CT Scanning System Error Correction Method, Device, Equipment, and Storage Medium

By determining the multi-energy X-ray attenuation data of the target model in the CT scanning system and establishing a mapping function between single-energy X-rays and multi-energy X-rays, the problem of difficulty in ray hardening correction and detector response consistency correction in the prior art is solved, and efficient image reconstruction is achieved and operation difficulty is reduced.

CN119595674BActive Publication Date: 2025-05-30SAINUO WEISHENG SCI & TECH BEIJING
2 Cites 0 Cited by

Patent Information

Application Number
CN202510139186.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-02-08
Publication Date
2025-05-30
Estimated Expiration
2045-02-08

AI Technical Summary

Technical Problem

Existing CT scanning systems are difficult to achieve effective ray hardening correction and detector response consistency correction in multi-energy X-ray scenarios, resulting in artifacts in image reconstruction and long data acquisition and analysis time.

Method used

By determining the multi-energy X-ray attenuation data of the target model at different rotation angles, and calculating the measured attenuation path of the X-ray passing through the target model, using the conversion factor between the attenuation data under single-energy X-rays and the attenuation path, a mapping function between the single-energy X-ray attenuation data and the multi-energy X-ray attenuation data is established to realize beam hardening correction and detector response consistency correction.

Benefits of technology

It effectively reduces data acquisition and analysis time, improves the accuracy and consistency of image reconstruction, and reduces the cost of the model and operation difficulty.

✦ Generated by Eureka AI based on patent content.
Patent Text Reader

Abstract

The CT scan system error correction method, device, equipment and medium provided by the embodiments of the present disclosure include: determining first attenuation data of a target phantom based on multi-energy X-rays at different rotation angles; determining the measured attenuation paths of X-rays passing through the target phantom at different rotation angles; determining second attenuation data of mono-energy X-rays passing through the target phantom at different rotation angles according to the measured attenuation paths and the conversion factor between the attenuation data and the attenuation paths under mono-energy X-rays; determining first target attenuation data and second target attenuation data under the target measured attenuation path according to the first attenuation data and the second attenuation data; and determining the mapping function between the mono-energy X-ray attenuation data and the multi-energy X-ray attenuation data under different target measured attenuation paths according to the first target attenuation data and the second target attenuation data under the target measured attenuation path. While beam hardening correction is achieved, detector response consistency correction is also achieved.
Need to check novelty before this filing date? Find Prior Art