A patch piezoelectric quartz device test fixture and test method

Abstract

The present invention relates to the field of patch piezoelectric quartz device testing, and in particular to a patch piezoelectric quartz device testing fixture and a testing method. A patch piezoelectric quartz device testing fixture is used in combination with a piezoelectric quartz oscillator, comprising: a base with a slide rail; a self-limiting lifting platform, which is arranged on the slide rail and can move up and down along the slide rail and stay at any movable position; an impedance matching circuit board, which is arranged on the lifting platform and can establish an electrical connection with the piezoelectric quartz oscillator; an external test pin, which is arranged on the lifting platform and connected to the impedance matching circuit board and is used to detect the patch piezoelectric quartz device; and a side-pressure right-angle chuck, which is arranged on the base and located below the test pin and is used to quickly fix the patch piezoelectric quartz device. The use of actively controlled test probes for measurement provides more convenient operation. Based on the lifting function, the test probes are placed externally, simplifying the cleaning process and difficulty of the test probes. Based on this top-down measurement method, a flexible and adaptable side-pressure right-angle chuck is used to further improve the adaptability and fixing efficiency of the test fixture to different shapes, ultimately achieving improved test efficiency and test accuracy of patch piezoelectric quartz devices.

Description

Technical Field

[0001] The present invention relates to the field of patch piezoelectric quartz device testing, and more particularly to a patch piezoelectric quartz device testing fixture and a testing method. Background Art

[0002] Piezoelectric quartz, also known as piezoelectric crystal, has excellent temperature performance for its piezoelectric coefficient and dielectric constant, remaining virtually unchanged at room temperature. It also offers high mechanical strength and quality factor, high rigidity, and excellent dynamic characteristics. It is pyroelectric, exhibits excellent insulation, and exhibits excellent repeatability. It is used in the electronics industry to manufacture quartz clocks, resonators, oscillators, high-frequency oscillators, and filters. Piezoelectric quartz devices are high-precision, high-ratio piezoelectric quartz components with exceptionally high frequency stability, making them crucial components in the modern defense and electronics industries.

[0003] Quartz crystals are anisotropic, resulting in different geometric shapes when cut along different orientations. Each slice, based on a specific geometry, exhibits different electromechanical conversion types, conversion efficiency, piezoelectric coefficient, elastic modulus, dielectric constant, temperature characteristics, and resonant frequency. Piezoelectric quartz devices are primarily used in high-precision equipment, requiring extremely high machining precision. Each piezoelectric quartz device undergoes high-precision testing before use to ensure performance.

[0004] Chip piezoelectric quartz devices are small and thin, and their back surfaces, which have contacts on one side, are irregular and not completely flat. Therefore, traditional testing using a piezoelectric quartz oscillator requires a dedicated auxiliary test fixture. This auxiliary test fixture has a groove that matches the shape of the patch, and a test probe at the bottom of the groove. The patch is placed in the groove using tweezers, and then pressure is applied from above to ensure close contact between the contact and the test probe. However, this auxiliary test fixture has the following shortcomings: First, the groove is fixed, so only one fixed-shape patch piezoelectric quartz device can be measured at a time. Changing to a different-shaped groove requires replacing the entire panel connecting the test probe. Second, because the patch piezoelectric quartz device must be completely placed in the matching groove each time, the placement and removal process is slow, which is not conducive to rapid measurement. Third, because the test probe is at the bottom of the groove, it is difficult to clean. If the test probe is not kept clean, it is difficult to ensure accurate testing of the patch piezoelectric quartz device. Summary of the Invention

[0005] The present invention aims to overcome at least one of the above-mentioned defects of the prior art and provide a patch piezoelectric quartz device test fixture and test method to solve the problem of how to improve the test accuracy and test efficiency of patch piezoelectric quartz devices.

[0006] The technical solution adopted by the present invention is a patch piezoelectric quartz device test fixture for use in combination with a piezoelectric quartz oscillator, including: a base with a slide rail; a self-limiting lifting platform, arranged on the slide rail, which can move up and down along the slide rail and stay at any movable position; an impedance matching circuit board, arranged on the lifting platform, which can establish an electrical connection with the piezoelectric quartz oscillator; an external test pin, arranged on the lifting platform, connected to the impedance matching circuit board, and used to detect the patch piezoelectric quartz device; an edge-pressure right-angle chuck, arranged on the base, located below the test pin, and used to quickly fix the patch piezoelectric quartz device.

[0007] The lifting platform and test probes have changed the existing testing method. By actively controlling the probes to contact the chip piezoelectric quartz device for measurement, it helps to improve the initiative of the operation during the test process and quickly switch between detection and de-detection. The self-limiting lifting platform allows the lifting platform to maintain its state at all times during the lifting process, freeing both hands for other operations, making the operation process more convenient. The external placement of the test probe helps to observe the test probe at any time, quickly determine whether it needs to be cleaned, and clean it at any time without removing the fixture, saving cleaning operation time. The side-pressure right-angle chuck has strong shape adaptability and is easy to fix and disassemble, which can help quickly fix chip piezoelectric quartz devices of different shapes. By using active control of the test probe for measurement, it provides more convenient operation. On the basis of lifting, the test probe is externally placed, simplifying the cleaning process and difficulty of the test probe. Based on this top-down measurement method, it is equipped with a flexible and adaptable side-pressure right-angle chuck, further improving the adaptability of the test fixture to different shapes and the fixing efficiency, ultimately achieving improved test efficiency and test accuracy of chip piezoelectric quartz devices.

[0008] This technical solution involves installing a rigid fixing block on the lifting platform for mounting the test probes. This rigid fixing block is connected to the lifting platform via screws on both sides. The rigid fixing block is a hard block of a certain thickness, providing excellent protection for the test probes, preventing them from being affected by accidental external contact or the fixture being dropped, thereby ensuring the accuracy of the test probes.

[0009] The technical solution is that the rigid fixing block is provided with a protection groove for positioning and protecting the test pin. The protection groove helps the test pin to be quickly installed and maintain its position, so that the test pin is evenly stressed.

[0010] The technical solution is that the top of the test pin is electrically connected to the impedance matching circuit board using a flexible member. The flexible member prevents the test pin and the impedance matching circuit board from interfering with each other, does not bear force on each other, and facilitates the replacement of either component.

[0011] In this technical solution, the impedance-matching circuit board is provided with a cable interface for establishing an electrical connection with the piezoelectric quartz oscillator. The opening of the cable interface is vertically upward. This upward opening facilitates easier connection of the cable to the piezoelectric quartz oscillator, and connecting the cable from above helps prevent interference with the vertical movement of the fixture.

[0012] The technical solution is that the edge-pressure right-angle chuck includes: an insulating support surface for supporting the horizontal surface of the patch piezoelectric quartz device; a right-angle limit block provided at a corner of the insulating support surface for limiting the patch piezoelectric quartz device; and a movable limit block, which cooperates with the right-angle limit block to quickly fix the patch piezoelectric quartz device. The insulating support surface can prevent certain external signal interference. The right-angle limit block forms a limiting right angle on the insulating support surface, which quickly and preliminarily limits the edge of the patch piezoelectric quartz device during movement. The movable limit block can be used to push the patch piezoelectric quartz device and to provide additional limit after the patch piezoelectric quartz device is initially limited, thereby quickly fixing the patch piezoelectric quartz device through the surrounding edges.

[0013] The technical solution is that the movable limit block includes a first movable limit block and a second movable limit block, and the first movable limit block is provided with a locking device. The first movable limit block and the second movable limit block cooperate with the right-angle edge to form a fixed combination surrounded by four sides, so that the patch piezoelectric quartz device can be completely fixed, and the first movable limit block is provided with a locking device, which can facilitate the measurement of patch piezoelectric quartz devices of the same batch model so that they can be fixed more quickly. When the shapes of the patch piezoelectric quartz devices are consistent, by further locking the first movable limit block, the edge-pressing right-angle chuck is left with only one movable groove suitable for the patch piezoelectric quartz device. The patch piezoelectric quartz device only needs to be placed on the movable groove, and the patch piezoelectric quartz device can be quickly fixed by operating the second movable limit block, further improving the fixing speed. Furthermore, the movable limit block is provided with an elastic pressure piece on the side close to the patch piezoelectric quartz device, and the side of the elastic pressure piece in contact with the patch piezoelectric quartz device is an inclined surface.

[0014] This technical solution employs an elastic mounting position within the protective groove, with each test pin of the pair of test pins positioned on a corresponding, interfering elastic mounting position. The elastic mounting position helps protect the test pins while also resolving the issue of the two test contacts being located at different heights. The elastic mounting position allows the test pins to be measured at different heights.

[0015] The technical solution is that a pressure detection device is provided on the impedance matching circuit board, and the pressure detection device detects the pressure exerted on the two test needles respectively. The contact effect between the test needle and the patch piezoelectric quartz device is judged by pressure, ensuring good contact between the test needle and the patch piezoelectric quartz device during the detection process. Furthermore, a driving device is also provided on the lifting platform, and the driving device can be controlled by one button to drive the lifting platform to move up and down slowly. The driving device is provided with a protection switch, and the protection switch is connected to the pressure detection device. When the pressure detection device reaches a preset value, the protection switch stops the driving device from moving downward.

[0016] The present technical solution is a detection method for a patch piezoelectric quartz device test fixture, comprising the following steps: the cable of a piezoelectric quartz oscillator is connected to the cable interface of the patch piezoelectric quartz device test fixture; the patch piezoelectric quartz device is placed in a side-pressed right-angle chuck with its contacts facing upward; the patch piezoelectric quartz device is quickly fixed by operating a movable limit block; the lifting platform is operated so that the test needle contacts the detection contacts of the patch piezoelectric quartz device from top to bottom and the test is performed; after the test is completed, the test needle is raised, the movable limit block is moved, and the patch piezoelectric quartz device is removed.

[0017] Compared with the existing technology, the beneficial effects of the present invention are: changing the existing testing method, adopting active control of the test needle for measurement, providing more convenient operation, and realizing the external placement of the test needle on the basis of lifting, simplifying the cleaning process and difficulty of the test needle, and according to this top-down measurement method, it is equipped with a flexible and adaptable side-pressure right-angle chuck, further improving the adaptability and fixing efficiency of the test fixture to different shapes, and finally achieving the improvement of the test efficiency and test accuracy of the patch piezoelectric quartz device. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 The figure is a schematic diagram of a test fixture for patch piezoelectric quartz devices according to the present invention.

[0019] Figure 2 Schematic diagram of the side-pressure right-angle chuck of the present invention.

[0020] Figure 3 The figure is a three-dimensional diagram of a test fixture for patch piezoelectric quartz devices according to the present invention.

[0021] Figure 4 For the present invention Figure 3 A partial enlarged view of B.

[0022] Explanation of the reference numerals: base 100, side-pressure right-angle chuck 200, hard and smooth area 211, fuzzy area 212, right-angle limit block 221, first movable limit block 222, locking device 224, inclined surface 225, limit groove 230, lifting platform 300, impedance matching circuit board 310, cable interface 311, elastic mounting position 312, flexible part 313, protective groove 314, test pin 320, rigid fixing block 330, handle 340. DETAILED DESCRIPTION

[0023] The accompanying drawings are for illustrative purposes only and are not to be construed as limiting the present invention. To better illustrate the following embodiments, some components in the accompanying drawings may be omitted, enlarged, or reduced in size, and do not represent actual product dimensions. Those skilled in the art will appreciate that some well-known structures and their descriptions may be omitted from the accompanying drawings.

[0024] Example 1

[0025] like Figure 1 As shown, this embodiment is a patch piezoelectric quartz device test fixture for use in combination with a piezoelectric quartz oscillator, including: a base 100 with a slide rail; a self-limiting lifting platform 300, which is arranged on the slide rail and can move up and down along the slide rail and stay at any movable position; an impedance matching circuit board 310, which is arranged on the lifting platform 300 and can establish an electrical connection with the piezoelectric quartz oscillator; an external test pin 320, which is arranged on the lifting platform 300 and is connected to the impedance matching circuit board 310, and is used to detect the patch piezoelectric quartz device; an edge-pressing right-angle chuck 200, which is arranged on the base 100 and is located below the test pin 320, and is used to quickly fix the patch piezoelectric quartz device.

[0026] The lifting platform 300 and the test needle 320 have changed the existing testing method. By actively controlling the probe to contact the patch piezoelectric quartz device for measurement, it helps to improve the initiative of the operation during the test and quickly switch between detection and release of detection; the self-limiting lifting platform 300 enables the lifting platform 300 to maintain its state at any time during the lifting process, freeing both hands to perform other operations, making the operation process more convenient; the external placement of the test needle 320 helps to observe the test needle 320 at any time, quickly determine whether it needs to be cleaned, and clean it at any time without disassembling the fixture, saving cleaning operation time; the edge-pressure right-angle chuck 200 has strong shape adaptability and is easy to fix and disassemble, which can help to quickly fix patch piezoelectric quartz devices of different shapes. The active control of the test needle 320 for measurement provides more convenient operation. On the basis of lifting, the test needle 320 is externalized, which simplifies the cleaning process and difficulty of the test needle 320. Based on this top-down measurement method, a flexible and adaptable side-pressure right-angle chuck 200 is used to further improve the adaptability and fixing efficiency of the test fixture to different shapes, ultimately achieving improved test efficiency and test accuracy of patch piezoelectric quartz devices.

[0027] The self-limiting lifting platform 300 is provided with a handle 340 for easy hand grasping. The handle 340 is used to manually control the vertical up and down movement of the lifting platform 300. The impedance matching circuit board 310 is arranged on the vertical surface of the lifting platform 300, so that the installation interface of the test needle 320 and the piezoelectric quartz oscillator is exposed and can be connected and replaced at any time. The test needle 320 is arranged on the lifting platform 300, so that the up and down movement of the lifting platform 300 drives the test needle 320 to move up and down, and touches and measures the chip quartz device from top to bottom. Although self-limiting reduces most of the impact, under the action of gravity, the test needle 320 will still slightly increase the pressure on the chip quartz device due to the weight of the lifting platform 300, forming a better contact effect. The characteristic of the edge-pressure right-angle chuck 200 is that, through the combination of fixed and movable components, the chip piezoelectric quartz device is first limited at the local edge and then further completely fixed. Compared with the existing placement groove, which requires the patch piezoelectric quartz device to be placed very accurately in the groove to form a preliminary fixation, the edge-pressure right-angle chuck 200 is no longer limited to a single shape and can complete the fixation faster to adapt to the top-down testing method and improve efficiency.

[0028] A rigid fixing block 330 for mounting the test needle 320 is provided on the lifting platform 300, and the rigid fixing block 330 is connected to the lifting platform 300 by screws on both sides. The rigid fixing block 330 is a hard block with a certain thickness, which provides good protection for the test needle 320, preventing accidental external touch or the falling of the fixture from affecting the test needle 320, so that the accuracy of the test needle 320 is guaranteed. The test needle 320 is an important component that is in direct contact with the patch piezoelectric quartz device. The accuracy of the test needle 320 directly affects the test results. Therefore, the test needle 320 should not be touched or collided at will under normal circumstances, otherwise it is easy to reduce the accuracy of the test needle 320. Due to the characteristics of this test fixture, the test pins 320 cannot be completely shielded. They can easily be touched during placement and removal of the SMD piezoelectric quartz device or during adjustment of the lift platform 300. To protect them, they are positioned within a rigid fixing block 330, shielding and transferring any external impact forces. The rigid fixing block 330 is secured to the lift platform 300 with screws on both sides. This allows for quick removal and installation when replacing the test pins 320. The two-sided fixing ensures that any force applied to the rigid fixing block 330 is evenly transferred to the base 100.

[0029] like Figure 3 As shown, a protective groove 314 for positioning and protecting the test pin 320 is provided on the rigid fixing block 330. The protective groove 314 helps the test pin 320 to be quickly installed and maintained in position, so that the test pin 320 is evenly stressed. The rigid fixing block 330 has a certain thickness, so it can form a protective groove 314 with a certain distance and can be embedded in a larger section of the test pin 320. On the one hand, the protective groove 314 limits the vertical state of the test pin 320 during the installation process, so that the test pin 320 can still reach a vertical state after the quick installation is completed; on the other hand, by keeping the test pin 320 vertical, it helps to make the test pin 320 evenly stressed during the detection process, and effectively prevents the deformation of the test pin 320 caused by up and down impacts.

[0030] The top of the test pin 320 is electrically connected to the impedance matching circuit board 310 via a flexible member 313. This prevents interference between the test pin 320 and the impedance matching circuit board 310, facilitating the replacement of either component. The flexible member 313 allows for the connection of multiple cables, flexible flat cables, or other flexible electrical connectors. This connection prevents impacts on either the impedance matching circuit board 310 or the test pin 320, preventing them from transmitting the force to the other. This provides protection for both components.

[0031] The impedance matching circuit board 310 is provided with a cable interface 311 for establishing an electrical connection with the piezoelectric quartz oscillator, and the opening of the cable interface 311 is vertically upward. The upward opening helps to make it easier to connect the cable to the piezoelectric quartz oscillator, and connecting the cable from above helps to avoid the cable interfering with the up and down movement of the fixture. Existing piezoelectric quartz oscillators mostly use coaxial cables, which are more rigid and not easy to bend. When installing from top to bottom, the cable does not need to pass through the narrow gap between the lifting platform 300 and the base 100, nor does it need to be bent significantly. The cable can enter from the side and connect to the cable interface 311 from top to bottom, so that the cable will not interfere with the up and down movement of the lifting platform 300.

[0032] like Figure 2 As shown, the edge-pressure right-angle chuck 200 includes: an insulating support surface for supporting the horizontal surface of the patch piezoelectric quartz device; a right-angle limit block 221, set at a corner of the insulating support surface, to limit the patch piezoelectric quartz device; and a movable limit block, which cooperates with the right-angle limit block 221 to quickly fix the patch piezoelectric quartz device. The insulating support surface can prevent certain external signal interference. The right-angle limit block 221 forms a limiting right angle on the insulating support surface, quickly and preliminarily limiting the edge of the patch piezoelectric quartz device during movement. The movable limit block can be used to push the patch piezoelectric quartz device and to provide additional limiting after the patch piezoelectric quartz device is initially limited, quickly fixing the patch piezoelectric quartz device through the surrounding edges.

[0033] The edge-pressure right-angle chuck 200 imposes minimal restrictions on the shape of the chip piezoelectric quartz device. Chip piezoelectric quartz devices of varying sizes and shapes can be quickly adapted and adjusted simply by increasing the spacing between the movable stop block and the right-angle stop block 221. Furthermore, during the securing process, the chip piezoelectric quartz device does not require precise placement; a simple push can still quickly secure it, improving securing efficiency and adaptability. The movable stop blocks include a first movable stop block 222 and a second movable stop block, with the first movable stop block 222 being equipped with a locking device 224.

[0034] The first movable limit block 222 and the second movable limit block cooperate with the right-angle side to form a fixed combination surrounded by four sides, so that the patch piezoelectric quartz device can be completely fixed, and the first movable limit block 222 is provided with a locking device 224, which can facilitate the measurement of the patch piezoelectric quartz devices of the same batch model and fix them more quickly. When the shapes of the patch piezoelectric quartz devices are consistent, by further locking the first movable limit block 222, the edge-pressing right-angle chuck 200 will only have one movable groove suitable for the patch piezoelectric quartz device. The patch piezoelectric quartz device only needs to be placed on the movable groove, and the patch piezoelectric quartz device can be quickly fixed by operating the second movable limit block, which further improves the fixing speed.

[0035] The locking device 224 can be fixed with a simple screw. A locking hole is provided on the first movable limit block 222. A groove is provided on the insulating support surface at the position where the first movable limit block 222 moves. The screw passes through the groove and the locking hole and fixes the first movable limit block 222 at the required position. The locking device 224 can also have an elastic reset function. After the first movable limit block 222 is in the locked position, it can still slide backward under the action of an external force. After the external force is lost, under the guidance of the elastic reset function, the first movable limit block 222 can slowly return to the position locked before sliding. When there is a patch piezoelectric quartz device between the first movable limit block 222 and the right-angle limit block 221, and the patch piezoelectric quartz device forms an obstacle to the position of the first movable limit block 222, the first movable limit block 222 will clamp the patch piezoelectric quartz device without damaging the patch piezoelectric quartz device. An elastic mounting position 312 is provided in the protection groove 314 , and each test pin of the test pin pair 320 is disposed on a corresponding elastic mounting position 312 that has complementary interference.

[0036] Example 2

[0037] like Figure 1 As shown, this embodiment is a patch piezoelectric quartz device test fixture for use in combination with a piezoelectric quartz oscillator, including: a base 100 with a slide rail; a self-limiting lifting platform 300, which is arranged on the slide rail and can move up and down along the slide rail and stay at any movable position; an impedance matching circuit board 310, which is arranged on the lifting platform 300 and can establish an electrical connection with the piezoelectric quartz oscillator; an external test pin 320, which is arranged on the lifting platform 300 and is connected to the impedance matching circuit board 310, and is used to detect the patch piezoelectric quartz device; an edge-pressing right-angle chuck 200, which is arranged on the base 100 and is located below the test pin 320, and is used to quickly fix the patch piezoelectric quartz device.

[0038] The lifting platform 300 and the test needle 320 have changed the existing testing method. By actively controlling the probe to contact the patch piezoelectric quartz device for measurement, it helps to improve the initiative of the operation during the test and quickly switch between detection and release of detection; the self-limiting lifting platform 300 enables the lifting platform 300 to maintain its state at any time during the lifting process, freeing both hands to perform other operations, making the operation process more convenient; the external placement of the test needle 320 helps to observe the test needle 320 at any time, quickly determine whether it needs to be cleaned, and clean it at any time without disassembling the fixture, saving cleaning operation time; the edge-pressure right-angle chuck 200 has strong shape adaptability and is easy to fix and disassemble, which can help to quickly fix patch piezoelectric quartz devices of different shapes. The active control of the test needle 320 for measurement provides more convenient operation. On the basis of lifting, the test needle 320 is externalized, which simplifies the cleaning process and difficulty of the test needle 320. Based on this top-down measurement method, a flexible and adaptable side-pressure right-angle chuck 200 is used to further improve the adaptability and fixing efficiency of the test fixture to different shapes, ultimately achieving improved test efficiency and test accuracy of patch piezoelectric quartz devices.

[0039] The self-limiting lift 300 features a handle 340 for easy grasping. This handle 340 is used to manually control the vertical movement of the lift 300. A self-resetting switch or button is also included, which connects to and controls a clamp mounted on the lift 300 that locks the track. The clamp is normally closed and continuously clamps the track, keeping the lift 300 in its current position. To move the lift 300, the switch or button on the handle 340 is triggered, releasing the clamp from the track within the triggering time, allowing the lift 300 to move. An impedance matching circuit board 310 is mounted on the vertical surface of the lift 300, exposing the mounting interfaces for the test probes 320 and the piezoelectric quartz oscillator, allowing for easy connection and replacement. The test probes 320 are mounted on the lift 300, allowing the lift 300 to move up and down with the vertical movement of the lift 300, contacting and measuring the SMD quartz device from top to bottom. Although self-limiting reduces most of the impact, under the action of gravity, the test needle 320 will still slightly increase the pressure on the patch quartz device due to the weight of the lifting platform 300, forming a better contact effect. The characteristic of the edge-pressure right-angle chuck 200 is that, through the combination of fixed and movable components, the patch piezoelectric quartz device is first limited at the local edge and then further completely fixed. Compared with the existing placement groove, which requires the patch piezoelectric quartz device to be placed in the groove very accurately to form a preliminary fixation, the edge-pressure right-angle chuck 200 is no longer limited to a single shape, and can complete the fixation faster to adapt to the top-down testing method and improve efficiency.

[0040] like Figure 3 As shown, a rigid fixing block 330 for mounting the test needle 320 is provided on the lifting platform 300, and the rigid fixing block 330 is connected to the lifting platform 300 by screws on both sides. The rigid fixing block 330 is a hard block with a certain thickness, which provides good protection for the test needle 320, preventing accidental external touch or the falling of the fixture from affecting the test needle 320, so that the accuracy of the test needle 320 is guaranteed. The test needle 320 is an important component that is in direct contact with the patch piezoelectric quartz device. The accuracy of the test needle 320 directly affects the test results. Therefore, the test needle 320 should not be touched or collided at will under normal circumstances, otherwise it is easy to reduce the accuracy of the test needle 320. Due to the characteristics of this test fixture, the test pins 320 cannot be completely shielded. They can easily be touched during placement and removal of the SMD piezoelectric quartz device or during adjustment of the lift platform 300. To protect them, they are positioned within a rigid fixing block 330, shielding and transferring any external impact forces. The rigid fixing block 330 is secured to the lift platform 300 with screws on both sides. This allows for quick removal and installation when replacing the test pins 320. The two-sided fixing ensures that any force applied to the rigid fixing block 330 is evenly transferred to the base 100.

[0041] The rigid fixing block 330 is provided with a protective groove 314 for positioning and protecting the test pin 320. The protective groove 314 helps the test pin 320 to be quickly installed and maintained in position, so that the test pin 320 is evenly stressed. The rigid fixing block 330 has a certain thickness, so it can form a protective groove 314 with a certain distance and can be embedded in a larger section of the test pin 320. On the one hand, the protective groove 314 limits the vertical state of the test pin 320 during the installation process, so that the test pin 320 can still reach a vertical state after the quick installation is completed; on the other hand, by keeping the test pin 320 vertical, it helps to make the test pin 320 evenly stressed during the detection process, effectively preventing the deformation of the test pin 320 caused by up and down impacts.

[0042] like Figure 4As shown, the top of the test pin 320 is electrically connected to the impedance matching circuit board 310 by a flexible part 313. The flexible part 313 prevents the test pin 320 and the impedance matching circuit board 310 from interfering with each other, without exerting force on each other, and facilitates the replacement of either component. The flexible part 313 can connect multiple strands of cables or soft cables or other flexible electrical connectors. The connection of the flexible part 313 ensures that no matter whether the impedance matching circuit board 310 or the test pin 320 is impacted, the impact force will not be transmitted to the other party, which is a protection for both components. Furthermore, a movable interface is used between the flexible part 313 and the test pin 320 or the impedance matching circuit. When any component fails and needs to be replaced, it can be quickly separated and replaced by a flexible connection, which greatly reduces the time required for maintenance and replacement and improves efficiency.

[0043] The impedance matching circuit board 310 is provided with a cable interface 311 for establishing an electrical connection with the piezoelectric quartz oscillator, and the opening of the cable interface 311 is vertically upward. The upward opening helps to make it easier to connect the cable to the piezoelectric quartz oscillator, and connecting the cable from above helps to avoid the cable interfering with the up and down movement of the fixture. Existing piezoelectric quartz oscillators mostly use coaxial cables, which are more rigid and not easy to bend. When installing from top to bottom, the cable does not need to pass through the narrow gap between the lifting platform 300 and the base 100, nor does it need to be bent significantly. The cable can enter from the side and connect to the cable interface 311 from top to bottom, so that the cable will not interfere with the up and down movement of the lifting platform 300.

[0044] like Figure 2 As shown, the edge-pressure right-angle chuck 200 includes: an insulating support surface for supporting the horizontal surface of the patch piezoelectric quartz device; a right-angle limit block 221, set at a corner of the insulating support surface, to limit the patch piezoelectric quartz device; and a movable limit block, which cooperates with the right-angle limit block 221 to quickly fix the patch piezoelectric quartz device. The insulating support surface can prevent certain external signal interference. The right-angle limit block 221 forms a limiting right angle on the insulating support surface, quickly and preliminarily limiting the edge of the patch piezoelectric quartz device during movement. The movable limit block can be used to push the patch piezoelectric quartz device and to provide additional limiting after the patch piezoelectric quartz device is initially limited, quickly fixing the patch piezoelectric quartz device through the surrounding edges.

[0045] The edge-pressure right-angle chuck 200 has minimal restrictions on the shape of the chip piezoelectric quartz device. Chip piezoelectric quartz devices of varying sizes and shapes can be quickly accommodated and adjusted simply by increasing the spacing between the movable stopper and the right-angle stopper 221. Furthermore, during the securing process, the chip piezoelectric quartz device does not require precise placement; a simple push can still quickly secure it, improving securing efficiency and adaptability. Furthermore, the insulating supporting surface can also be set to have a combination of a hard and smooth area 211 and a fuzzy area 212. The hard and smooth area 211 supports the patch piezoelectric quartz device during testing. Because the test needle 320 will contact the patch piezoelectric quartz device by applying pressure during the testing process, it is necessary to ensure that the surface in contact with the back of the patch piezoelectric quartz device is a smooth and hard horizontal surface; and the fuzzy area 212 is set on the extension of the hard and smooth area 211. The patch piezoelectric quartz device can pass through the fuzzy area 212 during movement. The fuzzy area 212 can clean the back of the patch piezoelectric quartz device to prevent dust or foreign particles from causing the patch piezoelectric quartz device to warp up.

[0046] The movable limit block includes a first movable limit block 222 and a second movable limit block, and the first movable limit block 222 is provided with a locking device 224. The first movable limit block 222 and the second movable limit block cooperate with the right-angle edge to form a fixed combination surrounded by four sides, so that the patch piezoelectric quartz device can be completely fixed. The first movable limit block 222 is provided with a locking device 224, which can facilitate the measurement of patch piezoelectric quartz devices of the same batch model and fix them more quickly. When the shapes of the patch piezoelectric quartz devices are consistent, by further locking the first movable limit block 222, the edge-pressing right-angle chuck 200 is left with only one movable groove suitable for the patch piezoelectric quartz device. The patch piezoelectric quartz device only needs to be placed on the movable groove, and the patch piezoelectric quartz device can be quickly fixed by operating the second movable limit block, further improving the fixing speed.

[0047] The locking device 224 can be fixed with a simple screw. A locking hole is provided on the first movable limit block 222. A groove is provided on the insulating support surface at the position where the first movable limit block 222 moves. The screw passes through the groove and the locking hole and fixes the first movable limit block 222 at the required position. The locking device 224 can also have an elastic reset function. After the first movable limit block 222 is in the locked position, it can still slide backward under the action of an external force. After the external force is lost, under the guidance of the elastic reset function, the first movable limit block 222 can slowly return to the position locked before sliding. When there is a patch piezoelectric quartz device between the first movable limit block 222 and the right-angle limit block 221, and the patch piezoelectric quartz device forms an obstacle to the position of the first movable limit block 222, the first movable limit block 222 will clamp the patch piezoelectric quartz device without damaging the patch piezoelectric quartz device. Furthermore, the first movable limit block 222 has a limit groove 230, which enables the first interactive limit block to move along a fixed motion trajectory, and the first movable limit block 222 and the right-angle limit block 221 form the limit groove 230 of the second movable limit block. After fixing the first movable limit block 222, the motion trajectory of the second movable limit block is also fixed.

[0048] Furthermore, an elastic pressure piece is provided on the side of the movable limit block close to the patch piezoelectric quartz device, and the side of the elastic pressure piece in contact with the patch piezoelectric quartz device is an inclined surface 225. The elastic pressure piece can prevent the movable limit block from applying excessive force during the fixation of the patch piezoelectric quartz device, causing damage to the edge of the patch piezoelectric quartz device. At the same time, the elastic pressure piece produces a slight elastic deformation during the fixation process. The elastic force provided by the deformation can further strengthen the fixation of the edge of the patch piezoelectric quartz device, making it more reliable. The inclined surface 225 forms an acute angle with the insulating support surface. When fixing the patch piezoelectric quartz device, the inclined surface 225 will generate a downward pressure force to help the patch piezoelectric quartz device stick to the insulating support surface.

[0049] A resilient mounting position 312 is provided within the protective groove 314. Each test pin of the test probe 320 is positioned on a corresponding and complementary resilient mounting position 312. The resilient mounting position 312 helps protect the test pins 320 while also resolving the issue of the two test contacts not being in the same plane. The resilient mounting position 312 enables the test pins 320 to perform measurements at different heights. The resilient mounting position 312 is an elastic member that allows a spring element with larger diameters at both ends and a smaller diameter in the middle to clamp the test pins. The smaller diameter portion of the middle portion is secured within the protective groove 314, allowing the test pins to move up and down. When downward pressure encounters resistance, the spring element continuously applies a stable counterforce to the test pins, ensuring contact while allowing for slight displacement. Therefore, when the back of the patch piezoelectric quartz device is uneven, causing the contacts to be off-plane, the self-adjusting resilient mounting position 312 can maintain good contact. Furthermore, a pressure detection device is provided on the impedance matching circuit board 310 to detect the pressure applied to each of the two test pins. The contact effect between the test needle 320 and the patch piezoelectric quartz device is judged by pressure, ensuring good contact between the test needle 320 and the patch piezoelectric quartz device during the detection process.

[0050] The platform 300 is also equipped with a drive device that can be controlled by a single button, driving the platform 300 to slowly move up and down. The drive device is equipped with a protection switch that is connected to the pressure detection device. When the pressure detection device reaches a preset value, the protection switch stops the drive device from moving downward.

[0051] Example 3

[0052] The present embodiment provides a detection method for a patch piezoelectric quartz device test fixture, comprising the following steps: connecting the cable of a piezoelectric quartz oscillator to a cable interface 311 of a patch piezoelectric quartz device test fixture; placing the patch piezoelectric quartz device in a side-pressed right-angle chuck 200 with its contacts facing upward; quickly fixing the patch piezoelectric quartz device by operating a movable limit block; operating a lifting platform 300 so that a test needle 320 contacts the detection contacts of the patch piezoelectric quartz device from top to bottom and performs a test; after the test is completed, raising the test needle 320, moving the movable limit block, and removing the patch piezoelectric quartz device.

[0053] Specifically, the cable of the piezoelectric quartz oscillator is inserted from the side and connected to the cable interface 311 from top to bottom; the piezoelectric quartz oscillator is turned on and preheated, and the first movable limit block 222 is determined to be unlocked; the patch piezoelectric quartz device is placed on the insulating support surface close to the limit right angle, and the first movable limit block 222 is used to push the patch piezoelectric quartz device. The patch piezoelectric quartz device can pass through the fluff area 212 during the movement. The fluff area 212 can clean the back of the patch piezoelectric quartz device to prevent dust or foreign particles from causing the patch piezoelectric quartz device to tilt. When the patch piezoelectric quartz device is pushed by the first movable limit block 222, it contacts one side of the limit right angle, and the first movable limit block 222 is locked. Then operate the second movable limit block to move the patch piezoelectric quartz device to the target position. At this time, the patch piezoelectric quartz device stays in the hard and smooth area 211 and is completely fixed. During the detection process, the test needle 320 will contact the patch piezoelectric quartz device by applying pressure, so it is necessary to ensure that the surface in contact with the back of the patch piezoelectric quartz device is a smooth, hard and horizontal surface.

[0054] Operate the handle 340 of the lifting platform 300, trigger the switch or button on the handle 340, and release the lock of the clamp on the track within the trigger time to move. Control the lifting platform 300 to slowly descend. When the chip piezoelectric quartz device contacts the test pin 320, observe the pressure detection device and judge by the pressure whether the contact pressure between the two test pins of the test pin 320 and the chip piezoelectric quartz device reaches the required value. At this time, it can be determined that the test pin 320 has established good contact with the chip piezoelectric quartz device. Stop triggering the switch or button on the handle 340, and the clamp continues to clamp the track so that the lifting platform 300 stays at the current position of the track, and start testing. After the test is completed, operate the handle 340 of the lifting platform 300 again, trigger the switch or button on the handle 340, and raise the lifting platform 300. After it rises to the specified position, release the second movable limit block, and the chip piezoelectric quartz device can be removed and replaced with the next test piece.

[0055] Obviously, the above embodiments of the present invention are merely examples for the purpose of clearly illustrating the technical solutions of the present invention, and are not intended to limit the specific implementation methods of the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the claims of the present invention shall be included within the scope of protection of the claims of the present invention.

Claims

1. A patch piezoelectric quartz device test fixture for use in combination with a piezoelectric quartz oscillator, characterized in that: include: Abutment, with slide rails; The self-limiting lifting platform is set on the slide rail and can move up and down along the slide rail and stop at any movable position; An impedance matching circuit board is placed on the lifting platform and can establish an electrical connection with the piezoelectric quartz oscillator; The external test probe is set on the lifting platform and connected to the impedance matching circuit board for testing the chip piezoelectric quartz device; The side-pressure right-angle chuck is arranged on the base and located below the test needle. The side-pressure right-angle chuck includes: Insulating support surface, used to support the horizontal surface of the patch piezoelectric quartz device; A right-angle limit block is provided at a corner of the insulating support surface to limit the position of the patch piezoelectric quartz device; A movable limit block, comprising a first movable limit block and a second movable limit block, wherein the first movable limit block is provided with a locking device, and the first movable limit block and the second movable limit block cooperate with the right-angle edge to form a fixed combination surrounded by four sides, thereby quickly fixing the patch piezoelectric quartz device; The movable limit block is provided with an elastic pressing piece on one side close to the patch piezoelectric quartz device. The side of the elastic pressing piece in contact with the patch piezoelectric quartz device is an inclined surface, and the inclined surface forms an acute angle with the insulating supporting surface.

2. A chip piezoelectric quartz device test fixture according to claim 1, characterized in that: The lifting platform is provided with a rigid fixing block for mounting the test needle, and the rigid fixing block is connected to the lifting platform by screws on both sides.

3. A chip piezoelectric quartz device test fixture according to claim 2, characterized in that: The rigid fixing block is provided with a protection groove for positioning and protecting the test needle.

4. A chip piezoelectric quartz device test fixture according to claim 2, characterized in that: The top of the test needle is electrically connected to the impedance matching circuit board through a flexible member.

5. The chip piezoelectric quartz device test fixture according to claim 1, characterized in that: The impedance matching circuit board is provided with a cable interface for establishing an electrical connection with the piezoelectric quartz oscillator, and the opening of the cable interface is vertically upward.

6. A chip piezoelectric quartz device test fixture according to claim 3, characterized in that: An elastic mounting position is provided in the protection groove, and each test needle of the test needle pair is arranged on a corresponding and complementary elastic mounting position.

7. The chip piezoelectric quartz device test fixture according to claim 1, characterized in that: The impedance matching circuit board has a pressure detection device, and the pressure detection device detects the pressure respectively exerted on the two test needles.

8. A detection method applicable to a patch piezoelectric quartz device test fixture according to any one of claims 1 to 7, characterized in that: The following steps are involved: The cable of the piezoelectric quartz oscillator is connected to the cable interface of the patch piezoelectric quartz device test fixture; The contact of the patch piezoelectric quartz device faces upward and is placed in a side-pressed right-angle chuck; By operating the movable limit block, the patch piezoelectric quartz device can be quickly fixed; Operate the lifting platform to test the detection contacts of the piezoelectric quartz device from top to bottom, and perform the test; After the test is completed, raise the test needle, move the movable limit block and remove the SMD piezoelectric quartz device.

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