Infrared defocus plane polarization correction method based on polarizer reflection polarization characteristics
By adding correction coefficients and nonlinear fitting to the radiative transfer model of the infrared focal plane polarization imaging system, and combining it with temperature-controlled adjustable infrared polarization radiation source for calibration, the overcorrection problem of the infrared focal plane polarization imaging system is solved, and the system's calibration accuracy and polarization information calculation accuracy are improved.
Patent Information
- Application Number
- CN202310368701.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-04-10
- Publication Date
- 2025-12-05
- Estimated Expiration
- 2043-04-10
AI Technical Summary
Infrared focal plane polarization imaging systems suffer from parameter overcorrection and reduced system resolution due to the failure to consider the polarization characteristics of polarizer reflection and radiation.
By adding a correction coefficient to the radiative transfer model of the infrared focal plane polarization imaging system to adjust the additional radiation, using a nonlinear method to fit the relationship between image grayscale and incident radiation, and calibrating using a temperature-controlled adjustable infrared polarization radiation source, a radiative transfer model of the infrared focal plane polarization imaging system is constructed to achieve response and polarization correction.
This improves the correction accuracy of the infrared focal plane polarization imaging system, reduces the measurement and calculation errors of the micro polarizer array parameters, and ensures the accurate calculation of polarization information of the external scene.