Apparatus and method for detecting and analyzing foreign substances in cathode

Abstract

The present invention relates to an apparatus and a method for detecting and analyzing foreign substances in a cathode, the apparatus comprising: a first camera which partitions, into a predetermined area, a cathode transported in one direction, and captures same; an image processing processor, which processes an image of the predetermined area captured by the first camera, so as to specify the location at which foreign substances are formed; a second camera for capturing the foreign substances specified by the image processing processor; and a spectrum processing processor, which analyzes spectrum signals of images of the foreign substances captured by the second camera, so as to classify the composition of the foreign substances.

Description

Device and method for detecting and analyzing foreign substances in anode materials

[0001] This invention claims the benefit of Korean Patent Application No. 10-2023-0149852 filed with the Korean Intellectual Property Office on November 2, 2023, the entire contents of which are incorporated herein by reference.

[0002] The present invention relates to a device and method for detecting and analyzing foreign substances in a cathode material, and more specifically, to a device and method for detecting and analyzing foreign substances in a cathode material, which can capture a predetermined section of a cathode material being transported in one direction with a vision camera to identify the location of a foreign substance, and then capture the image with a hyperspectral camera to classify the composition of the foreign substance.

[0003] Among the components that make up a secondary battery, the cathode, along with the anode, is a crucial factor in determining the battery's capacity, lifespan, and charging speed. Common cathode materials include lithium cobalt oxide (LCO), lithium nickel manganese oxide (NCM), and lithium iron phosphate (LFP).

[0004] These cathode materials determine the battery's capacity and average voltage. Therefore, the various types of fine impurities mixed in during the cathode material manufacturing process can significantly impact the quality of the resulting battery cells, resulting in low voltage.

[0005] Ultimately, inductively coupled plasma mass spectrometry (ICP-MS), laser induced breakdown spectrum (LiBS) microscope, micro-XRF, and general vision inspection methods are being used to detect foreign substances mixed into the cathode material and analyze its composition.

[0006] ICP-MS requires a preprocessing step to analyze a sample, which has the disadvantage of being complicated and requiring the use of a separate solvent. Libs microscopy is a technology that uses a microscope to scan a specific area, burns the part recognized as a foreign substance with a laser, and observes the spectrum of the plasma. However, it has the disadvantage of destroying some samples and making it difficult to use in large quantities. Micro-XRF is a technology that analyzes the composition of foreign substances by checking the X-ray response spectrum of particles, but has the disadvantage of taking a long time to move and photograph for mapping. General vision inspection methods have to distinguish particles only with the color of visible light, so it is difficult to distinguish the composition of foreign substances.

[0007] The background technology described above is technical information that the inventor possessed for the purpose of deriving embodiments of the present invention or acquired during the derivation process, and cannot necessarily be said to be publicly known technology disclosed to the general public prior to the filing of the embodiments of the present invention.

[0008] In order to solve the above problem, the present invention provides a device and method for detecting and analyzing foreign substances in a cathode material, which can capture a predetermined section of a cathode material being transported in one direction with a vision camera to identify the location of a foreign substance, and then capture the location with a hyperspectral camera to classify the composition of the foreign substance.

[0009] According to one embodiment of the present invention, a device for detecting and analyzing foreign matter in a cathode material may include a first camera for photographing cathode material transported in one direction by dividing the cathode material into predetermined regions; an image processing processor for processing an image of the predetermined region photographed by the first camera to identify a location where a foreign matter is formed; a second camera for photographing a foreign matter identified by the image processing processor; and a spectrum processing processor for analyzing a spectrum signal of an image of the foreign matter photographed by the second camera to classify the composition of the foreign matter.

[0010] In particular, the first camera may be a vision camera.

[0011] Additionally, the device may further include a first light source that irradiates light in a wavelength band that the vision camera can capture toward a predetermined area of ​​the cathode material.

[0012] Meanwhile, the second camera may be either a hyperspectral camera or a multispectral camera.

[0013] Additionally, the invention may further include a second light source that illuminates the foreign body with light in a wavelength band that can be captured by either the hyperspectral camera or the multispectral camera.

[0014] Meanwhile, if the location of the foreign substance is specified by the image processing processor, a first transport module may be further included to move the second camera to a location where the foreign substance in the predetermined area can be photographed.

[0015] In particular, the first transport module can move the second camera in the width direction of the cathode material being transported by extending in the length direction with a predetermined width direction size.

[0016] In addition, the method may further include a data processing processor that receives location data of a foreign substance specified by an image processing processor and speed data of a positive electrode being transported, and controls the second camera to capture the foreign substance when the foreign substance is at a location where the second camera can capture the foreign substance.

[0017] Meanwhile, if the location of the foreign substance is identified by the image processing processor, a second transport module may be further included to move the cathode material where the foreign substance is located to a location where the second camera can capture the image.

[0018] A method for detecting and analyzing foreign matter in a cathode material according to one embodiment of the present invention may include the steps of dividing a cathode material being transported in one direction into predetermined areas and photographing the area with a first camera; the step of processing an image of the predetermined area photographed with the first camera to specify a location where a foreign matter is formed; the step of photographing the specified foreign matter with a second camera; and the step of analyzing a spectrum signal of the image of the foreign matter photographed with the second camera to classify the composition of the foreign matter.

[0019] In particular, in the step of shooting with the first camera, the first camera may be a vision camera.

[0020] Additionally, when photographing a predetermined area of ​​the cathode material with a vision camera, a step of irradiating light in a wavelength band that the vision camera can photograph toward the predetermined area may be further included.

[0021] Additionally, in the step of shooting with the second camera, the second camera may be either a hyperspectral camera or a multispectral camera.

[0022] Additionally, when photographing a foreign substance with either a hyperspectral camera or a multispectral camera, a step of irradiating light matching a wavelength band that can be photographed by either the hyperspectral camera or the multispectral camera toward the foreign substance may be further included.

[0023] Meanwhile, the step of moving the second camera to a position where it can photograph foreign substances in a specific predetermined area may be further included.

[0024] Here, a step of receiving location data of a specific predetermined area and speed data of the anode material being transported may further be included to control the foreign substance to be photographed when the foreign substance is transported to a position where the second camera can photograph it.

[0025] Alternatively, the method may further include a step of moving the cathode material where the foreign substance is located to a position where the second camera can capture the foreign substance in order to capture the specific foreign substance.

[0026] The device for detecting and analyzing foreign substances in a cathode material according to one embodiment of the present invention has the advantage of enabling rapid and accurate quality control by analyzing and classifying fine foreign substances formed in the cathode material in real time.

[0027] Additionally, additional research data can be obtained on the process in which foreign substances are mixed in the production line of cathode materials.

[0028] The effects that can be obtained from the invention are not limited to the effects mentioned above, and other effects not mentioned can be clearly understood by a person having ordinary skill in the art to which the present invention belongs from the description below.

[0029] FIG. 1 is a perspective view of a foreign matter detection and analysis device for a cathode material according to an embodiment of the present invention.

[0030] FIG. 2 illustrates a block diagram of a foreign matter detection and analysis device for a cathode material according to an embodiment of the present invention.

[0031] FIG. 3 is a perspective view showing a second camera moving in a foreign matter detection and analysis device for a cathode material according to one embodiment of the present invention.

[0032] FIG. 4 is a perspective view showing a movement of a cathode formed with foreign matter in a foreign matter detection and analysis device of a cathode material according to one embodiment of the present invention.

[0033] FIG. 5 illustrates an image of a predetermined area captured by a first camera in a foreign matter detection and analysis device of a cathode material according to one embodiment of the present invention.

[0034] FIG. 6 illustrates an image of a foreign substance captured by a second camera in a foreign substance detection and analysis device for a cathode material according to one embodiment of the present invention.

[0035] FIG. 7 illustrates a spectrum signal of a foreign substance in a foreign substance detection and analysis device of a cathode material according to an embodiment of the present invention.

[0036] Figure 8 illustrates a flowchart of a method for detecting and analyzing foreign substances in a cathode material according to one embodiment of the present invention.

[0037] ※ Explanation of symbols

[0038] 1: Device for detecting and analyzing foreign substances in anode materials

[0039] 10: First camera

[0040] 20: Second camera

[0041] 30: Image Processing Processor

[0042] 40: Spectrum Processing Processor

[0043] 50: Data processing processor

[0044] 60: First light source

[0045] 70: Second light source

[0046] 80: First transport module

[0047] 90: Second transport module

[0048] A: FOV of the first camera

[0049] B: FOV of the second camera

[0050] C: Cathode material

[0051] The present invention will become clearer with reference to the embodiments described below in detail together with the accompanying drawings. However, the present invention is not limited to the embodiments disclosed below, but may be implemented in various different forms. These embodiments are provided only to ensure that the disclosure of the present invention is complete and to fully inform those skilled in the art of the scope of the invention. The present invention is defined solely by the scope of the claims. Meanwhile, the terminology used in this specification is for the purpose of describing the embodiments and is not intended to limit the present invention.

[0052] Throughout this specification, singular forms also include plural forms unless specifically stated otherwise in the text.

[0053] Throughout this specification, the terms "comprises" and / or "comprising" do not exclude the presence or addition of one or more other components, steps, operations and / or elements, and do not exclude other components unless specifically stated to the contrary, but rather include other components.

[0054] Terms such as “first” or “second” used throughout this specification may be used simply to distinguish the corresponding component from other corresponding components and do not limit the corresponding components in any other respect (e.g., importance or order).

[0055] Additionally, terms such as “unit” described throughout this specification mean a unit that processes at least one function or operation, which may be implemented as hardware or software, or a combination of hardware and software.

[0056] Additionally, when it is said throughout this specification that a part is "connected" to another part, this includes not only cases where it is "directly connected" but also cases where it is connected "with another structure in between."

[0057]

[0058] Hereinafter, the present invention will be described in more detail.

[0059] FIG. 1 is a perspective view of a foreign matter detection and analysis device (1) of a cathode material according to an embodiment of the present invention, and FIG. 2 is a block diagram of a foreign matter detection and analysis device (1) of a cathode material according to an embodiment of the present invention.

[0060] Referring to FIGS. 1 and 2, a foreign matter detection and analysis device (1) of a cathode material according to one embodiment of the present invention may include a first camera (10), an image processing processor (30), a second camera (20), and a spectrum processing processor (40).

[0061] The first camera (10) is configured to photograph a cathode material (C) being transported in one direction, and is installed at a predetermined distance from one surface of the cathode material (C), particularly the upper surface, and can be configured to photograph one surface of the cathode material (C).

[0062] In particular, the positive electrode material (C) is formed to have a predetermined widthwise size and a predetermined lengthwise size, and can be extended in the lengthwise direction and transported in one direction. Here, the first camera (10) divides a portion of the lengthwise direction of the positive electrode material (C) into a predetermined region and photographs it. Here, the 'predetermined region' is a region within the FOV (A) range of the first camera (10), and the area of ​​the predetermined region may be the entire width of the positive electrode material (C) in the widthwise direction and a portion of the corresponding lengthwise direction. Alternatively, a portion of the widthwise direction of the positive electrode material (C) may be divided and photographed by a plurality of first cameras (10). This may be determined depending on the sizes of the widthwise and lengthwise directions of the positive electrode material (C).

[0063] In particular, the first camera (10) may be a vision camera. A vision camera is a type of high-performance camera, and may be, for example, a GigE camera, a CameraLink camera, or a CoaXpress camera.

[0064] Finally, the first camera (10) repeatedly captures the cathode material (C) being transported in one direction by dividing it into a predetermined area, and the captured image can be transmitted to the image processing processor (30).

[0065] The image processing processor (30) is a central processing unit that determines the location of a foreign substance existing on the anode material (C), and can specify the location where the foreign substance is formed by receiving an image of a predetermined area captured by the first camera (10). The image captured by the first camera (10) can be converted into electrical energy through a CMOS image sensor and into a digital signal through an ADC (Analog Digital Converter). In this process, the location where a signal exceeding a set signal value is input can be specified as the location of the foreign substance.

[0066] In particular, referring to FIGS. 1 and 2, when the first camera (10) is a vision camera, it may further include a first light source (60) that irradiates light that matches a wavelength band that the vision camera can capture. Generally, a vision camera is a camera that can capture images in the visible light range, and when the colors of particles are the same, it is difficult to distinguish them, and there may be errors due to brightness. Therefore, in order to more effectively identify the location of a foreign substance, it is preferable to capture images by irradiating light that matches the wavelength band of visible light. To this end, the first light source (60) may directly irradiate light toward a predetermined area captured by the first camera (10), or may illuminate the predetermined area through indirect light. In addition, the first light source (60) may be mounted within the same casing as the first camera (10), or may be installed in a separate casing.

[0067]

[0068] Meanwhile, although the location of a foreign substance can be identified through the first camera (10), particularly the vision camera, it is somewhat difficult to determine the type, composition, etc. of the foreign substance. The vision camera has a relatively wide field of view (FOV) and thus has a relatively wide shooting range, but it has the characteristic of making it difficult to distinguish the type of foreign substance.

[0069] Therefore, it is necessary to capture the foreign substance identified in the image processing processor (30) using a separate camera, the second camera (20).

[0070] However, since the second camera (20) has a smaller FOV (B) than the FOV (A) of the first camera (10), the area that can be photographed is somewhat narrower. Therefore, when the location of the foreign substance is determined, it is necessary to move to that location and photograph it. In one embodiment, the second camera (20) may be either a hyperspectral camera or a multispectral camera.

[0071] In particular, the second camera (20) may be a hyperspectral imaging camera (HIS) or a multispectral imaging camera (Multi-Spectral Imaging, Multi-Band Camera). A hyperspectral camera has the characteristic of being able to capture a wide range of wavelengths by extending the range beyond the visible light wavelength. In addition, a hyperspectral image captured by a hyperspectral camera has the advantage of being able to acquire three-dimensional information composed of two spatial dimensions and one spectral size.

[0072] Multispectral cameras can capture images across the visible, near-infrared, and infrared wavelength ranges. While multispectral and hyperspectral cameras share the same principles, hyperspectral cameras offer higher radiative resolution and a finer spectrum.

[0073] Therefore, it is preferable to use a hyperspectral camera when the signal difference on the continuous spectrum is sensitive to the characteristics of the foreign substance, and a multispectral camera for faster processing and analysis when the signal difference is not large.

[0074] Finally, the second camera (20) captures only foreign substances at a specific location among a predetermined area of ​​the cathode material (C) being transported in one direction, and the captured image of the foreign substance can be transmitted to the spectrum processing processor (40).

[0075] The spectral processing processor (40) is a central processing unit that analyzes the spectral signal of a foreign substance, and can classify the composition of the foreign substance by receiving an image of the foreign substance captured by the second camera (20). The image captured by the second camera (20) has hundreds of continuous spectral wavelength bands reflected from the foreign substance, thereby enabling the composition of the foreign substance to be identified. This wide electromagnetic spectral range allows for high wavelength resolution and can include a wide range of spatial spectral information.

[0076] In particular, when the second camera (20) is one of a hyperspectral camera or a multispectral camera, it may further include a second light source (70) that irradiates light that matches a wavelength band that the camera can capture. Unlike a vision camera, a hyperspectral camera and a multispectral camera can capture light in a wavelength range wider than the range of visible light, so it is desirable to capture light that matches a wavelength band that the camera can capture. To this end, the second light source (70) may directly irradiate light toward a foreign substance captured by the second camera (20), or may illuminate the foreign substance through indirect light. In addition, the second light source (70) may be mounted within the same casing as the second camera (20), or may be installed in a separate casing.

[0077] Meanwhile, in order for the second camera (20) to capture a foreign substance, the second camera (20) must be positioned at the location where the foreign substance is formed in the cathode material (C). This is particularly important when the second camera (20) is a hyperspectral camera or a multispectral camera, because the area that the camera can capture is very small.

[0078] Therefore, the second camera (20) and / or the cathode material (C) on which the foreign matter is formed need to move. Fig. 3 is a perspective view showing the movement of the second camera (20) in the foreign matter detection and analysis device (1) of the cathode material (C) according to an embodiment of the present invention, and Fig. 4 is a perspective view showing the movement of the cathode material (C) on which the foreign matter is formed in the foreign matter detection and analysis device (1) of the cathode material (C) according to an embodiment of the present invention.

[0079] Referring to FIG. 3, a first transport module (80) may be further included to move a second camera (20) to a position where a foreign substance in a predetermined area can be photographed. Alternatively, referring to FIG. 4, a second transport module (90) may be further included to move a cathode material (C) in a predetermined area to a position where the second camera (20) can photograph it.

[0080] In the case of the first transport module (80), as an example, it can move in the width direction and / or length direction of the positive electrode material (C).

[0081] In particular, when the first transport module (80) can move in the width direction of the positive electrode material (C), the positive electrode material (C) having a predetermined width direction size and length direction size is transported in the length direction, so that the second camera (20) can capture an image of the foreign substance by taking a picture when the foreign substance is located in the direction in which the second camera (20) is facing after moving in the width direction of the positive electrode material (C).

[0082] Here, it is necessary to consider the speed at which the anode material (C) is transported. That is, when the location of a foreign substance is specified in a predetermined area photographed by the first camera (10), the anode material (C) is continuously moving in the longitudinal direction, so the photograph must be taken at the moment when the foreign substance is located in the FOV (B) of the second camera (20).

[0083] This can move the position of the second camera (20) through the data processing processor (50). More specifically, by coordinating the position data of the foreign substance specified by the image processing processor (30) and receiving the speed data of the anode material (C) being transported, the position change of the corresponding coordinates is taken into consideration, and when the foreign substance is transported to a position where the second camera (20) can take pictures, the foreign substance can be controlled to be photographed.

[0084] In the case of the second transport module (90), it is configured to move the cathode material (C) containing foreign substances to the location where the second camera (20) is located. This is a device that makes it easy to collect a sample of the cathode material (C) containing foreign substances, and when the location where the foreign substances are formed is specified by processing the image of a predetermined area captured by the first camera (10), the cathode material (C) containing the foreign substances can be transported in a direction other than one direction. In one embodiment, the direction can separate the cathode material (C) in a direction forming a predetermined angle with the one direction, preferably in a vertical direction. The separated cathode material (C) can be photographed in a location where the foreign substances are located using the second camera (20).

[0085]

[0086] Hereinafter, the results of spectrum analysis are shown through a foreign substance location detection image captured by the first camera (10) according to a foreign substance detection and analysis device (1) of a cathode material according to one embodiment of the present invention, and a foreign substance image captured by the second camera (20).

[0087] FIG. 5 illustrates an image of a predetermined area captured by a vision camera, which is a first camera (10), in a foreign matter detection and analysis device (1) of a cathode material according to an embodiment of the present invention. When a predetermined area of ​​a cathode material (C) being transported in one direction is captured and image processed, when a foreign matter exists in the cathode material (C), the foreign matter can be detected as in FIG. 5. The detected foreign matter specifies its location, transmits the location data to the data processing processor (50), and also transmits the speed data of the cathode material (C) being transported in one direction to the data processing processor (50). The data processing processor (50), which has received the data, moves it to capture the foreign matter with a hyperspectral camera, which is a second camera (20).

[0088] FIG. 6 illustrates a photograph of a foreign substance captured by a hyperspectral camera, which is a second camera (20), in a foreign substance detection and analysis device (1) for a cathode material according to one embodiment of the present invention. When a foreign substance on a cathode material (C) is captured by a hyperspectral camera, it can be confirmed as shown in FIG. 6. However, in order to analyze the composition of the foreign substance, the spectral signal of the foreign substance image must be analyzed.

[0089] FIG. 7 illustrates a spectrum signal of a foreign substance in a foreign substance detection and analysis device (1) of a cathode material according to an embodiment of the present invention. The foreign substance has a spectrum size formed differently according to a predetermined wavelength depending on its type. For example, in the case of aluminum (Alumina), the spectrum width and wavelength change are large at wavelengths of 425 to 676 nm, and in the case of stainless steel (SUS), the spectrum width is maintained gently at wavelengths of 447 to 583 nm, the spectrum width of copper increases significantly at a wavelength of 699 nm, and it can be confirmed that the spectrum width of brass does not change significantly.

[0090] Ultimately, by identifying the location of the foreign substance through a vision camera and analyzing the spectrum signal of the foreign substance photographed through a hyperspectral camera, the location and composition of the foreign substance present on the cathode material (C) can be more effectively analyzed.

[0091]

[0092] Meanwhile, a method (S1) for detecting and analyzing foreign matter in a cathode material according to an embodiment of the present invention may include a step (S10) of dividing a cathode material (C) being transported in one direction into predetermined areas and photographing the area with a first camera (10), a step (S20) of processing an image of the predetermined area photographed with the first camera (10) to identify a location where a foreign matter is formed, a step (S30) of photographing the identified foreign matter with a second camera (20), and a step (S40) of analyzing a spectrum signal of the image of the foreign matter photographed with the second camera (20) to classify the composition of the foreign matter.

[0093] The step (S10) of photographing with the first camera (10) is a step of photographing the cathode material (C) being transported in one direction. Here, the 'predetermined area' may be an area within the FOV range (A) of the first camera (10). In addition, the first camera (10) may be a vision camera.

[0094] When photographing a predetermined area of ​​the cathode material (C) with the first camera (10), a step (S11) of irradiating light in a wavelength band that the vision camera can photograph toward the predetermined area may be further included. This is a step for more easily finding foreign substances formed in the predetermined area.

[0095] The step (S20) of specifying the location of the foreign substance is a step of specifying the location of the foreign substance on the cathode material (C) by processing an image of a predetermined area captured by the first camera (10). This is because the FOV (B) of the second camera (20) is smaller than the FOV (A) of the first camera (10), so it is necessary to specify the location of the foreign substance more specifically.

[0096] If the location of the foreign substance is specified, a step (S21) of moving the second camera (20) to a position where the foreign substance in the specified predetermined area can be photographed may be further included. Alternatively, a step (S22) of moving the cathode material (C) where the foreign substance is located to a position where the second camera (20) can photograph it may be further included.

[0097] The step (S30) of photographing with the second camera (20) is a step of photographing the foreign substance with the second camera (20) when the location of the foreign substance is specified. The location of the foreign substance may be formed within the FOV (B) range of the second camera (20). In addition, the second camera (20) may be either a hyperspectral camera or a multispectral camera.

[0098] When photographing a foreign substance with the second camera (20), a step (S31) of irradiating light matching a wavelength band that can be photographed by either a hyperspectral camera or a multispectral camera toward the foreign substance may be further included. This is a step for more easily classifying the composition of the foreign substance.

[0099] In particular, when photographing a foreign substance with the second camera (20), a step (S32) may be further included to control photographing the foreign substance when it is transported to a position where the second camera (20) can photograph it by receiving location data of a specific predetermined area and speed data of the positive electrode (C) being transported.

[0100] The step of classifying the composition of the foreign substance (S40) is a step of classifying the composition of the foreign substance by analyzing the spectrum signal of the image of the foreign substance captured by the second camera (20).

[0101] The method (S1) for detecting and analyzing foreign matter in a cathode material according to an embodiment of the present invention may include all technical features and contents of the device (1) for detecting and analyzing foreign matter in a cathode material according to an embodiment of the present invention described above.

[0102]

[0103] Although the present invention has been described above with reference to limited embodiments, the present invention is not limited thereto, and it is obvious that various modifications and variations are possible within the scope of the technical idea of ​​the present invention and the equivalent scope of the patent claims to be described below by a person having ordinary skill in the art to which the present invention pertains.

Claims

1. A first camera that divides the cathode material being transported in one direction into a predetermined area and photographs it; An image processing processor that processes an image of a predetermined area captured by the first camera to identify a location where a foreign substance is formed; A second camera for photographing the foreign substance specified in the image processing processor; and A foreign substance detection and analysis device for a cathode material, comprising a spectrum processing processor that analyzes the spectrum signal of the foreign substance image captured by the second camera to classify the composition of the foreign substance.

2. In paragraph 1, The above first camera, A device for detecting and analyzing foreign matter in a cathode material, characterized by being a vision camera.

3. In paragraph 2, A foreign matter detection and analysis device for an anode material, further comprising a first light source that irradiates light in a wavelength band that the vision camera can capture toward a predetermined area of ​​the anode material.

4. In paragraph 1, The above second camera, A device for detecting and analyzing foreign matter in a cathode material, characterized in that it is one of a hyperspectral camera or a multispectral camera.

5. In paragraph 4, A foreign matter detection and analysis device for a cathode material further comprising a second light source that irradiates light in a wavelength band that can be captured by one of the hyperspectral camera or the multispectral camera toward the foreign matter.

6. In paragraph 1, A foreign matter detection and analysis device for a cathode material, further comprising a first transport module that moves the second camera to a position where the foreign matter can be photographed in the predetermined area when the location of the foreign matter is specified by the image processing processor.

7. In paragraph 6, The above first transport module, A foreign matter detection and analysis device for a cathode material, characterized in that the second camera is moved in the width direction of the cathode material, which is extended in the length direction and transported with a predetermined width direction size.

8. In paragraph 6 or 7, A foreign matter detection and analysis device for a cathode material, further comprising a data processing processor that receives location data of the foreign matter specified by the image processing processor and data on the speed at which the cathode material is transported, and controls the foreign matter to be photographed when the foreign matter is at a location where the second camera can photograph it.

9. In paragraph 1, A foreign matter detection and analysis device for a cathode material, further comprising a second transport module that moves the cathode material where the foreign matter is located to a position where the second camera can capture the foreign matter when the location of the foreign matter is identified by the image processing processor.

10. A step of dividing the cathode material being transported in a certain direction into a predetermined area and photographing it with a first camera; A step of processing an image of a predetermined area captured by the first camera to identify a location where a foreign substance is formed; A step of photographing the specified foreign substance using a second camera; and A method for detecting and analyzing foreign matter in a cathode material, comprising: a step of analyzing a spectrum signal of the foreign matter image captured by the second camera to classify the composition of the foreign matter; 11. In paragraph 10, In the step of shooting with the above first camera, A method for detecting and analyzing foreign substances in a cathode material, characterized in that the first camera is a vision camera.

12. In paragraph 11, A method for detecting and analyzing foreign substances in a cathode material, further comprising a step of irradiating light in a wavelength band that the vision camera can capture toward the predetermined area when photographing a predetermined area of ​​the cathode material with the vision camera.

13. In paragraph 10, In the step of shooting with the above second camera, A method for detecting and analyzing foreign matter in a cathode material, characterized in that the second camera is one of a hyperspectral camera or a multispectral camera.

14. In paragraph 13, A method for detecting and analyzing foreign substances in a cathode material, further comprising the step of irradiating light matching a wavelength band that can be captured by one of the hyperspectral camera or the multispectral camera toward the foreign substance when capturing the foreign substance with one of the hyperspectral camera or the multispectral camera.

15. In paragraph 10, A method for detecting and analyzing foreign substances in a cathode material, further comprising the step of moving the second camera to a position capable of photographing the foreign substances in the specified predetermined area.

16. In paragraph 15, A device for detecting and analyzing foreign matter in a cathode material, further comprising a step of controlling the cathode material to photograph the foreign matter when the foreign matter is transported to a position where the second camera can photograph the foreign matter by receiving location data of the specified predetermined area and speed data at which the cathode material is transported.

17. In paragraph 10, A method for detecting and analyzing foreign substances in a cathode material, further comprising the step of moving the cathode material where the foreign substance is located to a position where the second camera can capture the foreign substance.

Images