Electromagnetic sensitivity diagnosis method and computer device

Abstract

The invention relates to the field of electromagnetic sensitivity diagnosis, in particular to an electromagnetic sensitivity diagnosis method and a computer device, and realizes targeted diagnosis of the sensitivity of electromagnetic equipment in a complex environment. The method comprises the steps that a pulse signal with an adjustable rising edge is selected as an excitation signal, the rising edge of the excitation signal is adjusted, a tested object is tested, and if a sensitive threshold value of the tested object is directly related to the rising edge of the pulse signal, it is judged that the tested object is sensitive due to the fact that a differentiating circuit part is disturbed; the method comprises the following steps: selecting a pulse signal with an adjustable time duty ratio as an excitation signal, adjusting the time duty ratio, testing a tested object, if a sensitive threshold value of the tested object is related to the time duty ratio and the sensitive energy of the tested object is a fixed value in a fixed time period, judging that an integral circuit part of the tested object is disturbed, and otherwise, judging that the integral circuit part of the tested object is disturbed. Otherwise, whether the tested object is sensitive due to the fact that the digital logic circuit part is disturbed or not is diagnosed. The method is suitable for electromagnetic sensitivity diagnosis.

Description

Technical Field

[0001] The present invention relates to the field of electromagnetic sensitivity diagnosis, and in particular to an electromagnetic sensitivity diagnosis method and a computer device. Background Art

[0002] Electromagnetic sensitivity is the key weakness and shortcoming of information-based equipment in the electromagnetic game. However, due to the lack of scientific means to understand the sensitive mechanism, a large number of sensitive phenomena that occur in actual working conditions are difficult to reproduce in the laboratory, let alone be predicted in advance, resulting in electromagnetic sensitivity problems that can only be solved one by one, and it is difficult to completely cure them.

[0003] For example, "Requirements and Measurements of Electromagnetic Emissions and Sensitivity of Military Equipment and Subsystems" (GJB 151B) is currently the main basis for electromagnetic sensitivity testing of military products. The interference excitation signals it uses are all sinusoidal signals and damped signals with fixed parameters. However, it only conducts passability tests according to the current specified field strength and signal levels, without going deep into the sensitive mechanism of the test product. It is difficult to hit the pain points of the equipment, and cannot provide support for the safety judgment of the equipment in complex environments and the reproduction of sensitive phenomena. Summary of the invention

[0004] The purpose of the present invention is to overcome the shortcomings of the prior art and provide an electromagnetic sensitivity diagnosis method and a computer device, which realizes the targeted diagnosis of the sensitivity of electromagnetic equipment in a complex environment and improves the adaptability of the electromagnetic equipment sensitivity diagnosis.

[0005] The present invention adopts the following technical solutions to achieve the above-mentioned purpose. In a first aspect, the present invention provides an electromagnetic susceptibility diagnosis method, comprising:

[0006] S1. Select a pulse signal with an adjustable rising edge as the excitation signal, adjust the rising edge of the excitation signal, test the product under test, and obtain the variation rule of the sensitive threshold of the product under test with the rising edge of the transient pulse. Perform diagnosis based on the variation rule. If the sensitive threshold of the product under test is directly related to the rising edge of the pulse signal, it is determined that the product under test is sensitive due to the interference of the differential circuit part.

[0007] S2, select a pulse signal with an adjustable time duty cycle as an excitation signal, adjust the time duty cycle, test the test product, obtain the change rule of the test product's sensitive threshold with the time duty cycle of the transient pulse signal, and diagnose according to the change rule. If the test product's sensitive threshold is related to the time duty cycle, and within a fixed time period, the energy that makes the test product sensitive is a constant value, then it is determined that the test product is partially disturbed in the integration circuit, otherwise, enter step S3;

[0008] S3. Test the product under test to diagnose whether it is sensitive due to interference in the digital logic circuit.

[0009] Furthermore, in step S1, testing the test product specifically includes:

[0010] S101, preheat the test product to a stable working state;

[0011] S102, using a signal generating device to generate a pulse train;

[0012] S103. Scan the rising edge of the pulse in 1ns-100ns steps, keeping the pulse duration and time duty cycle unchanged. For each rising edge parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce. If the test product is sensitive, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just reappears. At this time, the interference signal level is the sensitive threshold, and ns represents nanoseconds.

[0013] S104. Repeat steps S102 to S103 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product along with the rising edge of the transient pulse signal.

[0014] Furthermore, in step S2, testing the test product specifically includes:

[0015] S201, preheat the test product to a stable working state;

[0016] S202, using a signal generating device to generate a pulse train;

[0017] S203, fix the pulse repetition period to 1ms, scan the time duty cycle in 1% steps within the range of 10% to 100%, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just repeats, at this time the interference signal level is the sensitive threshold, ms means milliseconds;

[0018] S204, injecting a fixed signal with a duration of 10 seconds, and calculating the energy threshold that makes the test object sensitive under different time duty cycles;

[0019] S205. Repeat steps S202 to S204 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product with the time duty cycle of the transient pulse signal.

[0020] Furthermore, in step S3, testing the test product specifically includes:

[0021] S301, preheat the test product to a stable working state;

[0022] S302, using a signal generating device to generate a pulse train;

[0023] S303, fix the pulse repetition period to 1ms, scan the time duty cycle in 10% to 100% steps, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can generate, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs, at this time the interference signal level is the sensitive threshold, and the first sensitive threshold curve is obtained;

[0024] S304, the low level duration of the fixed pulse is 5ms, and the high level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each high level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the second sensitive threshold curve is obtained;

[0025] S305, the high level duration of the fixed pulse is 5ms, and the low level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each low level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the third sensitive threshold curve is obtained;

[0026] S306. Select the time domain parameter that has the greatest impact on the sensitive threshold from the first sensitive threshold curve, the second sensitive threshold curve, and the third sensitive threshold curve. If the time domain parameter with the greatest impact is the low-level duration, it is determined that the combinational logic circuit is disturbed. If the time domain parameter with the greatest impact is the high-level duration, it is determined that the finite state machine in the sequential logic circuit is disturbed. If the time domain parameter with the greatest impact is the time duty cycle, it is determined that the accumulator circuit or the proportional circuit in the sequential logic circuit is disturbed.

[0027] In a second aspect, the present invention provides a computer device, including a memory, wherein the memory stores program instructions, and when the program instructions are executed, the electromagnetic susceptibility diagnostic method described above is executed.

[0028] The beneficial effects of the present invention are:

[0029] The present invention selects a pulse signal as an excitation signal for an electromagnetic sensitivity test, investigates and analyzes the mechanism of electromagnetic sensitivity in an electronic information system, selects a pulse signal with an adjustable rising edge as an excitation signal, adjusts the rising edge of the excitation signal, and if the sensitivity threshold of the test product is directly related to the rising edge of the pulse signal, it is determined that the differential circuit is partially disturbed and causes sensitivity, selects a pulse signal with an adjustable time duty cycle as an excitation signal, adjusts the time duty cycle, and if the sensitivity threshold of the test product is related to the time duty cycle, and within a fixed time period, the energy that makes the test product sensitive is a constant value, it is determined that the integral circuit is partially disturbed; otherwise, the test product may be sensitive due to partial disturbance of the digital logic circuit, and finally diagnoses the type of digital logic circuit disturbance of the test product, thereby realizing targeted diagnosis of the sensitivity of electromagnetic equipment in a complex environment and providing better support for the design of protective measures for electromagnetic equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Figure 1 This is a flow chart of an electromagnetic susceptibility diagnosis method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0031] To make the purpose, technical solution and advantages of the embodiments of the present invention more clear, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention.

[0032] The present invention provides an electromagnetic susceptibility diagnosis method, such as Figure 1 As shown, including:

[0033] S1. Select a pulse signal with an adjustable rising edge as an excitation signal, adjust the rising edge of the excitation signal, test the product under test, obtain the variation rule of the sensitive threshold of the product under test with the rising edge of the transient pulse, and diagnose according to the variation rule. If the sensitive threshold of the product under test is directly related to the rising edge of the pulse signal, it is determined that the product under test is sensitive due to the interference of the differential circuit part, otherwise, enter step S2;

[0034] The electromagnetic excitation signal used in this test is a pulse signal with an adjustable rising edge. The signal line in the test product is tested according to the following steps:

[0035] S101, preheat the test product to a stable working state;

[0036] S102, using a signal generating device to generate a pulse train;

[0037] S103. Scan the rising edge of the pulse in 1ns-100ns steps, keeping the pulse duration and time duty cycle unchanged. For each rising edge parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce. If the test product is sensitive, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just reappears. At this time, the interference signal level is the sensitive threshold, and ns represents nanoseconds.

[0038] S104. Repeat steps S102 to S103 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product along with the rising edge of the transient pulse signal.

[0039] S2, select a pulse signal with an adjustable time duty cycle as an excitation signal, adjust the time duty cycle, test the test product, obtain the change rule of the test product's sensitive threshold with the time duty cycle of the transient pulse signal, and diagnose according to the change rule. If the test product's sensitive threshold is related to the time duty cycle, and within a fixed time period, the energy that makes the test product sensitive is a constant value, then it is determined that the test product is partially disturbed in the integration circuit, otherwise, enter step S3;

[0040] The electromagnetic excitation signal used in this test is a pulse signal with an adjustable time duty cycle. The signal line in the test product is tested according to the following steps:

[0041] S201, preheat the test product to a stable working state;

[0042] S202, using a signal generating device to generate a pulse train;

[0043] S203, fix the pulse repetition period to 1ms, scan the time duty cycle in 1% steps within the range of 10% to 100%, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just repeats, at this time the interference signal level is the sensitive threshold, ms means milliseconds;

[0044] S204, injecting a fixed signal with a duration of 10 seconds, and calculating the energy threshold that makes the test object sensitive under different time duty cycles;

[0045] S205. Repeat steps S202 to S204 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product with the time duty cycle of the transient pulse signal.

[0046] S3. Test the product under test to diagnose whether it is sensitive due to interference in the digital logic circuit.

[0047] The electromagnetic excitation signal used in this test is a pulse signal with an adjustable time duty cycle. The signal line in the test product is tested according to the following steps:

[0048] S301, preheat the test product to a stable working state;

[0049] S302, using a signal generating device to generate a pulse train;

[0050] S303, fix the pulse repetition period to 1ms, scan the time duty cycle in 10% to 100% steps, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can generate, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs, at this time the interference signal level is the sensitive threshold, and the first sensitive threshold curve is obtained;

[0051] S304, the low level duration of the fixed pulse is 5ms, and the high level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each high level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the second sensitive threshold curve is obtained;

[0052] S305, the high level duration of the fixed pulse is 5ms, and the low level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each low level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the third sensitive threshold curve is obtained;

[0053] S306. Select the time domain parameter that has the greatest impact on the sensitive threshold from the first sensitive threshold curve, the second sensitive threshold curve, and the third sensitive threshold curve. If the time domain parameter with the greatest impact is the low-level duration, it is determined that the combinational logic circuit is disturbed. If the time domain parameter with the greatest impact is the high-level duration, it is determined that the finite state machine in the sequential logic circuit is disturbed. If the time domain parameter with the greatest impact is the time duty cycle, it is determined that the accumulator circuit or the proportional circuit in the sequential logic circuit is disturbed.

[0054] The above is only a preferred embodiment of the present invention. It should be understood that the present invention is not limited to the form disclosed herein, and should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be modified within the scope of the concept described herein through the above teachings or the technology or knowledge of the relevant field. The changes and modifications made by those skilled in the art shall not deviate from the spirit and scope of the present invention, and shall be within the scope of protection of the claims attached to the present invention.

Claims

1. A method for diagnosing electromagnetic susceptibility, characterized in that: include: S1. Select a pulse signal with an adjustable rising edge as an excitation signal, adjust the rising edge of the excitation signal, test the product under test, obtain the variation rule of the sensitive threshold of the product under test with the rising edge of the transient pulse, and diagnose according to the variation rule. If the sensitive threshold of the product under test is directly related to the rising edge of the pulse signal, it is determined that the differential circuit of the product under test is partially disturbed and thus becomes sensitive, otherwise, proceed to step S2. S2, select a pulse signal with an adjustable time duty cycle as an excitation signal, adjust the time duty cycle, test the test product, obtain the change rule of the test product's sensitive threshold with the time duty cycle of the transient pulse signal, and diagnose according to the change rule. If the test product's sensitive threshold is related to the time duty cycle, and within a fixed time period, the energy that makes the test product sensitive is a constant value, then it is determined that the test product is partially disturbed in the integration circuit, otherwise, enter step S3; S3. Test the product under test to diagnose whether it is sensitive due to interference in the digital logic circuit.

2. The electromagnetic susceptibility diagnostic method according to claim 1, characterized in that: In step S1, testing the test product specifically includes: S101, preheat the test product to a stable working state; S102, using a signal generating device to generate a pulse train; S103. Scan the rising edge of the pulse in 1ns-100ns steps, keeping the pulse duration and time duty cycle unchanged. For each rising edge parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce. If the test product is sensitive, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just reappears. At this time, the interference signal level is the sensitive threshold, and ns represents nanoseconds. S104. Repeat steps S102 to S103 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product along with the rising edge of the transient pulse signal.

3. The electromagnetic susceptibility diagnostic method according to claim 1, characterized in that: In step S2, testing the test product specifically includes: S201, preheat the test product to a stable working state; S202, using a signal generating device to generate a pulse train; S203, fix the pulse repetition period to 1ms, scan the time duty cycle in 1% steps within the range of 10% to 100%, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can produce, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just repeats, at this time the interference signal level is the sensitive threshold, ms means milliseconds; S204, injecting a fixed signal with a duration of 10 seconds, and calculating the energy threshold that makes the test object sensitive under different time duty cycles; S205. Repeat steps S202 to S204 for cables that meet the requirements, and obtain a variation rule of the sensitivity threshold of the test product with the time duty cycle of the transient pulse signal.

4. The electromagnetic susceptibility diagnostic method according to claim 1, characterized in that: In step S3, testing the test product specifically includes: S301, preheat the test product to a stable working state; S302, using a signal generating device to generate a pulse train; S303, fix the pulse repetition period to 1ms, scan the time duty cycle in 10% to 100% steps, for each time duty cycle parameter, increase the output power to the maximum power that the test product is sensitive to or that the test product can generate, if sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs, at this time the interference signal level is the sensitive threshold, and the first sensitive threshold curve is obtained; S304, the low level duration of the fixed pulse is 5ms, and the high level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each high level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the second sensitive threshold curve is obtained; S305, the high level duration of the fixed pulse is 5ms, and the low level duration is scanned in 0.1ms steps within the range of 0.1ms to 10ms. For each low level duration, the output power is increased to the maximum power that the test product is sensitive to or that can be generated by the test product. If sensitivity occurs, first reduce the interference signal level until the test product returns to normal, then continue to reduce the interference signal level to the set value, and then gradually increase the interference signal level until the sensitive phenomenon just recurs. At this time, the interference signal level is the sensitive threshold, and the third sensitive threshold curve is obtained; S306. Select the time domain parameter that has the greatest impact on the sensitive threshold from the first sensitive threshold curve, the second sensitive threshold curve, and the third sensitive threshold curve. If the time domain parameter with the greatest impact is the low-level duration, it is determined that the combinational logic circuit is disturbed. If the time domain parameter with the greatest impact is the high-level duration, it is determined that the finite state machine in the sequential logic circuit is disturbed. If the time domain parameter with the greatest impact is the time duty cycle, it is determined that the accumulator circuit or the proportional circuit in the sequential logic circuit is disturbed.

5. A computer device, comprising a memory, wherein the memory stores program instructions, characterized in that: When the program instructions are executed, the electromagnetic susceptibility diagnosis method according to any one of claims 1 to 4 is executed.

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