Interfacing and assembly method for double-layer focus-adjustable lens independent driving
By using a mezzanine interface structure and pin remapping circuit, combined with a protection and diagnostic module and anti-misinsertion design, the congestion and reliability issues of the dual-layer adjustable lens drive interface are solved, enabling efficient mass production and maintenance, convenient calibration, and improved electrical stability and yield.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- 南通诺瞳奕目医疗科技有限公司
- Filing Date
- 2026-04-22
- Publication Date
- 2026-06-09
AI Technical Summary
In the existing technology, the dual-layer adjustable lens drive interface has problems such as crowded connector area, limited temple space, difficulty in production testing and rework, easy mis-insertion of connectors, and low yield due to electrostatic shock.
It adopts a mezzanine interface structure, pin remapping circuit, protection and diagnostic module, anti-misinsertion and software handshake design. The pin remapping circuit distributes the signal into independent drive groups, sets up protection and diagnostic circuits, uses the mechanical foolproof structure of board to board connector to achieve fault isolation and electrostatic protection, and ensures correct insertion through software handshake.
Optimize interface layout to improve driver reliability and fault location efficiency, reduce the risk of mis-insertion, achieve efficient mass production and maintenance, facilitate parameter calibration, and improve electrical stability and yield.
Smart Images

Figure CN122172466A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of wearable eyewear electronic systems, and in particular to a sandwich panel interface for independent driving of dual-layer adjustable lenses and its assembly method. Background Technology
[0002] Dual-layer adjustable focus units require two independent drives (V1, V2) and often involve high-density interconnection of multiple buses and multiple ring electrodes. Directly placing all pins and protection / test functions on the main control board will cause problems such as crowded connector areas, limited temple space, difficulties in production testing and rework, as well as connector mis-insertion and electrostatic discharge.
[0003] Connector areas are crowded, and the number of wiring layers and costs are increasing. With limited space in the temples, the main control board cannot simultaneously ensure heat dissipation, power integrity, and high-density connections. The lack of nearby testing points for production testing / repair makes fault location difficult. Incorrect insertion, reverse insertion, and electrostatic discharge (ESD) of FFC / board-to-board connectors can lead to a decrease in yield.
[0004] Therefore, a systematic solution is needed that integrates "high-density interconnection + protection diagnostics + foolproof structure" into a small sandwich panel. Summary of the Invention
[0005] The core of this invention lies in solving the problems of crowded driving interfaces for dual-layer adjustable lens lenses, limited wiring in temple space, difficulties in mass production testing and rework, easy mis-insertion of connectors, and low yield caused by electrostatic shock in the prior art through a mezzanine interface structure, pin remapping circuit, protection and diagnostic module, anti-misinsertion and software handshake design.
[0006] To solve the above problems, the present invention adopts the following technical solution.
[0007] To address the aforementioned issues, this invention provides a mezzanine interface for independently driving a dual-layer adjustable lens, comprising: an input connector for connecting to a flexible flat cable of the adjustable lens; a board-to-board connector for electrically connecting to a main control board; a pin remapping circuit for redistributing the pin signals of the input connector into a first drive output group and a second drive output group to drive the first and second layers of the dual-layer adjustable lens, respectively; and a protection and diagnostic circuit for providing electrostatic protection, overcurrent diagnosis, and open-circuit diagnosis for the first and second drive output groups.
[0008] Furthermore, the first drive output group corresponds to the first layer drive voltage V1, and the second drive output group corresponds to the second layer drive voltage V2.
[0009] Furthermore, the pin remapping circuit includes a wire redistribution layer; the wire redistribution layer is provided with a cross-traffic area, and in the implementation of the switchable interface configuration, a selection switch unit is provided.
[0010] Furthermore, the protection and diagnostic circuitry includes an ESD protection array.
[0011] Furthermore, the protection and diagnostic circuitry includes series current-limiting elements and damping elements.
[0012] Furthermore, the protection and diagnostic circuit includes an overcurrent diagnostic module and an open-circuit diagnostic module, and triggers a drive shutdown when a fault is detected.
[0013] Furthermore, the sandwich panel is provided with at least one test point TP for production test probes to measure the driving waveform, leakage current and connectivity.
[0014] Furthermore, board-to-board connectors have mechanical key notches and asymmetrical pin arrangements to prevent reverse insertion and misaligned insertion.
[0015] Furthermore, the interlayer includes orientation silkscreen and positioning marks to indicate the correct insertion direction.
[0016] Furthermore, the mezzanine includes an ID identification circuit, which provides device identification information to the main control board and participates in the software handshake during the power-on self-test phase.
[0017] Furthermore, the ID recognition circuit includes a resistance code (Rcode) and an analog-to-digital converter (ADC) readout structure.
[0018] Furthermore, the interlayer plate is located inside the temple cavity and forms a plug-in layered layout with the main control board for easy disassembly and maintenance.
[0019] Furthermore, the mezzanine separates the high-density interconnect area from the large power supply and heat dissipation area of the main control board. The high-density interconnect area includes the input connectors, board-to-board connectors, wire redistribution layers, and test points.
[0020] The assembly method for the interlayer plate interface for independently driving dual-layer adjustable lenses includes the following steps: S1. Provide a main control board and a mezzanine board, wherein the mezzanine board is pre-assembled with board-to-board connectors and input connectors; S2. Connect the mezzanine board to the main control board via the board-to-board connector; S3. Connect the flexible flat cable of the adjustable lens to the sandwich panel input connector; S4. Perform power-on self-test to detect short circuits, open circuits and read ID information; S5. After the self-test passes, output V1 and V2 to the first layer and the second layer respectively, and perform production testing and calibration in sequence; S6. Write the calibration parameters to the storage medium and record the parameter version number and serial number in the traceability data packet, and then lock the mass production mode.
[0021] Furthermore, the self-test includes detecting short circuits based on overcurrent detection and detecting open circuits based on voltage dips.
[0022] Furthermore, the self-test also includes reading the resistor code ID and disabling the high-voltage drive output when the resistor code ID does not match.
[0023] Furthermore, the calibration includes scanning the first layer driving voltage V1 and the second layer driving voltage V2, and measuring the optical path difference data and diopter data to generate coordinated control parameters.
[0024] Furthermore, in step S2, mechanical key notches and asymmetrical pin arrangements are used to restrict the only insertion direction of the board-to-board connector.
[0025] Furthermore, locking the production mode includes disabling the debug interface and limiting the maximum output drive amplitude.
[0026] Furthermore, the calibration parameters are written to the storage medium, and the parameter version number, serial number, and writing result are recorded in the traceability data packet.
[0027] Furthermore, production testing and calibration are completed through interaction with external test software via a serial communication interface. The serial communication interface is at least one of a USB interface, a UART interface, and an I2C interface. The external test software includes at least one of a production testing script, waveform acquisition software, and calibration configuration software.
[0028] Compared with the prior art, the advantages of this invention are: (1) Interface and wiring optimization: Separate the high-density interconnection area from the main control board power supply heat dissipation area, reduce the number of wiring layers and cost of the main control board, and adapt to the narrow space of the temple.
[0029] (2) Improved drive and reliability: The dual-layer lens can be driven independently and isolated from faults. ESD protection, current limiting and damping components can reduce the risk of damage to the transparent electrode and improve electrical stability.
[0030] (3) Mass production and maintenance improvement: Integrate test points and diagnostic circuits nearby to quickly locate faults and improve production testing efficiency and repair convenience.
[0031] (4) Assembly safety assurance: Mechanical key notch, asymmetrical pin arrangement and software ID handshake constitute double foolproof, reducing the failure rate caused by misinsertion and reverse insertion.
[0032] (5) Calibration and mass production closed loop: Supports drive scanning, diopter calibration, parameter writing and mass production mode locking, realizing a standardized interface system from prototype to mass production. Attached Figure Description
[0033] Figure 1 This is a schematic diagram of the main control board + sandwich panel + double-layer adjustable focus unit system architecture of the present invention; Figure 2 This is a side view showing the internal circuit stacking and height constraint of the temple of the present invention. Figure 3 This is a schematic diagram of the pin remapping of the sandwich panel of the present invention (FFC input → dual-layer independent drive output). Figure 4 This is an electrical schematic diagram illustrating the dual-layer independent drive achieved through a sandwich panel according to the present invention. Figure 5 This is a schematic diagram of the protection and diagnostic circuit on the sandwich panel of the present invention; Figure 6 This is a schematic diagram of the connector's mechanical key positions and anti-misinsertion features according to the present invention; Figure 7 This is a schematic diagram of the sandwich panel assembly and testing process of the present invention; Figure 8 This is a schematic diagram of the calibration / debugging interface for the sandwich panel of the present invention. Detailed Implementation
[0034] The technical solutions will now be clearly and completely described with reference to the accompanying drawings in the embodiments of the present invention.
[0035] First implementation method: Figures 1 to 8 The diagram illustrates a mezzanine interface for independently driving a dual-layer adjustable lens, comprising: an input connector for connecting to a flexible flat cable of the adjustable lens; a board-to-board connector for electrically connecting to a main control board; a pin remapping circuit for redistributing the pin signals of the input connector into a first drive output group and a second drive output group to drive the first and second layers of the dual-layer adjustable lens, the pin remapping circuit including a wire redistribution layer; a cross-wiring area provided in the wire redistribution layer, and a selection switch unit provided in an embodiment of the switchable interface configuration; and a protection and diagnostic circuit for providing electrostatic discharge protection, overcurrent diagnosis, and open-circuit diagnosis for the first and second drive output groups.
[0036] like Figure 3 Regarding pin remapping: from high-density input via flexible flat cable to dual-layer independent drive output.
[0037] Let the pin set on the input connector be P_in. After pin remapping, the mezzanine board forms the first drive output group A, the second drive output group B, and the common signal group C.
[0038] This can be represented as: P_in → {A, B, C}.
[0039] In this diagram, A corresponds to the first drive output group, B corresponds to the second drive output group, and C includes ground, ID, temperature sampling, and shielding signals. The conductor redistribution layer is used to adjust the wiring sequence from the high-density input area to the two output groups. The crossover routing area is used to avoid signal conflicts, and the selection switch unit is used to switch between different lens interface configurations.
[0040] Regarding dual-layer independent drive and fault isolation: like Figure 4 The mezzanine board distributes the main control board's drive channels to two independent outputs.
[0041] The first drive output group outputs the first layer drive voltage V1; in the multi-bus implementation, the first drive output group outputs the first layer multi-bus drive vector V1=[V11, V12, ..., V1m].
[0042] The second drive output group outputs the second layer drive voltage V2; in the multi-bus implementation, the second drive output group outputs the second layer multi-bus drive vector V2=[V21, V22, ..., V2n].
[0043] To reduce the impact of a short circuit in one circuit on another, current-limiting branches, branch fuses, or controllable switches can be installed between the two circuits to achieve fault isolation.
[0044] Regarding protection and diagnosis: such as Figure 5 The protection and diagnostic circuitry on the mezzanine includes at least the following components: an ESD protection array to reduce damage to the transparent electrodes from static electricity during insertion and removal and static electricity from the human body; series current limiting and damping components to reduce ringing of long cables and improve waveform consistency; an overcurrent diagnostic module and an open-circuit diagnostic module. The open-circuit diagnostic module detects a broken wire by detecting a voltage drop or no-response current, while the overcurrent diagnostic module detects a short circuit by detecting a branch current exceeding a threshold.
[0045] In the overcurrent diagnostic module and open circuit diagnostic, the mezzanine is equipped with at least one test point TP. The test point TP is set at the key nodes of the first drive output group, the second drive output group and the common signal group, and is used for the production test automatic probe to perform waveform verification, leakage current test and continuity detection.
[0046] Regarding prevention of mis-insertion and software handshake: like Figure 6 The board-to-board connector has mechanical key notches and an asymmetrical pin arrangement, ensuring that the connector can only be inserted in a single direction. In addition, the mezzanine board contains orientation silkscreen and positioning marks to indicate the correct insertion direction. At the same time, software handshake is performed through ID pins or resistor codes to prevent reverse insertion and misaligned insertion. Specifically, the mezzanine board contains an ID identification circuit to provide device identification information to the main control board and participate in the software handshake during the power-on self-test phase. The ID identification circuit includes a resistor code (Rcode) and an analog-to-digital converter reading structure.
[0047] When the measured resistance code R_meas falls within the target range [R_min, R_max], the main control board enables output drive; when R_meas exceeds the range, the main control board maintains the high voltage off state.
[0048] Therefore, mechanical error prevention and software recognition together constitute a dual anti-misinsertion mechanism.
[0049] like Figure 2 The interlayer plate is located inside the temple cavity and forms a plug-in layered layout with the main control board for easy disassembly and maintenance.
[0050] The mezzanine separates the high-density interconnect area from the large power supply and heat dissipation area of the main control board. The high-density interconnect area includes the input connectors, board-to-board connectors, wire redistribution layers, and test points.
[0051] like Figure 7 An assembly method for a sandwich panel interface for independently driven dual-layer adjustable lens includes the following steps: S1. Provide a main control board and a mezzanine board, wherein the mezzanine board is pre-assembled with board-to-board connectors and input connectors; S2. Connect the mezzanine board to the main control board via the board-to-board connector; S3. Connect the flexible flat cable of the adjustable lens to the sandwich panel input connector; S4. Perform power-on self-test to detect short circuits, open circuits and read ID information; S5. After the self-test passes, output V1 and V2 to the first layer and the second layer respectively, and perform production testing and calibration in sequence; S6. Write the calibration parameters to the storage medium and record the parameter version number and serial number in the traceability data packet, and then lock the mass production mode.
[0052] The self-test includes detecting short circuits based on overcurrent detection and detecting open circuits based on voltage drops.
[0053] The self-test also includes reading the resistor code ID and disabling high-voltage drive output when the resistor code ID does not match.
[0054] The calibration process includes scanning the first-layer driving voltage V1 and the second-layer driving voltage V2, and measuring optical path difference data and diopter data to generate coordinated control parameters.
[0055] In step S2, mechanical key notches and asymmetrical pin arrangements are used to restrict the only insertion direction of the board-to-board connector.
[0056] Locking the production mode includes disabling the debug interface and limiting the maximum drive amplitude that can be output.
[0057] The calibration parameters are written to the storage medium, and the parameter version number, serial number and writing result are recorded in the traceability data packet. The production test and calibration are completed by interacting with the external test software through a serial communication interface. The serial communication interface is at least one of USB interface, UART interface and I2C interface. The external test software includes at least one of production test script, waveform acquisition software and calibration configuration software.
[0058] Regarding the production testing / calibration interface: like Figure 8 The debug / production test port can be used for the following operations: Read ID information and temperature data; Scan V1 and V2 and measure the optical path difference and diopter data; Write the collaborative control parameters, threshold, and version number; Lock the production mode, disable the debug interface, and limit the maximum drive amplitude.
[0059] The above are merely preferred embodiments of the present invention; they encompass all the protection scope of the present invention. Any equivalent substitutions or modifications made by those skilled in the art within the technical scope disclosed in the present invention, based on the technical solutions and improved concepts of the present invention, should be covered within the protection scope of the present invention.
Claims
1. A sandwich panel interface for independently driving a dual-layer adjustable focusing lens, characterized in that, include: Input connector for connection to a flexible flat cable for adjustable focus lenses; Board-to-board connectors are used for electrical connection to the main control board; A pin remapping circuit is used to redistribute the pin signals of the input connector into a first drive output group and a second drive output group to drive the first and second layers of the dual-layer adjustable lens, respectively. Protection and diagnostic circuitry is provided to provide electrostatic protection, overcurrent diagnosis, and open-circuit diagnosis for the first and second drive output groups.
2. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The first drive output group corresponds to the first layer drive voltage V1, and the second drive output group corresponds to the second layer drive voltage V2.
3. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The pin remapping circuit includes a wire redistribution layer; the wire redistribution layer is provided with a cross routing area and a selection switch unit is provided in the switchable interface configuration.
4. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The protection and diagnostic circuit includes an ESD protection array.
5. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The protection and diagnostic circuit includes a series current-limiting element and a damping element.
6. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The protection and diagnostic circuit includes an overcurrent diagnostic module and an open-circuit diagnostic module, and triggers a drive shutdown when a fault is detected.
7. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 3, characterized in that, The sandwich panel is provided with at least one test point TP for production test probes to measure the driving waveform, leakage current and connectivity.
8. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The board-to-board connector has mechanical key notches and an asymmetrical pin arrangement to prevent reverse insertion and misaligned insertion.
9. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The interlayer plate includes orientation silkscreen and positioning marks to indicate the correct insertion direction.
10. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The mezzanine includes an ID identification circuit, which provides device identification information to the main control board and participates in the software handshake during the power-on self-test phase.
11. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 10, characterized in that, The ID recognition circuit includes a resistance code (Rcode) and an analog-to-digital conversion reading structure.
12. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 1, characterized in that, The sandwich panel is located inside the temple cavity and forms a plug-in layered layout with the main control board for easy disassembly and maintenance.
13. The sandwich panel interface for independently driving a dual-layer adjustable lens according to claim 6, characterized in that, The mezzanine separates the high-density interconnect area from the large power heat dissipation area of the main control board, wherein the high-density interconnect area is the area where the input connector, board-to-board connector, wire redistribution layer and test points are located.
14. An assembly method for a sandwich panel interface for independently driving a dual-layer adjustable focusing lens, characterized in that, Includes the following steps: S1. Provide a main control board and a mezzanine board, wherein the mezzanine board is pre-assembled with a board-to-board connector and an input connector; S2. Connect the mezzanine board to the main control board via the board-to-board connector; S3. Connect the flexible flat cable of the adjustable lens to the sandwich panel input connector; S4. Perform power-on self-test to detect short circuits, open circuits and read ID information; S5. After the self-test passes, output V1 and V2 to the first layer and the second layer respectively, and perform production testing and calibration in sequence; S6. Write the calibration parameters to the storage medium and record the parameter version number and serial number in the traceability data packet, and then lock the mass production mode.
15. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, The self-test includes detecting short circuits based on overcurrent detection and detecting open circuits based on voltage drops.
16. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, The self-test also includes reading the resistor code ID and disabling high-voltage drive output when the resistor code ID does not match.
17. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, The calibration includes scanning the first layer driving voltage V1 and the second layer driving voltage V2, and measuring optical path difference data and diopter data to generate coordinated control parameters.
18. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, In step S2, mechanical key notches and asymmetrical pin arrangements are used to restrict the only insertion direction of the board-to-board connector.
19. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, The locked production mode includes disabling the debug interface and limiting the maximum output drive amplitude.
20. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable lens according to claim 14, characterized in that, The calibration parameters are written to the storage medium, and the parameter version number, serial number, and writing result are recorded in the traceability data packet.
21. The assembly method for the interlayer plate interface for independently driving a dual-layer adjustable focus lens according to claim 14, characterized in that, The production testing and calibration are completed through interaction with external testing software via a serial communication interface. The serial communication interface is at least one of a USB interface, a UART interface, and an I2C interface. The external testing software includes at least one of a production testing script, waveform acquisition software, and calibration configuration software.