Flash therapy system, flash beam safety locking method and related device

By obtaining the amount of proton charge and performing safe locking control, the safety problem of FLASH treatment is solved in the ordinary proton accelerator room to ensure radiation safety and therapeutic effect.

WO2025162041A1PCT designated stage Publication Date: 2025-08-07MEVION MEDICAL EQUIPMENT CO LTD
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Patent Information

Application Number
PCT/CN2025/073476
Authority / Receiving Office
WO · WO
Patent Type
Applications
Current Assignee / Owner
Priority Date
2024-02-04
Filing Date
2025-01-21
Publication Date
2025-08-07

AI Technical Summary

Technical Problem

How to achieve FLASH treatment in an ordinary proton accelerator computer room, avoid special thickening of the walls of the computer room, so as to reduce the dosage rate outside the computer room and ensure radiation safety.

Method used

By obtaining the amount of proton charge output from a single beam output, determine whether it exceeds the threshold, perform safe locking control, prohibit or allow beam output, and calculate the beam locking time to prevent unsafe radiation leakage.

Benefits of technology

It improves the safety of proton therapy equipment, protects patients and operators, ensures radiation safety management requirements, and realizes FLASH treatment in ordinary proton accelerator computer rooms.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present application relates to the technical field of particle radiotherapy. Provided are a FLASH therapy system, a FLASH beam safety locking method and a related device. The method comprises: acquiring the quantity of proton charges output by a single beam emission to serve as a first quantity of charges; determining whether the first quantity of charges exceeds a first threshold value; and on the basis of a determination result, performing beam emission control: if the first quantity of charges exceeds the first threshold value, performing first safety locking and forbidding beam emission, otherwise, allowing one beam emission, determining a beam emission locking duration and performing second safety locking within the beam emission locking duration, wherein during second safety locking, the loading of a beam is not allowed. The present application is used for performing beam emission control on the basis of user requirements and designing safe interlocking, such that an accelerator cannot extract a proton beam within a period of time after FLASH beam emission, thereby reducing the average dose rate on an hourly time scale; and proton FLASH therapy can also be realized in ordinary proton accelerator rooms, thereby facilitating the promotion of proton FLASH therapy.
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Description

FLASH therapy system, beam safety locking method and related equipment

[0001] This application claims priority to Chinese Patent Application No. 2024101587153 filed on February 4, 2024, which is incorporated by reference in its entirety. Technical Field

[0002] The present application relates to the field of particle radiotherapy technology, for example, to a FLASH treatment system, a beam safety locking method, and related equipment. Background Art

[0003] In the field of particle radiotherapy, the accuracy of dose calculation is one of the decisive factors for achieving high-quality treatment results. For proton radiotherapy, proton dose calculation methods involve two main approaches: analytical methods and Monte Carlo simulations. The analytical method often converts the Hounsfield Units (HU) values ​​obtained from CT scans into stopping power ratios for dose calculation. Although this does not involve the specific tissue composition of the voxel, this analytical algorithm has difficulty providing accurate dose calculations when dealing with heterogeneous media (such as the lungs). This is because these algorithms can only perform approximate calculations in terms of multi-elastic Coulomb scattering, elastic and inelastic nuclear reactions, and cannot achieve accurate modeling.

[0004] Flash therapy is a new type of non-invasive external beam radiotherapy technology. It is a non-invasive way to deliver a single dose of radiation in a very short time, thereby obtaining an extremely high radiation dose rate (usually an average dose rate of more than 100Gy / s is delivered within 50ms). This method of applying this extremely high radiation dose rate to biological cells or tissues is called Flash therapy (flash radiotherapy). Compared with conventional dose rate (1-7cGy / s) radiotherapy, Flash therapy delivers a high radiation dose in a very short time (<0.1s). High dose rate radiation causes oxygen depletion in tissues, making healthy tissues resistant to radiation, thereby enabling dose escalation therapy to destroy tumor tissue under conditions of high hypoxia. Experimental results show that Flash therapy greatly reduces damage to normal tissues while maintaining the same or even better tumor control rate. Compared with conventional radiotherapy, the incidence of radiation dermatitis in proton Flash therapy is reduced by an average of 35%. In accordance with the requirements for radiation safety and protection, in ordinary proton accelerator rooms, that is, rooms designed and planned with non-FLASH beam current intensity as the radiation source, it is not allowed to draw out FLASH beams, or very thick shielding walls must be designed to ensure that when the accelerator draws out the proton beam, the dose rate outside the room is less than 2.5μSv / h. Due to the extremely thick walls required, there are no FLASH proton rooms located in hospitals in China. From the perspective of thickening the walls, the dose rate outside the room can be reduced. How to implement FLASH operation in an ordinary proton accelerator room, thereby avoiding the special thickening of the proton accelerator room walls, is the technical problem to be solved by this application. Summary of the Invention

[0005] The purpose of this application is to provide a FLASH therapy system, a beam safety locking method and related equipment for beam control according to user needs, and to design a safety interlock so that the accelerator cannot emit a proton beam for a period of time after the FLASH beam is emitted, thereby reducing the average dose rate on a time scale of hours.

[0006] The purpose of this application is achieved by the following technical solutions:

[0007] In a first aspect, the present application provides a FLASH beam security locking method, the method comprising:

[0008] Obtaining a proton charge amount outputted by a single beam as a first charge amount;

[0009] determining whether the first charge amount exceeds a first threshold;

[0010] The beam emission is controlled according to the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit beam emission; if not, beam emission is allowed and the beam emission lock duration is calculated.

[0011] In some possible implementations, the FLASH beam safety locking method, if not, allows beam emission and calculates the beam locking duration, including: if the first charge amount is less than or equal to the first threshold, allows beam emission once, determines the beam locking duration, and performs a second safety lock within the beam locking duration; wherein, during the second safety lock period, beam loading is not allowed.

[0012] In some possible implementations, the FLASH beam safety locking method, the beam lock duration is: T = N / A y ×3600-t

[0013] Where T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y Optionally, in the FLASH beam safety locking method, the beam lock duration is:

[0014] When the first charge amount is less than the second threshold, T=T1;

[0015] When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2;

[0016] When the first charge amount is greater than or equal to the third threshold, T=T3;

[0017] Among them, T is the beam lock time, and T1, T2, and T3 are preset time lengths respectively.

[0018] In some possible implementations, the FLASH beam security locking method, the beam lock duration is: T = N / A y ×3600

[0019] Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

[0020] In some possible implementations, in the FLASH beam safety locking method, the first threshold value includes: A y =K×(I y ×3600)

[0021] Among them, A y is the first threshold, I y The preset proton flux intensity at the beam outlet is in nA, K coefficient, K>0.

[0022] In a second aspect, the present application provides a FLASH beam safety locking device, the device comprising:

[0023] Output charge acquisition module: used to obtain the proton charge of a single beam output as the first charge;

[0024] a determination module, configured to determine whether the first charge amount exceeds a first threshold;

[0025] The execution module is used to control the beam emission according to the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit the beam emission; if not, the beam emission is allowed and the beam emission lock time is calculated.

[0026] In a third aspect, the present application provides an electronic device, comprising a memory and one or more processors, wherein the memory stores a computer program, and the one or more processors are configured to execute the computer program to implement the following steps:

[0027] Obtaining a proton charge amount outputted by a single beam as a first charge amount;

[0028] determining whether the first charge amount exceeds a first threshold;

[0029] The beam emission is controlled according to the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit beam emission; if not, beam emission is allowed and the beam emission lock duration is calculated.

[0030] In some possible implementations, the electronic device described in this application, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600-t

[0031] Wherein, T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

[0032] In some possible implementations, in the electronic device described in this application, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program:

[0033] When the first charge amount is less than the second threshold, T=T1;

[0034] When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2;

[0035] When the first charge amount is greater than or equal to the third threshold and less than the fourth threshold, T=T3;

[0036] Among them, T is the beam lock time, and T1, T2, and T3 are preset time lengths respectively.

[0037] In some possible implementations, the electronic device described in this application, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600

[0038] Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

[0039] In a fourth aspect, the present application provides a FLASH treatment system, comprising:

[0040] Radiotherapy equipment and any FLASH beam safety locking device described in this application;

[0041] The radiotherapy device is used to perform radiotherapy on a patient.

[0042] In a fifth aspect, the present application provides a computer-readable storage medium, which stores computer instructions. When a computer reads the computer instructions, the computer executes any one of the FLASH beam security locking methods described in the present application.

[0043] The beneficial effects of the present application include: by judging whether the first charge amount exceeds the first threshold, the safe control of the proton beam output is achieved. If the first charge amount exceeds the threshold, the system will perform a first safety lock and prohibit beam output to avoid possible safety risks, improve the safety of the proton therapy equipment, and protect the safety of patients and operators. When the first charge amount is less than or equal to the first threshold, a beam is allowed to be output once, and a second safety lock is performed according to the set beam output lock time; this flexible beam output control method can be adjusted according to specific needs to ensure that the output of the proton beam is within a safe range and provide effective treatment for patients. The second safety lock is performed within the beam output lock time, and the loading of the beam flow is not allowed, which effectively prevents unsafe radiation leakage, thereby protecting the surrounding environment and staff from unnecessary radiation exposure, and meeting the requirements of radiation safety management. Through the above method, the safety of the FLASH beam can be improved, the beam output can be flexibly controlled, and radiation leakage can be effectively prevented and controlled, which will help improve the safety performance of the proton therapy equipment, ensure the safety of patients and operators, and provide reliable treatment effects for proton therapy. Ensuring that the dose rate outside the proton accelerator room (including ordinary proton accelerator rooms) is lower than the requirements of radiation safety and protection, ordinary proton accelerator rooms can also implement proton FLASH therapy, which is conducive to the promotion of proton FLASH therapy and provides a guarantee for more patients to have the opportunity to receive proton FLASH therapy. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] The present application is further described below with reference to the accompanying drawings and examples.

[0045] FIG1 is a schematic diagram of load shielding design for a common proton accelerator room;

[0046] FIG2 is a schematic diagram of a method for securely locking a FLASH beam provided in an embodiment of the present application;

[0047] FIG3 is a schematic flow chart of a method for safely locking a FLASH beam provided in an embodiment of the present application;

[0048] FIG4 is a schematic structural diagram of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0049] Below, the present application is further described in conjunction with the accompanying drawings and specific implementation methods. It should be noted that, under the premise of no conflict, the various embodiments or technical features described below can be arbitrarily combined to form new embodiments.

[0050] Before introducing this application, we first introduce the safety control requirements for radiotherapy and treatment rooms:

[0051] The reference control level for the dose rate outside the wall is limited to 2.5μSv / h. However, in the previous shielding design process, the maximum dose rate per second was calculated with a time interval of seconds and converted to hours. However, the traditional beam can emit beams continuously, allowing for a period of 1 hour (or approximately 1 hour).

[0052] 1 , which is a schematic diagram of load shielding design for a common proton accelerator room;

[0053] The ambient dose equivalent rate at 30 cm outside the wall and entrance door of the treatment room (excluding mobile electron accelerator treatment room) should not exceed the ambient dose equivalent rate reference control level determined by a), b) and c) below

[0054] a) Using the weekly workload of radiotherapy, the utilization factor and the residence factor of the location of the point of interest, the reference control level of the peripheral dose equivalent rate of the point of interest is obtained from the weekly dose reference control level See formula (1):

[0055]

[0056] is the reference control level of ambient dose equivalent rate, in microsieverts per hour (μSv / h);

[0057] H eThe weekly dose reference control level is expressed in microsieverts per week (μSv / week). Its value is determined as follows: for personnel in the controlled area outside the radiotherapy room: ≤100 μSv / week; for personnel in the non-controlled area outside the radiotherapy room: ≤μSv / week;

[0058] t z The maximum cumulative exposure hours of the equipment per week, in hours per week (h / week);

[0059] U is the utilization factor of the treatment device irradiating in the direction of the focus point;

[0060] Y is the residence factor of the person at the location of interest;

[0061] b) Determine the reference control level of the highest ambient dose equivalent rate at the concerned point according to the different personnel residence factors at the concerned point

[0062] 1) Places with a personnel residence factor T>1 / 2:

[0063] 2) Places with a personnel residence factor T ≤ 1 / 2:

[0064] c) The reference control level of ambient dose equivalent rate derived from a) above and the highest ambient dose equivalent rate reference control level in b) Select the smaller one as the reference control level of ambient dose equivalent rate at the point of concern

[0065] Through radiation environmental assessment and shielding design, simulation calculations were performed with a proton flux intensity of 1.2nA at the beam outlet. Within one hour, the reference control level of the dose rate outside the wall was within 2.5μSv / h.

[0066] 2 and 3 , FIG. 3 is a schematic diagram of a method for securely locking a FLASH beam according to an embodiment of the present application; FIG. 3 is a flow chart of a method for securely locking a FLASH beam according to an embodiment of the present application;

[0067] The present invention provides a method for safely locking a FLASH beam, the method comprising:

[0068] Obtaining a proton charge amount outputted by a single beam as a first charge amount;

[0069] determining whether the first charge amount exceeds a first threshold;

[0070] Beam emission is controlled according to the judgment result: if the first charge amount exceeds the first threshold, the first safety lock is performed to prohibit beam emission; if not, the FLASH safety lock is green, beam emission is allowed, and the beam emission lock time after beam emission is calculated.

[0071] In some possible implementations, if not, beam emission is allowed and the beam emission lock duration is calculated, including: if the first charge amount is less than or equal to a first threshold, beam emission is allowed once, the beam emission lock duration is determined, and a second safety lock is performed within the beam emission lock duration; wherein, during the second safety lock period, beam current is not allowed to be loaded.

[0072] During the beam lockout period, a second safety lockout is performed. During this period, the beam is not loaded to prevent unsafe radiation leakage. After the second safety lockout, the beam can be reloaded for treatment.

[0073] The working principle of the above technical solution is to obtain the proton charge of a single beam output as the first charge. This process is achieved through a beam plan, which is formulated based on treatment requirements and equipment parameters. Specifically, the beam plan determines the temporal output intensity and distribution of the proton beam to achieve the treatment goal.

[0074] Determine whether the first charge exceeds a first threshold. The first threshold is a pre-set upper limit of the proton charge. If the first charge exceeds the threshold, it indicates that there may be a safety risk and a safety lock is required.

[0075] Beam emission is controlled based on the determination result. If the first charge exceeds a first threshold, a first safety lock is performed, prohibiting beam emission to prevent unsafe radiation leakage. If the first charge does not exceed the first threshold, beam emission is permitted, and the beam lock duration is calculated.

[0076] Beam output is controlled by calculating the beam lock duration. When the secondary proton beam ends, the system locks in, which is the beam lock duration. During this time, proton beam output remains inhibited until the beam lock duration reaches the preset duration. This method enables safety control by monitoring the proton beam charge in real time, ensuring that proton beam output remains within a safe range and preventing radiation leakage that could harm humans and the environment.

[0077] The above technical solution achieves safe control of proton beam output by determining whether the first charge exceeds a first threshold. If the first charge exceeds the threshold, the system initiates a first safety lockout, prohibiting beam delivery to avoid potential safety risks. This method improves the safety of proton therapy equipment and protects patients and operators. If the first charge is less than or equal to the first threshold, beam delivery is permitted once, and a second safety lockout is initiated based on the set beam delivery lockout duration. This flexible beam delivery control method can be adjusted to specific needs, ensuring that proton beam delivery remains within a safe range and providing effective patient treatment. The second safety lockout, which prevents the delivery of the beam during the beam delivery lockout duration, effectively prevents unsafe radiation leakage, thereby protecting the surrounding environment and personnel from unnecessary radiation exposure and complying with radiation safety management requirements. This method improves the safety of the FLASH beam, flexibly controls beam delivery, and effectively prevents radiation leakage. This will help improve the safety performance of proton therapy equipment, ensure the safety of patients and operators, and provide reliable proton therapy treatment results.

[0078] In some possible implementations, the FLASH beam safety locking method, the beam lock duration is: T = N / A y ×3600-t

[0079] Wherein, T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

[0080] In some other possible implementations, the FLASH beam safety locking method, the beam lock duration is: T = N / A y ×3600

[0081] Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

[0082] The working principle of the above technical solution is: according to the first charge amount N and the first threshold A y The ratio of the beam lock time T is calculated. Specifically, the N / A in the formula y Indicates the ratio between the current proton beam charge and the set first threshold. The larger the ratio, the greater the proton beam output charge, and the longer the lock time should be to ensure treatment safety. N / A y The purpose of multiplying by 3600 is to convert the result into seconds for comparison with the irradiation time t. During the beam lockout time, a second safety lockout is performed, prohibiting further proton beam output to avoid radiation leakage and patient injury.

[0083] The effect of the above technical solution is: according to the beam lock time algorithm, by adjusting the first threshold A y The set value can flexibly control the beam lock time of the proton beam. When the charge of the proton beam is small and does not exceed the first threshold, it can be quickly unlocked and treatment can be carried out; when the charge exceeds the threshold, the locking mechanism is automatically triggered and a safe lock is performed. This adjustability makes proton beam therapy more flexible and safe. Since the charge and irradiation time of the proton beam are obtained in real time, the appropriate beam lock time can be accurately calculated according to different treatment needs and actual conditions, thereby maximizing the treatment effect while ensuring safety. The FLASH beam safety locking method can prevent the risk of equipment failure or damage caused by excessive proton beam output. By limiting the output charge and setting the beam lock time, the service life of the equipment can be effectively extended and the maintenance and replacement costs can be reduced. In general, this method improves the safety and reliability of FLASH beam therapy by setting thresholds, dynamically adjusting the beam lock time and other measures, while ensuring the maximization of treatment effects.

[0084] In some other possible implementations, the FLASH beam safety locking method, the beam lock duration is:

[0085] When the first charge amount is less than the second threshold, T=T1;

[0086] When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2;

[0087] When the first charge amount is greater than or equal to the third threshold and less than the fourth threshold, T=T3; and so on;

[0088] Wherein, T is the beam lock time, T1, T2, and T3 are preset time lengths respectively; T1 is between 400 seconds and 700 seconds, preferably 600 seconds; T3>T2>T1;

[0089] The third threshold value may be twice the second threshold value, and the fourth threshold value may be three times the second threshold value, corresponding to T2 being twice T1 and corresponding to T3 being three times T1. Furthermore, the second, third, and fourth threshold values ​​are each less than or equal to the first threshold value; the second threshold value is between 60°C and 80°C, preferably 72°C (coulomb).

[0090] The working principle of the above technical solution is that the system automatically selects a corresponding beam lockout duration based on the different ranges of the first charge. When the first charge is within a specific range, the corresponding preset duration is triggered to limit the proton beam output time and ensure treatment safety. The system needs to monitor the first charge during proton beam output in real time to promptly assess the current situation and respond. Through precise monitoring and data acquisition, timely control and adjustment of proton beam output can be ensured, avoiding potential safety risks caused by excessive output. By setting the relationship between the second, third, and fourth thresholds and the preset duration as multiples, the proton beam output duration within different ranges can be flexibly adjusted according to actual needs, achieving graded control of the beam current based on the first charge, while ensuring a balance between treatment effectiveness and safety. For different first charge conditions, the system must have a fast response speed, capable of adjusting the beam lockout duration within milliseconds, to ensure a rapid response to abnormalities in proton beam output and ensure treatment safety. In summary, by dynamically adjusting the beam lock duration, real-time monitoring of the first charge amount, the threshold multiple relationship, and the system response speed, the technical solution of setting the beam lock duration according to different situations can achieve refined control of the FLASH beam output, thereby ensuring the safety and adjustability of treatment.

[0091] The above technical solution achieves the following effects: By adjusting the beam lock duration based on the magnitude of the first charge, hierarchical control of the FLASH beam output can be achieved. Depending on the specific proton beam output, different beam lock duration limits can be implemented within different charge ranges, thereby better adapting to different treatment needs and ensuring safe radiation. By setting different preset durations T1, T2, and T3, combined with the relationship between threshold multiples, the timing of proton beam output can be effectively controlled, ensuring that excessive beam current does not occur during treatment, thereby improving treatment safety. By setting appropriate preset durations and thresholds based on specific needs, the system has strong adjustability, enabling flexible adjustments based on different patient conditions and the needs of different treatment stages, and improving personalized and targeted treatment. By setting appropriate thresholds and preset durations, the impact and stress on the system can be reduced, thereby improving the system's stability and reliability and ensuring normal operation of the system over long periods of operation. The preferred second threshold and preset duration can optimize system performance to a certain extent, enabling the system to achieve good output effects under different operating conditions and improving overall system performance. In summary, this FLASH beam safety locking method can achieve refined control and safety assurance of beam output, improve the adjustability and stability of the system, and provide a safer, more effective and personalized solution for medical treatment.

[0092] In some possible implementations, in the FLASH beam safety locking method, the first threshold value includes: A y =K×(I y ×3600)

[0093] Among them A y is the first threshold, I y The proton flux intensity at the preset beam outlet is in nA, K coefficient, K>0; I y Preferably 1.2nA.

[0094] The working principle of the above technical solution is: the first threshold value is calculated by the following method: A y =K×(I y ×3600)

[0095] Among them, A y Represents the first threshold, the unit is Coulomb (C), I y Indicates the preset proton flux intensity at the beam outlet, in nanoamperes (nA), K is the coefficient (K>0). y To calculate the first threshold A y K = t s ×I y / I a

[0096] Among them, t s Set the cutting time scale for the user in hours. a is the actual proton flux intensity at the beam outlet, in nanoamperes (nA);

[0097] According to the simulation results, I y When the current is 1.2nA, the reference control level of the dose rate outside the wall is within 2.5μSv / h. This simulation is calculated by cutting the time into one hour.

[0098] In actual applications, the device's beam port proton flux capacity can reach 35 to 50 nA; at the same time, different users may have different cutting time scales, which may be one and a half hours, half an hour, 20 minutes, and so on. Therefore, a coefficient K is set. According to the user's cutting time scale and the actual proton current intensity, different thresholds can be adjusted and determined according to the actual system performance and treatment needs to ensure the accuracy and operability of safety locking.

[0099] If the beam charge is less than or equal to the first threshold value A y , then the beam is emitted normally; after the beam is emitted, the system enters the locked state and sets the corresponding beam locking time length T according to the preset time length.

[0100] The system can preset upper thresholds based on real-time proton flux intensity and time-slicing requirements to safely limit FLASH beam output. When the proton flux intensity exceeds the preset value, the system automatically triggers a lockout mechanism to ensure the beam output remains within a safe range and remains locked for a preset duration, effectively protecting both the patient and the device, while improving the controllability and precision of treatment.

[0101] The present application also proposes a FLASH beam safety locking device, the device comprising:

[0102] Output charge acquisition module: used to obtain the proton charge of a single beam output as the first charge;

[0103] a determination module, configured to determine whether the first charge amount exceeds a first threshold;

[0104] The execution module is used to control the beam emission according to the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit the beam emission; if not, the beam emission is allowed and the beam emission lock time is calculated.

[0105] The execution module specifically includes: if the first charge amount is less than or equal to the first threshold, allowing a beam out once; after the beam out once, determining a beam out lock time; and performing a second safety lock within the beam out lock time; wherein, during the second safety lock time, no beam outflow is loaded.

[0106] In some possible implementations, the beam lock duration in the execution module is: T = N / A y ×3600-t

[0107] Wherein, T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

[0108] In some other possible implementations, the beam lock duration in the execution module is: T = N / A y ×3600

[0109] Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

[0110] In some possible implementations, the beam lock duration in the execution module is:

[0111] When the first charge amount is less than the second threshold, T=T1;

[0112] When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2;

[0113] When the first charge amount is greater than or equal to the third threshold and less than the fourth threshold, T=T3; and so on;

[0114] Wherein, T is the beam lock time, T1, T2, and T3 are preset time lengths respectively; T1 is between 400 seconds and 700 seconds, preferably 600 seconds; T3>T2>T1;

[0115] The third threshold value may be twice the second threshold value, and the fourth threshold value may be three times the second threshold value, corresponding to T2 being twice T1 and corresponding to T3 being three times T1. Furthermore, the second, third, and fourth threshold values ​​are each less than or equal to the first threshold value; the second threshold value is between 60°C and 80°C, preferably 72°C (coulomb).

[0116] The first threshold can be set according to user needs, specifically: A y =K×(I y ×3600)

[0117] Among them, A y Represents the first threshold, the unit is Coulomb (C), I y Indicates the preset proton flux intensity at the beam outlet, in nanoamperes (nA), K is the coefficient (K>0). y To calculate the first threshold A y K = t s ×I y / I a

[0118] Among them, t s Set the cutting time scale for the user in hours. a is the actual proton flux intensity at the beam outlet, in nanoamperes (nA);

[0119] According to the simulation results, I y When the current is 1.2nA, the reference control level of the dose rate outside the wall is within 2.5μSv / h. This simulation is calculated by cutting the time into one hour.

[0120] In actual applications, the device's beam port proton flux capacity can reach 35 to 50 nA; at the same time, different users may have different cutting time scales, which may be one and a half hours, half an hour, 20 minutes, and so on. Therefore, a coefficient K is set. According to the user's cutting time scale and the actual proton current intensity, different thresholds can be adjusted and determined according to the actual system performance and treatment needs to ensure the accuracy and operability of safety locking.

[0121] The working principles and effects of the above steps are the same as those of the FLASH beam safety locking method in the embodiment, and will not be described in detail here.

[0122] Electronic device embodiment:

[0123] 4, which is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application.

[0124] An electronic device 200 of the present application includes a memory 210 and one or more processors 220, wherein the memory stores a computer program;

[0125] The memory 210 may include a readable medium in the form of a volatile memory, such as a random access memory (RAM) 211 and / or a cache memory 212 , and may further include a read-only memory (ROM) 213 .

[0126] Among them, the memory 210 also stores a computer program, which can be executed by the processor 220. The memory 210 can also include a utility 214 having one or more program modules 215. Such program modules 215 include but are not limited to: an operating system, one or more application programs, other program modules and program data. Each of these examples or some combination may include the implementation of a network environment.

[0127] Accordingly, the processor 220 may execute the aforementioned computer program and may execute the utility 214 .

[0128] Bus 230 may represent one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, an accelerated graphics port, a processor, or a local bus using any of a variety of bus architectures.

[0129] The electronic device 200 may also communicate with one or more external devices 240, such as a keyboard, a pointing device, a Bluetooth device, etc., and may also communicate with one or more devices capable of interacting with the electronic device 200, and / or communicate with any device that enables the electronic device 200 to communicate with one or more other computing devices (e.g., a router, a modem, etc.). Such communication may be performed via an input / output interface 250. Furthermore, the electronic device 200 may also communicate with one or more networks (e.g., a local area network (LAN), a wide area network (WAN), and / or a public network, such as the Internet) via a network adapter 260. The network adapter 260 may communicate with other modules of the xxxx device 200 via the bus 230. It should be understood that, although not shown in the figure, other hardware and / or software modules may be used in conjunction with the electronic device 200, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, and data backup storage platforms.

[0130] When the one or more processors are configured to execute the computer program, the following steps are implemented:

[0131] Obtaining a proton charge amount outputted by a single beam as a first charge amount;

[0132] determining whether the first charge amount exceeds a first threshold;

[0133] Beam emission control is performed based on the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit beam emission; if not, beam emission is allowed, and the beam emission lock duration is calculated; specifically, if the first charge amount is less than or equal to the first threshold, beam emission is allowed once, the beam emission lock duration is determined, and a second safety lock is performed within the beam emission lock duration; during the second safety lock period, loading of the beam current is not allowed.

[0134] In some possible implementations, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600-t

[0135] Where T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

[0136] In some other possible implementations, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600

[0137] Where T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

[0138] In some possible implementations, the one or more processors are configured to obtain the beam-out locking duration in the following manner when executing the computer program:

[0139] When the first charge amount is less than the second threshold, T=T1;

[0140] When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2;

[0141] When the first charge amount is greater than or equal to the third threshold and less than the fourth threshold, T=T3;

[0142] Among them, T is the beam lock time, and T1, T2, and T3 are preset time lengths respectively.

[0143] In some other possible implementations, the one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600

[0144] Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

[0145] The first threshold can be set according to user needs, specifically: A y =K×(I y ×3600)

[0146] Among them, A y Indicates the first threshold, the unit is Coulomb (C), I y Indicates the preset proton flux intensity at the beam outlet, in nanoamperes (nA), K is the coefficient (K>0). y To calculate the first threshold A y K = t s ×I y / I a

[0147] Among them, t s Set the cutting time scale for the user in hours. a is the actual proton flux intensity at the beam outlet; the unit is nanoampere (nA);

[0148] According to the simulation results, I y When the current is 1.2nA, the reference control level of the dose rate outside the wall is within 2.5μSv / h. This simulation is calculated by cutting the time into one hour.

[0149] In actual applications, the device's beam port proton flux capacity can reach 35 to 50 nA; at the same time, different users may have different cutting time scales, which may be one and a half hours, half an hour, 20 minutes, and so on. Therefore, a coefficient K is set. According to the user's cutting time scale and the actual proton current intensity, different thresholds can be adjusted and determined according to the actual system performance and treatment needs to ensure the accuracy and operability of safety locking.

[0150] The working principles and effects of the above steps are the same as those of the FLASH beam safety locking method in the embodiment, and will not be described in detail here.

[0151] An embodiment of the present application provides a FLASH treatment system, comprising:

[0152] Radiotherapy equipment and any FLASH beam safety locking device described in the embodiments of the present application;

[0153] The radiotherapy device is used to perform radiotherapy on a patient.

[0154] An embodiment of the present application provides a computer-readable storage medium storing computer instructions. When a computer reads the computer instructions, the computer executes the FLAS H beam safety locking method described in any one of the embodiments.

[0155] In the present application, a readable storage medium can be any tangible medium that contains or stores a program that can be used by or in combination with an instruction execution system, device or device. A program product can use any combination of one or more readable media. The readable medium can be a readable signal medium or a readable storage medium. The readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared or semiconductor system, device or device, or any combination of the above. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.

[0156] A computer-readable storage medium may include a data signal propagated in baseband or as part of a carrier wave, carrying readable program code. This propagated data signal may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. The readable storage medium may also be any readable medium that can transmit, propagate, or transfer a program for use by or in conjunction with an instruction execution system, apparatus, or device. The program code contained on the readable storage medium may be transmitted using any suitable medium, including but not limited to wireless, wired, optical cable, RF, or any suitable combination thereof. The program code for performing the operations of the present invention may be written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Java and C++, as well as conventional procedural programming languages ​​such as C or similar programming languages. The program code may be executed entirely on the user computing device, partially on an associated device, as a standalone software package, partially on the user computing device and partially on a remote computing device, or entirely on a remote computing device or server. Where a remote computing device is involved, the remote computing device may be connected to the user computing device through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computing device (e.g., through the Internet using an Internet service provider).

Claims

1. A FLASH beam security locking method, the method comprising: Obtaining a proton charge amount outputted by a single beam as a first charge amount; determining whether the first charge amount exceeds a first threshold; The beam emission is controlled according to the determination result: if the first charge amount exceeds the first threshold value, a first safety lock is performed to prohibit the beam emission; If not, beam out is allowed and the beam out locking time is calculated.

2. The FLASH beam security locking method according to claim 1, wherein: If not, the beam is allowed to be emitted, and the beam locking time is calculated, including: If the first charge amount is less than or equal to the first threshold, beam emission is allowed once, a beam emission lock duration is determined, and a second safety lock is performed within the beam emission lock duration; wherein, during the second safety lock period, beam current is not allowed to be loaded.

3. The FLASH beam security locking method according to claim 1, wherein: The beam lock duration is: T = N / A y ×3600-t Wherein, T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

4. The FLASH beam security locking method according to claim 1, wherein: The beam lock duration is: T = N / A y ×3600 Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

5. The FLASH beam security locking method according to claim 1, wherein: The beam lock duration is: When the first charge amount is less than the second threshold, T=T1; When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2; When the first charge amount is greater than or equal to the third threshold, T=T3; Among them, T is the beam lock time, and T1, T2, and T3 are preset time lengths respectively.

6. The FLASH beam security locking method according to claim 1, wherein: The first threshold includes: A y =K×(I y ×3600) Among them A y is the first threshold, I y The preset proton flux intensity at the beam outlet is in nA, K coefficient, K>0.

7. A FLASH beam safety locking device, comprising: Output charge acquisition module: used to obtain the proton charge of a single beam output as the first charge; a determination module, configured to determine whether the first charge amount exceeds a first threshold; The execution module is configured to perform beam emission control according to the determination result: if the first charge amount exceeds a first threshold value, a first safety lock is performed to prohibit beam emission; If not, beam out is allowed and the beam out locking time is calculated.

8. An electronic device comprising a memory and one or more processors, wherein the memory stores a computer program, and the one or more processors are configured to implement the following steps when executing the computer program: Obtaining a proton charge amount outputted by a single beam as a first charge amount; determining whether the first charge amount exceeds a first threshold; The beam emission is controlled according to the determination result: if the first charge amount exceeds the first threshold, a first safety lock is performed to prohibit beam emission; if not, beam emission is allowed and the beam emission lock duration is calculated.

9. The electronic device according to claim 8, wherein The one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600-t Wherein, T is the beam lock time; t is the irradiation time, 3600 units are seconds, N is the first charge; A y is the first threshold.

10. The electronic device according to claim 8, wherein The one or more processors are configured to obtain the beam lock duration in the following manner when executing the computer program: T=N / A y ×3600 Where, T is the beam lock time; 3600 is in seconds; N is the first charge; A y is the first threshold.

11. The electronic device according to claim 8, wherein The one or more processors are configured to obtain the beam-out locking duration in the following manner when executing the computer program: When the first charge amount is less than the second threshold, T=T1; When the first charge amount is greater than or equal to the second threshold and less than the third threshold, T=T2; When the first charge amount is greater than or equal to the third threshold and less than the fourth threshold, T=T3; Among them, T is the beam lock time, and T1, T2, and T3 are preset time lengths respectively.

12. A FLASH treatment system, comprising: Radiotherapy equipment and the FLASH beam safety locking device according to claim 7; The radiotherapy device is used to perform radiotherapy on a patient. 13 . A computer-readable storage medium storing computer instructions, wherein when a computer reads the computer instructions, the computer executes the method according to claim 1 .

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