Methods, apparatus, migration methods, equipment and media for establishing anisotropic parameter fields

By calculating the thickness factor of well points and correcting the target logging layers, the problem of large differences in parameter fields in traditional methods is solved, enabling the establishment of more accurate anisotropic parameter fields and improving the analytical accuracy of seismic exploration.

CN122085336APending Publication Date: 2026-05-26CHINA NAT PETROLEUM CORP +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
CHINA NAT PETROLEUM CORP
Filing Date
2024-11-25
Publication Date
2026-05-26

AI Technical Summary

Technical Problem

Traditional methods for establishing anisotropic parameter fields often yield anisotropic parameters that differ significantly from the actual anisotropic parameter fields in the subsurface, making it difficult to analyze subsurface conditions.

Method used

By calculating the thickness factor of the well point at the target logging layer based on the logging layer information and seismic interpretation layer information of each well point, and correcting the target logging layer based on the thickness factor, an anisotropic parameter field is established.

Benefits of technology

This reduces the difference between the established anisotropic parameter field and the actual anisotropic parameter field of the underground medium, avoids anisotropic parameter distortion, and makes the established parameter field closer to the actual situation.

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Abstract

This invention relates to a method, apparatus, migration method, device, and medium for establishing an anisotropic parameter field. The method includes: obtaining the thickness of the target logging layer at each well point based on well logging layer information; obtaining the thickness of the target seismic interpretation layer corresponding to the well point based on seismic interpretation layer information; calculating the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer; and correcting the target logging layer based on the thickness factor of each well point and the thickness of the target seismic interpretation layer to obtain the corrected target logging layer, thereby establishing an anisotropic parameter field. In this embodiment, by constraining the logging layers between well points under the lateral trend of the seismic interpretation layer, the difference between the established anisotropic parameter field and the anisotropic parameter field of the actual subsurface medium is reduced.
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Description

Technical Field

[0001] This invention relates to the field of seismic exploration, and in particular to a method, apparatus, migration method, equipment and medium for establishing anisotropic parameter fields. Background Technology

[0002] Seismic exploration technology is one of the most important means for humans to understand underground conditions. Seismic exploration can be used not only for oil and natural gas exploration, but also for solving problems in coal mines, rock salt, and other engineering geological fields. Seismic exploration is a geophysical exploration method that utilizes the elastic differences of underground rocks to identify underground geological structures and distributions by artificially generating seismic waves.

[0003] Anisotropy parameters have a wide range of applications in seismic exploration, covering aspects such as seismic wave propagation velocity analysis, underground fracture analysis and stress field analysis, seismic wave migration imaging, and earthquake hazard prediction. Anisotropy refers to the phenomenon that the physical properties of seismic waves, such as velocity and polarization direction, change with the direction of propagation during their propagation.

[0004] As the precision of seismic exploration continues to improve, the subsurface media encountered in seismic exploration are becoming increasingly complex, which poses new challenges to the establishment of anisotropic parameter fields.

[0005] Traditional methods for establishing anisotropic parameter fields often yield anisotropic parameters that differ significantly from the actual anisotropic parameter fields in the subsurface, making it difficult to analyze subsurface conditions. Summary of the Invention

[0006] In view of this, the present invention proposes a method, apparatus, migration method, equipment and medium for establishing anisotropic parameter fields, which solves the problem that there is a large difference between the anisotropic parameter fields established by traditional methods and the anisotropic parameter fields of the actual underground media.

[0007] On one hand, embodiments of the present invention provide a method for establishing an anisotropic parameter field, the method comprising: Based on the logging layer information of each well point, the thickness of the target logging layer at the well point is obtained, and based on the seismic interpretation layer information, the thickness of the target seismic interpretation layer corresponding to the well point is obtained. Calculate the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer. The target logging horizon is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation horizon to obtain the corrected target logging horizon. An anisotropic parameter field is established based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer.

[0008] In some implementations, the thickness factor includes thickness error; Based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer, calculate the thickness factor of the well point at the target logging layer, including: The thickness error of the well point at the target logging layer is calculated based on the difference between the thickness of the target seismic interpretation layer and the thickness of the target logging layer.

[0009] In some implementations, the target logging horizon is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation horizon to obtain the corrected target logging horizon, including: The thickness error is interpolated to obtain the interpolated thickness error; The corrected target logging layer is obtained by summing the interpolated thickness error with the thickness of the target seismic interpretation layer.

[0010] In some implementations, the thickness factor includes a thickness scaling factor; Based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer, calculate the thickness factor of the well point at the target logging layer, including: Calculate the thickness ratio coefficient of the well point at the target logging layer based on the ratio of the thickness of the target seismic interpretation layer to the thickness of the target logging layer.

[0011] In some implementations, the target logging horizon is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation horizon to obtain the corrected target logging horizon, including: Interpolate the thickness ratio coefficient to obtain the interpolated thickness ratio coefficient; The corrected target logging layer is obtained by using the ratio of the thickness of the target seismic interpretation layer to the interpolated thickness ratio coefficient.

[0012] In some implementations, the seismic interpretation horizon information includes the depth of each seismic interpretation horizon; Based on the seismic interpretation horizon information, the thickness of the target seismic interpretation horizon corresponding to the well point is obtained, including: The thickness of the target seismic interpretation layer is obtained based on the depth of the target seismic interpretation layer corresponding to the well point and the depth of the previous seismic interpretation layer adjacent to the target seismic interpretation layer.

[0013] In some implementations, the logging stratification information includes the depth of each logging layer; Based on the logging layer information of each well point, the thickness of the target logging layer at each well point is obtained, including: The thickness of the target logging layer is obtained based on the depth of the target logging layer and the depth of the previous logging layer adjacent to the target logging layer, wherein the depth of the previous seismic interpretation layer adjacent to the target seismic interpretation layer is the same as the depth of the previous logging layer adjacent to the target logging layer.

[0014] In some implementations, an anisotropic parameter field is established based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer, including: The thickness of the target seismic interpretation layer and the corrected thickness of the target logging layer are calculated based on the following formula to obtain the anisotropy parameters of the target logging layer, thereby establishing an anisotropy parameter field. , in, Indicates the anisotropy parameters of the target logging layer. Indicates the thickness of the target seismic interpretation layer. This indicates the thickness of the target logging layer after correction.

[0015] On the other hand, embodiments of the present invention also provide an offset method, which includes: offsetting an anisotropic parameter field obtained according to the anisotropic parameter field establishment method described in any of the above embodiments to obtain offset imaging.

[0016] On the other hand, embodiments of the present invention also provide an anisotropic parameter field establishment device, the anisotropic parameter field establishment device comprising: The thickness calculation module is configured to obtain the thickness of the target logging layer of each well point based on the logging layer information of each well point, and to obtain the thickness of the target seismic interpretation layer corresponding to the well point based on the seismic interpretation layer information. The thickness factor calculation module is configured to calculate the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer. The correction module is configured to correct the target logging layer based on the thickness factor of each well point and the thickness of the target seismic interpretation layer, so as to obtain the corrected target logging layer. Establish a module, configure the thickness of the target seismic interpretation layer and the corrected thickness of the target logging layer, and establish an anisotropic parameter field.

[0017] On the other hand, embodiments of the present invention also provide an electronic device, including: at least one processor; and a memory storing a computer program executable on the processor, characterized in that the processor executes the steps of the method as described in any of the preceding embodiments when executing the program.

[0018] On the other hand, embodiments of the present invention also provide a computer storage medium, which stores a computer program that, when executed by a processor, performs the steps of the method described in any of the above embodiments.

[0019] The present invention has at least the following beneficial effects: The anisotropic parameter field establishment method, apparatus, migration method, equipment, and medium provided by this invention obtains the thickness of the target logging layer at each well point based on the logging layer information, and obtains the thickness of the target seismic interpretation layer corresponding to the well point based on the seismic interpretation layer information; calculates the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer; corrects the target logging layer based on the thickness factor of each well point and the thickness of the target seismic interpretation layer to obtain the corrected target logging layer; and establishes the anisotropic parameter field based on the thickness of the target seismic interpretation layer and the corrected target logging layer. This technical solution can constrain the logging layer of the well point by the lateral trend of the seismic interpretation layer during logging layer correction, reducing the difference between the established anisotropic parameter field and the anisotropic parameter field of the actual subsurface medium, while also avoiding distortion of the anisotropic parameters, making the established anisotropic parameter field closer to the anisotropic parameter field of the actual subsurface medium. Attached Figure Description

[0020] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other embodiments can be obtained based on these drawings without creative effort.

[0021] Figure 1 A flowchart of an anisotropic parameter field establishment method provided in an embodiment of the present invention; Figure 2 This is a schematic diagram comparing the target logging layers before and after correction. Figure 3 A schematic diagram of a multi-well work area provided in an embodiment of the present invention; Figure 4a This is a schematic diagram of the anisotropic parameter field established using the combined well-seismic method. Figure 4b To pass as Figure 1 A schematic diagram of the anisotropic parameter field established by the method shown; Figure 5a A schematic diagram of the migration imaging obtained by pre-stack depth migration of the anisotropic parameter field established by the well-seismic joint method; Figure 5b To pass as Figure 1 The anisotropic parameter field established by the method shown is subjected to pre-stack depth migration, resulting in a schematic diagram of the migration imaging. Figure 6 A schematic diagram of the anisotropic parameter field establishment device provided in an embodiment of the present invention; Figure 7 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention; Figure 8 A schematic diagram of the structure of a computer storage medium provided in an embodiment of the present invention. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to specific examples and the accompanying drawings.

[0023] It should be noted that all uses of "first" and "second" in the embodiments of the present invention are for the purpose of distinguishing two entities or parameters with the same name but different names. It is clear that "first" and "second" are only for the convenience of expression and should not be construed as limiting the embodiments of the present invention. Subsequent embodiments will not explain this in detail.

[0024] Anisotropy parameters have a wide range of applications in the field of seismic exploration, covering many aspects such as seismic wave propagation velocity analysis, underground fracture analysis and stress field analysis, seismic wave migration imaging, and earthquake disaster prediction.

[0025] An exemplary method for establishing an anisotropic parameter field is the well-seismic combined method. This method reads geological stratification information well by well, determines the corresponding seismic thickness of the strata based on the read geological stratification information, calculates anisotropic parameters based on the seismic thickness and geological thickness, and interpolates the anisotropic parameters to establish an anisotropic field.

[0026] When the applicant established the anisotropic parameter field using the aforementioned well-seismic combined method, it was found that this well-seismic combined method is actually a method for establishing anisotropic parameter fields from points to surfaces and then to volumes. This method does not consider the influence of formation changes between well points on anisotropic parameters. Therefore, the anisotropic parameter field established in the end differs significantly from the anisotropic parameter field of the actual underground medium, which is not conducive to the subsequent application of the anisotropic parameter field.

[0027] Furthermore, in this well-seismic combined method, due to the lack of lateral geological significance between each well point, the anisotropic parameters obtained by interpolation are prone to abrupt changes, resulting in poor lateral continuity of the established anisotropic parameter field.

[0028] In view of this, in order to solve at least one of the above-mentioned technical problems, this application proposes a method, apparatus, migration method, device, and medium for establishing an anisotropic parameter field. The anisotropic parameter field establishment method, apparatus, migration method, device, and medium provided by this invention calculate the thickness factor of a well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer. This allows for interpolation of the thickness factor of each well point under the constraint of the seismic interpretation layer, obtaining the interpolated thickness factor. By using the interpolated thickness factor and the corresponding thickness of the seismic interpretation layer, the corrected logging layer is obtained. This reduces the difference between the established anisotropic parameter field and the anisotropic parameter field of the actual subsurface medium, while also avoiding anisotropic parameter distortion, making the established anisotropic parameter field closer to the anisotropic parameter field of the actual subsurface medium.

[0029] The present invention will now be described in detail with reference to the embodiments and accompanying drawings.

[0030] The first aspect of this invention provides a method for establishing an anisotropic parameter field, such as... Figure 1 As shown, the method specifically includes steps S100 to S130.

[0031] S100. Based on the logging layer information of each well point, obtain the thickness of the target logging layer of the well point, and based on the seismic interpretation layer information, obtain the thickness of the target seismic interpretation layer corresponding to the well point.

[0032] During seismic exploration, to understand the subsurface environment of a specific area, artificial shot point firing can be used to obtain seismic stratigraphic information, thus forming seismic interpretation data for that area. Seismic interpretation stratigraphic information can be obtained from this data. This information may include the location of each seismic interpretation horizon, such as its depth.

[0033] During seismic exploration, to understand the subsurface environment of a region, especially the geological structure of a specific rock stratum, multiple well points can be set up within that area. Drilling is then performed at each well point to obtain geological stratification information below that well point, thus forming well logging data for the region. Well logging stratification information can be obtained from the well logging data and can include the location information of each well logging layer, such as its depth.

[0034] The target logging layer can be determined based on the actual underground geological structure. For example... Figure 2 As shown, in Figure 2 In the diagram, the line marked on the left can be interpreted as the target logging layer, i.e., the target logging layer before correction. However, it is not limited to this; other logging layers can also be designated as target logging layers according to actual needs.

[0035] In this embodiment of the invention, the thickness of the target seismic interpretation layer can be obtained based on the seismic interpretation layer information. The thickness of the target logging layer at each well point can be obtained based on the logging layer information at each well point. The thickness of the target seismic interpretation layer and the thickness of the target logging layer at each well point can be used for subsequent thickness factor calculations.

[0036] In one example, assuming there are 5 well points, namely well 1, well 2, well 3, well 4, and well 5, the thickness of each well point at the target logging layer can be calculated, denoted as D. 井1 D 井2 D 井3 D 井4 and D 井5 Correspondingly, the target seismic interpretation layer thickness corresponding to each well point can be calculated, which is D. 地震1 D 地震2 D 地震3 D 地震4 and D 地震5。

[0037] S110. Calculate the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer.

[0038] Specifically, based on the relationship between the thickness of the target seismic interpretation layer and the target logging layer, the thickness factor of the well point at the target logging layer is calculated.

[0039] In one example, assuming there are 5 well points, namely well 1, well 2, well 3, well 4, and well 5, the thickness of each well point at the target logging layer can be calculated, denoted as D. 井1 D 井2 D 井3 D 井4 and D 井5 Correspondingly, the target seismic interpretation layer thickness corresponding to each well point can be calculated, which is D. 地震1 D 地震2 D 地震3 D 地震4 and D 地震5。 According to D 井1 With D 地震1 D 井2 With D 地震2 D 井3 With D 地震3 D 井4 With D 地震4 D 井5 With D 地震5 The differences can be used to obtain the corresponding thickness factors, namely d1, d2, d3, d4, and d5.

[0040] Thickness factors can include thickness scaling factor, thickness error, etc. The thickness scaling factor can be obtained based on the ratio between the thickness of the target seismic interpretation layer and the thickness of the target logging layer, while the thickness error can be obtained based on the thickness difference between the target seismic interpretation layer and the target logging layer.

[0041] S120. Based on the thickness factor of each well point and the thickness of the target seismic interpretation layer, the target logging layer is corrected to obtain the corrected target logging layer.

[0042] According to several embodiments, the thickness factor can be interpolated to obtain the interpolated thickness factor. In one specific implementation, the thickness factor of the target logging layer can be obtained based on the interpolation algorithm and the thickness factors of each well point at the target logging layer. The interpolation algorithm can be any one of random forest interpolation, Gaussian interpolation, polynomial interpolation, K-nearest neighbor interpolation, etc., and is not specifically limited here. Since the seismic interpretation layer has lateral continuity, and the thickness factor is obtained based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer, the thickness factor at any position on the target logging layer obtained according to the interpolation algorithm and the thickness factors of each well point at the target logging layer is obtained under the trend constraint of the seismic interpretation layer. Thus, the lateral continuity of the thickness factor at any position on the target logging layer is guaranteed, and abrupt changes in the thickness factor obtained by interpolation are avoided.

[0043] In one example, assuming that eight thickness factors of eight well points at the target logging layer have been obtained, namely d1, d2, d3, d4, d5, d6, d7, and d8, an interpolation algorithm is used to interpolate d1, d2, d3, d4, d5, d6, d7, and d8 to obtain the interpolated thickness factors, which are the thickness factors at any position on the target logging layer.

[0044] When the thickness factor at any location has lateral continuity, the target logging horizon can be corrected based on the thickness factor at any location and the thickness of the target seismic interpretation horizon, thus obtaining the target logging horizon that is consistent with the trend of the seismic interpretation horizon.

[0045] like Figure 2 As shown, in Figure 2 In the diagram, the lines marked on the right represent the corrected target logging layers. Compared to the uncorrected target logging layers, the corrected target logging layers better reflect the actual target logging layers.

[0046] S130. Based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer, an anisotropic parameter field is established.

[0047] In this embodiment of the invention, thickness factors are interpolated under the constraint of seismic interpretation horizons. By obtaining the thickness factors at any location under the constraint of seismic interpretation horizons and the corresponding thickness of the seismic interpretation horizons, the corrected logging horizons are obtained. This reduces the difference between the established anisotropic parameter field and the anisotropic parameter field of the actual subsurface medium, and also avoids anisotropic parameter distortion, making the established anisotropic parameter field closer to the anisotropic parameter field of the actual subsurface medium.

[0048] In some embodiments, the thickness factor may include thickness error.

[0049] The present invention is as follows Figure 1 In step S110 of the illustrated embodiment, calculating the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer may include: calculating the thickness error of the well point at the target logging layer based on the difference between the thickness of the target seismic interpretation layer and the thickness of the target logging layer.

[0050] In some embodiments, the present invention as follows Figure 1 In step S120 of the illustrated embodiment, the target logging layer is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation layer to obtain the corrected target logging layer. This may include: interpolating the thickness error to obtain the interpolated thickness error; and obtaining the corrected target logging layer based on the sum of the interpolated thickness error and the thickness of the target seismic interpretation layer.

[0051] Based on the difference between the thickness of the target seismic interpretation layer and the thickness of the target logging layer, the thickness error of the well point at the target logging layer is calculated. By interpolating the thickness errors of all well points at the target logging layer, the interpolated thickness error of the target logging layer under the constraint of the target seismic interpretation layer can be obtained. Adding the interpolated thickness error to the thickness of the target seismic interpretation layer at the corresponding location, a spatial target logging layer model can be established, i.e., the corrected target logging layer, which improves the degree of agreement between the logging layer and the actual geological layer.

[0052] In one example, there are 5 well points, namely well 1, well 2, well 3, well 4, and well 5. The thicknesses of well 1, well 2, well 3, well 4, and well 5 at the target logging layer are respectively D. 井1 D 井2 D 井3 D 井4 and D 井5 The thicknesses of wells 1, 2, 3, 4, and 5 at the target seismic interpretation horizon are D, respectively. 地震1 D 地震2 D 地震3 D 地震4 and D 地震5。According to D 井1 With D 地震1 D 井2 With D 地震2 D 井3 With D 地震3 D 井4 With D 地震4 D 井5 With D 地震5 The differences can be used to obtain the corresponding thickness errors, namely d1, d2, d3, d4, and d5.

[0053] Interpolating d1, d2, d3, d4, and d5 yields the thickness error at any location within the target logging layer, assuming it to be d1~d5. 100 d1~d 100 By adding the corresponding target seismic interpretation layer thickness, the corrected target logging layer can be obtained.

[0054] In some embodiments, the thickness factor may include a thickness scaling factor.

[0055] The present invention is as follows Figure 1 In step S110 of the illustrated embodiment, calculating the thickness factor of the well point in the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer may further include: calculating the thickness ratio coefficient of the well point in the target logging layer based on the ratio of the thickness of the target seismic interpretation layer to the thickness of the target logging layer.

[0056] In some embodiments, the present invention as follows Figure 1 In step S120 of the illustrated embodiment, the target logging layer is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation layer to obtain the corrected target logging layer. This may also include: interpolating the thickness ratio coefficient to obtain the interpolated thickness ratio coefficient; and obtaining the corrected target logging layer based on the ratio of the thickness of the target seismic interpretation layer to the interpolated thickness ratio coefficient.

[0057] Based on the ratio of the thickness of the target seismic interpretation layer to the target logging layer, the thickness ratio coefficient of the well point at the target logging layer is calculated. Interpolation is then performed on the obtained thickness ratio coefficients of all well points at the target logging layer to obtain the thickness ratio coefficient at any location on the target logging layer, constrained by the target seismic interpretation layer. Based on the ratio of the thickness of the target seismic interpretation layer to the thickness ratio coefficient at the corresponding location, the corrected target logging layer can be obtained. This implementation further improves the consistency between the logging layer and the actual geological layer under the constraints of the thickness ratio coefficient and the seismic interpretation layer.

[0058] In one example, suppose there are 10 well points, numbered 1 through 10, with thicknesses of D at the target logging horizon for each well. 井1 ~D 井10 The thickness of the target seismic interpretation layer is D. 地震1 ~D 地震10。 According to D 地震1 With D 井1 D 地震2 With D 井2 D 地震3 With D 井3 D 地震4 With D 井4 D 地震5 With D 井5 D 地震6 With D 井,6 D 地震7 With D 井7 D 地震8 With D 井8 D 地震9 With D 井9 D 地震10 With D 井10 The ratios of these values ​​can be used to obtain the corresponding thickness errors, namely a1, a2, a3, a4, a5, a6, a7, a8, a9, and a. 10 . For a1, a2, a3, a4, a5, a6, a7, a8, a9, a 10 Interpolation is performed to obtain the ratio at any location in the target logging layer, assuming it to be a1~a 200 By dividing the target seismic interpretation layer thickness corresponding to each ratio by the corresponding ratio, the corrected target logging layer can be obtained.

[0059] In some embodiments, seismic interpretation horizon information may include the depth of each seismic interpretation horizon; well logging stratification information may include the depth of each well logging horizon.

[0060] The present invention is as follows Figure 1 In step S100 of the illustrated embodiment, the thickness of the target logging layer of each well point is obtained based on the logging layer information of each well point, and the thickness of the target seismic interpretation layer corresponding to the well point is obtained based on the seismic interpretation layer information. This may include: obtaining the thickness of the target seismic interpretation layer based on the depth of the target seismic interpretation layer corresponding to the well point and the depth of the upper seismic interpretation layer adjacent to the target seismic interpretation layer; and obtaining the thickness of the target logging layer based on the depth of the target logging layer and the depth of the upper seismic interpretation layer adjacent to the target logging layer.

[0061] Specifically, the thickness of the target seismic interpretation layer can be obtained based on the difference between the depth of the target seismic interpretation layer and the depth of the adjacent upper seismic interpretation layer. The thickness of the target logging layer can also be obtained by comparing the depth of the target logging layer with the depth of the adjacent upper seismic interpretation layer, where the depth of the adjacent upper seismic interpretation layer is the same as the depth of the adjacent upper seismic interpretation layer.

[0062] In some embodiments, the present invention as follows Figure 1 In step S130 of the illustrated embodiment, establishing an anisotropic parameter field based on the thickness of the target seismic interpretation layer and the corrected thickness of the target logging layer may include: calculating the thickness of the target seismic interpretation layer and the corrected thickness of the target logging layer based on the following formula to obtain the anisotropic parameters of the target logging layer, thereby establishing the anisotropic parameter field. , in, Indicates the anisotropy parameters of the target logging layer. Indicates the thickness of the target seismic interpretation layer. This indicates the thickness of the target logging layer after correction.

[0063] The present invention is as follows Figure 1 The anisotropic parameter field establishment method shown can be applied to, for example, Figure 3 The multi-well three-dimensional work area shown can be used to obtain, as follows: Figure 4b The anisotropic parameter field is shown. Figure 3 In the diagram, the area within the black line box represents the area that needs to be surveyed. (Through...) Figure 4b It can be seen that the anisotropic parameter field established through the embodiments of the present invention is more in line with geological laws, has good lateral continuity, and does not produce local anomalies.

[0064] Figure 4a This is an anisotropic parameter field established using an exemplary well-seismic combined method. From Figure 4a It can be seen that the exemplary well-seismic combined field establishment method is prone to local anomalies due to the uncontrollability of simple mathematical interpolation between wells. In some embodiments, in order to further improve the accuracy of the corrected target logging horizon and make it closer to the actual seismic horizon, thereby further reducing the difference between the established anisotropic parameter field and the anisotropic parameter field of the actual subsurface medium, this application can also implement, for example... Figure 1In steps S100 to S120 of the method shown, each logging layer before the target logging layer to be corrected is corrected layer by layer according to the depth of the layer from the ground. This makes the logging layer used to correct the target logging layer more accurate, thereby further improving the accuracy of the corrected target logging layer and making it closer to the actual geological layer.

[0065] Based on the same inventive concept, according to another aspect of the present invention, an embodiment of the present invention also provides an offset method, which includes: offsetting an anisotropic parameter field obtained according to the anisotropic parameter field establishment method described in any of the above embodiments to obtain an offset image.

[0066] Offset can be any offset method, such as pre-stack depth offset or post-stack depth offset, and no specific limitation is made here.

[0067] By performing pre-stack depth migration on the anisotropic parameter field established using an exemplary well-seismic combined method, the following can be obtained: Figure 5a The offset imaging shown. (Through) Figure 5a It can be seen that the migration imaging is affected by the anisotropic parameter anomaly, and local structural high points appear in the well profile.

[0068] Through the present invention as Figure 1 The anisotropic parameter field established in the illustrated embodiment is subjected to pre-stack depth migration, which yields the following results: Figure 5b The offset imaging shown. (Through) Figure 5b As can be seen, the anisotropic parameter update process of this invention takes into account the influence of formation changes between wells, the anisotropic parameter field is more reasonable, the corrected logging layer profile phase axis structure is reasonable, effectively avoids the phase axis distortion phenomenon caused by local anisotropic parameter value anomalies, and is more in line with geological laws.

[0069] Based on the same inventive concept, according to another aspect of the present invention, embodiments of the present invention also provide an anisotropic parameter field establishment apparatus. For example... Figure 6 As shown, the anisotropic parameter field establishment device 60 includes: Thickness calculation module 61 is configured to obtain the thickness of the target logging layer of each well point based on the logging layer information of each well point, and to obtain the thickness of the target seismic interpretation layer corresponding to the well point based on the seismic interpretation layer information. Thickness factor calculation module 62 is configured to calculate the thickness factor of the well point at the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer. The correction module 63 is configured to correct the target logging layer based on the thickness factor of each well point and the thickness of the target seismic interpretation layer, so as to obtain the corrected target logging layer. Module 64 is established to configure the thickness of the target seismic interpretation layer and the corrected thickness of the target logging layer, and to establish an anisotropic parameter field.

[0070] In this embodiment of the invention, a thickness factor is interpolated under the constraint of the seismic interpretation horizon. The corrected logging horizon is obtained by combining the interpolated thickness factor obtained under the constraint of the seismic interpretation horizon with the thickness of the corresponding seismic interpretation horizon. This reduces the discrepancy between the established anisotropic parameter field and the actual anisotropic parameter field of the subsurface medium, while also avoiding anisotropic parameter distortion, making the established anisotropic parameter field closer to the actual anisotropic parameter field of the subsurface medium.

[0071] Based on the same inventive concept, according to another aspect of the present invention, such as Figure 7 As shown, an embodiment of the present invention also provides an electronic device 70, which includes a processor 710 and a memory 720. The memory 720 stores a computer program 721 that can run on the processor. When the processor 710 executes the program, it performs the steps of the method described above.

[0072] The memory, as a non-volatile storage medium, can be used to store non-volatile software programs, non-volatile computer-executable programs, and modules, such as the program instructions / modules corresponding to the compression method described in the embodiments of this application. The processor executes various functional applications and data processing of the device by running the non-volatile software programs, instructions, and modules stored in the memory, thereby implementing the compression method of the above-described method embodiments.

[0073] The memory may include a program storage area and a data storage area, wherein the program storage area may store the operating system and applications required for at least one function; the data storage area may store data created based on the use of the device, etc. Furthermore, the memory may include high-speed random access memory and may also include non-volatile memory, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory may optionally include memory remotely located relative to the processor, which can be connected to the local module via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0074] Based on the same inventive concept, according to another aspect of the present invention, such as Figure 8 As shown, an embodiment of the present invention also provides a computer storage medium 80, which stores a computer program 81 that executes the above method when executed by a processor.

[0075] Finally, it should be noted that those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium for the program can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc. The above computer program embodiments can achieve the same or similar effects as any of the corresponding foregoing method embodiments.

[0076] Those skilled in the art will also understand that the various exemplary logic blocks, modules, circuits, and algorithm steps described in conjunction with the disclosure herein can be implemented as electronic hardware, computer software, or a combination of both. To clearly illustrate this interchangeability between hardware and software, the functionality of various illustrative components, blocks, modules, circuits, and steps has been generally described. Whether this functionality is implemented as software or as hardware depends on the specific application and the design constraints imposed on the system as a whole. Those skilled in the art can implement the functionality in various ways for each specific application, but such implementation decisions should not be construed as departing from the scope of the embodiments disclosed herein.

[0077] The above are exemplary embodiments disclosed in this invention. However, it should be noted that various changes and modifications can be made without departing from the scope of the embodiments of this invention as defined by the claims. The functions, steps, and / or actions of the methods according to the disclosed embodiments described herein do not need to be performed in any particular order. The sequence numbers of the disclosed embodiments of this invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments. Furthermore, although the elements disclosed in the embodiments of this invention may be described or claimed individually, they may be understood as multiple unless explicitly limited to a singular number.

[0078] It should be understood that, as used herein, the singular form “a” is intended to include the plural form as well, unless the context clearly supports an exception. It should also be understood that, as used herein, “and / or” refers to any and all possible combinations of one or more of the associated listed items.

[0079] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of the invention (including the claims) is limited to these examples. Within the framework of the invention, technical features of the above embodiments or different embodiments can be combined, and many other variations of different aspects of the invention exist, which are not provided in the details for the sake of brevity. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the invention should be included within the protection scope of the invention.

Claims

1. A method for establishing an anisotropic parameter field, characterized in that, include: Based on the logging layer information of each well point, the thickness of the target logging layer of the well point is obtained, and based on the seismic interpretation layer information, the thickness of the target seismic interpretation layer corresponding to the well point is obtained. Based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer, calculate the thickness factor of the well point in the target logging layer; The target logging layer is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation layer to obtain the corrected target logging layer. An anisotropic parameter field is established based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer.

2. The method according to claim 1, characterized in that, The thickness factor includes thickness error; Based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer, calculate the thickness factor of the well point in the target logging layer, including: The thickness error of the well point in the target logging layer is calculated based on the difference between the thickness of the target seismic interpretation layer and the thickness of the target logging layer.

3. The method according to claim 2, characterized in that, The target logging horizon is corrected based on the thickness factor of each well point and the thickness of the target seismic interpretation horizon to obtain the corrected target logging horizon, including: The thickness error is interpolated to obtain the interpolated thickness error; The corrected target logging layer is obtained by summing the interpolated thickness error with the thickness of the target seismic interpretation layer.

4. The method according to claim 1, characterized in that, The thickness factor includes a thickness scaling factor; The step of calculating the thickness factor of the well point in the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer includes: The thickness ratio coefficient of the well point in the target logging layer is calculated based on the ratio of the thickness of the target seismic interpretation layer to the thickness of the target logging layer.

5. The method according to claim 4, characterized in that, The target logging horizon is corrected based on the thickness factor at each well point and the thickness of the target seismic interpretation horizon, resulting in the corrected target logging horizon, including: Interpolate the thickness ratio coefficient to obtain the interpolated thickness ratio coefficient; The corrected target logging layer is obtained based on the ratio of the thickness of the target seismic interpretation layer to the interpolated thickness ratio coefficient.

6. The method according to any one of claims 1 to 5, characterized in that, The well logging stratification information includes the depth of each well logging layer; The step of obtaining the thickness of the target logging layer at each well point based on the logging layer information of each well point includes: The thickness of the target logging layer is obtained based on the depth of the target logging layer and the depth of the previous logging layer adjacent to the target logging layer.

7. The method according to claim 6, characterized in that, The seismic interpretation horizon information includes the depth of each seismic interpretation horizon; The step of obtaining the thickness of the target seismic interpretation layer corresponding to the well point based on the seismic interpretation layer information includes: The thickness of the target seismic interpretation layer is obtained based on the depth of the target seismic interpretation layer corresponding to the well point and the depth of the previous seismic interpretation layer adjacent to the target seismic interpretation layer, wherein the depth of the previous seismic interpretation layer adjacent to the target seismic interpretation layer is the same as the depth of the previous logging layer adjacent to the target logging layer.

8. The method according to any one of claims 1 to 5, characterized in that, The establishment of an anisotropic parameter field based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer includes: The thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer are calculated based on the following formula to obtain the anisotropy parameters of the target logging layer, thereby establishing an anisotropy parameter field. , in, Indicates the anisotropy parameters of the target logging layer. Indicates the thickness of the target seismic interpretation layer. This indicates the thickness of the target logging layer after correction.

9. An offset method, characterized in that, include: The anisotropic parameter field obtained by the anisotropic parameter field establishment method as described in any one of claims 1 to 8 is offset to obtain offset imaging.

10. An anisotropic parameter field establishment device, characterized in that, include: The thickness calculation module is configured to obtain the thickness of the target logging layer of each well point based on the logging layer information of each well point, and to obtain the thickness of the target seismic interpretation layer corresponding to the well point based on the seismic interpretation layer information. A thickness factor calculation module is configured to calculate the thickness factor of the well point in the target logging layer based on the thickness of the target seismic interpretation layer and the thickness of the target logging layer. The correction module is configured to correct the target logging layer based on the thickness factor of each well point and the thickness of the target seismic interpretation layer, so as to obtain the corrected target logging layer. A module is established and configured to create an anisotropic parameter field based on the thickness of the target seismic interpretation layer and the thickness of the corrected target logging layer.

11. An electronic device, comprising: At least one processor; as well as A memory storing a computer program executable on the processor, characterized in that the processor executes the program and performs the steps of the method as described in any one of claims 1 to 9.

12. A computer storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it performs the steps of the method as described in any one of claims 1 to 9.