Probe anti-breaking structure for circuit board flying probe test

Abstract

The invention relates to the technical field of circuit board production, in particular to a probe anti-breaking structure for a circuit board flying probe test, which comprises a probe, a connecting line is arranged at the upper end of the probe, and the outer end surface of the probe is recessed inwards to form a plurality of chutes; the straight tube is movably connected with the upper end of the probe; the guide cylinder sleeves the outer side of the probe, and the transverse part of the guide cylinder is in threaded connection with the lower end of the straight cylinder; the mounting piece is connected with the upper end of the straight cylinder; the guide plate is connected with the outer end of the probe and is slidably connected in the straight cylinder; the fourth elastic piece is connected with the upper end of the guide plate, and the other end is connected with the lower end of the mounting piece; and a plurality of guide members which are installed on the inner wall of the guide cylinder at equal intervals and are slidably connected to the outward ends of the plurality of sliding grooves respectively, so that elastic contact between the probe and the test position of the circuit board is realized, the probability of breakage and the like of the probe when the probe is in contact with the test position of the circuit board is effectively reduced, and the test efficiency is improved. The probability of damage of the test position of the circuit board is effectively reduced, and the test effect and quality are effectively ensured.

Description

Technical Field

[0001] This invention relates to a probe anti-breakage structure for flying probe testing of circuit boards, belonging to the field of circuit board manufacturing technology. Background Technology

[0002] Circuit boards (PCBs) play a crucial role in the mass production of fixed circuits and the optimization of electrical layout by miniaturizing and visualizing circuits. To ensure PCB product quality, the industry commonly uses flying probe testing technology for simulated online testing. As the core component of the flying probe testing system, the probe contacts the solder pads on the PCB surface under the action of a driving device, completing the testing process by simulating the actual circuit operation. During the reciprocating motion of testing different solder pads point by point, direct hard collisions can easily occur between the probe and the solder pads, significantly increasing the risk of probe breakage and solder pad damage, thus negatively impacting test results and product quality. Summary of the Invention

[0003] To address the problems in the prior art, this invention provides a probe anti-breakage structure for flying probe testing of circuit boards.

[0004] The technical solution adopted by the present invention to solve its technical problem is:

[0005] A probe breakage prevention structure for flying probe testing of circuit boards includes:

[0006] A probe, wherein a connecting line is provided at the upper end of the probe, and the outer end of the probe is recessed inward to form multiple grooves;

[0007] A straight cylinder is movably connected to the upper end of a probe, the upper end of which extends into the straight cylinder and the connecting line extends out of the upper side of the straight cylinder.

[0008] A guide tube is fitted onto the outside of the probe. The guide tube has a T-shaped cross-section. The transverse part of the guide tube is threaded to the lower end of the straight tube, and the transverse part of the guide tube extends into the straight tube. Multiple grooves are located inside the guide tube.

[0009] The mounting component is connected to the upper end of the straight cylinder, and the connecting line passes through the mounting component;

[0010] A guide plate is connected to the outer end of the probe, and the guide plate is slidably connected inside the straight cylinder;

[0011] The fourth elastic element is connected to the upper end of the guide plate, and the other end of the fourth elastic element is connected to the lower end of the mounting component. The fourth elastic element is located outside the probe and outside the connecting line.

[0012] The guide is provided in multiple parts, which are equidistantly installed on the inner wall of the guide cylinder. The multiple guides are slidably connected to the outer ends of multiple sliding grooves, and the guides extend into the sliding grooves.

[0013] Furthermore, the guide includes a mounting plate disposed on the inner wall of the guide cylinder. Multiple sliders are equidistantly arranged at the inner end of the mounting plate, and the multiple sliders are slidably connected to the outer end of the corresponding slide groove, with the sliders extending into the slide groove. Multiple sets of lubrication components are equidistantly installed at the inner end of the mounting plate, and the lubrication components are alternately arranged with the sliders. The multiple sets of lubrication components are slidably connected to the corresponding slide groove.

[0014] Furthermore, the lubrication assembly includes a mounting cylinder disposed on the inner end of the mounting plate and located outside the probe. A push plate is slidably connected inside the mounting cylinder. A third elastic element is mounted on the outer end of the push plate, and the other end of the third elastic element is connected to the outer wall of the inner side of the mounting cylinder. A graphite column is slidably connected inside the mounting cylinder and is attached to the inner end of the push plate. The graphite column extends out of the inner side of the mounting cylinder and into the corresponding sliding groove, and the graphite column is slidably connected to the sliding groove.

[0015] Furthermore, the mounting component includes a first circular plate, which is mounted on the upper end of the straight cylinder. The lower end of the first circular plate is connected to the other end of the fourth elastic member. A rectangular cylinder is provided on the upper end of the first circular plate, and a second circular plate is mounted on the upper end of the rectangular cylinder. The upper end of the connecting line passes through the first circular plate, the rectangular cylinder, and the second circular plate.

[0016] The lower end of the first circular plate is recessed upward to form four first holes, and the first holes penetrate the first circular plate. All four first holes are located on the outer side of the straight cylinder and the outer side of the rectangular cylinder. The upper end of the second circular plate is recessed downward to form four second holes, and the second holes penetrate the second circular plate. The four second holes are located on the outer side of the rectangular cylinder, and the four second holes are located directly above the four first holes.

[0017] Furthermore, a connecting rod is movably installed inside the rectangular tube, and the connecting rod has a U-shaped cross-section. Movable plates are provided at the left ends of the two lateral portions of the connecting rod, and the two movable plates are located on the front and rear sides of the connecting line. A rubber strip is installed between the two movable plates, and the rubber strip is located on the left side of the connecting rod. The rubber strip is attached to the outer right end of the connecting line.

[0018] Guide rods are installed at the middle of the left end of both movable plates, and the cross-section of the guide rods is T-shaped. The rods of both guide rods pass through the rectangular tube and extend out of the left side of the rectangular tube. The guide rods are slidably connected to the rectangular tube. Two second elastic members are symmetrically arranged at the left end of the rectangular tube. The other end of the two second elastic members is connected to the inward end of the vertical part of the two guide rods, and the two second elastic members are located on the outside of the rod part of the two guide rods.

[0019] Furthermore, the lower end of the middle part of the first circular plate is recessed upward to form a first through hole, and the first through hole penetrates the first circular plate. The cross-section of the first through hole is rectangular, and the first through hole is arranged in communication with the straight cylinder and the rectangular cylinder respectively. The upper end of the connecting line penetrates the first through hole, and two guide wheels are symmetrically installed inside the first through hole, and the two guide wheels are respectively attached to the left and right ends of the connecting line.

[0020] Furthermore, the upper end of the middle part of the second circular plate is recessed downward to form a second through hole, and the second through hole penetrates the second circular plate. The cross-section of the second through hole is rectangular, and the second through hole is located directly above the first through hole. The second through hole and the rectangular cylinder are arranged in communication, and the upper end of the connecting line penetrates the second through hole.

[0021] Two clamping blocks are symmetrically slidably connected inside the second through hole, and the two clamping blocks are arranged opposite each other. The two clamping blocks are respectively attached to the left and right ends of the connecting line. Two round rods are symmetrically installed inside the second through hole, and the two round rods are located on the front and rear sides of the connecting line. The two round rods pass through the two clamping blocks and are slidably connected to the clamping blocks. Two first elastic elements are symmetrically installed on the outer ends of the clamping blocks, and the two first elastic elements are respectively located outside the two round rods. The other ends of the two first elastic elements are connected to the inner wall of the second through hole.

[0022] Furthermore, the inner end faces of both clamping blocks are recessed outward to form arc-shaped grooves, and the arc-shaped grooves are located between the two round rods. Rubber pads are installed on the inner walls of both arc-shaped grooves.

[0023] The beneficial effects of this invention are:

[0024] When the probe contacts the test position on the circuit board, a collision force is generated between the probe and the test position. Under the action of the collision force, the probe retracts and moves upward, causing the guide plate to move upward along the straight cylinder. This compresses the fourth elastic element, which in turn generates an elastic force. This reduces the rigid contact force between the probe and the test position on the circuit board. Under the action of the elastic force of the fourth elastic element, a tight contact is made between the probe and the test position on the circuit board, effectively ensuring normal testing. This elastic contact between the probe and the test position on the circuit board effectively reduces the probability of the probe breaking when in contact with the test position on the circuit board, and effectively reduces the probability of damage to the test position on the circuit board, thus effectively ensuring the test effect and quality. Attached Figure Description

[0025] Other features, objects, and advantages of the invention will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0026] Figure 1 This is a schematic diagram of a probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0027] Figure 2 This is a cross-sectional view of a probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0028] Figure 3 for Figure 2 Enlarged view of section A in the middle;

[0029] Figure 4 This is a perspective view of the guide tube in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0030] Figure 5 This is a three-dimensional view of the probe in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0031] Figure 6 This is a schematic diagram of the first circular plate in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0032] Figure 7 This is a schematic diagram of the second circular plate in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention;

[0033] Figure 8 This is an assembly diagram of the guide rod, connecting rod, rubber band, and moving plate in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention.

[0034] Figure 9 This is a perspective view of the mounting plate in the probe anti-breakage structure for flying probe testing of circuit boards according to the present invention.

[0035] In the picture:

[0036] 1. Straight tube;

[0037] 2. Guide tube;

[0038] 3. Probe; 31. Connecting wire; 32. Guide plate; 33. Slide groove;

[0039] 4. Rectangular tube; 41. First circular plate; 411. First hole; 412. Guide wheel; 413. First through hole; 42. Second circular plate; 421. Second hole; 422. Second through hole; 423. Clamping block; 424. First elastic element; 425. Round rod; 43. Second elastic element; 44. Guide rod; 45. Connecting rod; 46. Rubber belt; 47. Moving plate;

[0040] 5. Mounting plate; 51. Slider; 52. Mounting cylinder; 53. Third elastic element; 54. Push plate; 55. Graphite column.

[0041] 6. Fourth elastic element. Detailed Implementation

[0042] In order to make the technical means, creative features, objectives and effects achieved by the present invention easier to understand, the present invention is further described below in conjunction with specific implementation methods.

[0043] Example 1: As Figures 1-9 As shown, a probe 3 anti-breakage structure for flying probe testing of circuit boards is provided, including: probe 3, a connecting line 31 extending from the upper side of a straight cylinder 1 and penetrating through a first circular plate 41, a rectangular cylinder 4 and a second circular plate 42 is set on the upper end of probe 3, the connecting line 31 connects probe 3 to the main body of the flying probe testing equipment of circuit boards, the straight cylinder 1 is movably mounted on the upper end of probe 3 and the upper end of probe 3 extends into the straight cylinder 1, the straight cylinder 1 provides a mounting carrier for components such as the first circular plate 41, and the transverse part of a guide cylinder 2 with a T-shaped cross section and a transverse part extending into the straight cylinder 1 is threaded to the lower end of the straight cylinder 1, the guide cylinder 2 is fitted on the outside of probe 3, the guide cylinder 2 provides a mounting carrier for mounting plate 5;

[0044] The first circular plate 41 is installed on the upper end of the straight cylinder 1. The first circular plate 41 provides an installation carrier for the rectangular cylinder 4. The rectangular cylinder 4 is set on the upper end of the first circular plate 41. The first circular plate 41 and the second circular plate 42 are connected through the rectangular cylinder 4. The second circular plate 42 is then installed on the upper end of the rectangular cylinder 4. The second circular plate 42 provides a processing carrier for the second hole 421.

[0045] Four first holes 411 are formed in the upper surface of the first circular plate 41, located on the outer side of the straight cylinder 1 and the outer side of the rectangular cylinder 4. Four second holes 421 are formed in the upper surface of the second circular plate 42, located on the outer side of the rectangular cylinder 4. The four second holes 421 are located directly above the four first holes 411. The four first holes 411 and the four second holes 421 are used together for the installation of the probe 3.

[0046] The guide plate 32, which is slidably connected inside the straight cylinder 1, is installed on the outer end of the probe 3. The fourth elastic element 6 is compressed through the guide plate 32. The fourth elastic element 6, whose other end is connected to the lower end of the first circular plate 41 and is located outside the probe 3 and outside the connecting line 31, is installed on the upper end of the guide plate 32. The guide plate 32 is returned to its original position through the fourth elastic element 6. The fourth elastic element 6 can be a spring.

[0047] Multiple grooves 33 are formed inwardly on the outer end of the probe 3 and located inside the guide cylinder 2. The grooves 33 provide space for the slider 51 to move. Multiple mounting plates 5, which are located on the outer side of the multiple grooves 33, are equidistantly mounted on the inner wall of the guide cylinder 2. The mounting plates 5 provide a mounting carrier for the slider 51. Multiple sliders 51, which are slidably connected to the outer end of the corresponding grooves 33 and extend into the grooves 33, are equidistantly mounted on the inner end of the mounting plates 5. The grooves 33 and the sliders 51 work together to guide the movement of the probe 3.

[0048] Multiple mounting cylinders 52 located outside the probe 3 are equidistantly mounted on the inner end of the mounting plate 5, and the mounting cylinders 52 and the slider 51 are arranged alternately. The mounting cylinders 52 provide mounting space for components such as the push plate 54, and the push plate 54 is slidably connected inside the mounting cylinder 52. The graphite column 55 is pushed by the push plate 54. Then, a third elastic member 53, whose other end is connected to the outer wall of the inner side of the mounting cylinder 52, is mounted on the outer end of the push plate 54. The third elastic member 53 applies a pushing force to the push plate 54. The third elastic member 53 can be a spring.

[0049] The graphite column 55, which is attached to the inner end of the push plate 54 and extends into the inner side of the mounting cylinder 52, is slidably connected to the mounting cylinder 52. The graphite column 55, which extends into the corresponding slide groove 33, is slidably connected to the slide groove 33, and the slide groove 33 is lubricated through the graphite column 55.

[0050] Before use, first contact the second circular plate 42 with the mounting carrier of the drive module in the circuit board flying probe tester, then pass the mounting bolt through the mounting carrier, the second hole 421 and the first hole 411 and connect it with the corresponding nut threadedly, thereby connecting the probe 3 and other components with the drive module in the circuit board flying probe tester, and then connect the other end of the connecting wire 31 with the circuit board flying probe tester.

[0051] In use, the drive module in the circuit board flying probe tester is used to drive the straight cylinder 1 and other components to move down, thereby causing the probe 3 to move down and make contact with the test position on the circuit board. Then, the probe 3, the connecting wire 31 and the circuit board flying probe tester are used to complete the test of the test position on the circuit board. The same steps are used to test different test positions on the circuit board, thereby completing the overall test of the circuit board.

[0052] When the lower end of probe 3 contacts the test position on the circuit board, a collision force is generated between the test position on the circuit board and probe 3. Under the action of the collision force, probe 3 retracts and moves upward, thereby causing guide plate 32 to move upward along straight cylinder 1, thereby compressing the fourth elastic element 6. This causes the fourth elastic element 6 to generate elastic force, which can alleviate the hard contact force between probe 3 and the test position on the circuit board. Under the action of the elastic force of the fourth elastic element 6, probe 3 and the test position on the circuit board are in close contact, effectively ensuring normal testing. This achieves elastic contact between probe 3 and the test position on the circuit board, effectively reducing the probability of probe 3 breaking when in contact with the test position on the circuit board, effectively reducing the probability of damage to the test position on the circuit board, and effectively ensuring the test effect and quality.

[0053] During the retraction and upward movement of probe 3, the slider 51 and the groove 33 will move relative to each other, thereby guiding the retraction of probe 3. At the same time, the graphite column 55 will also move relative to the groove 33, so as to lubricate the groove 33 with the graphite column 55. This effectively reduces the probability of probe 3 being worn due to friction caused by the relative movement of slider 51 and groove 33, thus effectively ensuring the test effect and quality.

[0054] Furthermore, the third elastic element 53 is initially in a compressed state. At this time, the third elastic element 53 itself has elastic force. When the graphite column 55 is worn out, under the action of the elastic force of the third elastic element 53, the push plate 54 moves inward along the mounting cylinder 52, thereby pushing the graphite column 55 inward along the mounting cylinder 52. This ensures that the graphite column 55 is always in contact with the inside of the slide groove 33, effectively ensuring the lubrication effect of the slide groove 33. This further effectively reduces the probability of wear of the probe 3 caused by factors such as friction generated by the relative movement of the slider 51 and the slide groove 33, effectively ensuring the test effect and quality.

[0055] When a fault occurs in the threaded position between the mounting bolt and the nut, the shank of the mounting bolt located between the first circular plate 41 and the second circular plate 42 can be cut, thereby allowing direct disassembly of components such as the probe 3. This facilitates the disassembly of components such as the probe 3, effectively reducing the probability of damage to components such as the probe 3 during fault disassembly, thereby reducing usage costs and effectively ensuring the subsequent testing results.

[0056] Example 2: Figure 2 , Figure 6 and Figure 7As shown, a U-shaped connecting rod 45 is movably installed inside a rectangular tube 4. The two movable plates 47 are connected through the connecting rod 45. The two movable plates 47 located on the front and rear sides of the connecting line 31 are respectively placed on the left ends of the two horizontal parts of the connecting rod 45. The two movable plates 47 work together to provide a mounting carrier for components such as the rubber belt 46. The rubber belt 46 located on the left side of the connecting rod 45 and attached to the outer right end of the connecting line 31 is installed between the two movable plates 47. The connecting line 31 is tidied up through the rubber belt 46.

[0057] Two guide rods 44 with T-shaped cross-sections, whose rods pass through the rectangular tube 4 and extend out of the left side of the rectangular tube 4, are respectively installed on the middle of the left end of the two movable plates 47, and the guide rods 44 are slidably connected to the rectangular tube 4. The movable plates 47 are moved by the guide rods 44. Two second elastic members 43 located on the outer side of the rods of the two guide rods 44 are symmetrically arranged on the left end of the rectangular tube 4, and the other end of the two second elastic members 43 is connected to the inward end of the vertical part of the two guide rods 44, respectively. The guide rods 44 are returned to their original position by the second elastic members 43. The second elastic members 43 can be springs.

[0058] A first through hole 413 is formed by recessing the lower end of the middle part of the first circular plate 41, penetrating the first circular plate 41. The first through hole 413 with a rectangular cross-section is arranged to communicate with the straight cylinder 1 and the rectangular cylinder 4 respectively. The first through hole 413 provides installation space for the guide wheel 412. The upper end of the connecting line 31 passes through the first through hole 413, and two guide wheels 412, which are respectively attached to the left and right ends of the connecting line 31, are symmetrically installed inside the first through hole 413. The two guide wheels 412 work together to guide the movement of the connecting line 31.

[0059] A second through hole 422 is formed by recessing the upper part of the middle of the second circular plate 42 downwards. The second through hole 422, which has a rectangular cross-section and is located directly above the first through hole 413, is connected to the rectangular cylinder 4. The second through hole 422 provides installation space for components such as clamping blocks 423. The upper end of the connecting line 31 passes through the second through hole 422, and two clamping blocks 423, which are respectively attached to the left and right ends of the connecting line 31, are symmetrically slidably connected in the second through hole 422. The two clamping blocks 423 are arranged opposite to each other and are used together to clamp the connecting line 31.

[0060] Two round rods 425 located on the front and rear sides of the connecting line 31 are symmetrically installed inside the second through hole 422. The round rods 425 passing through the two clamping blocks 423 are slidably connected to the clamping blocks 423. The two round rods 425 work together to guide the movement of the clamping blocks 423. Two first elastic members 424 located on the outer sides of the two round rods 425 are symmetrically installed on the outer ends of the clamping blocks 423. The other ends of the two first elastic members 424 are connected to the inner wall of the second through hole 422. The first elastic members 424 apply an inward pushing force to the clamping blocks 423. The first elastic members 424 can be springs. The inner end faces of the two clamping blocks 423 are recessed outward to form arc-shaped grooves. The arc-shaped grooves are located between the two round rods 425. The two arc-shaped grooves work together to limit and clamp the connecting line. Two rubber pads are installed on the inner walls of the two arc-shaped grooves respectively. The two rubber pads work together to protect the connecting line.

[0061] Before use, press the guide rod 44 to compress the second elastic element 43, so that the second elastic element 43 generates elastic force. At the same time, with the assistance of the connecting rod 45, move the two moving plates 47 and the rubber belt 46 outward. First, pass the connecting line 31 through the straight cylinder 1, the first through hole 413, the rectangular cylinder 4, the second through hole 422 and the two guide rods 44. Then, insert the probe 3 and the guide plate 32 into the straight cylinder 1 and make the guide plate 32 contact the fourth elastic element 6. At the same time, install the guide cylinder 2 on the lower end of the straight cylinder 1.

[0062] Then, the first circular plate 41 and the second circular plate 42 are fastened to the mounting carrier of the drive module in the circuit board flying probe tester using mounting bolts and nuts, thereby connecting the probe 3 and other components to the drive module in the circuit board flying probe tester. Then, the connecting line 31 is straightened, and the other end of the connecting line 31 is connected to the circuit board flying probe tester. At this time, the first elastic element 424 is used to push the two clamping blocks 423 inward, thereby clamping the connecting line 31. Then, the guide rod 44 is released, and under the elastic force of the second elastic element 43, the guide rod 44, the moving plate 47 and the rubber belt 46 move inward, thereby making the rubber belt 46 contact the connecting line 31 and apply tension.

[0063] In use, the drive module in the circuit board flying probe tester is used to drive the straight cylinder 1 and other components to move down, thereby causing the probe 3 to move down and make contact with the test position on the circuit board. Then, the probe 3, the connecting wire 31 and the circuit board flying probe tester are used to complete the test of the test position on the circuit board. The same steps are used to test different test positions on the circuit board, thereby completing the overall test of the circuit board.

[0064] When the lower end of probe 3 contacts the test position on the circuit board, the fourth elastic element 6 is used to relieve the hard contact force between probe 3 and the test position on the circuit board, and the slider 51 and the groove 33 are used to guide the retraction movement of probe 3. At the same time, under the action of tension, the connecting line 31 located in the rectangular tube 4 is pulled and gathered. Because the two clamping blocks 423 clamp the upper part of the connecting line 31, the lower part of the connecting line 31 is pulled upward under the auxiliary guidance of the two guide wheels 412.

[0065] When the probe 3 separates from the test position on the circuit board, the fourth elastic element 6 causes the probe 3 and other components to return to their original positions and pulls the lower part of the connecting line 31 downwards. At the same time, the rubber band 46 moves outwards, causing the moving plate 47 and other components to return to their installation positions. Then, the rubber band 46 applies tension to the connecting line 31 again, so that the connecting line 31 is orderly arranged when the probe 3 retracts. This effectively reduces the probability of the connecting line 31 getting tangled or worn when the probe 3 moves up and down, and effectively ensures the test effect and quality.

[0066] Although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A probe anti-breakage structure for flying probe testing of circuit boards, characterized in that, include: The probe (3) has a connecting line (31) at its upper end and a plurality of grooves (33) formed by the inward recess of its outer end face. A straight cylinder (1) is movably connected to the upper end of a probe (3), the upper end of the probe (3) extends into the straight cylinder (1), and the connecting line (31) extends out from the upper side of the straight cylinder (1); The guide tube (2) is fitted on the outside of the probe (3). The cross-section of the guide tube (2) is T-shaped. The transverse part of the guide tube (2) is threaded to the lower end of the straight tube (1), and the transverse part of the guide tube (2) extends into the straight tube (1). The multiple grooves (33) are all located inside the guide tube (2). The mounting component is connected to the upper end of the straight cylinder (1), and the connecting line (31) passes through the mounting component; A guide plate (32) is connected to the outer end of the probe (3), and the guide plate (32) is slidably connected inside the straight cylinder (1); The fourth elastic element (6) is connected to the upper end of the guide plate (32), and the other end of the fourth elastic element (6) is connected to the lower end of the mounting component. The fourth elastic element (6) is located outside the probe (3) and outside the connecting line (31). The guide is provided in multiple ways. The multiple guides are equidistantly installed on the inner wall of the guide cylinder (2). The multiple guides are slidably connected to the outer ends of multiple slide grooves (33), and the guides extend into the slide grooves (33).

2. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 1, characterized in that: The guide includes a mounting plate (5), which is disposed on the inner wall of the guide cylinder (2). Multiple sliders (51) are equidistantly arranged on the inner end of the mounting plate (5). The multiple sliders (51) are slidably connected to the outer end of the corresponding slide groove (33), and the sliders (51) extend into the slide groove (33). Multiple sets of lubrication components are equidistantly installed on the inner end of the mounting plate (5), and the lubrication components and sliders (51) are arranged alternately. The multiple sets of lubrication components are slidably connected to the corresponding slide groove (33).

3. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 2, characterized in that: The lubrication assembly includes a mounting cylinder (52), which is disposed on the inner end of the mounting plate (5) and located outside the probe (3). A push plate (54) is slidably connected inside the mounting cylinder (52). A third elastic element (53) is installed on the outer end of the push plate (54), and the other end of the third elastic element (53) is connected to the outer wall inside the mounting cylinder (52). A graphite column (55) is slidably connected inside the mounting cylinder (52), and the graphite column (55) is attached to the inner end of the push plate (54). The graphite column (55) extends out of the inner side of the mounting cylinder (52) and extends into the corresponding sliding groove (33), and the graphite column (55) is slidably connected to the sliding groove (33).

4. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 1, characterized in that: The mounting component includes a first circular plate (41), which is mounted on the upper end of the straight cylinder (1). The lower end of the first circular plate (41) is connected to the other end of the fourth elastic member (6). A rectangular cylinder (4) is provided on the upper end of the first circular plate (41). A second circular plate (42) is mounted on the upper end of the rectangular cylinder (4). The upper end of the connecting line (31) passes through the first circular plate (41), the rectangular cylinder (4), and the second circular plate (42). The lower end of the first circular plate (41) is recessed upward to form four first holes (411), and the first holes (411) penetrate the first circular plate (41). The four first holes (411) are all located outside the straight cylinder (1) and outside the rectangular cylinder (4). The upper end of the second circular plate (42) is recessed downward to form four second holes (421), and the second holes (421) penetrate the second circular plate (42). The four second holes (421) are located outside the rectangular cylinder (4), and the four second holes (421) are located directly above the four first holes (411).

5. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 4, characterized in that: The connecting rod (45) is movably installed inside the rectangular tube (4), and the cross-section of the connecting rod (45) is U-shaped. The left ends of the two horizontal parts of the connecting rod (45) are provided with movable plates (47), and the two movable plates (47) are located on the front and rear sides of the connecting line (31). A rubber strip (46) is installed between the two movable plates (47), and the rubber strip (46) is located on the left side of the connecting rod (45). The rubber strip (46) is attached to the outer right end of the connecting line (31). Guide rods (44) are installed at the middle of the left end of both movable plates (47), and the cross-section of the guide rods (44) is T-shaped. The rods of both guide rods (44) pass through the rectangular tube (4) and extend out of the left side of the rectangular tube (4). The guide rods (44) are slidably connected to the rectangular tube (4). Two second elastic members (43) are symmetrically arranged at the left end of the rectangular tube (4). The other ends of the two second elastic members (43) are respectively connected to the inward end of the vertical part of the two guide rods (44), and the two second elastic members (43) are respectively located outside the rod part of the two guide rods (44).

6. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 4, characterized in that: The lower end of the middle part of the first circular plate (41) is recessed to form a first through hole (413), and the first through hole (413) penetrates the first circular plate (41). The cross-section of the first through hole (413) is rectangular, and the first through hole (413) is connected to the straight cylinder (1) and the rectangular cylinder (4) respectively. The upper end of the connecting line (31) penetrates the first through hole (413). Two guide wheels (412) are symmetrically installed inside the first through hole (413), and the two guide wheels (412) are respectively attached to the left and right ends of the connecting line (31).

7. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 6, characterized in that: The upper part of the middle of the second circular plate (42) is recessed downward to form a second through hole (422), and the second through hole (422) penetrates the second circular plate (42). The cross-section of the second through hole (422) is rectangular, and the second through hole (422) is located directly above the first through hole (413). The second through hole (422) is connected to the rectangular tube (4). The upper end of the connecting line (31) penetrates the second through hole (422). Two clamping blocks (423) are symmetrically slidably connected inside the second through hole (422), and the two clamping blocks (423) are arranged opposite to each other. The two clamping blocks (423) are respectively attached to the left and right ends of the connecting line (31). Two round rods (425) are symmetrically installed inside the second through hole (422), and the two round rods (425) are located on the front and rear sides of the connecting line (31). The two round rods (425) pass through the two clamping blocks (423), and the round rods (425) are slidably connected to the clamping blocks (423). Two first elastic elements (424) are symmetrically installed on the outer end of the clamping blocks (423), and the two first elastic elements (424) are respectively located outside the two round rods (425). The other end of the two first elastic elements (424) is connected to the inner wall of the second through hole (422).

8. The probe anti-breakage structure for flying probe testing of circuit boards according to claim 7, characterized in that: The inner end faces of the two clamping blocks (423) are recessed outward to form arc-shaped grooves, and the arc-shaped grooves are located between the two round rods (425). Rubber pads are installed on the inner walls of the two arc-shaped grooves.

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