Display panel and display device

Abstract

The present application discloses a display panel and a display device. Display signal lines are connected between a driving chip and a pixel unit. Touch wires are connected between touch electrodes and the driving chip. Binding terminals are arranged in a binding region. One end of each test wire is connected to the corresponding touch wire, and the other end of the test wire passes through the binding region and extends to an outer boundary of the side of the display panel provided with the binding region; and the test wire is located between adjacent binding terminals.

Description

Display panel and display device TECHNICAL FIELD

[0001] The present application relates to the technical field of display, in particular to a display panel and a display device. BACKGROUND

[0002] Touch and display driver integration (TDDI) is to integrate the touch chip and the display chip in the display panel into a single chip, which can improve the integration of the display panel and simplify the structure of the display panel.

[0003] At present, in the display panel adopting the TDDI technology, when the touch performance test is performed, the integrated chip inputs the test signal, therefore, the touch performance test cannot be completed before the chip is bound, which is easy to cause abnormal products to enter the subsequent section, and is not conducive to improving the yield of the display panel. SUMMARY

[0004] The embodiments of the present application provide a display panel and a display device, which can improve the convenience of the touch performance test of the display panel and improve the yield of the display panel.

[0005] The embodiments of the present application provide a display panel, which comprises a display area and a non-display area adjacent to the display area.

[0006] The display panel further comprises:

[0007] A touch electrode is arranged in the display area.

[0008] A pixel unit is arranged in the display area.

[0009] A driving chip is arranged in the non-display area, and the non-display area comprises a binding area located on a side of the driving chip away from the display area.

[0010] A display signal line is connected between the driving chip and the pixel unit.

[0011] A touch trace is connected between the touch electrode and the driving chip.

[0012] A plurality of binding terminals are arranged in the binding area.

[0013] The display panel further comprises a test trace arranged in the non-display area, one end of the test trace is connected to the touch trace, the other end of the test trace passes through the binding area and extends to an outer boundary of the display panel on a side where the binding area is arranged, and the test trace is located between adjacent binding terminals.

[0014] According to the above purposes of the present application, the display device provided by the embodiments of the present application comprises a display panel, wherein the display panel comprises a display area and a non-display area adjacent to the display area.

[0015] The display panel further comprises:

[0016] a touch electrode disposed in the display area;

[0017] a pixel unit disposed in the display area;

[0018] a driving chip disposed in the non-display area, wherein the non-display area comprises a binding area located on a side of the driving chip away from the display area;

[0019] a display signal line connected between the driving chip and the pixel unit;

[0020] a touch trace connected between the touch electrode and the driving chip;

[0021] a plurality of binding terminals disposed in the binding area;

[0022] wherein the display panel further comprises a test trace disposed in the non-display area, one end of the test trace is connected to the touch trace, the other end of the test trace passes through the binding area and extends to an outer boundary of the display panel on a side of the display panel provided with the binding area, and the test trace is located between adjacent binding terminals. BRIEF DESCRIPTION OF DRAWINGS

[0023] FIG. 1 is a schematic diagram of a planar distribution structure of a display panel provided by the embodiments of the present application;

[0024] FIG. 2 is a schematic diagram of another planar distribution structure of a display panel provided by the embodiments of the present application;

[0025] FIG. 3 is a schematic diagram of a structure of a display panel in a non-display area provided by the embodiments of the present application;

[0026] FIG. 4 is a schematic diagram of another planar distribution structure of a display panel provided by the embodiments of the present application;

[0027] FIG. 5 is a schematic diagram of another structure of a display panel in a binding area provided by the embodiments of the present application;

[0028] FIG. 6 is a schematic diagram of another planar distribution structure of a display panel provided by the embodiments of the present application;

[0029] FIG. 7 is a schematic diagram of another planar distribution structure of a display panel provided by the embodiments of the present application;

[0030] FIG. 8 is a schematic view of another planar distribution structure of the display panel according to an embodiment of the present application;

[0031] FIG. 9 is a schematic view of another structure of the display panel in the non-display area according to an embodiment of the present application;

[0032] FIG. 10 is a schematic view of another planar distribution structure of the display panel according to an embodiment of the present application;

[0033] FIG. 11 is a schematic view of a structure of the display panel in the non-display area according to an embodiment of the present application;

[0034] FIG. 12 is a schematic view of another planar distribution structure of the display panel according to an embodiment of the present application;

[0035] FIG. 13 is a schematic view of a structure of a display panel motherboard according to an embodiment of the present application;

[0036] FIG. 14 is a schematic view of a structure of a display device according to an embodiment of the present application. Embodiments of the present application

[0037] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by a person of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0038] The following disclosure provides many different embodiments, or examples, for implementing different structures of the present application. For the purpose of simplicity and clarity, the descriptions of the specific examples in the following are described. They are, of course, merely examples and are not intended to limit the application in any way. Furthermore, the application can be used in various examples without departing from the scope of the application. In addition, the application provides various specific examples of processes and materials, but a person of ordinary skill in the art can realize the application of other processes and / or the use of other materials.

[0039] The display panel needs a driving chip to input test signals during touch performance testing, so the touch performance test cannot be completed before the chip is bound, which reduces the convenience of the display panel touch performance test, easily leads to abnormal products entering the subsequent process, and is not conducive to improving the yield of the display panel.

[0040] Please refer to FIG. 1, the present application provides a display panel, the display panel includes a display area 101 and a non-display area 102 adjacent to the display area 101.

[0041] Further, the display panel further comprises the touch electrode 10, a pixel unit (not shown in the figure), the driving chip 20, a display signal line 21, a touch trace 30 and a plurality of binding terminals 51; the touch electrode 10 and the pixel unit are arranged in the display area 101; the driving chip 20 is arranged in the non-display area 102, and the non-display area 102 further comprises a binding area 1021 arranged on a side of the driving chip 20 away from the display area 101; the display signal line 21 is connected between the pixel unit and the driving chip 20; the touch trace 30 is connected between the touch electrode 10 and the driving chip 20, and the plurality of binding terminals 51 are arranged in the binding area 1021.

[0042] In the embodiment, the display panel further comprises a test trace 41 arranged in the non-display area 101, one end of the test trace 41 is connected to the touch trace 30, the other end of the test trace 41 passes through the binding area 1021 and extends to an outer boundary of the side of the display panel where the binding area 1021 is arranged, and the test trace 41 is located between adjacent binding terminals 51.

[0043] In the embodiment, the display panel further comprises a test trace 41 arranged in the non-display area 101, one end of the test trace 41 is connected to the touch trace 30, the other end of the test trace 41 passes through the binding area 1021 and extends to an outer boundary of the side of the display panel where the binding area 1021 is arranged, and the test trace 41 is located between adjacent binding terminals 51.

[0044] In an embodiment of the present application, the driving chip comprises a first side arranged opposite to the display area and a second side connected to the first side, the display signal line is connected to the first side of the driving chip, and the touch trace is connected to the second side of the driving chip.

[0045] In an embodiment of the present application, the binding area comprises a first sub-area and a second sub-area adjacent to the first sub-area, one end of the test trace is connected to the touch trace on the second side of the driving chip, the other end of the test trace passes through the first sub-area, the second sub-area is located on a side of the test trace away from the driving chip, and the binding terminal comprises a first type of binding terminal arranged in the second sub-area.

[0046] The display panel further comprises a first connection line, the non-display area further comprises a functional circuit area, the functional circuit area is located at a different side of the display area from the binding area, one end of the first connection line is connected to the first type of binding terminal, the other end of the first connection line extends to the functional circuit area, and the first connection line is arranged without overlapping the test trace.

[0047] In an embodiment of the present application, the binding area further comprises a third sub-area arranged on the side of the first sub-area close to the driving chip, and the binding terminal further comprises a second type of binding terminal arranged in the third sub-area.

[0048] The display panel further comprises a second connection line, one end of the second connection line is connected to the second type of binding terminal, the other end of the second connection line is connected to the driving chip, and the second connection line is arranged without overlapping the test trace.

[0049] In an embodiment of the present application, the display panel further comprises a gate driving unit and a light-on test unit arranged in the functional circuit area, the first connection line is connected to the gate driving unit and the light-on test unit, and the second connection line is electrically connected to the display signal line and the touch trace through the driving chip.

[0050] In an embodiment of the present application, the display panel comprises a plurality of the first type of binding terminals and a plurality of the second type of binding terminals, and the interval between two adjacent first type of binding terminals is smaller than the width of the first sub-area in the direction of the first sub-area pointing to the second sub-area, and the interval between two adjacent second type of binding terminals is smaller than the width of the first sub-area in the direction of the first sub-area pointing to the second sub-area.

[0051] In an embodiment of the present application, the display panel further comprises a virtual terminal, the virtual terminal is located in the first sub-area, and the virtual terminal and the test trace are arranged adjacently in the direction of the first sub-area pointing to the second sub-area.

[0052] In an embodiment of the present application, the display panel further comprises a switch tube connected to the test trace, the switch tube is located on the side of the binding area close to the display area to control the on-off of the signal in the test trace.

[0053] In an embodiment of the present application, the switch tube is in an off state.

[0054] In an embodiment of the present application, the display panel further comprises a substrate and a gate layer and a source-drain layer arranged on the substrate, and the test trace comprises a first line segment located in the binding area, and the first line segment is located in the gate layer or the source-drain layer.

[0055] In an embodiment of the present application, the test trace further includes a second line segment connected to the first line segment at a side of the display area, and a distance between the first line segment and the substrate is less than a distance between the second line segment and the substrate.

[0056] In an embodiment of the present application, the number of test traces is multiple, and the first line segments of two adjacent test traces are arranged on different layers.

[0057] In an embodiment of the present application, the display panel further includes a test terminal connected to the touch trace.

[0058] In an embodiment of the present application, the test terminal is arranged at a side of the binding area close to the driving chip.

[0059] In an embodiment of the present application, the display panel further includes an insulating layer covering a surface of the test terminal.

[0060] Specifically, please refer to FIG. 1, FIG. 2 and FIG. 3, the display panel includes a display area 101 and a non-display area 102 adjacent to the display area 101.

[0061] Further, the display panel includes a substrate 71 and a display function layer arranged on the substrate 71, and only the structure of the display panel in the non-display area 102 is shown in FIG. 2 to describe the improved part of the display panel in the embodiment of the present application.

[0062] The display function layer includes the substrate 71, an inorganic stack layer 72 arranged on the substrate 71, and an organic stack layer arranged on the inorganic stack layer 72; and the organic stack layer includes a planar layer 74, a pixel definition layer 75, a barrier layer 76, an encapsulation layer 77 and a planar protection layer 78 arranged on the inorganic stack layer 72 in sequence.

[0063] In an embodiment, the non-display area 102 includes a bending area 1022 close to the display area 101, a binding area 1021 away from the display area 101, and a device area 1023 between the bending area 1022 and the binding area 1021; the inorganic stack layer 72 forms an opening in the bending area 1022, and the display panel further includes an organic filling layer 73 filled in the opening, and the planar layer 74, the pixel definition layer 75 and the barrier layer 76 in the non-display area 102 can also be partially arranged above the organic filling layer 73. Since the organic filling layer 73, the pixel definition layer 75 and the barrier layer 76 can be made of organic materials, the organic filling layer 73, the pixel definition layer 75 and the barrier layer 76 can provide effective stress buffering for the part of the display panel in the bending area 1022.

[0064] Further, the display panel further includes the touch electrode 10, the pixel unit, the driving chip 20 disposed in the non-display area 102, the touch trace 30 connected between the touch electrode 10 and the driving chip 20, and the display signal line 21 connected between the pixel unit and the driving chip 20. That is, the driving chip 20 provided in the embodiment of the present application is a TDDI driving chip integrating display and touch.

[0065] In an embodiment, the driving chip 20 includes a first side disposed opposite to the display area 101 and a second side connected to the first side, the display signal line 21 is connected to the first side of the driving chip 20, and the touch trace 30 is connected to the second side of the driving chip 20. That is, the driving chip 20 provided in the embodiment of the present application is connected to the signal lines on multiple sides, avoiding the interference between different signal lines caused by connecting multiple signal lines to the same side of the driving chip 20.

[0066] In an embodiment, one end of the display signal line 21 is connected to the pixel unit in the display area 101, and the other end is connected to the driving chip 20. The driving chip 20 can input display signals such as data signals and timing signals to the display signal line 21.

[0067] In an embodiment, the touch electrode 10 can be disposed on the side of the encapsulation layer 77 away from the substrate 71 and covered by the planar protection layer 78, and the driving chip 20 can be disposed in the device area 1023 in the non-display area 102. One end of the touch trace 30 is connected to the touch electrode 10 and located on the side of the encapsulation layer 77 away from the substrate 71, and extends into the non-display area 102. When passing through the bending area 1022, the touch trace 30 is located between the organic filling layer 73 and the planar layer 74. Since the touch trace 30 is surrounded by the organic material having a buffering effect on both sides, the bending stress of the touch trace 30 in the bending area 1022 can be reduced. The part of the touch trace 30 in the device area 1023 can be located between the planar layer 74 and the inorganic stack layer 72 and connected to the driving chip 20. Thus, the driving chip 20 can input touch signals to the touch trace 30 and transmit them to the touch electrode 10, so as to realize the touch function of the display panel.

[0068] In the device area 1023, a via 201 is formed on the touch trace 30, and a connecting piece 24 is formed in the via 201. The driving chip 20 can be connected to the touch trace 30 through the connecting piece 24.

[0069] In an embodiment, the display panel further includes a plurality of binding terminals 51 disposed in the binding area 1021, which can be used for binding connection with devices such as flexible circuit boards.

[0070] In the embodiment of the present application, in order to facilitate the display panel to perform the touch performance test, the test trace 41 is additionally arranged in the display panel, and the test trace 41 is arranged in the non-display area 102 and connected with the touch trace 30, and can be connected with the part of the touch trace 30 located in the device area 1023, and further can be connected with the part of the touch trace 30 before entering the driving chip 20, that is, the test trace 41 is connected with the touch trace 30 on the second side of the driving chip 20.

[0071] Further, the other end of the test trace 41 passes through the bonding area 1021 and extends to the outer boundary of the display panel on the side where the bonding area 1021 is arranged, and the test trace 41 is located between the adjacent bonding terminals 51; it should be noted that, since the TDDI integrated chip is adopted in the present application, the touch and display functions are combined, and thus part of the signals can be transmitted to the in-plane through the driving chip 20, such as the DOT trace signal, the guard signal and the PCD signal; therefore, compared with the scheme that the touch and display are driven by two ICs, the number of the bonding terminals 51 is greatly reduced in the display panel provided in the embodiment of the present application, for example, the number of the bonding pads of the existing panel is about 56, and the number of the bonding terminals 51 in the embodiment of the present application can be reduced to about 8, which provides a prerequisite for the test trace 41 to pass through the bonding area 1021 in the embodiment of the present application, that is, the test trace 41 is provided with sufficient space, so that the test trace 41 is more easily to pass through the bonding area 1021 and be connected with the test terminal located outside the panel area before cutting.

[0072] In an embodiment of the present application, please refer to FIG. 1 and FIG. 2, the display panel includes the test trace 41; it should be noted that, since the test terminal 42 is arranged in the area outside the display panel, and needs to be cut off after the touch performance test is completed, the display panel provided in the embodiment does not have the test terminal 42.

[0073] In the embodiment of the present application, in order to facilitate the display panel to perform the touch performance test, the test trace 41 is additionally arranged in the display panel, and the test trace 41 is arranged in the non-display area 102 and connected with the touch trace 30, and can be connected with the part of the touch trace 30 located in the device area 1023, and further can be connected with the part of the touch trace 30 before entering the driving chip 20, that is, the test trace 41 is connected with the touch trace 30 on the second side of the driving chip 20.

[0074] The test terminal 42 is located outside the display panel and can be located on the side where the bonding area 1021 is arranged in the display panel, and thus the end of the test trace 41 extending to the outer boundary of the display panel is connected with the test terminal 42, and after the touch performance test is completed, the cutting is performed along the outer boundary of the display panel to remove the test terminal 42.

[0075] In the embodiment, the test trace 41 needs to pass through the binding area 1021, and the binding area 1021 is provided with a plurality of binding terminals 51. Therefore, the arrangement of the binding terminals 51 is designed to reduce the adverse effects caused by the test trace 41 passing through the binding area 1021.

[0076] In an embodiment, the binding area 1021 includes a first sub-area A and a second sub-area B, and the first sub-area A and the second sub-area B are arranged along a direction perpendicular to the display area 101 and close to the binding area 1021. One end of the test trace 41 is connected to the touch trace 30 on the second side of the driving chip 20, and the other end of the test trace 41 passes through the first sub-area A. The second sub-area B is located on the side of the test trace 41 away from the driving chip 20. The binding terminals 51 include first binding terminals 511 arranged in the second sub-area B. The display panel further includes a first connection line 22, and the non-display area 102 further includes a functional circuit area 1024. The functional circuit area 1024 is located on a different side of the display area 101 from the binding area 1021. One end of the first connection line 22 is connected to the first binding terminals 511, and the other end of the first connection line 22 extends to the functional circuit area 1024. The first connection line 22 is arranged without overlapping the test trace 41, i.e., the first connection line 22 is not connected to the driving chip 20.

[0077] In an embodiment, the display panel further includes a gate drive unit and a light test unit arranged in the functional circuit area 1024. The first connection line 22 is connected to the gate drive unit and the light test unit.

[0078] In an embodiment, the binding area 1021 further includes a third sub-area C arranged on the side of the first sub-area A close to the driving chip 20. The binding terminals 51 further include second binding terminals 512 arranged in the third sub-area C. The display panel further includes a second connection line 23. One end of the second connection line 23 is connected to the second binding terminals 512, and the other end of the second connection line 23 is connected to the driving chip 20. The second connection line 23 is arranged without overlapping the test trace 41.

[0079] In an embodiment, the second connection line 23 is electrically connected to the display signal line 21 and the touch trace 30 through the driving chip 20, i.e., the signals in the display signal line 21 and the touch trace 30 can be transmitted through the second connection line 23.

[0080] It should be noted that the number of the binding terminals 51 in the display panel provided by the embodiments of the present application is greatly reduced relative to the display technology, to provide convenience for the test trace 41 to pass through the binding area 1021. Further, the embodiments of the present application arrange the positions of the plurality of binding terminals 51, so that the first type of binding terminals 511 which do not need to be connected with the driving chip 20 are arranged on the side of the test trace 41 away from the driving chip 20, and the second type of binding terminals 512 which need to be connected with the driving chip 20 are arranged on the side of the test trace 41 close to the driving chip 20, so that the first connection line 22 and the second connection line 23 do not overlap with the test trace 41, and the interference between the first connection line 22, the second connection line 23 and the test trace 41 is reduced.

[0081] In an embodiment, the display panel includes a plurality of first type of binding terminals 511 and a plurality of second type of binding terminals 512, and the spacing between two adjacent first type of binding terminals 511 is less than the width of the first sub-area A in the direction of the first sub-area A pointing to the second sub-area B, and the spacing between two adjacent second type of binding terminals 512 is less than the width of the first sub-area A in the direction of the first sub-area A pointing to the second sub-area B, so as to provide sufficient space for the arrangement of the test trace 41.

[0082] In an embodiment, the plurality of binding terminals 51 are located in the second sub-area B and the third sub-area C, and the test terminal 42 is arranged in alignment with the first sub-area A in the direction of the display area 101 close to the binding area 1021.

[0083] When the flexible circuit board 80 is pressed and bonded with the binding terminals 51, the ACF glue may overflow, and therefore, no binding terminal 51 is arranged in the first sub-area A, so as to effectively reduce the overflow amount of the ACF glue in the first sub-area A, and avoid the phenomenon of short circuit of the test terminal 42 caused by connection with the overflowed ACF glue.

[0084] As described above, the embodiments of the present application connect the test trace 41 to the test terminal 42, so that the test terminal 42 can be used to test the touch performance of the display panel, improve the convenience of the touch performance test of the display panel, avoid the abnormal products from entering the subsequent process, and improve the yield of the display panel. Further, the test trace 41 connects the test terminal 42 to the touch trace 30, so that the test terminal 42 can be arranged in other areas according to actual needs, and is not limited to the touch trace 30.

[0085] In addition, the arrangement of the bonding terminals 51 is designed to provide sufficient space for the test traces 41 and reduce interference between the test traces 41 and other connection lines. A first sub-area A is formed in the bonding area 1021 and is aligned with the test terminals 42, and the plurality of bonding terminals 51 are located outside the first sub-area A, thereby effectively reducing the overflow amount of the ACF glue in the first sub-area A, avoiding the short circuit phenomenon of the test terminals 42 caused by the connection with the overflow ACF glue, reducing the probability of short circuit between the touch traces 30, and improving the stability of the display panel. In the embodiment, the test terminals 42 are arranged in the area outside the display panel, which can be cut off in the process, thereby reducing the occupied area of the test terminals 42 in the display panel and increasing the wiring space in the display panel.

[0086] In another embodiment of the present application, please refer to FIG. 3, FIG. 4 and FIG. 5. In the embodiment, the display panel includes the test terminals 42 and the test traces 41. It should be noted that the test terminals 42 are arranged in the area outside the display panel and need to be cut off after the completion of the touch performance test. Therefore, the display panel provided in the embodiment does not have the test terminals 42.

[0087] The one end of the test trace 41 is connected to the touch trace 30, and the other end of the test trace 41 extends towards the display area 101 and the bonding area 1021, and extends through the bonding area 1021 to the outer boundary of the display panel on the side where the bonding area 1021 is arranged.

[0088] The test terminals 42 are located outside the display panel and can be located on the side of the display panel where the bonding area 1021 is arranged. Therefore, the end of the test trace 41 extending to the outer boundary of the display panel is connected to the test terminal 42, and after the completion of the touch performance test, the test terminal 42 is cut along the outer boundary of the display panel.

[0089] Further, the display panel further includes a virtual terminal 52 arranged in the first sub-area A. Since the plurality of bonding terminals 51 are located outside the first sub-area A, the distribution of the plurality of bonding terminals 51 is uneven, and after the bonding connection in the bonding area 1021, the stress distribution is uneven, which causes the display panel to bend or deform. Therefore, the virtual terminal 52 is formed in the first sub-area A to improve the uneven stress distribution and improve the yield of the display panel.

[0090] It should be noted that the virtual terminal 52 does not transmit signals.

[0091] Further, the display panel comprises a gate layer 91 and a source-drain layer 92 disposed on the substrate 71, and the test trace 41 comprises a first segment 411 located in the bonding area 1021 and located on the gate layer 91 or the source-drain layer 92; wherein the gate layer 91 and the source-drain layer 92 are both wrapped in the inorganic stack layer 72 and located between the film layer where the touch trace 30 is located and the substrate 71, and the gate layer 91 is located between the source-drain layer 92 and the substrate 71.

[0092] In an embodiment, the test trace 41 further comprises a second segment 412 connected to the first segment 411 on the side close to the display area 101, and the distance between the first segment 411 and the substrate 71 is smaller than the distance between the second segment 412 and the substrate 71; it can be understood that, since the first segment 411 is located in the bonding area 1021, and the bonding area 1021 needs to be pressed and bonded, and thus the film layer located in the bonding area 1021 will be extruded, and there is a risk of film layer rupture, therefore, in this embodiment, the first segment 411 is arranged on the side closer to the substrate 71, which can reduce the probability of short circuit between the first segment 411 and the bonding terminal 51, or between the first segment 411 and the first segment 411 due to film layer rupture, and improve the bonding yield of the display panel.

[0093] Further, in an embodiment, since the number of test traces 41 is multiple, and thus the number of first segments 411 is also multiple, and adjacent two first segments 411 are arranged on different layers, that is, among the adjacent two first segments 411, one is located on the gate layer 91, and the other is located on the source-drain layer 92; which can reduce the probability of short circuit between the adjacent first segments 411 and the first segments 411 due to film layer rupture, and improve the bonding yield of the display panel.

[0094] In an embodiment, the gate layer 91 can be at least two layers, and the source-drain layer 92 can also be at least two layers, and adjacent first segments 411 are located in different two film layers of the at least two gate layers 91 and the at least two source-drain layers 92, respectively.

[0095] In the implementation process, in the display panel before cutting, in the area outside the display panel, the test terminal 42 forms a switching layer through the same layer material of the source-drain layer 92 and the gate layer 91 and is connected to the test trace 41, and after the touch test is completed, the test terminal 42 is cut off.

[0096] In the embodiment, the test terminal 42 is connected to the test terminal 42 through the test wire 41, and the test terminal 42 can be used to test the touch performance of the display panel, thereby improving the convenience of the touch performance test of the display panel, avoiding that the abnormal product enters the subsequent process, and improving the yield of the display panel. In addition, the test terminal 42 is connected to the touch wire 30 through the test wire 41, and the test terminal 42 can be arranged in other areas according to actual needs, and is not limited to the touch wire 30. In addition, the virtual terminal 52 is additionally arranged in the first sub-area A to improve the uneven stress distribution and improve the yield of the display panel. In the embodiment, the test terminal 42 is arranged in an area outside the display panel, and can be cut off in the process, thereby reducing the area occupied by the test terminal 42 in the display panel and increasing the wiring space in the display panel. In the embodiment, the first line segment 411 is arranged closer to the substrate 71, and adjacent first line segments 411 are arranged in different film layers, thereby reducing the probability of short circuit between the first line segment 411 and the bonding terminal 51 or between the first line segments 411, improving the bonding yield of the display panel.

[0097] In another embodiment of the present application, please refer to FIG. 6 and FIG. 7, the difference between the embodiment and FIG. 4 is that the display panel further comprises a switch tube 43 connected to the test wire 41, and the switch tube 43 is located on the side of the bonding area 1021 close to the display area 101 to control the on-off of the signal in the test wire 41.

[0098] In an embodiment, the switch tube 43 can include a mos tube, wherein the source end and the drain end of the switch tube 43 are connected to the test wire 41, the gate end of the switch tube 43 is connected to a test terminal 42 through a bonding terminal 51, and the test terminal 42 can be used to control the on-off of the switch tube 43. During the touch performance test of the display panel, the test equipment transmits test signals to the test terminal 42, including test touch signals transmitted to the test terminal 42 connected to the test wire 41, and opening signals transmitted to the test terminal 42 connected to the gate end of the switch tube 43 to open the switch tube 43, so that the signal in the test wire 41 can be normally transmitted. After the test is completed, the test terminal 42 is cut off.

[0099] Therefore, in the display panel, the switch tube 43 is in an off state; it should be noted that in the embodiment, the switch tube 43 is added in the test wire 41, and the switch tube 43 is in an off state after the test is completed; at the outer boundary of the side of the display panel provided with the binding area 1021, due to the cutting process, the cross section of the adjacent test wire 41 is easy to be short-circuited, or when the flexible circuit board 80 is pressed and bound with the binding terminal 51, the ACF glue may overflow to cause the short circuit between the adjacent test wires 41, therefore, in the embodiment of the application, the switch tube 43 is in an off state, which can reduce the probability of short circuit between the adjacent test wires 41, reduce the probability of short circuit between the adjacent touch wires 30, and improve the touch stability and touch effect of the display panel.

[0100] As described above, in the embodiment of the application, the test wire 41 connected with the touch wire 30 is arranged, and the test wire 41 is connected to the test terminal 42, so that the test terminal 42 can be used to test the touch performance of the display panel, which improves the convenience of the touch performance test of the display panel, avoids that the abnormal product enters the subsequent process, and improves the yield of the display panel; the test terminal 42 is connected to the touch wire 30 through the test wire 41, so that the test terminal 42 can be arranged in other areas according to actual needs, and is not limited to the touch wire 30; in addition, the first sub-area A is formed in the binding area 1021 and is arranged opposite to the test terminal 42, and the plurality of binding terminals 51 are located outside the first sub-area A, so that the overflow amount of the ACF glue in the first sub-area A can be effectively reduced, the short circuit phenomenon caused by the connection between the test terminal 42 and the overflow ACF glue can be avoided, the probability of short circuit between the touch wires 30 is reduced, and the stability of the display panel is improved; in the embodiment, the test terminal 42 is arranged in an area outside the display panel, which can be cut off in the process, so that the area occupied by the test terminal 42 in the display panel is reduced, and the wiring space in the display panel is increased; in the embodiment, the first line segment 411 is arranged closer to the substrate 71, and the adjacent first line segments 411 are arranged in different film layers, so that the probability of short circuit between the first line segment 411 and the binding terminal 51, or between the first line segments 411 is reduced, and the binding yield of the display panel is improved; further, in the embodiment, the switch tube 43 is added in the path of the test wire 41, so that the short circuit phenomenon between the adjacent touch wires 30 caused by the short circuit of the cross section of the adjacent test wire 41 due to the cutting at the outer boundary of the side of the display panel provided with the binding area 1021 can be avoided, and the touch stability and touch effect of the display panel are improved.

[0101] In other embodiments of the present application, the test terminals 42 can also be directly arranged on the test traces 41, and the test terminals 42 need to be arranged on the binding area 1021 close to one side of the display area 101 to avoid affecting the binding process by the test terminals 42; the display panel further comprises an insulating layer 61 covering the surface of the test terminals 42 to play an insulating role. Since the test terminals 42 do not need to be powered on after the touch test is completed, the insulating layer 61 is used to cover the test terminals 42, and the material of the insulating layer 61 can include UV glue.

[0102] In an embodiment, referring to FIGS. 8 and 9, the display panel comprises test terminals 42, and the test terminals 42 are connected to the touch traces 30.

[0103] In an embodiment, the test terminals 42 can be directly arranged on the touch traces 30; that is, the first opening 401 and the second opening 402 located in the device area 1023 can be formed in the planar layer 74 to expose the part of the surface of the touch traces 30 away from the substrate 71, wherein the test terminals 42 can be filled in the first opening 401 and connected to the touch traces 30, and the chip connection terminals can be arranged in the second opening 402, and the driving chip 20 can be connected to the touch traces 30 through the chip connection terminals; it can be understood that the planar protection layer 78 above the first opening 401 and the second opening 402 can be removed to facilitate the binding of the driving chip 20 and the connection of the test equipment and the test terminals 42 when the display panel is tested for touch performance.

[0104] In an embodiment, the distance between adjacent test terminals 42 is greater than or equal to the distance between adjacent chip connection terminals and less than or equal to the distance between adjacent binding terminals 51.

[0105] It should be noted that the display panel comprises a plurality of touch traces 30, the number of test traces 41 is also multiple, and the plurality of test traces 41 and the plurality of touch traces 30 can be connected one by one, and only one of the connected touch trace 30 and test trace 41 is taken as an example in the embodiment of the present application.

[0106] Further in the implementation and application process, when the display panel needs to be tested for touch performance, the touch signal can be input to the touch traces 30 through the test terminals 42 to test the touch performance of the display panel, and after the touch performance test is completed, the insulating layer 61 can be used to cover the upper side of the first opening 401 to insulate the test terminals 42 from the outside.

[0107] In an embodiment, the material of the insulating layer 61 can include UV glue.

[0108] As described above, in the embodiment, the test terminal 42 is arranged on the touch wire 30, and the test terminal 42 is used to test the touch performance of the display panel, so that the convenience of the touch performance test of the display panel is improved, and the abnormal product is prevented from entering the subsequent process, and the yield of the display panel is improved.

[0109] In another embodiment, please refer to FIG. 10 and FIG. 11, in the embodiment, the display panel includes the test terminal 42 and the test wire 41, one end of the test wire 41 is connected to the touch wire 30, the other end of the test wire 41 extends towards the driving chip 20 in the direction of the display area 101, and is connected to the test terminal 42.

[0110] In the embodiment, the test terminal 42 is located on the side of the binding area 1021 close to the driving chip 20, that is, the test terminal 42 is located on the side of the binding area 1021 close to the display area 101, and the binding terminals 51 are evenly distributed in the binding area 1021, or the test terminal 42 and the binding terminals 51 are partially overlapped in the direction of the display area 101 close to the binding area 1021.

[0111] In the embodiment, the test terminal 42 is located on the side of the binding area 1021 close to the driving chip 20, that is, the test terminal 42 is located on the side of the binding area 1021 close to the display area 101, and the binding terminals 51 are evenly distributed in the binding area 1021, or the test terminal 42 and the binding terminals 51 are partially overlapped in the direction of the display area 101 close to the binding area 1021.

[0112] As described above, in the embodiment, the test terminal 42 is arranged on the touch wire 30, and the test terminal 42 is used to test the touch performance of the display panel, so that the convenience of the touch performance test of the display panel is improved, and the abnormal product is prevented from entering the subsequent process, and the yield of the display panel is improved.

[0113] In another embodiment, please refer to FIG. 12, the difference between the embodiment and the embodiments shown in FIG. 10 and FIG. 11 is that the plurality of binding terminals 51 are unevenly distributed.

[0114] In the embodiment, the test terminal 42 is located on the side of the binding area 1021 close to the driving chip 20, that is, the test terminal 42 is located on the side of the binding area 1021 close to the display area 101, and the binding terminals 51 are evenly distributed in the binding area 1021, or the test terminal 42 and the binding terminals 51 are partially overlapped in the direction of the display area 101 close to the binding area 1021.

[0115] ​In an embodiment, the interval between two adjacent binding terminals 51 is less than the width of the first sub-area A along the extension direction perpendicular to the test trace 41.

[0116] It should be noted that, since the binding area 1021 needs to be bound to the flexible circuit board 80, and can be bonded by anisotropic conductive film (ACF), when the flexible circuit board 80 is pressure-bonded with the binding terminal 51, the ACF glue may overflow. Therefore, by not arranging the binding terminal 51 in the first sub-area A, the overflow amount of the ACF glue in the first sub-area A can be effectively reduced, and the phenomenon of short circuit of the test terminal 42 caused by connection with the overflowed ACF glue can be avoided.

[0117] As described above, by arranging the test trace 41 connected with the touch trace 30, and connecting the test trace 41 to the test terminal 42, the test terminal 42 can be used to test the touch performance of the display panel, which improves the convenience of the touch performance test of the display panel, avoids the abnormal products from entering the subsequent process, and improves the yield of the display panel. In addition, by connecting the test terminal 42 and the touch trace 30 through the test trace 41, the test terminal 42 can be arranged in other areas according to actual needs, without being limited to the touch trace 30. Furthermore, the first sub-area A is arranged in the binding area 1021 and is aligned with the test terminal 42, and the plurality of binding terminals 51 are located outside the first sub-area A, which can effectively reduce the overflow amount of the ACF glue in the first sub-area A, avoid the phenomenon of short circuit of the test terminal 42 caused by connection with the overflowed ACF glue, reduce the probability of short circuit between the touch traces 30, and improve the stability of the display panel.

[0118] In addition, in combination with FIGS. 1, 8, 10 and 13, the present embodiment also provides a display panel mother board 100, which includes at least two sub-boards 1001 and a cutting area 1002 located outside the sub-boards 1001. The sub-boards 1001 include a display area 101 and a non-display area 102 adjacent to the display area 101.

[0119] The sub-boards 1001 further include a touch electrode 10, a driving chip 20 and a touch trace 30. The touch electrode 10 is arranged in the display area 101; the driving chip 20 is arranged in the non-display area 102; the touch trace 30 is connected between the touch electrode 10 and the driving chip 20; wherein the sub-boards 1001 further include at least a test trace 41 arranged in the non-display area 102, and the test trace 41 is connected with the touch trace 30.

[0120] It should be noted that after the display panel mother board 100 provided in this application embodiment is cut, the resulting daughter board 1001 is obtained after bonding and other processes to obtain the display panel described in the above embodiment. Therefore, the setting method of the test trace 41 and the connection method between the daughter board 1001 and the touch trace 30 can be set with reference to the above embodiment.

[0121] In one embodiment, the display panel includes a test trace 41 and a test terminal 42. The test terminal 42 is located in the cutting area 1002. One end of the test trace 41 is connected to the touch trace 30, and the other end of the test trace 41 extends to the outside of the sub-board 1001 and is connected to the test terminal 42, as shown in FIG1.

[0122] In one embodiment, the non-display area 102 includes a bending area 1022 on the side close to the display area 101, a bonding area 1021 on the side away from the display area 101, and a device area 1023 located between the bending area 1022 and the bonding area 1021, and the driver chip 20 is disposed in the device area 1023.

[0123] In one embodiment, the display panel includes a test terminal 42 connected to the touch trace 30, as shown in FIG8.

[0124] In one embodiment, the display panel includes a test trace 41 and a test terminal 42. The test terminal 42 is located on the side of the bonding area 1021 near the driver chip 20. One end of the test trace 41 is connected to the touch trace 30, and the other end of the test trace 41 is connected to the test terminal 42, as shown in FIG9.

[0125] It is understood that since the setting method of the test trace 41 and the connection method with the touch trace 30 in the display panel motherboard 100 provided in this application embodiment can be set with reference to the display panel described in the above embodiment, the display panel motherboard 100 has the same beneficial effect as the display panel described in the above embodiment, and will not be repeated here.

[0126] Additionally, referring to FIG14, this application embodiment also provides a display device 90, which includes the display panel 901 described in the above embodiments.

[0127] In summary, this embodiment of the application connects the test trace 41 to the touch trace 30, thereby enabling the test trace 41 to be used to test the touch performance of the display panel. For example, even without the driver chip 20 being bonded, the touch performance of the display panel can still be tested through the test trace 41, which improves the convenience of touch performance testing of the display panel, prevents defective products from entering subsequent processes, and improves the yield rate of the display panel.

[0128] In the above embodiments, the description of each embodiment has its own focus, and the parts not described in detail in a certain embodiment can be referred to the relevant description of other embodiments.

[0129] The display panel and the display device provided by the embodiments of the present application are described in detail above, and the principles and implementation manners of the present application are described by applying specific examples in this paper. The above description of the embodiments is only used to help understand the technical solutions of the present application and the core idea thereof. It should be understood by those skilled in the art that the technical solutions recorded in the foregoing embodiments can be modified, or some technical features thereof can be replaced equivalently. The modification or replacement does not change the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A display panel, comprising a display area and a non-display area adjacent to the display area; The display panel further comprises: a touch electrode disposed in the display area; a pixel unit disposed in the display area; a driving chip disposed in the non-display area, the non-display area comprising a binding area on a side of the driving chip away from the display area; a display signal line connected between the driving chip and the pixel unit; a touch trace connected between the touch electrode and the driving chip; a plurality of binding terminals disposed in the binding area; wherein the display panel further comprises a test trace disposed in the non-display area, one end of the test trace being connected to the touch trace, the other end of the test trace passing through the binding area and extending to an outer boundary of the display panel on a side of the display panel provided with the binding area, and the test trace being located between adjacent binding terminals.

2. The display panel of claim 1, wherein, The driving chip comprises a first side opposite to the display area and a second side connected to the first side, the display signal line being connected to the first side of the driving chip, and the touch trace being connected to the second side of the driving chip.

3. The display panel of claim 2, wherein, The binding area comprises a first sub-area and a second sub-area adjacent to the first sub-area, one end of the test trace being connected to the touch trace on the second side of the driving chip, the other end of the test trace passing through the first sub-area, the second sub-area being located on a side of the test trace away from the driving chip, and the binding terminals comprising first binding terminals disposed in the second sub-area; The display panel further comprises a first connection line, and the non-display area further comprises a functional circuit area, the functional circuit area and the binding area being located on different sides of the display area, one end of the first connection line being connected to the first binding terminals, and the other end of the first connection line extending to the functional circuit area, and the first connection line and the test trace being disposed without overlapping.

4. The display panel of claim 3, wherein, The binding area further comprises a third sub-area disposed on a side of the first sub-area close to the driving chip, and the binding terminals further comprise second binding terminals disposed in the third sub-area; The display panel further comprises a second connection line, one end of the second connection line being connected to the second binding terminals, and the other end of the second connection line being connected to the driving chip, and the second connection line and the test trace being disposed without overlapping.

5. The display panel of claim 4, wherein, The display panel further comprises a gate driving unit and a light-on test unit disposed in the functional circuit area, the first connection line being connected to the gate driving unit and the light-on test unit, and the second connection line being electrically connected to the display signal line and the touch trace through the driving chip.

6. The display panel of claim 4, wherein, The display panel comprises a plurality of the first type of binding terminals and a plurality of the second type of binding terminals, and the interval between two adjacent first type of binding terminals is less than the width of the first sub-region in the direction in which the first sub-region points to the second sub-region, and the interval between two adjacent second type of binding terminals is less than the width of the first sub-region in the direction in which the first sub-region points to the second sub-region.

7. The display panel of claim 3, wherein, The display panel further comprises a virtual terminal, which is located in the first sub-region and is arranged adjacent to the test trace in the direction in which the first sub-region points to the second sub-region.

8. The display panel of claim 1, wherein, The display panel further comprises a switch tube connected to the test trace, which is located on the side of the binding region close to the display region to control the on-off of the signal in the test trace.

9. The display panel of claim 8, wherein, The switch tube is in an off state.

10. The display panel of claim 1, wherein, The display panel further comprises a substrate, a gate layer and a source-drain layer arranged on the substrate, and the test trace comprises a first segment located in the binding region, and the first segment is located on the gate layer or the source-drain layer.

11. The display panel of claim 10, wherein, The test trace further comprises a second segment connected to the side of the first segment close to the display region, and the interval between the first segment and the substrate is less than the interval between the second segment and the substrate.

12. The display panel of claim 10, wherein, The number of test traces is multiple, and the first segments of two adjacent test traces are arranged on different layers.

13. The display panel of claim 1, wherein, The display panel further comprises a test terminal connected to the touch trace.

14. The display panel of claim 13, wherein, The test terminal is arranged on the side of the binding region close to the driving chip.

15. The display panel of claim 13, wherein, The display panel further comprises an insulating layer covering the surface of the test terminal.

16. A display device comprising a display panel, the display panel comprising a display region and a non-display region adjacent to the display region; The display panel further comprises: a touch electrode arranged in the display region; a pixel unit arranged in the display region; a driving chip arranged in the non-display region, the non-display region comprising a binding region located on the side of the driving chip away from the display region; a display signal line connected between the driving chip and the pixel unit; a touch trace connected between the touch electrode and the driving chip; a plurality of binding terminals arranged in the binding region; The display panel further comprises a test trace arranged in the non-display region, one end of the test trace is connected to the touch trace, the other end of the test trace passes through the binding region and extends to the outer boundary of the side of the display panel provided with the binding region, and the test trace is located between adjacent binding terminals.

17. The display device of claim 16, wherein, The driving chip comprises a first side opposite to the display region and a second side connected to the first side, the display signal line is connected to the first side of the driving chip, and the touch trace is connected to the second side of the driving chip.

18. The display device of claim 17, wherein, The binding area comprises a first sub-area and a second sub-area adjacent to the first sub-area, one end of the test trace is connected to the touch trace on the second side of the driving chip, the other end of the test trace passes through the first sub-area, the second sub-area is located on the side of the test trace away from the driving chip, the binding terminal comprises a first type of binding terminal arranged in the second sub-area; The display panel further comprises a first connection line, the non-display area further comprises a functional circuit area, the functional circuit area and the binding area are located on different sides of the display area, one end of the first connection line is connected to the first type of binding terminal, the other end of the first connection line extends to the functional circuit area, and the first connection line is arranged without overlapping the test trace.

19. The display device of claim 18, wherein, The binding area further comprises a third sub-area arranged on the side of the first sub-area close to the driving chip, and the binding terminal further comprises a second type of binding terminal arranged in the third sub-area. The display panel further comprises a second connection line, one end of the second connection line is connected to the second type of binding terminal, the other end of the second connection line is connected to the driving chip, and the second connection line is arranged without overlapping the test trace.

20. The display device of claim 16, wherein, The display panel further comprises a switch tube connected to the test trace, and the switch tube is located on the side of the binding area close to the display area to control the on-off of the signal in the test trace.

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