CT hardening artifact correction method based on index and power function transformation
CN121370211APending Publication Date: 2026-01-23ZHONGBEI UNIV
Patent Information
- Application Number
- CN202511330882.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-17
- Publication Date
- 2026-01-23
AI Technical Summary
Technical Problem
Existing CT hardening artifact correction methods rely on specific X-ray sources and detector hardware, resulting in low computational efficiency and poor parameter adaptability, making it difficult to balance accuracy and universality.
Method used
By employing exponential and power function transformations, the calculation process is simplified by calculating multi-energy projection values and adjusting correction parameters, making it suitable for conventional CT systems.
Benefits of technology
It significantly improves image quality and quantitative analysis accuracy, reduces hardware costs, simplifies the calculation process, is applicable to conventional CT systems, and enhances the reliability of defect identification and component analysis.
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Smart Images
Figure CN121370211A_ABST
Abstract
The invention relates to the technical field of CT imaging, in particular to a CT hardening artifact correction method based on index and power function transformation. The method comprises the following steps: scanning under normal imaging tube voltage of an object to obtain an X-ray image, and calculating to generate a multi-energy projection; substituting the multi-energy projection into a core transformation formula, and outputting a corrected projection; and finally, reconstructing an image for the corrected projection by adopting a filtering back projection or an iterative algorithm, and weakening a hardening artifact of the reconstructed image. A titanium alloy coated steel sample verifies that a titanium alloy area in a conventional reconstructed image is significant in gray difference, hardening artifacts are weakened after correction, a gray curve is more uniform, and the quantitative analysis accuracy of materials is improved. The problem of hardening artifacts caused by multi-energy-spectrum X-rays is solved through index and power function transformation, the traditional multi-step correction process is simplified, the number of traditional correction model parameters is reduced, and the method is suitable for industrial CT detection scenes.
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Citation Information
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