1600 DEG C narrow-band multi-angle emissivity measurement system and method

Abstract

The invention provides a 1600 DEG C narrow-band multi-angle emissivity measurement system and method, and the system comprises a laser generator which is used for transmitting a high-energy laser beam to heat a measured material to a preset temperature in a high-temperature working region; wherein the temperature of the high-temperature working area ranges from 1000 DEG C to 1600 DEG C; the narrow-band spectrometer is used for measuring emissivity spectral data of the heated to-be-measured material in a near-infrared band; wherein the measurement wave band range of the narrow wave band spectrometer is 0.1 [mu] m-1. 1 [mu] m; wherein the laser generator, the measured material and the narrow-band spectrometer are arranged at a close distance but not in physical contact, and the high-temperature emissivity of the solid material within the range of 10-90 degrees can be rapidly measured in situ. By means of the system, the problems that an existing material spectrum testing system cannot test the high-temperature emissivity of the material, the heating speed is low, the material size is limited, and only the normal emissivity can be measured are solved.

Description

Technical Field

[0001] The present application relates to the field of material spectrum testing, and in particular to a 1600°C narrow-band multi-angle emissivity measurement system and method. Background Art

[0002] A material spectroscopy testing system is a device used to analyze the spectral properties of materials. It is typically used to detect characteristics such as a material's composition, molecular structure, and physical state. It is widely used in fields such as chemical analysis, materials science, and environmental monitoring. The core principle of a spectroscopy testing system is to obtain spectral information about a material by measuring and analyzing the reflected, absorbed, transmitted, or emitted light through the interaction between light and matter using a spectroscopic instrument.

[0003] Existing material spectroscopy testing systems are generally unsuitable for extremely high-temperature testing and typically operate at room temperature. Testing materials at varying temperatures requires the use of high-temperature furnaces to reach temperatures ranging from several hundred to thousands of degrees Celsius. This heating process is slow and can cause oxidation, fracture, and other damage to solid materials. Furthermore, due to specific limitations on material size, the system can only measure fixed emissivity in a specific direction, failing to meet the rapid, multi-angle, and complex requirements of engineering testing. Summary of the Invention

[0004] In response to the above problems, the present application provides a 1600°C narrow-band multi-angle emissivity measurement system and method to solve many problems such as the inability of existing material spectral testing systems to measure the high-temperature emissivity of materials, slow heating speed, limited material size, and only being able to measure emissivity in a single direction.

[0005] In the first aspect, the present application provides a 1600°C narrow-band multi-angle emissivity measurement system, the technical solution adopted is: A 1600°C narrow-band multi-angle emissivity measurement system, comprising: A laser generator, configured to emit a high-energy laser beam to heat the material being tested to a preset temperature within a high-temperature working zone, wherein the high-temperature working zone is 1000°C to 1600°C; A narrow-band spectrometer, used to measure the emissivity spectral data of the heated material in the near-infrared band; wherein the measurement band range of the narrow-band spectrometer is 0.1 μm-1.1 μm; The laser generator, the material to be measured and the narrow-band spectrometer are arranged in close proximity but not in physical contact.

[0006] As one of the preferred solutions, the system further includes: The transfer platform is used to be set on the material to be tested or the narrow-band spectrometer to change the relative position angle between the material to be tested and the narrow-band spectrometer; wherein the relative position angle range is 10°-90°.

[0007] As one of the preferred solutions, the transfer platform includes a first moving part or a second moving part; the first moving part contacts the material to be tested to transfer the material to be tested; the second moving part is connected to the narrow-band spectrometer to transfer the narrow-band spectrometer.

[0008] As one of the preferred solutions, the wavelength of the high-energy laser beam emitted by the laser generator is staggered with the measurement band range.

[0009] As one of the preferred solutions, the wavelength of the high-energy laser beam is 1.2 μm.

[0010] As one of the preferred solutions, the system further includes: a first controller connected to the laser generator and configured to adjust operating parameters of the laser generator; the operating parameters including at least power; The second controller is connected to the narrow-band spectrometer and is used to adjust the measurement parameters of the narrow-band spectrometer.

[0011] As one of the preferred solutions, the first controller is provided with a display screen to display the working parameters and output the current working status; the second controller is provided with a display screen to display the measurement parameters and output the emissivity spectrum data.

[0012] A second aspect of the present application further provides a 1600°C narrow-band multi-angle emissivity measurement method, the method comprising: Prepare the material to be tested, a laser generator and a narrow-band spectrometer; the measurement band range of the narrow-band spectrometer is 0.1 μm-1.1 μm; The material to be tested, the laser generator and the narrow-band spectrometer are arranged in close proximity; Utilizing the laser generator to emit a high-energy laser beam to heat the material to be tested to a preset high temperature, wherein the preset high temperature is any temperature between 1000° C. and 1600° C.; Within a preset time, the narrow-band spectrometer is used to measure the emissivity spectrum data of the heated material in the near-infrared band.

[0013] As one of the preferred solutions, the method of measuring the emissivity spectrum data of the heated material in the near-infrared band using the narrow-band spectrometer further includes: Adjusting the relative position angle between the narrow-band spectrometer and the material being measured; wherein the relative position angle range is 10°-90°; The emissivity spectrum data of the material under test is measured at different relative position angles within the relative position angle range.

[0014] As one of the preferred solutions, a laser generator is prepared, including: A laser generator is selected that emits a high-energy laser beam with a wavelength of 1.2 μm.

[0015] Compared with the prior art, this application has the following advantages: This application proposes a 1600°C narrow-band multi-angle emissivity measurement system, which includes: A laser generator is used to emit a high-energy laser beam to heat the material under test to a preset temperature in a high-temperature working zone; wherein the high-temperature working zone is 1000°C-1600°C; a narrow-band spectrometer is used to measure the emissivity spectral data of the heated material under test in the near-infrared band; wherein the measurement band range of the narrow-band spectrometer is 0.1μm-1.1μm; wherein the laser generator, the material under test and the narrow-band spectrometer are arranged in close proximity but not in physical contact.

[0016] By adopting the technical solution of this application, a high-energy laser beam emitted by a laser generator is used to heat the surface of the material. When the high-energy laser beam is used to heat the material to be tested, the beam can concentrate a large amount of energy on the sample surface. The heat source is concentrated and accurate, and the heating speed is fast (it can rise to 1600°C in 2 minutes). Therefore, it is not limited by temperature, breaking through the temperature limit of traditional technology, and can be used to study the radiation characteristics of high-temperature or ultra-high-temperature materials at extreme temperatures. The material to be tested does not need to be mechanically clamped or installed in a specific device, and the size of the material to be tested is not strictly limited by the geometric size of the heating carrier. At the same time, a narrow-band spectrometer is used, and its measurement band is only 0.1μm-1.1μm, which matches the radiation peak wavelength of the material being tested heated to 1600℃. Therefore, the use of this narrow-band spectrometer is very suitable for capturing the main radiation information of ultra-high temperature objects at 1600℃, realizing spectral measurement under high temperature in the near-infrared narrow band, and outputting accurate emissivity spectrum data. It can measure the high-temperature emissivity of solid materials in the range of 10°-90° in situ and quickly, and is suitable for emissivity testing of ultra-high temperature materials.

[0017] The measurement method provided in the embodiment of the present application has the same advantages as the above-mentioned measurement system over the prior art, which will not be repeated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for the description of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0019] Figure 1This is a schematic diagram of the structure of a 1600°C narrow-band multi-angle emissivity measurement system according to an embodiment of the present application; Figure 2 This is a flowchart of the steps of the 1600°C narrow-band multi-angle emissivity measurement method described in another embodiment of the present application. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0021] It should be noted that different types of spectral testing systems are generally suitable for different temperature ranges. As mentioned in the background technology, the maximum test temperature of most spectral testing systems is only around 1000°C. The only spectral testing system currently suitable for material analysis in high-temperature environments uses a Fourier transform infrared spectrometer to measure the material's mid-infrared reflectivity. However, a Fourier transform infrared spectrometer covers the mid-infrared band from 2.5μm to 25μm and is therefore only suitable for measuring infrared radiation and reflectivity of materials at longer wavelengths.

[0022] As we know, as temperature increases, a material's peak radiation wavelength shifts toward shorter wavelengths (near-infrared). Therefore, at high temperatures, especially at or above 1600°C, an object's peak radiation wavelength is in the near-infrared band. Consequently, the thermal radiation intensity of a material at high temperatures is stronger in the near-infrared band. At mid-infrared bands and above, the radiation energy of an object decreases significantly, making it difficult to measure its emissivity. Therefore, Fourier transform infrared spectroscopy is only practical for measurements in the mid-infrared and longer wavelengths. It is more suitable for measuring the reflectivity of low- and medium-temperature materials, but not for testing ultra-high-temperature materials.

[0023] The near-infrared (NIR) band covers the critical radiation band of materials at ultra-high temperatures and is one of the most commonly used bands in materials science, thermal radiation, and energy management research. Therefore, measuring NIR emissivity under ultra-high temperature conditions is crucial and of practical significance for many high-temperature applications.

[0024] Furthermore, when testing materials within different temperature ranges, a high-temperature furnace or specialized heating device is used to heat the material sample to the desired temperature range. The material sample must be placed in the high-temperature furnace. However, the high-temperature furnaces in many spectral testing systems are limited in size and can typically only accommodate small samples. Furthermore, the heating speed is slow, making the energy consumption disadvantage particularly prominent when testing materials at ultra-high temperatures.

[0025] In view of the fact that most of the existing material spectrum testing systems measure the spectrum range of lower temperature or longer wavelength, they cannot fully capture the infrared radiation behavior of materials under high temperature conditions, and at the same time, there are many phenomena such as insufficient effective heating of materials. Figure 1 As shown, Figure 1 The structural principle diagram of the 1600°C narrow-band multi-angle emissivity measurement system shown in this application proposes a 1600°C narrow-band multi-angle emissivity measurement system, which includes: a laser generator for emitting a high-energy laser beam to heat the material under test to a preset temperature within a high-temperature working zone; wherein the high-temperature working zone is 1000°C-1600°C; a narrow-band spectrometer for measuring the emissivity spectral data of the heated material under test in the near-infrared band; wherein the measurement band range of the narrow-band spectrometer is 0.1μm-1.1μm; wherein the laser generator, the material under test, and the narrow-band spectrometer are arranged in close proximity but not in physical contact.

[0026] Specifically, a laser generator emits a high-energy laser beam, non-contact heating the material being tested to a designated high-temperature working zone, ranging from 1000°C to 1600°C. This non-contact heating method achieves rapid, load-free, force-free, and pressure-free heating of the material.

[0027] The high-energy laser beam emitted by the laser generator heats the surface of the material. When a high-energy laser beam is used to heat the material being measured, the beam can concentrate a large amount of energy on the sample surface, resulting in a concentrated and accurate heat source and a rapid temperature rise (reaching 1600°C in 2 minutes). Therefore, it is not subject to temperature restrictions, breaking through the temperature limitations of traditional technologies and being suitable for studying the radiation characteristics of high-temperature or ultra-high-temperature materials at extreme temperatures. In an embodiment of the present invention, a laser generator is used to heat the material to 1000°C-1600°C, expanding the spectral measurement capabilities of the material under extreme conditions. This can better simulate the material properties in extreme environments, helping to understand the emissivity characteristics of materials often used at high temperatures in fields such as aerospace, energy, and manufacturing, so as to propose targeted implementation plans.

[0028] The material to be tested and the laser generator can be separately arranged, with no physical contact or mechanical connection between the two. The laser generator emits a high-energy laser beam to the surface of the material to be tested, thereby performing non-contact heating. Therefore, the material to be tested does not need to be mechanically clamped or installed in a specific device. The size of the material to be tested is not strictly limited by the geometric size of the heating carrier. Therefore, the embodiments of the present invention are applicable to the heating of test materials of almost all shapes and sizes and the subsequent emissivity measurement.

[0029] As you can understand, emissivity is the ability of a material's surface to emit radiant energy at a specific temperature, and is generally related to the material's temperature and wavelength. Therefore, for materials heated to ultra-high temperatures, the emissivity of the object's radiation peaks in the near-infrared wavelength range. Based on this, a narrow-band spectrometer specifically designed to measure emissivity spectral data within the near-infrared band (0.1μm to 1.1μm) was selected to fill the wavelength range not covered by traditional technologies under ultra-high temperature conditions.

[0030] A narrowband spectrometer is an optical instrument used to measure electromagnetic radiation within a specific wavelength range. When measuring the emissivity of high-temperature materials, it is often used to detect a specific spectral region and focus on accurately measuring the radiation intensity of a specific wavelength or a small range of wavelengths.

[0031] As we know, narrowband spectrometers can measure emissivity within a specific wavelength range. This wavelength range is usually determined by the spectrometer's hardware configuration, including optical components, detector type, and filter design. For example, a near-infrared spectrometer typically has a response spectrum within the near-infrared band.

[0032] Preferably, the narrow-band spectrometer used in the embodiment of the present invention is an emission spectrum OES optical instrument, whose measurement band is only 0.1μm-1.1μm. This measurement band matches the radiation characteristics of the material being measured in the above-mentioned high-temperature working area, so it is more unique in combination with the laser generator. The measured emissivity spectrum data eliminates unnecessary spectral interference, allowing the system to obtain the most relevant spectral data, thereby improving the accuracy and efficiency of the measurement.

[0033] It can be known that the optical emission spectrometer (OES) is an existing device, and its specific measurement principles and steps can refer to specific models of emission spectrometers.

[0034] In some embodiments, the material under test and the narrowband spectrometer are also separated, without physical contact or mechanical connection, thus achieving non-contact measurement. Optical emission spectroscopy (OES) instruments measure the emissivity of a material under test by collecting light emitted from its surface. Light emitted by the material under test can be directed into the spectrometer using optical fibers or lenses, enabling non-contact measurement of the thermal radiation properties of high-temperature or ultra-high-temperature samples.

[0035] In some embodiments, the laser generator, the material being measured, and the narrowband spectrometer are placed in close proximity, with each pair of the three placed close to each other. In this embodiment, the non-contact setup eliminates the errors and interference that can arise from physical contact, while the close proximity ensures that both the laser generator and the narrowband spectrometer operate effectively within their respective ranges. The combination of these three creates a simple and efficient measurement system.

[0036] In some embodiments, the laser generator and the narrow-band spectrometer may be arranged symmetrically or asymmetrically with respect to the material being measured.

[0037] In some embodiments, the relative position between the material being measured and the narrowband spectrometer can be adjusted.

[0038] For example, the material being measured can be placed lightly on the ground, with the laser generator and narrowband spectrometer positioned above and adjacent to the material. Simply aligning the light output with the material is sufficient. Thus, the three are physically independent but functionally coupled. By performing non-contact heating and measurement at high temperatures, the high-temperature emissivity of solid materials can be rapidly and in situ measured within a 10°-90° range, overcoming many limitations of traditional spectral measurement systems.

[0039] In summary, a laser generator is used to heat the material under test to a predetermined high temperature. Especially under ultra-high temperature conditions (e.g., 1600°C), the near-infrared band (0.1μm-1.1μm) is the primary wavelength of energy radiated by the material under test at these temperatures. Emissivity measurements in the near-infrared band can accurately reflect the material's radiation characteristics at these temperatures.

[0040] Preferably, a laser generator is used to heat the material to be tested to 1600°C.

[0041] Near-infrared emissivity measurements are crucial for evaluating the performance of high- and ultra-high-temperature materials used in extreme temperature environments, such as refractories, aerospace materials, and metallurgical materials, including their heat resistance, optical properties, and energy absorption / release characteristics. This not only plays a key role in industry, scientific research, and national defense, but also provides a technical foundation for improving energy efficiency and developing new high-temperature materials.

[0042] Therefore, in order to accurately realize the emissivity measurement of high-temperature or ultra-high-temperature materials, a narrow-band spectrometer is set up. The measurement band range of the narrow-band spectrometer is designed to focus on the most effective band. The measurement band range of the narrow-band spectrometer is 0.1μm-1.1μm, which matches the radiation peak wavelength of the measured material heated to 1600℃. Therefore, the use of this narrow-band spectrometer is very suitable for capturing the main radiation information of ultra-high temperature objects at 1600℃, realizing spectral measurement at high temperature in the near-infrared narrow band, and outputting accurate emissivity spectrum data, which is applicable to a wider range of material types.

[0043] In related technologies, existing material testing systems can only test normal emissivity and cannot fully characterize the radiation characteristics of materials, which also limits their practical application in designing and simulating materials. In a further technical solution, the system further includes: The transfer platform is used to be set on the material to be tested or the narrow-band spectrometer to change the relative position angle between the material to be tested and the narrow-band spectrometer; wherein the relative position angle range is 10°-90°.

[0044] In this embodiment, the emissivity of a material typically changes with the measurement angle. A transfer platform is used to adjust the relative position between the material being measured and the narrowband spectrometer. The transfer platform can be placed on either the material being measured or the narrowband spectrometer. Adjusting the position of either allows the relative angle between the two to be adjusted, thereby varying the measurement angle and enabling multi-angle emissivity measurement. This overcomes the limitation of traditional systems that can only measure normal emissivity.

[0045] Specifically, the radiation intensity and directionality of a material's surface at high temperatures vary significantly, particularly within the angular range of 10°-90°, where significant differences in emissivity are evident. Therefore, when measuring angles from 10° to 90°, the surface emission characteristics of the material being measured are covered, from near-normal to near-surface, thereby characterizing the material's anisotropic thermal radiation properties and providing a more comprehensive understanding of the material's radiation characteristics at different angles.

[0046] In some embodiments, the transfer platform can achieve precise angle adjustment through a mechanical or automatic control system. Specifically, the spectrometer / tested material can adjust the angle as the transfer platform rotates and / or moves.

[0047] In some embodiments, the current relative position angle between the measured material and the narrowband spectrometer may be determined by means of different types of measurement tools.

[0048] For example, the angle between the spectrometer and the material surface is measured using a protractor with an electronic readout.

[0049] For example, a spirit level is used to measure the angle between the spectrometer and the material surface.

[0050] For example, an angle sensor is set on the transfer platform.

[0051] Therefore, the system formed by the embodiment of the present invention has the characteristics of fast heating speed, no support or pressure on the base material, and multiple testing angles. It also has a simple structure, low cost, simple operation, and is easy to assemble. It can quickly measure the high-temperature emissivity of solid materials in the range of 10°-90° in situ.

[0052] In a further technical solution, the transfer platform includes a first moving part or a second moving part; the first moving part contacts the material to be tested to transfer the material to be tested; the second moving part is connected to the narrow-band spectrometer to transfer the narrow-band spectrometer.

[0053] In this embodiment, the function of the first moving member is to adjust the position or angle of the material to be measured, thereby adjusting the measuring angle.

[0054] In some embodiments, the first moving part may be a connecting rod mechanism with a support plate, the material to be tested is placed on the support plate, the connecting rod mechanism is connected to a robotic arm, and the robotic arm drives the material to be tested to move in three-dimensional space.

[0055] In some embodiments, the first moving part may also be a rotating table, and the material to be measured is placed on the rotating table, and the angle between the material to be measured and the narrow-band spectrometer is changed by rotating the material to be measured.

[0056] In this embodiment, the function of the second moving member is to adjust the position or angle of the narrow-band spectrometer, thereby adjusting the measurement angle.

[0057] In some embodiments, the second moving member may be an electric translation platform, which can electrically move the spectrometer to adjust the distance between the spectrometer and the material being measured; In some embodiments, the second moving member may be a universal adjustment bracket, which enables the narrow-band spectrometer to be adjusted in multiple degrees of freedom.

[0058] Preferably, the transfer platform adopts a second moving part, that is, keeping the material to be measured still, moving the narrow-band spectrometer to capture emissivity data at different angles, avoiding disturbance of the high-temperature material, maintaining its surface state, and avoiding damage during the measurement process.

[0059] In another embodiment, the wavelength of the high-energy laser beam emitted by the laser generator is staggered with the measurement wavelength range.

[0060] In this embodiment, the laser generally emits a high-energy laser beam of a single wavelength, and thus different types of lasers emit laser beams of different wavelengths. Therefore, a specific type of laser can be selected based on the wavelength of the laser beam to be emitted.

[0061] As we know from the above, the measurement band of a narrow-band spectrometer is 0.1μm-1.1μm. Therefore, if the laser wavelength emitted by the laser overlaps with the measurement band of the spectrometer, the narrow-band spectrometer will mistakenly interpret the laser signal as spectral data emitted by the material, resulting in inaccurate emissivity measurement.

[0062] Therefore, a laser source with a specific wavelength is selected to be offset from the measurement band. The emitted high-energy laser beam is only used to heat the material surface, and the narrow-band spectrometer only focuses on measuring the emissivity in the 0.1μm-1.1μm band. Therefore, the spectrometer only captures the radiation spectrum spontaneously emitted by the measured material at high temperature, rather than the radiation carrying the laser. The offset of the two bands avoids the interference of the laser heating light source on the spectral measurement, ensuring the authenticity and accuracy of the emissivity spectrum data.

[0063] When heating the object under test, the laser wavelength is preferably fixed at 1.2μm (outside the measurement range of a narrowband spectrometer). Near-infrared lasers with a wavelength of 1.2μm offer high output power and good material absorption characteristics. Furthermore, the laser beam can be easily focused onto a small area, making it suitable for rapid heating. Therefore, selecting a laser generator in the near-infrared band allows for efficient material heating at this wavelength while achieving wavelength offset between laser heating and spectral measurement.

[0064] As a further illustration of this embodiment, the system further includes: a first controller connected to the laser generator, for adjusting the operating parameters of the laser generator; the operating parameters include at least power; a second controller connected to the narrow-band spectrometer, for adjusting the measurement parameters of the narrow-band spectrometer.

[0065] In this embodiment, the first controller controls the operating state and output of the laser generator, primarily adjusting parameters such as power. Power regulation is one of the most important parameters in the laser heating process. Because different materials react differently to laser heating and have different emissivity rates, the laser power can be adjusted to achieve the optimal heating effect. Especially in the high-temperature range of 1000°C to 1600°C, power control ensures the heating speed and duration, thereby rapidly heating the material being tested.

[0066] Of course, in addition to power, the operating parameters of the laser may also include the focal position of the laser beam, the spot diameter, the laser pulse frequency, etc.

[0067] In this embodiment, the second controller is responsible for controlling the measurement parameters of the narrow-band spectrometer to optimize the spectrum measurement process.

[0068] It is understood that the measurement parameters of the emission spectrum OES optical instrument include spectral resolution, exposure time, etc. According to the different temperature states of the material, the second controller can dynamically adjust the measurement parameters to adapt to the changes in the spectral intensity emitted by the material under different temperature conditions.

[0069] In combination with the above embodiments, when the transfer platform changes the relative position angle between the material under test and the spectrometer, the second controller can dynamically adjust the parameters of the spectrometer to ensure that accurate emissivity data can still be captured at different angles.

[0070] In this embodiment, the first controller and the second controller can both be computers, which control the operating parameters of the laser generator and the narrow-band spectrometer by operating corresponding software in the computers. During the measurement process, they can be placed around the corresponding laser generator and narrow-band spectrometer.

[0071] As a further explanation of this embodiment, the first controller is provided with a display screen to display the working parameters and output the current working status; the second controller is provided with a display screen to display the measurement parameters and output the emissivity spectrum data.

[0072] In this embodiment, through the display screen of the first controller, the operator can directly judge whether the operating parameters of the laser need to be adjusted based on the display of the operating parameters, thereby optimizing the heating effect.

[0073] Through the display screen of the second controller, which shows the spectral data provided under the current temperature and measurement conditions, the operator can observe the emission characteristics of the material in real time, confirm the validity and accuracy of the measurement, and adjust the measurement parameters of the spectrometer as needed.

[0074] It can be understood that the display screen is the corresponding software operation interface in the computer.

[0075] Therefore, the embodiment of the present application integrates functions such as laser power adjustment and spectrometer measurement into one system, and operates and displays them separately through two computers, realizing a fully automated measurement process, and visualizing the working process and emissivity data, which helps to observe the laser heating and spectral measurement processes separately, realize one-stop parameter control and data display, and is easy to operate, thereby improving the convenience of the system.

[0076] Based on the same concept, this application also proposes a cold start method based on unidirectional heating and multiple temperature changes, which is realized by relying on the 1600℃ narrow band multi-angle emissivity measurement system as described above. Figure 2 As shown, Figure 2 This is a flowchart of the steps of the 1600°C narrow-band multi-angle emissivity measurement method according to an embodiment of the present application. The method includes the following steps: S1. Prepare the material to be tested, a laser generator, and a narrow-band spectrometer; the measurement band range of the narrow-band spectrometer is 0.1 μm-1.1 μm; S2, placing the material to be tested, the laser generator, and the narrow-band spectrometer in close proximity; S3, using the laser generator to emit a high-energy laser beam to heat the material to be tested to a preset high temperature, wherein the preset high temperature is any temperature between 1000° C. and 1600° C.; S4. Within a preset time, use the narrow-band spectrometer to measure the emissivity spectrum data of the heated material in the near-infrared band.

[0077] The material to be tested may be a metal matrix, and the preset time may be 5 minutes.

[0078] Furthermore, step S4 includes: S5. Adjust the relative position angle between the narrowband spectrometer and the material under test; wherein the relative position angle range is 10°-90°; S6. Measure the emissivity spectrum data of the material under test at different relative position angles within the relative position angle range.

[0079] The steps for measuring each relative position angle in step S6 refer to steps S1 to S4.

[0080] Furthermore, step S1 includes: S11. Select a laser generator that emits a high-energy laser beam with a wavelength of 1.2 μm.

[0081] Through steps S1 to S6, in order to address the many limitations of measuring the high-temperature emissivity of materials, a high-energy laser beam is used to heat the material surface to 1600°C. Through the design and construction of a narrow-band spectrometer, a high-temperature emissivity measurement device in the 0.1μm-1.1μm band within the range of 10°-90° is realized. This device has the characteristics of fast heating speed (heating to 1600°C in 2 minutes), measuring the near-infrared band (0.1μm-1.1μm), and completing the test. It has the characteristics of fast heating speed, no support or pressure on the base material, and multiple test angles.

[0082] It should be noted that for the method embodiments, for the sake of simplicity, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the embodiments of the present application are not limited by the order of the actions described, because according to the embodiments of the present application, certain steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions involved are not necessarily required by the embodiments of the present application.

[0083] As for the method embodiment, since it is basically similar to the system embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the system embodiment.

[0084] It should be noted that the various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same and similar parts between the various embodiments can be referenced to each other.

[0085] It should also be noted that, in this article, the directions or positional relationships indicated by the terms "upper", "lower", "left", "right", "inside", "outside", etc. are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, relational terms such as "first" and "second" are merely used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations, nor can they be understood as indicating or implying relative importance. Moreover, the term "comprises" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or terminal device that includes a series of elements includes not only those elements, but also includes other elements that are not explicitly listed, or also includes elements that are inherent to such process, method, article or terminal device.

[0086] The above describes in detail the 1600°C narrow-band multi-angle emissivity measurement system and method provided by this application. Specific examples are used herein to illustrate the principles and implementation methods of this application. The description of the above embodiments is intended only to facilitate understanding of this application, and the contents of this specification should not be construed as limiting this application. Furthermore, those skilled in the art will appreciate that various modifications may be made to the specific implementation methods and scope of application based on this application. While it is not necessary and impossible to exhaustively enumerate all implementation methods here, any obvious changes or modifications derived therefrom remain within the scope of protection of this application.

Claims

1. A 1600°C narrow-band multi-angle emissivity measurement system, characterized in that: The system includes: A laser generator, configured to emit a high-energy laser beam to heat the material being tested to a preset temperature within a high-temperature working zone, wherein the high-temperature working zone is 1000°C to 1600°C; A narrow-band spectrometer, used to measure the emissivity spectral data of the heated material in the near-infrared band; wherein the measurement band range of the narrow-band spectrometer is 0.1 μm-1.1 μm; The laser generator, the material to be measured and the narrow-band spectrometer are arranged in close proximity but not in physical contact.

2. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 1, characterized in that: The system further comprises: The transfer platform is used to be set on the material to be tested or the narrow-band spectrometer to change the relative position angle between the material to be tested and the narrow-band spectrometer; wherein the relative position angle range is 10°-90°.

3. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 2, characterized in that: The transfer platform includes a first moving part or a second moving part; the first moving part contacts the material to be tested to transfer the material to be tested; the second moving part is connected to the narrow-band spectrometer to transfer the narrow-band spectrometer.

4. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 1, characterized in that: The wavelength of the high-energy laser beam emitted by the laser generator is staggered with the measurement wavelength range.

5. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 4, characterized in that: The wavelength of the high-energy laser beam is 1.2 μm.

6. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 1, characterized in that: The system further comprises: a first controller connected to the laser generator and configured to adjust operating parameters of the laser generator; the operating parameters including at least power; The second controller is connected to the narrow-band spectrometer and is used to adjust the measurement parameters of the narrow-band spectrometer.

7. The 1600°C narrow-band multi-angle emissivity measurement system according to claim 6, characterized in that: The first controller is provided with a display screen to display the working parameters and output the current working status; the second controller is provided with a display screen to display the measurement parameters and output the emissivity spectrum data.

8. A 1600°C narrowband multi-angle emissivity measurement method, characterized in that: The method comprises: Prepare the material to be tested, a laser generator and a narrow-band spectrometer; the measurement band range of the narrow-band spectrometer is 0.1 μm-1.1 μm; The material to be tested, the laser generator and the narrow-band spectrometer are arranged in close proximity; Utilizing the laser generator to emit a high-energy laser beam to heat the material to be tested to a preset high temperature, wherein the preset high temperature is any temperature between 1000° C. and 1600° C.; Within a preset time, the narrow-band spectrometer is used to measure the emissivity spectrum data of the heated material in the near-infrared band.

9. The 1600°C narrowband multi-angle emissivity measurement method according to claim 8, characterized in that: The method further comprises: measuring the emissivity spectrum data of the heated material in the near-infrared band by using the narrow-band spectrometer; Adjusting the relative position angle between the narrow-band spectrometer and the material being measured; wherein the relative position angle range is 10°-90°; The emissivity spectrum data of the material under test is measured at different relative position angles within the relative position angle range.

10. The method for measuring 1600°C narrow-band multi-angle emissivity according to claim 8, characterized in that: Prepare the laser generator, including: A laser generator is selected that emits a high-energy laser beam with a wavelength of 1.2 μm.

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