Perovskite test device and battery production system
Patent Information
- Application Number
- PCT/CN2026/074219
- Authority / Receiving Office
- WO · WO
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2025-02-18
- Filing Date
- 2026-01-22
- Publication Date
- 2026-08-27
Smart Images

Figure CN2026074219_27082026_PF_FP_ABST
Abstract
Description
Perovskite testing equipment and battery production system Cross-references
[0001] This application incorporates Chinese Patent Application No. 202520254381.X, filed on February 18, 2025, entitled "Perovskite Testing Device and Battery Production System," which is incorporated herein by reference in its entirety. Technical Field
[0002] This application relates to the field of perovskite testing technology, and more specifically, to a perovskite testing device and a battery production system. Background Technology
[0003] With the popularization and promotion of new energy vehicles, their charging and discharging performance and range have increasingly attracted people's attention and importance. As the power source for new energy vehicles, batteries are widely used.
[0004] Solar cells typically include a perovskite active layer, which is usually formed by annealing a perovskite thin film after most of the solvent has evaporated from a wet perovskite film, allowing for initial crystallization. Most existing perovskite testing devices can only perform one type of spectral measurement. Switching to other devices is required for other types of spectral measurements, resulting in poor applicability and an inability to simultaneously meet diverse spectral testing needs. Summary of the Invention
[0005] In view of this, this application discloses a perovskite testing device and a battery production system.
[0006] A perovskite testing device includes a housing, a stage, a first testing mechanism, and a second testing mechanism. The stage is disposed within the housing and used to hold the sample. The first testing mechanism emits a first test light and acquires the fluorescence spectrum of the first test light passing through the sample. The second testing mechanism emits a second test light and acquires the absorption and scattering spectrum of the second test light passing through the sample. Both the first and second testing mechanisms are detachably mounted within the housing and are spaced apart. This perovskite testing device, with its detachable first and second testing mechanisms, can simultaneously perform fluorescence and absorption / scattering spectral testing on the sample. The same device can integrate at least two different spectral tests, allowing it to meet various spectral testing needs and simplifying the overall structural design while optimizing space utilization.
[0007] In some embodiments, the first testing mechanism includes a first spectrometer, a first optical fiber, and a first transmitter electrically connected together. The first transmitter emits first test light, and the first spectrometer acquires the fluorescence spectrum of the first test light passing through the sample. The first transmitter is detachably housed within a housing, the first spectrometer is located outside the housing, and the first optical fiber passes through the housing and connects the first transmitter and the first spectrometer. This detachable housing of the first transmitter within the housing simplifies the overall design of the testing device and optimizes its space utilization.
[0008] In some embodiments, the first testing mechanism further includes an optical component detachably disposed at the emitting end of the first transmitter and used to adjust the optical path and spot of the first test light. Thus, the optical path and spot of the first test light can be adjusted via the optical component according to actual needs, enhancing the practicality and applicability of the first testing mechanism.
[0009] In some embodiments, the optical components include a first filter, an aperture stop, a second filter, and a condenser lens. The first filter, aperture stop, second filter, and condenser lens are arranged sequentially along the emission path of the first test light. The first filter filters out excess long-wavelength light from the first test light; the aperture stop adjusts the spatial uniformity of the first test light; the second filter filters out excess short-wavelength light from the first test light; and the condenser lens focuses the first test light. This allows for adjustment of the optical path and spot size of the first test light, facilitating successful fluorescence spectroscopy testing of the sample. The structural design is reasonable and simple.
[0010] In some embodiments, the second filter is a semi-transparent mirror, and the second filter is tilted. The first test light is reflected by the second filter and passes through the sample. The first test light passing through the sample is received by the first spectrometer through the first optical fiber. In this way, the first test light, after being reflected by the second filter to the sample, is reflected through the second filter and the condenser lens, and then incident on the first optical fiber and the first spectrometer to obtain the fluorescence spectrum of the first test light passing through the sample. This also facilitates a simplified design of the overall structure of the testing device.
[0011] In some embodiments, the perovskite testing apparatus further includes a first support, which is detachably mounted within the housing and capable of translation and / or lifting. Optical components are detachably mounted on the first support. Thus, when fluorescence spectroscopy testing of the sample is required, the optical components can be mounted on the first support, and the position of the optical components can be changed by translating or lifting the first support, thereby altering the spot size of the first test light, enhancing the practicality and applicability of the first testing mechanism.
[0012] In some embodiments, the perovskite testing apparatus further includes a second support, which is detachably mounted inside the housing and can be flipped. Optical components are detachably mounted on the second support. Thus, when fluorescence spectroscopy testing of the sample is required, the optical components can be mounted on the second support, and by flipping the second support, the angle of the optical components can be changed, thereby altering the illumination angle of the first test light, enhancing the practicality and applicability of the first testing mechanism.
[0013] In some embodiments, the first testing mechanism further includes a halogen lamp connected to a first optical fiber. This allows the first testing mechanism to have a wide spectral testing coverage, enhancing its practicality and applicability.
[0014] In some embodiments, the second testing mechanism includes an electrically connected second spectrometer, a second optical fiber, and a second transmitter. The second transmitter emits a second test light, and the second spectrometer acquires the absorption and scattering spectrum of the second test light passing through the sample. The second transmitter is detachably housed within a housing, the second spectrometer is located outside the housing, and the second optical fiber passes through the housing and connects the second transmitter and the second spectrometer. This detachable housing of the second transmitter within the housing allows the testing device to meet different spectral testing requirements and facilitates a simplified overall structural design, optimizing the space utilization of the testing device.
[0015] In some embodiments, the perovskite testing apparatus further includes a third support, which is detachably mounted inside the housing and can be flipped. The second emitter can be detachably mounted on the third support. Thus, when absorption and scattering spectroscopy testing of the sample is required, the second emitter can be mounted on the third support, and by flipping the third support, the angle of the second emitter can be changed, thereby changing the illumination angle of the second test light, enhancing the practicality and applicability of the second testing mechanism.
[0016] In some embodiments, the perovskite testing apparatus further includes a vacuum flash evaporation chamber, which is detachably disposed within the housing, and the stage is removably disposed within the vacuum flash evaporation chamber. Thus, after the perovskite thin film is formed through vacuum flash evaporation, the sample on the stage does not need to be moved, allowing for subsequent fluorescence spectroscopy and absorption scattering spectroscopy measurements. This makes the operation convenient, time-saving, and improves operational efficiency.
[0017] In some embodiments, the top side of the vacuum flash evaporation chamber is provided with a first window and a second window. The first window is used for the passage of a first test light, and the second window is used for the passage of a second test light. In this way, the first test light can pass through the first window and illuminate the sample inside the vacuum flash evaporation chamber, and the second test light can pass through the second window and illuminate the sample inside the vacuum flash evaporation chamber, thus avoiding the penetration of light into the vacuum flash evaporation chamber.
[0018] In some embodiments, the perovskite testing apparatus further includes a spin coater, which is detachably housed within the enclosure, and a stage is removably mounted on the spin coater. This allows for efficient application of the perovskite solution using a spin coater, significantly improving operational efficiency.
[0019] A battery production system includes the aforementioned perovskite testing device. In this battery production system, both the first and second testing mechanisms are detachably mounted within the housing, enabling simultaneous fluorescence spectroscopy and absorption scattering spectroscopy testing of samples. The same testing device can integrate at least two different spectral tests, allowing it to meet various spectral testing requirements and simplifying the overall structural design of the testing device, thus optimizing its space utilization. Attached Figure Description
[0020] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the published drawings without creative effort.
[0021] Figure 1 is a schematic diagram of the combination of perovskite testing devices in some embodiments of this application.
[0022] Figure 2 is a schematic diagram of the optical path of the perovskite testing device in the spin coating annealing stage in some embodiments of this application.
[0023] Figure 3 is a schematic diagram of the optical path of the perovskite testing device in the vacuum flash stage in some embodiments of this application.
[0024] Figure label:
[0025] 100. Housing; 200. Storage platform; 300. First testing mechanism; 310. First spectrometer; 320. First optical fiber; 330. First transmitter; 400. Second testing mechanism; 410. Second spectrometer; 420. Second optical fiber; 430. Second transmitter; 500. Optical components; 510. First filter; 520. Aperture; 530. Second filter; 540. Condensing lens; 610. First support; 620. Second support; 630. Third support; 700. Halogen lamp; 800. Vacuum flash evaporation chamber; 801. First window; 802. Second window; 900. Spin coater. Detailed Implementation
[0026] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0027] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.
[0028] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0029] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.
[0030] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.
[0031] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.
[0032] With the popularization and promotion of new energy vehicles, their charging and discharging performance and range have increasingly attracted people's attention and importance. As the power source for new energy vehicles, batteries are widely used.
[0033] Solar cells typically include a perovskite active layer, which is usually formed by annealing a perovskite thin film after most of the solvent has evaporated from a wet perovskite film, allowing for initial crystallization. Most existing perovskite testing devices can only perform one type of spectral measurement. Switching to other devices is required for other types of spectral measurements, resulting in poor applicability and an inability to simultaneously meet diverse spectral testing needs.
[0034] Based on the above considerations and after in-depth research, this application designs a perovskite testing device. Both the first and second testing mechanisms can be detachably installed in the housing, which can simultaneously perform fluorescence spectroscopy and absorption scattering spectroscopy tests on the sample. The same testing device can integrate at least two different spectral tests, so that the testing device can meet different spectral testing needs, and facilitate the simplification of the overall structure design of the testing device and optimize the space utilization of the testing device.
[0035] Please refer to Figure 1. In one embodiment, the perovskite testing device includes a housing 100, a stage 200, a first testing mechanism 300, and a second testing mechanism 400. The stage 200 is disposed inside the housing 100 and is used to place the sample. The first testing mechanism 300 is used to emit a first testing light and acquire the fluorescence spectrum of the first testing light passing through the sample. The second testing mechanism 400 is used to emit a second testing light and acquire the absorption and scattering spectrum of the second testing light passing through the sample. The first testing mechanism 300 and the second testing mechanism 400 are detachably installed in the housing 100 and are spaced apart from each other.
[0036] It should be noted that the first testing mechanism 300 is capable of emitting a first testing light and, after illuminating the sample with the first testing light, obtaining the fluorescence spectrum of the first testing light passing through the sample; the second testing mechanism 400 is capable of emitting a second testing light and, after illuminating the sample with the second testing light, obtaining the absorption and scattering spectrum of the second testing light passing through the sample.
[0037] In the embodiments of this application, the housing 100 is a component with accommodating space for placing components such as the platform 200, the first testing mechanism 300, and the second testing mechanism 400. The housing 100 can have various structural forms, such as a cuboid, a cylinder, or other shapes. The specific structural form of the housing 100 is not limited here.
[0038] In the embodiments of this application, the stage 200 is a component for placing samples. The stage 200 can have various structural forms, such as a plate-like structure or a block-like structure, and the outer contour of the stage 200 can be circular, square, or other shapes.
[0039] In the embodiments of this application, the first testing mechanism 300 is a component used to perform fluorescence spectroscopy testing on the sample. The first testing mechanism 300 can have various structural forms; for example, the first testing mechanism 300 includes a fluorescence spectrometer, which is used to perform fluorescence spectroscopy testing on the sample.
[0040] In the embodiments of this application, the second testing mechanism 400 is a component used to perform absorption and scattering spectroscopy testing on the sample. The second testing mechanism 400 can have various structural forms; for example, the second testing mechanism 400 includes an absorption and scattering spectrometer, which is used to perform absorption and scattering spectroscopy testing on the sample.
[0041] The perovskite testing device described above has a first testing mechanism 300 and a second testing mechanism 400 that can be detachably installed in the housing 100. It can simultaneously perform fluorescence spectroscopy and absorption scattering spectroscopy tests on the sample. The same testing device can integrate at least two different spectral tests, so that the testing device can meet different spectral testing requirements and facilitate the simplification of the overall structure design of the testing device and optimize the space utilization of the testing device.
[0042] According to some embodiments of this application, please refer to FIG1. The first testing mechanism 300 includes a first spectrometer 310, a first optical fiber 320 and a first transmitter 330 electrically connected. The first transmitter 330 is used to emit a first test light, and the first spectrometer 310 is used to acquire the fluorescence spectrum of the first test light passing through the sample. The first transmitter 330 is detachably disposed inside the housing 100, the first spectrometer 310 is disposed outside the housing 100, and the first optical fiber 320 passes through the housing 100 and connects the first transmitter 330 and the first spectrometer 310.
[0043] It is understood that the first transmitter 330 is used to emit the first test light, and after the first test light illuminates the sample, it is incident on the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample.
[0044] In the embodiments of this application, the housing 100 is provided with a first clearance hole, the first transmitter 330 is located inside the housing 100, the first spectrometer 310 is located outside the housing 100, one end of the first optical fiber 320 is located inside the housing 100, and the other end of the first optical fiber 320 passes through the first clearance hole and is connected to the first spectrometer 310. The first clearance hole can be a round hole, a square hole, or a hole of other shapes.
[0045] In the embodiments of this application, the first spectrometer 310 is a fluorescence spectrometer, which analyzes the composition and properties of the sample by measuring the fluorescence intensity and wavelength distribution emitted by the sample.
[0046] With the above configuration, the first transmitter 330 is detachably housed inside the housing 100, enabling the testing device to meet different spectral testing requirements and simplifying the overall structural design of the testing device, thereby optimizing the space utilization of the testing device.
[0047] According to some embodiments of this application, please refer to FIG1. The first testing mechanism 300 further includes an optical component 500, which is detachably disposed at the emission end of the first transmitter 330 and is used to adjust the optical path and spot of the first test light.
[0048] It should be noted that the optical component 500 is located at the emitting end of the first transmitter 330. The first test light emitted by the first transmitter 330 is incident on the optical component 500, reflected by the optical component 500 to the sample, and then incident on the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample.
[0049] In the embodiments of this application, the optical component 500 is a component used to adjust the optical path and light spot of the first test light. The optical component 500 can be a combination of various types of lenses to meet different optical path and light spot requirements. For example, the optical component 500 includes lenses such as semi-transparent lenses and focusing lenses to adjust the optical path and light spot size.
[0050] In the embodiments of this application, the optical component 500 is detachably disposed at the emission end of the first transmitter 330. The optical component 500 and the first transmitter 330 can be detachably connected in a variety of ways, such as screwing, snapping or plugging the optical component 500 and the emission end of the first transmitter 330.
[0051] In the embodiments of this application, the number of optical components 500 is not limited to one, that is, the number of optical components 500 can be at least two. When the number of optical components 500 is at least two, each optical component 500 can be arranged side by side in the same direction or in other arrangements.
[0052] With the above settings, the optical path and spot of the first test light can be adjusted by the optical component 500 according to actual needs, thereby enhancing the practicality and applicability of the first test mechanism 300.
[0053] According to some embodiments of this application, please refer to FIG1. The optical component 500 includes a first filter 510, an aperture 520, a second filter 530, and a condenser lens 540. The first filter 510, aperture 520, second filter 530, and condenser lens 540 are arranged sequentially according to the emission path of the first test light. The first filter 510 is used to filter out excess long-wavelength light in the first test light. The aperture 520 is used to adjust the spatial uniformity of the first test light. The second filter 530 is used to filter out excess short-wavelength light in the first test light. The condenser lens 540 is used to focus the first test light.
[0054] Understandably, the first test light emitted by the first transmitter 330 is sequentially incident on the first filter 510 and the aperture 520, then reflected by the second filter 530 to the sample, and after being reflected through the second filter 530 and the condenser lens 540, it is incident on the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample.
[0055] In the embodiments of this application, the first filter 510 is a component used to filter out excess long-wavelength light in the first test light. In some embodiments, the first filter 510 is a long-pass filter, the main material of which is optical glass or optical plastic. The surface of the long-pass filter is coated with a special interference film. These interference films produce different phase differences for light of different wavelengths. Light waves within a specific wavelength range interfere with each other in the film layer, reinforcing each other, and thus pass smoothly through the filter; while light waves of other wavelengths interfere with each other in the film layer, canceling each other out and being blocked by the filter. Depending on its materials and manufacturing process, long-pass filters can also be divided into various types, such as glass-based long-pass filters, plastic-based long-pass filters, hard-film long-pass filters, and soft-film long-pass filters.
[0056] In the embodiments of this application, the aperture 520 is a component used to adjust the spatial uniformity of the first test light. By properly setting the aperture 520, the amount and direction of light entering the optical system can be controlled, thereby improving the imaging quality. There are many types of apertures 520, the most common being field apertures 520, aperture diaphragms 520, vignetting apertures 520, and stray light removal apertures 520.
[0057] In embodiments of this application, the second filter 530 is a component used to filter out excess short-wavelength light in the first test light. In some embodiments, the second filter 530 is a short-pass filter, whose main material is optical glass or optical plastic, and is mainly used to block the passage of interfering wavelength light above a certain specific wavelength band, while allowing light below that specific wavelength band to pass through.
[0058] In the embodiments of this application, the condenser lens 540 is a component used to focus the first test light. When the light passes through the condenser lens 540, the light will be refracted because the refractive index of the lens material is different from that of the surrounding environment, so that the originally dispersed light can be concentrated.
[0059] With the above settings, the optical path and spot of the first test light can be adjusted, and the fluorescence spectrum test of the sample can be carried out smoothly. The structural design is reasonable and simple.
[0060] According to some embodiments of this application, please refer to FIG1, the second filter 530 is a semi-transparent lens and the second filter 530 is tilted; the first test light is reflected by the second filter 530 and passes through the sample, and the first test light passing through the sample is received by the first spectrometer 310 through the first optical fiber 320.
[0061] In the embodiments of this application, the second filter 530 is tilted, and the tilt angle of the second filter 530 is such that the first test light is reflected by the second filter 530 and passes through the sample. In some embodiments, the tilt angle of the second filter 530 can be a specific value such as 30 degrees, 60 degrees or 90 degrees.
[0062] In the embodiments of this application, the second filter 530 is a semi-transparent lens. A semi-transparent lens is a filter that can divide the intensity of an incident light beam into two parts, one part of which is transmitted and the other part is reflected. The intensity of transmission and reflection of the semi-transparent lens can be made as needed, such as 50% transmission and 50% reflection, 60% transmission and 40% reflection, 70% transmission and 30% reflection, etc.
[0063] With the above settings, the first test light can be reflected to the sample through the second filter 530, and then reflected through the second filter 530 and the condenser lens 540 before being incident on the first optical fiber 320 and the first spectrometer 310 to obtain the fluorescence spectrum of the first test light passing through the sample. This also facilitates the simplification of the overall structure design of the testing device.
[0064] According to some embodiments of this application, please refer to FIG1. The perovskite testing device further includes a first support 610, which is detachably disposed within the housing 100 and is capable of translation and / or lifting. The optical component 500 is detachably disposed on the first support 610.
[0065] It should be noted that when fluorescence spectroscopy testing of the sample is required, the optical component 500 can be placed on the first support 610, and the position of the optical component 500 can be changed by translating or raising the first support 610, thereby changing the spot size of the first test light; when fluorescence spectroscopy testing of the sample is not required, the optical component 500 can be removed from the first support 610.
[0066] In the embodiments of this application, the optical component 500 can be detachably mounted on the first bracket 610. The optical component 500 and the first bracket 610 can be detachably connected in a variety of ways, such as screwing, snapping, or plugging the optical component 500 and the first bracket 610.
[0067] In the embodiments of this application, the first bracket 610 is detachably disposed within the housing 100 and is capable of translation and / or lifting. The first bracket 610 can be detachably disposed within the housing 100 in various ways, such as screwing, snapping, or inserting the first bracket 610 into the housing 100. The first bracket 610 is capable of translation in the horizontal direction and / or lifting in the vertical direction.
[0068] With the above settings, when fluorescence spectroscopy testing of samples is required, the optical component 500 can be placed on the first support 610, and the position of the optical component 500 can be changed by translating or raising the first support 610, thereby changing the spot size of the first test light, which enhances the practicality and applicability of the first testing mechanism 300.
[0069] According to some embodiments of this application, please refer to FIG1. The perovskite testing device further includes a second support 620, which is detachably disposed within the housing 100 and can be flipped. The optical component 500 can be detachably disposed on the second support 620.
[0070] It should be noted that when fluorescence spectroscopy testing of the sample is required, the optical component 500 can be placed on the second support 620, and the angle of the optical component 500 can be changed by flipping the second support 620, thereby changing the illumination angle of the first test light; when fluorescence spectroscopy testing of the sample is not required, the optical component 500 can be removed from the second support 620.
[0071] In the embodiments of this application, the optical component 500 can be detachably mounted on the second bracket 620. The optical component 500 and the second bracket 620 can be detachably connected in a variety of ways, such as screwing, snapping, or plugging the optical component 500 and the second bracket 620.
[0072] In the embodiments of this application, the second bracket 620 is detachably disposed within the housing 100 and is capable of translation and / or lifting. The second bracket 620 can be detachably disposed within the housing 100 in various ways, such as screwing, snapping, or inserting the second bracket 620 into the housing 100. The second bracket 620 can be flipped in the horizontal direction and / or in the vertical direction.
[0073] With the above settings, when fluorescence spectroscopy testing of samples is required, the optical component 500 can be placed on the second support 620, and the angle of the optical component 500 can be changed by flipping the second support 620, thereby changing the illumination angle of the first test light, which enhances the practicality and applicability of the first testing mechanism 300.
[0074] According to some embodiments of this application, referring to FIG1, the first testing mechanism 300 further includes a halogen lamp 700, which is connected to the first optical fiber 320.
[0075] In the embodiments of this application, the halogen lamp 700 is used for absorption and scattering spectroscopy testing. As one of the light sources for spectral measurement, the halogen lamp 700 has high brightness and a wide spectral coverage, which can meet the needs of some measurement occasions that require high brightness, such as very bright environments or spectral measurements with a large scanning range.
[0076] The above settings enable the first testing unit 300 to have a wide spectral testing coverage, thereby enhancing its practicality and applicability.
[0077] According to some embodiments of this application, referring to FIG1, the second testing mechanism 400 includes a second spectrometer 410, a second optical fiber 420 and a second transmitter 430 electrically connected. The second transmitter 430 is used to emit a second test light, and the second spectrometer 410 is used to acquire the absorption and scattering spectrum of the second test light passing through the sample. The second transmitter 430 is detachably disposed inside the housing 100, the second spectrometer 410 is disposed outside the housing 100, and the second optical fiber 420 passes through the housing 100 and connects the second transmitter 430 and the second spectrometer 410.
[0078] Understandably, the second transmitter 430 is used to emit a second test light, and after the second test light illuminates the sample, it is incident on the second optical fiber 420 and the second spectrometer 410 to obtain the absorption and scattering spectrum of the second test light passing through the sample.
[0079] In the embodiments of this application, the housing 100 is provided with a second clearance hole, the second transmitter 430 is located inside the housing 100, the second spectrometer 410 is located outside the housing 100, one end of the second optical fiber 420 is located inside the housing 100, and the other end of the second optical fiber 420 passes through the second clearance hole and is connected to the second spectrometer 410. The second clearance hole can be a round hole, a square hole, or a hole of other shapes.
[0080] In the embodiments of this application, the second spectrometer 410 is an absorption scattering spectrometer, which measures and analyzes the differences in the absorption, scattering, and emission properties of light by the sample.
[0081] With the above configuration, both the first transmitter 330 and the second transmitter 430 can be detachably installed inside the housing 100, enabling the testing device to meet different spectral testing requirements and simplifying the overall structural design of the testing device, thereby optimizing the space utilization of the testing device.
[0082] According to some embodiments of this application, please refer to FIG1. The perovskite testing device further includes a third support 630, which is detachably disposed within the housing 100 and can be flipped. The second transmitter 430 can be detachably disposed on the third support 630.
[0083] It should be noted that when it is necessary to perform absorption and scattering spectroscopy tests on the sample, the second emitter 430 can be placed on the third support 630, and the angle of the second emitter 430 can be changed by flipping the third support 630, thereby changing the illumination angle of the second test light; when it is not necessary to perform absorption and scattering tests on the sample, the second emitter 430 can be removed from the third support 630.
[0084] In the embodiments of this application, the second transmitter 430 can be detachably mounted on the third bracket 630. The second transmitter 430 and the third bracket 630 can be detachably connected in a variety of ways, such as screwing, snapping, or plugging the second transmitter 430 and the third bracket 630 together.
[0085] In the embodiments of this application, the third bracket 630 is detachably disposed within the housing 100 and is capable of translation and / or lifting. The third bracket 630 can be detachably disposed within the housing 100 in various ways, such as screwing, snapping, or inserting into the housing 100. The third bracket 630 can be flipped in the horizontal direction and / or in the vertical direction.
[0086] With the above setup, when it is necessary to perform absorption and scattering spectroscopy tests on the sample, the second emitter 430 can be placed on the third support 630, and the angle of the second emitter 430 can be changed by flipping the third support 630, thereby changing the illumination angle of the second test light, which enhances the practicality and applicability of the second test mechanism 400.
[0087] According to some embodiments of this application, please refer to FIG1. The perovskite testing device further includes a vacuum flash chamber 800, which is detachably disposed within the housing 100, and the stage 200 is removably disposed within the vacuum flash chamber 800.
[0088] It should be noted that the sample is a perovskite thin film. Before performing various spectral tests, the stage 200 is placed inside the vacuum flash evaporation chamber 800. The sample coated with the perovskite solution is placed on the stage 200, and a perovskite thin film is formed after vacuum flash evaporation. The sample on the stage 200 does not need to be moved. After assembling the first testing mechanism 300 and the second testing mechanism 400, fluorescence spectroscopy and absorption scattering spectroscopy tests are performed on the sample respectively. When fluorescence spectroscopy and absorption scattering spectroscopy tests are not required, the vacuum flash evaporation chamber 800 and the stage 200 can be removed.
[0089] In the embodiments of this application, the vacuum flash evaporation chamber 800 is detachably disposed inside the housing 100. The vacuum flash evaporation chamber 800 and the housing 100 can be detachably connected in a variety of ways, such as screwing, snapping or plugging the vacuum flash evaporation chamber 800 and the housing 100.
[0090] In the embodiments of this application, the vacuum flash evaporation chamber 800 is a component having an inner cavity and used to place components such as the platform 200. The vacuum flash evaporation chamber 800 can have various structural forms, such as a cuboid, a cylinder, or other shapes. The specific structural form of the vacuum flash evaporation chamber 800 is not limited here.
[0091] With the above settings, after the perovskite thin film is formed by vacuum flash evaporation, the sample on the stage 200 does not need to be moved, and subsequent fluorescence spectroscopy and absorption scattering spectroscopy tests can continue. The operation is convenient and time-saving, which helps to improve the efficiency of operation.
[0092] According to some embodiments of this application, please refer to FIG1. The top side of the vacuum flash evaporation chamber 800 is provided with a first window 801 and a second window 802. The first window 801 is used for the first test light to pass through, and the second window 802 is used for the second test light to pass through.
[0093] It is understandable that the first test light can pass through the first window 801 and irradiate the sample inside the vacuum flash chamber 800, and the second test light can pass through the second window 802 and irradiate the sample inside the vacuum flash chamber 800.
[0094] In the embodiments of this application, a transparent glass is provided at the first window 801 so that the first window 801 can be closed without obstructing the passage of light. The shape of the first window 801 can be circular, square or other shapes, and no specific limitation is made here.
[0095] In the embodiments of this application, a transparent glass is provided at the second window 802 so that the second window 802 can be closed without obstructing the passage of light. The shape of the second window 802 can be circular, square, or other shapes, and no specific limitation is made here.
[0096] With the above settings, the first test light can pass through the first window 801 and irradiate the sample inside the vacuum flash evaporation chamber 800, and the second test light can pass through the second window 802 and irradiate the sample inside the vacuum flash evaporation chamber 800, thus avoiding the light from passing through the vacuum flash evaporation chamber 800.
[0097] According to some embodiments of this application, please refer to FIG1. The perovskite testing apparatus also includes a spin coater 900, which is detachably disposed within the housing 100, and the stage 200 is removably disposed on the spin coater 900.
[0098] It should be noted that the sample is a perovskite thin film. Before performing various spectral tests, the stage 200 is placed inside the vacuum flash evaporation chamber 800, and a perovskite solution is coated using a spin coater 900. The sample coated with the perovskite solution is then placed on the stage 200, and a perovskite thin film is formed after vacuum flash evaporation.
[0099] In the embodiments of this application, the stage 200 can be removably mounted on the spin coater 900. The stage 200 and the spin coater 900 can be removably mounted on the spin coater 900 in various ways, such as by screwing, snapping, or plugging the stage 200 into the spin coater 900.
[0100] With the above settings, the perovskite solution can be coated using a spin coater 900, which can effectively improve the efficiency of operation.
[0101] Please refer to Figure 1. In one embodiment, the battery production system includes the perovskite testing device described above.
[0102] It should be noted that the battery production system is used for the production of perovskite solar cells, but is not limited to perovskite solar cells; it can also be used for the production of other types of batteries. A perovskite solar cell typically includes the following structure: a transparent conductive oxide layer, an electron transport layer, a perovskite active layer, a hole transport layer, and a metal back electrode, sequentially stacked along the thickness direction of the perovskite solar cell. Of course, a perovskite solar cell may also omit the electron transport layer or the hole transport layer. The perovskite active layer is usually obtained by annealing a perovskite thin film formed after most of the solvent has evaporated from a wet perovskite film, allowing for initial crystallization.
[0103] In the aforementioned battery production system, both the first testing unit 300 and the second testing unit 400 can be detachably installed in the housing 100. They can simultaneously perform fluorescence spectroscopy and absorption scattering spectroscopy tests on samples. The same testing device can integrate at least two different spectral tests, enabling the testing device to meet different spectral testing requirements and simplifying the overall structural design of the testing device, thus optimizing the space utilization of the testing device.
[0104] According to some embodiments of this application, referring to Figure 1, this application provides a perovskite testing device, including a housing 100, a stage 200, a first testing mechanism 300, and a second testing mechanism 400. The stage 200 is disposed inside the housing 100 and used to place the sample. The first testing mechanism 300 and the second testing mechanism 400 are detachably installed in the housing 100 and are spaced apart. The first testing mechanism 300 includes a first spectrometer 310, a first optical fiber 320, a first transmitter 330, and an optical component 500. The first transmitter 330 is used to emit a first test light, the first spectrometer 310 is used to acquire the fluorescence spectrum of the first test light passing through the sample, and the optical component 500 is detachably disposed in the first transmitter. The output end of 330 is used to adjust the optical path and spot of the first test light; the second test mechanism 400 includes a second spectrometer 410, a second optical fiber 420 and a second transmitter 430. The second transmitter 430 is used to emit the second test light, and the second spectrometer 410 is used to acquire the absorption and scattering spectrum of the second test light passing through the sample; wherein, the first transmitter 330 and the second transmitter 430 are detachably installed inside the housing 100, the first spectrometer 310 and the second spectrometer 410 are both installed outside the housing 100, the first optical fiber 320 passes through the housing 100 and connects the first transmitter 330 and the first spectrometer 310, and the second optical fiber 420 passes through the housing 100 and connects the second transmitter 430 and the second spectrometer 410.
[0105] The perovskite testing device further includes a first support 610, a second support 620, a third support 630, a vacuum flash chamber 800, and a spin coater 900. The first support 610 is detachably mounted inside the housing 100 and can be moved horizontally and / or raised and lowered, and the optical component 500 is detachably mounted on the first support 610. The second support 620 is detachably mounted inside the housing 100 and can be flipped, and the optical component 500 is detachably mounted on the second support 620. The third support 630 is detachably mounted inside the housing 100 and can be flipped, and the second emitter 430 is detachably mounted on the third support 630. The vacuum flash chamber 800 is detachably mounted inside the housing 100, and the stage 200 is removably mounted inside the vacuum flash chamber 800. The spin coater 900 is detachably mounted inside the housing 100, and the stage 200 is removably mounted on the spin coater 900.
[0106] According to some embodiments of this application, referring to FIG1, this application provides a battery production system including the perovskite testing device described above.
[0107] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0108] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.
Claims
1. A perovskite test device, wherein, include: Box (100); A platform (200) is provided inside the box (100) and used to place samples; A first testing unit (300) is used to emit a first test light and acquire the fluorescence spectrum of the first test light passing through the sample; The second testing mechanism (400) is used to emit a second test light and to acquire the absorption and scattering spectrum of the second test light passing through the sample; The first testing mechanism (300) and the second testing mechanism (400) are detachably installed on the housing (100) and are spaced apart.
2. The perovskite test device of claim 1, wherein, The first testing mechanism (300) includes an electrically connected first spectrometer (310), a first optical fiber (320), and a first transmitter (330). The first transmitter (330) is used to emit the first test light, and the first spectrometer (310) is used to acquire the fluorescence spectrum of the first test light passing through the sample. The first transmitter (330) is detachably disposed inside the housing (100), the first spectrometer (310) is disposed outside the housing (100), and the first optical fiber (320) passes through the housing (100) and connects the first transmitter (330) and the first spectrometer (310).
3. The perovskite test device of claim 2, wherein, The first testing mechanism (300) further includes an optical component (500), which is detachably disposed at the emission end of the first transmitter (330) and used to adjust the optical path and spot of the first test light.
4. The perovskite testing device of claim 3, wherein, The optical component (500) includes a first filter (510), an aperture (520), a second filter (530), and a condenser lens (540). The first filter (510), the aperture (520), the second filter (530), and the condenser lens (540) are arranged sequentially according to the emission path of the first test light. The first filter (510) is used to filter out excess long-wavelength light in the first test light. The aperture (520) is used to adjust the spatial uniformity of the first test light. The second filter (530) is used to filter out excess short-wavelength light in the first test light. The condenser lens (540) is used to focus the first test light.
5. The perovskite test device of claim 4, wherein, The second filter (530) is a semi-transparent mirror, and the second filter (530) is tilted. The first test light is reflected by the second filter (530) and passes through the sample. The first test light passing through the sample is received by the first spectrometer (310) through the first optical fiber (320).
6. The perovskite test device of any of claims 3-5, wherein, The perovskite testing device further includes a first support (610), which is detachably disposed within the housing (100) and is capable of translation and / or lifting. The optical component (500) is detachably disposed on the first support (610).
7. The perovskite test device of any of claims 3-6, wherein, The perovskite testing device further includes a second support (620), which is detachably disposed inside the housing (100) and can be flipped, and the optical component (500) can be detachably disposed on the second support (620).
8. The perovskite test device of any of claims 2-7, wherein, The first testing mechanism (300) further comprises a halogen lamp (700) connected with the first optical fiber (320).
9. The perovskite test device of any of claims 1-8, wherein, The second testing mechanism (400) comprises a second spectrometer (410), a second optical fiber (420) and a second emitter (430) electrically connected, the second emitter (430) is used for emitting second testing light, and the second spectrometer (410) is used for acquiring an absorption scattering spectrum of the second testing light passing through the sample. The second emitter (430) is detachably arranged in the box (100), the second spectrometer (410) is arranged outside the box (100), and the second optical fiber (420) passes through the box (100) and is connected with the second emitter (430) and the second spectrometer (410).
10. The perovskite test device of claim 9, wherein, The perovskite testing device further comprises a third support (630) which is detachably arranged in the box (100) and can be flipped, and the second emitter (430) can be detachably arranged on the third support (630).
11. The perovskite test device of any of claims 1-10, wherein, The perovskite testing device further comprises a vacuum flash chamber (800) which is detachably arranged in the box (100), and the object table (200) can be removably arranged in the vacuum flash chamber (800).
12. The perovskite test device of claim 11, wherein, A top side of the vacuum flash chamber (800) is provided with a first window (801) and a second window (802), the first window (801) is used for allowing the first testing light to pass through, and the second window (802) is used for allowing the second testing light to pass through.
13. The perovskite test device of any of claims 1-12, wherein, The perovskite testing device further comprises a spin coater (900) which is detachably arranged in the box (100), and the object table (200) can be removably arranged on the spin coater (900).
14. A battery production system, wherein, The perovskite testing device comprises the perovskite testing device according to any one of claims 1-13.