Free-form surface adaptive measurement device and method based on Fourier spot analysis
By combining Fourier spot analysis and liquid crystal spatial light modulator, the measurement failure problem of adaptive interferometer in detecting large surface deviations from freeform surfaces is solved, realizing fast and accurate detection of freeform surface shape errors, which is applicable to various surface shapes and interference structures.
Patent Information
- Application Number
- CN202610250044.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-03-03
- Publication Date
- 2026-06-23
AI Technical Summary
Existing adaptive interferometers struggle to form or distinguish interference fringes when dealing with large deviations from freeform surfaces, leading to measurement failures and an inability to effectively detect surface shape errors with large deviations from freeform surfaces.
An adaptive measurement method based on Fourier spot analysis is adopted. By analyzing the distribution characteristics of Fourier spot on the surface, dynamic compensation is performed using a liquid crystal spatial light modulator. The compensation wavefront is optimized by combining a non-metaphorical metaheuristic algorithm of the population and a fourth-order Jung-Kutta algorithm to achieve zero-position testing.
It expands the adaptive interferometry measurement range, enabling rapid and accurate detection of large surface deviations from freeform surfaces. It possesses global search and local refinement capabilities, is applicable to various surface shapes and interference structures, and offers fast measurement speed and high accuracy.