, based on instructions from the MCU 500. As shown in Figure 4, the upper waveform is the continuous wave output by the PLL, while the lower waveform is the waveform after the switch, which simulates the TDD waveform. The switching time slots are determined based on the carrier and case (situation) for which the TDD system being tested applies, i.e., based on the TDD system's own characteristics. The switching time slots are controlled by the MCU. In other words, the switching time slots control the ratio of channel opening and closing. Figure 6 shows the switching time slots corresponding to a specific case 1. Note that SLOT0-9 can be understood as different time points: DL indicates downlink switch on, UL indicates uplink switch off, and GP indicates guard interval.

[0064] The sampling module 300 is composed of a coupler and a first detector: Coupler: According to the power distribution, a part of the output signal is extracted and recorded as the first output signal, and the remaining signal is recorded as the second output signal. The first output signal is directly output to the first detector, and the first output signal is used as a closed loop for power control sampling. The second output signal is output to the TDD system to be detected. First detector: Converts the first output signal from an RF signal to a DC signal. It should be noted that the extraction is usually a fixed extraction, which depends on the coupling degree of the coupler and can be in the range of 10 to 20 dB. After the signal is extracted, it is converted through the first detector and sent to MCU500, which stores the converted DC signal. Among them, the closed loop refers to the combination of a coupler, a first detector and an MCU, or the combination of a coupler, a first detector, an attenuator and an MCU. The closed loop part will be applied in the subsequent Example 1.

[0065] Comparison module 400 consists of a second detector and a comparator: the second detector samples the input signal from the TDD system to be tested, converting the input signal from an RF signal to a DC signal; the comparator converts the signal detected by the detector into a rectangular signal by comparing it with a reference level, and outputs it to MCU 500. It should be noted that the input signal is the signal output from the sampling module 300 to the TDD system to be tested, as mentioned above. The TDD system to be tested analyzes this signal and simulates a signal corresponding to the same switching time slot as the input signal.

[0066] The MCU 500 compares the switching time slot amount in the instruction from the MCU 500 with the switching time slot amount corresponding to the input signal obtained based on the input signal. If the comparison result is the same, it indicates that the TDD system to be tested is normal and has no problems. In this case, the normal operation can be indicated by sending a signal or connecting an LED to the MCU 500, such as emitting a short signal prompt tone or lighting the LED continuously. If the comparison result is different, it indicates that there is a problem with the TDD system to be tested. In this case, a warning signal or a flashing LED can be used to provide a message prompt.

[0067] It should be further explained that the comparison of the switch time slots is not just a comparison of the ratio when on and the ratio when off, but needs to specifically correspond to whether the duration when on is consistent with the duration when off.

[0068] Example 1. In addition, the above scheme is based on the premise that the amplitude of the signal adjusted by the RF switch 200 meets the requirements. For example, the test to be performed is a test with a signal amplitude in the range of 0-40, such as a test with a signal amplitude of 25, and the amplitude of the waveform obtained after the control of the RF switch 200 is just 25. At this time, there is no need to adjust the amplitude of the signal. If the amplitude to be tested is 40, the amplitude of the signal needs to be adjusted. At this time, it is necessary to add an attenuator after the RF switch 200 to adjust the amplitude of the signal, and the amount of adjustment is determined by the "first output signal as a closed loop for power control sampling" mentioned above, that is, continuously collecting the power of the first output signal. If the current amplitude is different from the amplitude to be tested, the attenuator is used to increase or decrease the current power to make the current amplitude the same as the amplitude to be tested. That is, the attenuator, coupler, first detector, and MCU500 form a closed loop. The coupler extracts the signal, which is converted by the first detector and sent to the MCU500. The MCU500 determines the amplitude of the converted DC signal and compares it with the required amplitude. Based on the comparison result, the attenuator processes the signal processed by the RF switch 200 to meet the required amplitude. That is, if the power is high, the attenuation value is increased, and if the power is low, the attenuation value is reduced. This process can be seen in Figure 5. The upper part shows the signal from the MCU500 to the switch; the lower part shows the signal from the comparator to the MCU500. The MCU500 compares the two signals to determine the rising edge position, falling edge position, and cycle time.

[0069] Preferably, in any of the above embodiments, the sampling module 300 includes a coupler and a first detector;

[0070] The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected;

[0071] The first detector is used to convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU 500 .

[0072] Preferably, in any of the above embodiments, the comparison module 400 includes a second detector and a comparator;

[0073] The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal;

[0074] The comparator is configured to process the second DC signal to obtain a rectangular signal, and send the rectangular signal to the MCU 500 .

[0075] Preferably, in any of the above embodiments, the method further comprises:

[0076] The attenuator is used to adjust the amplitude of the RF continuous wave signal.

[0077] As shown in FIG2 , a TDD system testing method includes:

[0078] The phase-locked loop 100 locks the phase of the RF continuous wave signal output by the AC signal source;

[0079] The RF switch 200 opens or closes the channel for transmitting the RF continuous wave signal according to the instruction of the MCU 500 to process the RF continuous wave signal into a fixed waveform signal;

[0080] The sampling module 300 processes the fixed waveform to obtain a first processing result and a second processing result, outputs the first processing result to the TDD system to be detected, converts the second processing result to obtain a first DC signal, and sends the first DC signal to the MCU 500;

[0081] The comparison module 400 obtains the first DC signal processed by the TDD system to be detected, records it as a processed signal, converts the processed signal to obtain a second DC signal, processes the second DC signal to obtain a rectangular signal, and sends the rectangular signal to the MCU 500;

[0082] The MCU 500 compares the switch ratio in the MCU instruction with the switch ratio corresponding to the rectangular signal to see if they are consistent. If they are consistent, the test is passed; otherwise, the test is failed.

[0083] In some possible implementations, this solution does not require multiple instruments during the test process, and the operation process is simple, and does not require testers with operational capabilities to perform the test, saving manpower and material resources.

[0084] Preferably, in any of the above embodiments, the sampling module 300 includes a coupler and a first detector;

[0085] The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected;

[0086] The first detector is used to convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU 500 .

[0087] Preferably, in any of the above embodiments, the comparison module 400 includes a second detector and a comparator;

[0088] The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal;

[0089] The comparator is configured to process the second DC signal to obtain a rectangular signal, and send the rectangular signal to the MCU 500 .

[0090] Preferably, in any of the above embodiments, the method further comprises:

[0091] The attenuator is used to adjust the amplitude of the RF continuous wave signal.

[0092] Another technical solution of the present invention to solve the above technical problem is as follows: a storage medium, wherein instructions are stored in the storage medium, and when a computer reads the instructions, the computer executes any of the methods described above.

[0093] In some possible implementations, this solution does not require multiple instruments during the test process, and the operation process is simple, and does not require testers with operational capabilities to perform the test, saving manpower and material resources.

[0094] Another technical solution of the present invention to solve the above technical problem is as follows: an electronic device includes the above storage medium and a processor that executes instructions in the above storage medium.

[0095] In some possible implementations, this solution does not require multiple instruments during the test process, and the operation process is simple, and does not require testers with operational capabilities to perform the test, saving manpower and material resources.

[0096] The reader should understand that in the description of this specification, reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art can combine and combine different embodiments or examples described in this specification and features of different embodiments or examples without contradiction.

[0097] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and method can be implemented in other ways. For example, the method embodiments described above are merely illustrative. For example, the division of steps is merely a logical function division. In actual implementation, other division methods may be used. For example, multiple steps may be combined or integrated into another step, or some features may be ignored or not performed.

[0098] If the above method is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the various embodiments of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, and other media that can store program code.

[0099] The above are merely specific embodiments of the present invention, but the scope of protection of the present invention is not limited thereto. Any person skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope disclosed in the present invention, and such modifications or substitutions are intended to be within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be subject to the scope of protection of the claims.

Claims

1. A test system for a TDD system, characterized in that: include: Phase-locked loop, RF switch, sampling module, comparison module and MCU; The phase-locked loop is used to: lock the phase of the RF continuous wave signal output by the AC signal source; The radio frequency switch is used to: according to the instruction of the MCU, open or close the channel for transmitting the RF continuous wave signal, so as to process the RF continuous wave signal into a fixed waveform signal; The sampling module is used to: process the fixed waveform to obtain a first processing result and a second processing result, output the first processing result to the TDD system to be detected, convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU; The comparison module is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, convert the processed signal to obtain a second DC signal, process the second DC signal to obtain a rectangular signal, and send the rectangular signal to the MCU; The MCU is used to compare whether the switch ratio in the MCU instruction is consistent with the switch ratio corresponding to the rectangular signal. If they are consistent, the test is passed; if they are inconsistent, the test is failed.

2. A TDD system test system according to claim 1, characterized in that: The sampling module includes a coupler and a first detector; The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected; The first detector is used to: convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU.

3. The test system of a TDD system according to claim 1, characterized in that: The comparison module includes a second detector and a comparator; The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal; The comparator is used to process the second direct current signal to obtain a rectangular signal, and send the rectangular signal to the MCU.

4. The test system of a TDD system according to claim 1, characterized in that: Also includes: The attenuator is used to adjust the amplitude of the RF continuous wave signal.

5. A method for testing a TDD system, characterized in that: include: The phase-locked loop locks the phase of the RF continuous wave signal output by the AC signal source; The radio frequency switch opens or closes the channel for transmitting the RF continuous wave signal according to the instruction of the MCU, so as to process the RF continuous wave signal into a fixed waveform signal; The sampling module processes the fixed waveform to obtain a first processing result and a second processing result, outputs the first processing result to the TDD system to be detected, converts the second processing result to obtain a first direct current signal, and sends the first direct current signal to the MCU; The comparison module obtains the first DC signal processed by the TDD system to be detected, records it as a processed signal, converts the processed signal to obtain a second DC signal, processes the second DC signal to obtain a rectangular signal, and sends the rectangular signal to the MCU; The MCU compares whether the switch ratio in the MCU instruction is consistent with the switch ratio corresponding to the rectangular signal. If they are consistent, the test is passed; if they are inconsistent, the test is failed.

6. A TDD system testing method according to claim 5, characterized in that: The sampling module includes a coupler and a first detector; The coupler is used to: process the fixed waveform to obtain a first processing result and a second processing result, and output the first processing result to the TDD system to be detected; The first detector is used to: convert the second processing result to obtain a first direct current signal, and send the first direct current signal to the MCU.

7. A TDD system testing method according to claim 5, characterized in that: The comparison module includes a second detector and a comparator; The second detector is used to: obtain the first DC signal processed by the TDD system to be detected, record it as a processed signal, and convert the processed signal to obtain a second DC signal; The comparator is used to process the second direct current signal to obtain a rectangular signal, and send the rectangular signal to the MCU.

8. A TDD system testing method according to claim 5, characterized in that: Also includes: The attenuator is used to adjust the amplitude of the RF continuous wave signal.

9. A storage medium, characterized in that: The medium stores instructions, and when a computer reads the instructions, the computer executes the method according to any one of claims 5 to 8.

10. An electronic device, characterized in that: The invention comprises the storage medium as claimed in claim 9 and a processor for executing instructions in the storage medium.

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