Test tool of current sensor

Abstract

The utility model discloses a testing tool of a current sensor, which relates to the technical field of chip testing and comprises the current sensor, a shell is arranged on the outer side of the current sensor, a magnetic core is arranged on the inner side of the shell, a Hall chip is arranged on the inner side of the magnetic core, pins are arranged on the side face of the Hall chip, and the pins are arranged on the side face of the Hall chip. According to the utility model, the pin part of the chip adopts the contact of the test probe for signal transmission, the test probe is fixed on the probe base, and then the test probe and the probe base are fixed on the slide block with the guide rail together, so that the purpose that the test probe is rapidly separated from or contacted with the pin of the chip is achieved; the rotatable screw on the limiting block on one side can be used for abutting against the probe base after the test probe is in contact with the chip pin, so that the probe is prevented from being separated from the pin, and the limiting effect is achieved. According to the invention, a plurality of current sensors can be conveniently tested at the same time, and the current sensors can be rapidly mounted and dismounted in a lossless manner, so that the production efficiency is remarkably improved, and the risks of chip pin deformation and the like caused by testing are reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a testing tool for a current sensor. Background Art

[0002] Hall effect current sensors utilize the Hall effect principle and offer advantages such as a small package size, wide measurement range, light weight, and low power consumption. They are widely used for AC or DC current sensing in industrial, commercial, and communications systems. They primarily consist of a low-drift linear Hall effect chip, a magnetic core, and a current conductor path with a built-in low insertion resistance. When an applied current passes through this low-resistance current conductor path, it generates a magnetic field, which the Hall effect chip converts into a voltage output proportional to the input current. The internal magnetic core effectively suppresses interference from external common-mode magnetic fields, thereby improving accuracy in noisy environments.

[0003] Before shipment, current sensors need to be tested to ensure that substandard products do not flow out. Typically, this testing process involves passing current through the chip and testing it. However, current testing methods typically inspect each current sensor individually, and the chip pins are inserted into the terminals, which can easily deform. This is time-consuming for high-volume production, reducing production efficiency. Utility Model Content

[0004] The purpose of the present utility model is to provide a test fixture for a current sensor to solve the problem that the current sensors are usually tested one by one in the current test method, and the pins of the chip are inserted into the terminals, which are prone to deformation. Therefore, for mass production, this will consume a lot of time and reduce production efficiency.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a test tool for a current sensor, comprising a current sensor, a shell is provided on the outside of the current sensor, a magnetic core is provided on the inside of the shell, a Hall chip is provided on the inside of the magnetic core, pins are provided on the side of the Hall chip, an electric wood floor is provided on the bottom of the current sensor, a toggle clamp is provided on the top of the electric wood floor and is located on the side of the current sensor, a copper bus is provided on the inside of the current sensor, and a test probe is provided on the inside of the copper bus, a guide rail is fixedly connected to the top of the guide rail, a slider is slidably connected to the top of the guide rail, a carrier is used to position and place the current sensor to be tested, the chip pins on the current sensor are supported and positioned, a test probe is used to transmit electrical signals from the pins of the contact current sensor, a probe base is used to fix the test probe, and the test probe is glued to the test pins The probe is fixed in the positioning hole of the probe base to ensure that each probe can contact the pin on the corresponding current sensor. The slider is used to fix the probe base. There are two threaded holes on the slider, and the probe base and the slider are fixed by screws. The guide rail is combined with the slider to ensure that the slider can slide back and forth on the guide rail to facilitate the contact and disengagement of the probe and the current sensor pins. The limit block is used to control the position of the slider on the guide rail to ensure that the test probe on the slider can always contact the chip pins on the current sensor and always maintain the conductive state during the test. The copper busbar is used for the series conduction of the tested circuits of multiple current sensors. The horizontal elbow clamp is used to contact the tested copper busbar on the current sensor with the tooling copper busbar with a certain pressure to ensure a small contact resistance. The bakelite substrate is the main body of the current sensor test tooling and is used to fix the carrier, guide rail, limit block, copper busbar, and horizontal elbow clamp.

[0006] As a preferred technical solution of the present invention, a conductor located on the side of the Hall chip is provided on the inner side of the magnetic core.

[0007] As a preferred technical solution of the present invention, a carrier is provided on the top of the electric wood floor, and the inner side of the carrier is clamped with a current sensor.

[0008] As a preferred technical solution of the present invention, a probe base located on the side of the copper bus is provided on the side of the test probe.

[0009] As a preferred technical solution of the present invention, the slider is fixedly connected to the bottom of the probe base, and the slider is fixedly connected to the probe base via screws.

[0010] As a preferred technical solution of the present invention, the side of the slider is provided with a limit block located on the top of the electric wood floor. The limit block is used to control the position of the slider on the guide rail to ensure that the test probe on the slider can always contact the chip pins on the current sensor and always maintain a conductive state during the test process.

[0011] As a preferred technical solution of the present invention, a guide rail is provided between the two carriers, a slider is provided on the guide rail, a probe base is provided on the slider, and a test probe is provided on the probe base.

[0012] Compared with the prior art, the beneficial effects of the present invention are:

[0013] The utility model is a test fixture for current sensors, which can conveniently test multiple current sensors at the same time and can quickly and non-destructively install and remove the current sensors, thereby significantly improving production efficiency and reducing risks such as chip pin deformation caused by testing.

[0014] The present invention is divided into multiple stations for synchronous operation. Different from the previous method of inserting the product's conductor and chip pin into the tooling, the present invention utilizes a copper busbar to contact the product's conductor and is compressed using a lateral elbow clamp. The chip pin portion is contacted with a test probe for signal transmission. The test probe is fixed to the probe base and then fixed together on a slider with a guide rail, thereby achieving the purpose of quickly separating or contacting the test probe and the chip pin. The rotatable screw on the limit block on the side can be used to press against the probe base after the test probe contacts the chip pin, preventing the probe from separating from the pin to achieve the limit function. The present invention facilitates simultaneous testing of multiple current sensors and can achieve non-destructive and quick installation and removal of current sensors, thereby significantly improving production efficiency and reducing the risk of chip pin deformation caused by testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic structural diagram of a test fixture for a current sensor according to the present invention from a first perspective;

[0016] Figure 2 It is a structural schematic diagram of the current sensor to be measured of the present invention;

[0017] Figure 3 This is a schematic structural diagram of the current sensor to be measured with the housing omitted;

[0018] Figure 4 This is a schematic diagram of the contact between the test probe and the chip pins on the current sensor.

[0019] In the figure: 1. Current sensor; 2. Housing; 3. Magnetic core; 4. Hall chip; 5. Pin; 6. Conductor; 7. Carrier; 8. Test probe; 9. Probe base; 10. Slider; 11. Guide rail; 12. Limit block; 13. Copper busbar; 14. Horizontal elbow clamp; 15. Bakelite floor. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0021] See also Figure 1-4 The utility model provides a test tool for a current sensor, including a current sensor 1, a shell 2 is provided on the outside of the current sensor 1, a magnetic core 3 is provided on the inside of the shell 2, a Hall chip 4 is provided on the inside of the magnetic core 3, and pins 5 are provided on the side of the Hall chip 4. The bottom of the current sensor 1 is provided with an electric wood floor 15, and the top of the electric wood floor 15 is provided with an elbow clamp 14 located on the side of the current sensor 1. A copper bus 13 is provided on the inside of the current sensor 1, and a test probe 8 is provided on the inside of the copper bus 13 on the inside of the current sensor 1. The top of the electric wood floor 15 is fixedly connected to a guide rail 11, and the top of the guide rail 11 is slidably connected to a slider 10. The carrier 7 is used to position the current sensor 1 to be tested, support and position the chip pins 5 on the current sensor 1, and the test probe 8 is used to contact the pins 5 of the current sensor 1 for transmitting electrical signals. The probe base 9 is used to fix the test probe 8, and the test probe 8 is fixed in the positioning hole of the probe base 9 with glue to ensure that each The probe can contact the pin 5 on the corresponding current sensor 1. The slider 10 is used to fix the probe base 9. There are two threaded holes on the slider 10. The probe base 9 and the slider 10 are fixed by screws. The guide rail 11 is combined with the slider 10 to ensure that the slider 10 can slide back and forth on the guide rail 11, which is convenient for the probe to contact and disengage with the pin 5 of the current sensor 1. The limit block 12 is used to control the position of the slider 10 on the guide rail 11 to ensure that the test probe 8 on the slider 10 can always contact the chip pin 5 on the current sensor 1 and always maintain the conductive state during the test. The copper bus 13 is used for series conduction of the tested circuits of multiple current sensors 1. The horizontal elbow clamp 14 is used to contact the tested copper bus 13 on the current sensor 1 with the tooling copper bus 13, with a certain pressure to ensure a small contact resistance. The bakelite substrate is the main body of the test tooling of the current sensor 1, which is used to fix the carrier 7, the guide rail 11, the limit block 12, the copper bus 13, and the horizontal elbow clamp.

[0022] A conductor 6 is provided on the inner side of the magnetic core 3 and is located on the side of the Hall chip 4. A carrier 7 is provided on the top of the bakelite floor 15. The inner side of the carrier 7 is clamped with the current sensor 1. A probe base 9 is provided on the side of the test probe 8 and is located on the side of the copper bus 13.

[0023] The slider 10 is fixedly connected to the bottom of the probe base 9, and the slider 10 is fixedly connected to the probe base 9 by screws. A limit block 12 is provided on the side of the slider 10 and is located on the top of the electric wood floor 15. The limit block 12 is used to control the position of the slider 10 on the guide rail 11 to ensure that the test probe 8 on the slider 10 can always contact the chip pin 5 on the current sensor 1 and always maintain a conductive state during the test. A guide rail 11 is set between the two carriers 7, a slider 10 is set on the guide rail 11, a probe base 9 is set on the slider 10, and a test probe 8 is set on the probe base 9.

[0024] In specific use, first, a test fixture for a current sensor 1 can conveniently test multiple current sensors 1 at the same time and can quickly and non-destructively install and remove the current sensor 1, thereby significantly improving production efficiency and reducing the risk of deformation of the chip pin 5 caused by testing. The utility model is divided into multiple stations for synchronous operation, and is different from the previous method of inserting the product's conductor 6 and the chip pin into the fixture. The present invention uses a copper bus 13 to contact the product conductor 6 and uses a horizontal elbow clamp to tighten it. The chip pin part uses a test probe 8 to contact for signal transmission. The test probe 8 is fixed on the probe base 9 and then fixed together on the slider 10 with the guide rail 11, so as to achieve the purpose of quickly separating or contacting the test probe 8 and the chip pin 5. The rotatable screw on the limit block 12 on the side can be used to press against the probe base 9 after the test probe 8 contacts the chip pin, preventing the probe from separating from the pin to achieve the limit effect. The present invention is convenient for testing multiple current sensors 1 at the same time and can quickly and non-destructively install and remove the current sensor 1, thereby significantly improving production efficiency and reducing the risk of deformation of the chip pin 5 caused by testing.

[0025] Although the embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and variations may be made to these embodiments without departing from the principles and spirit of the present invention, and the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A test fixture for a current sensor, comprising a current sensor (1), characterized in that: The outer side of the current sensor (1) is provided with a shell (2), the inner side of the shell (2) is provided with a magnetic core (3), the inner side of the magnetic core (3) is provided with a Hall chip (4), the side of the Hall chip (4) is provided with a pin (5), the bottom of the current sensor (1) is provided with an electric wood floor (15), the top of the electric wood floor (15) is provided with an elbow clamp (14) located on the side of the current sensor (1), the inner side of the current sensor (1) is provided with a copper busbar (13), and the inner side of the current sensor (1) is provided with a test probe (8) located on the inner side of the copper busbar (13), the top of the electric wood floor (15) is fixedly connected to a guide rail (11), and the top of the guide rail (11) is slidably connected to a slider (10).

2. The current sensor test fixture according to claim 1, characterized in that: A conductor (6) located on the side of the Hall chip (4) is provided on the inner side of the magnetic core (3).

3. The current sensor test fixture according to claim 1, characterized in that: A carrier (7) is provided on the top of the electric wood floor (15), and the inner side of the carrier (7) is clamped with the current sensor (1).

4. The current sensor test fixture according to claim 1, characterized in that: A probe base (9) is provided on the side of the test probe (8) and is located on the side of the copper bus (13).

5. The current sensor test fixture according to claim 1, characterized in that: The slider (10) is fixedly connected to the bottom of the probe base (9), and the slider (10) is fixedly connected to the probe base (9) via screws.

6. The current sensor testing tool according to claim 1, characterized in that: A side surface of the slider (10) is provided with a limiting block (12) located on the top of the electric wood floor (15).

7. The current sensor test fixture according to claim 1, characterized in that: A guide rail (11) is provided between the two carriers (7), a slider (10) is provided on the guide rail (11), a probe base (9) is provided on the slider (10), and a test probe (8) is provided on the probe base (9).

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