Radio frequency multi-vector synthesis impedance converter and method for measuring plural impedance points
By building a measurement module and fast algorithm in the RF multi-vector synthetic impedance converter, the problem of excessive measurement time of multi-vector synthetic impedance converter is solved, and fast measurement and efficient design are achieved.
Patent Information
- Application Number
- CN202410225245.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-02-29
- Publication Date
- 2025-07-22
AI Technical Summary
Multi-vector synthetic impedance converters take too long to measure complex impedance points, resulting in reduced application value.
The built-in measurement module and fast measurement algorithm of the RF multi-vector synthetic impedance converter are adopted to quickly obtain the measurement data of N1×N2×...×Nn complex impedance points by measuring N1+N2+...+Nn complex impedance points.
It greatly shortens the measurement time and improves the design and testing efficiency of high-power RF chips, modules and systems.
Smart Images
Figure CN120352693A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of radio frequency multi-vector synthesis impedance transformers, and particularly relates to a method for quickly measuring complex impedance points of a radio frequency multi-vector synthesis impedance transformer by using a multi-vector synthesis fast algorithm. Background Art
[0002] A multi-vector transformer (abbreviated as MVT) is an impedance transformer with an ultra-high reflection coefficient, capable of handling ultra-high power, having ultra-fine tuning capabilities, applicable to broadband, and with arbitrarily adjustable phase.
[0003] However, multi-vector synthesis requires measuring a large number of complex impedance points. Taking double-vector synthesis as an example, when measuring an impedance transformer, assuming that two vector transformers are both located at 1000 complex impedance points in the Smith chart domain, the number of point combinations that need to be located and measured is: 1000×1000 = 1000000, that is, one measurement requires locating 1 million points, taking nearly 170 hours, about 7 days; therefore, for a multi-vector impedance transformer, the time consumption increases exponentially, resulting in the loss of corresponding application value of the multi-vector impedance transformer. Summary of the Invention
[0004] Aiming at the deficiencies of the prior art, the present invention provides a radio frequency multi-vector synthesis impedance transformer and a method for measuring complex impedance points, which solves the technical problem that the vector synthesis transformer requires measuring a large number of complex impedance points during multi-vector synthesis, resulting in a relatively long time consumption.
[0005] To solve the above technical problems, the present invention provides the following technical solution: A radio frequency multi-vector synthesis impedance transformer includes a multi-vector impedance transformer as the main body. A measurement module for measuring several complex impedance points required for multi-vector synthesis is built into the multi-vector impedance transformer, and the multi-vector impedance transformer is connected to two ports of a vector network analyzer for active measurement, forming a radio frequency multi-vector synthesis impedance transformer that can quickly obtain measurement data.
[0006] Further, the measurement module uses a radio frequency multi-vector synthesis fast measurement algorithm MVSA to measure several complex impedance points of the multi-vector impedance transformer.
[0007] This technical solution also provides a method for measuring complex impedance points of the above radio frequency multi-vector synthesis impedance transformer. The measurement method includes the following steps:
[0008] S1. Place the multi-vector transformer at the 0 position, start the vector network analyzer to measure the S parameters of the multi-vector impedance transformer and output the results;
[0009] S2. Perform a global Smith chart measurement on the multi-vector impedance converter corresponding to the first vector converter to obtain the S-parameter matrix S 1AB (x, y), and convert the S-parameter matrix S 1AB (x, y) and the 0-bit matrix S 1AB (0, 0) obtained in step S1 into T matrices T 1AB (x, y) and T 1AB (0, 0), and perform a de-embedding operation to obtain the operation result;
[0010] S3. Place the first vector converter at the 0-bit, perform a global Smith chart measurement on the FC-TVB corresponding to the second vector converter to obtain the S-parameter matrix S 1AB (0, 0) including S 2AB (x, y), and convert it into a T matrix to obtain T 2AB (x, y);
[0011] S4. Perform a Cascade operation on the above two T matrices, that is, obtain a measurement file containing the synthesis of two vector converters, and then convert it back to the S-parameter matrix;
[0012] S5. Place the first vector converter and the second vector converter at the 0-bit, repeat the above operations for the third vector converter, and so on, to obtain the S-parameter matrix of the synthesis of n vectors, which is the number of complex impedance points included in the measurement data.
[0013] Further, in step S1, the multi-vector impedance converter is equivalent to a 50-ohm transmission line.
[0014] Further, in step S1, the output result is the S-parameter matrix: S 1AB (0, 0) @ x = 0, y = 0 initial position.
[0015] Further, in step S2, the operation result is:
[0016] T1(x, y) = T 1AB -1 (0, 0) * T 1AB (x, y)
[0017] Among them, the T1 matrix T 1AB is the transformation T matrix of the S-parameter matrix S 1AB .
[0018] Further, in step S3, the S-parameter matrix S 1AB (0, 0) including S 2AB (x, y), and convert it into a T matrix to obtain T 2ABThe expression of (x, y) is: T2(x, y) = T 2AB (x, y).
[0019] Furthermore, in step S4, the measurement file composed of the synthesis of two vector converters, when converted back to the expression of the S-parameter matrix, is:
[0020] Furthermore, in step S5, the measurement file composed of the synthesis of n vector converters, when converted back to the expression of the S-parameter matrix, is:
[0021] By means of the above technical solutions, the present invention provides a radio frequency multi-vector synthesis impedance converter and a method for measuring complex impedance points, which at least have the following beneficial effects:
[0022] The present invention does not need to measure one by one by locating a large number of complex impedance points of each vector converter combination. Only by measuring N1 + N2 +...... + Nn complex impedance points can the measurement data of N1 × N2 ×...... × Nn complex impedance points be obtained, making it possible for rapid radio frequency multi-vector synthesis measurement, greatly shortening the measurement time, and thus greatly improving the design and test efficiency of high-power radio frequency chips, modules and systems. Description of the Drawings
[0023] The drawings described herein are used to provide a further understanding of the present application and form a part of the present application. The schematic embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation to the present application. In the drawings:
[0024] Figure 1 It is a schematic diagram of the structural composition of the radio frequency multi-vector synthesis impedance converter (FC-MVT) of the present invention;
[0025] Figure 2 It is a schematic diagram of the principle of the double-vector synthesis transformation of the present invention;
[0026] Figure 3 It is a schematic connection diagram of the rapid measurement of the radio frequency multi-vector synthesis converter of the present invention;
[0027] Figure 4 It is an effect diagram of the global Smith chart tuning after the rapid measurement of the radio frequency multi-vector synthesis impedance converter FC-MVT of the present invention. Detailed Embodiments
[0028] To make the above objects, features and advantages of the present invention more obvious and understandable, the present invention will be further described in detail below with reference to the drawings and specific embodiments. Thereby, the implementation process of how the present application uses technical means to solve technical problems and achieve technical effects can be fully understood and implemented accordingly.
[0029] The multi-vector impedance transformer (Multi-Vector Transformer, abbreviated as MVT) is an impedance transformer with an ultra-high reflection coefficient, capable of handling ultra-high power, having ultra-fine tuning capabilities, applicable to broadband applications, and with arbitrarily adjustable phase.
[0030] However, multi-vector synthesis requires measuring a large number of complex impedance points. Taking double-vector synthesis as an example, when measuring the impedance transformer, assuming that two vector transformers are both located at 1000 complex impedance points in the Smith chart domain, the number of point combinations that need to be located and measured is: 1000×1000 = 1000000, that is, 1 million points need to be located for one measurement, taking nearly 170 hours, about 7 days; therefore, for the multi-vector impedance transformer, the time consumption increases exponentially, resulting in the loss of the corresponding application value of the multi-vector impedance transformer.
[0031] Based on the technical defect that the measurement time increases exponentially in the above-mentioned existing technology, please refer to Figures 1-4 , which shows a specific implementation manner of this embodiment. This embodiment proposes a radio frequency multi-vector synthesis impedance transformer, as Figure 1 shown, the radio frequency multi-vector synthesis impedance transformer (FC-MVT) consists of two parts: a multi-vector impedance transformer (MVT) and a built-in radio frequency multi-vector synthesis fast measurement algorithm MVSA (Multi-Vector Synthesis Algorithm, abbreviated as MVSA). As Figure 2 shown, taking the double reflection vector transformer as an example, the first transformer generates a reflection vector, which is superimposed on the reflection vector generated by the second transformer, and an ultra-high reflection coefficient can be obtained. Using the radio frequency multi-vector synthesis fast measurement algorithm MVSA, the data of the radio frequency multi-vector synthesis impedance transformer (FC-MVT) can be quickly obtained. Therefore, the radio frequency multi-vector synthesis impedance transformer includes a multi-vector impedance transformer as the main body, a measurement module for measuring several complex impedance points required for multi-vector synthesis is built into the vector impedance transformer, and the multi-vector impedance transformer is connected to two ports of a vector network analyzer for active measurement, constituting a radio frequency multi-vector synthesis impedance transformer that can quickly obtain measurement data.
[0032] Figure 3Shows the specific measurement connection. FC-MVT is a radio frequency multi-vector synthesis impedance converter with a built-in radio frequency multi-vector synthesis fast measurement algorithm MVSA. Among them, VNA is a vector network analyzer. The radio frequency multi-vector synthesis impedance converter (FC-MVT) is connected to two ports of the vector network analyzer (VNA). The built-in radio frequency dual-vector synthesis fast measurement algorithm (MVSA) operates through the following steps to measure the complex impedance points of the radio frequency multi-vector synthesis impedance converter (FC-MVT). The specific process includes:
[0033] S1. Place the multi-vector converter at 0 position, start the vector network analyzer to measure the S-parameters of the multi-vector impedance converter and output the results. The multi-vector impedance converter is equivalent to a 50-ohm transmission line;
[0034] The output result is the S-parameter matrix: S 1AB (0,0)@x = 0, y = 0 initial position;
[0035] S2. Conduct a global Smith chart measurement on the multi-vector impedance converter corresponding to the first vector converter to obtain the S-parameter matrix S 1AB (x,y), and convert the S-parameter matrix S 1AB (x,y) and the 0-position matrix S 1AB (0,0) obtained in step S1 into T matrices T 1AB (x,y) and T 1AB (0,0), and perform de-embedding operation to obtain the operation result;
[0036] The operation result is:
[0037] T1(x,y) = T 1AB -1 (0,0) * T 1AB (x,y)
[0038] Among them, the T1 matrix T 1AB is the transformation matrix of the S-parameter matrix S 1AB .
[0039] S3. Place the first vector converter at 0 position, conduct a global Smith chart measurement on the FC-TVB corresponding to the second vector converter to obtain the S-parameter matrix S 1AB (0,0) included, S 2AB (x,y), and convert it into a T matrix to obtain T 2AB (x,y), that is: T2(x,y) = T 2AB (x,y).
[0040] S4. Perform Cascade operation on the above two T matrices, that is, obtain a measurement file containing the synthesis of two vector converters, and then convert it back to the S-parameter matrix, that is:
[0041]
[0042] S5. Place the first vector converter and the second vector converter at the 0 position, repeat the above operations for the third vector converter, and so on, then the S-parameter matrix of the synthesis of n vectors can be obtained. According to the basic principles of microwaves, each point contains 4 S-parameters, corresponding to a point on the Smith chart, that is, a complex impedance point. Therefore, the S-parameter matrix is a number of complex impedance points contained in the measurement data.
[0043] In summary, as Figure 4 shown, it is the effect diagram of the global Smith chart tuning after the rapid measurement of the radio frequency multi-vector synthesis impedance converter FC-MVT. By using the built-in radio frequency double-vector synthesis rapid measurement algorithm (MVSA) software, there is no need to measure by locating a large number of complex impedance points of each vector converter combination. Only by measuring N1 (the number of measurement points of the first vector converter) + N2 (the number of measurement points of the second vector converter) +...... + Nn (the number of measurement points of the nth vector converter) complex impedance points, the measurement data of N1×N2×......×Nn complex impedance points can be obtained, making the rapid measurement of radio frequency multi-vector synthesis possible, greatly shortening the measurement time, and thus greatly improving the design and test efficiency of high-power radio frequency chips, modules and systems.
[0044] Those of ordinary skill in the art can understand that all or part of the steps in the method of the above embodiments can be completed by controlling relevant hardware through program instructions. Therefore, this application can adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware aspects. Moreover, this application can adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to solid-state disk memories, disk memories, CD-ROMs, optical memories, etc.) containing computer-usable program codes.
[0045] Each embodiment in this specification is described in a progressive manner. The key point of each embodiment is to illustrate the differences from other embodiments. The same or similar parts among the embodiments can be referred to each other. For the above embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiments.
[0046] The above embodiments have introduced the present invention in detail. Specific examples are used in this article to elaborate on the principle and implementation manner of the present invention. The description of the above embodiments is only used to help understand the method and its core idea of the present invention; at the same time, for those of ordinary skill in the art, according to the idea of the present invention, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present invention.
Claims
1. A radio frequency multi-vector synthesis impedance converter, including a multi-vector impedance converter as the main body, characterized in that, A measurement module for measuring a number of complex impedance points required for multi-vector synthesis is built into the multi-vector impedance converter, and the multi-vector impedance converter is connected to two ports of a vector network analyzer for active measurement, thus forming a radio frequency multi-vector synthesis impedance converter capable of quickly obtaining measurement data.
2. The RF multi-vector synthesis impedance converter according to claim 1, wherein, The measurement module uses a radio frequency multi-vector synthesis fast measurement algorithm MVSA to measure a number of complex impedance points of the multi-vector impedance converter.
3. A method for measuring complex impedance points of the radio frequency multi-vector synthesis impedance converter according to any one of the above claims 1-2, characterized in that, The measurement method includes the following steps: S1. Place the multi-vector converter at the 0 position, start the vector network analyzer to measure the S-parameters of the multi-vector impedance converter and output the results; S2. Perform a global Smith chart measurement on the multi-vector impedance converter corresponding to the first vector converter to obtain the S-parameter matrix S 1AB (x, y), and transform the S-parameter matrix S 1AB (x, y) and the 0-bit matrix S 1AB (0, 0) obtained in step S1 into T matrices T 1AB (x, y) and T 1AB (0, 0), and perform a de-embedding operation to obtain the operation result; S3. Place the first vector transducer at the 0 position, perform a global Smith chart measurement on the FC-TVB corresponding to the second vector transducer, and obtain the S-parameter matrix S 1AB including S 2AB at (0, 0), and convert it into a T matrix to obtain T 2AB at (x, y); S4. Perform a Cascade operation on the above two T matrices, that is, obtain a measurement file containing the synthesis of two vector converters, and then convert it back to the S-parameter matrix; S5. Place the first vector converter and the second vector converter at the 0 position, and repeat the above operations for the third vector converter, and so on, to obtain the S-parameter matrix of the synthesis of n vectors, which is the number of complex impedance points included in the measurement data.
4. The method for measuring a plurality of impedance points according to claim 3, wherein In step S1, the multi-vector impedance converter is equivalent to a 50-ohm transmission line.
5. The method for measuring a plurality of impedance points according to claim 3, characterized in that, In step S1, the output result is the S-parameter matrix: S 1AB (0, 0) @ x = 0, y = 0 initial position.
6. The method for measuring a plurality of impedance points according to claim 3, wherein In step S2, the operation result is: T1(x, y) = T 1AB -1 (0, 0) * T 1AB (x, y) Among them, the T1 matrix T 1AB is the transformation T matrix of the S-parameter matrix S 1AB .
7. The method for measuring a plurality of impedance points according to claim 3, wherein In step S3, the S parameter matrix S 1AB including (0, 0) is 2AB (x, y), and is converted into the T matrix to obtain T 2AB (x, y). The expression of T2(x, y) = T 2AB (x, y).
8. The method for measuring a plurality of impedance points according to claim 3, wherein In step S4, the measurement file containing the synthesis of two vector converters, when converted back to the expression of the S-parameter matrix, is:
9. The method for measuring a plurality of impedance points according to claim 3, wherein In step S5, for the measurement file synthesized by n vector converters, the expression for converting it back to the S-parameter matrix is: