Chip tester and device under test board connection structure

CN123034149APending Publication Date: 2026-11-03SHANGHAI PENGWU ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202611403734.3
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2026-09-10
Publication Date
2026-11-03

AI Technical Summary

Technical Problem

The existing SCSI100Pin connector lacks a guiding structure, which can easily lead to misalignment during insertion and removal, causing the male pins to bend or become misaligned, increasing equipment maintenance costs and downtime.

Method used

A guide is installed on the SCSI100Pin female connector, and a guide groove is designed on the male connector. The pre-alignment is achieved by the cooperation of the guide and the guide groove to avoid pin force deviation. The connector is then tightened with screws for fixation.

Benefits of technology

It reduces connector spare parts consumption, minimizes equipment downtime for maintenance, simplifies operating procedures, and lowers the overall production cost of chip testing.

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Abstract

The application discloses a chip testing machine and a DUT board connecting structure, belongs to the technical field of semiconductor production, and is used for butt joint of SCSI-100Pin connectors between the chip testing machine and the DUT board. In the prior art, SCSI-100Pin male pins are independently suspended, are locked only by means of screw columns, and have no guiding and positioning structure, so that the plug-in misalignment is prone to cause bent pins and crooked pins, and material loss and downtime cost are increased. The structure is provided with two POM guiding members on a SCSI-100Pin female seat, and guiding grooves are formed in the SCSI-100Pin male head shell in correspondence; when butt joint, the guiding members and the guiding grooves are first matched to complete pre-alignment and limiting, the joint deviation is constrained, and then the screw is locked. The scheme retains the original locking structure, has good compatibility, can avoid the deformation of the pins caused by misalignment stress, reduces the damage probability of the connector, simplifies manual alignment operation, reduces spare part replacement and equipment downtime, and reduces the comprehensive production cost of the chip testing link.
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Description

Technical Field

[0001] This invention relates to the field of semiconductor manufacturing technology, specifically to a connection structure between a chip testing machine and a device under test board. Background Technology

[0002] The SCSI 100-pin interface is a high-density parallel data interface widely used in servers, industrial control systems, and chip testing equipment. Compared to the IDE interface, the SCSI 100-pin interface features higher transmission rates, stronger multitasking capabilities, and better operational stability, and is commonly used to transmit data signals between chip testing machines and DUT boards.

[0003] The existing SCSI 100-pin connector has 100 independent suspended pins on the male end. The current connection structure relies solely on screw posts for locking and securing the connector, lacking a dedicated alignment guide. During insertion and removal assembly, misalignment can easily cause the suspended pins to bend or become misaligned. Damaged connector pins require replacement with spare parts, resulting in equipment downtime and increasing both material and time costs for semiconductor chip testing. Summary of the Invention

[0004] The purpose of this invention is to provide a connection structure between a chip tester and the board under test, which solves the problem that the existing SCSI100Pin connector has no guiding structure and that misalignment during insertion and removal can easily cause bending and skewing of the male pins, thereby reducing the overall cost of chip testing.

[0005] To solve the above-mentioned technical problems, the technical solution provided by the present invention is: a connection structure between a chip tester and a device under test board, characterized in that it includes a SCSI-100Pin male connector and a SCSI-100Pin female connector adapted to the SCSI-100Pin male connector;

[0006] The SCSI-100Pin female connector is provided with two POM material guides, and the outer shell of the SCSI-100Pin male connector is provided with two guide grooves that are slidably connected to the guides.

[0007] The SCSI-100Pin male connector has 100 independent, suspended pins.

[0008] Furthermore, the two guide members are respectively arranged on both sides of the SCSI-100Pin female connector.

[0009] Furthermore, a fixing component is provided on one side of the SCSI-100Pin male connector above the guide groove, and the guide component is fixedly installed on the fixing component of the SCSI-100Pin male connector.

[0010] The advantages of this invention compared to existing technologies are as follows: This invention adds an alignment structure of guide and guide groove to the original SCSI100Pin connector. During the assembly and docking process, the guide and guide groove first cooperate to complete the pre-positioning, constraining the positional offset between the male and female connectors, avoiding the direct effect of manual alignment deviation on the suspended pins of the male connector, reducing bent pin and crooked pin failures. This structure is compatible with the screw locking method of the original SCSI100Pin connector, with few modified parts and limited increase in material costs. It can reduce connector spare parts consumption, reduce equipment downtime for maintenance, simplify manual alignment operations, and reduce the overall production cost of chip testing. Attached Figure Description

[0011] Figure 1 This is a schematic diagram of a SCSI-100Pin male connector structure for connecting a chip tester to the board under test.

[0012] Figure 2 This is a common structural diagram in existing technologies.

[0013] Figure 3 This is a schematic diagram of the structure of the present invention.

[0014] As shown in the figure: 1. SCSI-100Pin male connector; 2. Independent suspended pin; 3. Guide component; 4. Fixing component; 5. Housing; 6. Guide groove; 7. SCSI-100Pin female connector. Detailed Implementation

[0015] The present invention will now be described in further detail with reference to the accompanying drawings.

[0016] This embodiment is a connection structure between a chip tester and a device under test (DUT) board, used for signal connection between the semiconductor chip tester and the DUT board. It includes a SCSI-100Pin male connector 1 and a SCSI-100Pin female connector adapted to the SCSI-100Pin male connector 1. The SCSI-100Pin male connector 1 is mounted on one end of the chip tester, and the SCSI-100Pin female connector 7 is arranged on one side of the DUT board. The installation positions of the male and female connectors can also be interchanged according to the overall layout of the machine.

[0017] like Figure 1 As shown, the SCSI-100Pin male connector 1 has 100 independent, suspended pins without external support or protection. Figure 2 Traditional connection methods rely solely on screw posts to lock the male and female connectors together. Without a guide and positioning structure, misalignment occurs during insertion and removal, and the suspended pins are prone to bending and deformation under stress.

[0018] like Figure 3In this embodiment, a fixing member 4 is provided on one side of the SCSI-100Pin male connector 1, and two guide members 3 are respectively located on the left and right sides of the female connector; the outer shell of the SCSI-100Pin male connector 1 is correspondingly machined into two guide grooves 6, the position and outline of the guide grooves 6 match the guide members 3, the SCSI-100Pin male connector 1 and the SCSI-100Pin female connector are installed in place, the guide members 3 press against the fixing member 4, and can be further locked by screws.

[0019] Equipment assembly and docking process: The operator moves the SCSI-100Pin male connector 1 toward the SCSI-100Pin female connector 7. First, the POM guide on the female connector slides into the guide groove 6 of the male connector housing 5. The guide 3 and the guide groove 6 cooperate with each other to constrain the horizontal offset of the male connector and the female connector, and complete the pre-alignment limit. Under the constraint of the guide structure, the 100 suspended pins of the male connector and the female connector socket can be accurately aligned. Then, tighten the screw posts to complete the locking and fixing between the male connector and the female connector.

[0020] During disassembly, first loosen the screws, and the guide groove 6 will slide smoothly out along the guide 3 to complete the connector separation.

[0021] POM material possesses excellent wear resistance and self-lubricating properties. The guide component 3 and guide groove 6 are not easily worn during repeated insertion and removal friction, resulting in a long service life. This embodiment retains the original screw-locking structure, requiring no significant modifications to the original equipment interface and offering good compatibility. The guide structure distributes the force generated by assembly misalignment deviations, preventing misalignment stress from being directly applied to the suspended male pins, significantly reducing the probability of bent or misaligned pin failures, minimizing connector spare part replacements and equipment downtime for maintenance, and lowering the overall cost of chip testing and production.

[0022] The present invention and its embodiments have been described above. This description is not restrictive, and the accompanying drawings are only one embodiment of the present invention; the actual structure is not limited thereto. In conclusion, if those skilled in the art are inspired by this description and design similar structures and embodiments without departing from the spirit of the invention, such designs should fall within the protection scope of the present invention.

Claims

1. A connection structure between a chip tester and a device under test board, characterized in that, Includes a SCSI-100Pin male connector (1) and a SCSI-100Pin female connector that is compatible with the SCSI-100Pin male connector (1); The SCSI-100Pin female connector (7) is provided with two POM material guides (3), and the outer shell (5) of the SCSI-100Pin male connector (1) is provided with two guide grooves (6) that are slidably connected to the guides (3). The SCSI-100Pin male connector (1) is equipped with 100 independent suspended pins (2).

2. The connection structure between the chip tester and the device under test board according to claim 1, characterized in that, The two guides (3) are respectively arranged on both sides of the SCSI-100Pin female connector (7).

3. The connection structure between the chip tester and the device under test board according to claim 1, characterized in that, The SCSI-100Pin male connector (1) has a fixing member (4) on one side above the guide groove (6), and the guide member (3) is fixedly installed on the fixing member (4) of the SCSI-100Pin male connector (1).