Polycrystalline diamond defect detection and repair equipment and intelligent repair method

Abstract

The invention discloses polycrystalline diamond defect detection and repair equipment and an intelligent repair method. The method comprises the following steps: preprocessing a to-be-processed area of a to-be-detected product, performing excitation scanning, obtaining distribution data of an internal fluorescence signal, and generating a fluorescence signal distribution diagram; carrying out image analysis on the fluorescence signal distribution diagram, identifying and positioning an abnormal fluorescence signal region in the fluorescence signal distribution diagram, constructing a three-dimensional coordinate model according to the abnormal fluorescence signal region, and processing by adopting ultra-short pulse laser processing equipment to form a repair channel; providing a repair alloy, and filling the repair alloy into the repair channel through a directional infiltration technology to realize metallurgical bonding repair of the internal defect area; an optical traceable signal detection mechanism is introduced into a polycrystalline diamond material, and an ultrashort pulse laser micro-channel processing and directional infiltration repairing process is combined, so that positioning and in-situ repairing of internal defects are realized, and the overall mechanical property of the material is effectively recovered; therefore, the service life of the product is obviously prolonged, and the machining reliability is improved.

Description

Technical Field

[0001] This invention relates to the field of detection technology, and in particular to a defect detection and repair device and intelligent repair method for polycrystalline diamond. Background Technology

[0002] Polycrystalline diamond (PCD), due to its extremely high hardness, excellent wear resistance, and good thermal conductivity, has become the material of choice for high-end cutting tools, oil drilling, precision forming, and wear-resistant parts. In the field of CNC precision machining, PCD end mills and tool tips are widely used for high-speed, high-precision cutting of non-ferrous metals (such as aluminum alloys and copper alloys) and composite materials, requiring tools to maintain extremely high dimensional stability and surface quality under harsh working conditions. With the increasing demands for machining efficiency and part accuracy in aerospace, new energy, and precision manufacturing, the reliability, lifespan, and one-time setup completion rate of PCD tools have become key indicators directly affecting manufacturing costs and yield.

[0003] Currently, common methods for quality control and repair of PCD (Polymer Capacitor Defect) include ultrasonic microscopy, industrial CT scanning for defect detection, and laser surface remelting, micro-area welding, brazing, or surface chemical deposition (such as CVD) for damage repair. These detection methods each have advantages in identifying macroscopic or subsurface defects, but generally involve trade-offs in resolution, speed, or cost: ultrasound struggles to reliably identify micron-sized pores or stress field anomalies; while industrial CT provides high-resolution tomographic information, the equipment is expensive and online rapid detection is difficult. Repair techniques mostly focus on surface treatment, restoring surface morphology through laser remelting or external filling. However, these high-temperature or surface-guided repair methods cannot effectively fill or eliminate deep micron-sized voids and binder-rich areas, and are prone to causing PCD graphitization, thermal damage, or insufficient metallurgical bonding with the matrix, resulting in the inability to restore the mechanical properties of the repaired area.

[0004] Therefore, it is necessary to improve the existing technology to solve the technical problem that the service life of PCD tools is still relatively short after repair. Summary of the Invention

[0005] The purpose of this invention is to provide a polycrystalline diamond defect detection and repair device and an intelligent repair method to solve the above-mentioned technical problems.

[0006] To achieve this objective, the present invention adopts the following technical solution: A method for defect detection and intelligent repair in polycrystalline diamond includes the following steps: S1, preprocess the area to be processed of the sample, and use an optical scanning device to excite and scan the area to be processed to obtain the distribution data of the internal fluorescence signal and generate a fluorescence signal distribution map; S2, perform image analysis on the fluorescence signal distribution map, identify and locate abnormal fluorescence signal regions, and construct a three-dimensional coordinate model of internal micro-defects accordingly. S3. Based on the defect location determined by the three-dimensional coordinate model, an ultra-short pulse laser processing device is used to process from the product surface to the internal defect area to form a repair channel; S4 provides a high thermal conductivity repair alloy. Through directional melting and infiltration technology, the repair alloy is filled into the repair channel to achieve metallurgical bonding repair of internal defect areas.

[0007] Optionally, the test sample is a polycrystalline diamond tool tip with a built-in nano-fluorescent tracer and a functionally graded binder phase structure.

[0008] Optionally, the nano-fluorescent tracer is uniformly added nano-Al2O3:Cr 3+ The functionally graded binder phase structure has a cobalt content that gradually decreases from 10% to 5% from the core to the surface of the product, which provides a guiding channel for the melting and infiltration of the repair material.

[0009] Optionally, step S1 specifically includes: S11, the sample to be tested is fixed on the positioning platform and ultrasonically cleaned with an organic solvent to remove contaminants adsorbed on the surface; S12, using diamond spray polishing cloth to mechanically polish the area to be processed of the test sample after cleaning to form a smooth surface; S13, start the laser scanning microscope, set the excitation source wavelength to 650nm, and adjust the laser power and detector gain parameters according to the material characteristics of the sample under test; S14, control the positioning platform to move along a preset path, so that the laser beam scans the flat surface point by point, and simultaneously collects the intensity value of the 694nm band fluorescence signal generated by the nano fluorescent tracer; S15, the collected fluorescence signal intensity values ​​are correlated with spatial coordinates to generate a fluorescence signal distribution map with a preset spatial resolution, which is a two-dimensional fluorescence signal intensity distribution.

[0010] Optionally, step S3 specifically includes: S31, import the three-dimensional coordinate model, and calculate the optimal laser processing path from the surface of the test object to each defect based on the spatial location information of the defects; S32, Based on the optimal laser processing path and the material properties of the test sample, set the processing parameters of the laser, including pulse energy, repetition frequency and scanning speed; S33, control the laser beam to perform drilling along the calculated optimal path, forming a micro-repair channel with an entrance diameter smaller than a preset first size on the surface of the test sample, and the micro-repair channel reaches the internal defect area. S34 uses a combination of high-pressure inert gas blowing and low-frequency ultrasonic vibration to clean the inner wall of the repair channel formed during processing, removing processing residues from the channel.

[0011] Optionally, the repair alloy is a low-melting-point, high-thermal-conductivity Sn-Ag-Ti nanocomposite alloy powder, which is mixed and stirred with an organic carrier to prepare a paste-like repair alloy with a preset viscosity.

[0012] Optionally, step S4 specifically includes: S41, a repair alloy is provided, and the repair alloy is applied to the area around the entrance of the repair channel that has been processed on the surface of the test sample through a dispensing system to form a local repair alloy coating. S42, a low-power quasi-continuous laser beam is used to scan and irradiate the local repair alloy coating, causing it to melt into a liquid state and wet the entrance of the repair channel; S43 utilizes the local thermal field generated by the laser beam and the capillary force generated by the functionally graded binder phase structure to drive the molten repair alloy to flow and fill the internal defect area along the repair channel, thereby filling the repair alloy into the repair channel.

[0013] Optionally, step S43 may be followed by: S44, maintaining laser energy to keep the repair alloy in a molten state in the defect area, achieves metallurgical bonding through the interfacial reaction of Ti element with diamond and cobalt phases; S45, the laser beam is removed to allow the repair alloy to cool and solidify naturally, completing the overall repair structure formation from internal defects to surface channels.

[0014] Optionally, step S4 may be followed by: S5, The surface of the repaired polycrystalline diamond is finely finished to obtain a polycrystalline diamond with a preset surface roughness; S6. Non-destructive testing equipment was used to verify the performance of the repaired area to confirm that its mechanical properties had been restored to be consistent with those of the substrate.

[0015] This invention also provides a polycrystalline diamond defect detection and repair device for implementing the polycrystalline diamond defect detection and intelligent repair method described above. The detection and repair device includes at least: The positioning and clamping module is used to fix the test object and achieve positioning. An optical scanning detection module includes an excitation light source with a preset wavelength and a fluorescence signal collector, used to acquire data on the distribution of fluorescence signals inside the sample under test; The laser processing module is used to process and form repair channels at designated locations based on the 3D model. The repair module includes a repair alloy supply mechanism and a laser cladding mechanism, which are used to fill the repair alloy into the repair channel and achieve metallurgical bonding. The central control module includes an image processing unit for processing fluorescence signal data, identifying abnormal areas, and constructing a three-dimensional coordinate model of the defect.

[0016] Compared with existing technologies, this invention has the following advantages: First, the area to be processed of the test sample is pre-processed, and the area is excited and scanned using an optical scanning device to obtain the distribution data of the internal fluorescence signal and generate a fluorescence distribution map; then, the fluorescence distribution map is analyzed to identify and locate abnormal fluorescence signal areas, thereby constructing a three-dimensional coordinate model of the internal micro-defects; based on this, according to the defect location determined by the three-dimensional coordinate model, an ultra-short pulse laser processing device is used to process from the product surface to the defect area to form a repair channel; finally, a high thermal conductivity repair alloy is provided, and it is filled into the repair channel through directional melting infiltration technology, thereby achieving metallurgical bonding repair of the internal defect area; this method, by introducing an optically traceable signal detection mechanism into polycrystalline diamond material and combining ultra-short pulse laser microchannel processing and directional melting infiltration repair technology, realizes the positioning and in-situ repair of internal defects, which not only avoids the shortcomings of traditional methods in surface-limited repair, but also effectively restores the overall mechanical properties of the material through metallurgical bonding, thereby significantly extending the product service life and improving processing reliability. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] The structures, proportions, sizes, etc., shown in the accompanying drawings of this specification are only for the purpose of assisting those skilled in the art in understanding and reading the content disclosed in the specification, and are not intended to limit the conditions under which the present invention can be implemented. Therefore, they have no substantial technical significance. Any modifications to the structure, changes in the proportions, or adjustments to the size, without affecting the effects and objectives that the present invention can produce, should still fall within the scope of the technical content disclosed in the present invention.

[0019] Figure 1 This is one of the flowcharts illustrating the polycrystalline diamond defect detection and intelligent repair method in this embodiment. Figure 2This is the second flowchart illustrating the polycrystalline diamond defect detection and intelligent repair method of this embodiment. Figure 3 This is the third flowchart illustrating the polycrystalline diamond defect detection and intelligent repair method of this embodiment. Detailed Implementation

[0020] To make the objectives, features, and advantages of this invention more apparent and understandable, the technical solutions of the embodiments of this invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the embodiments described below are only some embodiments of this invention, and not all embodiments. Based on the embodiments of this invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this invention.

[0021] In the description of this invention, it should be understood that the terms "upper," "lower," "top," "bottom," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. It should be noted that when a component is considered to be "connected" to another component, it can be directly connected to the other component or there may be a component positioned centrally in the connection.

[0022] The technical solution of the present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0023] Example 1: Combination Figures 1 to 3 As shown, this embodiment of the invention provides a method for defect detection and intelligent repair of polycrystalline diamond, including the following steps: S1. The area to be processed of the sample is preprocessed, and an optical scanning device is used to excite and scan the area to be processed to obtain the distribution data of the internal fluorescence signal and generate a fluorescence signal distribution map.

[0024] First, the surface of the polycrystalline diamond area to be treated is cleaned and finely polished to remove contaminants and irregular microparticles, thereby ensuring the stability and accuracy of subsequent detection signals. Then, an optical scanning device is used to excite and scan the area, using a laser of a specific wavelength to excite the tracer components contained in the material, acquiring the distribution data of its internal fluorescence signals, and generating a fluorescence signal distribution map, providing basic image information for subsequent defect identification.

[0025] S2. Perform image analysis on the fluorescence signal distribution map to identify and locate abnormal fluorescence signal regions, and construct a three-dimensional coordinate model of internal micro-defects accordingly.

[0026] By comparing the differences between normal and abnormal fluorescent areas using image recognition algorithms, potential micron-level defects can be identified. Combining this with tomographic data, the three-dimensional coordinates of the defects are further precisely located, and a complete three-dimensional model of the internal defects is constructed, providing path planning for subsequent laser channel processing.

[0027] S3. Based on the defect location determined by the three-dimensional coordinate model, an ultra-short pulse laser processing device is used to process from the product surface to the internal defect area to form a repair channel.

[0028] Based on the three-dimensional coordinate model of the defect obtained in step S2, the ultrashort pulse laser equipment is controlled to process the target defect area from the product surface along a planned path. The ultrashort pulse laser has a very small heat-affected zone, enabling the formation of a repair channel with a controllable diameter while ensuring that the surrounding PCD substrate is not thermally damaged. This channel extends to the target defect area, providing a low-damage guiding path for the subsequent introduction of repair materials.

[0029] S4 provides a high thermal conductivity repair alloy. Through directional melting and infiltration technology, the repair alloy is filled into the repair channel to achieve metallurgical bonding repair of internal defect areas.

[0030] A specially formulated high thermal conductivity repair alloy is coated at the entrance of the repair channel, and then melted upon heating using directional infiltration technology. Relying on capillary action and the gradient characteristics of the material structure, the molten repair alloy actively penetrates into the repair channel and fills the defect cavity. After the infiltration process is complete, the repair alloy achieves metallurgical bonding with the diamond matrix and binder phase within the defect area, effectively eliminating the defect and restoring the structural integrity of the local material.

[0031] S5, perform finishing treatment on the repaired polycrystalline diamond surface to obtain polycrystalline diamond with a preset surface roughness.

[0032] After defect repair, residual protrusions or alloy deposits may remain at the entrance of the repair channel. Precision grinding or polishing is used to finish the repaired area, restoring the tool surface to a surface finish consistent with the original substrate, achieving the preset surface roughness requirements, thereby ensuring that the cutting performance of the tool tip or working surface is not affected.

[0033] S6. Non-destructive testing equipment was used to verify the performance of the repaired area to confirm that its mechanical properties had been restored to be consistent with those of the substrate.

[0034] Repeated fluorescence scanning confirms that no abnormal signals appear in the repaired area. Simultaneously, mechanical property tests (such as microhardness or nanoindentation) are performed on the repaired point and its surrounding area to ensure that the hardness and toughness of the repaired area have been restored to match the substrate. Once verified as satisfactory, the repaired polycrystalline diamond tool can be put into normal use.

[0035] The working principle of this invention is as follows: First, the area to be processed of the test sample is pre-processed, and the area is excited and scanned using an optical scanning device to obtain the distribution data of the internal fluorescence signal and generate a fluorescence distribution map. Then, the fluorescence distribution map is analyzed to identify and locate abnormal fluorescence signal areas, thereby constructing a three-dimensional coordinate model of the internal micro-defects. Based on this, according to the defect location determined by the three-dimensional coordinate model, an ultra-short pulse laser processing device is used to process from the product surface to the defect area to form a repair channel. Finally, a high thermal conductivity repair alloy is provided and filled into the repair channel through directional melting and infiltration technology, thereby achieving metallurgical bonding repair of the internal defect area. This method, by introducing an optically traceable signal detection mechanism into polycrystalline diamond material and combining ultra-short pulse laser microchannel processing and directional melting and infiltration repair technology, realizes the positioning and in-situ repair of internal defects. It not only avoids the shortcomings of traditional methods in surface-limited repair, but also effectively restores the overall mechanical properties of the material through metallurgical bonding, thereby significantly extending the product's service life and improving processing reliability.

[0036] In this embodiment, the test sample is a polycrystalline diamond tool tip with a built-in nano-fluorescent tracer and a functionally graded binder phase structure.

[0037] In this embodiment, the nano-fluorescent tracer is uniformly added nano-Al2O3:Cr 3+ The functionally graded binder structure is a distribution of cobalt content that gradually decreases from 10% to 5% from the core to the surface of the product, which provides a guiding channel for the melting and infiltration of the repair material.

[0038] It should be noted that Al2O3:Cr 3+ As a nano-fluorescent tracer, this material emits a stable and strong fluorescence signal when excited by laser of a specific wavelength. The fluorescence intensity can clearly indicate differences in internal stress states and the presence of structural defects. By introducing this tracer into tool materials, high-contrast detection of micron-level internal defects can be achieved during optical scanning.

[0039] The polycrystalline diamond tool tip employs a functionally graded binder phase design, where the cobalt content gradually decreases from 10% in the core region to 5% in the surface region. This gradient distribution maintains high toughness and sintering density in the core region while increasing the diamond content in the surface region to enhance hardness and wear resistance. More importantly, this gradient structure provides a natural guiding channel for the directional infiltration of the repair material during subsequent repair processes, allowing the repair alloy to enter the defect area with lower resistance and higher filling efficiency.

[0040] In this embodiment, step S1 specifically includes: S11. Fix the test sample on the positioning platform and use an organic solvent to perform ultrasonic cleaning to remove contaminants adsorbed on the surface. Using an organic solvent for ultrasonic cleaning can effectively remove oil, dust or other contaminants adhering to the surface of the tool, ensuring surface cleanliness.

[0041] S12 uses a diamond spray polishing cloth to mechanically polish the area to be processed on the cleaned sample to form a smooth surface. Surface smoothness plays an important role in the stability of laser scanning and the uniform acquisition of fluorescence signals. It can reduce scattering and noise caused by surface roughness, thereby improving the clarity and resolution of subsequent scanned images.

[0042] S13, start the laser scanning microscope, set the excitation light source wavelength to 650nm, and adjust the laser power and detector gain parameters according to the material characteristics of the sample. Appropriately adjusting the laser power and detector gain parameters according to the material characteristics of the sample can ensure that the fluorescence signal is within a reasonable range and avoid excessive weakness or oversaturation, thereby obtaining a stable and reliable optical detection signal.

[0043] S14, control the positioning platform to move along the preset path, so that the laser beam scans the flat surface point by point, and simultaneously collects the intensity value of the 694nm band fluorescence signal generated by the nano fluorescent tracer, ensuring that the fluorescence signal corresponds one-to-one with the spatial coordinates during the scanning process, thereby obtaining the original data containing defect information.

[0044] S15, the collected fluorescence signal intensity values ​​are correlated with spatial coordinates to generate a fluorescence signal distribution map with a preset spatial resolution, which is a two-dimensional fluorescence signal intensity distribution.

[0045] In this embodiment, step S3 specifically includes: S31 imports a three-dimensional coordinate model and calculates the optimal laser processing path from the surface of the test object to each defect based on the spatial location information of the defect. This avoids unnecessary damage to non-defect areas, shortens the processing path length, and improves processing efficiency, thereby ensuring that the micro-channel can reach the target defect area with minimal impact.

[0046] S32, based on the optimal laser processing path and the material characteristics of the test sample, sets the laser processing parameters, including pulse energy, repetition frequency, and scanning speed; through a reasonable combination of parameters, the heat-affected zone during laser action can be effectively controlled, avoiding ablation or graphitization of the material surface, thereby ensuring the precision and integrity of the channel processing.

[0047] S33 controls the laser beam to perform drilling along the calculated optimal path, forming a micro-repair channel with an entrance diameter smaller than the preset first size on the surface of the test object. The micro-repair channel directly reaches the internal defect area. This channel directly connects to the internal defect area, ensuring that the channel has sufficient guiding capacity while minimizing the amount of substrate removed, which helps maintain the overall strength and surface integrity of the tool.

[0048] S34 uses a combination of high-pressure inert gas blowing and low-frequency ultrasonic vibration to clean the inner wall of the repair channel formed during processing, removing processing residues and ensuring the cleanliness and unobstructed flow of the inner wall.

[0049] In this embodiment, the repair alloy is a low-melting-point, high-thermal-conductivity Sn-Ag-Ti nanocomposite alloy powder, which is mixed and stirred with an organic carrier to prepare a paste-like repair alloy with a preset viscosity.

[0050] It should be noted that the composite gold can melt rapidly under laser or heating action and penetrate and fill internal defect areas under the guidance of capillary action and gradient bonding phase structure. The Ti element in the alloy can react with carbon atoms on the diamond surface to form carbides, thereby enhancing the metallurgical bonding between the repair alloy and the matrix.

[0051] In this embodiment, step S4 specifically includes: S41 provides a repair alloy, which is applied to the area around the entrance of the repair channel on the surface of the test sample through a dispensing system to form a local repair alloy coating. This ensures that the repair alloy fully covers the entrance of the channel, allowing it to melt smoothly and enter the channel during subsequent heating, thereby creating stable starting conditions for the directional flow of the repair material.

[0052] S42 employs a low-power quasi-continuous laser beam to scan and irradiate the local repair alloy coating, melting it into a liquid state and wetting the entrance of the repair channel. Scanning and irradiating the local repair alloy coating with a low-power quasi-continuous laser beam heats the alloy to a molten state and forms a wetting layer on the surface, which can significantly reduce the interfacial energy between the repair alloy and the channel entrance, thereby improving the spreadability of the molten alloy on the channel wall and ensuring that it can smoothly penetrate into the repair channel.

[0053] S43 utilizes the local thermal field generated by the laser beam and the capillary force generated by the functionally graded binder phase structure to drive the molten repair alloy to flow and fill the internal defect area along the repair channel, thereby filling the repair alloy into the repair channel.

[0054] By utilizing the localized thermal field generated by the laser beam, combined with the capillary forces provided by the functionally graded binder structure, the molten repair alloy is driven to flow directionally along the repair channel into the internal defect region and gradually fill it. This process effectively guides the alloy material deep into the defect site, achieving full filling of the internal defects and avoiding the formation of voids or uneven filling.

[0055] S44, maintaining laser energy to keep the repair alloy in a molten state in the defect area, achieves metallurgical bonding through the interfacial reaction of Ti element with diamond and cobalt phases; this interfacial reaction not only improves the metallurgical bonding strength between the repair alloy and the matrix, but also enhances the overall consistency between the repair area and the surrounding materials.

[0056] S45, the laser beam is removed, allowing the repair alloy to cool and solidify naturally, completing the formation of an overall repair structure from internal defects to surface channels. This ensures the continuity and density between the internal and external channels of the repair area, thereby effectively restoring the structural integrity and mechanical properties of the defective area.

[0057] Example 2: This invention also provides a polycrystalline diamond defect detection and repair device for implementing the polycrystalline diamond defect detection and intelligent repair method as described in Example 1. The detection and repair device includes at least: The positioning and clamping module is used to fix the test object and achieve positioning. An optical scanning detection module includes an excitation light source with a preset wavelength and a fluorescence signal collector, used to acquire data on the distribution of fluorescence signals inside the sample under test; The laser processing module is used to process and form repair channels at designated locations based on the 3D model. The repair module includes a repair alloy supply mechanism and a laser cladding mechanism, which are used to fill the repair alloy into the repair channel and achieve metallurgical bonding. The central control module includes an image processing unit for processing fluorescence signal data, identifying abnormal areas, and constructing a three-dimensional coordinate model of the defect.

[0058] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for detecting and intelligently repairing polycrystalline diamond defects, comprising: The method comprises the following steps: S1, pre-treating a to-be-treated area of a to-be-tested product, and using an optical scanning device to perform excitation scanning on the to-be-treated area to obtain distribution data of internal fluorescence signals and generate a fluorescence signal distribution map; S2, performing image analysis on the fluorescence signal distribution map, identifying and locating an abnormal fluorescence signal area therein, and constructing a three-dimensional coordinate model of internal micro-defects accordingly; S3, according to a defect position determined by the three-dimensional coordinate model, using an ultra-short pulse laser processing device to process a repair channel from a product surface to the internal defect area; S4, providing a high-thermal-conductivity repair alloy, and filling the repair alloy into the repair channel by a directional infiltration technology to realize metallurgical bonding repair of the internal defect area.

2. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The to-be-tested product is a polycrystalline diamond cutter tip with a functional gradient adhesive phase structure and embedded with a nano-fluorescent tracer.

3. The polycrystalline diamond defect detection and intelligent repair method of claim 2, wherein, The nano fluorescent tracer is uniformly added nano Al2O3:Cr 3+ The functional gradient binder phase structure is a distribution form in which the cobalt content is graded from 10% to 5% from the core to the surface of the product, which provides a guide channel for the infiltration of the repair material.

4. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The step S1 specifically comprises: S11, fixing the to-be-tested product on a positioning platform, and using an organic solvent to perform ultrasonic cleaning on the to-be-tested product to remove surface-adsorbed contaminants; S12, using a diamond spray polishing cloth to mechanically polish the to-be-treated area of the cleaned to-be-tested product to form a smooth surface; S13, starting a laser scanning microscope, setting a wavelength of an excitation light source to 650 nm, and adjusting laser power and detector gain parameters according to material characteristics of the to-be-tested product; S14, controlling the positioning platform to move along a preset path, so that a laser beam performs point-by-point scanning on the smooth surface, and fluorescence signal intensity values of a 694 nm waveband generated by the nano-fluorescent tracer are synchronously collected; S15, performing correlation operation on the collected fluorescence signal intensity values and spatial coordinates to generate a fluorescence signal distribution map with a preset spatial resolution of fluorescence signal intensity distribution.

5. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The step S3 specifically comprises: S31, importing the three-dimensional coordinate model, and calculating an optimal laser processing path from the surface of the to-be-tested product to each defect according to spatial position information of the defects; S32, setting processing parameters of a laser according to the optimal laser processing path and material characteristics of the to-be-tested product, the processing parameters including pulse energy, repetition frequency and scanning speed; S33, controlling a laser beam to perform drilling processing along the calculated optimal path to form a micro-repair channel with an entrance diameter less than a preset first size on the surface of the to-be-tested product, and the micro-repair channel directly reaches the internal defect area; S34, using a combination of high-pressure inert gas blowing and low-frequency ultrasonic vibration to clean the inner wall of the processed repair channel to remove processing residues in the channel.

6. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The repair alloy is a Sn-Ag-Ti nano-composite alloy powder with low melting point and high thermal conductivity, which is mixed and stirred with an organic carrier to prepare a paste-shaped repair alloy with a preset viscosity.

7. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The step S4 specifically comprises: S41, providing a repair alloy, coating the repair alloy on a surrounding area of an entrance of a processed repair channel on the surface of the to-be-tested product by a dispensing system to form a local repair alloy coating; S42, using a low-power quasi-continuous laser beam to scan and irradiate the local repair alloy coating to melt the local repair alloy coating into a liquid state and wet the entrance of the repair channel; S43, using the local thermal field generated by the laser beam and the capillary force generated by the functional gradient bonding phase structure to drive the molten repair alloy to flow and fill the internal defect area along the repair channel, so as to fill the repair alloy into the repair channel.

8. The polycrystalline diamond defect detection and intelligent repair method of claim 7, wherein, The step S43 further includes: S44, maintaining the laser energy to maintain the molten state of the repair alloy in the defect area for a preset period of time, and realizing metallurgical bonding through the interface reaction of Ti element with diamond and cobalt phase; S45, moving away the laser beam to naturally cool and solidify the repair alloy, and completing the formation of the overall repair structure from the internal defect to the surface channel.

9. The polycrystalline diamond defect detection and intelligent repair method of claim 1, wherein, The step S4 further includes: S5, finishing the repaired polycrystalline diamond surface to obtain a polycrystalline diamond with a preset surface roughness; S6, using a non-destructive testing device to verify the performance of the repaired area, and confirming that the mechanical properties are restored to be consistent with the matrix.

10. A polycrystalline diamond defect detection and repair apparatus, characterised in that, The detection and repair device for realizing the polycrystalline diamond defect detection and intelligent repair method according to any one of claims 1 to 9, at least includes: A positioning and clamping module for fixing the to-be-tested product and realizing positioning; An optical scanning detection module including an excitation light source with a preset wavelength and a fluorescence signal collector for acquiring fluorescence signal distribution data inside the to-be-tested product; A laser processing module for processing and forming a repair channel at a specified position according to a three-dimensional model; A repair module including a repair alloy supply mechanism and a laser cladding mechanism for filling the repair alloy into the repair channel and realizing metallurgical bonding; A central control module including an image processing unit for processing fluorescence signal data, identifying abnormal areas and constructing a three-dimensional coordinate model of defects.

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