High-vacuum low-temperature test cabin

Abstract

The invention belongs to the technical field of testing equipment, and particularly relates to a high-vacuum low-temperature testing cabin which can meet the requirement for simultaneous and independent testing of a plurality of different samples through a testing mechanism which is independently arranged and can flexibly adjust the position, improve the testing efficiency and meet the debugging requirements of more testing environments. Compared with a conventional single space, the flexibility is higher; the independent double-sided space of the test chamber can further realize large-temperature-difference hedging test or conventional low-temperature test or high-temperature test according to test environment requirements, additional transfer space is not needed, hedging detection of multiple environment temperatures can be carried out at the same time, and detection conditions are more diversified.

Description

Technical Field

[0001] This invention belongs to the field of testing equipment technology, specifically relating to a high-vacuum cryogenic testing chamber. Background Technology

[0002] In order to obtain the parameters of material usage status and property changes under special environments, the research and development of special materials often involves simulating special environments to test the materials, such as simulating high temperature, low temperature or acidic environments, in order to obtain the material's usage status in special environments.

[0003] Currently, most conventional testing equipment can only meet the requirements of a single high-temperature or low-temperature environment, or can only achieve high-low temperature switching for impact testing. Such equipment has a single testing environment, and when testing a large batch of materials or materials with different testing environment requirements, it cannot be tested simultaneously, making it difficult to meet requirements such as different temperatures, testing times, or environmental variables. On the other hand, setting up multiple independent spaces means that impact testing cannot be carried out, which in turn makes it inconvenient to adjust the testing environment variables and results in a low level of environmental variable conditions that can be met. Summary of the Invention

[0004] The purpose of this invention is to provide a high-vacuum cryogenic test chamber to solve the problems mentioned in the background art.

[0005] To achieve the above-mentioned technical objectives, the technical solution adopted by the present invention is as follows:

[0006] A high-vacuum low-temperature test chamber includes a body, a refrigeration mechanism and a temperature-changing mechanism are respectively embedded on the upper and lower sides of the body, a vacuum pumping mechanism is also embedded in the body, and a test chamber is located in the middle of the body, where a test mechanism is provided.

[0007] The main carrier platform is the overall frame carrier of the testing mechanism. The main carrier platform is rotatably located in the middle of the testing chamber and is connected to the transmission device embedded in the carrier body.

[0008] The test chamber is the test space of the test mechanism and there are several test chambers. The test chambers are evenly distributed and connected to the main carrier plate axis. The test chamber is composed of a heat insulation board and a sample plate. Each test chamber has at least one sample plate and two heat insulation boards and is distributed in a fan-shaped interval. The sample plate is placed between the two heat insulation boards.

[0009] The sealing ring is a sealing device used in the testing mechanism to form an overall seal. The sealing ring is connected to the main carrier plate and divides several test chambers into independent spaces. The sealing ring has side doors corresponding to the positions of several sample plates.

[0010] The upper and lower ends of the main carrier plate are provided with several air ring grooves, which connect the cooling mechanism, the temperature changing mechanism, the vacuuming mechanism and several test chambers.

[0011] The main carrier plate consists of end plates, a central shaft, and an inner ring. There are two end plates, which are concentrically distributed and rotatably mounted at the upper and lower ends of the test chamber. The central shaft and the inner ring are both concentrically fixed between the two end plates. The diameter of the inner ring is larger than that of the central shaft. The heat insulation plate and the sample plate are both fixedly connected to the inner ring and their upper and lower ends are respectively connected to the two end plates. The sealing ring is located between the two end plates.

[0012] The sample carrier has an inner cavity with an opening facing the side door. The left and right end faces of the sample carrier have several test windows that communicate with the inner cavity, spaced apart from top to bottom. The inner cavity is provided with a support platform that matches the position of the test windows, and the sample carrier is provided with a sealing component that matches the test windows.

[0013] The sealing assembly includes an inner frame and a locking element. The inner frame is slidably sealed to the test window and extends into the inner cavity. The locking element is located between the inner frame and the sample plate.

[0014] The locking component consists of an outer frame, a crossbar, and a screw. The outer frame is connected to the sample plate and corresponds to the center of the test window. The crossbar is located in the center of the outer frame. The screw is threadedly connected to the outer frame and rotatably connected to the crossbar.

[0015] The number of gas ring grooves is at least three, and their diameters gradually decrease. The three gas ring grooves, from the outside to the inside, are a vacuuming ring groove, a cooling ring groove, and a temperature-changing ring groove, respectively. The vacuuming ring groove is connected to the gas path of the vacuuming mechanism, the cooling ring groove is connected to the gas path of the cooling mechanism, and the temperature-changing ring groove is connected to the gas path of the temperature-changing mechanism. The gas ring groove on the upper end plate is the input ring groove, and the gas ring groove on the lower end plate is the output ring groove.

[0016] The spaces on the left and right sides of a single sample plate are a low-temperature space and a variable-temperature space, respectively. Both the low-temperature space and the variable-temperature space are connected to the gas path of the suction ring groove through an electrically controlled valve. The refrigeration ring groove is only connected to the low-temperature space through an electrically controlled valve, and the variable-temperature space is only connected to the variable-temperature ring groove through an electrically controlled valve.

[0017] This application has at least the following advantages compared to the prior art:

[0018] This application utilizes an independently designed and flexibly adjustable testing mechanism to simultaneously and independently test several different samples, improving testing efficiency and meeting the debugging needs of more testing environments. Compared to a conventional single-space setup, it offers greater flexibility. The independent double-sided space of the testing chamber further enables large temperature difference offset testing, conventional low-temperature testing, or high-temperature testing, depending on the testing environment requirements, without the need for additional relocation space. It also allows for simultaneous offset testing at multiple ambient temperatures, resulting in more diverse testing conditions. Attached Figure Description

[0019] The present invention can be further illustrated by the non-limiting embodiments given in the accompanying drawings.

[0020] Figure 1 This is a schematic diagram of the overall structure of the present invention.

[0021] Figure 2 This is a schematic diagram of the structure of the present invention with the door removed.

[0022] Figure 3 This is a schematic diagram of the structure of the present invention, which removes the door and sealing ring.

[0023] Figure 4 This is a schematic diagram of the testing mechanism of the present invention.

[0024] Figure 5 This is a cross-sectional view of the planar centerline structure of the present invention.

[0025] Figure 6 This is a cross-sectional view of the vertical centerline structure of the present invention.

[0026] Figure 7 This is a schematic diagram of the main carrier platform and test chamber of the present invention.

[0027] 1. Body, 11. Test chamber, 2. Insulation plate, 21. Sample plate, 3. Sealing ring, 31. Side door, 4. End plate, 41. Central shaft, 42. Inner ring, 5. Inner cavity, 51. Test window, 52. Support platform, 6. Inner frame, 61. Outer frame, 62. Horizontal frame, 63. Screw, 7. Vacuum ring groove, 71. Cooling ring groove, 72. Variable temperature ring groove, 8. Low temperature space, 81. Variable temperature space, 82. Electrically controlled valve. Detailed Implementation

[0028] To enable those skilled in the art to better understand the present invention, the technical solution of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.

[0029] like Figure 1-7 As shown, a high vacuum low temperature test chamber includes a body 1, a refrigeration mechanism and a temperature-changing mechanism are respectively embedded on the upper and lower sides of the body 1, a vacuum pumping mechanism is also embedded inside the body 1, and a test chamber 11 is located in the middle of the body 1, and a test mechanism is provided inside the test chamber 11.

[0030] The main carrier platform is the overall frame carrier of the testing mechanism. The main carrier platform is rotatably located in the middle of the testing chamber 11 and is connected to the transmission device embedded in the carrier body 1.

[0031] Test chambers are the test spaces of the testing mechanism and there are several test chambers. The test chambers are evenly distributed around the axis of the main carrier plate and connected to it. The test chambers are composed of insulation plates 2 and sample plates 21. Each test chamber has at least one sample plate 21 and two insulation plates 2, which are distributed in a fan-shaped interval. The sample plate 21 is placed between the two insulation plates 2.

[0032] The sealing ring 3 is a sealing device used to form an overall seal in the testing mechanism. The sealing ring 3 is connected to the main carrier plate and divides several test chambers into independent spaces. The sealing ring 3 has side doors 31 corresponding to the positions of several carrier plates 21.

[0033] The upper and lower ends of the main carrier plate are provided with several air ring grooves, which connect the cooling mechanism, temperature control mechanism, vacuum pumping mechanism and several test chambers.

[0034] In this application, the main test samples are plate-shaped materials, such as rubber and sheets. Before testing, depending on the type of sample and the needs of the test, samples of the same type can be placed in one test chamber for testing, or different types of materials can be placed in the same test chamber for testing. The environmental variables of the test can be flexibly distributed and arranged according to actual needs.

[0035] The main carrier plate is driven by a transmission device such as a motor built into the main body 1, which allows the main carrier plate to rotate within the test chamber 11 to accommodate the orientation of the test chambers at different positions, facilitating the loading and unloading of test samples. After all test samples are placed on the sample carrier plate 21, environmental treatment is performed according to whether the test chamber has a sample or not. For ease of operation, a corresponding industrial computer or control panel can be installed on the main body 1 for centralized control. The control systems, methods, circuits, or means are all well-known to those skilled in the art, so they will not be described in detail here. Of course, cooling mechanisms, temperature changing mechanisms, and vacuuming mechanisms are also common environmental change devices in the testing environment of this art. For example, cooling can be achieved using common compressor cooling, temperature changing can be achieved using resistance heating, and vacuuming can be achieved by directly using a vacuum pump. In this application, no specific restrictions are placed on the means of environmental change.

[0036] Specifically, the sealing ring 3 divides several test chambers into independent test spaces. Each test chamber is distributed by the insulation plate 2, and adjacent test chambers share the same adjacent insulation plate 2. In this way, several independent test spaces are formed on the inner ring 42 side of the sealing ring 3. When the test environment of the corresponding test chamber needs to be changed, the vacuuming mechanism first performs vacuuming treatment on the test chamber containing the sample through the corresponding air ring groove. Then, the cooling mechanism and the temperature changing mechanism introduce the cooled or temperature-changing medium into the test chamber. The medium can be air or liquid.

[0037] It is worth noting that since the test environment of this application can be a vacuum environment or a non-vacuum environment, when the test environment is a vacuum environment, a heat exchanger (not shown in the schematic diagram of this application) needs to be added to the test chamber. The heat exchanger referred to in this application refers to a hollow copper busbar or copper tube or other device with good heat exchange effect. The heat exchanger is connected to the gas ring groove. Passing the heat exchange medium into the heat exchanger can change the temperature of the environment in the test chamber in a vacuum environment without affecting the vacuum environment. When the test environment is a non-vacuum environment, it is not necessary to install a heat exchanger and the heat exchange medium can be directly input into the test chamber. Of course, the heat exchange medium directly input into the test chamber is limited to gas. Therefore, in the specific test environment, the heat exchange medium and the heat exchange method in the vacuum environment can be selected according to the actual needs. In fact, for the convenience of operation and testing, this application recommends using a heat exchanger for heat exchange of the medium and control of the test environment.

[0038] After the sample test in a single test chamber is completed, if it is necessary to inspect the sample, the side door 31 of the corresponding test chamber can be opened to take out the sample from the single test chamber. Compared with the conventional testing of multiple samples in the same space, this can avoid affecting the continued testing of other samples that need to be tested, reduce testing errors, and facilitate more convenient environmental control of samples in different test chambers. At the same time, the same test chamber includes two test spaces, that is, a single sample can be tested simultaneously on the front and back of the sample carrier plate 21 with a large temperature difference combination test of low temperature + room temperature and low temperature + high temperature, thereby realizing the testing needs of some special application environments.

[0039] The main carrier plate consists of end plates 4, a central shaft 41, and an inner ring 42. There are two end plates 4, which are concentrically distributed and rotatably mounted at the upper and lower ends of the test chamber 11. The central shaft 41 and the inner ring 42 are both concentrically fixed between the two end plates 4. The diameter of the inner ring 42 is larger than that of the central shaft 41. The heat insulation plate 2 and the sample plate 21 are both fixedly connected to the inner ring 42 and their upper and lower ends are respectively connected to the two end plates 4. The sealing ring 3 is located between the two end plates 4.

[0040] The end plate 4, together with the central shaft 41, can allow the upper and lower end plates 4 to rotate simultaneously. The central shaft 41 and the inner ring 42 are connected by a bracket, which can improve the support stability and torsional resistance of the inner ring 42.

[0041] The sample plate 21 has an inner cavity 5 with an opening facing the side door 31. The left and right end faces of the sample plate 21 are spaced apart from top to bottom with a number of test windows 51 communicating with the inner cavity 5. The inner cavity 5 is provided with a support platform 52 that matches the position of the test windows 51. The sample plate 21 is provided with a sealing component that matches the test windows 51.

[0042] The sealing assembly includes an inner frame 6 and a locking element. The inner frame 6 is slidably sealed to the test window 51 and extends into the inner cavity 5. The locking element is located between the inner frame 6 and the sample plate 21.

[0043] When placing the sample, the inner cavity 5 of the corresponding sample carrier plate 21 is exposed by opening the corresponding side door 31. Then, the sample to be tested is placed into the inner cavity 5 of the sample carrier plate 21. The support platform 52 and the bottom wall of the inner cavity 5 can be used to support the sample. After placement, the inner frame 6 can be driven by the locking device so that the inner frame 6 abuts and clamps the sample plate. The abutting end of the inner frame 6 can be equipped with a sealing ring 3 to improve the sealing effect after clamping. In this way, the inner frames 6 on both sides of the sample carrier plate 21 cooperate with each other to form a stable clamping and sealing state for the sample. The exposed part of the sample in the test window 51 corresponds to two test environments respectively, achieving the effect of diverse testing.

[0044] It is worth noting that, in order to avoid temperature conflicts between the two environments caused by the test window 51, if the number of samples in a single test chamber is less than the number of test windows 51, other heat-insulating plates should be used for sealing. Of course, only one test window 51 can be set to achieve a one-to-one correspondence. In this application, the number of test windows 51 is not specifically limited.

[0045] The locking component consists of an outer frame 61, a crossbar 62, and a screw 63. The outer frame 61 is connected to the sample plate 21 and corresponds to the middle of the test window 51. The crossbar 62 is located in the middle of the outer frame 61. The screw 63 is threadedly connected to the outer frame 61 and rotatably connected to the crossbar 62.

[0046] When clamping, fixing, and sealing the sample plate, the screw 63 is rotated, causing it to extend and retract on the outer frame 61 according to the direction of rotation. This causes the crossbar 62 connecting the screw 63 and the inner frame 6 to move the inner frame 6 within the test window 51. This allows for convenient and quick clamping, fixing, and sealing of the sample. Alternatively, other control devices such as electrically controlled telescopic rods, hydraulic cylinders, or pneumatic cylinders can be used to control the movement of the inner frame 6.

[0047] The number of gas ring grooves is at least three, and their diameters gradually decrease. The three gas ring grooves are, from the outside to the inside, a vacuuming ring groove 7, a cooling ring groove 71, and a temperature-changing ring groove 72. The vacuuming ring groove 7 is connected to the gas path of the vacuuming mechanism, the cooling ring groove 71 is connected to the gas path of the cooling mechanism, and the temperature-changing ring groove 72 is connected to the gas path of the temperature-changing mechanism. The gas ring groove on the upper end plate 4 is the input ring groove, and the gas ring groove on the lower end plate 4 is the output ring groove.

[0048] The spaces on the left and right sides of a single sample plate 21 are a low-temperature space 8 and a variable-temperature space 81, respectively. Both the low-temperature space 8 and the variable-temperature space 81 are connected to the gas path of the suction ring groove 7 through an electric control valve 82. The refrigeration ring groove 71 is only connected to the low-temperature space 8 through an electric control valve 82, and the variable-temperature space 81 is only connected to the variable-temperature ring groove 72 through an electric control valve 82.

[0049] In this application, the air ring groove uses an electrically controlled valve 82 connected to the corresponding test chamber to open and close the air path. Since the electrically controlled valve 82 moves synchronously with the entire test mechanism, it corresponds one-to-one with the test chamber. In terms of wiring, a conductive slip ring can be used to connect the circuit and meet the rotation requirements of the device.

[0050] When conducting tests such as large temperature difference offset tests, the first step is to use the external vacuum pumping mechanism to simultaneously evacuate the air from the two spaces in the corresponding test chamber in the air ring groove 7 until the vacuum state required for the test is reached. Then, the cooling ring groove 71 in the left space introduces the cooling medium into the heat exchanger in the low temperature space 8 through the electronically controlled valve 82, thereby cooling the low temperature space 8. The corresponding temperature-changing ring groove 72 also introduces the heat exchange medium into the heat exchanger in the temperature-changing space 81 through the corresponding electronically controlled valve 82, thereby heating the temperature-changing space 81. In this way, large temperature difference offset tests can be achieved in the same test chamber.

[0051] Of course, for some ambient and low temperature tests, the variable temperature space 81 does not need to be filled with heat exchange medium, so as to meet the needs of different test environments;

[0052] It is worth noting that the air ring grooves on the two end plates 4 are respectively the input ring groove and the output ring groove. That is, the output ring groove is for outputting the heat exchange medium, and the input ring groove is for inputting the heat exchange medium, thus forming a circulation path with the heat exchanger. Furthermore, since the air ring grooves on the end plates are loops, the input and output ports of the refrigeration mechanism, the temperature control mechanism, and the vacuum mechanism can all be coordinated with the rotation of the main carrier plate. That is, the air ring grooves on the end plates are actually in a rotational coordination with the machine body, and the input and output ports on the machine body can always correspond to the corresponding air ring grooves, thereby achieving the effect of circulation and transportation. Moreover, since the heat exchange medium input to each test chamber is in an independent state, the environmental control of different test chambers can be achieved simply by controlling the on / off state of the passage through an electric control valve. Therefore, it can better meet the needs of diverse testing environments and avoid the inconvenience caused by different testing environments for different samples.

[0053] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the invention. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in the present invention should still be covered by the claims of the present invention.

Claims

1. A high-vacuum low-temperature test chamber, comprising a body, wherein a cooling mechanism and a temperature-changing mechanism are respectively embedded on the upper and lower sides of the body, and a vacuum pumping mechanism is also embedded inside the body, characterized in that: The middle part of the body is a test chamber, and a test mechanism is installed inside the test chamber; The main carrier platform is the overall frame carrier of the testing mechanism. The main carrier platform is rotatably located in the middle of the testing chamber and is connected to the transmission device embedded in the carrier body. The test chamber is the test space of the test mechanism and there are several test chambers. The test chambers are evenly distributed and connected to the main carrier plate axis. The test chamber is composed of a heat insulation board and a sample plate. Each test chamber has at least one sample plate and two heat insulation boards and is distributed in a fan-shaped interval. The sample plate is placed between the two heat insulation boards. The sealing ring is a sealing device used in the testing mechanism to form an overall seal. The sealing ring is connected to the main carrier plate and divides several test chambers into independent spaces. The sealing ring has side doors corresponding to the positions of several sample plates. The upper and lower ends of the main carrier plate are provided with several air ring grooves, which connect the cooling mechanism, the temperature changing mechanism, the vacuuming mechanism and several test chambers.

2. The high-vacuum cryogenic test chamber according to claim 1, characterized in that: The main carrier plate consists of end plates, a central shaft, and an inner ring. There are two end plates, which are concentrically distributed and rotatably mounted at the upper and lower ends of the test chamber. The central shaft and the inner ring are both concentrically fixed between the two end plates. The diameter of the inner ring is larger than that of the central shaft. The heat insulation plate and the sample plate are both fixedly connected to the inner ring and their upper and lower ends are respectively connected to the two end plates. The sealing ring is located between the two end plates.

3. The high-vacuum cryogenic test chamber according to claim 1, characterized in that: The sample carrier has an inner cavity with an opening facing the side door. The left and right end faces of the sample carrier have several test windows that communicate with the inner cavity, spaced apart from top to bottom. The inner cavity is provided with a support platform that matches the position of the test windows, and the sample carrier is provided with a sealing component that matches the test windows.

4. The high-vacuum cryogenic test chamber according to claim 3, characterized in that: The sealing assembly includes an inner frame and a locking element. The inner frame is slidably sealed to the test window and extends into the inner cavity. The locking element is located between the inner frame and the sample plate.

5. A high-vacuum cryogenic test chamber according to claim 4, characterized in that: The locking component consists of an outer frame, a crossbar, and a screw. The outer frame is connected to the sample plate and corresponds to the center of the test window. The crossbar is located in the center of the outer frame. The screw is threadedly connected to the outer frame and rotatably connected to the crossbar.

6. The high-vacuum cryogenic test chamber according to claim 1, characterized in that: The number of gas ring grooves is at least three, and their diameters gradually decrease. The three gas ring grooves, from the outside to the inside, are a vacuuming ring groove, a cooling ring groove, and a temperature-changing ring groove, respectively. The vacuuming ring groove is connected to the gas path of the vacuuming mechanism, the cooling ring groove is connected to the gas path of the cooling mechanism, and the temperature-changing ring groove is connected to the gas path of the temperature-changing mechanism. The gas ring groove on the upper end plate is the input ring groove, and the gas ring groove on the lower end plate is the output ring groove.

7. A high-vacuum cryogenic test chamber according to claim 6, characterized in that: The spaces on the left and right sides of a single sample plate are a low-temperature space and a variable-temperature space, respectively. Both the low-temperature space and the variable-temperature space are connected to the gas path of the suction ring groove through an electrically controlled valve. The refrigeration ring groove is only connected to the low-temperature space through an electrically controlled valve, and the variable-temperature space is only connected to the variable-temperature ring groove through an electrically controlled valve.

Images