Barreled spring probe

Abstract

A spring probe is provided. The spring probe includes a first conductive contact including a first set of sliding fingers. The spring probe further includes a second conductive contact positioned coaxially with the first conductive contact and including a second set of sliding fingers configured to engage the first set of sliding fingers when the spring probe is in an axially compressed position. The spring probe further includes a barrel positioned coaxially with the first conductive contact and the second conductive contact, wherein the first conductive contact and the second conductive contact are axially translatable with respect to the barrel. The spring probe further includes a spring disposed within the barrel and configured to bias the first conductive contact and the second conductive contact axially outward from the axially compressed position.

Description

BARRELED SPRING PROBECROSS-REFERENCE TO RELATED APPLICATION

[0001] This application claims priority to Chinese Patent Application No. 202410702651.9 filed 31 May 2024, entitled BARRELED SPRING PROBE, the entire contents of which are hereby incorporated by referenced.BACKGROUND

[0002] The embodiments described herein relate generally to electrical interconnects and, more particularly, to spring probes for use in radio frequency (RF) test sockets and other RF circuits

[0003] Spring probes are a type of electrical contact used in the electronics industry, including in the testing of semiconductor integrated circuit chips. Spring probes generally include a moving plunger mechanism. For example, as shown in FIG. 1, a spring probe 100 may include one or more pins 102 in contact with a barrel 104, with a spring 106 providing resistance to inward force on one or more of the pins 102. In such a configuration, signals travel through a conduction path formed by the pin and the barrel. In at least some cases, such configurations do not provide a stable electric contact resistance. An improved spring probe is therefore desirable.BRIEF SUMMARY

[0004] In one aspect, a spring probe is provided. The spring probe includes a first conductive contact including a first set of sliding fingers. The spring probe further includes a second conductive contact positioned coaxially with the first conductive contact and including a second set of sliding fingers configured to engage the first set of sliding fingers when the spring probe is in an axially compressed position. The spring probe further includes a barrel positioned coaxially with the first conductive contact and the second conductive contact, wherein the first conductive contact and the second conductive contact are axially translatable with respect to the barrel. The spring probe further includes a spring disposed within the barrel and configured to bias the firstconductive contact and the second conductive contact axially outward from the axially compressed position.

[0005] In another aspect, a method for manufacturing a spring probe is provided. The method includes positioning a first conductive contact coaxially with a spring. The first conductive contact includes a first set of sliding fingers. The method further includes positioning a second conductive contact coaxially with the first conductive contact and the spring. The second conductive contact includes a second set of sliding fingers configured to engage the first set of sliding fingers when the spring probe is in an axially compressed position. The spring is configured to bias the first conductive contact and the second conductive contact axially outward from the axially compressed position. The method further includes positioning a barrel coaxially with the first conductive contact, the second conductive contact, and the spring, wherein the first conductive contact and the second conductive contact are axially translatable with respect to the barrel.

[0006] In another aspect, a spring probe is provided. The spring probe includes a first conductive contact including a first set of sliding fingers. The first set of sliding fingers is configured to engage a second set of sliding fingers of a second conductive contact positioned coaxially with the first conductive contact when the spring probe is in an axially compressed position. The spring probe further includes a barrel positioned coaxially with the first conductive contact, wherein the first conductive contact is axially translatable with respect to the barrel. The spring probe further includes a spring disposed within the barrel and configured to bias the first conductive contact axially outward from the axially compressed position.BRIEF DESCRIPTION OF THE DRAWINGS

[0007] FIGS. 1-5 show example embodiments of the systems and methods described herein.

[0008] FIG. 1 depicts an existing spring probe;

[0009] FIG. 2A depicts an example spring probe;

[0010] FIG. 2B is a cross-sectional view of the example spring probe shown in FIG. 2A;

[0011] FIG. 2C is an exploded view of the example spring probe shown in FIGS. 2A and 2B;

[0012] FIG. 3A depicts another example spring probe;

[0013] FIG. 3B is a cross-sectional view of the example spring probe shown in FIG. 3A;

[0014] FIG. 3C is an exploded view of the example spring probe shown in FIGS. 3A and 3B;

[0015] FIG. 4 depicts an example conductive contact for use in the example spring probes shown in FIGS. 2A-3C; and

[0016] FIG. 5 is a flow chart illustrating an example method for manufacturing a spring probe such as the spring probes shown in FIGS. 2A-3C.DETAILED DESCRIPTION

[0017] In the following specification and the claims, reference will be made to a number of terms, which shall be defined to have the following meanings.

[0018] The singular forms “a,” “an,” and “the” include plural references unless the context clearly dictates otherwise.

[0019] Approximating language, as used herein throughout the specification and claims, is applied to modify any quantitative representation that could permissibly vary without resulting in a change in the basic function to which it is related. Accordingly, a value modified by a term or terms, such as “about,” “approximately,” and “substantially,” is not to be limited to the precise value specified. In at least some instances, the approximating language may correspond to the precision of an instrument for measuring the value. Here and throughout the specification and claims, range limitations are combined and interchanged, such ranges are identified and include all thesub-ranges contained therein unless context or language indicates otherwise.

[0020] As used herein, the terms “upper,” “lower,” “upward,” and “downward” are used for the purpose of illustration and are not intended to limit the scope of the disclosure.

[0021] The embodiments described herein include a spring probe that includes a first conductive contact including a first set of sliding fingers and a second conductive contact positioned coaxially with the first conductive contact and including a second set of sliding fingers. The first set of sliding fingers and second set of sliding fingers are configured to engage when the spring probe is in an axially compressed position, forming a path by which electric signals can be transmitted through the spring probe. The conductive contacts connected via the respective sets of sliding fingers or other couplings offer improved contact resistance and signal integrity performance compared to other spring probe designs.

[0022] The spring probe further includes a barrel positioned coaxially with the first and second conductive contacts. The first conductive contact and the second conductive contact are able to slide or translate with respect to the barrel to effectively change an overall length of the spring probe. The spring probe further includes a spring disposed within the barrel and configured to bias the first and second conductive contacts axially outward from the compressed position.

[0023] FIG. 2A depicts an example spring probe 200. FIG. 2B is a cross-sectional view of spring probe 200, and FIG. 2C is an exploded view of spring probe 200.

[0024] In the example embodiment, spring probe 200 includes a first or “upper” conductive contact 202 and a second or “lower” conductive contact 204 that is positioned coaxially with upper conductive contact 202 about an axis 206. As shown in FIGS. IB and 1C, upper conductive contact 202 includes a first set of sliding fingers 208 and lower conductive contact 204 includes a second set of sliding fingers 210. First set of sliding fingers 208 and second set of sliding fingers 210 are configured to mate whenspring probe is in an axially compressed position, as described in further detail below. When first set of sliding fingers 208 and second set of sliding fingers 210 are in contact, a robust conduction path is formed between upper conductive contact 202 and lower conductive contact 204, by which electric signals can be transmitted through spring probe 200. It should be appreciated that, while FIGS. 2A-2C illustrate inner ends of upper conductive contact 202 and lower conductive contact 204 as being sets of sliding fingers, in other embodiments, other types of coupling mechanisms or no such coupling mechanisms may be included.

[0025] In the example embodiment, spring probe 200 further includes a barrel 212 positioned coaxially with and in electrical contact with upper conductive contact 202 and lower conductive contact 204. Upper conductive contact 202 and lower conductive contact 204 are axially translatable with respect to barrel 212. Barrel 212 defines an inner cavity 214 that extends from an upper opening 216 to a lower opening 218. As shown in FIGS. 2A and 2B, upper opening 216 and lower opening 218 have a diameter that enables upper conductive contact 202 and lower conductive contact 204 to slide into respective ends of barrel 212 while retaining upper conductive contact 202 and lower conductive contact 204 in a coaxial position with respect to barrel 212.

[0026] In the example embodiment, spring probe 200 further includes a spring 220 disposed within barrel 212 and configured to bias upper conductive contact 202 and lower conductive contact 204 axially outward from the compressed position. In other words, spring 220 biases upper conductive contact 202 upward through upper opening 216 and lower conductive contact 204 downward through lower opening 218. When an external compressing force is applied to upper conductive contact 202 and lower conductive contact 204, spring 220 is compressed, and upper conductive contact 202 and lower conductive contact 204 move towards one another until reaching the compressed state in which first set of sliding fingers 208 and second set of sliding fingers 210 are fully engaged.

[0027] As shown in FIGS. 2B and 2C, upper conductive contact 202 and lower conductive contact 204 include respective shoulders 222. Spring 220 is retained between the respective shoulders 222 of upper conductive contact 202 and lowerconductive contact 204 such that the biasing force of spring 220 is applied to shoulders 222. While shoulders 222 are illustrated in FIGS. 2B and 2C as substantially rectangular protrusions from main bodies of upper conductive contact 202 and lower conductive contact 204, it should appreciated that in other embodiments, shoulders 222 may be other shapes, such as rings, that are capable of retaining spring 220 therebetween. As shown in FIG. 2B, in some embodiments, shoulders 222 are positioned along upper conductive contact 202 and lower conductive contact 204 at a location contained within barrel 212 and are sufficiently long in a radial direction to prevent shoulders 222 from passing through upper opening 216 and lower opening 218. Barrel 212 can therefore catch or otherwise engage shoulders 222 to limit a length to which spring probe 200 can be extended, for example, when no external compressing force is applied to spring probe 200.

[0028] FIG. 3A depicts another example spring probe 300. FIG. 3B is a cross-sectional view of spring probe 300, and FIG. 23 is an exploded view of spring probe 300. Spring probe 300 includes upper conductive contact 202, lower conductive contact 204, barrel 212, and spring 220, which generally function as described with respect to spring probe 200 (shown in FIGS. 2A-2C).

[0029] In the example embodiment, spring probe 300 includes at least one dielectric ring 302 positioned on an outer surface of barrel 212. In some embodiments, barrel 212 includes annular shoulders 304 to retain dielectric ring 302 in position along barrel 212. While FIGS. 3A-3C illustrate barrel 212 as having annular shoulders 304, it should be appreciated that in other embodiments, a variety of different shapes of shoulders and / or grooves may be used to retain dielectric ring 302 in position along barrel 212. Additionally, while one dielectric ring 302 is shown in FIGS. 3A-3C, it should be appreciated that spring probe 300 may include multiple similar dielectric rings 302.

[0030] In some embodiments, spring probe 300 serves as a central conductor of a coaxial transmission line. For example, spring probe 300 may be used for a board-to-board connection for testing integrated circuit chips in a test socket environment. When used in a coaxial transmission line, dielectric ring 302 is configuredto retain spring probe 300 in position with respect to an outer bore or sheathing of the coaxial transmission line while maintaining electrical isolation between spring probe 300 and the outer bore or sheathing.

[0031] FIG. 4 depicts an example conductive contact 400 for use in a spring probe such as spring probe 200 (shown in FIGS. 2A-2C) or spring probe 300 (shown in FIGS. 3A-3C). Conductive contact 400 generally functions as described with respect to upper conductive contact 202 and lower conductive contact2 described above with respect to FIGS. 2A-3C. Conductive contact 400 includes a crown tip 402, which in some cases offers an improved electrical connection to an external conductor (e.g., a ball-shaped pad). While crown tip 402 is illustrated in FIG. 4 as a four-pointed crown tip, it should be appreciated that crown tip 402 may include more or fewer points.

[0032] FIG. 5 is a flowchart of an example method 500 for manufacturing a spring probe such as spring probe 200 (shown in FIGS. 2A-2C).

[0033] In the example embodiment, method 500 includes positioning 502 a first conductive contact (such as upper conductive contact 202) coaxially (e.g., about axis 206) with a spring (such as spring 220). The first conductive contact includes a first set of sliding fingers (such as first set of sliding fingers 208).

[0034] In the example embodiment, method 500 further includes positioning 504 a second conductive contact (such as lower conductive contact 204) coaxially with the first conductive contact and the spring. The second conductive contact including a second set of sliding fingers (such as second set of sliding fingers 210) configured to engage the first set of sliding fingers when the spring probe is in an axially compressed position. The spring is configured to bias the first conductive contact and the second conductive contact axially outward from the axially compressed position.

[0035] In the example embodiment, method 500 further includes positioning 506 a barrel (such as barrel 212) coaxially with the first conductive contact, the second conductive contact, and the spring. The first conductive contact and the second conductive contact are axially translatable with respect to the barrel.

[0036] In some embodiments, the first conductive contact further includes a first at least one shoulder and the second conductive contact includes a second at least one shoulder (such as shoulder 222), and wherein the spring is retained between the first at least one shoulder and the second at least one shoulder.

[0037] In some embodiments, method 500 further includes positioning a dielectric ring (such as dielectric ring 302) on a radially outward surface of the barrel.

[0038] In some embodiments, the barrel includes one or more shoulders (such as annular shoulders 304) or grooves configured to retain the dielectric ring.

[0039] In some embodiments, the dielectric ring is configured to retain the spring probe in position with respect to a coaxial bore or sheath.

[0040] In some embodiments, at least one of the first conductive contact or the second conductive contact includes a crown tip (such as crown tip 402).

[0041] In some embodiments, the first conductive contact and the second conductive contact are configured to electrically couple to a respective one of a printed circuit board or integrated circuit.

[0042] Example embodiments of methods and systems for spring probes are described above in detail. The methods and systems are not limited to the specific embodiments described herein, but rather, components of systems and / or steps of the methods may be used independently and separately from other components and / or steps described herein. Accordingly, the example embodiments can be implemented and used in connection with many other applications not specifically described herein.

[0043] Technical effects of the systems and methods described herein include at least one of: (a) providing more reliable electric contact to reduce its contact resistance in a spring probe utilizing an sliding finger coupling between two conductive contacts of the spring probe contained within an outer barrel; and (b) increasing signal integrity of coaxial board-to-board connecters utilizing spring probes by using springprobes having an sliding finger coupling between two conductive contacts of the spring probe contained within an outer barrel.

[0044] Although specific features of various embodiments of the disclosure may be shown in some drawings and not in others, this is for convenience only. In accordance with the principles of the disclosure, any feature of a drawing may be referenced and / or claimed in combination with any feature of any other drawing.

[0045] This written description uses examples to disclose various embodiments, including the best mode, and also to enable any person skilled in the art to practice the disclosure, including making and using any devices or systems and performing any incorporated methods. The patentable scope of the disclosure is defined by the claims, and may include other examples that occur to those skilled in the art. Such other examples are intended to be within the scope of the claims if they have structural elements that do not differ from the literal language of the claims, or if they include equivalent structural elements with insubstantial differences from the literal language of the claims.

Claims

WHAT IS CLAIMED IS:

1. A spring probe comprising: a first conductive contact comprising a first set of sliding fingers; a second conductive contact positioned coaxially with said first conductive contact and comprising a second set of sliding fingers configured to engage said first set of sliding fingers when said spring probe is in an axially compressed position; a barrel positioned coaxially with said first conductive contact and said second conductive contact, wherein said first conductive contact and said second conductive contact are axially translatable with respect to said barrel; and a spring disposed within said barrel and configured to bias said first conductive contact and said second conductive contact axially outward from the axially compressed position.

2. The spring probe of Claim 1, wherein said first conductive contact further comprises a first shoulder and said second conductive contact comprises a second shoulder, and wherein said spring is retained between said first shoulder and said second shoulder.

3. The spring probe of Claim 1, further comprising a dielectric ring positioned on a radially outward surface of said barrel.

4. The spring probe of Claim 3, wherein said barrel comprises one or more shoulders or grooves configured to retain said dielectric ring.

5. The spring probe of Claim 3, wherein said dielectric ring is configured to retain said spring probe in position with respect to a coaxial bore or sheath.

6. The spring probe of Claim 1, wherein at least one of said first conductive contact and / or said second conductive contact comprises a crown tip.

7. The spring probe of Claim 1, wherein said first conductive contact and said second conductive contact are configured to electrically couple to a respective one of a printed circuit board or integrated circuit.

8. A method for manufacturing a spring probe, said method comprising: positioning a first conductive contact coaxially with a spring, the first conductive contact including a first set of sliding fingers; positioning a second conductive contact coaxially with the first conductive contact and the spring, the second conductive contact including a second set of sliding fingers configured to engage the first set of sliding fingers when the spring probe is in an axially compressed position, wherein the spring is configured to bias the first conductive contact and the second conductive contact axially outward from the axially compressed position; and positioning a barrel coaxially with the first conductive contact, the second conductive contact, and the spring, wherein the first conductive contact and the second conductive contact are axially translatable with respect to the barrel.

9. The method of Claim 8, wherein the first conductive contact further includes a first shoulder and the second conductive contact includes a second shoulder, and wherein the spring is retained between the first shoulder and the second shoulder.

10. The method of Claim 8, further comprising positioning a dielectric ring on a radially outward surface of the barrel.

11. The method of Claim 10, wherein the barrel includes one or more shoulders or grooves configured to retain the dielectric ring.

12. The method of Claim 10, wherein the dielectric ring is configured to retain the spring probe in position with respect to a coaxial bore or sheath.

13. The method of Claim 8, wherein at least one of the first conductive contact and / or the second conductive contact includes a crown tip.

14. The method of Claim 8, wherein the first conductive contact and the second conductive contact are configured to electrically couple to a respective one of a printed circuit board or integrated circuit.

15. A spring probe comprising: a first conductive contact comprising a first set of sliding fingers, said first set of sliding fingers configured to engage a second set of sliding fingers of a second conductive contact positioned coaxially with said first conductive contact when said spring probe is in an axially compressed position; a barrel positioned coaxially with said first conductive contact, wherein said first conductive contact is axially translatable with respect to said barrel; and a spring disposed within said barrel and configured to bias said first conductive contact axially outward from the axially compressed position.

16. The spring probe of Claim 15, wherein said first conductive contact further comprises a first shoulder, and wherein said spring is retained between said first shoulder and a second shoulder of the second conductive contact.

17. The spring probe of Claim 15, further comprising a dielectric ring positioned on a radially outward surface of said barrel.

18. The spring probe of Claim 17, wherein said barrel comprises one or more shoulders or grooves configured to retain said dielectric ring.

19. The spring probe of Claim 17, wherein said dielectric ring is configured to retain said spring probe in position with respect to a coaxial bore or sheath.20 The spring probe of Claim 17, wherein said first conductive contact comprises a crown tip.

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