SSD test method, device and equipment based on AECQ100 standard

Abstract

The invention discloses an SSD testing method, device and equipment based on the AECQ100 standard, and relates to the technical field of solid state disk testing. The method comprises the steps that a testing device capable of supplying power to a plurality of SSDs to be tested at the same time is created, configuration parameters related to testing are set through MP Tool software to generate a configuration parameter file, and the configuration parameter file is written into NAND Flash of the SSDs to be tested; unified power-on and power-off operation is conducted on the SSD to be tested based on the testing device, corresponding testing codes are run according to the configuration parameter file, and AECQ100 standard testing of the SSD to be tested is achieved; and based on the AECQ100 standard test result and the flicker state of the indicator lamp on the SSD to be tested, judging whether the SSD test is passed or not. Through automatic testing, the labor cost is reduced, and the testing efficiency is improved.

Description

Technical Field

[0001] This application relates to the technical field of solid-state drive testing, and specifically relates to an SSD testing method, device, and equipment based on the AECQ100 standard. Background Art

[0002] An SSD (Solid State Drive) is a storage device composed of several NAND Flash (NAND flash memory chips) flash arrays, and is a data storage device different from traditional hard disks. Data is stored in non-volatile storage units inside the NAND Flash, and the characteristics of concurrent I / O (Input / Output) operations of the NAND Flash array are utilized to achieve high-speed data transmission. The data of the NAND Flash is transmitted to the client through NVMe (NVM Express, Non-Volatile Memory Host Controller Interface Specification), SATA (a hard disk data transmission interface), or other protocols.

[0003] Currently, SSD testing based on the AECQ100 standard (a standard for quality and reliability verification of automotive integrated circuits) is mainly divided into two types, one is static testing, and the other is dynamic testing. Static testing mainly involves placing the powered-off SSD in a testing device and subjecting it to harsh environment tests such as high and low temperatures, vibration, shock, and damp heat cycling. Then, the SSD is powered on again, and it is judged whether the SSD can work normally, and whether the SSD passes the AECQ100 standard test is judged according to the working state of the SSD; dynamic testing mainly involves embedding a simple program in the main controller of the SSD, and then placing the SSD in a testing environment and subjecting it to test items such as high and low temperatures and periodic power on and off. After the test is completed, the running state of the SSD is checked to judge whether it passes the AECQ100 standard test.

[0004] The existing test solutions have the following problems: (1) They only simply test the reliability of the integrated circuits and components of the SSD system, without considering the data stability of NAND Flash, resulting in insufficient conditions for judging the failure of SSD system tests; (2) They do not consider that misoperations or frequent power - on and power - off may cause some Row Blocks of NAND Flash (logical storage units composed of Planes (NAND Flash storage single - block matrices composed of multiple Blocks) with the same Block Number inside several Dies (flash memory dies)) to be repeatedly read, written, and erased, leading to too high Program Erase Count (PEC) of this part of the Row Blocks, so that the PEC of the entire SSD is not evenly distributed, destroying the wear - leveling of the SSD, being unfavorable for the later use or sale of the SSD, and increasing the R & D cost; (3) The tests more tend to test the stability of integrated circuits and record the corresponding fault points, ignoring the detailed recording of NAND Flash errors and the recording of the number of bit inversions of Row Blocks, lacking the performance analysis of NAND Flash, and being unfavorable for the subsequent firmware development and improving the stability of the SSD system; (4) After the SSD card - opening is completed, the SSD needs to be taken out of the card - opening module, then placed on the test vehicle, and after the test is completed, the SSD is taken out of the test vehicle and put into the analysis module. Such tests and analyses increase the labor cost and reduce the production test efficiency. Summary of the Invention

[0005] This application provides an SSD test method, device, and equipment based on the AECQ100 standard, which reduces labor costs and improves test efficiency through automated testing.

[0006] In the first aspect, an embodiment of this application provides an SSD test method based on the AECQ100 standard. The SSD test method based on the AECQ100 standard includes:

[0007] Create a test device that can supply power to multiple SSDs to be tested simultaneously, set configuration parameters related to testing through the MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested;

[0008] Perform unified power - on and power - off operations on the SSD to be tested based on the test device, and run the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested;

[0009] Based on the AECQ100 standard test results and the flashing status of the indicator light on the SSD to be tested, determine whether the SSD test passes.

[0010] In combination with the first aspect, in one embodiment, the test device includes a power supply and a plurality of voltage conversion chips connected to the power supply, and each voltage conversion chip can be connected to a plurality of SSDs to be tested.

[0011] In combination with the first aspect, in one embodiment, setting configuration parameters related to testing through the MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested specifically includes:

[0012] Enter the parameter setting interface of the MP Tool software, and set the configuration parameters related to testing by means of selection or active filling;

[0013] The MP Tool software generates a configuration parameter file with the set configuration parameters;

[0014] Write the generated configuration parameter file into the set area of the NAND Flash of the SSD to be tested.

[0015] In combination with the first aspect, in one embodiment, the configuration parameters include running time, running cycles, new bad block bars, and test failure conditions.

[0016] In combination with the first aspect, in one embodiment, the test device performs unified power-on and power-off operations on the SSD to be tested, and runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested, specifically including:

[0017] The test device performs unified power-on and power-off on the SSD to be tested. The SSD to be tested is initialized and self-tested, and then waits for a set time;

[0018] The SSD to be tested runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested.

[0019] In combination with the first aspect, in one embodiment, implementing the AECQ100 standard test for the SSD to be tested, the specific test process includes:

[0020] During the test, the SSD to be tested saves snapshots regularly or according to the test progress. At the same time, the bit flip number of the NAND Flash and the NAND Flash read / write / erase failure information are recorded to obtain the test result information of the AECQ100 standard test;

[0021] Classify the test result information and write it into the set area of the NAND Flash of the SSD to be tested.

[0022] In combination with the first aspect, in one implementation, for the blinking state of the indicator light on the SSD to be tested, specifically:

[0023] When the indicator light is in the constantly-on state, it indicates that the test has not started and the SSD is initializing and self-checking;

[0024] When the indicator light is in the blinking state and the duration of both the on and off states is the first set duration, it indicates that the test is in progress;

[0025] When the indicator light is in the blinking state and the duration of both the on and off states is the second set duration, it indicates that the test has failed;

[0026] When the indicator light is in the blinking state and the duration of both the on and off states is the third set duration, it indicates that the test has succeeded.

[0027] In combination with the first aspect, in one implementation, after determining whether the SSD test passes based on the AECQ100 standard test result and the blinking state of the indicator light on the SSD to be tested, it further includes:

[0028] Establish communication between the MP Tool software running on the PC and the SSD to be tested, and the MP Tool software sends instructions to the SSD to be tested to obtain the AECQ100 standard test result and the basic information of the SSD to be tested;

[0029] Based on the obtained AECQ100 standard test result and basic information, the MP Tool software visually displays the fault points, error messages, and reliability performance of the NNAD Flash;

[0030] Upload the AECQ100 standard test result to the server for storage, and screen out the weak blocks and original bad block information of the NAND Flash and save them to the NAND Flash.

[0031] In the second aspect, an embodiment of the present application provides an SSD test device based on the AECQ100 standard, and the SSD test device based on the AECQ100 standard includes:

[0032] A device module, which is used to create a test device that can supply power to multiple SSDs to be tested simultaneously;

[0033] An opening card module, which is used to set configuration parameters related to the test through the MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested;

[0034] A test module, which is used to perform unified power-on and power-off operations on the SSD to be tested based on the test device, and run the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested;

[0035] A result acquisition module, which is used to determine whether the SSD test passes based on the AECQ100 standard test result and the blinking status of the indicator light on the SSD to be tested.

[0036] In a third aspect, an embodiment of the present application provides an SSD test device based on the AECQ100 standard, which is characterized in that the SSD test device based on the AECQ100 standard includes a processor, a memory, and an SSD test program based on the AECQ100 standard stored on the memory and executable by the processor. When the SSD test program based on the AECQ100 standard is executed by the processor, the steps of the above-mentioned SSD test method based on the AECQ100 standard are implemented.

[0037] The beneficial effects brought by the technical solution provided by the embodiment of the present application include:

[0038] It can effectively solve problems such as overly single SSD test design based on the AECQ100 standard, low test efficiency, test data loss, and insufficient determination of test results; the present application not only regards the integrated circuits and components of the SSD as the determination of test results, but also regards the data storage ability of NAND Flash as a condition for determining test results, which can further discover fault points and potential dangers; the present application saves context data in a snapshot manner to avoid the phenomenon of uneven wear of the SSD caused by repeated power-on and power-off; the present application can help optimize the performance of the SSD and improve the firmware code; the present application can perform automated testing, reduce the production cost of enterprises, and improve the production test efficiency. Description of the Drawings

[0039] Figure 1 It is a schematic flow chart of the SSD test method based on the AECQ100 standard of the present application;

[0040] Figure 2 It is a schematic structural diagram of the test device;

[0041] Figure 3 It is a schematic functional module diagram of the SSD test device based on the AECQ100 standard of the present application;

[0042] Figure 4 It is a schematic hardware structure diagram of the SSD test device based on the AECQ100 standard of the present application. Detailed Embodiments

[0043] To enable those skilled in the art to better understand the solution of this application, the following will clearly and completely describe the technical solution in the embodiments of this application with reference to the accompanying drawings in the embodiments of this application. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of this application.

[0044] To make the purpose, technical solution and advantages of this application clearer, the following will further describe the embodiments of this application in detail with reference to the accompanying drawings.

[0045] In a first aspect, the embodiments of this application provide an SSD testing method based on the AECQ100 standard. Starting from protecting the PEC of the SSD, improving the testing efficiency, and increasing the NAND Flash analysis, it improves the failure rate of the SSD system testing and further discovers potential failure points or threats in the SSD system, reduces the impact on the SSD PEC caused by abnormal power-off, increases the NAND Flash analysis data to provide data support for subsequent firmware optimization, and the automated testing reduces the labor cost and improves the testing efficiency.

[0046] In one embodiment, refer to Figure 1 , Figure 1 which is the flow schematic diagram of the SSD testing method based on the AECQ100 standard of this application. As Figure 1 shown, the SSD testing method based on the AECQ100 standard includes:

[0047] S1: Create a testing device that can supply power to multiple SSDs to be tested simultaneously, and set the configuration parameters related to the test through the MP Tool (card opening and test result acquisition tool) software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested;

[0048] Specifically, for the testing device, refer to Figure 2 shown. The testing device includes a power supply and multiple voltage conversion chips connected to the power supply, and each voltage conversion chip can be connected to multiple SSDs to be tested. The power supply is specifically 12V.

[0049] Furthermore, in one embodiment, setting the configuration parameters related to the test through the MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested specifically includes:

[0050] S101: Enter the parameter setting interface of the MP Tool software and set the configuration parameters related to the test by selection or active filling; that is, enter the parameter setting interface of the MP Tool software, and the tester sets the configuration parameters by checking or filling in the parameters. The entire test process can be controlled through the set configuration parameters. The configuration parameters include running time, number of running cycles, new bad block strip, and test failure conditions;

[0051] S102: The MP Tool software generates a configuration parameter file from the set configuration parameters;

[0052] S103: Write the generated configuration parameter file into the set area of the NAND Flash of the SSD to be tested. Specifically, after the MP Tool software generates a configuration parameter file for the configuration parameters, during the card opening process, the configuration parameter file is written into a specific area of the NAND Flash. When the SSD is powered on again, the program in the SSD controller will read the configuration parameter file from the NAND Flash and then parse the configuration parameter file to obtain the corresponding configuration parameters.

[0053] S2: Based on the test device, perform unified power-on and power-off operations on the SSD to be tested, and run the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested;

[0054] Further, in one embodiment, based on the test device, perform unified power-on and power-off operations on the SSD to be tested, and run the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested, specifically including:

[0055] S201: Through the test device, perform unified power-on and power-off on the SSD to be tested. The SSD to be tested is initialized and self-tested, and then waits for a set time;

[0056] S202: The SSD to be tested runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested.

[0057] Specifically, when the card opening is completed, at this time, through the test device, perform unified power-on and power-off on the SSD to be tested. The SSD to be tested will be initialized and self-tested, and then wait for a set time, such as waiting for 30 seconds. The reason for waiting for the set time without any operation is to prevent the starting Row Block of the NAND Flash from being repeatedly operated, resulting in phenomena such as too high PEC and wear imbalance; when the waiting time ends, the SSD to be tested runs the corresponding test code according to the configuration parameter file to meet the test requirements of the AECQ100 standard.

[0058] Further, in one embodiment, an AECQ100 standard test for the SSD to be tested is implemented. The specific test process includes:

[0059] S2021: During the test, the SSD to be tested saves snapshots regularly or according to the test progress. At the same time, the number of bit flips of the NAND Flash and the read / write / erase failure information of the NAND Flash are recorded to obtain the test result information of the AECQ100 standard test;

[0060] S2022: Classify the test result information and write it into the set area of the NAND Flash of the SSD to be tested.

[0061] Specifically, during the test, the SSD to be tested will save snapshots regularly or according to the test progress, ensuring that power-on and power-off cycles will not cause the loss of test data during SSD testing, and ensuring that the SSD can inherit the unfinished test and continue the test when powered on next time, preventing the phenomenon of excessive PEC and wear imbalance caused by repeated operation of some Row Blocks; and during the entire test process, the number of bit flips of the NAND Flash and the read / write / erase failure information of the NAND Flash will be recorded in detail. Finally, after the AECQ100 test is completed, the SSD will classify the test result information and then write this data into a special location of the NAND Flash for storage, facilitating later error analysis, NAND Flash performance analysis, and the improvement and optimization of subsequent firmware code, etc. This application can not only test the reliability and stability of SSD integrated circuits, components, and NAND Flash, but also play a role in screening NAND Flash.

[0062] S3: Based on the AECQ100 standard test result and the blinking status of the indicator light on the SSD to be tested, determine whether the SSD test passes. Specifically, when the test is completed, the tester can directly judge whether the test passes by checking the blinking status of the LED.

[0063] In this application, for the blinking status of the indicator light on the SSD to be tested, specifically:

[0064] When the indicator light is in a constantly on state, it means that the test has not started and the SSD is initializing and self-checking;

[0065] When the indicator light is in a blinking state and the duration of both the on and off states is the first set duration, it means that the test is in progress;

[0066] When the indicator light is in a blinking state and the duration of both the on and off states is the second set duration, it means that the test fails;

[0067] When the indicator light is in a flashing state and the duration of both the on and off states is the third set duration, it indicates a successful test.

[0068] It should be noted that the first set duration can be set to 1000 ms, the second set duration can be set to 250 ms, and the third set duration can be set to 2000 ms.

[0069] Furthermore, after determining whether the SSD test passes based on the AECQ100 standard test results and the flashing state of the indicator light on the SSD to be tested, it further includes:

[0070] S401: Establish communication between the MP Tool software running on a PC (Personal Computer) and the SSD to be tested. The MP Tool software sends instructions to the SSD to be tested to obtain the AECQ100 standard test results and the basic information of the SSD to be tested;

[0071] S402: Based on the obtained AECQ100 standard test results and basic information, the MP Tool software visually displays the fault points, error messages, and the reliability performance of the NNAD Flash;

[0072] S403: Upload the AECQ100 standard test results to the server for storage, and screen out the weak blocks and original bad block information of the NAND Flash and save them to the NAND Flash.

[0073] Specifically, the tester uses the MP Tool software running on the PC and establishes communication with the SSD through NVMe, SATA, or UART. The MP Tool software sends corresponding instructions to the SSD to obtain the AECQ100 test results and the basic information of the SSD. Then, the MP Tool software visually displays the fault points, error messages, and the reliability performance of the NNAD Flash, making the test results clear at a glance through the visual interface. Finally, the test results are uploaded to the server for storage. At the same time, the SSD test system will screen out information such as the weak blocks and original bad blocks of the NAND Flash and save them to the NAND Flash for convenient subsequent inheritance.

[0074] This application not only meets the test requirements of the AECQ100 standard but also combines static testing and dynamic testing into one, realizing automated testing, reducing the steps of repeatedly moving the SSD, and greatly reducing the workload of manpower; snapshot saving, power failure recovery, and NAND Flash data analysis modules are also added to the main control system to realize an automated testing system that integrates AECQ100 testing and production testing.

[0075] The present invention is mainly designed and implemented based on the AECQ10 test standard. The entire test process can not only test the stability and reliability of the main hardware modules of the SSD, such as integrated circuits, components, and NAND Flash, but also screen the NAND Flash. This application is completed on the test device from card opening to the end of the test. The entire test process does not require repeated handling of the SSD, reducing the probability of irreversible damage to the SSD, while reducing manpower and improving production test efficiency; the visualization of the card opening process to select configuration parameters improves the flexibility of the test. Testers can check test items according to test requirements, and at the same time, parameters such as running time, running cycles, and the number of Row Blocks of the NAND Flash can be configured; this application not only adds a 30S wait for no operation, but also adds a function of saving snapshots regularly or according to the test progress. If there is an incorrect operation or power-on / off test during the cycle, the recovery function module can restore to the state before power-off, and then continue to complete the unfinished state, thus avoiding the occurrence of wear imbalance caused by repeated operation of Row Blocks, protecting the NAND Flash as much as possible, and reducing losses. When the test is completed, the factory bad blocks of the NAND Flash and the newly generated bad blocks during the test will be written into a specific area of the NAND Flash for storage, which is convenient for future inheritance and management, reducing the need for the same test during subsequent production testing, and improving production efficiency. This application will upload the test results and data to the server for storage. Subsequently, developers can modify and improve the firmware design according to the performance of the NAND Flash during the test, further improving the data security and stability of the SSD.

[0076] In a second aspect, an embodiment of the present application further provides an SSD test device based on the AECQ100 standard.

[0077] In one embodiment, referring to Figure 3 , Figure 3 is a schematic diagram of the functional modules of the SSD test device based on the AECQ100 standard of the present application. As Figure 3 shown, the SSD test device based on the AECQ100 standard includes: a device module, a card opening module, a test module, and a result acquisition module.

[0078] The device module is used to create a test device that can supply power to multiple SSDs to be tested simultaneously; the card-opening module is used to set configuration parameters related to testing through the MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested; the test module is used to perform unified power-on and power-off operations on the SSD to be tested based on the test device, and run corresponding test codes according to the configuration parameter file to implement the AECQ100 standard test for the SSD to be tested; the result acquisition module is used to determine whether the SSD test passes based on the AECQ100 standard test result and the flashing status of the indicator light on the SSD to be tested.

[0079] Among them, the function implementation of each module in the above SSD test device based on the AECQ100 standard corresponds to each step in the above SSD test method embodiment based on the AECQ100 standard, and its function and implementation process will not be elaborated here one by one.

[0080] In a third aspect, an embodiment of the present application provides an SSD test device based on the AECQ100 standard. The SSD test device based on the AECQ100 standard can be a device with data processing functions such as a personal computer (PC), a laptop, or a server.

[0081] Refer to Figure 4 , Figure 4 which is a schematic diagram of the hardware structure of the SSD test device based on the AECQ100 standard involved in the solution of the embodiment of the present application. In the embodiment of the present application, the SSD test device based on the AECQ100 standard may include a processor, a memory, a communication interface, and a communication bus.

[0082] Among them, the communication bus can be of any type and is used to interconnect the processor, the memory, and the communication interface.

[0083] The communication interface includes input / output (I / O) interfaces, physical interfaces, and logical interfaces, etc., which are used to implement the interconnection of internal devices of the SSD test device based on the AECQ100 standard, and interfaces for implementing the interconnection of the SSD test device based on the AECQ100 standard with other devices (such as other computing devices or user devices). The physical interface can be an Ethernet interface, a fiber optic interface, an ATM interface, etc.; the user device can be a display screen (Display), a keyboard (Keyboard), etc.

[0084] The memory can be various types of storage media, such as random access memory (RAM), read-only memory (ROM), non-volatile RAM (NVRAM), flash memory, optical memory, hard disk, programmable ROM (PROM), erasable PROM (EPROM), electrically erasable PROM (EEPROM), etc.

[0085] The processor can be a general-purpose processor, which can call the SSD test program based on the AECQ100 standard stored in the memory and execute the SSD test method based on the AECQ100 standard provided in the embodiments of the present application. For example, the general-purpose processor can be a central processing unit (CPU). Among them, the method executed when the SSD test program based on the AECQ100 standard is called can refer to the various embodiments of the SSD test method based on the AECQ100 standard of the present application, which will not be elaborated here.

[0086] Those skilled in the art can understand that Figure 4 the hardware structure shown in

[0087] does not constitute a limitation to the present application, and may include more or fewer components than shown in the figure, or combine certain components, or have different component arrangements.

[0088] In the description of the embodiments of the present application, terms such as "exemplary", "for example" or "for instance" are used to represent examples, illustrations or explanations. Any embodiment or design solution described as "exemplary", "for example" or "for instance" in the embodiments of the present application should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Exactly speaking, using words such as "exemplary", "for example" or "for instance" aims to present relevant concepts in a specific manner.

[0089] In the description of the embodiments of the present application, unless otherwise specified, " / " means "or". For example, A / B may mean A or B. The "and / or" in the text is only a relationship describing the associated objects, indicating that there can be three relationships. For example, A and / or B may mean: A exists alone, A and B exist simultaneously, and B exists alone. In addition, in the description of the embodiments of the present application, "a plurality of" means two or more than two.

[0090] In some processes described in the embodiments of the present application, there are a plurality of operations or steps that appear in a specific order. However, it should be understood that these operations or steps may not be executed in the order in which they appear in the embodiments of the present application or may be executed in parallel. The serial numbers of the operations are only used to distinguish different operations, and the serial numbers themselves do not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed in order or in parallel, and these operations or steps may be combined.

[0091] Through the description of the above embodiments, those skilled in the art can clearly understand that the above-described embodiment methods can be implemented by means of software plus a necessary general hardware platform. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above and includes several instructions for causing a terminal device to execute the methods described in the various embodiments of the present application.

[0092] The above are only the preferred embodiments of the present application, and do not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present application, or directly or indirectly applied in other related technical fields, shall be equally included in the patent protection scope of the present application.

Claims

1. A SSD testing method based on the AECQ100 standard, characterized in that: The SSD test method based on the AECQ100 standard includes: Create a test device that can power multiple SSDs to be tested simultaneously, set test-related configuration parameters through MP Tool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested; The test device performs unified power-on and power-off operations on the SSD to be tested, and runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test of the SSD to be tested; Based on the AECQ100 standard test results and the flashing status of the indicator light on the SSD to be tested, it is possible to determine whether the SSD test has passed.

2. The SSD testing method based on the AECQ100 standard according to claim 1, characterized in that: The testing device includes a power supply and a plurality of voltage conversion chips connected to the power supply, and each voltage conversion chip can be connected to a plurality of SSDs to be tested.

3. The SSD testing method based on the AECQ100 standard as claimed in claim 1, characterized in that: The test-related configuration parameter settings are performed by MPTool software to generate a configuration parameter file and write it into the NAND Flash of the SSD to be tested, specifically including: Enter the parameter setting interface of MP Tool software and set the configuration parameters related to the test by selecting or actively filling in the parameters; MP Tool software generates a configuration parameter file with the set configuration parameters; Write the generated configuration parameter file into the setting area of ​​the NAND Flash of the SSD to be tested.

4. The SSD testing method based on the AECQ100 standard as claimed in claim 3, characterized in that: The configuration parameters include running time, running cycles, newly added bad block strips, and test failure conditions.

5. The SSD testing method based on the AECQ100 standard as claimed in claim 1, characterized in that: The test device performs a unified power-on and power-off operation on the SSD to be tested, and runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test of the SSD to be tested, specifically including: The SSD to be tested is powered on and off uniformly through the test device, and the SSD to be tested performs initialization and self-test, and then waits for the set time; The SSD to be tested runs the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test on the SSD to be tested.

6. The SSD testing method based on the AECQ100 standard as claimed in claim 5, characterized in that: The AECQ100 standard test of the SSD to be tested is implemented, and the specific test process includes: During the test, the SSD to be tested saves snapshots regularly or according to the test progress, and records the bit flip number of NAND Flash and NAND Flash read, write and erase failure information to obtain the test result information of AECQ100 standard test; The test result information is classified and written into a set area of ​​the NAND Flash of the SSD to be tested.

7. The SSD testing method based on the AECQ100 standard as claimed in claim 1, characterized in that: For the flashing status of the indicator light on the SSD to be tested, please refer to: When the indicator light is always on, it means the test has not started yet and the SSD is initializing and self-checking. When the indicator light is flashing, and the duration of on and off is the first set time, it means that the test is in progress; When the indicator light is flashing, and the duration of on and off is the second set time, it means the test has failed; When the indicator light is flashing and the duration of on and off is the third set time, it means the test is successful.

8. The SSD testing method based on the AECQ100 standard as claimed in claim 1, characterized in that: After determining whether the SSD test has passed based on the AECQ100 standard test results and the flashing status of the indicator light on the SSD to be tested, the following steps are also included: The MP Tool software running on the PC establishes communication with the SSD to be tested, and the MP Tool software sends instructions to the SSD to be tested to obtain the AECQ100 standard test results and basic information of the SSD to be tested; Based on the obtained AECQ100 standard test results and basic information, MP Tool software visualizes the failure point, error information, and NNADFlash reliability performance; The AECQ100 standard test results are uploaded to the server for storage, and the weak blocks and original bad block information of the NAND Flash are screened out and saved in the NAND Flash.

9. An SSD test device based on the AECQ100 standard, characterized in that: The SSD test device based on the AECQ100 standard includes: A device module, which is used to create a test device that can simultaneously power multiple SSDs to be tested; The card opening module is used to set the configuration parameters related to the test through the MP Tool software to generate the configuration parameter file and write it into the NAND Flash of the SSD to be tested; A test module, which is used to uniformly power on and off the SSD to be tested based on the test device, and run the corresponding test code according to the configuration parameter file to implement the AECQ100 standard test of the SSD to be tested; The result acquisition module is used to determine whether the SSD test has passed based on the AECQ100 standard test results and the flashing state of the indicator light on the SSD to be tested.

10. An SSD test device based on the AECQ100 standard, characterized in that: The SSD testing device based on the AECQ100 standard includes a processor, a memory, and an SSD testing program based on the AECQ100 standard stored in the memory and executable by the processor, wherein when the SSD testing program based on the AECQ100 standard is executed by the processor, the steps of the SSD testing method based on the AECQ100 standard as described in any one of claims 1 to 8 are implemented.

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