Automatic test capacitor surge test control method and system

Abstract

The invention discloses an automatic test capacitor surge test control method and system, and the method comprises the steps: setting test parameters according to the surge current test requirements of a to-be-tested tantalum capacitor, carrying out the cyclic charging and discharging test of the surge of the tantalum capacitor according to the set parameters, and obtaining the test result of the surge of the tantalum capacitor. According to the invention, the test result can be rapidly and clearly obtained by carrying out cyclic charging and discharging test on the tantalum capacitor surge, the control process is simple and efficient, the logic is clear, stable and reliable, the main control module is used for control, the structure is stable, the control logic is simple, and the test result can be rapidly and clearly obtained.

Description

Technical Field

[0001] The present invention belongs to the field of electronic test and measurement technology, and relates to electronic component testing, automatic test equipment, electrical characteristic analysis, and electronic manufacturing and quality control technology, and specifically relates to an automated test capacitor surge test control method and system. Background Art

[0002] With the rapid development of science and technology, the requirements for performance and stability of electronic equipment are increasing day by day. As a key electronic component, the performance of tantalum capacitors directly affects the working effect of electronic equipment. In the fields of aviation, aerospace, medical treatment, communications, etc., the accuracy, reliability and life of tantalum capacitors are extremely high. Therefore, the tantalum capacitor automatic control test system came into being, aiming to accurately control the production process of tantalum capacitors through automation means, to ensure its stable and reliable performance, and to meet the needs of high-end electronic equipment. Industrial automation control system, program control system PLC realizes the control of production lines through programmable logic controllers.

[0003] Disadvantages of PLC automation control: High cost. Compared with traditional relay control systems, the initial investment cost of PLC is higher. Fault diagnosis is difficult. Complex PLC systems may fail, and fault diagnosis and troubleshooting require professional technicians and tools. The software is highly dependent. The function of PLC depends largely on the software. The stability and update of the software may affect the performance of the entire system. Summary of the invention

[0004] The object of the present invention is to provide an automated capacitor surge test control method and system to overcome the problems of low control accuracy and poor reliability of capacitor surge test in the prior art.

[0005] To achieve the above purpose, the technical solution adopted by the present invention is as follows: An automated capacitor surge test control method comprises the following steps: S1, set the test parameters according to the surge current test requirements of the tantalum capacitor to be tested; S2, performing a cyclic charge and discharge test on the tantalum capacitor surge according to the set parameters, and then obtaining the test result of the tantalum capacitor surge.

[0006] Preferably, the number of cycles is set to 5 times according to the surge current test requirements of the tantalum capacitor to be tested.

[0007] Preferably, according to the surge current test requirement of the tantalum capacitor to be tested, the charging time is 3-5s.

[0008] Preferably, according to the surge current test requirement of the tantalum capacitor to be tested, the discharge time is 3-5s.

[0009] Preferably, the test result of the tantalum capacitor surge is obtained including voltage, current and temperature parameters of the tantalum capacitor during the test.

[0010] Preferably, the comprehensive performance results of the tantalum capacitor under set surge current test conditions include the capacitor's tolerance, life estimation, and failure threshold.

[0011] An automated capacitor surge test control system includes a main control module, a switch control module and an electric power relay drive module; The main control module is used to set the test parameters according to the surge current test requirements of the tantalum capacitor to be tested; the electric power relay drive module performs cyclic charging and discharging of the tantalum capacitor surge according to the set test parameters, and obtains the test results of the tantalum capacitor surge at the same time; the switch control module is used to start the test and to disconnect the test in an emergency during the test.

[0012] Preferably, the main control module adopts ATmega328PU main control chip, and the main control chip is connected to the switch control module and the electric power relay drive module.

[0013] Preferably, the ATmega328PU main control chip is also connected to a display screen module.

[0014] Preferably, the number of cycles is set to 5 times according to the surge current test requirements of the tantalum capacitor to be tested; the charging time is set to 3-5s according to the surge current test requirements of the tantalum capacitor to be tested; and the discharge time is set to 3-5s according to the surge current test requirements of the tantalum capacitor to be tested.

[0015] Compared with the prior art, the present invention has the following beneficial technical effects: The present invention provides an automated capacitor surge test control method. The test parameters are set according to the surge current test requirements of a tantalum capacitor to be tested. A cyclic charge and discharge test is performed on the tantalum capacitor surge according to the set parameters, and then the test result of the tantalum capacitor surge is obtained. The present invention can quickly and clearly obtain the test result by performing a cyclic charge and discharge test on the tantalum capacitor surge. The control process is simple, efficient, clear in logic, stable and reliable.

[0016] The present invention discloses an automated capacitor surge test control system, comprising a main control module, a switch control module and an electric power relay drive module. The main control module is used to set a test parameter of a tantalum capacitor surge current to be tested. The tantalum capacitor surge is cyclically charged and discharged using the test parameter set by the electric power relay drive module, and a test result of the tantalum capacitor surge is obtained simultaneously. The present invention uses the main control module for control, has a stable structure, and has a simple control logic, and can quickly and clearly obtain a test result. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1This is a flow chart of the automated capacitor surge test control method in an embodiment of the present invention. DETAILED DESCRIPTION

[0018] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0019] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0020] like Figure 1 As shown, the present invention provides an automated test capacitor surge test control method, which specifically includes the following steps: S1, set the test parameters according to the surge current test requirements of the tantalum capacitor to be tested; S2, performing a cyclic charge and discharge test on the tantalum capacitor surge according to the set parameters, and then obtaining the test result of the tantalum capacitor surge.

[0021] In a specific implementation manner of the present application, the test parameters are set according to the surge current test requirements of the tantalum capacitor to be tested, including the number of cycles, charging time, and discharging time; the number of cycles refers to the number of repetitions of the charging and discharging operations on the tantalum capacitor during the entire test process. The expected service life of the capacitor, the operating frequency in the application scenario, and the purpose of the test need to be considered comprehensively. If the test is intended to evaluate the performance stability of the capacitor under long-term continuous operation, the number of cycles should be set relatively high to fully simulate the long-term performance of the capacitor in actual applications. Conversely, if the test focuses on quickly screening qualified products or conducting preliminary performance verification, the number of cycles can be appropriately reduced.

[0022] The charging time is the time required from the start of the test until the capacitor reaches the preset charging voltage. The setting of this parameter is affected by many factors, including the output power of the test power supply, the capacity of the capacitor, the design of the charging circuit, and the charging rate in the test requirements. The charging time setting is crucial to accurately evaluate the charging performance of the capacitor. Too short a charging time may cause the capacitor to fail to fully charge, thus failing to accurately reflect its performance in actual applications; while too long a charging time may increase the test time and cost, and is not conducive to quickly screening out capacitors with excellent performance.

[0023] The discharge time is the time required from the beginning of the capacitor's discharge to the voltage dropping to the preset discharge threshold. Similar to the charging time, the setting of the discharge time also needs to take into account multiple factors, including the capacity of the capacitor, the design of the discharge circuit, the discharge rate in the test requirements, and the purpose of the test. The accurate setting of the discharge time is of great significance for evaluating the capacitor's discharge performance, energy release capacity, and internal resistance. At the same time, the setting of the discharge time must also consider test safety to avoid excessive heat or voltage spikes generated by the capacitor during the discharge process, thereby damaging the test equipment or causing safety hazards.

[0024] In a specific embodiment of the present application, the number of cycles is set to 5 times according to the surge current test requirements of the tantalum capacitor to be tested; the charging time is 3-5s according to the surge current test requirements of the tantalum capacitor to be tested, and the discharge time is 3-5s according to the surge current test requirements of the tantalum capacitor to be tested.

[0025] In a specific implementation of the present application, the peak value for testing the surge current is to determine the maximum instantaneous current value that the tantalum capacitor needs to withstand during the test, which is set based on the capacitor's specification and the expected maximum current in the application scenario.

[0026] In a specific implementation of the present application, the charge and discharge rate is tested: the speed of capacitor charge and discharge, that is, how fast the current changes per unit time, is set to evaluate the performance of the capacitor under fast charge and discharge conditions.

[0027] In a specific implementation manner of the present application, the number of test cycles: determines the number of cycles for performing charge and discharge tests to fully simulate the life cycle and stability performance of the capacitor in actual use.

[0028] In the specific implementation of the present application, the test voltage: sets the voltage value applied to both ends of the capacitor during the test, which must be ensured to be within a safe range and can effectively stimulate the surge current characteristics of the capacitor.

[0029] In the specific implementation manner of the present application, the test temperature conditions: consider testing under different temperature environments, because temperature has a significant impact on the performance of the capacitor, including the capacitance, internal resistance and leakage current of the capacitor.

[0030] In the specific implementation manner of the present application, monitoring parameters: clearly define the data that needs to be monitored during the test process, including voltage fluctuations, temperature changes, internal resistance changes, and whether the capacitor has a short circuit or open circuit fault.

[0031] After setting the above parameters, the tantalum capacitor can be subjected to a surge current cycle charge and discharge test according to the preset scheme. During the test, high-precision power supply equipment and measuring instruments are used to ensure precise control of test conditions and accuracy of data collection.

[0032] Cyclic charge and discharge test: The capacitor is charged and discharged for multiple cycles according to the set charge and discharge rate and voltage conditions. After each cycle, it is paused for a period of time according to the set test interval to simulate the intermittent working state in actual application and observe the recovery of the capacitor.

[0033] Data recording and analysis: During the test, the changes in voltage, current, temperature parameters, and any abnormal performance of the capacitor are recorded in real time. After the test is completed, the collected data is analyzed in depth using software or tools to evaluate the performance stability, life prediction, and possible failure modes of the capacitor under surge current conditions.

[0034] Obtaining test results: Based on the above tests and analysis, a comprehensive performance evaluation report of tantalum capacitors under specific surge current test conditions is finally obtained, including the capacitor's tolerance, life estimation, and failure threshold, providing a scientific basis for capacitor selection, design optimization, and reliability evaluation.

[0035] In a specific implementation manner of the present application, the number of cycles, charging time and discharging time of the surge current of the tantalum capacitor to be tested during the test process are adjustable.

[0036] The present invention provides an automated capacitor surge test control system for the above-mentioned automated capacitor surge test control method, which specifically includes a main control module, a switch control module and an electric power relay drive module. The main control module is used to set test parameters according to the surge current test requirements of the tantalum capacitor to be tested; the electric power relay drive module performs cyclic charging and discharging of the tantalum capacitor surge according to the set test parameters, and simultaneously obtains the test results of the tantalum capacitor surge; the switch control module is used to start the test and to disconnect the test in an emergency during the test.

[0037] In the specific implementation of the present application, the main control module adopts ATmega328PU main control chip, which is connected to the switch control module and the electric power relay drive module. The ATmega328PU main control chip is a high-performance, low-power main control chip with rich peripheral interfaces and high integration. The main control module is stably and efficiently connected to the switch control module and the electric power relay drive module, realizing intelligent management and precise control of the entire system.

[0038] Specifically, the main control chip ATmega328PU establishes a direct communication link with the switch control module through its programmable input and output port (GPIO). The switch control module is responsible for receiving instructions from the main control chip and performing precise on / off operations on various switch devices in the system, thereby achieving instant control of the circuit on and off. This design not only improves the system's response speed, but also ensures the accuracy and reliability of control.

[0039] At the same time, the ATmega328PU main control chip is also connected to the electric power relay drive module through the drive circuit. As the core of power control, the electric power relay drive module can drive the high-power relay to perform on-off operations according to the instructions of the main control chip, thereby controlling the connection and disconnection of high-voltage and high-current loads. This application enables the system to easily cope with various complex power control requirements.

[0040] The communication interfaces of the ATmega328PU main control chip include USART, SPI and I2C interfaces, which provide the system with the ability to transmit and interact with external devices. The ATmega328PU main control chip is also connected to a display module and a power module. The test results and cycle times of the ATmega328PU main control chip can be displayed through the display module, achieving more intelligent control and monitoring.

[0041] The main control module uses ATmega328PU as the main control chip, and through close cooperation with the switch control module and the power relay drive module, an efficient, stable and easy-to-expand power control system is built. This system can not only meet the needs of various complex application scenarios, but also provide strong technical support for the realization of intelligent and automated power management.

[0042] The display screen module specifically adopts a 1602 display screen, and the set number of cycles is displayed on the 1602 display screen.

[0043] In the specific implementation of the present application, the expected time required for the surge current to stabilize is set. This time is set according to the characteristics of the device under test and the test requirements: Maximum current setting: Enter the maximum value of the expected surge current. This value is used to ensure that the test instrument does not exceed its measurement range during measurement.

[0044] Rated current setting: Enter the current value of the device under normal working conditions. This value is used to compare with the surge current to evaluate the impact of the surge current on the device.

[0045] Surge threshold setting: When the current reaches this setting value, it indicates that a surge event has occurred. This value is usually set according to the surge current tolerance of the device under test.

[0046] The display module is used to show the display mode set by the test, such as trend graph, waveform graph or analysis list.

[0047] At the same time, set the time base and amplitude: The time base setting determines the length of time represented by each grid on the waveform. According to the test requirements, select the appropriate time length to observe the waveform of the surge current.

[0048] The amplitude setting determines the voltage or current value represented by each grid on the waveform. Similarly, select the appropriate amplitude range according to the test requirements.

[0049] Surge current test cycle number display setting: Enter the setup interface: First, the user needs to enter the setup interface of the main control module or the test parameter configuration area.

[0050] Select the number of cycles setting: In the settings interface, find the settings related to the number of cycles.

[0051] Enter the number of loops: According to the test requirements, enter the required number of cycles. The test instrument will automatically perform the surge current impact test according to the set number of cycles. After entering the number of cycles, confirm the settings and save. The test instrument will start testing according to the number of cycles set by the user.

[0052] The charging test function is used to evaluate the ability of the device under test to withstand surge current during the charging process. Connect the tantalum capacitor surge to be tested to the test system and ensure that all connections are firm and reliable. According to the characteristics and application requirements of the tantalum capacitor surge device to be tested, start the test instrument and begin to apply simulated surge current pulses. Observe and record the changes in voltage, current and other parameters of the device under test during the test.

[0053] In a specific embodiment of the present invention, the tantalum capacitor surge current test system controls the entire system through the ATmega328PU main control chip. The user controls the switch control module through the button to input the number of cycle tests to the system. The ATmega328PU main control chip displays the result set by the user through the display module, such as "Number=5". After the user presses the "Start" button, the display screen will display the system working status "state: charge", indicating that it is currently in the surge test state. "state: discharge" means that the tantalum capacitor to be tested is in the discharge state, and the energy storage capacitor is in the energy replenishment state. "CS5" means that the fifth surge test is currently being carried out; "4" means that the countdown unit of the current test state is "seconds", the charging time is set to 4s, the discharge time is set to 4s, and the number of cycles is set to 5 times.

[0054] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. An automated capacitor surge test control method, characterized in that: The following steps are involved: S1, set the test parameters according to the surge current test requirements of the tantalum capacitor to be tested; S2, performing a cyclic charge and discharge test on the tantalum capacitor surge according to the set parameters, and then obtaining the test result of the tantalum capacitor surge.

2. The method for controlling an automated capacitor surge test according to claim 1, characterized in that: According to the surge current test requirements of the tantalum capacitor to be tested, the number of cycles is set to 5 times.

3. The method for controlling an automated capacitor surge test according to claim 1, characterized in that: According to the surge current test requirement of the tantalum capacitor to be tested, the charging time is 3-5s.

4. The method for controlling an automated capacitor surge test according to claim 1, characterized in that: According to the surge current test requirement of the tantalum capacitor to be tested, the discharge time is 3-5s.

5. The method for controlling an automated capacitor surge test according to claim 1, characterized in that: The test results of tantalum capacitor surge are obtained including the voltage, current and temperature parameters of the tantalum capacitor during the test.

6. The method for controlling an automated capacitor surge test according to claim 5, characterized in that: Obtain comprehensive performance results of tantalum capacitors under set surge current test conditions, including capacitor withstand capability, life estimation, and failure threshold.

7. An automated capacitor surge test control system, characterized in that: It includes a main control module, a switch control module and an electric power relay drive module; The main control module is used to set the test parameters according to the surge current test requirements of the tantalum capacitor to be tested; the electric power relay drive module performs cyclic charging and discharging of the tantalum capacitor surge according to the set test parameters, and obtains the test results of the tantalum capacitor surge at the same time; the switch control module is used to start the test and to disconnect the test in an emergency during the test.

8. The automated capacitor surge test control system according to claim 7, characterized in that: The main control module adopts ATmega328PU main control chip, and the main control chip is connected to the switch control module and the electric power relay drive module.

9. The automated capacitor surge test control system according to claim 7, characterized in that: The ATmega328PU main control chip is also connected to a display module.

10. The automated capacitor surge test control system according to claim 7, characterized in that: According to the surge current test requirements of the tantalum capacitor to be tested, the number of cycles is set to 5 times; according to the surge current test requirements of the tantalum capacitor to be tested, the charging time is 3-5s; according to the surge current test requirements of the tantalum capacitor to be tested, the discharge time is 3-5s.

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