Test equipment data synchronization processing method and system
By building a port data association graph and causal relationship model, and optimizing data synchronization strategy using graph neural network and self-attention mechanism, the problem of unstable data synchronization accuracy of multi-port test equipment is solved, high-precision data synchronization and fusion are achieved, and the intelligence level of test equipment is improved.
Patent Information
- Application Number
- CN202510355074.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-25
- Publication Date
- 2025-04-25
- Estimated Expiration
- 2045-03-25
AI Technical Summary
Existing multi-port testing equipment lacks adaptive optimization capabilities in data synchronization strategies, resulting in unstable data alignment accuracy and difficulty in dynamically adjusting synchronization strategies, affecting the accuracy of data fusion and subsequent analysis.
By constructing a port data association graph, determining the connection relationship between ports based on the time-varying adjacency matrix, using the graph neural network to extract port data characterization, and optimizing the data synchronization strategy; building a causal relationship model, analyzing the influencing factors of data synchronization error, identifying the propagation path of data deviation between ports, calculating the data drift amount, and optimizing the synchronization window based on causal inference to correct data drift; time alignment of port data is constructed, a unified time scale is used, and modal key information is extracted based on feature encoding, and cross-modal data association is determined using a self-attention mechanism to optimize feature matching between ports.
It realizes dynamic adjustment of data synchronization parameters, reduces data drift errors, improves high-precision synchronous alignment and fusion of port data, improves data consistency, provides high-quality data input for data analysis, abnormal detection and prediction of test equipment, and improves the stability and intelligence level of test equipment.