Method and device for evaluating performance of quantum operation gate, electronic equipment and storage medium

Abstract

This application discloses a method, apparatus, electronic device, and storage medium for evaluating the performance of quantum operation gates. The method includes: inserting a delay of a target duration between adjacent Clifford gates in a quantum benchmark test sequence to obtain a first benchmark test sequence; determining a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; the target duration is n times the duration of a pulse operation gate rotating 90° around a target axis; inserting n pulse operation gates rotating 90° around a target axis between adjacent Clifford gates in a purity random benchmark test sequence to obtain a second benchmark test sequence; determining a second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence; using the difference between the second incoherent error and the first incoherent error as the target incoherent error; and evaluating the performance of the quantum operation gate based on the target incoherent error, thereby realizing the performance evaluation of microwave generating devices and microwave transmission links.

Description

Technical Field

[0001] This application relates to the field of quantum computing technology, and more specifically, to a method, apparatus, electronic device, and storage medium for evaluating the performance of quantum operation gates. Background Technology

[0002] The total error of a quantum operation gate includes coherent error and incoherent error. Coherent error refers to the error caused by predictable but incorrect operations or noise affecting the system, while incoherent error refers to the loss of information or decoherence of quantum states due to random interactions with the environment during evolution. Incoherent errors mainly include errors caused by relaxation processes, errors caused by dephase processes, and errors caused by random jitter and instability of microwave pulse amplitude.

[0003] In related technologies, the main focus for incoherent errors is on the relaxation process and dephase process, which are the two causes of incoherent errors. However, it is impossible to measure incoherent errors caused by random jitter and instability of microwave pulse amplitude, which makes it impossible to evaluate the performance of microwave generating devices and microwave transmission links.

[0004] Therefore, how to evaluate the performance of microwave generating devices and microwave transmission links is a technical problem that needs to be solved by those skilled in the art. Summary of the Invention

[0005] The purpose of this application is to provide a method, apparatus, electronic device, and computer-readable storage medium for evaluating the performance of quantum manipulation gates, thereby enabling the performance evaluation of microwave generating devices and microwave transmission links.

[0006] To achieve the above objectives, this application provides a method for evaluating the performance of quantum operation gates, comprising:

[0007] A first benchmark sequence is obtained by inserting a delay of a target duration between adjacent Clifford gates in a quantum benchmark sequence, and a first incoherent error is determined based on the quantum benchmark sequence and the first benchmark sequence; wherein, the Clifford gates in the quantum benchmark sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis;

[0008] A second benchmark sequence is obtained by inserting n pulse-operated gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark sequence, and a second incoherent error is determined based on the purity random benchmark sequence and the second benchmark sequence; wherein, the Clifford gates in the purity random benchmark sequence are randomly selected;

[0009] The difference between the second incoherent error and the first incoherent error is taken as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter;

[0010] The performance of quantum manipulation gates is evaluated based on the target incoherent error.

[0011] The step of inserting a delay of a target duration between adjacent Clifford gates in the quantum benchmark sequence to obtain the first benchmark sequence includes:

[0012] The first benchmark sequence is obtained by inserting a delay of the target duration between adjacent Clifford gates in the purity random benchmark sequence.

[0013] Alternatively, a delay of the target duration can be inserted between adjacent Clifford gates in a random benchmark sequence to obtain the first benchmark sequence.

[0014] Wherein, if the quantum benchmark sequence is a purity random benchmark sequence, then determining the first incoherent error based on the quantum benchmark sequence and the first benchmark sequence includes:

[0015] The qubits of the purity random benchmark test sequence are initialized in the |0> state, a first decay curve of purity is determined based on the purity random benchmark test sequence, and a first unitary value is determined based on the first decay curve.

[0016] The qubits of the first benchmark test sequence are initialized in the |0> state, a second decay curve of purity is determined based on the first benchmark test sequence, and a second unitary value is determined based on the second decay curve.

[0017] The third incoherent error is determined based on the first unitivity and the second unitivity;

[0018] Accordingly, the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error, including:

[0019] The difference between the second incoherent error and the third incoherent error is taken as the target incoherent error.

[0020] Wherein, if the quantum benchmark sequence is a random benchmark sequence, then determining the first incoherent error based on the quantum benchmark sequence and the first benchmark sequence includes:

[0021] The qubits of the random benchmark test sequence are initialized in the |0> state. A third decay curve for the probability of recovering the |0> state is determined based on the random benchmark test sequence, and a first decoherence coefficient is determined based on the third decay curve.

[0022] The qubits of the first benchmark test sequence are initialized in the |0> state. A fourth decay curve is determined based on the first benchmark test sequence to determine the probability of recovering the |0> state. A second decoherence coefficient is determined based on the fourth decay curve.

[0023] The fourth incoherence error is determined based on the first decoherence coefficient and the second decoherence coefficient;

[0024] Accordingly, the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error, including:

[0025] The difference between the second incoherent error and the fourth incoherent error is taken as the target incoherent error.

[0026] The step of determining the second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence includes:

[0027] The qubits of the purity random benchmark test sequence are initialized in the |0> state, a first decay curve of purity is determined based on the purity random benchmark test sequence, and a first unitary value is determined based on the first decay curve.

[0028] The qubits of the second benchmark test sequence are initialized in the |0> state. A fifth decay curve of purity is determined based on the second benchmark test sequence, and a third unitary value is determined based on the fifth decay curve.

[0029] The second incoherent error is determined based on the first unitaryness and the third unitaryness.

[0030] The performance evaluation of the quantum operation gate based on the target incoherent error includes:

[0031] The noise power spectrum of the microwave control system for the quantum bits is determined based on the target incoherent error and used as the performance evaluation result of the quantum operation gate.

[0032] Wherein, the noise power spectrum of the microwave control system for determining qubits based on the target incoherent error is used as the performance evaluation result of the quantum operation gate, including:

[0033] The noise power spectrum of the microwave control system of the qubit is determined based on the target incoherent error and the relationship between the target incoherent error and the noise power spectrum, and the noise power spectrum is used as the performance evaluation result of the quantum operation gate.

[0034] The relationship between the target incoherence error and the noise power spectrum is as follows:

[0035] ;

[0036] in, For the preset duration, The target incoherence error, Angular frequency, This is the noise power spectrum.

[0037] To achieve the above objectives, this application provides a quantum operation gate performance evaluation device, comprising:

[0038] The first testing module is used to insert a delay of a target duration between adjacent Clifford gates in a quantum benchmark test sequence to obtain a first benchmark test sequence, and to determine a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; wherein, the Clifford gates in the quantum benchmark test sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis;

[0039] The second testing module is used to insert n pulse operation gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark test sequence to obtain a second benchmark test sequence, and to determine a second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence; wherein, the Clifford gates in the purity random benchmark test sequence are randomly selected;

[0040] The determining module is used to take the difference between the second incoherent error and the first incoherent error as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter;

[0041] The performance evaluation module is used to evaluate the performance of the quantum operation gate based on the target incoherent error.

[0042] To achieve the above objectives, this application provides an electronic device, comprising:

[0043] Memory, used to store computer programs;

[0044] A processor, used to implement the steps of the quantum operation gate performance evaluation method described above when executing the computer program.

[0045] To achieve the above objectives, this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the quantum operation gate performance evaluation method described above.

[0046] As can be seen from the above scheme, the quantum operation gate performance evaluation method provided in this application includes: inserting a delay of a target duration between adjacent Clifford gates in a quantum benchmark test sequence to obtain a first benchmark test sequence, and determining a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; wherein, the Clifford gates in the quantum benchmark test sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis; adjacent... A second benchmark sequence is obtained by inserting n pulse operation gates rotating 90° around the target axis between Clifford gates, and a second incoherent error is determined based on the purity random benchmark sequence and the second benchmark sequence; wherein, the Clifford gates in the purity random benchmark sequence are randomly selected; the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter; the performance of the quantum operation gates is evaluated based on the target incoherent error.

[0047] The quantum operation gate performance evaluation method provided in this application uses a quantum benchmark test sequence and an inserted delayed quantum benchmark test sequence to measure the incoherent errors caused by relaxation and dephase processes, i.e., the first incoherent error. This first incoherent error can be the fourth incoherent error calculated using a random benchmark test sequence as the quantum benchmark test sequence, or the third incoherent error calculated using a purity random benchmark test sequence as the quantum benchmark test sequence. Furthermore, the overall incoherent error, i.e., the second incoherent error, is measured using a purity random benchmark test sequence and a purity random benchmark test sequence with a pulse operation gate inserted at a 90° rotation around the target axis. The difference between the second and first incoherent errors is the incoherent error caused by microwave pulse amplitude jitter, i.e., the target incoherent error. Based on the incoherent errors, the performance of microwave generating devices and microwave transmission links can be evaluated. This application also discloses a quantum operation gate performance evaluation device, an electronic device, and a computer-readable storage medium, which can achieve the same technical effects.

[0048] It should be understood that the above general description and the following detailed description are merely exemplary and do not limit this application. Attached Figure Description

[0049] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort. The drawings are used to provide a further understanding of this disclosure and constitute a part of the specification. They are used together with the following detailed description to explain this disclosure, but do not constitute a limitation of this disclosure. In the drawings:

[0050] Figure 1 This is a flowchart illustrating a method for evaluating the performance of quantum manipulation gates according to an exemplary embodiment;

[0051] Figure 2 This is a schematic diagram illustrating a random benchmark sequence according to an exemplary embodiment;

[0052] Figure 3 This is a schematic diagram illustrating a purity random benchmark test sequence according to an exemplary embodiment;

[0053] Figure 4 This is a schematic diagram illustrating a first benchmark test sequence according to an exemplary embodiment;

[0054] Figure 5 This is a schematic diagram illustrating another first benchmark test sequence according to an exemplary embodiment;

[0055] Figure 6 This is a schematic diagram illustrating a second benchmark test sequence according to an exemplary embodiment;

[0056] Figure 7 A flowchart illustrating another method for evaluating the performance of quantum operation gates according to an exemplary embodiment;

[0057] Figure 8 This is a structural diagram illustrating a quantum operation gate performance evaluation device according to an exemplary embodiment;

[0058] Figure 9 This is a structural diagram of an electronic device according to an exemplary embodiment. Detailed Implementation

[0059] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. Furthermore, in the embodiments of this application, "first," "second," etc., are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0060] This application discloses a method for evaluating the performance of quantum manipulation gates, which enables the evaluation of the performance of microwave generators and microwave transmission links.

[0061] See Figure 1 A flowchart illustrating a method for evaluating the performance of quantum operation gates according to an exemplary embodiment is shown below. Figure 1 As shown, it includes:

[0062] S101: Insert a delay of a target duration between adjacent Clifford gates in the quantum benchmark test sequence to obtain a first benchmark test sequence, and determine a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; wherein, the Clifford gates in the quantum benchmark test sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis;

[0063] The execution subject of this embodiment can be a quantum computer. The purpose of this embodiment is to measure the incoherent error caused by microwave pulse amplitude jitter in the quantum operation gate, thereby realizing the performance evaluation of microwave generating devices and microwave transmission links.

[0064] In this step, the quantum benchmark sequence is first defined. In this embodiment, the quantum benchmark sequence can be a randomized benchmarking sequence or a purity benchmarking sequence. Randomized benchmarking sequences include Clifford gate sequences, rotation recovery gates, and measurement gates, such as... Figure 2 As shown, Figure 2 In this context, C represents the Clifford gate, which is randomly selected; R represents the rotation recovery gate; and M represents the measurement gate. In a randomized benchmark sequence, M only includes I (no operating gate). A purity benchmarking sequence is shown below. Figure 3As shown, it includes the Clifford gate sequence and the measurement gate. The Clifford gate is randomly selected. M includes I (no operation gate), X (90° rotation pulse operation gate in the X direction), and Y (90° rotation pulse operation gate in the Y direction).

[0065] Secondly, a delay of a target duration is inserted between adjacent Clifford gates in the quantum benchmark sequence to obtain the first benchmark sequence, with a target duration of [missing value]. , The duration of the pulse operation gate is defined as the rotation of the target axis by 90°. The target axis can be either the X-axis or the Y-axis.

[0066] As a feasible implementation, the quantum benchmark sequence is a random benchmark sequence. A first benchmark sequence is obtained by inserting a delay of the target duration between adjacent Clifford gates in the random benchmark sequence. Using this implementation, the first benchmark sequence is as follows: Figure 4 As shown.

[0067] As another feasible implementation, the quantum benchmark sequence is a purity-randomized benchmark sequence. A first benchmark sequence is obtained by inserting a delay of a target duration between adjacent Clifford gates in the purity-randomized benchmark sequence. Using this implementation, the first benchmark sequence is as follows: Figure 5 As shown.

[0068] It should be noted that, compared with ordinary random benchmark sequences, purity random benchmark sequences completely eliminate the influence of coherent errors, thus improving the accuracy of measuring incoherent errors.

[0069] Furthermore, quantum benchmark sequences and quantum benchmark sequences with insertion delays are used to measure the incoherent errors caused by relaxation and dephase processes, which are also known as the first incoherent errors.

[0070] As a possible implementation, if the quantum benchmark sequence is a random benchmark sequence, then determining the first incoherence error based on the quantum benchmark sequence and the first benchmark sequence includes: initializing the qubits of the random benchmark sequence in the |0> state, determining a third decay curve for the probability of recovering the |0> state based on the random benchmark sequence, and determining a first decoherence coefficient based on the third decay curve; initializing the qubits of the first benchmark sequence in the |0> state, determining a fourth decay curve for the probability of recovering the |0> state based on the first benchmark sequence, and determining a second decoherence coefficient based on the fourth decay curve; and determining a fourth incoherence error based on the first decoherence coefficient and the second decoherence coefficient.

[0071] In practice, the qubits of the random benchmark sequence are initialized in the |0> state, a standard initial state in quantum computing. By executing the random benchmark sequence and measuring the decay of the |0> state probability as the number of Clifford gates increases, a decay curve for recovering the |0> state probability, also known as the third decay curve, is obtained. This curve describes the decay of the quantum gate sequence's ability to maintain its initial quantum state properties. Based on the third decay curve, the first decoherence coefficient can be calculated, which measures the quality of the quantum operation gate operation. The closer the decoherence coefficient is to 1, the smaller the error of the quantum operation gate operation, and the higher the quality of the quantum operation gate operation. Furthermore, the same operation and measurement are performed on the first benchmark sequence to obtain the fourth decay curve for recovering the |0> state probability. Based on the fourth decay curve, the second decoherence coefficient can be calculated. Therefore, the fourth incoherence error is determined based on the first and second decoherence coefficients, using the following formula:

[0072] ;

[0073] in, The duration of the insertion delay. For insertion time of The fourth incoherent error corresponding to the delay, where d is the dimension of the qubit system, and the dimension of the qubit system is d=2. k k is the number of qubits. This is the first decoherence coefficient. For insertion time of The second decoherence coefficient corresponding to the delay.

[0074] As another feasible implementation, if the quantum benchmark test sequence is a purity random benchmark test sequence, then determining the first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence includes: initializing the qubits of the purity random benchmark test sequence in the |0> state; determining a first decay curve of purity based on the purity random benchmark test sequence; and determining a first unitary value based on the first decay curve; initializing the qubits of the first benchmark test sequence in the |0> state; determining a second decay curve of purity based on the first benchmark test sequence; and determining a second unitary value based on the second decay curve; and determining a third incoherent error based on the first unitary value and the second unitary value.

[0075] In practice, the qubits of the purity random benchmark sequence are initialized in the |0> state, which is a standard starting state in quantum computing. By executing the purity random benchmark sequence and measuring the decay of quantum state purity with increasing Clifford gate count, a purity decay curve, also known as the first decay curve, is obtained. This curve describes the decay of the quantum gate sequence's ability to maintain its initial quantum state properties. Based on the first decay curve, the first unitary value can be calculated, which measures the ability of quantum operation gates to maintain quantum state purity. A higher unitary value indicates a smaller incoherent error in the quantum operation gates, and thus a higher quality quantum operation gate. Furthermore, the same operation and measurement are performed on the first benchmark sequence to obtain a second purity decay curve. Based on this second decay curve, a second unitary value can be calculated. Therefore, the third incoherent error is determined based on the first and second unitary values, using the following formula:

[0076] ;

[0077] in, The duration of the insertion delay. For insertion time of The third incoherent error corresponding to the delay, where d is the dimension of the qubit system, and the dimension of the qubit system is d=2. k k is the number of qubits. It is the first unitary degree. For insertion time of The second unitary degree corresponding to the delay.

[0078] Compared to ordinary random benchmark sequences, purity random benchmark sequences completely eliminate the influence of coherent errors, thus improving the accuracy of measuring incoherent errors.

[0079] S102: Insert n pulse operation gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark test sequence to obtain a second benchmark test sequence, and determine a second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence; wherein, the Clifford gates in the purity random benchmark test sequence are randomly selected;

[0080] In this step, n pulse-operated gates rotating 90° around the target axis are inserted between adjacent Clifford gates in the purity random benchmark sequence to obtain a second benchmark sequence. The target axis can be either the X-axis or the Y-axis. Taking the X-axis as an example, the second benchmark sequence is as follows: Figure 6 As shown.

[0081] Furthermore, the overall incoherent error, i.e. the second incoherent error, is measured using a purity random benchmark sequence and a purity random benchmark sequence with an inserted rotating pulse operation gate.

[0082] As a possible implementation, determining the second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence includes: initializing the qubits of the purity random benchmark test sequence in the |0> state; determining a first decay curve of purity based on the purity random benchmark test sequence; and determining a third unitary value based on the first decay curve; initializing the qubits of the second benchmark test sequence in the |0> state; determining a fifth decay curve of purity based on the second benchmark test sequence; and determining a fourth unitary value based on the fifth decay curve; and determining the second incoherent error based on the third unitary value and the fourth unitary value.

[0083] In practice, the method for calculating the second incoherent error is similar to the method for calculating the third incoherent error based on unitaryness. The second incoherent error is determined according to the formula for calculating the second incoherent error, which is as follows:

[0084] ;

[0085] in, The duration of the insertion delay. The second incoherent error is given by the delay of inserting n pulse operation gates rotating 90° around the target axis, where d is the dimension of the qubit system, and the dimension of the qubit system is d=2. k k is the number of qubits, u ref The third unitary degree, u is the value at which the insertion time is... The fourth unitary degree corresponding to the delay.

[0086] S103: The difference between the second incoherent error and the first incoherent error is taken as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter;

[0087] In this step, the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error caused by microwave pulse amplitude jitter, i.e., the target incoherent error. .

[0088] If a random benchmark sequence is used as the quantum benchmark sequence in step S101 to calculate the fourth incoherent error, then in this step, the difference between the second incoherent error and the fourth incoherent error is taken as the target incoherent error.

[0089] If a purity random benchmark test sequence is used as a quantum benchmark test sequence in step S101 to calculate the third incoherent error, then in this step, the difference between the second incoherent error and the third incoherent error is taken as the target incoherent error.

[0090] S104: Evaluate the performance of the quantum operation gate based on the target incoherent error.

[0091] In this step, the performance evaluation result of the quantum operation gate can be determined based on the target incoherent error. In specific implementations, the calculated target incoherent error can be directly used as the performance evaluation result of the quantum operation gate, or other indicators for evaluating the performance of the quantum operation gate can be further calculated based on the target incoherent error. This embodiment does not impose specific limitations.

[0092] As a feasible implementation method, the performance evaluation of the quantum operation gate based on the target incoherent error includes: determining the noise power spectrum of the microwave control system of the quantum bit as the performance evaluation result of the quantum operation gate based on the target incoherent error.

[0093] In this embodiment, the noise power spectrum of the microwave control system for the qubit is further calculated based on the calculated target incoherence error as a performance evaluation result for the quantum operation gate. The noise power spectrum is a function describing the power distribution of a noise signal across different frequency ranges. It reflects the power intensity of the noise at each frequency component and provides detailed information about the noise characteristics of the qubit's environment.

[0094] As a feasible implementation, the step of determining the noise power spectrum of the microwave control system of the qubit based on the target incoherent error as the performance evaluation result of the quantum operation gate includes: determining the noise power spectrum of the microwave control system of the qubit based on the target incoherent error and the relationship between the target incoherent error and the noise power spectrum, and using the noise power spectrum as the performance evaluation result of the quantum operation gate.

[0095] The relationship between the target incoherence error and the noise power spectrum is as follows:

[0096] ;

[0097] in, For the preset duration, The target incoherence error, Angular frequency, This is the noise power spectrum.

[0098] As can be seen from the above, this embodiment continuously changes the value of n, thereby continuously changing the insertion delay duration. And the number of pulse operation gates inserted that rotate 90° around the target axis, repeat steps S101-S103, and test the target incoherence error corresponding to different numbers of n. The noise power spectrum is calculated using the methods described above. This allows for the testing of the noise characteristics of microwave amplitudes on timescales relevant to quantum computing, within the operating environment of qubits.

[0099] The quantum operation gate performance evaluation method provided in this application uses a quantum benchmark test sequence and an inserted delayed quantum benchmark test sequence to measure the incoherent errors caused by relaxation and dephase processes, i.e., the first incoherent errors. Here, the first incoherent error can be the fourth incoherent error calculated using a random benchmark test sequence as the quantum benchmark test sequence, i.e., the third incoherent error calculated using a purity random benchmark test sequence as the quantum benchmark test sequence. Further, the overall incoherent error, i.e., the second incoherent error, is measured using a purity random benchmark test sequence and a purity random benchmark test sequence with a pulse operation gate inserted around the target axis at 90° rotation. The difference between the second incoherent error and the first incoherent error is the incoherent error caused by microwave pulse amplitude jitter, i.e., the target incoherent error. Based on the incoherent error, the performance evaluation of microwave generating devices and microwave transmission links can be realized.

[0100] This application discloses a method for evaluating the performance of quantum operation gates. Compared with the previous embodiment, this embodiment further explains and optimizes the technical solution. Specifically:

[0101] See Figure 7 A flowchart illustrating another method for evaluating the performance of quantum operation gates according to an exemplary embodiment, as shown below. Figure 7 As shown, it includes:

[0102] S201: Initialize the qubits of the purity random benchmark test sequence in the |0> state, determine the first decay curve of purity based on the purity random benchmark test sequence, and determine the first unitary value according to the first decay curve; wherein, the Clifford gate in the purity random benchmark test sequence is randomly selected;

[0103] In specific implementation, the purity random benchmark test sequence includes multiple first subsequence groups, each first subsequence group includes multiple first subsequences, and each first subsequence includes a Clifford gate sequence and a measurement gate. The Clifford gates in the Clifford gate sequence are randomly selected. The Clifford gate sequences of different first subsequences in the same first subsequence group have the same sequence length. The measurement gates of different first subsequences in the same first subsequence group are respectively a no-operation gate, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction. The Clifford gate sequences of the first subsequences in different first subsequence groups have different sequence lengths.

[0104] For example, the first subsequence group 1 includes the first subsequence 11, the first subsequence 12, and the first subsequence 13. The Clifford gate sequence in the first subsequence 11, the first subsequence 12, and the first subsequence 13 all have a sequence length of 5. The first subsequence 11 needs to be run three times: the first measurement gate is a no-operation gate, the second measurement gate is a 90° rotation pulse operation gate in the X direction, and the third measurement gate is a 90° rotation pulse operation gate in the Y direction. The first subsequence 12 needs to be run three times: the first measurement gate is a no-operation gate, the second measurement gate is a 90° rotation pulse operation gate in the X direction, and the third measurement gate is a 90° rotation pulse operation gate in the Y direction. The first subsequence 13 needs to be run three times: the first measurement gate is a no-operation gate, the second measurement gate is a 90° rotation pulse operation gate in the X direction, and the third measurement gate is a 90° rotation pulse operation gate in the Y direction. The first subsequence group 2 includes the first subsequence 21, the first subsequence 22, and the first subsequence 23. The Clifford gate sequence in the first subsequence 21, the first subsequence 22, and the first subsequence 23 all have a sequence length of 10. The first subsequence 21 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction. The first subsequence 22 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction. The first subsequence 23 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction. The first subsequence group 3 includes the first subsequence 31, the first subsequence 32, and the first subsequence 33. The Clifford gate sequence in the first subsequence 31, the first subsequence 32, and the first subsequence 33 all have a sequence length of 15. The first subsequence 31 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction. The first subsequence 32 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction. The first subsequence 33 needs to be run three times. The first measurement gate is set to no operation, the second measurement gate is set to a 90° rotation pulse operation gate in the X direction, and the third measurement gate is set to a 90° rotation pulse operation gate in the Y direction.

[0105] Furthermore, the purity of the qubits corresponding to each first subsequence group is measured sequentially. Taking the target first subsequence group as an example, which contains multiple target first subsequences, the qubits of these multiple target first subsequences are initialized to the |0> state. Using a measurement gate without operation, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, the purity of the qubits under the action of each target first subsequence is measured. The average purity of the qubits under the action of multiple target first subsequences is taken as the purity of the qubits corresponding to the target first subsequence group. Based on the measured purity of the qubits corresponding to each first subsequence group and the sequence length of the Clifford gate sequence of the first subsequence in each first subsequence group, a curve of purity versus the sequence length of the Clifford gate sequence is fitted to obtain the first decay curve. The first decay curve describes how the purity of the quantum state decays with the increase of the sequence length. The first decay curve can be expressed as... , where m is the sequence length of the Clifford gate sequence in the first subsequence, and A and B are parameters obtained when fitting the curve. Let P(m) be the purity measured from the first subsequence containing a Clifford gate sequence of length m, representing the first unitary value. The first unitary value can be determined based on the fitted first decay curve. .

[0106] S202: Insert a delay of a target duration between adjacent Clifford gates in the purity random benchmark test sequence to obtain a first benchmark test sequence; wherein, the target duration is n times a preset duration, n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis;

[0107] In this step, a delay of the target duration is inserted between adjacent Clifford gates in each first subsequence to obtain the corresponding second subsequence, where the target duration is... , The duration of the pulse operation gate, which rotates 90° around the target axis, can be either the X-axis or the Y-axis. That is, after inserting the delay, multiple second subsequence groups are obtained. Each second subsequence group contains several second subsequences, including a Clifford gate sequence and measurement gates. The Clifford gates in the Clifford gate sequence are randomly selected. The Clifford gate sequences in different second subsequences within the same second subsequence group have the same sequence length. The measurement gates are, respectively, a no-operation gate, a 90° rotation pulse operation gate in the X-direction, and a 90° rotation pulse operation gate in the Y-direction. The sequence lengths of the Clifford gate sequences in the second subsequences within different second subsequence groups are different.

[0108] S203: Initialize the qubits of the first benchmark test sequence in the |0> state, determine the second decay curve of purity based on the first benchmark test sequence, and determine the second unitaryness according to the second decay curve;

[0109] In practice, the purity of the qubits corresponding to each second subsequence group is measured sequentially. Taking the target second subsequence group as an example, which contains multiple target second subsequences, the qubits of these multiple target second subsequences are initialized to the |0> state. The purity of the qubits under the influence of each target second subsequence is measured using a measurement gate without operation, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction. The average purity of the qubits under the influence of multiple target second subsequences is taken as the purity of the qubits corresponding to the target second subsequence group. Based on the measured purity of the qubits corresponding to each second subsequence group and the sequence length of the Clifford gate sequence of the second subsequence in each second subsequence group, a curve of purity versus the sequence length of the Clifford gate sequence is fitted to obtain a second decay curve. The second decay curve describes how the purity of the quantum state decays with increasing sequence length. The second decay curve can be expressed as follows: , where m is the sequence length of the Clifford gate sequence in the second subsequence. and These are the parameters obtained when fitting the curve. Let P(m) be the purity of the second subsequence containing a Clifford gate sequence of length m. The second unitaryness can be determined based on the fitted second decay curve.

[0110] S204: Determine the third incoherent error based on the first unitaryness and the second unitaryness;

[0111] In this step, the third incoherent error is determined based on the first and second unitary values, using the following formula:

[0112] ;

[0113] in, The duration of the insertion delay. For insertion time of The third incoherent error corresponding to the delay, where d is the dimension of the qubit system, and the dimension of the qubit system is d=2. k k is the number of qubits. It is the first unitary degree. For insertion time of The second unitary degree corresponding to the delay.

[0114] S205: Insert n pulse operation gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark test sequence to obtain a second benchmark test sequence;

[0115] In this step, n 90° rotation pulse operation gates around the target axis are inserted between adjacent Clifford gates in each first subsequence to obtain the corresponding third subsequence. That is, after inserting n 90° rotation pulse operation gates around the target axis, multiple third subsequence groups are obtained. Each third subsequence group contains several third subsequences. The Clifford gate sequences of different third subsequences in the same third subsequence group have the same sequence length. The measurement gates are no operation gate, 90° rotation pulse operation gate in the X direction, and 90° rotation pulse operation gate in the Y direction, respectively. The Clifford gate sequences of the third subsequences in different third subsequence groups have different sequence lengths.

[0116] S206: Initialize the qubits of the second benchmark test sequence in the |0> state, determine the fifth decay curve of purity based on the second benchmark test sequence, and determine the third unitaryness according to the fifth decay curve;

[0117] In this step, the purity of the qubits corresponding to each third subsequence group is measured sequentially. Taking the target third subsequence group as an example, which contains multiple target third subsequences, the qubits of these multiple target third subsequences are initialized to the |0> state. Using a measurement gate without operation, a 90° rotation pulse operation gate in the X direction, and a 90° rotation pulse operation gate in the Y direction, the purity of the qubits under the action of each target third subsequence is measured. The average purity of the qubits under the action of multiple target third subsequences is taken as the purity of the qubits corresponding to the target third subsequence group. Based on the measured purity of the qubits corresponding to each third subsequence group and the sequence length of the Clifford gate sequence of the third subsequence in each group, a curve of purity versus the sequence length of the Clifford gate sequence is fitted to obtain the fifth decay curve. The fifth decay curve describes how the purity of the quantum state decays with increasing sequence length. The fifth decay curve can be represented as follows: , where m is the sequence length of the Clifford gate sequence in the third subsequence. and These are the parameters obtained when fitting the curve, where u is the third unitary value and P(m) is the purity measured from the third subsequence containing a Clifford gate sequence of length m. The third unitary value can be determined based on the fitted fifth decay curve.

[0118] S207: Determine the second incoherent error based on the first unitaryness and the third unitaryness;

[0119] In this step, the second incoherent error is determined according to the formula for calculating the second incoherent error. The formula for calculating the second incoherent error is as follows:

[0120] ;

[0121] in, The duration of the insertion delay. The second incoherent error is given by the delay of inserting n pulse operation gates rotating 90° around the target axis, where d is the dimension of the qubit system, and the dimension of the qubit system is d=2. k k is the number of qubits, u ref Let u be the first unitary degree, and u be the value at which the insertion time is... The corresponding third unitary degree under the condition of delay.

[0122] S208: The difference between the second incoherent error and the third incoherent error is taken as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter;

[0123] In this step, the difference between the second incoherent error and the third incoherent error is taken as the target incoherent error caused by microwave pulse amplitude jitter, i.e., the target incoherent error. .

[0124] S209: The noise power spectrum of the microwave control system for the quantum bits is determined based on the target incoherent error and used as the performance evaluation result of the quantum operation gate.

[0125] In this embodiment, the noise power spectrum of the microwave control system for the qubits is further calculated based on the calculated target incoherence error as the performance evaluation result of the quantum operation gate. The relationship between the target incoherence error and the noise power spectrum is as follows:

[0126] ;

[0127] in, For the preset duration, The target incoherence error, Angular frequency, This is the noise power spectrum.

[0128] As can be seen from the above, this embodiment continuously changes the value of n, thereby continuously changing the insertion delay duration. And the number of pulse operation gates inserted that rotate 90° around the target axis, repeat steps S201-S208, and test the target incoherence error corresponding to different numbers of n. The noise power spectrum is calculated using the methods described above. This allows for the testing of the noise characteristics of microwave amplitudes on timescales relevant to quantum computing, within the operating environment of qubits.

[0129] Therefore, this embodiment, based on a purity random benchmark test sequence, achieves the measurement of incoherent errors caused by microwave pulse amplitude jitter and the noise characteristics of the quantum bit environment on a time scale related to quantum operation gates. It can completely eliminate interference caused by coherent errors, thereby accurately evaluating the performance of microwave generating devices and microwave transmission links.

[0130] The following describes a quantum operation gate performance evaluation device provided in the embodiments of this application. The quantum operation gate performance evaluation device described below and the quantum operation gate performance evaluation method described above can be referred to each other.

[0131] See Figure 8 A structural diagram of a quantum operation gate performance evaluation device is shown according to an exemplary embodiment, as follows: Figure 8 As shown, it includes:

[0132] The first test module 100 is used to insert a delay of a target duration between adjacent Clifford gates in a quantum benchmark test sequence to obtain a first benchmark test sequence, and to determine a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; wherein, the Clifford gates in the quantum benchmark test sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis;

[0133] The second test module 200 is used to insert n pulse operation gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark test sequence to obtain a second benchmark test sequence, and to determine a second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence; wherein, the Clifford gates in the purity random benchmark test sequence are randomly selected;

[0134] The determining module 300 is used to take the difference between the second incoherent error and the first incoherent error as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter;

[0135] The performance evaluation module 400 is used to evaluate the performance of the quantum operation gate based on the target incoherent error.

[0136] The quantum operation gate performance evaluation device provided in this application uses a quantum benchmark test sequence and an inserted delayed quantum benchmark test sequence to measure the incoherent error caused by relaxation process and dephase process, which is the first incoherent error. It uses a purity random benchmark test sequence and a purity random benchmark test sequence with an inserted pulse operation gate rotating 90° around the target axis to measure the overall incoherent error, which is the second incoherent error. The difference between the second incoherent error and the first incoherent error is the incoherent error caused by microwave pulse amplitude jitter, which is the target incoherent error. Based on the incoherent error, the performance evaluation of microwave generating devices and microwave transmission links can be realized.

[0137] Based on the above embodiments, as a preferred embodiment, the first test module 100 is specifically used to: insert a delay of a target duration between adjacent Clifford gates in a purity random benchmark test sequence to obtain a first benchmark test sequence, or to insert a delay of a target duration between adjacent Clifford gates in a random benchmark test sequence to obtain a first benchmark test sequence.

[0138] Based on the above embodiments, as a preferred implementation, if the quantum benchmark test sequence is a purity random benchmark test sequence, then the first test module 100 is specifically used to: initialize the qubits of the purity random benchmark test sequence in the |0> state; determine a first decay curve of purity based on the purity random benchmark test sequence; and determine a first unitary value based on the first decay curve; initialize the qubits of the first benchmark test sequence in the |0> state; determine a second decay curve of purity based on the first benchmark test sequence; and determine a second unitary value based on the second decay curve; and determine a third incoherent error based on the first unitary value and the second unitary value.

[0139] Accordingly, the determining module 300 is specifically used to: take the difference between the second incoherent error and the third incoherent error as the target incoherent error.

[0140] Based on the above embodiments, as a preferred implementation, if the quantum benchmark test sequence is a random benchmark test sequence, then the first test module 100 is specifically used to: initialize the qubits of the random benchmark test sequence in the |0> state; determine a third decay curve for the probability of recovering the |0> state based on the random benchmark test sequence; and determine a first decoherence coefficient based on the third decay curve; initialize the qubits of the first benchmark test sequence in the |0> state; determine a fourth decay curve for the probability of recovering the |0> state based on the first benchmark test sequence; and determine a second decoherence coefficient based on the fourth decay curve; and determine a fourth incoherence error based on the first decoherence coefficient and the second decoherence coefficient.

[0141] Accordingly, the determining module 300 is specifically used to: take the difference between the second incoherent error and the fourth incoherent error as the target incoherent error.

[0142] Based on the above embodiments, as a preferred implementation, the second test module 200 is specifically used for: initializing the qubits of the purity random benchmark test sequence in the |0> state, determining a first decay curve of purity based on the purity random benchmark test sequence, and determining a first unitary value based on the first decay curve; initializing the qubits of the second benchmark test sequence in the |0> state, determining a fifth decay curve of purity based on the second benchmark test sequence, and determining a third unitary value based on the fifth decay curve; and determining a second incoherent error based on the first unitary value and the third unitary value.

[0143] Based on the above embodiments, as a preferred implementation, the performance evaluation module 400 is specifically used to: determine the noise power spectrum of the microwave control system of the quantum bit as the performance evaluation result of the quantum operation gate based on the target incoherent error.

[0144] Based on the above embodiments, as a preferred implementation, the performance evaluation module 400 is specifically used to: determine the noise power spectrum of the microwave control system of the quantum bit based on the target incoherent error and the relationship between the target incoherent error and the noise power spectrum, and use the noise power spectrum as the performance evaluation result of the quantum operation gate;

[0145] The relationship between the target incoherence error and the noise power spectrum is as follows:

[0146] ;

[0147] in, For the preset duration, The target incoherence error, Angular frequency, This is the noise power spectrum.

[0148] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0149] Based on the hardware implementation of the above program modules, and in order to implement the method of the embodiments of this application, the embodiments of this application also provide an electronic device. Figure 9 This is a structural diagram of an electronic device according to an exemplary embodiment, such as... Figure 9 As shown, the electronic device includes:

[0150] Communication interface 1 enables information exchange with other devices, such as network devices;

[0151] Processor 2, connected to communication interface 1, enables information exchange with other devices and, when running a computer program, executes the quantum operation gate performance evaluation method provided by one or more of the above-mentioned technical solutions. The computer program is stored in memory 3.

[0152] Of course, in practical applications, the various components in an electronic device are coupled together through bus system 4. It can be understood that bus system 4 is used to achieve communication and connection between these components. In addition to the data bus, bus system 4 also includes a power bus, a control bus, and a status signal bus. However, for clarity, in... Figure 9 The general will label all buses as Bus System 4.

[0153] The memory 3 in this embodiment is used to store various types of data to support the operation of the electronic device. Examples of such data include any computer program used to operate on the electronic device.

[0154] It is understood that memory 3 can be volatile memory or non-volatile memory, or both. Non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); magnetic surface memory can be disk storage or magnetic tape storage. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memory 3 described in the embodiments of this application is intended to include, but is not limited to, these and any other suitable types of memory.

[0155] The methods disclosed in the embodiments of this application can be applied to processor 2, or implemented by processor 2. Processor 2 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit of the hardware in processor 2 or by instructions in the form of software. The processor 2 may be a general-purpose processor, DSP, or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Processor 2 can implement or execute the methods, steps and logic block diagrams disclosed in the embodiments of this application. The general-purpose processor may be a microprocessor or any conventional processor, etc. The steps of the methods disclosed in the embodiments of this application can be directly manifested as being executed by a hardware decoding processor, or being executed by a combination of hardware and software modules in the decoding processor. The software modules may be located in a storage medium, which is located in memory 3. Processor 2 reads the program in memory 3 and completes the steps of the aforementioned method in combination with its hardware.

[0156] When processor 2 executes the program, it implements the corresponding processes in the various methods of the embodiments of this application. For the sake of brevity, these will not be described in detail here.

[0157] In an exemplary embodiment, this application also provides a storage medium, namely a computer storage medium, specifically a computer-readable storage medium, such as a memory 3 that stores a computer program, which can be executed by a processor 2 to complete the steps described in the aforementioned method. The computer-readable storage medium may be a memory such as FRAM, ROM, PROM, EPROM, EEPROM, Flash Memory, magnetic surface memory, optical disc, or CD-ROM.

[0158] Those skilled in the art will understand that all or part of the steps of the above method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it performs the steps of the above method embodiments. The aforementioned storage medium includes various media that can store program code, such as mobile storage devices, ROM, RAM, magnetic disks, or optical disks.

[0159] Alternatively, if the integrated units described above are implemented as software functional modules and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical solutions of the embodiments of this application, or the parts that contribute to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause an electronic device (which may be a personal computer, server, network device, etc.) to execute all or part of the methods described in the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as mobile storage devices, ROM, RAM, magnetic disks, or optical disks.

[0160] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A method for evaluating the performance of quantum manipulation gates, characterized in that, include: A first benchmark sequence is obtained by inserting a delay of a target duration between adjacent Clifford gates in a quantum benchmark sequence, and a first incoherent error is determined based on the quantum benchmark sequence and the first benchmark sequence; wherein, the Clifford gates in the quantum benchmark sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis; A second benchmark sequence is obtained by inserting n pulse-operated gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark sequence, and a second incoherent error is determined based on the purity random benchmark sequence and the second benchmark sequence; wherein, the Clifford gates in the purity random benchmark sequence are randomly selected; The difference between the second incoherent error and the first incoherent error is taken as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter; The performance of quantum manipulation gates is evaluated based on the target incoherent error.

2. The quantum operation gate performance evaluation method according to claim 1, characterized in that, The step of inserting a delay of a target duration between adjacent Clifford gates in the quantum benchmark sequence to obtain the first benchmark sequence includes: The first benchmark sequence is obtained by inserting a delay of the target duration between adjacent Clifford gates in the purity random benchmark sequence. Alternatively, a delay of the target duration can be inserted between adjacent Clifford gates in a random benchmark sequence to obtain the first benchmark sequence.

3. The quantum operation gate performance evaluation method according to claim 2, characterized in that, If the quantum benchmark sequence is a purity random benchmark sequence, then determining the first incoherent error based on the quantum benchmark sequence and the first benchmark sequence includes: The qubits of the purity random benchmark test sequence are initialized in the |0> state, a first decay curve of purity is determined based on the purity random benchmark test sequence, and a first unitary value is determined based on the first decay curve. The qubits of the first benchmark test sequence are initialized in the |0> state, a second decay curve of purity is determined based on the first benchmark test sequence, and a second unitary value is determined based on the second decay curve. The third incoherent error is determined based on the first unitivity and the second unitivity; Accordingly, the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error, including: The difference between the second incoherent error and the third incoherent error is taken as the target incoherent error.

4. The quantum operation gate performance evaluation method according to claim 2, characterized in that, If the quantum benchmark sequence is a random benchmark sequence, then determining the first incoherent error based on the quantum benchmark sequence and the first benchmark sequence includes: The qubits of the random benchmark test sequence are initialized in the |0> state. A third decay curve for the probability of recovering the |0> state is determined based on the random benchmark test sequence, and a first decoherence coefficient is determined based on the third decay curve. The qubits of the first benchmark test sequence are initialized in the |0> state. A fourth decay curve is determined based on the first benchmark test sequence to determine the probability of recovering the |0> state. A second decoherence coefficient is determined based on the fourth decay curve. The fourth incoherence error is determined based on the first decoherence coefficient and the second decoherence coefficient; Accordingly, the difference between the second incoherent error and the first incoherent error is taken as the target incoherent error, including: The difference between the second incoherent error and the fourth incoherent error is taken as the target incoherent error.

5. The quantum operation gate performance evaluation method according to claim 1, characterized in that, The determination of the second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence includes: The qubits of the purity random benchmark test sequence are initialized in the |0> state, a first decay curve of purity is determined based on the purity random benchmark test sequence, and a first unitary value is determined based on the first decay curve. The qubits of the second benchmark test sequence are initialized in the |0> state. A fifth decay curve of purity is determined based on the second benchmark test sequence, and a third unitary value is determined based on the fifth decay curve. The second incoherent error is determined based on the first unitaryness and the third unitaryness.

6. The quantum operation gate performance evaluation method according to claim 1, characterized in that, The performance evaluation of the quantum operation gate based on the target incoherent error includes: The noise power spectrum of the microwave control system for the quantum bits is determined based on the target incoherent error and used as the performance evaluation result of the quantum operation gate.

7. The quantum operation gate performance evaluation method according to claim 6, characterized in that, The noise power spectrum of the microwave control system for determining qubits based on the target incoherent error is used as the performance evaluation result of the quantum operation gate, including: The noise power spectrum of the microwave control system of the qubit is determined based on the target incoherent error and the relationship between the target incoherent error and the noise power spectrum, and the noise power spectrum is used as the performance evaluation result of the quantum operation gate. The relationship between the target incoherence error and the noise power spectrum is as follows: ； in, For the preset duration, The target incoherence error, Angular frequency, This is the noise power spectrum.

8. A quantum operation gate performance evaluation device, characterized in that, include: The first testing module is used to insert a delay of a target duration between adjacent Clifford gates in a quantum benchmark test sequence to obtain a first benchmark test sequence, and to determine a first incoherent error based on the quantum benchmark test sequence and the first benchmark test sequence; wherein, the Clifford gates in the quantum benchmark test sequence are randomly selected, the target duration is n times a preset duration, where n is a positive integer, and the preset duration is the duration of the pulse operation gate rotated 90° around the target axis; The second testing module is used to insert n pulse operation gates rotating 90° around the target axis between adjacent Clifford gates in the purity random benchmark test sequence to obtain a second benchmark test sequence, and to determine a second incoherent error based on the purity random benchmark test sequence and the second benchmark test sequence; wherein, the Clifford gates in the purity random benchmark test sequence are randomly selected; The determining module is used to take the difference between the second incoherent error and the first incoherent error as the target incoherent error; wherein, the target incoherent error is the incoherent error caused by microwave pulse amplitude jitter; The performance evaluation module is used to evaluate the performance of the quantum operation gate based on the target incoherent error.

9. An electronic device, characterized in that, include: Memory, used to store computer programs; A processor for executing the computer program to implement the steps of the quantum operation gate performance evaluation method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed, implements the steps of the quantum operation gate performance evaluation method as described in any one of claims 1 to 7.

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