A low-mid precision MEMS inertial measurement unit rapid test system
By combining a MEMS inertial navigation system integrated tester with an inclined fixture, rapid multi-axis testing of medium- and low-precision MEMS inertial navigation systems has been achieved, solving the problems of high testing costs and low efficiency in existing technologies and providing an efficient and low-cost testing solution.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- BEIJING AEROSPACE FEITENG EQUIPMENT TECHNOLOGY CO LTD
- Filing Date
- 2025-12-31
- Publication Date
- 2026-07-17
AI Technical Summary
Existing MEMS inertial navigation testing systems are costly and inefficient, especially in environmental testing, which is costly and makes it difficult to achieve rapid and efficient multi-axis testing.
Using a MEMS inertial group integrated tester, test cables, and a tilting fixture, the MEMS inertial group is rotated at different positions to test, achieving multi-axial data acquisition. Combined with the power supply and data acquisition functions of the MEMS inertial group integrated tester, test reports are generated.
It significantly improves the testing efficiency of MEMS inertial navigation systems, reduces costs, has high equipment integration, is suitable for rapid outdoor testing, and is scalable and portable.
Smart Images

Figure CN122408823A_ABST