A current output module
A 32-channel current output module for SLSC systems addresses inefficiencies in HIL testing by converting voltage to current and managing relay control, enhancing testing efficiency and reducing cable complexity.
Patent Information
- Application Number
- PCT/TR2024/051412
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2024-11-26
- Publication Date
- 2025-07-03
AI Technical Summary
Existing SLSC Module systems face challenges in performing multi-port measurements efficiently while maintaining performance levels, especially in HIL testing, due to complex and compact product designs, and there is a need for cost-effective, reliable solutions that eliminate the inefficiency of detailed point-to-point cable connections.
A 32-channel current output module is developed for SLSC systems, converting external voltage into a constant current output, utilizing FGPA modules to manage relay control and signal scaling, and compatible with SLSC chassis for comprehensive testing and measurements.
The module enables efficient, reliable, and cost-effective multi-port measurements in HIL testing by eliminating the need for detailed cable connections, saving time and preventing damage to tested systems.
Smart Images

Figure TR2024051412_03072025_PF_FP_ABST
Abstract
Description
[0001] DESCRIPTION
[0002] A CURRENT OUTPUT MODUEE
[0003] Technical Field
[0004] The present invention relates to a current output module which is used in SLSC (Switch Load and Signal Conditioning) systems and in electronic hardware testing, particularly in HIL (Hardware-in-the-loop) testing, and which is connected to test equipment and / or products being tested and enables comprehensive testing and measurements.
[0005] Background of the Invention
[0006] Today, advanced integrated circuit technologies allow many different technical features to be combined into a single product and therefore lead to complex and compact product designs. The performance test infrastructures of advanced, complex and compact products also change according to the emerging needs. The ability to perform multi-port measurements simultaneously while maintaining the expected performance level of the device, shortening test times, renewable / modular test systems and cost-effective solutions have created needed requirements in the test and measurement market and created a competitive environment in the test and measurement field. Embedded software testing has become one of the most important fields, especially since embedded software is critical in terms of security in various fields with complex structures, mainly in the automotive, aircraft and defense industries. Performing hardware-in-the-loop tests (HIL Test System) on the hardware is encountered as one of the most widely adopted methods in the industrial field in testing embedded software, which is critical for safety due to its ability to simulate the inputs of the system to be tested. HIL test systems enable tests to be performed as often as desired, saving time without the risk of damaging high-cost hardware and without carrying the security risks of the untested product. At this point, SLSC Modules have taken its place in the worldwide market as a product that has emerged as an attachment to the measurement and control platform of HIL test systems for more practical and more efficient operation.
[0007] The SLSC Module system consists of 4 main components as chassis, modules, Rear Transition Interface (RTI) and cabling. The chassis, in addition to being a unit designed to be used in combination with the PXI (PCI Extensions for Instrumentation), offers more power and board space which is ideal for high power loads, switching and signal conditioning. The chassis enables the communication between the modules and performs the cooling function of the system. On the other hand, SLSC Modules provide switching, load simulation or signal conditioning for signal paths. SLSC Modules can communicate and be fed through the chassis, or they can communicate through auxiliary lines on the modules themselves. On the other hand, the rear transition interface RTI provides a standard connection for bringing signals back to the cable options of the SLSC modules and to the data acquisition modules (DAQ). The cabling of the SLSC module system allows signals to be transmitted within standard available cables and simplifies overall system integration by reducing the need for cabling.
[0008] The SLSC Module system, which can be defined as a companion platform in addition to HIL systems, contains front-end modules that can be used in PXI or CompactRIO (cRIO) extensions and specific to the system to be tested. The SLSC Module, in addition to comprising a rear transition interface that provides a standardized connection between itself and the PXI or cRIO, has a standard cable function diagram. Therefore, it enables the function to be fulfilled while using standard cables, without the need for a detailed point-to-point cable connection. The SLSC module system, which can eliminate the vulnerability to error resulting from the lack of the need for point-to-point cable connection, facilitates the test and measurement process due to its standardized connections. SLSC Modules can operate in stand-alone, pass through, or cascaded / sequential mode within the chassis. The cascade mode allows the signal path to pass through more than one SLSC module. Each SLSC chassis also comprises an SLSC digital data bus that allows users to explore, configure and set parameters on individual modules. Signals can pass through SLSC modules through both the front connection point and through the rear transition interface (RTI) connection.
[0009] Points such as renewable test systems in the known state of the art, repeated uses, finding cost-effective solutions aim to solve the needs created by today's technology in the easiest and most reliable way. In this context, it has become a need to produce signal conditioning and switching systems that can provide the most effective results for the increasing need for test systems and solutions. SLSC Module Systems, while being the product that emerged as a result of these needs, has been a product that saves time and cost by eliminating the difficulty and inefficiency of detailed point-to-point cable connection that HIL systems encounter. In addition, the SLSC Module system provides advantages in real-time and simulation-oriented test and measurement systems in terms of preventing damage to the systems to be tested and performing the tests repeatedly. It has a structure that can be adapted to technological developments since it is a system that not only allows the creation of configurations formed by different modules specific to the system to be tested, but also allows the modules to be developed on their own. In particular, expanding the test intervals of the feature of the system to be tested is stated as a need to be met for products with the latest technological design by product development companies.
[0010] The Chinese patent document no. CN216926923, an application included in the state of the art, discloses an instrument capable of measuring the direct current resistance of an opening and closing coil of a circuit breaker with a rectifier module, which comprises a shell, a plurality of keys and a liquid crystal display screen are arranged on the surface of the shell, a battery and a test circuit board are arranged in the shell, and the test circuit board comprises a power supply module, a constant current and signal conditioning module connected with the output end of the power supply module, a CPU (Central Processing Unit) and a sampling module; the power supply module is powered by a battery and converts the battery voltage into + / -15V and 3.3 V to respectively supply power to the constant current and signal conditioning module and the CPU and sampling module; the constant current and signal conditioning circuit is connected with the CPU and sampling module and is used for providing various constant current and conditioning voltage signals; and the CPU and sampling module is used for controlling the external interface and detecting the electric quantity of the battery. According to the invention, the rectification module does not need to be dismounted and recovered, measurement is directly carried out on the AC side of the rectification module, the test time is greatly reduced, and the controllability of on-site safety is improved.
[0011] The Chinese patent document no. CN218585189, an application included in the state of the art, discloses an AC signal simulation conditioning module for a controller. The said invention describes an AC signal simulation conditioning module for a controller. In the invention, the signal input circuit is respectively connected with a tested piece and the phase switching circuit, the phase switching circuit is connected with the four-quadrant DA circuit, and the four-quadrant DA circuit is connected with the filtering gain circuit; the signal input circuit is used for receiving an electric signal input by a tested piece and transmitting the electric signal to the phase switching circuit; the phase switching circuit is used for controlling current and obtaining an alternating current sine wave reference signal in the same direction as the input voltage according to the measured phase; the four-quadrant DA circuit is used for controlling an input voltage amplitude and outputting a required alternating current sine wave reference signal; and the filtering gain circuit is used for amplifying the alternating current sine wave reference signal and filtering interference noise in the alternating current sine wave reference signal. According to the invention, the acquisition quantity and the effective signal acquisition quantity of the output signal of the detected piece are improved, and the normal detection of the output signal of the detected piece is ensured.
[0012] The Taiwanese patent document no. TW201813301, an application included in the state of the art, discloses a level shift circuit and semiconductor device. The said invention provides a level shift circuit and a semiconductor device capable of extending a power supply potential range in which the level shift operation can be performed. In the invention, a level shift circuit includes amplitude amplifying circuits AMPtl, AMPbl, and a sublevel shift circuit SLSC1. The amplitude amplifying circuits AMPtl, AMPbl are supplied with a reference power supply potential GND and an external power supply potential VDD2 and, in response to an input signal (INT, INB) of an internal power supply voltage amplitude (VDD1 (< VDD2) amplitude), output signals SND1, SND2 with an amplitude larger than the VDD1 amplitude and smaller than the external power supply voltage amplitude (VDD2 amplitude). The sublevel shift circuit SLSC1 is supplied with the reference power supply potential GND and the external power supply potential VDD2, and outputs an output signal (OUT, OUTB) of the VDD2 amplitude in response to the signals SND1, SND2.
[0013] The United States patent document no. US2001033196, an application included in the state of the art, discloses a state variable filter including a programmable variable resistor. In the said invention, an active state variable filter including a summing circuit, a first and second integrator circuits, and an amplifier circuit is described. The summing circuit and first and second integrator circuits each include a programmable variable resistor for programmably varying the filtering characteristics of the state variable filter. Each programmable variable resistor receives a digital value and provides an electrical resistance corresponding to the digital value between a pair of terminals. Each programmable variable resistor may include multiple branch circuits extending between the pair of terminals, each branch circuit including an electrical resistor and an electrical switch connected in series. Alternately, each programmable variable resistor may include multiple subcircuits connected in series between the pair of terminals, each subcircuit including an electrical resistor and an electrical switch connected in parallel. Each programmable variable resistor may also include a memory unit for storing the digital value, and control logic for controlling the electrical switches dependent upon the digital value. The electrical switches may be bilateral switches such as microelectromechanical systems (MEMS) switches. An instrumentation system is also presented comprising a signal conditioning subsystem including the state variable filter.
[0014] The United States patent document no. US5909660, an application included in the state of the art, discloses a signal conditioning module for sensing multiform field voltage signals. In the said invention, a signal conditioning module for sensing multiform field signals and for providing isolated digital signals appropriate for a processing system is described. The invention allows sensing of field signals which are either AC or DC and which have magnitudes ranging from zero to greater than 240 volts in the preferred embodiment. A circuit according to the said invention includes a bidirectional maximum current limiter coupled to a bidirectional isolation current sensor. The current sensor preferably includes an opto-coupler. The current limiter preferably includes cross-coupled depletion mode devices and a current limit resistor. In this manner, current flowing through the resistor develops a voltage for turning off one depletion mode device or the other depending upon the polarity of the current, so that the input current is limited to a predetermined maximum level for a wide voltage range of input signals and regardless of voltage polarity. The opto-coupler preferably includes cross-coupled LEDs for sensing current in either direction. An AC smoothing filter is provided at the output to filter AC signals for providing a smooth digital output signal.
[0015] The United States patent document no. US6513086, an application included in the state of the art, discloses a signal conditioning system including low voltage and high voltage analog buses. In the said invention, a signal conditioning system which includes a low voltage analogue bus, and a high voltage analogue bus is described. The signal conditioning system comprises a chassis having a plurality of slots, wherein each of the slots is adapted to receive a module. The chassis includes a low voltage analogue bus and adapted for transmitting low voltage electrical signals. The chassis also includes a high voltage analogue bus and adapted for transmitting high voltage electrical signals. Modules may be placed in slots of the chassis, wherein each module may connect through a connector to one or both of the low voltage analogue bus and the high voltage analogue bus. The high voltage analogue bus allows for the conditioning (including switching) of high voltage electrical signals. In an alternate embodiment, the signal conditioning system may comprise a chassis which only includes a low voltage analogue bus, i.e., the chassis does not include a built-in high voltage analogue bus. For example, the signal conditioning system may be an existing SCXI chassis which does not include a high voltage analogue bus. In this embodiment, the system may include one or more rear connectors which are adapted to connect to one or more of the modules comprised in the chassis. The one or more rear connectors collectively form a high voltage analogue bus for transmitting high voltage electrical signals between the one or more modules.
[0016] Summary of the Invention
[0017] An object of the present invention is to realize a 32-channel current output module which is used in SLSC systems and in electronic hardware testing, particularly in HIL (Hardware-in-the-loop) testing, in order to enable comprehensive testing and measurements and which is connected to test equipment and / or products being tested.
[0018] Detailed Description of the Invention
[0019] “A Current Output Module” realized to fulfd the objectives of the present invention is shown in the figures attached, in which: Figure 1 is a view of an inventive current output module.
[0020] The components illustrated in the figure are individually numbered, where the numbers refer to the following:
[0021] 1. Current output module
[0022] 2. Module circuit board
[0023] 3. FGPA (Field-programmable gate arrays) module
[0024] 4. Front panel
[0025] 5. Front panel fixer
[0026] 6. Mounting mechanism
[0027] 7. Connection element
[0028] An inventive current output module (1) which is used in SLSC systems and converts the voltage value given externally into a constant output current by connecting to the test equipment and the products being tested in electronic hardware tests, especially in HIL (Hardware-in-the-loop) tests mainly comprises at least one module circuit board (2); and at least one FGPA module (3) which is located on the module circuit board (2); has at least one control block that receives 24 V voltage from an SLSC case and is used to turn the outputs on and off, and at least one current output block that converts the ±10V voltage value coming from the control block to ± 100mA value in a signalized manner and wherein the ±15V voltage requirement is provided externally.
[0029] An inventive current output module (1) further comprises at least one front panel (4) which is fixed on the module circuit board (2) by means of a front panel fixer (5) and connection elements passing through therein; and at least one mounting mechanism (6) which is located on the front panel (4) and fixed with the help of connection elements; and a plurality and variety of connection elements (7) which are used for fixing and mounting.
[0030] The FGPA module (3) included in an inventive current output module (1) converts the voltage value given externally into a constant current output and receives a power at 24 V voltage from the SLSC case. The FGPA module (3) receives the ±15V voltage required for the current output blocks externally. The controller block located in the FGPA module (3) is used to turn the outputs on and off. The current output block located in the FGPA module (3) converts the transmitted ±10V into ± 100mA in a signal scaled manner. (Diagram 1) The controller block located in the FGPA module (3) performs relay control for the signal outputs.
[0031] Diagram 1. Current output module (1) diagram
[0032] In the FGPA module (3) included in an inventive current output module (1), a voltage in the range of ±10 V is applied from the JI connector in the current output block and transmitted to the "IN+" pins of the U1 and U3 op-amps (operational amplifier). The FGPA module (3) generates a positive voltage value on the Out pins of the U1 and U3 op-amps due to the operating principle of the op-amps (comparator) if the voltage applied to the current output block is positive. The FGPA module (3) generates a negative voltage value on the “OUT” pins of the U1 and U3 op-amps due to the operating principle of the op-amps if the voltage applied to the current output block is negative.
[0033] When a positive voltage is applied from the JI connector, the QI MOSFET (metal-oxide-semiconductor field-effect transistor) is activated due to the positive voltage applied to the “G” pin since it is an n-MOSFET, and a current transmission is enabled between the “D” and “S” pins of the QI MOSFET. On the other hand, the Q3 MOSFET is deactivated due to the positive voltage applied to the “G” pin since it is a p-MOSFET. After the QI MOSFET is activated, the voltage applied to the “IN+” pin of the U1 op-amp is transmitted to the “IN-” pin due to the operating principle of the op-amps. The voltage value on the “IN-” pin of the U1 op-amp is transmitted to the “S” pin of the QI MOSFET. The voltage on the “S” pin of the QI MOSFET enables a current to flow through the R1 resistance. Due to the operating principle of the MOSFETs, the current passing through the “S” pin of the QI MOSFET also passes through the “D” pin and therefore this passing current also passes through the R2 resistance. The current passing through the R2 resistance causes a voltage drop and this voltage drop is transmitted to the “IN+” pin of the U2 op-amp at +15V voltage. Due to the operating principle of the op-amp (comparator), a negative voltage value is generated on the “OUT” pin of the U2 integration. The Q2 MOSFET is activated due to the negative voltage applied to the “G” pin since it is a p-MOSFET, and a current transmission is enabled between the “D” and “S” pins of the Q2 MOSFET. After the Q2 MOSFET is activated, the voltage on the “IN+” pin of the U2 op-amp is transmitted to the “IN-” pin due to the operating principle of opamps. The voltage value on the “IN-” pin of the U2 op-amp is transmitted to the “S” pin of the Q2 MOSFET. A current flows through R3 resistance since there is a voltage difference between the voltage on the “S” pin of the Q2 MOSFET and the +15V voltage. The current flowing through the R3 resistance is transmitted to the J2 connector through the Q2 MOSFET since the Q2 MOSFET is active and therefore the current flowing through the “S” pin will also flow through the “D” pin.
[0034] When a negative voltage is applied from the JI connector, the Q3 MOSFET is activated due to the negative voltage applied to the “G” pin since it is a p- MOSFET, and a current transmission is enabled between the “D” and “S” pins of the Q3 MOSFET. On the other hand, the QI MOSFET is deactivated due to the negative voltage applied to the “G” pin since it is an n-MOSFET. After the Q3 MOSFET is activated, the voltage applied to the “IN+” pin of the U3 op-amp is transmitted to the “IN-” pin due to the operating principle of the op-amps. The voltage value on the “IN-” pin of the U3 op-amp is transmitted to the “S” pin of the Q3 MOSFET. The voltage on the “S” pin of the Q3 MOSFET enables a current to flow through the R4 resistance. Due to the operating principle of the MOSFETs, the current passing through the “S” pin of the Q3 MOSFET also passes through the “D” pin and therefore this passing current also passes through the R5 resistance. The current passing through the R5 resistance causes a voltage drop and this voltage drop is transmitted to the “IN+” pin of the U4 op-amp at - 15V voltage. Due to the operating principle of the op-amp (comparator), a positive voltage value is generated on the “OUT” pin of the U4 integration. The Q4 MOSFET is activated due to the positive voltage applied to the “G” pin since it is a n-MOSFET, and a current transmission is enabled between the “D” and “S” pins of the Q4 MOSFET. After the Q4 MOSFET is activated, the voltage on the “IN+” pin of the U4 op-amp is transmitted to the “IN-” pin due to the operating principle of op-amps. The voltage value on the “IN-” pin of the U4 op-amp is transmitted to the “S” pin of the Q4 MOSFET. A current flows through R6 resistance since there is a voltage difference between the voltage on the “S” pin of the Q4 MOSFET and the -15V voltage. The current flowing through the R6 resistance is transmitted to the J2 connector through the Q4 MOSFET since the Q4 MOSFET is active and therefore the current flowing through the “S” pin will also flow through the “D” pin. In this way, a current in the range of ±100mA is received from the J2 connector. (Diagram 2)
[0035]
[0036] Diagram 2. Detailed diagram of current output block
[0037] An inventive current output module (1) is a 32-channel current module used in an SLSC chassis housing. An inventive current output module (1) provides current output in the range of ± 100mA with a resolution of lOOuA by using ±10V analogue voltage from the input. The signal outputs of an inventive current output module (1) are relay controlled, and the relay control is provided by the control block on the FGPA module (3). An inventive current output module (1) should be used in combination with the SLSC chassis. On the other hand, independent channel configuration can be realized by means of an inventive current output module (1) and the load connection has a maximum value of 14.5 V. Furthermore, an inventive current output module (1) comprises 2 slots for instrumentation modules. Within these basic concepts; it is possible to develop various embodiments of the inventive “A Current Output Module (1)”; the invention cannot be limited to examples disclosed herein and it is essentially according to claims.
Claims
CLAIMS1. A current output module (1) which is used in SLSC systems and converts the voltage value given externally into a constant output current by connecting to the test equipment and the products being tested in electronic hardware tests, especially in HIL (Hardware-in-the-loop) tests mainly; characterized by at least one module circuit board (2); and at least one FGPA module (3) which is located on the module circuit board (2); has at least one control block that receives 24 V voltage from an SLSC case and is used to turn the outputs on and off, and at least one current output block that converts the ±10V voltage value coming from the control block to ± 100mA value in a signalized manner and wherein the ±15V voltage requirement is provided externally.
2. A current output module (1) according to Claim 1; characterized by at least one front panel (4) which is fixed on the module circuit board (2) by means of a front panel fixer (5) and connection elements passing through therein; and at least one mounting mechanism (6) which is located on the front panel (4) and fixed with the help of connection elements; and a plurality and variety of connection elements (7) which are used for fixing and mounting.
3. A current output module (1) according to Claim 1 or 2; characterized by the FGPA module (3) which converts the voltage value given externally into a constant current output and receives a power at 24 V voltage from the SLSC case.
4. A current output module (1) according to any one of the preceding claims; characterized by the FGPA module (3) which receives the ±15V voltage required for the current output blocks externally.
5. A current output module (1) according to any one of the preceding claims; characterized by the controller block which is located in the FGPA module (3) and performs relay control for the signal outputs.
6. A current output module (1) according to any one of the preceding claims, which is a 32-channel current module used in an SLSC chassis housing.
Citation Information
Patent Citations
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