Chopped chilli fermentation jar temperature remote regulation and control system and method based on supervision and control

Abstract

The invention provides a chopped chilli fermentation jar temperature remote regulation and control system and method based on supervision and control, and relates to the technical field of temperature remote regulation and control. The abnormal confidence coefficient of the temperature of the chopped chilli fermentation jar in the current chopped chilli fermentation period is determined; calibrating the temperature value of each temperature sensor; further generating temperature regulation and control instructions of a heating rate control section and a constant temperature maintaining section in the current chopped chilli fermentation period; when the abnormal confidence exceeds a set threshold value, a semiconductor temperature control module on the outer wall of the chopped hot pepper fermentation jar body is remotely controlled to execute a temperature regulation and control instruction, temperature gradient distribution in the chopped hot pepper fermentation jar is continuously monitored in the instruction execution process, and then the distribution proportion of the heating power and the refrigerating power of the semiconductor temperature control module is adjusted. According to the application, the internal temperature of the chopped chilli fermentation jar can be remotely and accurately regulated and controlled in a high-acid, high-salt and high-humidity chopped chilli fermentation environment, so that the uniform distribution of the internal temperature of the fermentation jar is improved.

Description

Technical Field

[0001] This application relates to the field of remote temperature control technology, and more specifically, to a remote temperature control system and method for a chili fermentation jar based on supervised control. Background Technology

[0002] With the upgrading of the modern food fermentation industry, high-precision temperature control technology plays an increasingly important role in the fermentation process. Temperature is a key parameter affecting microbial activity and the formation of metabolites during fermentation. Precise control of the fermentation environment temperature can significantly improve product yield, quality, and flavor. Meanwhile, the development of remote monitoring and control technology allows managers to monitor the fermentation process in real time, reducing human intervention and operational risks, and providing a technological foundation for intelligent fermentation production.

[0003] However, during the fermentation of chopped chili peppers, the high salt content and gradually increasing acidity of the fermenting material, along with changes in humidity, easily create complex temperature gradients inside the fermentation jar, leading to significant local temperature fluctuations. The high-acid, high-salt, and high-humidity fermentation environment not only increases the measurement interference and drift risk of temperature sensors but also adds to the limitations of traditional single-point temperature measurement and manual control methods, making it difficult to accurately grasp the internal temperature distribution. Under these circumstances, local temperature anomalies can affect the distribution of microbial activity and the uniformity of fermentation. Existing heating or cooling equipment is unable to achieve rapid and precise power adjustment, further reducing the stability of fermentation quality. Therefore, how to remotely and precisely control the internal temperature of the chopped chili pepper fermentation jar under high-acid, high-salt, and high-humidity conditions, thereby improving the uniformity of temperature distribution inside the fermentation jar, has become a challenge for the industry. Summary of the Invention

[0004] This application provides a remote temperature control system and method for a chopped chili fermentation jar based on supervised control, which can remotely and precisely control the internal temperature of the chopped chili fermentation jar in a high-acid, high-salt, and high-humidity fermentation environment, thereby improving the uniformity of temperature distribution inside the fermentation jar.

[0005] In a first aspect, this application provides a method for remotely controlling the temperature of a fermentation jar for chopped chili peppers based on supervised control, the method comprising the following steps: Temperature change data during the current chopped chili fermentation cycle is collected by an array of temperature sensors inside the chopped chili fermentation jar. The anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle is determined based on the temperature fluctuation characteristics of the temperature change data. The temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers, thus obtaining the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped chili peppers. Based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform, temperature control instructions are generated for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle. When the abnormal confidence level exceeds the set threshold, the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar is remotely controlled to execute the temperature control command. During the execution of the command, the temperature gradient distribution inside the chopped pepper fermentation jar is continuously monitored, and the distribution ratio of heating power and cooling power of the semiconductor temperature control module is adjusted according to the temperature gradient distribution.

[0006] In this embodiment, determining the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle based on the temperature fluctuation characteristics of the temperature change data specifically includes: Determine the temperature fluctuation characteristics of the temperature change data; Based on the temperature fluctuation characteristics, the abnormal temperature fluctuation characteristics of the chopped chili fermentation jar during the current chopped chili fermentation cycle are determined. The feature matching degree of the temperature anomaly pattern in the fermentation jar during the current fermentation cycle is determined by the abnormal temperature fluctuation characteristics of the fermentation jar during the current fermentation cycle. The confidence level of temperature anomalies in the fermentation jar during the current fermentation cycle is determined based on the characteristic matching degree of the temperature anomaly pattern in the fermentation jar during the current fermentation cycle.

[0007] In this embodiment, the temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers. Specifically, the calibrated temperature value of each temperature sensor during the current fermentation cycle includes: The temperature drift of the temperature sensor array during the current chopped chili fermentation cycle is determined based on the temperature reference value of each temperature sensor in the temperature sensor array at the beginning of the current chopped chili fermentation cycle. The temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers is determined based on the temperature drift and the temperature change trend of each temperature sensor within the current fermentation period of the chopped chili peppers. The temperature value of each temperature sensor is calibrated by using the temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers, thus obtaining the temperature calibration value of each temperature sensor within the current fermentation period of the chopped chili peppers.

[0008] In this embodiment, the temperature control commands for generating the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle based on all temperature calibration values ​​and the chopped chili fermentation process parameters issued by the remote monitoring platform specifically include: Receive the fermentation process parameters for chopped chili peppers from the remote monitoring platform; Based on the spatial distribution characteristics of all temperature calibration values, cold and hot spot areas were identified within the chopped chili fermentation jar. The temperature gradient of the temperature rise rate control section within the current chopped pepper fermentation cycle is determined based on the cold spot region and the chopped pepper fermentation process parameters. The temperature fluctuation tolerance value of the constant temperature maintenance section within the current chopped pepper fermentation cycle is determined by the hot spot area and the chopped pepper fermentation process parameters. Based on the temperature gradient of the temperature rise rate control section and the temperature fluctuation tolerance value of the constant temperature maintenance section within the current chopped chili fermentation cycle, temperature control commands are generated for the temperature rise rate control section and the constant temperature maintenance section within the current chopped chili fermentation cycle.

[0009] In this embodiment, continuously monitoring the temperature gradient distribution inside the chopped chili fermentation jar during instruction execution specifically includes: Real-time monitoring of the temperature calibration values ​​of each temperature sensor in the temperature sensor array; The rate of change of temperature gradient at different depths inside the chopped chili fermentation jar is determined based on the temperature calibration value and spatial location information of each temperature sensor. The temperature gradient distribution inside the fermentation jar was determined by the rate of change of temperature gradient at different depths inside the jar.

[0010] In this embodiment, adjusting the distribution ratio of heating power and cooling power of the semiconductor temperature control module through the temperature gradient distribution specifically includes: Based on the temperature gradient distribution, the areas of heat accumulation and heat loss inside the chopped chili fermentation jar were identified. The distribution ratio of the cooling power of the semiconductor temperature control module is determined by the temperature deviation of the heat accumulation area. The distribution ratio of the heating power of the semiconductor temperature control module is determined based on the temperature deviation of the heat-deficient area.

[0011] In this embodiment, the anomaly confidence level represents the evaluation index of the degree of temperature anomaly in the chopped chili fermentation jar.

[0012] In this embodiment, the temperature drift represents the degree of temperature deviation of the temperature sensor array during the current fermentation cycle of the chopped chili peppers.

[0013] In this embodiment, the temperature gradient distribution represents a characteristic distribution reflecting the heat accumulation state at different depths within the fermentation jar of chopped chili peppers.

[0014] Secondly, this application provides a supervised control-based remote temperature control system for a chopped chili fermentation jar, used to execute a supervised control-based remote temperature control method for a chopped chili fermentation jar, the remote temperature control system comprising: The data acquisition module is used to collect temperature change data during the current fermentation cycle of chopped peppers through the temperature sensor array inside the chopped pepper fermentation jar; An anomaly confidence analysis module is used to determine the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle based on the temperature fluctuation characteristics of the temperature change data. The temperature calibration module is used to calibrate the temperature value of each temperature sensor by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped peppers, and to obtain the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped peppers. The instruction generation module is used to generate temperature control instructions for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform. The power dynamic adjustment module is used to remotely control the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar to execute the temperature control command when the abnormal confidence level exceeds the set threshold. During the execution of the command, the module continuously monitors the temperature gradient distribution inside the chopped pepper fermentation jar and adjusts the distribution ratio of heating power and cooling power of the semiconductor temperature control module based on the temperature gradient distribution.

[0015] The technical solutions provided by the embodiments disclosed in this application have the following beneficial effects: Temperature change data during the current fermentation cycle of chopped chili peppers is collected by a temperature sensor array inside the fermentation jar. The anomaly confidence level of the fermentation jar's temperature during the current fermentation cycle is determined based on the temperature fluctuation characteristics of the temperature change data. The temperature value of each temperature sensor is calibrated based on the temperature drift of the temperature sensor array during the current fermentation cycle, resulting in a calibrated temperature value for each sensor. Temperature control commands for the heating rate control segment and the constant temperature maintenance segment during the current fermentation cycle are generated based on all calibrated temperature values ​​and the fermentation process parameters issued by the remote monitoring platform. When the anomaly confidence level exceeds a set threshold, the semiconductor temperature control module on the outer wall of the fermentation jar is remotely controlled to execute the temperature control commands. During command execution, the temperature gradient distribution inside the fermentation jar is continuously monitored, and the distribution ratio of heating and cooling power of the semiconductor temperature control module is adjusted based on the temperature gradient distribution.

[0016] Therefore, in this application, the distribution ratio of heating and cooling power of the semiconductor temperature control module can be adjusted through the temperature gradient distribution. Firstly, by deploying a temperature sensor array inside the chili fermentation jar, global and continuous temperature acquisition of the entire fermentation environment is achieved, effectively overcoming the limitations of traditional single-point temperature measurement methods. This allows for a comprehensive understanding of the complex temperature gradients and local fluctuations that may occur under high-acid, high-salt, and high-humidity environments, providing a reliable real-time data foundation for subsequent control. Secondly, by analyzing the fluctuation characteristics of temperature change data, the system can quantify the confidence level of temperature anomalies in the current fermentation cycle, enabling early identification of local temperature anomalies and ensuring that potential anomalies can be detected and intervened in a timely manner. Subsequently, the temperature values ​​of the temperature sensors are calibrated to ensure the accuracy and consistency of the temperature sensor data, reducing the interference of high-salt, high-acid, and high-humidity environments on measurement accuracy, making control decisions based on more reliable data, and further improving the stability and reliability of temperature control. Predictive capability; based on all temperature calibration values ​​and the fermentation process parameters of chopped chili peppers issued by the remote monitoring platform, intelligent temperature control commands are generated for the heating rate control segment and the constant temperature maintenance segment, achieving precise control of the internal temperature of the fermentation jar; when the anomaly confidence level exceeds the preset threshold, the semiconductor temperature control module on the outer wall of the chopped chili pepper fermentation jar can execute the temperature control command and continuously monitor the internal temperature gradient distribution during the command execution process. By dynamically adjusting the distribution ratio of heating power and cooling power, rapid compensation for local temperature anomalies is achieved, ensuring temperature uniformity; overall, this closed-loop control mode can effectively suppress local temperature fluctuations in high-acid, high-salt, and high-humidity fermentation environments, optimize the distribution of microbial activity, improve the uniformity and stability of the fermentation process, reduce manual intervention and operational risks, and improve the level of intelligent management, thereby achieving the technical objective of remotely and accurately controlling the internal temperature of the chopped chili pepper fermentation jar in complex fermentation environments, significantly improving the uniformity of temperature distribution and the stability of fermentation quality.

[0017] In summary, the technical solution adopted in this application can achieve remote and precise control of the internal temperature of the chopped chili fermentation jar in a high-acid, high-salt, and high-humidity fermentation environment, thereby improving the uniformity of temperature distribution inside the fermentation jar. Attached Figure Description

[0018] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only for this embodiment of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1This is an exemplary flowchart of a method for remote temperature control of a chopped chili fermentation jar based on supervised control, provided in this application. Figure 2 This is a flowchart illustrating the determination of anomaly confidence levels provided in this application; Figure 3 This is a flowchart illustrating the process of generating temperature control commands according to the present application; Figure 4 This is a module structure diagram of a remote temperature control system for a chili fermentation jar based on supervisory control, provided in this application. Detailed Implementation

[0020] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0021] This application provides a remote temperature control system and method for a chili pepper fermentation jar based on supervised control. The core of this system involves collecting temperature change data within the current fermentation cycle of the chili pepper using a temperature sensor array inside the fermentation jar; determining the anomaly confidence level of the temperature in the fermentation jar during the current fermentation cycle based on the temperature fluctuation characteristics of the temperature change data; calibrating the temperature value of each temperature sensor by measuring the temperature drift of the temperature sensor array during the current fermentation cycle to obtain a calibrated temperature value for each sensor; generating temperature control commands for the heating rate control segment and the constant temperature maintenance segment during the current fermentation cycle based on all calibrated temperature values ​​and the chili pepper fermentation process parameters issued by the remote monitoring platform; and when the anomaly confidence level exceeds a set threshold, remotely controlling a semiconductor temperature control module on the outer wall of the fermentation jar to execute the temperature control commands. During command execution, the system continuously monitors the temperature gradient distribution inside the fermentation jar and adjusts the distribution ratio of heating and cooling power of the semiconductor temperature control module based on the temperature gradient distribution.

[0022] Example 1: To better understand the above technical solution, the following will provide a detailed description of the technical solution in conjunction with the accompanying drawings and specific implementation methods. (Refer to...) Figure 1 As shown in the figure, this is an exemplary flowchart of a method for remotely controlling the temperature of a chopped chili fermentation jar based on supervised control, according to this embodiment of the present application. The method for remotely controlling the temperature of a chopped chili fermentation jar includes the following steps: In step S1, temperature change data during the current fermentation cycle of chopped chili peppers is collected by the temperature sensor array inside the fermentation jar.

[0023] In practice, temperature sensors are arranged in layers and at multiple points in different directions inside the chopped chili fermentation jar. The array of all temperature sensors is used as the temperature sensor array inside the chopped chili fermentation jar, and the temperature change data collected by the temperature sensor array over time is used as the temperature change data within the current chopped chili fermentation cycle.

[0024] It should be noted that the temperature change data mentioned in this application refers to the set of temperature change data collected by each temperature sensor in the temperature sensor array during the current fermentation cycle of chopped chili peppers.

[0025] In step S2, the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle is determined based on the temperature fluctuation characteristics of the temperature change data.

[0026] Preferably, in this embodiment, the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle is determined based on the temperature fluctuation characteristics of the temperature change data, with reference to... Figure 2 As shown in the figure, this is a flowchart illustrating the process of determining the anomaly confidence level in some embodiments of this application. In this embodiment, the determination of the anomaly confidence level can be achieved using the following steps: In step S21, the temperature fluctuation characteristics of the temperature change data are determined; In step S22, the abnormal temperature fluctuation characteristics of the chopped chili fermentation jar during the current chopped chili fermentation cycle are determined based on the temperature fluctuation characteristics. In step S23, the feature matching degree of the abnormal temperature pattern of the fermentation jar in the current fermentation cycle is determined by the abnormal temperature fluctuation characteristics of the fermentation jar in the current fermentation cycle. In step S24, the anomaly confidence level of the temperature in the fermentation jar during the current fermentation cycle is determined based on the feature matching degree of the temperature anomaly pattern in the fermentation jar during the current fermentation cycle.

[0027] It should be noted that the temperature fluctuation characteristics mentioned in this application refer to the characteristics used to characterize the temperature field fluctuation inside the fermentation jar; the abnormal fluctuation characteristics refer to the abnormal characteristics of the temperature of the chopped chili fermentation jar deviating from the normal fluctuation range during the current chopped chili fermentation cycle; the feature matching degree refers to the degree of matching between the abnormal temperature pattern of the chopped chili fermentation jar during the current fermentation cycle and the historical abnormal temperature pattern; and the anomaly confidence degree refers to the evaluation index of the degree of temperature anomaly of the chopped chili fermentation jar.

[0028] In practice, firstly, the temperature values ​​of adjacent temperature sensors (e.g., adjacent positions on the same circumference or corresponding positions on upper and lower layers) at the same time are retrieved from the temperature change data. Then, a numerical differentiation method (e.g., the two-point difference formula: the rate of temperature change between adjacent temperature sensors = ...) is used. ,in , For adjacent temperature sensors , The temperature change rate of each pair of adjacent sensors is calculated based on the temperature at a given time, and the feature composed of all temperature change rates is used as the temperature fluctuation feature of the temperature change data. Secondly, based on the 3σ principle (i.e., 99.7% confidence interval) of historical normal chopped chili fermentation data, a normal fluctuation threshold is set. Then, all temperature change rates in the temperature fluctuation feature are traversed to filter out outliers exceeding the normal fluctuation threshold. Next, a sliding window method (window size set to 30 minutes, step size 5 minutes) is used to statistically analyze the proportion of outliers and the maximum exceedance of the threshold within each window. Simultaneously, combined with statistics such as the standard deviation of the time series and the peak factor (ratio of peak value to effective value), the temperature of the chopped chili fermentation jar within the current chopped chili fermentation cycle is finally determined. The process involves identifying abnormal fluctuation characteristics. Then, historical abnormal fluctuation characteristics of the chopped chili fermentation jar during historical fermentation cycles are retrieved. A cosine similarity algorithm is used to calculate the cosine similarity between the abnormal temperature fluctuation characteristics of the chopped chili fermentation jar in the current fermentation cycle and each historical abnormal fluctuation characteristic. The highest cosine similarity is taken as the feature matching degree of the temperature anomaly pattern in the current fermentation cycle. Finally, the coefficient of variation of the proportion of all abnormal points in the abnormal temperature fluctuation characteristics of the chopped chili fermentation jar in the current fermentation cycle is calculated. The feature matching degree is then multiplied by (1 - coefficient of variation), and the resulting value is taken as the anomaly confidence level of the temperature in the current fermentation cycle.

[0029] In step S3, the temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers, thereby obtaining the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped chili peppers.

[0030] In this embodiment, the temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers. The temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped chili peppers can be obtained by the following steps: The temperature drift of the temperature sensor array during the current chopped chili fermentation cycle is determined based on the temperature reference value of each temperature sensor in the temperature sensor array at the beginning of the current chopped chili fermentation cycle. The temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers is determined based on the temperature drift and the temperature change trend of each temperature sensor within the current fermentation period of the chopped chili peppers. The temperature value of each temperature sensor is calibrated by using the temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers, thus obtaining the temperature calibration value of each temperature sensor within the current fermentation period of the chopped chili peppers.

[0031] It should be noted that, in this application, the temperature drift amount represents the degree of temperature deviation of the temperature sensor array within the current chopped chili fermentation cycle; the temperature change trend represents the trend curve of temperature change over time within the current chopped chili fermentation cycle; the temperature calibration coefficient represents the coefficient for calibrating the temperature deviation of the temperature sensor within the current chopped chili fermentation cycle; and the temperature calibration value represents the effective temperature value obtained after calibrating the temperature value of the temperature sensor.

[0032] In specific implementation, firstly, the temperature values ​​of each temperature sensor in the temperature sensor array at the start of the current fermentation cycle are used as the temperature reference value (denoted as...). (where i is the temperature sensor number), the average temperature of each temperature sensor within each window is calculated using the sliding window method (window duration 30 minutes, step size 5 minutes). (where t is the window number), using the well-known deviation formula (transition temperature offset) 1) Calculate the transition temperature drift of each temperature sensor in different windows, then calculate the average of all transition temperature drifts, and use the average as the temperature drift of the temperature sensor array in the current chopped chili fermentation cycle. 2) Use the least squares method to fit the average temperature of each temperature sensor in different windows, and use the fitted curve trend as the temperature change trend of each temperature sensor in the current chopped chili fermentation cycle. Then, divide the temperature drift by the temperature fitted value of each temperature sensor on the temperature change trend in the current chopped chili fermentation cycle, and subtract all the values ​​obtained from the division by 1. Use all the subtraction values ​​as the temperature calibration coefficient of the corresponding temperature sensor in the current chopped chili fermentation cycle. Finally, multiply the temperature calibration coefficient of each temperature sensor in the current chopped chili fermentation cycle by the temperature value of each temperature sensor, and use the multiplication result as the temperature calibration value of each temperature sensor in the current chopped chili fermentation cycle.

[0033] In step S4, temperature control commands for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle are generated based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform.

[0034] Preferably, in this embodiment, temperature control commands for the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle are generated based on all temperature calibration values ​​and the chopped chili fermentation process parameters issued by the remote monitoring platform, with reference to... Figure 3 As shown in the figure, this is a schematic flowchart of generating temperature control commands in some embodiments of this application. In this embodiment, generating temperature control commands can be achieved by the following steps: In step S41, the fermentation process parameters of chopped chili peppers are received from the remote monitoring platform; In step S42, cold and hot areas within the chopped chili fermentation jar are identified based on the spatial distribution characteristics of all temperature calibration values. In step S43, the temperature gradient of the temperature rise rate control section within the current chopped chili fermentation cycle is determined based on the cold spot region and the chopped chili fermentation process parameters. In step S44, the temperature fluctuation tolerance value of the constant temperature maintenance section within the current chopped chili fermentation cycle is determined by the hot spot area and the chopped chili fermentation process parameters. In step S45, temperature control commands for the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle are generated based on the heating gradient of the heating rate control segment and the temperature fluctuation tolerance value of the constant temperature maintenance segment within the current chopped chili fermentation cycle.

[0035] It should be noted that the chopped chili fermentation process parameters mentioned in this application refer to key parameters issued by the remote monitoring platform to guide the chopped chili fermentation process; the cold spot area refers to the area where the temperature is lower than the average level in the chopped chili fermentation jar and requires enhanced heating during the heating phase; the hot spot area refers to the area where the temperature is higher than the average level in the chopped chili fermentation jar and requires heat dissipation control during the constant temperature phase; the heating gradient refers to the heating rate that the heating rate control segment needs to achieve per unit time within the current chopped chili fermentation cycle; the temperature fluctuation tolerance value refers to the tolerance value that defines the temperature control boundary of the constant temperature phase, reflecting the allowable upper and lower fluctuation range of the target temperature during the constant temperature phase; the temperature control command refers to the control command that adjusts the temperature of the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle.

[0036] In specific implementation, firstly, the fermentation process parameters of chopped chili peppers are received from the remote monitoring platform. These parameters include core parameters such as the target fermentation temperature, the duration of the heating phase, the duration of the constant temperature phase, and the upper limit of overall temperature fluctuation. Secondly, the mean μ and standard deviation σ are calculated for all temperature calibration values. The feature composed of the mean μ and standard deviation σ is used as the spatial distribution feature of all temperature calibration values. Then, the mean μ and standard deviation σ are subtracted from the mean μ in the spatial distribution feature, and the result is used as the lower boundary of the temperature limit. Finally, the mean μ and standard deviation σ are added to the mean μ in the spatial distribution feature, and the result is used as the upper boundary of the temperature limit. Temperatures below the lower boundary of the temperature limit are then calibrated. The temperature sensor locations corresponding to the calibrated values ​​are designated as cold spot regions, and the temperature sensor locations corresponding to the calibrated values ​​above the upper boundary of the temperature limit are designated as hot spot regions. Next, the lowest calibrated value in the cold spot region is taken as the lowest cold spot temperature. Then, combined with the target fermentation temperature and the duration of the heating phase in the chopped chili fermentation process parameters, a linear interpolation method is used to calculate the heating gradient of the heating rate control segment within the current chopped chili fermentation cycle, i.e.: Heating gradient = (Target fermentation temperature - Lowest cold spot temperature) / Heating phase duration. Then, the highest calibrated value in the hot spot region is taken as the highest hot spot temperature. Combined with the target fermentation temperature and the overall temperature fluctuation limit in the chopped chili fermentation process parameters, a linear interpolation method is used to calculate the heating gradient of the heating rate control segment within the current chopped chili fermentation cycle, i.e.: Heating gradient = (Target fermentation temperature - Lowest cold spot temperature) / Heating phase duration. Finally, the highest calibrated value in the hot spot region is taken as the highest hot spot temperature. Then, combined with the target fermentation temperature and the overall temperature fluctuation limit in the chopped chili fermentation process parameters, a linear interpolation method is used to calculate the heating gradient of ... The following formula calculates the temperature fluctuation tolerance value for the constant temperature maintenance phase within the current chopped chili fermentation cycle: Temperature fluctuation tolerance value = Overall temperature fluctuation upper limit × (1 - Constant temperature phase duration / Total fermentation duration) + (Target fermentation temperature - Highest hot spot temperature); Finally, for the heating rate control phase, the heating phase duration is divided into 1-hour periods based on the heating gradient. The target temperature for each period is calculated using "Initial temperature of the period + Heating gradient × 1 hour" (e.g., with an initial temperature of 20℃ and a heating gradient of 0.5℃ / h, the target temperature for the first hour is 20.5℃, and the target temperature for the second hour is 21℃). Simultaneously, the heating module for the cold spot area is set with "Base power × ( The output power of "1 + heating gradient / maximum gradient threshold" (the maximum gradient threshold is the highest heating rate allowed by the process, such as 1℃ / h, to ensure that the power matches the gradient) is used to form a heating sub-instruction of "[Segment 1: target temperature 20.5℃, cold point heating power 300W (base 250W); Segment 2: target temperature 21℃, cold point heating power 325W]". Then, with the temperature fluctuation tolerance value as the core threshold, the control range of "target fermentation temperature ± temperature fluctuation tolerance value" is set (for example, when the target temperature is 30℃ and the temperature fluctuation tolerance value is 0.5℃, the control range is 29.5-30.5℃). When the temperature of a certain area exceeds the upper limit of the control range (for example, 30℃), the control range will be set.At 6℃, the heat dissipation power is calculated as follows: Heat dissipation power = (current temperature - upper limit of control range) / temperature fluctuation tolerance × rated heat dissipation power. A cooling command is generated based on this power. When the temperature in a certain area falls below the lower limit of the control range, the supplementary heating power is calculated as follows: Supplementary heating power = (lower limit of control range - current temperature) / temperature fluctuation tolerance × rated supplementary heating power. A supplementary heating command is generated based on this power. The combined cooling and supplementary heating commands form a constant temperature sub-command. Further, the heating sub-commands are sorted by time period, and the constant temperature sub-commands are categorized by trigger conditions, integrating them into temperature control commands for the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle.

[0037] In step S5, when the abnormal confidence level exceeds the set threshold, the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar is remotely controlled to execute the temperature control command. During the execution of the command, the temperature gradient distribution inside the chopped pepper fermentation jar is continuously monitored, and the distribution ratio of heating power and cooling power of the semiconductor temperature control module is adjusted according to the temperature gradient distribution.

[0038] It should be noted that the threshold mentioned in this application can be determined in the following way: collect historical data of at least 30 complete fermentation cycles of chopped chili peppers, filter out the "real temperature abnormality cases" (such as abnormal confidence data corresponding to fermentation failure and abnormal flavor) and "normal fluctuation cases" (confidence data corresponding to successful fermentation and no temperature abnormality) that have been manually confirmed, form abnormal datasets and normal datasets respectively, calculate the minimum value of the abnormal dataset and the maximum value of the normal dataset, and set the average of the maximum and minimum values ​​as the threshold.

[0039] In specific implementation, when the abnormal confidence level exceeds the set threshold, the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar can execute the temperature control command in the following way: when the abnormal confidence level exceeds the set threshold, the remote monitoring platform sends the temperature control command to the control terminal of the chopped pepper fermentation jar via industrial Ethernet after encryption and packaging. After receiving the command, the control terminal parses the power distribution of the heating stage and the threshold triggering conditions of the constant temperature stage, and converts them into pulse width modulation signal parameters that can be recognized by the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar. Then, the heating element and the cooling element are controlled to work through the internal bridge circuit.

[0040] It should be noted that the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar described in this application is a temperature regulation device installed on the outer wall of the chopped pepper fermentation jar and based on semiconductor temperature control technology (such as the Peltier effect). It can receive temperature control commands issued by a remote monitoring platform and adjust the distribution of heating and cooling power through the coordinated work of the internal heating unit (such as graphene heating film) and cooling unit (such as Peltier element) to achieve precise temperature control of the chopped pepper fermentation jar, providing a stable temperature environment for the chopped pepper fermentation process.

[0041] In this embodiment, continuously monitoring the temperature gradient distribution inside the chopped chili fermentation jar during instruction execution can be achieved through the following steps: Real-time monitoring of the temperature calibration values ​​of each temperature sensor in the temperature sensor array; The rate of change of temperature gradient at different depths inside the chopped chili fermentation jar is determined based on the temperature calibration value and spatial location information of each temperature sensor. The temperature gradient distribution inside the fermentation jar was determined by the rate of change of temperature gradient at different depths inside the jar.

[0042] It should be noted that the temperature gradient distribution described in this application represents a characteristic distribution reflecting the heat accumulation state at different depths within the fermentation jar for chopped chili peppers.

[0043] In practice, firstly, a temperature sensor array is used to collect the temperature calibration values ​​of each temperature sensor in real time, and the spatial position information (such as depth coordinates and radial coordinates) of each temperature sensor within the fermentation tank is recorded simultaneously to ensure a one-to-one correspondence between data and position. Next, using the numerical differentiation method, with the depth of the fermentation tank as the dimension, the temperature calibration values ​​of temperature sensors at adjacent depths are selected. The temperature gradient change rate is calculated for different depth intervals using the formula "temperature gradient change rate = (difference between temperature calibration values ​​at adjacent depths) / distance between adjacent depths", thus quantifying the rate of temperature change in each depth interval. Finally, the temperature gradient change rates of all depth intervals are arranged in depth order, and combined with the spatial distribution of each temperature sensor, a correspondence between "depth and gradient change rate" is constructed. This correspondence is then used as the temperature gradient distribution inside the fermentation tank for chopped chili peppers.

[0044] In this embodiment, adjusting the distribution ratio of heating power and cooling power of the semiconductor temperature control module through the temperature gradient distribution can be achieved using the following steps: Based on the temperature gradient distribution, the areas of heat accumulation and heat loss inside the chopped chili fermentation jar were identified. The distribution ratio of the cooling power of the semiconductor temperature control module is determined by the temperature deviation of the heat accumulation area. The distribution ratio of the heating power of the semiconductor temperature control module is determined based on the temperature deviation of the heat-deficient area.

[0045] It should be noted that, in this application, the heat accumulation area refers to a spatial region inside the fermentation jar where the local heat energy density is higher than the surrounding area; the heat deficiency area refers to a spatial region inside the fermentation jar where the local heat energy density is lower than the surrounding area; the allocation ratio of the cooling power of the semiconductor temperature control module indicates the proportion of heat absorption undertaken by the semiconductor temperature control module during the cooling stage, in order to specifically reduce the temperature of the local overheated area, suppress the local temperature overshoot phenomenon, and thus maintain the stability and spatial uniformity of the temperature field inside the fermentation jar; the allocation ratio of the heating power of the semiconductor temperature control module indicates the proportion of heat compensation undertaken by the semiconductor temperature control module during the heating stage, in order to focus on heating the low-temperature area, improve the uniformity of temperature distribution and the spatial coupling efficiency of heat response.

[0046] In specific implementation, firstly, based on the temperature gradient distribution, the temperature calibration values ​​of different depth intervals are compared with the target fermentation temperature. Regions with a temperature gradient change rate higher than the target fermentation temperature and a positive value in the temperature gradient distribution are identified as heat accumulation regions, while regions with a temperature gradient change rate lower than the target fermentation temperature and a negative value in the temperature gradient distribution are identified as heat deficiency regions. Secondly, the temperature deviation of the heat accumulation region (i.e., the difference between the average temperature of the heat accumulation region and the target fermentation temperature) is calculated. Using a linear proportional method, the cooling power of the semiconductor temperature control module is calculated, i.e., "Cooling power allocation ratio = Temperature deviation / Preset maximum allowable deviation × 100%". Finally, the temperature deviation of the heat deficiency region is calculated similarly, and the allocation ratio is determined using the same linear proportional method, according to "Heating power allocation ratio = Temperature deviation / Preset maximum allowable deviation × 100%".

[0047] It should be noted that the maximum permissible deviation preset in this application can be determined in the following way: collect historical data of at least 20 successful fermentation cycles, count the maximum difference in temperature inside the jar from the target value in each cycle without affecting the fermentation quality, and take the average of these differences as the maximum permissible deviation.

[0048] Therefore, in this application, the distribution ratio of heating and cooling power of the semiconductor temperature control module can be adjusted through the temperature gradient distribution. Firstly, by deploying a temperature sensor array inside the chili fermentation jar, global and continuous temperature acquisition of the entire fermentation environment is achieved, effectively overcoming the limitations of traditional single-point temperature measurement methods. This allows for a comprehensive understanding of the complex temperature gradients and local fluctuations that may occur under high-acid, high-salt, and high-humidity environments, providing a reliable real-time data foundation for subsequent control. Secondly, by analyzing the fluctuation characteristics of temperature change data, the system can quantify the confidence level of temperature anomalies in the current fermentation cycle, enabling early identification of local temperature anomalies and ensuring that potential anomalies can be detected and intervened in a timely manner. Subsequently, the temperature values ​​of the temperature sensors are calibrated to ensure the accuracy and consistency of the temperature sensor data, reducing the interference of high-salt, high-acid, and high-humidity environments on measurement accuracy, making control decisions based on more reliable data, and further improving the stability and reliability of temperature control. Predictive capability; based on all temperature calibration values ​​and the fermentation process parameters of chopped chili peppers issued by the remote monitoring platform, intelligent temperature control commands are generated for the heating rate control segment and the constant temperature maintenance segment, achieving precise control of the internal temperature of the fermentation jar; when the anomaly confidence level exceeds the preset threshold, the semiconductor temperature control module on the outer wall of the chopped chili pepper fermentation jar can execute the temperature control command and continuously monitor the internal temperature gradient distribution during the command execution process. By dynamically adjusting the distribution ratio of heating power and cooling power, rapid compensation for local temperature anomalies is achieved, ensuring temperature uniformity; overall, this closed-loop control mode can effectively suppress local temperature fluctuations in high-acid, high-salt, and high-humidity fermentation environments, optimize the distribution of microbial activity, improve the uniformity and stability of the fermentation process, reduce manual intervention and operational risks, and improve the level of intelligent management, thereby achieving the technical objective of remotely and accurately controlling the internal temperature of the chopped chili pepper fermentation jar in complex fermentation environments, significantly improving the uniformity of temperature distribution and the stability of fermentation quality.

[0049] In summary, the technical solution adopted in this application can achieve remote and precise control of the internal temperature of the chopped chili fermentation jar in a high-acid, high-salt, and high-humidity fermentation environment, thereby improving the uniformity of temperature distribution inside the fermentation jar.

[0050] Example 2: This application provides a remote temperature control system for a chili fermentation jar based on supervised control, referring to... Figure 4 As shown in the figure, this is a module structure diagram of a remote temperature control system for a chopped chili fermentation jar based on supervised control, according to this embodiment of the present application. The remote temperature control system for the chopped chili fermentation jar includes: The data acquisition module 100 is used to collect temperature change data during the current fermentation cycle of chopped chili peppers through the temperature sensor array inside the fermentation jar. Anomaly confidence analysis module 200 is used to determine the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle based on the temperature fluctuation characteristics of the temperature change data. The temperature calibration module 300 is used to calibrate the temperature value of each temperature sensor by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped peppers, and to obtain the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped peppers. The instruction generation module 400 is used to generate temperature control instructions for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform. The power dynamic adjustment module 500 is used to remotely control the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar to execute the temperature control command when the abnormal confidence level exceeds the set threshold. During the execution of the command, the module continuously monitors the temperature gradient distribution inside the chopped pepper fermentation jar and adjusts the distribution ratio of heating power and cooling power of the semiconductor temperature control module based on the temperature gradient distribution.

[0051] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0052] Those skilled in the art will understand that all or part of the steps in the various methods of the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, including read-only memory (ROM), random access memory (RAM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), one-time programmable read-only memory (OTPROM), electrically-Erasable Programmable Read-Only Memory (EEPROM), compactdisc read-only memory (CD-ROM) or other optical disc storage, disk storage, magnetic tape storage, or any other computer-readable medium capable of carrying or storing data.

[0053] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

Claims

1. A method for remote temperature control of a fermentation jar for chopped chili peppers based on supervised control, characterized in that, The method for remotely controlling the temperature of the chopped chili fermentation jar includes the following steps: Temperature change data during the current chopped chili fermentation cycle is collected by an array of temperature sensors inside the chopped chili fermentation jar. The anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle is determined based on the temperature fluctuation characteristics of the temperature change data. The temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers, thus obtaining the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped chili peppers. Based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform, temperature control instructions are generated for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle. When the abnormal confidence level exceeds the set threshold, the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar is remotely controlled to execute the temperature control command. During the execution of the command, the temperature gradient distribution inside the chopped pepper fermentation jar is continuously monitored, and the distribution ratio of heating power and cooling power of the semiconductor temperature control module is adjusted according to the temperature gradient distribution.

2. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, Determining the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle based on the temperature fluctuation characteristics of the temperature change data specifically includes: Determine the temperature fluctuation characteristics of the temperature change data; Based on the temperature fluctuation characteristics, the abnormal temperature fluctuation characteristics of the chopped chili fermentation jar during the current chopped chili fermentation cycle are determined. The feature matching degree of the temperature anomaly pattern in the fermentation jar during the current fermentation cycle is determined by the abnormal temperature fluctuation characteristics of the fermentation jar during the current fermentation cycle. The confidence level of temperature anomalies in the fermentation jar during the current fermentation cycle is determined based on the characteristic matching degree of the temperature anomaly pattern in the fermentation jar during the current fermentation cycle.

3. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, The temperature value of each temperature sensor is calibrated by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped chili peppers. The specific calibration value of each temperature sensor during the current fermentation cycle of the chopped chili peppers includes: The temperature drift of the temperature sensor array during the current chopped chili fermentation cycle is determined based on the temperature reference value of each temperature sensor in the temperature sensor array at the beginning of the current chopped chili fermentation cycle. The temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers is determined based on the temperature drift and the temperature change trend of each temperature sensor within the current fermentation period of the chopped chili peppers. The temperature value of each temperature sensor is calibrated by using the temperature calibration coefficient of each temperature sensor within the current fermentation period of the chopped chili peppers, thus obtaining the temperature calibration value of each temperature sensor within the current fermentation period of the chopped chili peppers.

4. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, Based on all temperature calibration values ​​and the chopped chili fermentation process parameters issued by the remote monitoring platform, temperature control instructions are generated for the heating rate control segment and the constant temperature maintenance segment within the current chopped chili fermentation cycle. Specifically, these instructions include: Receive the fermentation process parameters for chopped chili peppers from the remote monitoring platform; Based on the spatial distribution characteristics of all temperature calibration values, cold and hot spot areas were identified within the chopped chili fermentation jar. The temperature gradient of the temperature rise rate control section within the current chopped pepper fermentation cycle is determined based on the cold spot region and the chopped pepper fermentation process parameters. The temperature fluctuation tolerance value of the constant temperature maintenance section within the current chopped pepper fermentation cycle is determined by the hot spot area and the chopped pepper fermentation process parameters. Based on the temperature gradient of the temperature rise rate control section and the temperature fluctuation tolerance value of the constant temperature maintenance section within the current chopped chili fermentation cycle, temperature control commands are generated for the temperature rise rate control section and the constant temperature maintenance section within the current chopped chili fermentation cycle.

5. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, Continuously monitoring the temperature gradient distribution inside the chili fermentation jar during command execution specifically includes: Real-time monitoring of the temperature calibration values ​​of each temperature sensor in the temperature sensor array; The rate of change of temperature gradient at different depths inside the chopped chili fermentation jar is determined based on the temperature calibration value and spatial location information of each temperature sensor. The temperature gradient distribution inside the fermentation jar was determined by the rate of change of temperature gradient at different depths inside the jar.

6. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, Adjusting the distribution ratio of heating and cooling power of the semiconductor temperature control module through the temperature gradient distribution specifically includes: Based on the temperature gradient distribution, the areas of heat accumulation and heat loss inside the chopped chili fermentation jar were identified. The distribution ratio of the cooling power of the semiconductor temperature control module is determined by the temperature deviation of the heat accumulation area. The distribution ratio of the heating power of the semiconductor temperature control module is determined based on the temperature deviation of the heat-deficient area.

7. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, The anomaly confidence level is an assessment index representing the degree of temperature anomaly in the chopped chili fermentation jar.

8. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, The temperature drift represents the degree of temperature deviation of the temperature sensor array during the current fermentation cycle of the chopped chili peppers.

9. The method for remote temperature control of a chopped chili fermentation jar based on supervised control as described in claim 1, characterized in that, The temperature gradient distribution represents the characteristic distribution reflecting the heat accumulation state at different depths within the fermentation jar for chopped chili peppers.

10. A supervised control-based remote temperature control system for a chopped chili fermentation jar, used to execute the supervised control-based remote temperature control method for a chopped chili fermentation jar as described in any one of claims 1 to 9, characterized in that, The remote temperature control system for the chopped chili fermentation jar includes: The data acquisition module is used to collect temperature change data during the current fermentation cycle of chopped peppers through the temperature sensor array inside the chopped pepper fermentation jar; An anomaly confidence analysis module is used to determine the anomaly confidence level of the temperature in the chopped chili fermentation jar during the current chopped chili fermentation cycle based on the temperature fluctuation characteristics of the temperature change data. The temperature calibration module is used to calibrate the temperature value of each temperature sensor by measuring the temperature drift of the temperature sensor array during the current fermentation cycle of the chopped peppers, and to obtain the temperature calibration value of each temperature sensor during the current fermentation cycle of the chopped peppers. The instruction generation module is used to generate temperature control instructions for the heating rate control segment and the constant temperature maintenance segment within the current chopped pepper fermentation cycle based on all temperature calibration values ​​and the chopped pepper fermentation process parameters issued by the remote monitoring platform. The power dynamic adjustment module is used to remotely control the semiconductor temperature control module on the outer wall of the chopped pepper fermentation jar to execute the temperature control command when the abnormal confidence level exceeds the set threshold. During the execution of the command, the module continuously monitors the temperature gradient distribution inside the chopped pepper fermentation jar and adjusts the distribution ratio of heating power and cooling power of the semiconductor temperature control module based on the temperature gradient distribution.

Images