A time parameter testing method, device, equipment and medium for diagnostic fault codes
By controlling the target function state change and reading the diagnostic trouble code state within a preset time period, the problem of large error in the diagnostic trouble code time parameter test in the prior art is solved, and accurate time parameter measurement is achieved.
Patent Information
- Application Number
- CN202310911853.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-07-24
- Publication Date
- 2025-09-12
- Estimated Expiration
- 2043-07-24
AI Technical Summary
The existing technology has large errors when testing the time parameters of diagnostic fault codes on a test bench, and it is impossible to accurately determine whether the time parameters meet the test requirements.
By controlling the target function state change before and after the preset time period and sending a diagnostic request to the electronic control unit to be tested, the first state and second state of the diagnostic fault code are read. If the first state is the target state and the second state is the preset state, it is determined that the preset time period meets the test requirements.
It achieves accurate measurement of the time parameters of the diagnostic trouble code, eliminates the deviation caused by the internal processing time of the software and the response to the diagnostic reply, and controls the error within one message cycle.