Gas chamber structure optimization method and system based on gas sensor

Abstract

The invention relates to the technical field of structure optimization, in particular to a gas chamber structure optimization method and system based on a gas sensor, and the method comprises the following steps: obtaining the flow velocity and temperature data of a gas chamber channel, recognizing the number of a paragraph needing to be compressed, positioning a light beam reflection abnormal path, reconstructing a local structure proportion, and calculating a volume and flow velocity difference value. And screening the number of the retention area, setting coating configuration parameters, establishing a reflection control list, associating structure adjustment with a wavelength response interval, and generating optimized gas chamber structure configuration information. According to the invention, by acquiring and analyzing the test data of the gas chamber channel and comparing the structural compression critical ratio, the structural section needing to be optimized is effectively identified, the adaptability of the structure is improved, the measurement precision and the response speed of the analyzer are enhanced, the anomaly detection and optimization are carried out on the light beam path, the overlapping and interference of the light beams are effectively reduced, and the detection accuracy is improved. The reliability of the detection result is improved, and the flowing efficiency of the gas is optimized by redesigning the shape and proportion of the channel.

Description

Technical Field

[0001] The present invention relates to the technical field of structural optimization, and in particular to a gas chamber structure optimization method and system based on a gas sensor. Background Art

[0002] The field of structural optimization technology primarily involves the multi-objective coordination and optimization of engineering structures in terms of functionality, strength, stiffness, size, shape, mass distribution, and manufacturing feasibility through systems design, mechanical analysis, and mathematical modeling, so that the structure achieves optimal or near-optimal design objectives while satisfying performance constraints. This field is widely used in technology-intensive industries such as mechanical engineering, aerospace, automotive engineering, precision instruments, and electronic equipment, with a particular focus on improving the efficiency, reliability, and manufacturing economy of structural systems. Common methods include topology optimization, dimensional optimization, shape optimization, and multidisciplinary collaborative optimization, combined with tools such as finite element analysis and parameter sensitivity analysis to achieve accurate prediction and iterative improvement of structural performance.

[0003] The gas chamber structure optimization method aims to improve the design of the gas channel cavity structure in spectral gas analyzers. This approach achieves uniform gas flow within the channel, stable optical signal transmission, and minimized interference signals by precisely controlling factors such as the gas channel's inner wall shape, size ratio, optical path, and reflection interference characteristics. This approach is primarily intended to improve the detection accuracy, response time, and gas utilization efficiency of spectral gas analyzers, and is suitable for applications requiring high-precision gas concentration measurement, such as industrial monitoring, medical diagnostics, and environmental testing.

[0004] Traditional optimization methods focus on multi-objective mathematical modeling and analytical optimization of dimensions such as structural geometry, stress distribution, and material configuration. However, in gas channel structures, there is a lack of consideration of the linkage between fluid behavior and optical signal propagation characteristics, resulting in the difficulty of optimizing the results to balance gas flow uniformity and optical interference stability. For example, structural topology optimization based solely on finite element models cannot reflect the gas retention problem caused by local gas flow velocity fluctuations in real time during the design process, nor can it identify the interference and overlapping behavior of light beams in multiple reflection paths through the model. This can lead to problems such as signal jitter, response lag, or insufficient detection accuracy under high-frequency response or high-sensitivity measurement conditions. In addition, traditional methods rely on uniform materials or full-coverage coatings to control the reflection characteristics of the inner wall of the gas chamber, and lack a grouping control mechanism based on the response characteristics of the spectral center wavelength. This results in frequent superposition of wall interference signals and unstable reflection paths in multi-wavelength measurement tasks, resulting in noise redundancy and distribution offset in the detection data, affecting the accuracy of monitoring judgment and the reliability of response. Summary of the Invention

[0005] The purpose of the present invention is to solve the shortcomings of the prior art and to propose a gas chamber structure optimization method and system based on a gas sensor.

[0006] In order to achieve the above object, the present invention adopts the following technical solution: a gas chamber structure optimization method based on a gas sensor, comprising the following steps:

[0007] S1: Obtain test data of the analyzer gas chamber channel, calculate the ratio of gas flow rate to cross-sectional area in each section, compare the ratio with the critical ratio of structural compression set in the channel, identify the list of structural numbers that meet compression requirements, and generate a set of structural segment numbers to be optimized;

[0008] S2: calling the set of structure segment numbers to be optimized, screening the locations of disordered reflection signal areas by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of the channel reflection load, and generating a set of abnormal beam path sections;

[0009] S3: Based on the set of abnormal sections of the beam path, identify the region numbers where the gas stagnation risk value exceeds the retention judgment value, reset the corresponding channel morphology to a unequal width channel structure, record the new cross-sectional ratio of each structural segment, and generate a channel reconstruction structure ratio parameter set;

[0010] S4: Call the channel reconstruction structure proportion parameter set to obtain the reflection path difference value and the central reflection wavelength range formed before and after the structural deformation, divide the reflection impact groups into multiple groups according to the wavelength range, analyze the required reflectivity reduction according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list.

[0011] The present invention has the following improvements: the set of structure segment numbers to be optimized includes a structure segment number sequence, a structure compression critical value, and a corresponding channel position identifier; the set of abnormal beam path sections includes a reflection path superposition segment number, an optical path quantity threshold, and an inner wall reflection point coordinate range; the channel reconstruction structure ratio parameter set specifically includes a cross-sectional ratio setting value, a channel segment number mapping relationship, and a reconstruction volume index sequence; and the wall reflection control ratio list includes a reflectivity adjustment group number, a corresponding wavelength range, and a coating thickness parameter index.

[0012] The present invention is improved in that the step of obtaining the set of structure segment numbers to be optimized is specifically as follows:

[0013] S111: Acquire test data of the analyzer gas chamber channel, including instantaneous flow velocity values and temperature stability values of the front, middle, and end sections under steady-state gas flow conditions, pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of each section, and generate a flow velocity-area ratio sequence;

[0014] S112: Based on the velocity-area ratio sequence, according to the ratio data of each segment, a critical ratio value of structural compression set in the channel is called, each segment ratio is sequentially compared with the critical ratio value of structural compression, and the segment numbers of which the ratio is lower than the critical ratio value of structural compression are determined, a number set capable of implementing structural compression is obtained, and a sequence of segment numbers requiring compression is generated;

[0015] S113: According to the compression requirement paragraph number sequence and the paragraph structure area number corresponding to each number, the corresponding channel segment positions in the air chamber three-dimensional structure model are numbered and summarized, and a number list is constructed according to the paragraph number sorting rule to form a structure segment number set to be optimized.

[0016] The present invention is improved in that the steps of obtaining the set of abnormal sections of the light beam path are specifically as follows:

[0017] S211: Calling the set of structure segment numbers to be optimized, obtaining each structure segment number, extracting the values of the incident angle and the exit angle of the light beam in the analyzer gas chamber channel, and locating the coordinate points of the inner wall reflection surface of each numbered segment in combination with the channel contour information in the three-dimensional structure diagram, determining the propagation direction difference between the incident path and the exit path through coordinate association, and generating a segment angle and coordinate matching data set;

[0018] S212: Based on the segment angle and coordinate matching data set, according to the incident angle, exit angle, and reflection point coordinate position, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, calculate the number of reflections and the total optical path length of the corresponding structural segment, and record whether there is spatial overlap in the channel wall of the light beam reflection path. Compare the number of light beam reflections and the optical path length with the upper limit standard of the reflection load per unit channel segment using the formula:

[0019]

[0020] Obtain the reflected load deviation value through calculation, classify the segment numbers whose reflected load deviation value is greater than the set deviation judgment reference value into the abnormal segment set, and generate a reflection abnormal segment identification list;

[0021] Among them, R i Represents the deviation value of the reflected load in the i-th segment, N i Indicates the number of reflections of the i-th beam, L i is the total length of the i-th optical path, P ij T represents the projection area of the reflection point of the jth path in the i-th segment on the channel surface, i is the reflection load threshold allowed in the i-th channel, and m is the total number of beam paths in the i-th segment;

[0022] S213: Based on the reflection abnormality segment identification list, the position of each segment number in the air chamber structure is recalled, the marking status and path coordinates of the overlapping reflection segments are extracted, and the segment numbers that meet the standard of the number of beam overlapping paths exceeding the reflection load are screened to generate a beam path abnormality segment set.

[0023] The present invention is improved in that the step of obtaining the channel reconstruction structure ratio parameter set is specifically as follows:

[0024] S311: Obtain the set of abnormal sections of the beam path, extract the cross-sectional width value, height value, channel section length value and number of reflection points of the corresponding channel section, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence;

[0025] S312: Based on the local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value in the channel segment, the volume index of each segment and the corresponding flow rate value are calculated in a ratio according to the numbered segment correspondence method, using the formula:

[0026]

[0027] Obtain the gas stagnation risk value of each numbered segment by calculation, compare the stagnation risk value with the gas retention judgment value, select the numbered set whose gas stagnation risk value exceeds the gas retention judgment value, and generate a channel retention segment identification list;

[0028] Among them, S k represents the gas stagnation risk value of the kth segment, V k is the volume index of the kth segment, F k is the gas flow rate value of the kth section, A k is the cross-sectional area of the kth segment, D k is the number of reflection points in the kth paragraph, Q k is the length of the k-th channel;

[0029] S313: According to the channel retention segment identification list, perform unequal width channel morphology adjustment for each segment, record the new width and height values of the cross-section after adjustment of the structural segment, calculate and archive the new aspect-to-height ratio of the cross-section, establish an association record table between the structural segment number and the corresponding new cross-section ratio, and generate a channel reconstruction structure ratio parameter set.

[0030] The present invention is improved in that the steps for obtaining the wall reflection control ratio list are specifically as follows:

[0031] S411: calling the channel reconstruction structure ratio parameter set, obtaining reflection path trajectory data of the corresponding structure segment before and after deformation, calculating the difference in the number of path segments and the total length difference of the reflection path for each structure segment, combining the path difference with the central wavelength response segment to form a difference label set, and generating a reflection path difference feature set;

[0032] S412: Call the reflection path difference feature set, segment the response segment according to the central wavelength response segment of each numbered segment to form multiple wavelength coverage intervals, and set the target reflectivity in combination with the spectrum analyzer reflection threshold standard. Calculate the required reflectivity adjustment amplitude of the coating based on the difference between the current reflectivity value and the target reflectivity value of each wavelength interval using the formula:

[0033]

[0034] Obtaining the reflectivity control offset value corresponding to each wavelength interval by calculation, and using the offset value as a reflectivity optimization interval identification parameter, obtaining the reflectivity reduction group corresponding to each section number, and generating a wavelength reflectivity control group set;

[0035] Among them, R xge W represents the reflection control deviation value of the xth segment in the gth wavelength range, xce is the current reflectivity value of the xth segment, W xre is the reflectivity value of the target in the xth segment, Z xe is the cross-sectional ratio of the xth segment after deformation, H xe is the projection height value of the xth segment of the light path, B xe A is the total length of the current reflection path in segment x, xe is the number of original paths in segment x;

[0036] S413: Based on the wavelength reflection control group set, according to the reflection control offset value of each group, a pairing mapping is performed with the correspondence between the material number and thickness identified in the coating database, and a coating material number with a reflectivity adjustment capability higher than the target reflectivity offset value is selected, and the required coating thickness value is marked. A matching table between the structure segment number, wavelength range, material number and thickness value is established to generate a wall reflection control ratio list.

[0037] The present invention is improved in that the method further comprises:

[0038] S5: calling the wall reflection control ratio list, comparing the wavelength value of the sensitive interval in the sensor calibration response spectrum, identifying the segment number that overlaps with the sensitive interval in the frequency domain after the structure adjustment, and forming an optimized structural parameter combination set including the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value to generate optimized air chamber structure configuration information;

[0039] The optimized air chamber structure configuration information specifically refers to the structure segment arrangement sequence, structure cross-section combination parameters, light path structure index, inner wall reflection parameter label and sensor response target band.

[0040] The present invention is improved in that the step of obtaining the optimized air chamber structure configuration information is specifically as follows:

[0041] S511: Calling the wall reflection control ratio list, extracting the structural ratio configuration value, reflection control material number, and reflection path adjustment value of the corresponding section, obtaining the wavelength start and end values of the sensor calibration response spectrum, determining whether the center wavelength of the reflection path formed after structural deformation is within the sensitive range, screening the section number set with overlapping wavelength frequency bands, and generating a frequency domain overlapping section identifier set;

[0042] S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values of the corresponding segment, calculate the cross-sectional ratio, and extract the reflection path value and material number. The three data items are integrated into a segment structure state group, which is arranged in the order of the segment numbers to construct a number index. The structure state group is associated with the channel structure morphology structure map to generate a segment structure coupling parameter group.

[0043] S513: Call the paragraph structure coupling parameter group, and integrate the paragraph order, cross-section ratio value, number of reflection paths, coating number, and target response band into a unified form structure according to the number index and structural characteristic parameters. Embed them into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establish the collection information of each paragraph configuration, and generate the optimized gas chamber structure configuration information.

[0044] A gas sensor-based air chamber structure optimization system, the gas sensor-based air chamber structure optimization system is used to implement the above-mentioned gas sensor-based air chamber structure optimization method, the system comprising:

[0045] The optimized structure identification module obtains the test data of the analyzer gas chamber channel, calculates the ratio of gas flow rate to cross-sectional area in each section, compares the ratio with the critical ratio of structural compression set in the channel, identifies the list of structural numbers that meet the compression requirements, and generates a set of structural segment numbers to be optimized;

[0046] The beam anomaly identification module calls the set of structure segment numbers to be optimized, determines whether the number of beam overlaps on a single path segment is greater than the upper limit standard of the channel reflection load, filters the location of the disordered reflection signal area, and generates a set of beam path anomaly sections;

[0047] The channel reconstruction analysis module identifies the region number where the gas stagnation risk value exceeds the retention judgment value based on the set of abnormal sections of the beam path, resets the corresponding channel morphology to a unequal width channel structure, and generates a channel reconstruction structure ratio parameter set;

[0048] The wall reflection control module calls the channel reconstruction structure ratio parameter set, divides it into multiple reflection impact groups according to the wavelength range, analyzes the required reflectivity reduction range based on the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list;

[0049] The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after the structural adjustment, and forms an optimized structural parameter combination set including the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value to generate optimized air chamber structure configuration information.

[0050] Compared with the prior art, the advantages and positive effects of the present invention are:

[0051] In the present invention, by acquiring and analyzing the test data of the gas chamber channel, accurately calculating the ratio of the gas flow rate to the cross-sectional area in each section, and comparing the critical ratio of structural compression, the structural sections that need to be optimized are effectively identified, thereby improving the adaptability of the structure. By reducing the stagnation and turbulence of the gas in the channel, the measurement accuracy and response speed of the analyzer are enhanced, and the abnormality detection and optimization of the light beam path are performed, which effectively reduces the overlap and interference of the light beam, optimizes the stable transmission of the optical signal, and improves the reliability of the detection results. By redesigning the channel shape and proportion, the flow efficiency of the gas is optimized, and the energy consumption and material usage are reduced, thereby improving the subsequent detection effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] Figure 1 is a flow chart of the method of the present invention;

[0053] Figure 2 A flowchart for obtaining a set of structure segment numbers to be optimized according to the present invention;

[0054] Figure 3 A flow chart for obtaining a set of abnormal sections of a light beam path according to the present invention;

[0055] Figure 4 A flow chart of obtaining a channel reconstruction structure ratio parameter set according to the present invention;

[0056] Figure 5 A flow chart for obtaining a wall reflection control ratio list for the present invention;

[0057] Figure 6 The present invention is a flow chart for obtaining optimized air chamber structure configuration information. DETAILED DESCRIPTION

[0058] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0059] In the description of the present invention, it should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings and are only for the convenience of describing the present invention and simplifying the description. They do not indicate or imply that the devices or elements referred to must have a specific direction, be constructed and operate in a specific direction, and therefore should not be understood as limiting the present invention. In addition, in the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0060] See also Figure 1 The present invention provides a technical solution: a gas chamber structure optimization method based on a gas sensor, comprising the following steps:

[0061] S1: Acquire test data of the analyzer gas chamber channel, including the instantaneous flow rate and temperature stability values of the front, middle, and end sections under steady-state gas flow conditions. Separate each section according to the geometric distribution area of the channel cross section, calculate the ratio of gas flow rate to cross-sectional area in each section, and compare the ratio with the critical compression ratio of the structure set in the channel section by section to identify a list of structures with compression requirements and generate a set of structure section numbers to be optimized.

[0062] S2: Call the set of structure segment numbers to be optimized, obtain the beam incident angle, exit angle, and coordinates of the local inner wall reflection point in the segment, calculate the number of path segments and optical path length formed by the beam on the channel wall, and record the numbers of the reflection surfaces with overlapping beam paths. By determining whether the number of beam overlaps on a single path segment exceeds the upper limit of the channel reflection load, the location of the disordered reflection signal area is screened to generate a set of beam path abnormality segments;

[0063] S3: Based on the set of abnormal sections of the beam path, the actual channel cross-sectional dimensions, number of reflection points, and channel length of the corresponding area are extracted. The product of the cross-sectional area and the channel length is used as the local volume index. The local volume index is compared with the gas flow rate in the channel to identify the area number where the gas stagnation risk value exceeds the retention judgment value. The channel morphology corresponding to the number is reset to a unequal width channel structure. The new cross-sectional ratio of each structural segment is recorded to generate a channel reconstruction structure ratio parameter set.

[0064] S4: Call the channel reconstruction structure ratio parameter set, obtain the reflection path difference value and the central reflection wavelength range formed before and after the structure deformation according to the structure segment number, divide it into multiple reflection impact groups according to the wavelength range, analyze the required reflectivity reduction according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list;

[0065] S5: Call the wall reflection control ratio list, extract the structural ratio configuration, inner wall material number and reflection path adjustment value of the channel section, compare the sensitive interval wavelength value in the sensor calibration response spectrum, identify the section number that overlaps with the sensitive interval in the frequency domain after the structural adjustment, summarize the cross-sectional ratio, optical path number and reflection control material configuration corresponding to the section, and couple it with the overall shape of the gas channel to form an optimized structural parameter combination set including the channel section layout order, local structural shape, optical path direction, reflection parameter number and sensor response target value, and generate the optimized gas chamber structure configuration information;

[0066] The set of structural segment numbers to be optimized includes the structural segment number sequence, the structural compression critical value and the corresponding channel position identifier; the set of abnormal beam path sections includes the reflection path superposition segment number, the optical path number threshold and the inner wall reflection point coordinate range; the channel reconstruction structure ratio parameter set specifically includes the cross-sectional ratio setting value, the channel segment number mapping relationship and the reconstruction volume index sequence; the wall reflection control ratio list includes the reflectivity adjustment group number, the corresponding wavelength range and the coating thickness parameter index; the optimized gas chamber structure configuration information specifically refers to the structural segment arrangement sequence, the structural cross-sectional combination parameters, the optical path structure index, the inner wall reflection parameter label and the sensor response target band.

[0067] See also Figure 2 , the specific steps for obtaining the structure segment number set to be optimized are:

[0068] S111: Acquire test data of the analyzer gas chamber channel, including instantaneous flow velocity values and temperature stability values of the front, middle, and end sections under steady-state gas flow conditions, pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of each section, and generate a flow velocity-area ratio sequence;

[0069] The test data of the analyzer gas chamber channel was obtained. Specifically, when the gas was introduced and steady-state flow conditions were reached, measurement points were set at the front, middle, and end of the gas chamber channel. Data was recorded at each measurement point using a flow rate sensor and a thermistor thermometer. The instantaneous flow rate values v1, v2, and v3 of each section under steady-state conditions, as well as the corresponding temperature stability values T1, T2, and T3, were obtained. Assuming v1 = 3.2 m / s, v2 = 2.7 m / s, and v3 = 2.0 m / s, T1 = 298 K, T2 = 301 K, and T3 = 303 K, the cross-sectional area values A1, A2, and A3 of each section of the channel were then read from the three-dimensional structure model of the gas chamber. Assuming A1 = 1.2 cm 2 、A2=1.5cm 2 、A3=1.8cm 2, by performing a segment-by-segment pairing operation, that is, pairing the instantaneous flow velocity and cross-sectional area of each segment to form paired items (v1, A1), (v2, A2), (v3, A3), and then performing division operations respectively to obtain the velocity-area ratios r1, r2, and r3 corresponding to each segment. The specific calculation method is:

[0070]

[0071] This calculation step does not involve setting thresholds, baseline values, weights, or coefficients, and therefore does not include parameter settings for these types of items. This generates a velocity-area ratio sequence [r1, r2, r3] for use in subsequent steps.

[0072] S112: Based on the velocity-area ratio sequence, according to the ratio data of each segment, the critical ratio value of structural compression set in the channel is called, and each segment ratio is sequentially compared with the critical ratio value of structural compression, and the segment numbers whose ratios are lower than the critical ratio value of structural compression are determined, and a number set for which structural compression can be implemented is obtained, and a sequence of segment numbers requiring compression is generated;

[0073] Based on the velocity area ratio sequence [r1, r2, r3], the critical ratio value R of the structure compression set inside the analyzer is called. t , respectively compare each ratio in the sequence with the ratio value, and set the judgment condition as: when a ratio r i Satisfy r i <R t When , the segment number is recorded as the compression demand segment number. Structural compression critical ratio value R t This is the judgment basis set in the system. It is defined as when the gas flow rate density (flow rate per unit area) is lower than this value, it indicates that the gas momentum in this section is insufficient and there is a risk of spatial redundancy. This value is set based on the minimum working momentum threshold referenced in the gas channel design parameters (set through statistical regression analysis of the matching relationship between structural parameters and gas physical properties). Its unit is m·s -1 cm -2 . Set the value to R t =1.50m·s -1 cm -2 , this value refers to the lower quartile value of the 12 groups of cross-section and flow rate matching samples in the same air chamber model structure, ensuring that it is used to identify the 25% lower limit segment to avoid misjudgment. The judgment process is: r1 = 2.67 > 1.50, does not meet the compression condition; r2 = 1.80 > 1.50, still does not meet the condition; r3 = 1.11 < 1.50, meets the condition, so the segment 3 number is recorded as the compression requirement segment number. When executing the judgment operation, the system completes it by traversing the ratio array and calling the comparison function, and writes the segment number that meets the conditions into the number set {3}, and finally generates the compression requirement segment number sequence [3].

[0074] S113: According to the compression requirement segment number sequence and the segment structure area number corresponding to each number, the corresponding channel segment positions in the air chamber three-dimensional structure model are numbered and summarized, and a number list is constructed according to the segment number sorting rule to form a structure segment number set to be optimized;

[0075] According to the generated compression requirement paragraph number sequence [3], the mapping table between the paragraph number and the structural segment position in the three-dimensional structure model is consulted, and the paragraph number 3 is mapped to the structural area number Z3. Z3 is set to correspond to the end section of the air chamber channel, and the number Z3 is marked as the target structural optimization area. When the system performs the number summary operation, the number 3 and its structural mapping number Z3 are written into the initial number set. The set is initially empty and becomes {Z3} after being added. Then it is sorted according to the paragraph number sorting rules. In the current example, the number set contains only one item. The sorting operation does not change the current set. The final structure segment number set to be optimized is {Z3}, which is used for subsequent three-dimensional structure modeling software module to perform regional reconstruction. This section does not involve the use or judgment of "threshold", "base value", "weight" or "coefficient". All judgments are based on the number screening results established in the previous step to perform number mapping operations. No new settings are required.

[0076] See also Figure 3 ,The specific steps for obtaining the set of abnormal sections of the beam path are:

[0077] S211: Call the set of structure segment numbers to be optimized, obtain each structure segment number, extract the values of the incident angle and the exit angle of the light beam in the analyzer gas chamber channel, and locate the coordinate point of the inner wall reflection surface of each numbered segment by combining the channel contour information in the three-dimensional structure diagram. Determine the propagation direction difference between the incident path and the exit path through coordinate association, and generate a segment angle and coordinate matching data set;

[0078] Call the structure segment number set to be optimized and obtain the number value Z of each structure segment i For each numbered segment, the incident angle θ of the beam at the channel position of the segment is extracted from the 3D model database. in,i With the exit angle θ out,i The incident angle is defined as the angle between the beam entering the channel section and the channel axis, and the exit angle is the angle between the beam and the axis after leaving the current channel section. Then, the position of the numbered segment is mapped to the three-dimensional structure diagram. By traversing the contour points of the channel inner wall defined in the model data, the inner wall surface corresponding to the segment number is selected to obtain the coordinates of all vertices constituting the surface (x i1 ,y i1 ,z i1 )、(x i2 ,y i2 ,z i2 )…(xin ,y in ,z in ), linear fitting is used to construct the local reflection plane, combined with the incident light direction vector and the outgoing light direction vector Expressed in the form of coordinate vectors, they are (cosθ in,i ,sinθ in,i ,0) and (cosθ out,i ,sinθ out,i ,0), calculate the difference in propagation direction by vector dot product and arc cosine function The direction difference is used as a characteristic indicator of the change in the propagation of the light beam within the structure segment, and each segment is numbered Z. i , angle of incidence θ in,i , exit angle θ out,i , propagation direction difference δ i The data items are packaged together with the reflection surface coordinate set to form a segment angle and coordinate matching dataset.

[0079] S212: Based on the segment angle and coordinate matching data set, according to the incident angle, exit angle, and reflection point coordinate position, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, calculate the number of reflections and the total optical path length of the corresponding structural segment, and record whether there is spatial overlap in the channel wall of the light beam reflection path. Compare the number of light beam reflections and the optical path length with the upper limit standard of the reflection load per unit channel segment using the formula:

[0080]

[0081] Obtain the reflected load deviation value through calculation, classify the segment numbers whose reflected load deviation value is greater than the set deviation judgment reference value into the abnormal segment set, and generate a reflection abnormal segment identification list;

[0082] This value measures whether the load on the beam reflection path within a single section of the gas cell exceeds a set threshold. Its characteristic is the degree of deviation from the reflected load. Essentially, this value measures the deviation of the optical path complexity (number and length of reflections) per unit projected area from the preset load standard. A larger value indicates a more severe overload in that section of the structure.

[0083] Among them, R i Represents the deviation value of the reflected load in the i-th segment, N i Indicates the number of reflections of the i-th beam, L i is the total length of the i-th optical path, P ij T represents the projection area of the reflection point of the jth path in the i-th segment on the channel surface, i is the reflection load threshold allowed in the i-th channel, and m is the total number of beam paths in the i-th segment;

[0084] Based on the segment angle and coordinate matching dataset, the incident angle θ of each structural segment is read separately in,i , exit angle θ out,i , inner wall coordinate set (x ij ,y ij ,z ij ), according to the geometric optical reflection rules, the beam path is constructed from the incident point along the incident direction, and the reflection direction is calculated at each intersection with the inner wall plane. The path is continued until it reaches the exit direction, and the number of reflection segments N is recorded. i , and the length of each reflected path is accumulated to be the total optical path length L i , let N i =5, L i =1.75m, for all reflection points in this section, calculate their projected area P on the channel cross-sectional plane. i1 ,P i2 ,…,P im , let m = 4, its value is P i1 =2.0cm 2 、P i2 =1.5cm 2 、P i3 =1.8cm 2 、P i4 =2.2cm 2 , then the total area is:

[0085]

[0086] Call to set the reflection load threshold T i This value is used to define the allowable comprehensive reflection load of this section of the channel. The setting basis is the cross-judgment of the thermal optical bearing capacity of the material and the statistical results of the beam energy density when designing the structural unit of this section. The setting value is T i =1.2 (unitless), the specific calculation refers to the average number of reflections measured in the previous structure segment of 4.2 times, the average optical path of 1.5m, and the average total projection area of 8.0cm2, then refer to the generated For the normal reflection load value of the median segment, the threshold value is determined to be 1.2 by shifting 50% upward to ensure that the high load segment is accommodated.

[0087]

[0088] Set the deviation judgment reference value Δ T =0.10, which is set according to the maximum light and heat deviation tolerance allowed in the air chamber structure. It is based on the heat dissipation capacity test under high reflective load. In the test, the load deviation greater than 0.1 will cause the heat accumulation rate to increase nonlinearly. Therefore, it is selected as the boundary value, which will not change with the fluctuation of the segment number. i =0.0333<ΔT , then the current segment number will not be included in the abnormal segment set, otherwise it will be added to the abnormal segment number set, and finally a reflective abnormal segment identification list will be generated.

[0089] S213: Based on the reflection abnormality segment identification list, the position of each segment number in the air chamber structure is recalled, the marking status and path coordinates of the overlapping reflection segments are extracted, and the segment numbers that meet the standard of the number of beam overlapping paths exceeding the reflection load are selected to generate a set of beam path abnormality segments;

[0090] According to the segment number recorded in the reflection abnormal segment identification list, the three-dimensional model of the air chamber structure is called back item by item, and the segment position corresponding to each abnormal segment number is retrieved. The mark status field in the structure data is used to extract whether all the beam paths in the segment have spatial overlap flags. If the number of spatial overlap segments of the beam paths in a segment is C, then the number of spatial overlap segments is C. i Exceeding the standard path overlap allowance S for structural reflected load i , then the segment number is classified into the beam path abnormal segment set. Suppose an abnormal segment is numbered Z5, the number of its overlapping paths is C5=6, the allowable standard is S5=3, and the allowable standard S i The reference segment length d is set i With inner diameter D i Calculate the limit of the number of load paths in the channel section If d i =5cm, D i =15cm, then At this time, C5=S5, and it is not included in the path anomaly set; if C5=7, then C5>S5, and it is included in the anomaly set. Finally, all segment numbers that meet the conditions are summarized to generate the beam path anomaly segment set.

[0091] See also Figure 4 , the specific steps for obtaining the channel reconstruction structure ratio parameter set are:

[0092] S311: Obtain a set of abnormal sections of the beam path, extract the cross-sectional width, height, length, and number of reflection points of the corresponding channel sections, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence;

[0093] After obtaining the set of beam path anomaly sections, read the structural segment channel data corresponding to each numbered section k in sequence, and extract the cross-sectional width W of each section through the geometric parameter field defined in the structural model. k , height H k , channel segment length Q k , and count the number of reflection points D from the optical recording data of the segment k , then calculate the cross-sectional area A of each segment k , according to formula A k =W k ×Hk To get the specific values, set the width of the k=2 segment to W2=3.5cm and the height to H2=2.0cm, then the cross-sectional area of this segment is A2=3.5×2.0=7.0cm 2 , and then calculate the local area volume V according to the segment length k , the formula is V k =A k ×Q k , assuming the channel length is Q2 = 12 cm, the volume index is V2 = 7.0 × 12 = 84.0 cm 3 After executing the above operation, the volume data V of each segment is k , cross-sectional area A k , segment length Q k , number of reflection points D k They are compiled into the structure record list and combined into a local volume indicator sequence in the order of paragraph numbers for subsequent flow and retention analysis steps.

[0094] S312: Based on the local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value in the channel segment, according to the numbered segment correspondence method, the ratio of each segment volume index to the corresponding flow rate value is calculated using the formula:

[0095]

[0096] Obtain the gas stagnation risk value of each numbered segment by calculation, compare the stagnation risk value with the gas retention judgment value, select the numbered set whose gas stagnation risk value exceeds the gas retention judgment value, and generate a channel retention segment identification list;

[0097] This value is used to measure whether the gas flow efficiency in the local area of the channel has dropped to the level of risk of stagnation, that is, whether gas stagnation or dead zone is likely to occur. The first half represents the spatial capacity corresponding to a unit flow rate, while the second half provides an estimate of the expected volume based on geometry and reflected disturbances. A larger deviation indicates a mismatch between the design and aerodynamic conditions, potentially leading to stagnation.

[0098] Among them, S k represents the gas stagnation risk value of the kth segment, V k is the volume index of the kth segment, F k is the gas flow rate value of the kth section, A k is the cross-sectional area of the kth segment, D k is the number of reflection points in the kth paragraph, Q k is the length of the k-th channel;

[0099] Based on the local volume index sequence, first extract the volume index V corresponding to each segment number k k The gas flow rate F measured in this sectionk , set F2 = 1.8m / s, and substitute the two into the left side of the calculation formula After unit conversion, V2 = 84.0 cm 3 =8.4×10 -5 m 3 ,but Then extract the cross-sectional area A according to the corresponding relationship of the segment numbers k , number of reflection points D k , paragraph length Q k In this example, A2 = 7.0 cm 2 =7.0×10 -4 m 2 , D2=6,Q2=0.12m, substitute the terms on the right side of the formula to calculate

[0100]

[0101] According to the main formula:

[0102]

[0103] The gas retention judgment value Γ = 0.12, which is set in the reference analyzer in the typical gas chamber under normal gas replacement conditions, the lower limit of the residence time and the local turbulent diffusion range boundary, by measuring the maximum difference mean μ in 30 groups of samples 差 = 0.09, and set it as the boundary value by 30%, and get Γ = 0.12. If S k >Γ, the segment is determined to have a gas stagnation risk. In this example, S2 = 0.18695 > Γ, so the segment k = 2 is included in the stagnation segment identification list.

[0104] S313: Based on the channel retention segment identification list, perform unequal width channel shape adjustment for each segment, record the new width and height values of the cross-section after adjustment, calculate and archive the new aspect-to-height ratio of the cross-section, establish a record table associating the structure segment number with the corresponding new cross-section ratio, and generate a channel reconstruction structure ratio parameter set;

[0105] According to the channel retention section identification list, read the original cross-sectional dimensions W of each section number corresponding to the structure section in sequence. k ,H k , which is used as the initial input for adjustment. The system performs unequal width adjustment according to the retention index and geometric boundary restrictions of the segment. The adjustment strategy is: give priority to reducing the width W k To improve the local velocity field concentration, and moderately increase the height H kTo ensure the maintenance of volume flux, assume that the original W2 = 3.5 cm and H2 = 2.0 cm. According to the adjustment ratio rule, the width is reduced by 10%, that is, the new width W′2 = 3.15 cm, and the height is increased by 10%, then H′2 = 2.2 cm. Recalculate the cross-sectional ratio value ρ2 = W′2 / H′2 = 3.15 / 2.2≈1.43, record the adjusted parameter value, construct a mapping record table, associate the number segment k = 2 with the adjusted aspect ratio ρ2 = 1.43, and add it to the structural ratio parameter set for synchronous update of the channel structure reconstruction parameters.

[0106] See also Figure 5 The specific steps for obtaining the wall reflection control ratio list are as follows:

[0107] S411: Calling the channel reconstruction structure ratio parameter set, obtaining the reflection path trajectory data of the corresponding structure segment before and after deformation, calculating the difference in the number of path segments and the total length difference of the reflection path for each structure segment, combining the path difference with the central wavelength response segment to form a difference label set, and generating a reflection path difference feature set;

[0108] Call the channel reconstruction structure ratio parameter set, call the reflection path trajectory data before and after the structure deformation one by one according to the number segment, and extract the number of path segments N before deformation for each number segment bx , the number of path segments after deformation N ax , and calculate the difference in the number of path segments ΔN x =N ax -N bx , and summarize the total length of the original path L bx The total length of the deformed path L ax , we can get the total length difference of the reflection path ΔL x =L ax -L bx , taking the x=3 segment as an example, let the number of path segments before deformation be N b3 =6, the number of path segments after deformation is N a3 =4, then ΔN3=4-6=-2, indicating that the reflection path is simplified and the original path length is L b3 =1.75m, after deformation it is L a3 =1.60m, and ΔL3 = -0.15m. The central wavelength response record is then consulted to extract the central response wavelength range of the third segment, which is 540-560nm. The path segment difference ΔN3 and the path length difference ΔL3 are bound to this response band to form the reflection path difference label for this segment. The same operation is performed on all numbered segments to generate a four-tuple set of segment number, path segment difference, path length difference, and wavelength range, which constitutes the reflection path difference feature set.

[0109] S412: Call the reflection path difference feature set, divide the response segment into segments according to the central wavelength response segment of each numbered segment, and form multiple wavelength coverage intervals. Combined with the spectrum analyzer reflection threshold standard, set the target reflectivity. Calculate the required reflectivity adjustment amplitude of the coating based on the difference between the current reflectivity value and the target reflectivity value of each wavelength interval using the formula:

[0110]

[0111] Obtaining the reflectivity control offset value corresponding to each wavelength interval by calculation, and using the offset value as a reflectivity optimization interval identification parameter, obtaining the reflectivity reduction group corresponding to each section number, and generating a wavelength reflectivity control group set;

[0112] This value is used to quantify the adjustment distance between the reflectivity state of the current channel segment and the target state to guide the selection of coating materials and coating thickness control. This value comprehensively considers the reflectivity adjustment requirements within the wavelength range (i.e., numerical differences), the path impact caused by structural deformation (through structural proportions and optical path feature modulation), and the optical path complexity, and is ultimately quantified into an adjustment intensity indicator required for coating ratio control.

[0113] Among them, R xge W represents the reflection control deviation value of the xth segment in the gth wavelength range, xce is the current reflectivity value of the xth segment, W xre is the reflectivity value of the target in the xth segment, Z xe is the cross-sectional ratio of the xth segment after deformation, H xe is the projection height value of the xth segment of the light path, B xe A is the total length of the current reflection path in segment x, xe is the number of original paths in segment x;

[0114] After calling the reflection path difference feature set, read the central response wavelength range of each numbered segment and divide it into segments with a wavelength step of 5nm. Suppose the wavelength range of segment x=3 is 540~560nm. After segmentation, the intervals g1=[540,545], g2=545,550], g3=[550,555], and g4=[555,560] are obtained. Then, call the standard reflection threshold data of the spectrum analyzer and read the target reflectivity W of each interval segment. xre , set the target reflectivity to 0.65, and then read the actual reflectivity value W of each interval in the current structure xce , let W xce,g3 =0.53, calculate the difference W xce -W xre =0.53-0.65=-0.12, and the cross-sectional ratio Z after structural deformation is extracted at the same time xe =1.43, light path projection height Hxe =2.2cm, the total length of the current reflection path B xe =1.60m, original path number A xe =6, substitute the above parameters into the formula:

[0115]

[0116] Calculate the values of each part:

[0117]

[0118] R xge =|-0.0676+0.2667|=0.1991;

[0119] The reflection adjustment offset value R xge It is used to judge with the set offset tolerance value. The reflection control offset reference value Λ = 0.15 is set according to the difference between the maximum allowable reflection offset control range and the mean value of the coating spectrum adjustment response in the multi-channel spectrometer. The set value Λ = 0.15 is derived from the average deviation value of the upper limit of the 95% confidence interval in the statistics of 20 groups of samples. If R xge >Λ, then the segment and interval are included in the reflectivity reduction group. In this example, 0.1991>0.15, the x=3 segment and g=3 interval meet the conditions and are added to the wavelength reflectivity control group set.

[0120] S413: Based on the wavelength reflectance control group set, the reflectance control offset value of each group is matched with the material number and thickness correspondence in the coating database, and a coating material number with a reflectance adjustment capability higher than the target reflectance offset value is selected, and the required coating thickness value is marked. A matching table between the structure segment number, wavelength range, material number and thickness value is established to generate a wall reflection control ratio list;

[0121] According to the wavelength reflection control group, each segment number and wavelength range are cyclically analyzed, and the material number and thickness value comparison table recorded in the coating database are called to compare the reflection adjustment ability δR of each material combination in the target wavelength range. m (h), retrieve all the items that meet the condition δR m (h)≥R xge The material and thickness combination, let the material number M 17 At a thickness of h = 150nm, it can provide an adjustment capability of 0.21, meeting δR M17 (150) = 0.21 > R xge =0.1991, then select M 17 As the matching coating for the third wavelength interval of the third segment, and record the corresponding thickness of 150nm, construct the structure segment number x=3, wavelength interval g=3, material number M17 , thickness 150nm four-tuple relationship, collect and organize all combinations that meet the conditions to generate a wall reflection control ratio list.

[0122] See also Figure 6 ,The specific steps for obtaining the optimized air chamber structure configuration information are:

[0123] S511: Call the wall reflection control ratio list, extract the structural ratio configuration value, reflection control material number and reflection path adjustment value of the corresponding section, obtain the wavelength start and end values of the sensor calibration response spectrum, determine whether the central wavelength of the reflection path formed after the structural deformation is within the sensitive range, filter the section number set with overlapping wavelength frequency bands, and generate the frequency domain overlapping section identifier set;

[0124] Call the wall reflection control ratio list and extract the cross-sectional structure ratio value ρ corresponding to the structure segment number one by one x =W x / H x , reflection control material number M x and the center wavelength λ of the reflection path cx , extract the wavelength starting value λ of the response spectrum from the sensor calibration data set s and the end value λ e , suppose a segment number x = 3, its central wavelength λ c3 =553nm, the sensor response spectrum is λ s =540nm,λ e =560nm, perform judgment operation λ s ≤λ cx ≤λ e Is it true? In this case, 553nm∈

[0125] 540nm, 560nm] is true, the central wavelength of this segment is recorded as being in the sensitive range. If it is not true, the segment is eliminated, and the numbers of all the segments that meet the conditions are sequentially summarized to form a numbered set. This set is the frequency domain overlapping segment identifier set.

[0126] S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values of the corresponding segment, calculate the cross-sectional ratio, and extract the reflection path value and material number. The three data items are integrated into a segment structure state group, which is arranged in the order of the segment numbers to construct a number index. The structure state group is associated with the channel structure morphology structure map to generate a segment structure coupling parameter group.

[0127] According to the frequency domain overlapping segment identification set, traverse each segment number x and extract its corresponding cross-sectional width W x , height H x , calculate the cross-section ratio value Assume that segment x = 3, width W3 = 3.15cm, height H3 = 2.20cm, and we get Then read the number N of the reflection path x , reflection control material number M x , let N3=5,M3=M 17 , the three parameters (ρ3, N3, M3) are combined into a paragraph structure state group, and the corresponding state group is generated for each paragraph in sequence. The paragraph numbers are sorted from small to large, and a paragraph number index list is constructed. The number index is used as the primary key, and the structure state group is written into each paragraph entry in the channel structure morphology atlas database. A mapping from the number to the morphology state group is established in the structure atlas, realizing the ternary linkage between the number segment and the geometric parameters, reflection path information and material configuration, and completing the construction of the paragraph structure coupling parameter group.

[0128] S513: Calling the segment structure coupling parameter group, integrating the segment order, cross-section ratio value, number of reflection paths, coating number, and target response band into a unified form structure according to the number index and structural characteristic parameters, and embedding them into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establishing the collective information of each segment configuration, and generating the optimized gas chamber structure configuration information;

[0129] Based on the paragraph structure coupling parameter group, each group of structural parameters is analyzed in sequence according to the number index, and the paragraph number x and cross-section ratio value ρ are read. x , number of reflection paths N x , coating number M x , corresponding target response band [λ sx ,λ ex ], integrate the above five parameters into a unified structural data form entry, embed them into the overall structure mapping diagram of the gas channel in sequence, match the paragraph number and spatial distribution position in the mapping diagram, insert the structural unit configuration data through the index position, and record the complete structural configuration field in each structural node, including morphological proportion, path load, material label and band coverage interval, so as to construct the paragraph parameter set information, and construct the full map configuration of the gas channel structure section by section according to the number, and finally generate the optimized gas chamber structure configuration information.

[0130] A gas sensor-based air chamber structure optimization system, which is used to implement the above-mentioned gas sensor-based air chamber structure optimization method, includes:

[0131] The optimized structure identification module obtains the test data of the analyzer gas chamber channel, calculates the ratio of gas flow rate to cross-sectional area in each section, compares the ratio with the critical ratio of structural compression set in the channel, identifies the list of structural numbers that meet the compression requirements, and generates a set of structural segment numbers to be optimized;

[0132] The beam anomaly identification module calls the set of structure segment numbers to be optimized, determines whether the number of beam overlaps on a single path segment is greater than the upper limit of the channel reflection load, filters the location of the disordered reflection signal area, and generates a set of beam path anomaly segments;

[0133] The channel reconstruction analysis module identifies the area numbers where the gas stagnation risk value exceeds the retention threshold based on the set of abnormal sections of the beam path. It then resets the corresponding channel morphology to a unequal-width channel structure, records the new cross-sectional ratio of each structural section, and generates a channel reconstruction structure ratio parameter set.

[0134] The wall reflection control module calls the channel reconstruction structure ratio parameter set, divides it into multiple reflection impact groups according to the wavelength range, analyzes the required reflectivity reduction according to the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list;

[0135] The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after structural adjustment, and forms an optimized structural parameter combination set including the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value to generate the optimized air chamber structure configuration information.

[0136] The above are merely preferred embodiments of the present invention and do not limit the present invention in any other form. Any technician familiar with the profession may use the technical content disclosed above to change or modify it into an equivalent embodiment with equivalent changes and apply it to other fields. However, any simple modification, equivalent change and modification made to the above embodiment based on the technical essence of the present invention without departing from the content of the technical solution of the present invention shall still fall within the scope of protection of the technical solution of the present invention.

Claims

1. A gas chamber structure optimization method based on a gas sensor, characterized in that: The following steps are involved: S1: Obtain test data of the analyzer gas chamber channel, calculate the ratio of gas flow rate to cross-sectional area in each section, compare the ratio with the critical ratio of structural compression set in the channel, identify the list of structural numbers that meet compression requirements, and generate a set of structural segment numbers to be optimized; S2: calling the set of structure segment numbers to be optimized, screening the locations of disordered reflection signal areas by judging whether the number of beam overlaps on a single path segment is greater than the upper limit standard of the channel reflection load, and generating a set of abnormal beam path sections; S3: Based on the set of abnormal sections of the beam path, identify the region numbers where the gas stagnation risk value exceeds the retention judgment value, reset the corresponding channel morphology to a unequal width channel structure, record the new cross-sectional ratio of each structural segment, and generate a channel reconstruction structure ratio parameter set; S4: Call the channel reconstruction structure proportion parameter set to obtain the reflection path difference value and the central reflection wavelength range formed before and after the structural deformation, divide the reflection impact groups into multiple groups according to the wavelength range, analyze the required reflectivity reduction according to the target reflectivity, set the required coating thickness and material number, and generate a wall reflection control ratio list.

2. The gas chamber structure optimization method based on a gas sensor according to claim 1, characterized in that: The set of structure segment numbers to be optimized includes a structure segment number sequence, a structure compression critical value, and a corresponding channel position identifier; the set of abnormal beam path sections includes a reflection path superposition segment number, an optical path quantity threshold, and an inner wall reflection point coordinate range; the channel reconstruction structure ratio parameter set specifically includes a cross-sectional ratio setting value, a channel segment number mapping relationship, and a reconstruction volume index sequence; the wall reflection control ratio list includes a reflectivity adjustment group number, a corresponding wavelength range, and a coating thickness parameter index.

3. The gas chamber structure optimization method based on a gas sensor according to claim 2, characterized in that: The steps for obtaining the set of structure segment numbers to be optimized are specifically as follows: S111: Acquire test data of the analyzer gas chamber channel, including instantaneous flow velocity values and temperature stability values of the front, middle, and end sections under steady-state gas flow conditions, pair the flow velocity value of each section with the corresponding cross-sectional area in the channel geometry, calculate the ratio between the gas flow velocity and the cross-sectional area of each section, and generate a flow velocity-area ratio sequence; S112: Based on the velocity-area ratio sequence, according to the ratio data of each segment, a critical ratio value of structural compression set in the channel is called, each segment ratio is sequentially compared with the critical ratio value of structural compression, and the segment numbers of which the ratio is lower than the critical ratio value of structural compression are determined, a number set capable of implementing structural compression is obtained, and a sequence of segment numbers requiring compression is generated; S113: According to the compression requirement paragraph number sequence and the paragraph structure area number corresponding to each number, the corresponding channel segment positions in the air chamber three-dimensional structure model are numbered and summarized, and a number list is constructed according to the paragraph number sorting rule to form a structure segment number set to be optimized.

4. The gas chamber structure optimization method based on a gas sensor according to claim 3, characterized in that: The steps for obtaining the set of abnormal sections of the beam path are specifically as follows: S211: Calling the set of structure segment numbers to be optimized, obtaining each structure segment number, extracting the values of the incident angle and the exit angle of the light beam in the analyzer gas chamber channel, and locating the coordinate points of the inner wall reflection surface of each numbered segment in combination with the channel contour information in the three-dimensional structure diagram, determining the propagation direction difference between the incident path and the exit path through coordinate association, and generating a segment angle and coordinate matching data set; S212: Based on the segment angle and coordinate matching data set, according to the incident angle, exit angle, and reflection point coordinate position, combined with the reflection path trajectory of the structural segment in the air chamber channel structure, calculate the number of reflections and the total optical path length of the corresponding structural segment, and record whether there is spatial overlap in the channel wall of the light beam reflection path. Compare the number of light beam reflections and the optical path length with the upper limit standard of the reflection load per unit channel segment using the formula: Obtain the reflected load deviation value through calculation, classify the segment numbers whose reflected load deviation value is greater than the set deviation judgment reference value into the abnormal segment set, and generate a reflection abnormal segment identification list; Among them, R i Represents the deviation value of the reflected load in the i-th segment, N i Indicates the number of reflections of the i-th beam, L i is the total length of the i-th optical path, P ij T represents the projection area of the reflection point of the jth path in the i-th segment on the channel surface, i is the reflection load threshold allowed in the i-th channel, and m is the total number of beam paths in the i-th segment; S213: Based on the reflection abnormality segment identification list, the position of each segment number in the air chamber structure is recalled, the marking status and path coordinates of the overlapping reflection segments are extracted, and the segment numbers that meet the standard of the number of beam overlapping paths exceeding the reflection load are screened to generate a beam path abnormality segment set.

5. The gas chamber structure optimization method based on a gas sensor according to claim 4, characterized in that: The steps for obtaining the channel reconstruction structure ratio parameter set are specifically as follows: S311: Obtain the set of abnormal sections of the beam path, extract the cross-sectional width value, height value, channel section length value and number of reflection points of the corresponding channel section, calculate the cross-sectional area and local area volume index, and generate a local volume index sequence; S312: Based on the local volume index sequence, according to the volume value of each numbered segment and the gas flow rate value in the channel segment, the volume index of each segment and the corresponding flow rate value are calculated in a ratio according to the numbered segment correspondence method, using the formula: Obtain the gas stagnation risk value of each numbered segment by calculation, compare the stagnation risk value with the gas retention judgment value, select the numbered set whose gas stagnation risk value exceeds the gas retention judgment value, and generate a channel retention segment identification list; Among them, S k represents the gas stagnation risk value of the kth segment, V k is the volume index of the kth segment, F k is the gas flow rate value of the kth section, A k is the cross-sectional area of the kth segment, D k is the number of reflection points in the kth paragraph, Q k is the length of the k-th channel; S313: According to the channel retention segment identification list, perform unequal width channel morphology adjustment for each segment, record the new width and height values of the cross-section after adjustment of the structural segment, calculate and archive the new aspect-to-height ratio of the cross-section, establish an association record table between the structural segment number and the corresponding new cross-section ratio, and generate a channel reconstruction structure ratio parameter set.

6. The gas chamber structure optimization method based on a gas sensor according to claim 5, characterized in that: The steps for obtaining the wall reflection control ratio list are as follows: S411: calling the channel reconstruction structure ratio parameter set, obtaining reflection path trajectory data of the corresponding structure segment before and after deformation, calculating the difference in the number of path segments and the total length difference of the reflection path for each structure segment, combining the path difference with the central wavelength response segment to form a difference label set, and generating a reflection path difference feature set; S412: Call the reflection path difference feature set, segment the response segment according to the central wavelength response segment of each numbered segment to form multiple wavelength coverage intervals, and set the target reflectivity in combination with the spectrum analyzer reflection threshold standard. Calculate the required reflectivity adjustment amplitude of the coating based on the difference between the current reflectivity value and the target reflectivity value of each wavelength interval using the formula: Obtaining the reflectivity control offset value corresponding to each wavelength interval by calculation, and using the offset value as a reflectivity optimization interval identification parameter, obtaining the reflectivity reduction group corresponding to each section number, and generating a wavelength reflectivity control group set; Among them, R xge W represents the reflection control deviation value of the xth segment in the gth wavelength range, xce is the current reflectivity value of the xth segment, W xre is the reflectivity value of the target in the xth segment, Z xe is the cross-sectional ratio of the xth segment after deformation, H xe is the projection height value of the xth segment of the light path, B xe A is the total length of the current reflection path in segment x, xe is the number of original paths in segment x; S413: Based on the wavelength reflection control group set, according to the reflection control offset value of each group, a pairing mapping is performed with the correspondence between the material number and thickness identified in the coating database, and a coating material number with a reflectivity adjustment capability higher than the target reflectivity offset value is selected, and the required coating thickness value is marked. A matching table between the structure segment number, wavelength range, material number and thickness value is established to generate a wall reflection control ratio list.

7. The gas chamber structure optimization method based on a gas sensor according to claim 6, characterized in that: The method further comprises: S5: calling the wall reflection control ratio list, comparing the wavelength value of the sensitive interval in the sensor calibration response spectrum, identifying the segment number that overlaps with the sensitive interval in the frequency domain after the structure adjustment, and forming an optimized structural parameter combination set including the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value to generate optimized air chamber structure configuration information; The optimized air chamber structure configuration information specifically refers to the structure segment arrangement sequence, structure cross-section combination parameters, light path structure index, inner wall reflection parameter label and sensor response target band.

8. The gas chamber structure optimization method based on a gas sensor according to claim 7, characterized in that: The steps for obtaining the optimized air chamber structure configuration information are specifically as follows: S511: Calling the wall reflection control ratio list, extracting the structural ratio configuration value, reflection control material number, and reflection path adjustment value of the corresponding section, obtaining the wavelength start and end values of the sensor calibration response spectrum, determining whether the center wavelength of the reflection path formed after structural deformation is within the sensitive range, screening the section number set with overlapping wavelength frequency bands, and generating a frequency domain overlapping section identifier set; S512: Based on the frequency domain overlapping segment identifier set, obtain the cross-sectional width and height values of the corresponding segment, calculate the cross-sectional ratio, and extract the reflection path value and material number. The three data items are integrated into a segment structure state group, which is arranged in the order of the segment numbers to construct a number index. The structure state group is associated with the channel structure morphology structure map to generate a segment structure coupling parameter group. S513: Call the paragraph structure coupling parameter group, and integrate the paragraph order, cross-section ratio value, number of reflection paths, coating number, and target response band into a unified form structure according to the number index and structural characteristic parameters. Embed them into the overall structure mapping diagram of the gas channel in sequence according to the coupling association order, establish the collection information of each paragraph configuration, and generate the optimized gas chamber structure configuration information.

9. A gas chamber structure optimization system based on a gas sensor, characterized in that: The system is used to implement the gas chamber structure optimization method based on a gas sensor according to any one of claims 1 to 8, and the system includes: The optimized structure identification module obtains the test data of the analyzer gas chamber channel, calculates the ratio of gas flow rate to cross-sectional area in each section, compares the ratio with the critical ratio of structural compression set in the channel, identifies the list of structural numbers that meet the compression requirements, and generates a set of structural segment numbers to be optimized; The beam anomaly identification module calls the set of structure segment numbers to be optimized, determines whether the number of beam overlaps on a single path segment is greater than the upper limit standard of the channel reflection load, filters the location of the disordered reflection signal area, and generates a set of beam path anomaly sections; The channel reconstruction analysis module identifies the region number where the gas stagnation risk value exceeds the retention judgment value based on the set of abnormal sections of the beam path, resets the corresponding channel morphology to a unequal width channel structure, and generates a channel reconstruction structure ratio parameter set; The wall reflection control module calls the channel reconstruction structure ratio parameter set, divides it into multiple reflection impact groups according to the wavelength range, analyzes the required reflectivity reduction range based on the target reflectivity, sets the required coating thickness and material number, and generates a wall reflection control ratio list; The structural optimization configuration module calls the wall reflection control ratio list, identifies the segment numbers that overlap with the sensitive interval in the frequency domain after the structural adjustment, and forms an optimized structural parameter combination set including the channel segment layout order, local structural morphology, light path direction, reflection parameter number and sensor response target value to generate optimized air chamber structure configuration information.

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