Measurement apparatus and production device
By switching the illumination between the first and second backlight components in the measurement device, the problem of insufficient illumination in traditional defect detection and measurement is solved, enabling high-contrast image acquisition and multi-faceted dimensional measurement, thereby improving the accuracy and efficiency of measurement.
Patent Information
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- BEIJING SMARTMORE INTELLIGENT TECH CO LTD
- Filing Date
- 2025-04-24
- Publication Date
- 2026-07-02
AI Technical Summary
In traditional defect detection and measurement methods, insufficient lighting leads to inconvenience in image processing.
The measurement device includes a measurement module, a transfer structure, and a lighting component. The first and second backlight components provide backlighting effects, and the workpiece posture is switched by rotating the load beam to achieve full illumination and measurement of the workpiece in all directions.
It improves image contrast, facilitates measurement and analysis, and enables simultaneous dimensional measurement of multiple surfaces of a workpiece, thereby improving the accuracy and efficiency of measurement.
Smart Images
Figure CN2025090872_02072026_PF_FP_ABST
Abstract
Description
Measuring devices and production equipment
[0001] This application claims priority to Chinese Patent Application No. 202411954941.9, filed with the China National Intellectual Property Administration on December 27, 2024, entitled "Measuring Device and Production Equipment", the entire contents of which are incorporated herein by reference. Technical Field
[0002] This application relates to the field of measurement technology, and in particular to a measuring device and production equipment. Background Technology
[0003] With technological advancements, the precision requirements for the components of various devices and equipment are increasing to achieve specific and complex functions. Therefore, it is common practice to inspect products for defects and measure their dimensions before they leave the factory to eliminate defective items. Traditional methods for defect detection and measurement are similar, using a camera and light source to acquire images of the product under inspection, and then analyzing these images to determine if the product meets requirements. For traditional defect detection and measurement methods, the lighting method is a crucial factor affecting the quality of the images acquired by the camera.
[0004] However, current defect detection and measurement methods suffer from problems such as inconvenient image processing due to insufficient lighting. Summary of the Invention
[0005] Therefore, it is necessary to provide a measuring device and production equipment to address the problem of inconvenience in product testing and measurement caused by insufficient lighting.
[0006] This application provides a measurement device, comprising a measurement module, a drive platform, a transfer structure, and an illumination assembly. The measurement module includes a camera; the drive platform has a measurement area corresponding to the detection range of the camera; the transfer structure is movably disposed on the drive platform and can move to the measurement area. The transfer structure includes a support, a beam mounted on the support, and a fixture disposed on the beam, the fixture being used to pick up a workpiece; the illumination assembly includes a first backlight assembly and a second backlight assembly. The first backlight assembly is disposed on the beam and faces the fixture, and the second backlight assembly is located in the measurement area at least when the transfer structure is in the measurement area, and is along the optical axis of the camera, the second backlight assembly being located at a position away from the camera relative to the beam; wherein the beam is rotatably connected to the support, the beam can rotate to a position where the first backlight assembly faces the camera, and the beam can rotate to a position where the fixture and the workpiece are suspended between the camera and the second backlight assembly.
[0007] In one embodiment, the first backlight assembly and the fixture are located on the same side of the load beam.
[0008] In one embodiment, the orthographic projection of the fixture onto the first backlight assembly is located within the orthographic projection of the workpiece picked up by the fixture onto the first backlight assembly.
[0009] In one embodiment, the fixture is configured as a light-transmitting element or a partially light-transmitting element, wherein the illumination light provided by the first backlight assembly can illuminate the workpiece through the fixture.
[0010] In one embodiment, a plurality of the fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly are arranged in an elongated shape along the reference direction, so that the provided illumination can cover the area where the fixtures are located.
[0011] In one embodiment, a plurality of the fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly includes a plurality of illumination portions arranged at intervals along the reference direction, the plurality of illumination portions corresponding to the plurality of fixtures to provide illumination.
[0012] In one embodiment, the transfer structure further includes a driving member. The load beam is hollow and rotates relative to the bracket about a first axis. The first backlight assembly has multiple through holes. Multiple driving members are disposed inside the load beam and pass through the through holes to partially extend out of the load beam. The multiple driving members are respectively connected to multiple fixtures to drive the multiple fixtures to rotate synchronously and independently about a second axis. The second axis intersects the first axis.
[0013] In one embodiment, the first axis is perpendicular to the second axis.
[0014] In one embodiment, the first backlight assembly is configured as a plate, and the second axis is perpendicular to the first backlight assembly.
[0015] In one embodiment, the drive platform is connected to the bracket to drive the transfer structure to the measurement area, and the second backlight assembly is disposed in the measurement area and faces the camera.
[0016] In one embodiment, the drive platform includes a drive component and a panel covering the drive component, a portion of the bracket extends into the space between the drive component and the panel and is connected to the drive component, and the second backlight assembly is fixed to the side of the panel facing the camera.
[0017] In one embodiment, the second backlight assembly is located on the bracket at a position relative to the support beam away from the camera and facing the side where the camera is located.
[0018] In one embodiment, the bracket includes columns and a connecting plate, with two columns spaced apart and the connecting plate connected between the two columns. The connecting plate is connected to the drive platform, and both ends of the load beam are rotatably connected to the two columns respectively. The load beam is closer to the side where the camera is located relative to the connecting plate. The second backlight assembly is disposed on the bracket in the area between the load beam and the connecting plate, and extends laterally outward to the space sandwiched between the load beam and the connecting plate.
[0019] In one embodiment, the measuring device further includes a base and a frame mounted on the base, the driving platform and the lighting assembly are both mounted on the base, the measuring module further includes a light source, the light source provides illumination for the camera to take pictures, and the camera and the light source are both mounted on the frame.
[0020] This application also provides a production apparatus, which includes the measuring device described above.
[0021] In the aforementioned measurement device, both the first backlight assembly and the fixture are mounted on the support beam, with the first backlight assembly facing the fixture. When the support beam rotates relative to the bracket to a position where the first backlight assembly faces the camera, the first backlight assembly faces both the fixture and the camera. Therefore, the illumination provided by the first backlight assembly can highlight the outer contour of the workpiece picked up by the fixture, thus providing a backlighting effect. This allows the camera to acquire a high-contrast image, facilitating measurement analysis. Furthermore, the second backlight assembly is located in the measurement area. In the direction pointed to by the camera's optical axis, the second backlight assembly is positioned away from the camera relative to the support beam. Therefore, the support beam can easily rotate to a position where the fixture and workpiece are suspended between the camera and the second backlight assembly. At this time, the illumination from the second backlight assembly can also highlight the outer contour of the workpiece picked up by the fixture, providing a backlighting effect for measurement analysis. It is easy to understand that the support beam switches between the position illuminated by the first backlight assembly and the position illuminated by the second backlight assembly by rotation. As the support beam rotates, the posture of the workpiece located on the support beam also changes accordingly. In other words, the workpiece's posture when illuminated by the first backlight component is different from that when illuminated by the second backlight component. The workpiece's posture can be switched by rotating the load beam, so that the first backlight component and the second backlight component can provide backlight illumination respectively, which can fully measure the dimensions of the workpiece in all directions. Attached Figure Description
[0022] Figure 1a is a side view of an exemplary detection device provided in an embodiment of this application.
[0023] Figure 1b is a side view of the rotating structure in the exemplary detection device shown in Figure 1a after it has been rotated by a certain angle.
[0024] Figure 2 is a side view of a measuring device provided in an embodiment of this application.
[0025] Figure 3 is a schematic diagram showing the distribution of the transfer structure, lighting components and measurement module in the measurement device shown in Figure 2 when the load beam is in the first detection position.
[0026] Figure 4 is a schematic diagram showing the distribution of the transfer structure, lighting components and measurement module in the measurement device shown in Figure 2 when the load beam is in the second detection position.
[0027] Figure 5 is an isometric view of the transfer structure and drive platform in the measurement device shown in Figure 2.
[0028] Figure 6 is an isometric view of the transfer structure in the measuring device shown in Figure 2.
[0029] Figure 7 is a front view of the transfer structure provided in the second aspect of an embodiment of this application.
[0030] Figure 8 is a top view of a first backlight assembly provided in a third aspect of an embodiment of this application.
[0031] Reference numerals: 10, Measuring device; 100, Measuring module; 110, Camera; 120, Light source; 200, Transfer structure; 210, Support; 211, Column; 212, Connecting plate; 220, Load beam; 230, Fixture; 240, Driving component; 300, Illumination assembly; 301, Illumination section; 310, First backlight assembly; 311, Perforation; 320, Second backlight assembly; 400, Driving platform; 401, Measuring area; 410, Driving component; 420, Panel; 500, Frame; 20, Workpiece; 30, Carrier; 31, Support structure; 32, Rotating structure; 33, Pick-up structure; 40, Product; 41, Top surface; 42, Side surface; U, First rotating axis; O1, First axis; O2, Second axis; L, Optical axis; L0, Illumination ray; K, Reference direction; S, Distribution direction. Detailed Implementation
[0032] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0033] In the description of this application, it should be understood that if terms such as "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential" appear, these terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0034] Furthermore, where the terms "first" and "second" appear, these terms are for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined with "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, where the term "multiple" appears, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0035] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.
[0036] In this application, unless otherwise expressly specified and limited, the use of descriptions such as "above" or "below" the second feature indicates that the first and second features are in direct contact or indirect contact via an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. Similarly, "below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0037] It should be noted that if an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. If an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. If so, the terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application are for illustrative purposes only and do not represent the only possible implementation.
[0038] Traditional detection devices typically include a base, a detection module, and a carrier 30, with both the carrier 30 and the detection module housed on the base. The detection module includes a camera and a light source, and is usually supported by the base, giving the camera and light source a higher position relative to the carrier 30 for easier detection. Referring to Figures 1a and 1b, the carrier 30 typically includes a support structure 31, a rotating structure 32, and a pickup structure 33. The support structure 31 is connected to the base, and the rotating structure 32 is located on the support structure 31 and can rotate relative to the support structure 31 around a first axis U. The pickup structure 33 is used to pick up the product 40 and is located on the top surface of the rotating structure 32. Thus, as shown in Figure 1a, when the pickup structure 33 rotates with the rotating structure 32 until the top surface 41 of the product 40 faces the detection module, the detection module can detect the top surface 41 of the product 40. Similarly, as shown in Figure 1b, when the picking structure 33 rotates with the rotating structure 32 until the side 42 of the product 40 faces the detection module, the detection module can detect the side 42 of the product 40. However, as mentioned above, since the light source 120 and the camera are mounted together and are located at a high position relative to the carrier 30, the lighting is often insufficient when the detection device needs to measure the size of the product 40, making it difficult to effectively distinguish the edge contour of the product 40 from the background, resulting in greater difficulty in processing the acquired images.
[0039] To address the aforementioned problems, the inventors of this application provide a measurement device comprising a measurement module, a transfer structure, and an illumination assembly. The measurement module is used to inspect and measure a workpiece picked up by the transfer structure. The transfer structure includes a support, a beam, and a fixture. The beam is rotatably mounted on the support, and the fixture is mounted on the beam and used to pick up the workpiece. The illumination assembly includes a first backlight assembly and a second backlight assembly. The first backlight assembly is mounted on the beam and faces the fixture. Therefore, when the beam rotates to face the measurement module from the side where the fixture is located, the top surface of the workpiece also faces the measurement module, and the first backlight assembly provides a backlight effect to highlight the outer contour of the workpiece. The second backlight assembly can be aligned with the measurement module. When it is necessary to inspect the side of the workpiece, the beam can be driven to rotate relative to the support, allowing the workpiece to extend from the side into the space clamped by the second backlight assembly and the measurement module, and to be suspended in mid-air. Thus, the second backlight assembly provides a backlight effect when the side of the workpiece is being inspected, highlighting the outer contour of the workpiece in another direction. Therefore, the measuring device provided in this application can simultaneously measure the dimensions of at least two surfaces of a workpiece. The measuring modules provided in various embodiments of this application will be described in detail below with reference to the accompanying drawings and specific implementation details.
[0040] Referring to Figure 2, which is a side view of a measuring device provided in an embodiment of this application, the measuring device 10 provided in an embodiment of this application is capable of detecting defects and measuring workpiece 20. The measuring device 10 is described using measurement as an example in each embodiment. It should be understood that the measuring device 10 also performs defect detection on workpiece 20 in the same manner, and therefore will not be described in detail here.
[0041] Referring to Figures 2 to 4, in one embodiment, the measuring device 10 includes a measuring module 100, a transfer structure 200, an illumination assembly 300, and a drive platform 400. The transfer structure 200 is used to pick up the workpiece 20. The measuring module 100 includes a camera 110, which is used to perform appearance inspection and measurement on the workpiece 20 located within its detection range. The drive platform 400 is provided with a measuring area 401 corresponding to the detection range of the camera 110. The transfer structure 200 is movably disposed on the drive platform 400 and can move to the measuring area 401. When the transfer structure 200 is within the measuring area 401, the workpiece 20 picked up by the transfer structure 200 can be measured. The transfer structure 200 includes a support 210, a beam 220, and a fixture 230. The beam 220 is mounted on the support 210, and the fixture 230 is disposed on the beam 220. The fixture 230 is used to pick up the workpiece 20. The lighting assembly 300 includes a first backlight assembly 310 and a second backlight assembly 320. The first backlight assembly 310 is disposed on the support beam 220 and faces the fixture 230. The second backlight assembly 320 is located in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401. Furthermore, along the optical axis L of the camera 110, the second backlight assembly 320 is located at a position relative to the support beam 220 and away from the camera 110. The support beam 220 is rotatably connected to the bracket 210, and the support beam 220 can rotate to a position where the first backlight assembly 310 faces the camera 110, and also to a position where the fixture 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320.
[0042] In the aforementioned measurement device 10, both the first backlight assembly 310 and the fixture 230 are mounted on the support beam 220, with the first backlight assembly 310 facing the fixture 230. As shown in Figure 3, when the support beam 220 rotates relative to the bracket 210 to a position where the first backlight assembly 310 faces the camera 110, the first backlight assembly 310 faces both the fixture 230 and the camera 110. Therefore, the illumination provided by the first backlight assembly 310 can highlight the outer contour of the workpiece 20 picked up by the fixture 230, i.e., provide a backlighting effect, enabling the camera 110 to acquire a high-contrast image, facilitating measurement and analysis. As shown in Figure 4, further, the second backlight assembly 320 is located in the measurement area 401. Moreover, in the direction pointed to by the optical axis L of the camera 110, the second backlight assembly 320 is located at a position away from the camera 110 relative to the support beam 220. Therefore, the support beam 220 can be easily rotated to a position where the fixture 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320. At this time, the illumination from the second backlight assembly 320 can also highlight the outer contour of the workpiece 20 picked up by the fixture 230, thus providing a backlighting effect for measurement and analysis. It is easy to understand that the support beam 220 switches between the position illuminated by the first backlight assembly 310 and the position illuminated by the second backlight assembly 320 by rotating. As the support beam 220 rotates, the posture of the workpiece 20 located on the support beam 220 also changes. That is, the posture of the workpiece 20 when illuminated by the first backlight assembly 310 is different from the posture of the workpiece 20 when illuminated by the second backlight assembly 320. By rotating the support beam 220, the posture of the workpiece 20 can be switched, allowing the first backlight assembly 310 and the second backlight assembly 320 to provide backlighting respectively, enabling sufficient measurement of the dimensions of the workpiece 20 in all directions.
[0043] As shown in Figure 4, the workpiece 20 is suspended between the camera 110 and the second backlight assembly 320. The suspension means that the illumination light L0 provided by the second backlight assembly 320 is not blocked by any other structure except the workpiece 20, thus highlighting the outer contour of the workpiece 20.
[0044] Regarding the aforementioned second backlight assembly 320, it is located in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401, as shown in Figure 2. In a first aspect, the second backlight assembly 320 can be directly disposed in the measurement area 401 and face the camera 110, so that when the carrier beam 220 rotates to the point where the workpiece 20 is located between the second backlight assembly 320 and the camera 110, the second backlight assembly 320 can provide a backlight effect, facilitating measurement. As shown in Figure 7, in a second aspect, the second backlight assembly 320 can also be disposed on the bracket 210 at a position relative to the carrier beam 220 and away from the camera 110, so that the second backlight assembly 320 can move with the transfer structure 200 as a whole to the measurement area 401. At this time, the carrier beam 220 can also rotate to the position where the workpiece 20 is located between the second backlight assembly 320 and the camera 110. In the following embodiments, two different arrangements of the second backlight assembly 320 will be described in conjunction with the specific components of the transfer structure 200.
[0045] It is understood that the first backlight assembly 310 is closer to the support beam 220 relative to the fixture 230 in order to provide backlight illumination. The aforementioned orientation of the first backlight assembly 310 toward the measurement module 100 refers to the light-emitting side of the first backlight assembly 310 facing the camera 110. For ease of explanation in various embodiments, the position of the support beam 220 relative to the bracket 210 when the first backlight assembly 310 faces the camera 110 is recorded as the first detection position. The position of the support beam 220 relative to the bracket 210 when the fixture 230 and the workpiece 20 are suspended between the second backlight assembly 320 and the camera 110 is recorded as the second detection position. The angle through which the support beam 220 rotates from the first detection position to the second detection position relative to the bracket 210 is recorded as the switching angle.
[0046] As shown in Figure 3, the load beam 220 is in the first detection position. As shown in Figure 4, the load beam 220 is in the second detection position. When the load beam 220 is in the first detection position, in the image acquired by the camera 110, the area of the first backlight assembly 310 not obscured by the workpiece 20 is relatively bright, while the area of the first backlight assembly 310 obscured by the workpiece 20 is relatively dark. The comparison between the bright and dark areas facilitates the determination of the outline of the workpiece 20, making it easier to analyze and obtain the dimensions of the workpiece 20. The same principle applies when the load beam 220 is in the second detection position, so it will not be described further.
[0047] Please refer to Figures 2 to 4. Further, taking the first backlight assembly 310 and fixture 230 located on the top surface of the support beam 220 as an example: As shown in Figure 3, when the top surface of the support beam 220 faces the camera 110 (i.e., when the support beam 220 is in the first detection position), the upper surface of the workpiece 20 picked up by the fixture 230 also faces the camera 110. Under the backlighting effect of the first backlight assembly 310, the camera 110 can easily obtain the relevant dimensions (e.g., length and width) of the upper surface of the workpiece 20. As shown in Figure 4, when the support beam 220 rotates relative to the bracket 210 through the aforementioned switching angle, causing the top surface of the support beam 220 to face to the side, one side circumferential surface of the workpiece 20 picked up by the fixture 230 will face the camera 110. Under the backlighting effect of the second backlight assembly 320, the camera 110 can easily obtain the relevant dimensions (e.g., thickness, width, or length) of the side circumferential surface of the workpiece 20. For a workpiece 20 that is roughly plate-shaped, its dimensions in each direction can be determined after being inspected at the first and second inspection positions. Of course, the measurement module 100 is not limited to measuring the overall dimensions of the workpiece 20. For example, in some embodiments, the dimensions of local structures on the workpiece 20 can also be measured, which can be set according to actual needs.
[0048] In one embodiment, the specific value of the switching angle can be between 0 and 180°, and can be 15°, 30°, 45°, 60°, 75°, 90°, 120°, and 150°, etc. The specific value of the switching angle can be designed specifically according to the shape of the workpiece 20 and the specific shape of the part to be inspected. For example, the switching angle can be configured to 90° for measuring a workpiece 20 whose upper surface is perpendicular to its side peripheral surface.
[0049] Referring to Figures 3 and 4, in one embodiment, the direction from the fixture 230 to the support beam 220 is denoted as the distribution direction S. As shown in Figure 3, when the support beam 220 is in the first detection position, the distribution direction S can be parallel to the optical axis L of the camera 110. As shown in Figure 4, when the support beam 220 is in the second detection position, the distribution direction S can be perpendicular to the optical axis L of the camera 110. That is, when the support beam 220 is in the second detection position, the fixture 230 and the support beam 220 are approximately laterally distributed relative to the approximately vertical optical axis L of the camera 110. Thus, the bracket 210 and the support beam 220 can support the fixture 230 and the workpiece 20 picked up by the fixture 230 stably between the second backlight assembly 320 and the camera 110 without blocking the illumination light L0 of the second backlight assembly 320 directed towards the fixture 230 and the workpiece 20, thereby ensuring that the fixture 230 and the workpiece 20 picked up by the fixture 230 are in a suspended state as described in each embodiment.
[0050] Referring to Figures 3 and 4, in one embodiment, the first backlight assembly 310 and the fixture 230 are located on the same side of the support beam 220. Therefore, the first backlight assembly 310 can provide more direct and sufficient illumination to the fixture 230 and the workpiece 20 picked up by the fixture 230. Of course, when the workpiece 20 has a large size, the first backlight assembly 310 can also be arranged on the circumferential side of the support beam 220 to provide sufficient illumination to the workpiece 20.
[0051] Referring to Figure 3, in one embodiment, the orthographic projection of the fixture 230 onto the first backlight assembly 310 lies within the orthographic projection of the workpiece 20 picked up by the fixture 230 onto the first backlight assembly 310. In other words, the fixture 230 can be constructed to be sufficiently small relative to the workpiece 20 to reduce the probability that the fixture 230 obstructs the illumination light of the first backlight assembly 310 and is misjudged as the outer contour of the workpiece 20, thereby improving the accuracy and effectiveness of the measurement. The orthographic projection mentioned in this embodiment can be the orthographic projection along the optical axis L direction of the camera 110 when the beam 220 is in the first detection position.
[0052] Referring to Figure 3, in one embodiment, the fixture 230 is configured as a light-transmitting element or a partially light-transmitting element, meaning that the illumination light provided by the first backlight assembly 310 can pass through the fixture 230 to illuminate the workpiece 20. This reduces the probability that the fixture 230 obstructs the illumination light from the first backlight assembly 310 and is misjudged as the outer contour of the workpiece 20, thereby improving measurement accuracy and effectiveness. In short, the portion of the fixture 230 that poses a risk of obstructing the workpiece can be configured to be light-transmitting.
[0053] Referring to Figures 5 and 6, in one embodiment, the support beam 220 rotates relative to the bracket 210 about a first axis O1, and the fixture 230 can rotate relative to the support beam 220 about a second axis O2. The second axis O2 intersects the first axis O1. In this embodiment, the fixture 230 is also rotatable relative to the support beam 220, which enriches the posture of the fixture 230 within the measurement area 401, allowing different sides of the workpiece 20 to rotate to a position facing the camera 110, thereby improving the comprehensiveness and efficiency of the measurement.
[0054] Furthermore, the transfer structure 200 also includes a drive member 240 and a driver (not shown in the figure, the same below). The carrier beam 220 is hollow. The first backlight assembly 310 has multiple through holes 311, and multiple drive members 240 are disposed in the carrier beam 220 and pass through the through holes 311 to partially extend out of the carrier beam 220. The multiple drive members 240 are respectively connected to multiple fixtures 230 to drive the multiple fixtures 230 to rotate around the second axis O2. Referring to Figure 4, taking the carrier beam 220 as being in the second detection position and the workpiece 20 being approximately plate-shaped as an example, as mentioned above, if one side of the workpiece 20 faces the camera 110 at this time, then rotating the fixtures 230 can make different side surfaces of the workpiece 20 face the camera 110 respectively. Thus, on the one hand, it is possible to measure the specific structural features on different side surfaces of the workpiece 20. On the other hand, it can also measure different outer contour dimensions of the workpiece 20. For example, when the long side circumferential surface faces the camera 110, the length of the workpiece 20 can be measured, and when the wide side circumferential surface faces the camera 110, the width of the workpiece 20 can be measured.
[0055] Furthermore, the actuator may be located inside the load beam 220 and connected to the load beam 220 and the bracket 210 to drive the load beam 220 to rotate relative to the bracket 210.
[0056] In one embodiment, multiple drive units 240 can drive multiple fixtures 230 to rotate synchronously around a second axis O2 for batch measurement.
[0057] In another embodiment, the multiple drive units 240 can also drive multiple fixtures 230 to rotate independently around the second axis O2. Thus, the posture of the workpiece 20 picked up by any fixture 230 can be specifically adjusted to improve the consistency of the workpiece 20's posture. That is, when the posture of one or more workpieces 20 differs from that of the others, driving that workpiece 20 to rotate by a certain angle will make the postures of all workpieces 20 more consistent, facilitating batch measurement. It should be noted that differing workpiece 20 postures not only prevent the area to be measured from being correctly displayed in the measurement module, but also, for measurement purposes, poor posture consistency means that at least some workpieces 20 are not in the expected posture during measurement. Therefore, the measurement results for these parts of the workpiece 20 cannot reflect the actual physical quantity of the workpiece 20, resulting in low reliability of the measurement results.
[0058] Referring to Figures 5 and 6, in one embodiment, the drive member 240 includes an output shaft that passes through a through hole 311 to connect with the fixture 230. The first axis O1 may be perpendicular to the second axis O2.
[0059] Referring to Figure 6, in one embodiment, the first backlight assembly 310 is configured as a plate, and the second axis O2 may be perpendicular to the first backlight assembly 310.
[0060] Referring to Figure 2, in one embodiment, the measuring device 10 further includes a base (not shown, the same below) and a frame 500. The frame 500 is mounted on the base, and the drive platform 400 and the lighting assembly 300 are both mounted on the base. The measuring module 100 is mounted on the frame 500. Furthermore, the camera 110 is mounted on the frame 500, so that the camera 110 has a higher position relative to the transfer structure 200 and the lighting assembly 300, which facilitates measurement.
[0061] Referring to Figure 2 and, in conjunction with Figure 5, in one embodiment, a drive platform 400 is disposed on a base and connected to a support 210 to drive the transfer structure 200 to move relative to the base. That is, the transfer structure 200 can be movable under the driving action of the drive platform 400, for example, the drive platform 400 can drive the transfer structure 200 to move to the measurement area 401, and to other positions outside the measurement area 401 (e.g., loading position, unloading position, etc.). As mentioned above, the second backlight assembly 320 can be disposed in the measurement area 401 and face the camera 110. With this configuration, when the second backlight assembly 320 is needed to provide illumination for measurement, the support beam 220 can be driven to rotate laterally, suspending the fixture 230 and the workpiece 20 between the camera 110 and the second backlight assembly 320.
[0062] As shown in Figures 6 and 7, the carrier beam 220 can be spaced apart from the drive platform 400, with the space configured to accommodate the second backlight assembly 320. This allows the carrier beam 220 to pass unobstructed and remain positioned on the drive platform 400 where the second backlight assembly 320 is located. For example, when the carrier beam 220 is in the first detection position, the first backlight assembly 310 needs to face and align with the camera 110. In other words, referring to Figure 2, the carrier beam 220, the first backlight assembly 310, the fixture 230, and the workpiece 20 will be located between the camera 110 and the second backlight assembly 320. This spaced arrangement to accommodate the second backlight assembly 320 reduces the probability of collision or interference when the transfer structure 200 moves to the location of the second backlight assembly 320.
[0063] Please refer to Figures 2 to 4. In one embodiment, when the load beam 220 switches from the first detection position to the second detection position, the support 210 can also be driven to move laterally a certain distance simultaneously, so that the workpiece 20 can be more accurately positioned between the camera 110 and the second backlight assembly 320. Of course, in another embodiment, the second backlight assembly 320 can be configured to have a sufficiently large size, in which case the transfer structure 200 does not need to be moved.
[0064] Referring to Figure 5, in one embodiment, the drive platform 400 includes a drive component 410 and a panel 420, with the panel 420 covering the drive component 410. A portion of the bracket 210 extends inward between the drive component 410 and the panel 420, and is connected to the drive component 410. The second backlight assembly 320 is fixed to the side of the panel 420 facing the camera 110. The drive component 410 can be configured with a drive method such as gear drive, belt drive, chain drive, pneumatic drive, or hydraulic drive, which can be selected according to actual needs, and this application does not limit it. It is understood that, regardless of the motion drive method, it is foreseeable that the drive component 410 will have a portion of moving components. Therefore, this application configures the drive platform 400 to also include the panel 420 covering the drive component 410, which can provide a mounting base for the second backlight assembly 320, facilitating the stable mounting of the second backlight assembly 320 on the drive platform 400.
[0065] As shown in Figure 7, in one embodiment, the second backlight assembly 320 may also be disposed on the support beam 220 of the bracket 210 away from the camera 110 and facing the side where the camera 110 is located. Thus, when the support beam 220 is rotated to the second detection position, the fixture 230 and the workpiece 20 can be suspended between the second backlight assembly 320 and the camera 110.
[0066] Furthermore, since the second backlight assembly 320 disposed on the bracket 210 can move synchronously with the transfer structure 200 into the measurement area 401, that is, the second backlight assembly 320 can provide illumination simultaneously with the transfer structure 200 within the measurement area 401. In other words, for the second backlight assembly 320 provided in each embodiment, when it is fixed within the measurement area 401, it obviously always remains within the measurement area 401. When the second backlight assembly 320 is fixed to the bracket 210, the second backlight assembly 320 can move together with the transfer structure 200 into the measurement area 401. Therefore, the second backlight assembly 320 is located in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401.
[0067] Referring to Figures 6 and 7, the support 210 further includes columns 211 and a connecting plate 212. The two columns 211 are spaced apart, and the connecting plate 212 is connected between the two columns 211. The connecting plate 212 can be used to connect to the drive platform 400. The two ends of the load beam 220 are rotatably connected to the two columns 211 respectively. Moreover, the load beam 220 is closer to the side where the camera 110 is located relative to the connecting plate 212. The second backlight assembly 320 can be disposed on the support 210 in the area between the load beam 220 and the connecting plate 212, so as to provide backlight for the measurement of the workpiece even when the entire structure 200 moves with it.
[0068] As shown in Figure 7, the second backlight assembly 320 can be further disposed on the side of the connecting plate 212 facing the support beam 220, that is, the side of the connecting plate 212 facing the camera 110. Alternatively, the second backlight assembly 320 can be connected to the area of the column 211 located between the support beam 220 and the connecting plate 212, so that the second backlight assembly 320 is further away from the camera 110 relative to the support beam 220.
[0069] It should be noted that the placement of the second backlight assembly 320 on the connecting plate 212 does not affect the transmission connection between the connecting plate 212 and the drive platform 400. For example, the connecting plate 212 can be positioned on the side facing away from the camera 110 and connected to the drive platform 400. Alternatively, taking the drive platform 400 as an example of using a lead screw and nut transmission method, the connecting plate 212 can have a threaded transmission hole (not shown in the figure, the same below) through it. The lead screw of the drive platform 400 passes through the threaded transmission hole and engages with the threaded transmission within the hole to drive the transfer structure 200. Since the components included in the drive platform 400 are located on the side facing away from the camera 110 relative to the second backlight assembly 320, they will not block the illumination light of the second backlight assembly 320.
[0070] In one embodiment, when the second backlight assembly 320 is disposed on the bracket 210, the second backlight assembly 320 can be configured to have a sufficiently large illumination size such that when the carrier beam 220 rotates to the second detection position, the orthographic projection of the workpiece 20 along the optical axis L of the camera 110 can be located on the second backlight assembly 320. In other words, the second backlight assembly 320 can be configured to have a sufficient size such that when the carrier beam 220 rotates to the second detection position, the workpiece 20 can be located between the second backlight assembly 320 and the camera 110. For example, the second backlight assembly 320 can be configured to extend laterally outward beyond the space clamped by the carrier beam 220 and the bracket 210.
[0071] In one embodiment, the second backlight assembly 320 may also be configured as a plate. Furthermore, the second backlight assembly 320 and the first backlight assembly 310 may be arranged in parallel. The plate-shaped first backlight assembly 310 and second backlight assembly 320 facilitate providing a wide-range illumination effect to cover the area of the fixture 230 and the workpiece 20 picked up by the fixture 230.
[0072] Referring to Figure 5, in one embodiment, multiple fixtures 230 are arranged at intervals along a reference direction K. The first backlight assembly 310 and / or the second backlight assembly 320 are arranged in an elongated shape along the reference direction K, so that the provided illumination can cover the area where the fixtures 230 are located.
[0073] Referring to Figure 8, in another embodiment, the first backlight assembly 310 and / or the second backlight assembly 320 include a plurality of illumination portions 301 arranged at intervals along a reference direction K. The plurality of illumination portions 301 correspond to a plurality of fixtures 230 to provide illumination to the workpiece 20 picked up by the corresponding fixture 230. The number of illumination portions 301 may be the same as the number of fixtures 230, in which case the illumination portions 301 can provide illumination to the fixtures 230 one-to-one.
[0074] Please refer to Figure 8. The correspondence between the lighting unit 301 and the fixture 230 is not limited to a one-to-one relationship. In conjunction with the foregoing, the output shaft of the drive member 240 passes through the through hole 311 of the first backlight assembly 310 and connects to the fixture 230. In this case, the through hole 311 can be formed by two adjacent lighting units 301. That is, one lighting unit 301 can correspond to the adjacent half-areas of two adjacent workpieces 20. Specifically, the lighting unit 301 located between the two fixtures 230 is used to provide backlight illumination to the right half of the workpiece 20 located on the left and the left half of the workpiece 20 located on the right. Of course, the lighting unit 301 can also have other correspondences with the fixture 230, which will not be elaborated here, and can be designed specifically according to actual needs. It is understood that the same principle applies when the second backlight assembly 320 includes the aforementioned lighting unit 301, and when both the first backlight assembly 310 and the second backlight assembly 320 include the aforementioned lighting unit 301, so it will not be elaborated further.
[0075] It should be emphasized that although the illumination effect in the measurement device 10 is illustrated using the first backlight assembly 310 and the second backlight assembly 320 as examples in the various embodiments of this application, the measurement device 10 provided in the various embodiments of this application is not limited to providing illumination effects solely through the first backlight assembly 310 and the second backlight assembly 320. Please refer again to FIG2. In one embodiment, the measurement module 100 further includes a light source 120. The light source 120 and the camera 110 are both mounted on the frame 500. The light source 120 provides illumination for the camera 110 to improve the image clarity of the camera 110.
[0076] In one embodiment, the camera 110 and the light source 120 are referred to as a measuring component, and the measuring module 100 may include multiple measuring components. For example, the number of measuring components is the same as the number of fixtures 230 in the transfer structure 200, so as to measure the workpiece 20 picked up by each fixture 230 in a one-to-one correspondence. The transfer structure 200 and the measuring module 100 that measures the workpiece 20 picked up by the transfer structure 200 are referred to as the same measuring group. The measuring device 10 may include multiple measuring groups, that is, the measuring device 10 includes multiple transfer structures 200 and multiple measuring modules 100. For example, as shown in FIG2, the measuring device 10 includes two measuring groups, and the measuring modules 100 included in the two measuring groups may be disposed on opposite sides of the frame 500. It should be noted that, in another embodiment, multiple transfer structures 200 may also share a measurement module 100, and the multiple transfer structures 200 may alternately move into the measurement area 401 of the measurement module 100 under the drive of the drive platform 400.
[0077] One embodiment of this application also provides a production apparatus that includes a measuring device 10 as described in various embodiments. Since the production apparatus includes all the features of the measuring device 10, it also includes all the technical effects of the measuring device 10 as described above.
[0078] Furthermore, the production equipment may also include a feeding device and a discharging device. The feeding device is used to transport the workpiece 20 to the measuring device 10, and the discharging device is used to receive the workpiece 20 that has been measured by the measuring device 10 and to classify the workpiece 20 according to the measurement results.
[0079] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0080] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A metrology device, characterized in that, The measuring device includes: Measurement module, including camera; The driving platform is equipped with a measurement area corresponding to the detection range of the camera; A transfer structure is movably mounted on the drive platform. The transfer structure can move to the measurement area. The transfer structure includes a support, a load beam mounted on the support, and a fixture mounted on the load beam. The fixture is used to pick up the workpiece. The lighting assembly includes a first backlight assembly and a second backlight assembly. The first backlight assembly is disposed on the carrier beam and faces the fixture. The second backlight assembly is located in the measurement area at least when the transfer structure is in the measurement area and is along the optical axis of the camera. The second backlight assembly is located at a position away from the camera relative to the carrier beam. The carrier beam is rotatably connected to the bracket, and the carrier beam can be rotated to a position where the first backlight assembly faces the camera, and the carrier beam can be rotated to a position where the fixture and the workpiece are suspended between the camera and the second backlight assembly.
2. The apparatus of claim 1, wherein The first backlight assembly and the fixture are located on the same side of the support beam.
3. The apparatus of claim 2, wherein The orthographic projection of the fixture onto the first backlight assembly is located within the orthographic projection of the workpiece picked up by the fixture onto the first backlight assembly.
4. The apparatus of claim 1, wherein, The fixture is configured as a light-transmitting element or a partially light-transmitting element, and the illumination light provided by the first backlight assembly can illuminate the workpiece through the fixture.
5. The apparatus of claim 1, wherein, Multiple fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly extend in an elongated shape along the reference direction, so that the provided illumination can cover the area where the fixtures are located.
6. The apparatus of claim 1, wherein The plurality of fixtures are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly includes a plurality of illumination portions arranged at intervals along the reference direction, the plurality of illumination portions corresponding to the plurality of fixtures to provide illumination.
7. The apparatus of claim 1, wherein The transfer structure further includes a driving component. The load beam is hollow and rotates relative to the bracket around a first axis. The first backlight assembly has multiple through holes. Multiple driving components are disposed inside the load beam and pass through the through holes to partially extend out of the load beam. The multiple driving components are respectively connected to multiple fixtures to drive the multiple fixtures to rotate synchronously and independently around a second axis. The second axis intersects with the first axis.
8. The measuring device according to claim 7, characterized in that, The first axis is perpendicular to the second axis; and / or The first backlight assembly is constructed in a plate shape, and the second axis is perpendicular to the first backlight assembly.
9. The measuring device according to claim 1, characterized in that, The drive platform is connected to the bracket to drive the transfer structure to the measurement area, and the second backlight assembly is located in the measurement area and faces the camera.
10. The measuring device according to claim 9, characterized in that, The drive platform includes a drive component and a panel covering the drive component. A portion of the bracket extends into the space between the drive component and the panel and is connected to the drive component. The second backlight assembly is fixed to the side of the panel facing the camera.
11. The measuring device according to claim 1, characterized in that, The second backlight assembly is located on the bracket at a position relative to the support beam away from the camera, and facing the side where the camera is located.
12. The measuring device according to claim 11, characterized in that, The support includes columns and connecting plates. The two columns are spaced apart, and the connecting plate is connected between the two columns. The connecting plate is connected to the drive platform. The two ends of the load beam are rotatably connected to the two columns respectively, and the load beam is closer to the side where the camera is located relative to the connecting plate. The second backlight assembly is located on the bracket in the area between the support beam and the connecting plate, and extends laterally outward into the space between the support beam and the connecting plate.
13. The measuring device according to claim 1, characterized in that, It also includes a base and a frame mounted on the base, the drive platform and the lighting components are both mounted on the base, the measurement module also includes a light source, the light source provides illumination for the camera to take pictures, and the camera and the light source are both mounted on the frame.
14. A production equipment, characterized in that, The production equipment includes the measuring device as described in any one of claims 1 to 13.