A test system

Abstract

The present invention relates to a body (2) which is a spacecraft and is located under space conditions, at least one control computer (3) located on the body (2) and providing for the control of the body (2), at least one power source (4) located on the body (2), connected to the control computer (3), and generating power, and a plurality of components (5) located on the body (2) to be tested under space conditions.

Description

[0001] DESCRIPTION

[0002] A TEST SYSTEM

[0003] The present invention relates to a test system for testing Commercial Off-the-Shelf (RAHAT) (COTS) and Industrial and Automotive Grade (IAG) materials under space conditions.

[0004] Components used in hardware designed for space applications are required to be radiationresistant due to space conditions. The radiation resistance varies according to the orbit in which the satellite will operate and the duration of its mission in orbit. For resistance against radiation, there are factors such as Single Event Effects and Total Ionizing Dose. Within the scope of the aforementioned factors, space-qualified component manufacturers take various measures in their component designs, component package types, and structures. Subsequently, they subject their components to radiation testing with various particles (protons, neutrons, etc.). In radiation tests, particles are accelerated and directed onto the components, and the functionality of the component is monitored via measurement equipment. As these procedures create significant time and testing costs, the unit prices of radiation - resistant or radiation-tolerant materials are very high compared to the unit price of untested Commercial Off-the-Shelf components. For this reason, a need arises for sending Commercial Off-the-Shelf (COTS) materials to space along with a satellite being launched, for testing their use under space conditions, and for a suitable test architecture for this purpose.

[0005] In the People's Republic of China patent document No. CN1 13804996A, which is included in the known state of the art, a method and a system are disclosed for testing the in-orbit radiation-induced single event effects on Digital Signal Processors (DSPs) located in aircraft and / or spacecraft. The document mentions that the in-orbit radiation-induced single event effects of the DSP under test are monitored in real-time, that the test result is sent to a particle radiation effect FPGA, that the test is monitored by means of a display unit, and that the test data is transmitted to a ground station via the FPGA. Within the scope of the document, it is mentioned that the radiation-induced single event effects are analyzed cyclically in static and dynamic ways.

[0006] Thanks to the test system developed with this invention, the usability of RAHAT or COTS materials under space conditions is tested by using RAHAT or COTS materials on a satellite instead of space-qualified materials. Another object of the present invention is to enable the reduction of satellite costs and the improvement of material procurement processes by using RAHAT or COTS materials in space equipment.

[0007] A further object of the present invention is to create a design architecture for errors that may be encountered specific to the materials, in order to enable the design of satellite equipment with RAHAT or COTS components.

[0008] A further object of the present invention is to enable the testing of more than one electronic component within a test system.

[0009] The test system, realized to achieve the object of the invention and defined in the first claim and the claims dependent thereon, comprises a body, which is a spacecraft, located in the space environment or in space conditions created on Earth. A satellite control computer is located on the body. The control computer performs all functional controls of the satellite. A power source is located on the body. The power source generates and distributes power to ensure the functionality of the body. A component is located on the body. The component is manufactured from RAHAT or COTS material and is located on the body to be tested under space conditions.

[0010] The test system, which is the subject of the invention, comprises a first card located on the body. The component, which is an electronic component, is located on the first card. A second card is located on the body, and a component, which is an electronic component, is located on it. The components located on the second card and the components located on the first card have different part numbers and are of a different structure. The first card and the second card have a communication interface with each other and are capable of communicating. The first card is connected to the power source and the control computer independently of the second card. The power line at the input of the first card and the power line at the input of the second card are separate from each other. The control computer communicates with both the first card and the second card separately.

[0011] In one embodiment of the invention, the test system comprises a first controller located on the first card and the second card. The first controller controls the operation of the components, receives and evaluates their health data, and manages the transmission of the data to the control computer. A second controller is located on the first card and the second card. The first controller and the second controller have a communication interface with each other. For the purpose of redundancy (Triple Modular Redundancy - TMR), there are preferably three communication interfaces between the first card, the second card, and the control computer. The second controller has a different part number from the first controller and is of a different structure. In the event of an error in the first controller caused by radiation and / or in accordance with parameters predetermined by the manufacturer, the first controller is reprogrammed by the user via the second controller. The first controller and the second controller are tested by the user under space conditions.

[0012] In one embodiment of the invention, the test system comprises a first card and a second card located on the body, which are connected to the control computer and the power source independently of the satellite system's electronic components. The power source, while generating power for the operation of the electronic components located within the satellite, simultaneously powers the first card and the second card. The control computer, while ensuring the functionality of the satellite, also enables the user to control the first card and the second card. There can be a plurality of first cards and / or second cards.

[0013] In one embodiment of the invention, the test system comprises a plurality of environmental specimens located on the first card and / or the second card. The environmental specimen enables the adjustment and control of the frequency and amplitude of the signals required for the operation of the first controller and / or the second controller and / or the components. While the environmental specimen adjusts the frequency and amplitude of the signals, it is simultaneously tested by the user under space conditions.

[0014] In one embodiment of the invention, the test system comprises a plurality of power specimens located on the first card and / or the second card. The power specimen controls and regulates the current and voltage transmitted from the power source to the first card and / or the second card. Within the power specimen, there are a plurality of power regulators at different voltage levels and of different structures, which enable the adjustment of the voltage levels required by the components. While some of the regulators are space-qualified materials, others are components, and they are tested under space conditions together with the power specimen. The electronic components necessary for the operation of the first controller are space- qualified materials. Fuse circuits are located at the inputs of the components and enable the control of the voltage levels. While the power specimen controls the voltage and current levels, its operation under space conditions is tested by the user.

[0015] In one embodiment of the invention, the test system comprises a plurality of storage specimens located on the first card and / or the second card. The storage specimen stores data from the data communications between the control computer and the first card and / or the second card and / or the components. The storage specimens have different structures and different part numbers from one another. The storage specimen both stores data and is tested by the user for its operation under space conditions.

[0016] In one embodiment of the invention, the test system comprises a plurality of communication specimens located on the first card and / or the second card. The communication specimen enables communication between the control computer and the first card and / or the second card and / or the components. The communication specimen comprises communication interfaces and communication protocols of different structures and part numbers. While the communication specimen enables data communication, its operation under space conditions is tested by the user.

[0017] In one embodiment of the invention, the test system comprises a first controller and a second controller which, in the event of an error in the operation of a component in accordance with parameters predetermined by the manufacturer and / or due to radiation, enable the interruption or regulation of the power transmitted from the source to said component, thereby enabling the isolation of the faulty component from the other components or from the satellite components located on the body.

[0018] In an embodiment of the invention, the test system comprises a communication specimen that allows the components located on the first card and / or the second card to communicate with each other via an Ethernet interface.

[0019] In one embodiment of the invention, the test system comprises a first controller which is an FPGA and SoC (System-on-Chip) integrated circuit, and a second controller which is an FPGA. In the event of an error in the first controller, the first controller is reprogrammed by the user via the second controller.

[0020] In one embodiment of the invention, the test system comprises a ground station. From the ground station, the user controls the operation of the components, analyzes their operational data, and intervenes in the event of an error.

[0021] In one embodiment of the invention, the test system comprises a component which is a Commercial Off-the-Shelf or Industrial and Automotive Grade material. In one embodiment of the invention, the test system comprises a first controller that enables, in accordance with parameters predetermined by the manufacturer: the testing of the components' operation under space conditions; and the detection, by the user and / or automatically, and subsequent isolation of non-operational components.

[0022] The test system realized to achieve the objects of the present invention is illustrated in the accompanying figures, wherein;

[0023] Figure 1 - A schematic view of the test system.

[0024] Figure 2 - A schematic view of the first card.

[0025] Figure 3 - A schematic view of the second card.

[0026] The components in the figures are individually numbered, and the correspondences of these numbers are given below.

[0027] 1. Test system

[0028] 2. Body

[0029] 3. Control computer

[0030] 4. Power source

[0031] 5. Component

[0032] 501 . First controller

[0033] 502. Second controller

[0034] 503. Environmental specimen

[0035] 504. Power specimen

[0036] 505. Storage specimen

[0037] 506. Communication specimen

[0038] 6. First card

[0039] 7. Second card

[0040] 8. Ground station

[0041] The test system (1 ) comprises a body (2) which is a spacecraft located under space conditions, at least one control computer (3) located on the body (2) and providing for the control of the body (2), at least one power source (4) located on the body (2), connected to the control computer (3), and generating power, and a plurality of components (5) located on the body (2) to be tested under space conditions. The test system (1 ), which is the subject of the invention, comprises a first card (6) located on the body (2) and having a component (5) located on it; and a second card (7) located on the body (2), carrying components (5) of a different type from the components (5) on the first card

[0042] (6). The first card (6) is in communication with the second card (7), is connected to the power source (4) independently from the second card (7), and has a communication interface with the control computer (3) independently from the second card (7), thereby enabling the communication between the components (5) on the first card (6) and the components (5) on the second card (7) to be tested under space conditions.

[0043] A body (2) is provided, located within space conditions, either in the space environment or on Earth. The body (2) is a spacecraft. A control computer (3) is located on the body (2) and ensures the functionality of the body (2). A power source (4) is located on the body (2) and generates the power required for the body (2) to be functional. A component (5) is located on the body (2). The component (5) is located on the body (2) to be tested under space conditions and consists of non-space-qualified materials.

[0044] A first card (6) is located on the body (2). A component (5) is located on the first card (6). A second card (7) is located on the body (2). A component (5) is located on the second card (7). The first card (6) and the second card (7) provide redundancy for each other. The components (5) located on the first card (6) and the second card (7) have different structures, different part numbers, and are manufactured in accordance with different parameters. The first card (6) and the second card (7) are connected to the power source (4) and the control computer (3) independently of each other. In the event of an error on the first card (6) or the second card

[0045] (7), the power to one of the cards is shut down, thereby preventing any threat to the other card and / or to the body (2).

[0046] In one embodiment of the invention, the test system (1 ) comprises; a first controller (501 ), which is a component (5), located on the first card (6) and / or the second card (7) and which controls the operation of the components (5); and a second controller (502), which is a component (5), located on the first card (6) and the second card (7), which mutually checks its operation with the first controller (501 ), which has a different part number so as to be of a different structure from the first controller (501 ), and which enables the programming of the first controller (501 ). Thereby, the first controller (501 ) and the second controller (502), having different part numbers and different structures, are tested under space conditions. In the event of an error in the first controller (501 ), so that the first controller (501 ) can maintain its functionality, it is reprogrammed and, if necessary, reset via the second controller (502). In one embodiment of the invention, the test system (1 ) comprises a first card (6) and a second card (7) which communicate with the control computer (3) and are connected to the power source (4) independently of, but simultaneously with, the electronic components on the body (2), thereby enabling the components (5) to be tested under space conditions in isolation from said electronic components. Thereby, in the event of an error on the first card (6) and / or the second card (7), it is ensured that the first card (6) and / or the second card (7) is isolated from the other electronic components within the body (2) while the rest of the system continues to operate simultaneously.

[0047] In one embodiment of the invention, the test system (1 ) comprises at least one environmental specimen (503), which is a component (5), located on the first card (6) and the second card (7), and which enables the adjustment of the frequency and amplitude of the signals required for the operation of the first controller (501 ). Thereby, the signal amplitude and frequency values predetermined by the manufacturer for each component (5) are provided.

[0048] In one embodiment of the invention, the test system (1 ) comprises at least one power specimen (504), which is a component (5), located on the first card (6) and the second card (7), and which enables the adjustment to suitable voltage and current levels for the operation of the components (5) by controlling the current and voltage transmitted from the source (4) to the first card (6) and / or the second card (7). Thereby, the voltage and current levels predetermined by the manufacturer for each component (5) are provided.

[0049] In one embodiment of the invention, the test system (1 ) comprises at least one storage specimen (505), which is a component (5), located on the first card (6) and the second card (7), and which stores the data transmitted from the control computer (3) to the first card (6) and / or the second card (7) and / or the data belonging to the components (5). Thereby, the operation of storage specimens with different part numbers and structures from one another is enabled to be tested under space conditions.

[0050] In one embodiment of the invention, the test system (1 ) comprises at least one communication specimen (506), which is a component (5), located on the first card (6) and the second card (7), and which enables communication between the control computer (3) and the first card (6) and / or the second card (7), as well as communication between the components (5) themselves. Thereby, the testing of communication interfaces with different part numbers and structures is enabled under space conditions via the communication specimen (506). In one embodiment of the invention, the test system (1 ) comprises a first controller (501 ) and a second controller (502) that, in the event of an error in the operation of a component (5), cut off the power transmitted from the source (4) to said component (5), thereby preventing the faulty component (5) from damaging other components (5). Thereby, if an error occurs in the components (5) while they are being tested under space conditions, it is ensured that the electronic components within the body (2) continue to perform their functions, and the components (5) are tested under space conditions while being isolated from the other electronic components.

[0051] In one embodiment of the invention, the test system (1 ) comprises a communication specimen (506) which allows the components (5) located on the first card (6) and the second card (7) to communicate with each other via an Ethernet interface, thereby allowing communication with a Gigabit Ethernet interface to be tested under space conditions. Thereby, the testing of communication via the Ethernet interface under space conditions is provided by means of the communication specimen (506).

[0052] In one embodiment of the invention, the test system (1 ) comprises a first controller (501 ) with an integrated FPGA and SoC, and a second controller (502) which is an FPGA; wherein in the event of an error in the first controller (501 ) located on the first card (6) or the second card (7), the second controller (502) allows the first controller (501 ) to be reprogrammed by the user. Thereby, the operation of the FPGA is enabled in cases predetermined by the manufacturer and / or user, and the operation of the FPGA and SoC integrated circuit is enabled in cases predetermined by the manufacturer and / or user, and the operation of the first controller (501 ) and the second controller (502), which have different structures from each other, is tested under space conditions.

[0053] In one embodiment of the invention, the test system (1 ) comprises at least one ground station (8) that enables the operation of the components (5) to be controlled by the user and, in the event of an error in the first controller (501 ), allows the user to reprogram the first controller (501 ) via the control computer (3). Thereby, while the components (5) are being tested under space conditions, the user analyzes and controls the test.

[0054] In one embodiment of the invention, the test system (1 ) comprises a component (5) which is a Commercial Off-the-Shelf and / or Industrial and Automotive Grade material, and whose operation is tested under space conditions in accordance with parameters predetermined by the manufacturer. Thereby, the testing of non-space-qualified components (5) inside a satellite in space is enabled. In one embodiment of the invention, the test system (1 ) comprises a first controller (501 ) that enables the testing of whether the components (5) operate under space conditions in accordance with parameters predetermined by the manufacturer, the detection of non- operational components (5), and the cutting off of the power transmitted from the source (4) to the detected components (5) to prevent them from damaging other components (5). Thereby, the operational statuses of the components (5) under space conditions are stored by means of the storage specimen (505), and a performance history for space conditions is provided for the non-space-qualified components (5).

Claims

CLAIMS1. A test system (1 ) comprising; a body (2) which is a spacecraft and is located under space conditions; at least one control computer (3) located on the body (2) and providing for the control of the body (2); at least one power source (4) located on the body (2), connected to the control computer (3), and generating power; a plurality of components (5) located on the body (2) to be tested under space conditions; characterized in that it comprises a first card (6) located on the body (2) and having at least one component (5) located thereon; and a second card (7) located on the body (2) and carrying components (5) of a type different from the components (5) on the first card (6); wherein the first card (6) is in communication with the second card (7), is connected to the power source (4) independently of the second card (7), and has a communication interface with the control computer (3) independently of the second card (7), thereby enabling communication between the components (5) on the first card (6) and the components (5) on the second card (7) to be tested under space conditions.

2. The test system (1 ) according to claim 1 , characterized in that it comprises a first controller (501 ) which is a component (5), located on the first card (6) and / or the second card (7), and which controls the operation of the components (5); and a second controller (502) which is a component (5), located on the first card (6) and the second card (7), which mutually checks its operation with the first controller (501 ), which has a different part number so as to be of a different structure from the first controller (501 ), and which enables the programming of the first controller (501 ).

3. The test system (1 ) according to claim 1 or claim 2, characterized in that the first card (6) and the second card (7) communicate with the control computer (3) and are connected to the power source (4) independently of, but simultaneously with, the electronic components on the body (2), thereby enabling the components (5) to be tested under space conditions in isolation from said electronic components.

4. The test system (1 ) according to claim 2 or claim 3, characterized in that it comprises at least one environmental specimen (503) which is a component (5), is located on the first card (6) and the second card (7), and enables the adjustment of the frequency and amplitude of the signals required for the operation of the first controller (501 ).

5. The test system (1 ) according to any one of the preceding claims, characterized in that it comprises at least one power specimen (504) which is a component (5), islocated on the first card (6) and the second card (7), and which, by controlling the current and voltage transmitted from the source (4) to the first card (6) and / or the second card (7), enables adjustment to suitable voltage and current levels for the operation of the components (5).

6. The test system (1 ) according to any one of the preceding claims, characterized in that it comprises at least one storage specimen (505) which is a component (5), is located on the first card (6) and the second card (7), and which stores the data transmitted from the control computer (3) to the first card (6) and / or the second card (7) and / or the data belonging to the components (5).

7. The test system (1 ) according to any one of the preceding claims, characterized in that it comprises at least one communication specimen (506) which is a component (5), is located on the first card (6) and the second card (7), and which enables communication between the control computer (3) and the first card (6) and / or the second card (7), and communication between the components (5) themselves.

8. The test system (1 ) according to any one of claims 2 to 7, characterized in that the first controller (501 ) and the second controller (502), in the event of an error in the operation of a component (5), are configured to cut off the power transmitted from the source (4) to said component (5), thereby preventing the faulty component (5) from damaging other components (5).

9. The test system (1 ) according to claim 7 or claim 8, characterized in that the communication specimen (506) allows the components (5) located on the first card (6) and the second card (7) to communicate with each other via an Ethernet interface, thereby allowing communication via a Gigabit Ethernet interface to be tested under space conditions.

10. The test system (1 ) according to any one of claims 2 to 9, characterized in that the first controller (501 ) has an integrated FPGA and SoC, and the second controller (502) is an FPGA; and wherein, in the event of an error in the first controller (501 ) located on the first card (6) or the second card (7), the second controller (502) allows the first controller (501 ) to be reprogrammed by the user.

11. The test system (1 ) according to any one of claims 2 to 10, characterized in that it comprises at least one ground station (8) that enables the operation of the components (5) to be controlled by a user and, in the event of an error in the first controller (501 ), allows the user to reprogram the first controller (501 ) via the control computer (3).

12. The test system (1 ) according to any one of the preceding claims, characterized in that the component (5) is a Commercial Off-the-Shelf and / or Industrial and Automotive Grade material, and wherein the operation of said component (5) is tested under space conditions in accordance with parameters predetermined by the manufacturer.

13. The test system (1 ) according to any one of claims 2 to 12, characterized in that the first controller (501 ) is configured to test whether the components (5) operate under space conditions in accordance with parameters predetermined by the manufacturer; detect non-operational components (5); and enable the power transmitted from the source (4) to the detected components (5) to be cut off in order to prevent said detected components (5) from damaging other components (5).

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