Information processing device

Abstract

In the present invention, a processing unit may execute a plurality of times of first processing by changing a rotation amount and / or a translation amount of a second plane orthogonal coordinate system in the first processing, execute a plurality of times of second processing respectively corresponding to the plurality of times of the first processing, and execute third processing involving determining, as specific second processing among the plurality of times of the second processing, second processing in which the number of objects on the second plane orthogonal coordinate system overlapping any of objects on a first plane orthogonal coordinate system is largest, and storing, into the storage unit, information on the rotation amount and / or the translation amount of the second plane orthogonal coordinate system in the first processing corresponding to the specific second processing.

Description

Information processing apparatus

[0001] The technology disclosed in this specification relates to an information processing apparatus.

[0002] A substrate inspection apparatus is disclosed in Patent Document 1. The substrate inspection apparatus of Patent Document 1 includes a data storage unit that stores component mounting information and substrate design information, a component information acquisition unit that acquires component position information from the data storage unit, an image creation unit that creates a substrate design image from the substrate design information, a land information acquisition unit that extracts a land area from the image creation unit and acquires land information, a representative coordinate derivation unit that acquires land information from the land information acquisition unit and derives land representative coordinates and component representative coordinates, and an offset calculation unit that calculates an offset that is the difference between the land representative coordinates and the component representative coordinates. The substrate inspection apparatus of Patent Document 1 is characterized by performing alignment by matching the land representative coordinates and the component material surface coordinates based on the offset.

[0003] Japanese Unexamined Patent Application Publication No. 2024-030735

[0004] In the configuration of Patent Document 1, in order to perform coordinate alignment, it is considered that the derivation of land representative coordinates and the derivation of component representative coordinates must be performed, so the processing may become complicated. Therefore, other methods for performing coordinate alignment are being explored. This specification provides a technology that can correct the mismatch between two coordinate systems by a simple procedure using the overlap of a plurality of objects.

[0005] The information processing device disclosed herein comprises a storage unit and a processing unit. The storage unit may store information on the positions and shapes of a plurality of objects on a first Cartesian coordinate system and information on the positions and shapes of a plurality of objects on a second Cartesian coordinate system different from the first Cartesian coordinate system. The processing unit is capable of performing a first process of rotating and / or translating the second Cartesian coordinate system from a predetermined reference position relative to the first Cartesian coordinate system, with the first Cartesian coordinate system and the second Cartesian coordinate system superimposed. When performing the first process, if there are objects on the second Cartesian coordinate system that overlap with any of the objects on the first Cartesian coordinate system, the processing unit may be capable of performing a second process of identifying the number of overlapping objects. The processing unit may perform the first process multiple times by changing the amount of rotation and / or translation of the second plane orthogonal coordinate system in the first process, perform the second process multiple times corresponding to each of the multiple first processes, designate the second process that has the largest number of objects in the second plane orthogonal coordinate system that overlap with objects in the first plane orthogonal coordinate system as a specific second process, and perform a third process that stores information on the amount of rotation and / or translation of the second plane orthogonal coordinate system in the storage unit in the first process corresponding to the specific second process.

[0006] With this configuration, when several objects in the first orthogonal coordinate system overlap with several objects in the second orthogonal coordinate system, the amount of rotation and / or translation of the second orthogonal coordinate system can be determined based on the number of overlapping objects. By considering the amount of rotation and / or translation of the second orthogonal coordinate system when the number of overlapping objects is greatest as the discrepancy (amount of mismatch) between the first and second orthogonal coordinate systems, the mismatch between the two coordinate systems can be corrected. Thus, by utilizing the overlap of multiple objects, the mismatch between the two coordinate systems can be corrected in a simple procedure.

[0007] A schematic side view showing the component mounting device of the embodiment. A cross-sectional view taken along line II-II in Figure 1. A schematic plan view showing the first and second orthogonal coordinate systems of the embodiment. A flowchart of the first coordinate alignment process of the embodiment. A schematic plan view showing the first coordinate alignment process of the embodiment. A schematic plan view showing the first coordinate alignment process of the embodiment. A flowchart of the second coordinate alignment process of the embodiment. A schematic plan view showing the second coordinate alignment process of the embodiment. A schematic plan view showing the process executed before the process of S4 in the first coordinate alignment process of Modification 1. A schematic plan view showing the processes of S26 and S28 in the second coordinate alignment process of Modification 2. A schematic plan view showing the processes of S26 and S28 in the second coordinate alignment process of another modification. A schematic plan view showing the processes of S26 and S28 in the second coordinate alignment process of another modification. A schematic plan view showing the processes of S26 and S28 in the second coordinate alignment process of another modification.

[0008] The main features of the embodiments described below are listed below. Note that the technical elements described below are independent technical elements that exhibit technical usefulness individually or in various combinations, and are not limited to the combinations described in the claims at the time of filing.

[0009] In the information processing apparatus disclosed herein, the processing unit may perform the first and second processes after transforming the shapes of each of the plurality of objects in the first Cartesian coordinate system and each of the plurality of objects in the second Cartesian coordinate system into simple shapes.

[0010] In the information processing apparatus disclosed herein, the simple shape may be a quadrilateral or a circular shape.

[0011] With these configurations, by deforming the shape of an object to a simpler shape, the overlap between an object in the first orthogonal coordinate system and an object in the second orthogonal coordinate system can be clearly recognized.

[0012] In the information processing apparatus disclosed herein, after performing the third process, the processing unit may perform the fourth process, in which, with the first orthogonal coordinate system and the second orthogonal coordinate system superimposed, the second orthogonal coordinate system is rotated and / or translated relative to the first orthogonal coordinate system from the reference position based on the rotation and / or translation amount information of the second orthogonal coordinate system stored in the storage unit by the third process. When performing the fourth process, the processing unit may perform a fifth process to extract and guide objects that do not overlap with any of the objects in the first orthogonal coordinate system from among the multiple objects in the second orthogonal coordinate system.

[0013] With this configuration, it is possible to correct the discrepancy between the two coordinate systems and then correct the position of the object in the second orthogonal coordinate system.

[0014] In the information processing apparatus disclosed herein, the object on the first Cartesian coordinate system may be an object representing a component mounted on a substrate.

[0015] In the information processing apparatus disclosed herein, the object on the second Cartesian coordinate system may be an object representing a portion of a substrate on which a component is mounted.

[0016] These configurations allow for precise mounting of components onto the circuit board.

[0017] (Example) An example of a component mounting apparatus 1 will be described with reference to the drawings. As shown in Figures 1 and 2, the component mounting apparatus 1 of the example comprises a plurality of component feeders 12, a feeder holding unit 14, a mounting head 16, a head moving device 18, a conveyor 15, a display operation device 42, and an information processing device 50. The component mounting apparatus 1 is a device for mounting electronic components 4 onto a circuit board 2.

[0018] Each of the multiple component feeders 12 can be installed on the component mounting device 1. When the component feeders 12 are installed on the component mounting device 1, electronic components 4 are supplied from the component feeders 12 to the component mounting device 1.

[0019] Each component feeder 12 contains multiple electronic components 4. The type of electronic component 4 is not particularly limited, but examples include corner chips, lead-defined components, special-angle components, bump-defined components, and insert components. The component feeder 12 is detachably attached to the feeder holding section 14 of the component mounting device 1 and supplies the electronic components 4 to the mounting head 16. The specific configuration of the component feeder 12 is not particularly limited. Each component feeder 12 may be, for example, a tape-type feeder that supplies multiple electronic components 4 contained on a tape, a tray-type feeder that supplies multiple electronic components 4 contained on a tray, or a bulk-type feeder that supplies multiple electronic components 4 randomly contained in a container.

[0020] The feeder holder 14 has multiple slots, and a component feeder 12 can be detachably installed in each of the multiple slots. The feeder holder 14 may be fixed to the component mounting device 1, or it may be detachable from the component mounting device 1.

[0021] The mounting head 16 is detachably attached to a head holding portion 19 provided on the moving base 18a of the head moving device 18. The mounting head 16 has a nozzle 6 for attracting electronic components 4. The nozzle 6 is detachably attached to the mounting head 16. The mounting head 16 is movable with the nozzle 6 in the Z direction (here, the vertical direction), allowing the nozzle 6 to move closer to and further away from the component feeder 12 and the circuit board 2. The mounting head 16 can attract electronic components 4 from the component feeder 12 with the nozzle 6 and mount the electronic components 4 attracted by the nozzle 6 onto the circuit board 2.

[0022] The head moving device 18 moves the mounting head 16 between the parts feeder 12 and the circuit board 2. In this embodiment, the head moving device 18 is an XY robot that moves the moving base 18a in the X and Y directions, and the mounting head 16 is fixed to the moving base 18a. The moving base 18a is provided with a head holding part 19 to which the mounting head 16 can be attached and detached, and the mounting head 16 is attached to the head holding part 19. The head moving device 18 can move the nozzle 6 in parallel in a plane (XY plane) parallel to the surface of the circuit board 2.

[0023] The conveyor 15 is a device that loads, positions, and unloads circuit boards 2 in the component mounting device 1. The conveyor 15 loads the circuit boards 2 into the component mounting device 1 from the loading entrance (not shown) and positions the circuit boards 2 at the mounting work position within the component mounting device 1 (the position where the circuit boards 2 are shown in Figure 2). The conveyor 15 also unloads the circuit boards 2 to the loading entrance (not shown) of an adjacent component mounting device 1. In other words, the conveyor 15 transports the circuit boards 2 sequentially to adjacent component mounting devices 1. The type of conveyor 15 is not particularly limited. For example, the conveyor 15 may be a belt conveyor, a chain conveyor, or a roller conveyor.

[0024] The display and operation device 42, for example, includes a touch panel and displays various visual information related to the component mounting device 1, as well as accepting various input operations related to the component mounting device 1. In a modified example, the display and operation device 42 may include a monitor and a keyboard, etc. The display and operation device 42 is provided, for example, on the front side of the component mounting device 1.

[0025] The information processing device 50 comprises a processing unit 52 and a storage unit 54. The processing unit 52, for example, includes a CPU and executes various controls and processes related to the component mounting device 1 based on a predetermined program stored in the storage unit 54. The controls and processes executed by the processing unit 52 will be described later.

[0026] The memory unit 54 includes, for example, ROM and RAM, and stores various information related to the component mounting device 1. The memory unit 54 also stores, for example, programs for executing various controls and processes related to the component mounting device 1.

[0027] The storage unit 54 comprises a first storage unit 54a and a second storage unit 54b. The first storage unit 54a stores, for example, first data 100. The first data 100 is sometimes called pad data. The first data 100 includes information of a first Cartesian coordinate system 10 (see Figure 3) and information of a plurality of objects 30 (see Figure 3) on the first Cartesian coordinate system 10. The first data 100 includes information on the position and shape of the plurality of objects 30 on the first Cartesian coordinate system 10.

[0028] As shown in Figure 3, the first Cartesian coordinate system 10 is a coordinate system of a plane having orthogonal axes (X-axis and Y-axis). The first Cartesian coordinate system 10 can be represented, for example, by an infinite plane where the lengths of the X-axis and Y-axis are infinite. In a modified example, the first Cartesian coordinate system 10 may be represented by a finite plane where the lengths of the X-axis and Y-axis are finite. The first Cartesian coordinate system 10 has an origin O1. In the following explanation, "first Cartesian coordinate system" may be abbreviated to "first coordinate system".

[0029] The objects 30 on the first coordinate system 10 represent electronic components 4 that are mounted on the circuit board 2 by the component mounting device 1 described above. The multiple objects 30 on the first coordinate system 10 are classified into multiple types. For example, the objects 30 on the first coordinate system 10 represent corner chips, lead-defined components, special-angle components, bump-defined components, inset components, etc., that are mounted on the circuit board 2. The positions and shapes of the objects 30 on the first coordinate system 10 vary.

[0030] The second storage unit 54b (see Figure 1) stores, for example, second data 200. The second data 200 is sometimes called Gerber data. The second data 200 includes information about the second Cartesian coordinate system 20 (see Figure 3) and information about a plurality of objects 40 (see Figure 3) on the second Cartesian coordinate system 20. The second data 200 includes information about the position and shape of the plurality of objects 40 on the second Cartesian coordinate system 20.

[0031] As shown in Figure 3, the second Cartesian coordinate system 20 is a coordinate system of a plane having orthogonal axes (X-axis and Y-axis). The second Cartesian coordinate system 20 can be represented, for example, by an infinite plane where the lengths of the X-axis and Y-axis are infinite. In a modified example, the second Cartesian coordinate system 20 may be represented by a finite plane where the lengths of the X-axis and Y-axis are finite. The second Cartesian coordinate system 20 has an origin O2. In the following explanation, "second Cartesian coordinate system" may be abbreviated to "second coordinate system".

[0032] The objects 40 in the second coordinate system 20 represent portions of the circuit board 2 on which the electronic components 4 are mounted by the component mounting device 1 described above. The multiple objects 40 in the second coordinate system 20 are classified into multiple types. For example, the objects 40 in the second coordinate system 20 represent pads, lands, etc., on which the electronic components 4 are mounted. The positions and shapes of the objects 40 in the second coordinate system 20 vary.

[0033] (First Coordinate Alignment Process; Figure 4) Next, the first coordinate alignment process of the embodiment will be described. The first coordinate alignment process is started, for example, when a predetermined start instruction is input. In the first coordinate alignment process, the processing unit 52 executes the process shown in Figure 4 based on the first data 100 stored in the first storage unit 54a and the second data 200 stored in the second storage unit 54b. The processing unit 52 repeatedly executes the series of processes from S2 to S16 shown in Figure 4.

[0034] As shown in Figure 4, in S2 of the first coordinate alignment process, the processing unit 52 performs a process to superimpose the first coordinate system 10 and the second coordinate system 20. Specifically, as shown in Figure 3, the processing unit 52 places the first coordinate system 10 at a predetermined first reference position R1 and the second coordinate system 20 at a predetermined second reference position R2. The method for placing the first coordinate system 10 at the first reference position R1 is not particularly limited. For example, the processing unit 52 places the first coordinate system 10 at the first reference position R1 using a known algorithm such as SIFT, SURF, ORB, or AKAZE. The same applies to the method for placing the second coordinate system 20 at the second reference position R2.

[0035] In S2 (see Figure 4), the first coordinate system 10 is positioned at the first reference position R1, and the second coordinate system 20 is positioned at the second reference position R2, so that the first coordinate system 10 and the second coordinate system 20 overlap (see Figure 3). Also in S2, the origin O1 of the first coordinate system 10 is positioned at the first reference point P1, and the origin O2 of the second coordinate system 20 is positioned at the second reference point P2.

[0036] In the subsequent S4, the processing unit 52 performs a process to rotate and / or translate the second coordinate system 20 relative to the first coordinate system 10 from the second reference position R2, with the first coordinate system 10 and the second coordinate system 20 superimposed (an example of the first process). As shown in Figures 5 and 6, the processing unit 52 rotates and / or translates the second coordinate system 20 based on a predetermined amount of rotation and / or a predetermined amount of translation. Figure 5 shows the state before rotation and / or translation, and Figure 6 shows the state after rotation and / or translation.

[0037] When the processing unit 52 rotates the second coordinate system 20, it rotates the second coordinate system 20 with its origin O2 as the center of rotation. When the processing unit 52 translates the second coordinate system 20, it translates the second coordinate system 20 in the X-axis direction and / or the Y-axis direction.

[0038] When the process in S4 is executed, as shown in Figure 6, some of the objects 40 in the second coordinate system 20 may overlap with one of the objects 30 in the first coordinate system 10. In the example shown in Figure 6, the objects "40a" in the second coordinate system 20 overlap with the objects "30a" in the first coordinate system 10.

[0039] As shown in Figure 4, in the subsequent step S6, the processing unit 52 identifies one or more objects "40a" among the multiple objects 40 on the second coordinate system 20 that overlap with any of the multiple objects 30 on the first coordinate system 10. For example, the processing unit 52 identifies an object 40 on the second coordinate system 20 as an overlapping object "40a" if it overlaps with an object 30 on the first coordinate system 10 over an area of ​​10% or more of its area.

[0040] In the subsequent step S8, the processing unit 52 determines the number of overlapping objects "40a" identified in step S6 (an example of the second process). In the example shown in Figure 6, the number of overlapping objects "40a" is 2. In reality, a larger number will be identified.

[0041] In the subsequent S10, the processing unit 52 calculates the agreement rate X between the multiple objects 30 on the first coordinate system 10 and the multiple objects 40 on the second coordinate system 20, based on the number of overlapping objects "40a" identified in S8. The agreement rate X is calculated, for example, based on the following formula (1): Agreement rate X = Number of overlapping objects "40a" on the second coordinate system 20 identified in S8 / Total number of objects 40 on the second coordinate system 20 ... (1)

[0042] In the subsequent S12, the processing unit 52 determines whether the matching rate X calculated in the above S10 exceeds the highest past matching rate X. The highest past matching rate X is the highest matching rate X among the plurality of matching rates X calculated in a plurality of previous series of processes before this time when the processing unit 52 repeatedly executes a series of processes from S2 to S16 shown in FIG. 4 a plurality of times. When the matching rate X of the objects 30 and 40 is the highest, the number of overlapping objects "40a" on the second coordinate system 20 is the largest. Note that the highest past matching rate X is stored, for example, in the second storage unit 54b.

[0043] When the matching rate X calculated in the current S10 by the processing unit 52 exceeds the highest past matching rate X (YES in S12), in the subsequent S14, the information on the rotation amount and / or translation amount of the second coordinate system 20 in the current S4 is stored in the second storage unit 54b (an example of the third process). The processing unit 52 may overwrite and store the information on the rotation amount and / or translation amount at the time of the highest past matching rate X stored in the second storage unit 54b with the information on the current rotation amount and / or translation amount. On the other hand, when the matching rate X calculated in the current S10 by the processing unit 52 does not exceed the highest past matching rate X (NO in S12), the processing unit 52 skips S14 and executes the process of S16.

[0044] In the subsequent S16, the processing unit 52 determines whether the number of repeated executions of the series of processes from S2 to S14 of the first coordinate alignment process has reached a predetermined reference number of times. When the number of repeated executions reaches the reference number of times (YES in S16), the first coordinate alignment process ends. On the other hand, when the answer is NO in S16, the process returns to S2. In this case, the processing unit 52 executes the series of processes from S2 to S16 again. Thereby, the processing unit 52 can change the rotation amount and / or translation amount of the second coordinate system 20 in the process of S4 and execute the process of S4 a plurality of times.

[0045] Further, the processing unit 52 can execute a plurality of times of the process of S8 corresponding to each of the plurality of times of the process of S4. Further, among the plurality of times of the process of S8, the processing unit 52 designates the process of S8 of the cycle in which the number of objects 40 on the second coordinate system 20 overlapping with the object 30 on the first coordinate system 10 becomes the largest as a specific process, and the rotation amount and / or the parallel movement amount information of the second coordinate system 20 in the process of S4 corresponding to this specific process can be stored in the second storage unit 54b.

[0046] (Second coordinate alignment process; FIG. 7) Next, the second coordinate alignment process will be described. The second coordinate alignment process is started, for example, when a predetermined start instruction is input after the above-described first coordinate alignment process (see FIG. 4) ends. In the second coordinate alignment process, the processing unit 52 executes the process shown in FIG. 7 based on the first data 100 stored in the first storage unit 54a, the second data 200 stored in the second storage unit 54b, and the rotation amount and / or the parallel movement amount information of the second coordinate system 20 stored in the second storage unit 54b in the above-described first coordinate alignment process (see S14 in FIG. 4).

[0047] As shown in FIG. 7, in S22 of the second coordinate alignment process, the processing unit 52 executes a process of overlapping the first coordinate system 10 and the second coordinate system 20. The process of S22 is the same as the process of S2 of the above-described first coordinate alignment process. Therefore, detailed description thereof will be omitted.

[0048] In subsequent S24, with the first coordinate system 10 and the second coordinate system 20 overlapped, the processing unit 52 rotates and / or translates the second coordinate system 20 from the second reference position R2 with respect to the first coordinate system 10 based on the rotation amount and / or the parallel movement amount information of the second coordinate system 20 stored in the second storage unit 54b by the process of S14 of the above-described first coordinate alignment process (an example of the fourth process). The rotation amount and / or the parallel movement amount of the second coordinate system 20 stored in the second storage unit 54b by the process of S14 described above is the rotation amount and / or the parallel movement amount of the cycle in which the number of overlapping objects "40a" on the second coordinate system 20 becomes the largest.

[0049] When the processing unit 52 rotates the second coordinate system 20, it rotates the second coordinate system 20 with its origin O2 as the center of rotation. When the processing unit 52 translates the second coordinate system 20, it translates the second coordinate system 20 in the X-axis direction and / or the Y-axis direction.

[0050] When the process in S24 described above is executed, as shown in Figure 8, some of the objects 40 in the second coordinate system 20 will overlap with any of the objects 30 in the first coordinate system 10. Also, some of the objects 40 in the second coordinate system 20 will not overlap with any of the objects 30 in the first coordinate system 10. In the example shown in Figure 8, the objects "40a" in the second coordinate system 20 will overlap with the objects "30a" in the first coordinate system 10. On the other hand, the objects "40b" in the second coordinate system 20 will not overlap with the objects 30 in the first coordinate system 10.

[0051] As shown in Figure 7, in the subsequent S26, the processing unit 52 identifies one or more objects "40b" among the multiple objects 40 on the second coordinate system 20 that do not overlap with any of the multiple objects 30 on the first coordinate system 10.

[0052] In the subsequent S28, the processing unit 52 performs a process to extract and guide one or more non-overlapping objects "40b" identified in S26 (an example of a fifth process). For example, the processing unit 52 rotates and / or translates the non-overlapping objects "40b" on the second coordinate system 20 so that they overlap with the corresponding objects 30 on the first coordinate system 10.

[0053] (Effects) The embodiments have been described above. As is clear from the above description, the processing unit 52 changes the amount of rotation and / or translation of the second coordinate system 20 and performs the process of rotating and / or translating the second coordinate system 20 relative to the first coordinate system 10 multiple times. The processing unit 52 also designates the process in which the number of objects 40a on the second coordinate system 20 that overlap with the object 30 on the first coordinate system 10 is greatest as a specific process, and stores the information of the amount of rotation and / or translation of the second coordinate system 20 corresponding to the specific process in the second storage unit 54b.

[0054] With this configuration, when several objects 30 on the first coordinate system 10 and several objects 40 on the second coordinate system 20 overlap, the amount of rotation and / or translation of the second coordinate system 20 can be determined based on the number of overlapping objects 40a. By considering the amount of rotation and / or translation of the second coordinate system 20 when the number of overlapping objects 40a on the second coordinate system 20 is largest as the discrepancy (amount of mismatch) between the first coordinate system 10 and the second coordinate system 20, the mismatch between the two coordinate systems 10 and 20 can be corrected. Thus, by utilizing the overlap of multiple objects 30 and 40, the mismatch between the two coordinate systems 10 and 20 can be corrected in a simple procedure.

[0055] Furthermore, the processing unit 52 executes a process to rotate and / or translate the second coordinate system 20 relative to the first coordinate system 10 based on the rotation and / or translation amount information of the second coordinate system 20 stored in the second storage unit 54b. In this case, if there is an object 40b among the multiple objects 40 on the second coordinate system 20 that does not overlap with any of the multiple objects 30 on the first coordinate system 10, the processing unit 52 extracts and guides the object 40b that does not overlap.

[0056] With this configuration, after correcting the discrepancy between the two coordinate systems 10 and 20, the position of the non-overlapping object 40b on the second coordinate system 20 can be corrected.

[0057] (Modification 1) In Modification 1, the processing unit 52 may transform the shape of the object 30 on the first coordinate system 10 into a simple shape before executing the process S4 of the first coordinate alignment process (see Figure 4). Alternatively, the processing unit 52 may transform the shape of the object 40 on the second coordinate system 20 into a simple shape before executing the process S4 of the first coordinate alignment process. A simple shape is, for example, a quadrilateral or a circle. Note that the quadrilateral shape is a concept that includes both square and rectangular shapes.

[0058] For example, as shown in Figure 9, if the shape of object 30 in the first coordinate system 10 is more complex than a rectangle, the processing unit 52 may transform the shape of object 30 in the first coordinate system 10 into a rectangle. In other words, the processing unit 52 may generate a simple rectangle object 30c from the complex-shaped object 30.

[0059] More specifically, the processing unit 52 may deform the shape of the object 30 into a rectangle such that the longest side of the complex-shaped object 30 becomes the short side of the rectangle. In another modification, the processing unit 52 may deform the shape of the object 30 into a rectangle such that the longest side of the complex-shaped object 30 becomes the long side of the rectangle. In yet another modification, the processing unit 52 may deform the shape of the object 30 into a square such that the longest side of the complex-shaped object 30 becomes one side of the square. The processing unit 52 may similarly deform the object 40 on the second coordinate system 20.

[0060] In another variation, if the object 30 on the first coordinate system 10 is represented by multiple line segments, the processing unit 52 may transform the shape of the object 30 into a rectangle or a square by combining these multiple line segments. The processing unit 52 may similarly transform the object 40 on the second coordinate system 20.

[0061] (Modification 2) In Modification 2, when the processing unit 52 executes the S26 and S28 processes of the second coordinate alignment process (see Figure 7), it may extract and guide multiple objects 40 of the same type on the second coordinate system 20 all at once.

[0062] For example, as shown in Figure 10, the processing unit 52 may extract multiple objects 40d of the same type (e.g., corner chips) on the second coordinate system 20 all at once and guide them to overlap with objects 30d of the corresponding type (e.g., pads) on the first coordinate system 10.

[0063] In this case, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 collectively so that the area S of the overlapping portion between the object 40d on the second coordinate system 20 and the object 30d on the first coordinate system 10 is equal for multiple objects 40d. Alternatively, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 collectively so that the center of the X-axis direction of the object 40d on the second coordinate system 20 coincides with the center of the X-axis direction of the object 30d on the first coordinate system 10.

[0064] In another modification, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 collectively, as shown in Figure 11, so that the center of the Y-axis direction of the object 40d on the second coordinate system 20 coincides with the center of the Y-axis direction of the object 30d on the first coordinate system 10.

[0065] Furthermore, in another modification, as shown in Figure 12, if the shape of the object 40 on the second coordinate system 20 and the shape of the object 30 on the first coordinate system 10 are both circular, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 all at once so that the center of the object 40d on the second coordinate system 20 coincides with the center of the object 30d on the first coordinate system 10.

[0066] In further variations, when the processing unit 52 guides a plurality of objects 40d on the second coordinate system 20 all at once, as shown in Figure 13, for a pair of objects 40d1 and 40d2 facing each other in the X-axis direction, the processing unit 52 may guide the plurality of objects 40d all at once such that the area S1 of the overlapping portion between one object 40d1 and the object 30d on the first coordinate system 10 is equal to the area S2 of the overlapping portion between the other object 40d2 and the object 30d on the first coordinate system 10. Similarly, for a pair of objects 40d3 and 40d4 facing each other in the Y-axis direction, the processing unit 52 may guide the plurality of objects 40d all at once such that the area S3 of the overlapping portion between one object 40d3 and the object 30d on the first coordinate system 10 is equal to the area S4 of the overlapping portion between the other object 40d4 and the object 30d on the first coordinate system 10.

[0067] Furthermore, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 collectively so that the center of the X-axis direction of the object 40d on the second coordinate system 20 coincides with the center of the X-axis direction of the object 30d on the first coordinate system 10. Similarly, the processing unit 52 may guide multiple objects 40d on the second coordinate system 20 collectively so that the center of the Y-axis direction of the object 40d on the second coordinate system 20 coincides with the center of the Y-axis direction of the object 30d on the first coordinate system 10.

[0068] (Modification 3) In Modification 3, when the processing unit 52 executes the S28 process of the second coordinate alignment process (see Figure 7), it may sequentially execute the S28 process for each type of object 30 on the first coordinate system 10. For example, the processing unit 52 may sequentially guide the multiple pad objects 40 on the second coordinate system 20 that correspond to each of the corner chip, lead definition component, special angle component, bump definition component, and insertion component objects 30 on the first coordinate system 10.

[0069] Although specific examples of the present invention have been described in detail above, these are merely illustrative and do not limit the scope of the claims. The technologies described in the claims include various modifications and changes to the specific examples illustrated above. The technical elements described in this specification or drawings exhibit technical usefulness individually or in various combinations, and are not limited to the combinations described in the claims at the time of filing. Furthermore, the technologies illustrated in this specification or drawings can achieve multiple objectives simultaneously, and achieving even one of these objectives itself constitutes technical usefulness.

[0070] 1: Component mounting device, 2: Circuit board, 4: Electronic component, 10: First plane orthogonal coordinate system, 12: Component feeder, 14: Feeder holding unit, 15: Conveyor, 16: Mounting head, 18: Head moving device, 20: Second plane orthogonal coordinate system, 30: Object, 40: Object, 42: Display operation device, 50: Information processing device, 52: Processing unit, 54: Storage unit, 54a: First storage unit, 54b: Second storage unit, P1: First reference point, P2: Second reference point, R1: First reference position, R2: Second reference position

Claims

1. An information processing device comprising a storage unit and a processing unit, wherein the storage unit stores information on the position and shape of a plurality of objects on a first orthogonal coordinate system, and information on the position and shape of a plurality of objects on a second orthogonal coordinate system different from the first orthogonal coordinate system, the processing unit is capable of performing a first process of rotating and / or translating the second orthogonal coordinate system from a predetermined reference position relative to the first orthogonal coordinate system while the first orthogonal coordinate system and the second orthogonal coordinate system are superimposed, and is capable of performing a second process of identifying the number of overlapping objects if, when performing the first process, there are objects on the second orthogonal coordinate system that overlap with any of the objects on the first orthogonal coordinate system, the processing unit is capable of performing a second process of identifying the number of overlapping objects, the processing unit performs the first process multiple times by changing the amount of rotation and / or translation of the second orthogonal coordinate system in the first process, and performs a second process multiple times corresponding to each of the multiple first processes. An information processing device that, among multiple instances of the second process, designates the instance of the second process in which the number of objects in the second orthogonal coordinate system that overlap with objects in the first orthogonal coordinate system is greatest as a specific second process, and executes a third process in which it stores information of the amount of rotation and / or translation of the second orthogonal coordinate system in the storage unit for the first process corresponding to the specific second process.

2. The information processing apparatus according to claim 1, wherein the processing unit deforms the shapes of each of the multiple objects on the first plane orthogonal coordinate system and the shapes of each of the multiple objects on the second plane orthogonal coordinate system into simple shapes, and then performs the first process and the second process.

3. The information processing apparatus according to claim 2, wherein the simple shape is a quadrilateral or a circular shape.

4. The information processing apparatus according to claim 1 or 2, wherein, after executing the third process, the processing unit executes a fourth process in which, with the first orthogonal coordinate system and the second orthogonal coordinate system superimposed, the second orthogonal coordinate system is rotated and / or translated relative to the first orthogonal coordinate system from the reference position based on the rotation and / or translation amount information of the second orthogonal coordinate system stored in the storage unit by the third process, and when executing the fourth process, if there is an object among the plurality of objects on the second orthogonal coordinate system that does not overlap with any of the plurality of objects on the first orthogonal coordinate system, the processing unit executes a fifth process in which it extracts and guides the object that does not overlap.

5. The information processing apparatus according to claim 1 or 2, wherein the object on the first Cartesian coordinate system is an object representing a component mounted on a substrate.

6. The information processing apparatus according to claim 1 or 2, wherein the object on the second Cartesian coordinate system is an object representing a portion of a substrate on which components are mounted.

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