A method, device and equipment for reducing truncation error in spherical near-field antenna measurement
Patent Information
- Application Number
- CN202511286406.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-10
- Publication Date
- 2026-09-11
- Estimated Expiration
- 2045-09-10
AI Technical Summary
然而,这种方法会引入截断误差,导致重建的远场方向图出现纹波、主瓣畸变等问题,严重影响其精度
[0041]本说明书提供的球面近场天线测量截断误差缩减方法,获取被测天线被截断的球面近场测量数据。针对被截断的球面近场测量数据,在俯仰角方向上执行快速傅里叶变换,得到第一频域数据。对第一频域数据进行滤波处理,得到第二频域数据。对第二频域数据,执行逆快速傅里叶变换,得到近场重建数据,采用近场重建数据替换所述被截断的球面近场测量数据。
Smart Images

Figure CN121164734B_ABST
Abstract
Description
Technical Field
[0001] This specification relates to the field of antenna testing technology, and in particular to a method, apparatus and equipment for reducing the truncation error in the measurement of a spherical near-field antenna. Background Technology
[0002] With the rapid development of communication technology, the demand for high-performance antennas is increasing, which also places higher demands on antenna measurement technology. However, due to the influence of measurement distance and electromagnetic environment, far-field measurement technology cannot meet the measurement requirements of complex structures and large-scale antennas. Therefore, near-field measurement technology, especially the most accurate spherical near-field measurement technology, has attracted widespread attention from researchers.
[0003] In spherical near-field measurements, the antenna under test is typically mounted on a precision azimuth-elevation dual-axis turntable to achieve the rotational motion required for spherical scanning. However, the turntable itself and its supporting structures (such as columns and brackets) occupy space and obstruct the probe's effective measurement of the antenna at certain angles. Furthermore, the turntable has physical rotation angle limits: while the azimuth turntable can achieve 360° continuous rotation, the range of motion of the elevation turntable is typically much less than 180° (e.g., ±90° or ±110°). This results in the probe being unable to obtain effective sampling in the near-field region of the spherical surface by rotating the antenna.
[0004] Therefore, due to the limitations of the aforementioned measurement techniques, near-field sampling often cannot cover the entire sphere. When reconstructing the far-field radiation pattern of an antenna using incomplete near-field sampling data, zero-padding is typically applied to the truncated sampling region. However, this method introduces truncation errors, leading to problems such as ripple and main lobe distortion in the reconstructed far-field radiation pattern, severely affecting its accuracy.
[0005] Therefore, this specification provides a method, apparatus, and equipment for reducing the measurement truncation error of a spherical near-field antenna. Summary of the Invention
[0006] This specification provides a method, apparatus, and device for reducing the measurement truncation error of a spherical near-field antenna, in order to partially solve the aforementioned problems existing in the prior art.
[0007] The following technical solution is adopted in this specification:
[0008] This specification provides a method for reducing the truncation error in spherical near-field antenna measurements, including:
[0009] S1. Acquire near-field measurement data of the truncated spherical surface of the antenna under test;
[0010] S2. Perform a fast Fourier transform on the pitch angle direction for the truncated spherical near-field measurement data to obtain the first frequency domain data;
[0011] S3. Filter the first frequency domain data to obtain the second frequency domain data;
[0012] S4. Perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and replace the truncated spherical near-field measurement data with the near-field reconstruction data.
[0013] Based on the aforementioned technical methods, by performing frequency domain transformation (Fast Fourier Transform), filtering, and inverse transformation (Inverse Fast Fourier Transform) on the truncated spherical near-field measurement data, the truncated data portion can be effectively reconstructed. This allows for a more accurate reflection of the true far-field radiation characteristics of the antenna's untruncated region after near-field to far-field transformation. This method can compensate for data loss caused by limited measurement range. A key objective of spherical near-field measurement is to predict far-field radiation patterns using near-field data. This method, by optimizing the quality of near-field data, improves the accuracy of the radiation pattern obtained during the near-field to far-field conversion, making the prediction results closer to reality. Furthermore, this method is applicable to different types of antennas and their various operating frequency ranges, as long as the corresponding truncated spherical near-field measurement data can be obtained. Therefore, this scheme not only effectively reduces truncation errors caused by measurement range limitations but also has significant implications for improving antenna performance evaluation, design optimization, and fault diagnosis.
[0014] Furthermore, step S1 involves acquiring near-field measurement data of the truncated spherical surface of the antenna under test, specifically including:
[0015] Acquire spherical near-field measurement data of the antenna under test;
[0016] Based on the spherical near-field measurement data, determine the spherical near-field measurement data that were not measured;
[0017] The unmeasured spherical near-field measurement data is zero-filled to serve as the spherical near-field measurement data of the truncated antenna under test.
[0018] Based on the aforementioned technical methods, by analyzing the detected spherical near-field measurement data of the antenna under test, the unmeasured spherical regions, i.e., the truncated regions, are identified. Zero-filling is then applied to these unmeasured regions, setting the electric field value to zero. This method maintains the integrity and consistency of the data structure during subsequent Fourier transform and filtering processes. Although the zero-filled data is not the actual measured value, it still constitutes a complete spherical near-field data matrix, allowing subsequent operations such as Fast Fourier Transform, frequency domain filtering, and inverse transform to be performed on a unified data structure.
[0019] Furthermore, in step S3, the first frequency domain data is filtered to obtain the second frequency domain data, specifically including:
[0020] The first frequency domain data is smoothed and filtered within a preset frequency domain interval to obtain smoothed frequency domain data, which is then used as the second frequency domain data.
[0021] Furthermore, before performing smoothing filtering on the first frequency domain data within a preset frequency domain interval, step S3 also includes step S31:
[0022] In the first frequency domain data, a data fluctuation range is identified, and the data fluctuation range is used as a preset frequency domain range.
[0023] Based on the aforementioned technical methods, by first identifying data fluctuation ranges and then performing filtering within these ranges, a "one-size-fits-all" approach is avoided. Fluctuation ranges often correspond to areas where noise, interference, or measurement errors are concentrated. Targeted filtering of these areas can significantly improve the signal-to-noise ratio and stability of the data.
[0024] Furthermore, the method further includes step S5:
[0025] Repeat steps S2-S4 N times;
[0026] The truncated spherical near-field measurement data after replacement in the (N-1)th round of reconstruction is used as the truncated spherical near-field measurement data of the antenna under test in the Nth round.
[0027] N is a positive integer greater than 1.
[0028] Based on the aforementioned techniques, since the initial truncated or zero-padding data is inaccurate, a single Fast Fourier Transform (FFT), filtering, and Inverse Fast Fourier Transform (IFFT) process may not be sufficient to fully recover the true near-field data. Through multiple rounds of iterative reconstruction, a more accurate near-field distribution can be continuously approximated.
[0029] Furthermore, the method further includes step S6:
[0030] Calculate the similarity between the near-field reconstruction data of the Nth round and the near-field reconstruction data of the (N-1)th round;
[0031] Determine whether the similarity reaches a preset value; if yes, stop repeating steps S2-S4 and replace the truncated spherical near-field measurement data with the near-field reconstruction data of the Nth round; if no, continue repeating steps S2-S4 for the N+1th round.
[0032] Furthermore, the method also includes step S6, determining whether N has reached a preset value. If so, then stop repeating steps S2-S4, and replace the truncated spherical near-field measurement data with the near-field reconstruction data of the Nth round.
[0033] This specification provides a device for reducing the measurement truncation error of a spherical near-field antenna, comprising:
[0034] The determination module is used to acquire near-field measurement data of the truncated spherical surface of the antenna under test;
[0035] A transformation module, which is communicatively connected to the determination module, is used to perform a fast Fourier transform in the pitch angle direction on the truncated spherical near-field measurement data to obtain first frequency domain data.
[0036] A filtering module is communicatively connected to the transformation module. The filtering module is used to filter the first frequency domain data to obtain the second frequency domain data.
[0037] The reconstruction module is communicatively connected to the filtering module. The reconstruction module is used to perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and to replace the truncated spherical near-field measurement data with the near-field reconstruction data.
[0038] This specification provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for reducing the measurement truncation error of a spherical near-field antenna.
[0039] This specification provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement a method for reducing the measurement truncation error of a spherical near-field antenna.
[0040] The above-mentioned technical solutions adopted in this specification can achieve the following beneficial effects:
[0041] The method for reducing truncation errors in spherical near-field antenna measurements provided in this specification acquires truncated spherical near-field measurement data of the antenna under test. For the truncated spherical near-field measurement data, a Fast Fourier Transform (FFT) is performed in the elevation direction to obtain first frequency domain data. The first frequency domain data is then filtered to obtain second frequency domain data. The second frequency domain data is then subjected to an Inverse Fast Fourier Transform (IFT) to obtain near-field reconstructed data, which is used to replace the truncated spherical near-field measurement data.
[0042] Based on the aforementioned technical methods, by performing frequency domain transformation (Fast Fourier Transform), filtering, and inverse transformation (Inverse Fast Fourier Transform) on the truncated spherical near-field measurement data, the truncated data portion can be effectively reconstructed. This allows for a more accurate reflection of the true far-field radiation characteristics of the antenna's untruncated region after near-field to far-field transformation. This method can compensate for data loss caused by limited measurement range. A key objective of spherical near-field measurement is to predict far-field radiation patterns using near-field data. This method, by optimizing the quality of near-field data, improves the accuracy of the radiation pattern obtained during the near-field to far-field conversion, making the prediction results closer to reality. Furthermore, this method is applicable to different types of antennas and their various operating frequency ranges, as long as the corresponding truncated spherical near-field measurement data can be obtained. Therefore, this scheme not only effectively reduces truncation errors caused by measurement range limitations but also has significant implications for improving antenna performance evaluation, design optimization, and fault diagnosis. Attached Figure Description
[0043] The accompanying drawings, which are included to provide a further understanding of this specification and form part of this specification, illustrate exemplary embodiments and are used to explain this specification, but do not constitute an undue limitation thereof. In the drawings:
[0044] Figure 1 A flowchart illustrating a method for reducing the measurement truncation error of a spherical near-field antenna, provided as an embodiment of this specification;
[0045] Figure 2 This is a schematic diagram of near-field measurement data of a spherical dipole antenna provided in this specification;
[0046] Figure 3 A schematic diagram of the far-field radiation pattern of a spherical wave unfolded by a dipole antenna, as provided in this specification.
[0047] Figure 4 This is a schematic diagram of near-field measurement data for an array antenna spherical surface, provided in this specification.
[0048] Figure 5 A schematic diagram of the far-field radiation pattern of a spherical wave unfolded array antenna provided in this specification;
[0049] Figure 6 A schematic diagram of a device for reducing measurement truncation error of a spherical near-field antenna provided in this specification;
[0050] Figure 7 This specification provides a corresponding Figure 1 A schematic diagram of the structure of an electronic device. Detailed Implementation
[0051] It should be noted that, unless otherwise specified, the embodiments and technical features in the embodiments of this application can be combined with each other, and the detailed descriptions in the specific embodiments should be understood as explanations of the purpose of this application and should not be regarded as undue limitations on this application.
[0052] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the specific technical solutions of this application will be further described in detail below with reference to the accompanying drawings of the embodiments of this application. The following embodiments are used to illustrate this application, but are not intended to limit the scope of this application.
[0053] In embodiments of this application, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0054] The technical solutions provided in the various embodiments of this specification are described in detail below with reference to the accompanying drawings.
[0055] Figure 1 A flowchart illustrating a method for reducing the truncation error in spherical near-field antenna measurements, provided for embodiments of this specification, includes the following steps:
[0056] S1: Acquire near-field measurement data of the truncated spherical surface of the antenna under test.
[0057] In this specification, the process of reducing the truncation error in spherical near-field antenna measurements can be performed by a server, a terminal device with computing and data processing capabilities, or other similar devices. Of course, for greater convenience, a spherical near-field testing system can also be loaded onto the device for spherical near-field measurement and data processing. It is worth noting that this specification does not limit the type of device used to perform the truncation error reduction process; devices such as personal computers and mobile terminals can also be used. For ease of description, the following explanation uses a server as the execution entity.
[0058] In one or more embodiments of this specification, the server can acquire spherical near-field measurement data of the antenna under test obtained by the probe scanning the spherical surface of the antenna under test on the turntable. It is worth noting that the range of motion of the turntable in the elevation direction is typically much less than 180°, generally ±90° or ±110°, etc. For ease of description, the following description will use spherical near-field measurement data of the antenna under test with a range of ±90° in the elevation direction from the near-field measurement data.
[0059] Therefore, the spherical near-field measurement data outside the sampling range of 90° is considered the truncated spherical near-field measurement data that was not measured by the probe. This portion of the unmeasured spherical near-field measurement data is blank in the collected spherical near-field measurement data of the antenna under test. The server can then preprocess the unmeasured spherical near-field measurement data, such as performing zero-padding, to obtain the truncated spherical near-field measurement data of the antenna under test.
[0060] In one or more embodiments of this specification, the server acquires and determines truncated spherical near-field measurement data of the antenna under test, which includes electric field vector data in the azimuth (φ) direction and electric field vector data in the elevation (θ) direction.
[0061] S2: Perform a fast Fourier transform on the pitch angle direction for the truncated spherical near-field measurement data to obtain the first frequency domain data.
[0062] In one or more embodiments of this specification, the server can perform a fast Fourier transform on the electric field vector data in the pitch angle (θ) direction for the truncated spherical near-field measurement data to obtain the transformed first frequency domain data. It is worth noting that the electric field vector data in the azimuth direction is not processed in this specification.
[0063] S3: Filter the first frequency domain data to obtain the second frequency domain data.
[0064] In one or more embodiments of this specification, after obtaining the first frequency domain data corresponding to the pitch angle direction, the server can preprocess the first frequency domain data. The method may be that the server performs filtering processing on the first frequency domain data to obtain second frequency domain data.
[0065] Specifically, the server can perform smoothing filtering on the first frequency domain data within a preset frequency domain range to obtain smoothed frequency domain data, which can then be used as the second frequency domain data.
[0066] The process also includes step S31, where, after performing a Fast Fourier Transform on the electric field vector data in the pitch angle direction, the data fluctuation intervals with data fluctuations can be determined from the first frequency domain data, and these intervals are used as preset frequency domain intervals. By first identifying the data fluctuation intervals and then performing filtering within these intervals, a "one-size-fits-all" approach is avoided. Fluctuation intervals often correspond to areas where noise, interference, or measurement errors are concentrated. Targeted filtering of these areas can significantly improve the signal-to-noise ratio and stability of the data.
[0067] S4: Perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and replace the truncated spherical near-field measurement data with the near-field reconstruction data.
[0068] In one or more embodiments of this specification, the server can perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstructed data, and use the near-field reconstructed data to replace the truncated spherical near-field measurement data, thus completing the spherical near-field measurement data of the antenna under test. Then, a near-field to far-field transformation can be performed based on the spherical near-field measurement data of the antenna under test to determine the far-field radiation pattern of the antenna, thereby realizing the antenna system performance measurement.
[0069] based on Figure 1 The method for reducing truncation errors in spherical near-field antenna measurements, as shown, effectively reconstructs the truncated data portion by performing frequency domain transformation (Fast Fourier Transform), filtering, and inverse transformation (Inverse Fast Fourier Transform) on the truncated spherical near-field measurement data. This allows for a more accurate reflection of the true far-field radiation characteristics of the antenna's untruncated region after near-field to far-field transformation. This method compensates for data loss caused by limited measurement range. A key objective of spherical near-field measurements is to predict far-field radiation patterns using near-field data. This method, by optimizing the quality of near-field data, improves the accuracy of the radiation pattern obtained during the near-field to far-field conversion, making the prediction results closer to reality. Furthermore, this method is applicable to different types of antennas and their various operating frequency ranges, as long as the corresponding truncated spherical near-field measurement data can be obtained. Therefore, this scheme not only effectively reduces truncation errors caused by measurement range limitations but also has significant implications for improving antenna performance evaluation, design optimization, and fault diagnosis.
[0070] Furthermore, in one or more embodiments of this specification, step S5 is also included. After steps S1-S4, the truncated spherical near-field measurement data of the antenna under test is initially determined. However, a single fast Fourier transform, filtering, and inverse fast Fourier transform process may not be sufficient to completely recover the true near-field data, and iterative reconstruction work needs to be performed again or multiple times. Therefore, steps S2-S4N rounds need to be repeated. For the Nth round of reconstruction, the server can use the truncated spherical near-field measurement data of the antenna under test after replacement in the (N-1)th round of reconstruction as the truncated spherical near-field measurement data of the antenna under test in the Nth round, where N is a positive integer greater than 1.
[0071] Next, this specification also includes step S6, where the server calculates the similarity between the near-field reconstruction data of round N and the near-field reconstruction data of round N-1, and determines whether the similarity reaches a preset similarity. If yes, the server stops repeating steps S2-S4 and replaces the truncated spherical near-field measurement data with the near-field reconstruction data of round N. If no, the server continues to repeat steps S2-S4 for round N+1 until the similarity reaches the preset similarity.
[0072] Alternatively, step S6 could also involve the server determining whether N has reached a preset value. If so, the server stops repeating steps S2-S4 and replaces the truncated spherical near-field measurement data with the near-field reconstruction data from the Nth round. Otherwise, the server continues repeating steps S2-S4 for the N+1th round until the preset value is reached.
[0073] Specifically, for the N rounds of reconstruction repeating steps S2-S4 above, the server can determine the near-field reconstruction data obtained in the (N-1)th round of reconstruction (i.e., the replaced truncated spherical near-field measurement data) for the Nth round of reconstruction of the truncated spherical near-field measurement data of the antenna under test, and use it as the truncated spherical near-field measurement data for the Nth round of reconstruction, where N is a positive integer greater than 1, i.e., N is at least 2. It is worth noting that in this specification, steps S1 to S4 above can be regarded as the first round of reconstruction of the truncated spherical near-field measurement data of the antenna under test.
[0074] Following steps S1 to S4 above, the server can perform a Fast Fourier Transform (FFT) on the truncated spherical near-field measurement data reconstructed in the Nth round, along the pitch angle, to obtain the first frequency domain data reconstructed in the Nth round. Then, the first frequency domain data reconstructed in the Nth round is filtered to obtain the second frequency domain data reconstructed in the Nth round. Finally, based on the second frequency domain data reconstructed in the Nth round, an Inverse Fast Fourier Transform (IFFT) is performed to obtain the near-field reconstruction data reconstructed in the Nth round.
[0075] Next, the server determines whether the near-field reconstruction data determined in the Nth round of reconstruction meets the conditions for stopping reconstruction. If yes, the near-field reconstruction data determined in the Nth round of reconstruction is used as the near-field measurement data of the truncated spherical surface of the antenna under test. If not, the (N+1)th round of reconstruction of the near-field measurement data of the truncated spherical surface of the antenna under test is performed until the obtained near-field reconstruction data meets the conditions for stopping reconstruction.
[0076] One method for determining whether the near-field reconstruction data identified in the Nth round of reconstruction meets the conditions for stopping reconstruction is to have the server calculate the similarity between the near-field reconstruction data identified in the Nth round of reconstruction and the truncated spherical near-field measurement data identified in the (N-1)th round of reconstruction (i.e., the near-field reconstruction data of the (N-1)th round). Then, determine whether the similarity reaches a preset similarity threshold.
[0077] Alternatively, the server can determine whether the Nth round of reconstruction is a preset round of reconstruction, i.e., whether N has reached a preset value.
[0078] The method for reducing truncation errors in spherical near-field antenna measurements described in this specification can reconstruct truncated spherical near-field measurement data when performing spherical near-field measurements on antennas such as dipole antennas and array antennas.
[0079] For example, when modeling and simulating a dipole antenna with a full-wave frequency of 1.9 GHz, the data in the simulated spherical near-field measurement data of the dipole antenna, specifically the region with an elevation angle greater than 90°, is truncated. Then, the truncated spherical near-field measurement data is filled with zeros, and steps S2 to S4 are repeated until the determined near-field reconstructed data meets the reconstruction stopping condition. This reconstructed near-field data is used to compensate for the truncated data in the spherical near-field measurement data of the dipole antenna, and then spherical wave expansion is performed to obtain the far-field radiation pattern.
[0080] Figure 2 This is a schematic diagram illustrating near-field measurement data of a spherical dipole antenna provided in this specification. Figure 2 As shown, Figure 2 The left side shows the simulated near-field measurement data of an untrunculated dipole antenna spherical surface, with an elevation angle (θ) ranging from 0° to 180°. Figure 2 The middle region represents the near-field measurement data of the dipole antenna spherical surface after zero-filling the area with an elevation angle greater than 90°. Figure 2 The right side shows the near-field measurement data of the dipole antenna spherical surface after preprocessing according to this scheme. The following description of the processing results using this scheme is marked as Proposed in the figure.
[0081] Figure 3 This is a schematic diagram of the far-field radiation pattern of a spherical wave unfolded using a dipole antenna, as provided in this specification. Figure 3 As shown, Figure 3The large image on the left shows four far-field patterns: a simulated dipole antenna far-field pattern as a reference (Full-wave sim. (Ref.)), a far-field pattern expanded with zero padding, a far-field pattern expanded using the proposed method, and a far-field pattern expanded using the last value strategy proposed in the literature "R. Cornelius, Fast Spherical Near-Field Antenna Measurement Methods, Auflage. Aachen: Apprimus Verlag, 2019." Figure 3 The enlarged view in the upper right corner shows the degree of fit between the far-field radiation patterns of the simulated dipole antenna used as a reference, within the elevation angle range of -20° to 20°. Figure 3 The enlarged view in the lower right corner shows the degree of fit between the far-field radiation patterns of each elevation angle in the range of -100° to -60° and the far-field radiation pattern of the simulated dipole antenna used as a reference.
[0082] This specification also includes a method for reducing truncation errors in spherical near-field antenna measurements of the array antenna. For example, the array antenna can be modeled and simulated using a full-wave design, with its operating frequency set to 14.25 GHz. The data in the simulated spherical near-field measurement data of the array antenna, specifically the region with an elevation angle greater than 90°, is then truncated. The truncated spherical near-field measurement data is then filled with zeros, and steps S2 to S4 are repeated until the determined near-field reconstructed data meets the reconstruction stopping condition. The resulting near-field reconstructed data is used to compensate for the truncated data in the spherical near-field measurement data of the array antenna, and then spherical wave unrolling is performed to obtain the far-field radiation pattern.
[0083] Figure 4 This is a schematic diagram illustrating near-field measurement data of a spherical array antenna provided in this specification. Figure 4 As shown, Figure 4 The left side shows the simulated near-field measurement data of the untrunculated array antenna spherical surface, with an elevation angle (θ) ranging from 0° to 180°. Figure 4 The middle area represents the near-field measurement data of the array antenna spherical surface after zero-filling the region with an elevation angle greater than 90°. Figure 4 The right side shows the spherical near-field measurement data of the array antenna after preprocessing according to this scheme. The following description of the processing results using this scheme is marked as Proposed in the figure.
[0084] Figure 5 This is a schematic diagram of the far-field radiation pattern of a spherical wave unfolded array antenna provided in this specification. Figure 5 As shown, Figure 5The large image on the left shows four far-field patterns: the far-field pattern of the simulated dipole antenna as a reference (Full-wave sim.(Ref.)), the far-field pattern expanded after zero-filling, the far-field pattern expanded using the Proposed method, and the far-field pattern expanded according to the Last value strategy. Figure 5 The enlarged view in the upper right corner shows the degree of fit between the far-field radiation patterns of the antenna and the far-field radiation pattern of the simulated dipole antenna used as a reference, within the elevation angle range of 60° to 100°. Figure 5 The enlarged view in the lower right corner shows the degree of fit between the far-field radiation patterns of each elevation angle in the range of -100° to -60° and the far-field radiation pattern of the simulated dipole antenna used as a reference.
[0085] The above describes a method for reducing the truncation error in spherical near-field antenna measurements, provided by one or more embodiments of this specification. Based on the same idea, this specification also provides a corresponding device for reducing the truncation error in spherical near-field antenna measurements, such as... Figure 6 As shown.
[0086] Figure 6 A schematic diagram of a spherical near-field antenna measurement truncation error reduction device provided in this specification specifically includes:
[0087] The determination module 600 is used to acquire near-field measurement data of the truncated spherical antenna under test;
[0088] Transformation module 602, which is communicatively connected to the determination module, is used to perform a fast Fourier transform in the pitch angle direction on the truncated spherical near-field measurement data to obtain first frequency domain data;
[0089] A filtering module 604 is communicatively connected to the transformation module. The filtering module is used to filter the first frequency domain data to obtain the second frequency domain data.
[0090] The reconstruction module 606 is communicatively connected to the filtering module. The reconstruction module is used to perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and to replace the truncated spherical near-field measurement data with the near-field reconstruction data.
[0091] This specification also provides a computer-readable storage medium storing a computer program that can be used to execute the above-described... Figure 1 A method for reducing the measurement truncation error of a spherical near-field antenna is provided.
[0092] This instruction manual also provides Figure 7 The diagram shows a schematic structural representation of the electronic device. Figure 7As shown, at the hardware level, this electronic device includes a processor, internal bus, network interface, memory, and non-volatile memory, and may also include other hardware required for business operations. The processor reads the corresponding computer program from the non-volatile memory into memory and then runs it to achieve the above. Figure 1 The method for reducing measurement truncation error of the spherical near-field antenna.
[0093] Of course, in addition to software implementation, this specification does not exclude other implementation methods, such as logic devices or a combination of hardware and software. In other words, the execution subject of the following processing flow is not limited to each logic unit, but can also be hardware or logic devices.
[0094] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.
[0095] The above description is merely an embodiment of this specification and is not intended to limit this specification. Various modifications and variations can be made to this specification by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this specification should be included within the scope of the claims of this specification.
Claims
1. A method for reducing the measurement truncation error of a spherical near-field antenna, characterized in that, include: S1. Acquire near-field measurement data of the truncated spherical surface of the antenna under test; S2. Perform a fast Fourier transform on the pitch angle direction for the truncated spherical near-field measurement data to obtain the first frequency domain data; S3. In the first frequency domain data, determine the data fluctuation range where data fluctuation exists; perform smoothing filtering on the first frequency domain data in the data fluctuation range to obtain smoothed frequency domain data, which is used as the second frequency domain data; S4. Perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and replace the truncated spherical near-field measurement data with the near-field reconstruction data.
2. The method for reducing the measurement truncation error of a spherical near-field antenna as described in claim 1, characterized in that, Step S1 involves acquiring near-field measurement data of the truncated spherical surface of the antenna under test, specifically including: Acquire spherical near-field measurement data of the antenna under test; Based on the spherical near-field measurement data, determine the spherical near-field measurement data that were not measured; The unmeasured spherical near-field measurement data is zero-filled to serve as the spherical near-field measurement data of the truncated antenna under test.
3. The method for reducing the measurement truncation error of a spherical near-field antenna as described in claim 1, characterized in that, The method further includes step S5: Repeat steps S2-S4 N times; The truncated spherical near-field measurement data after replacement in the (N-1)th round of reconstruction is used as the truncated spherical near-field measurement data of the antenna under test in the Nth round. N is a positive integer greater than 1.
4. The method for reducing the measurement truncation error of a spherical near-field antenna as described in claim 3, characterized in that, The method further includes step S6: Calculate the similarity between the near-field reconstruction data of the Nth round and the near-field reconstruction data of the (N-1)th round; Determine whether the similarity reaches a preset value; if yes, stop repeating steps S2-S4 and replace the truncated spherical near-field measurement data with the near-field reconstruction data of the Nth round; if no, continue repeating steps S2-S4 for the N+1th round.
5. The method for reducing the measurement truncation error of a spherical near-field antenna as described in claim 4, characterized in that, The method further includes step S6, determining whether N has reached a preset value. If so, then stop repeating steps S2-S4, and replace the truncated spherical near-field measurement data with the near-field reconstruction data of the Nth round.
6. A device for reducing measurement truncation error of a spherical near-field antenna, characterized in that, include: The determination module is used to acquire near-field measurement data of the truncated spherical antenna under test; A transformation module, which is communicatively connected to the determination module, is used to perform a fast Fourier transform in the pitch angle direction on the truncated spherical near-field measurement data to obtain first frequency domain data. A filtering module is communicatively connected to the transformation module. The filtering module is used to determine the data fluctuation range where data fluctuation exists in the first frequency domain data; and to perform smoothing filtering on the first frequency domain data in the data fluctuation range to obtain smoothed frequency domain data, which is used as the second frequency domain data. The reconstruction module is communicatively connected to the filtering module. The reconstruction module is used to perform an inverse fast Fourier transform on the second frequency domain data to obtain near-field reconstruction data, and to replace the truncated spherical near-field measurement data with the near-field reconstruction data.
7. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the method described in any one of claims 1 to 5.
8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method described in any one of claims 1 to 5.